Thermal vacuum test flange plate and space traveling wave tube thermal vacuum test system

Abstract

The utility model provides a thermal vacuum test flange plate and a thermal vacuum test system for a space traveling wave tube, and relates to the technical field of microwaves. The thermal vacuum test flange plate comprises a flange part; the input interface is arranged on the flange component; the output window is arranged on the flange component; wherein at least one of the input interfaces and the output windows comprises multiple input interfaces and multiple output windows, the input interfaces and the output windows are arranged in a circular shape on the first surface of the flange part, and the distance between the circle center of the circular shape and the center of the first surface is smaller than a preset distance threshold value. The thermal vacuum test system for the space traveling wave tube comprises a vacuum device; an atmospheric device; according to the thermal vacuum test flange plate, the atmosphere device is connected with the vacuum device through the thermal vacuum test flange plate.

Description

Technical Field

[0001] The utility model relates to the field of microwave technology, and more specifically to a thermal vacuum test flange and a space traveling wave tube thermal vacuum test system. Background Art

[0002] A space traveling wave tube is a microwave vacuum device with the characteristics of high frequency, wide bandwidth and high power. It is widely used in satellite payload systems and plays the role of microwave final stage amplification.

[0003] Since satellites are in a vacuum environment when they are in orbit, it is necessary to simulate the space environment and conduct a large number of thermal vacuum tests to assess the reliability of space traveling wave tubes during the development of space traveling wave tubes. In the thermal vacuum test system, the thermal vacuum flange connects the product in the vacuum environment with the test system in the atmospheric environment, and its role is very critical. For certain thermal vacuum equipment, the positions of the thermal vacuum flange and the cold plate are fixed and cannot be adjusted. The replacement and installation of the thermal vacuum flange is a relatively time-consuming and labor-intensive task.

[0004] In addition, the input interface and output window of the traditional thermal vacuum test flange are of a single model and fixed position, which leads to a single working frequency band. It can only support one space traveling wave tube for thermal vacuum testing, and the position of the waveguide window cannot be adjusted for different time periods. Therefore, the efficiency of the thermal vacuum test is limited. At the same time, it is necessary to reserve multiple models of flanges, resulting in a waste of resources. Utility Model Content

[0005] In view of this, the utility model provides a thermal vacuum test flange and a space traveling wave tube thermal vacuum test system.

[0006] One aspect of the utility model provides a thermal vacuum test flange, comprising a flange component, an input interface and an output window. The input interface is arranged on the flange component; the output window is arranged on the flange component; wherein at least one of the input interface and the output window includes a plurality of input interfaces and the output window are arranged in a circular shape on a first surface of the flange component, and the distance between the center of the circular shape and the center of the first surface is less than a preset distance threshold.

[0007] According to an embodiment of the present invention, the input interface includes a vacuum-sealed SMA interface.

[0008] According to an embodiment of the present utility model, the output window comprises a waveguide vacuum sealing window, wherein the waveguide vacuum sealing window comprises multiple models.

[0009] According to an embodiment of the present invention, the model of the waveguide vacuum sealing window includes at least one of the following: BJ120 model, BJ180 model and BJ260 model.

[0010] According to an embodiment of the present invention, the flange component is configured to adjust the position of the output window according to the rotation of the flange component, or to adjust the position of the input interface according to the rotation of the flange component.

[0011] Another aspect of the utility model provides a space traveling wave tube thermal vacuum test system, comprising a vacuum device, an atmospheric device and a thermal vacuum test flange. The atmospheric device is connected to the vacuum device via the thermal vacuum test flange.

[0012] According to an embodiment of the utility model, the vacuum device comprises: a housing, a specimen mounting cold plate and a space traveling wave tube. The specimen mounting cold plate is arranged in the housing; the space traveling wave tube is arranged on the specimen mounting cold plate, wherein the model of the space traveling wave tube matches the model of the output window of the thermal vacuum test flange.

[0013] According to an embodiment of the utility model, the atmospheric device includes a signal generator and a test module. The signal generator is electrically connected to the space traveling wave tube; it is suitable for providing a first microwave signal to the space traveling wave tube, wherein the number of the signal generators corresponds to the number of the space traveling wave tubes; the test module is electrically connected to the space traveling wave tube; it is suitable for receiving a second microwave signal output by the space traveling wave tube and detecting the second microwave signal, wherein the model of the test module corresponds to the model of the space traveling wave tube.

[0014] According to an embodiment of the utility model, the space traveling wave tube thermal vacuum test system further includes an input cable. The input cable passes through the input interface of the thermal vacuum test flange and is electrically connected to the signal generator and the space traveling wave tube, wherein the number of the input cables corresponds to the number of the output windows.

[0015] According to an embodiment of the utility model, the space traveling wave tube thermal vacuum test system further comprises a connecting waveguide, which passes through the output window of the thermal vacuum test flange and is connected to the test module and the space traveling wave tube, wherein the model of the connecting waveguide corresponds to the model of the output window.

[0016] According to the embodiments of the utility model, by arranging a plurality of input interfaces and a plurality of output windows on the flange component, it is possible to simultaneously carry out thermal vacuum tests on space traveling wave tubes of multiple frequency bands, thereby improving work efficiency. Since the input interfaces and the output windows are arranged in a circular shape on the first surface of the flange component, the positions of the input interfaces and the output windows can be changed by rotating the flange component, thereby making the thermal vacuum test more flexible. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The above contents and other purposes, features and advantages of the present invention will become more apparent through the following description of the embodiments of the present invention with reference to the accompanying drawings, in which:

[0018] Figure 1 A schematic diagram of a thermal vacuum test flange according to an embodiment of the utility model is schematically shown;

[0019] Figure 2 A schematic diagram of an SMA interface according to an embodiment of the utility model is schematically shown;

[0020] Figure 3 A schematic diagram of a waveguide vacuum sealing window according to an embodiment of the utility model is schematically shown;

[0021] Figure 4 A schematic diagram of a rotating flange component according to an embodiment of the utility model is schematically shown;

[0022] Figure 5 A schematic diagram of a conventional thermal vacuum test flange according to an embodiment of the utility model is schematically shown;

[0023] Figure 6 A schematic diagram of a flange component according to an embodiment of the utility model is schematically shown;

[0024] Figure 7 A schematic diagram schematically shows a space traveling wave tube thermal vacuum test system according to an embodiment of the utility model; and

[0025] Figure 8 A specific schematic diagram of a space traveling wave tube thermal vacuum test system according to an embodiment of the utility model is schematically shown. DETAILED DESCRIPTION

[0026] Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. However, it should be understood that these descriptions are exemplary only and are not intended to limit the scope of the present invention. In the following detailed description, for ease of explanation, many specific details are described to provide a comprehensive understanding of the embodiments of the present invention. However, it is obvious that one or more embodiments may also be implemented without these specific details. In addition, in the following description, descriptions of known structures and technologies are omitted to avoid unnecessary confusion of the concepts of the present invention.

[0027] The terms used herein are only for describing specific embodiments and are not intended to limit the present invention. The terms "include", "comprises", etc. used herein indicate the existence of the features, steps, operations and / or components, but do not exclude the existence or addition of one or more other features, steps, operations or components.

[0028] All terms (including technical and scientific terms) used herein have the meanings commonly understood by those skilled in the art, unless otherwise defined. It should be noted that the terms used herein should be interpreted as having a meaning consistent with the context of this specification, and should not be interpreted in an idealized or overly rigid manner.

[0029] When using expressions such as "at least one of A, B, and C, etc.", they should generally be interpreted according to the meaning of the expression commonly understood by those skilled in the art (for example, "a system having at least one of A, B, and C" should include but is not limited to a system having A alone, B alone, C alone, A and B, A and C, B and C, and / or A, B, C, etc.).

[0030] The input interface and output window of the traditional thermal vacuum test flange are of a single model and fixed position, resulting in a single operating frequency band. It can only support one space traveling wave tube for thermal vacuum testing, and the waveguide window position cannot be adjusted for different time periods.

[0031] In view of the above problems, the inventors found that by setting a plurality of input interfaces or output windows of different models, the thermal vacuum test flange can flexibly adjust the position of the input interface or output window by rotation and ensure the working efficiency of the thermal vacuum test.

[0032] In view of this, an embodiment of the utility model provides a thermal vacuum test flange, comprising a flange component, an input interface and an output window. The input interface is arranged on the flange component; the output window is arranged on the flange component; wherein at least one of the input interface and the output window includes a plurality of input interfaces and the output window are arranged in a circular shape on the first surface of the flange component, and the distance between the center of the circular shape and the center of the first surface is less than a preset distance threshold.

[0033] The following will be based on Figure 1 to Figure 6 The thermal vacuum test flange of the embodiment of the utility model is described in detail.

[0034] Figure 1 A schematic diagram of a thermal vacuum test flange according to an embodiment of the utility model is schematically shown.

[0035] like Figure 1 As shown, one aspect of the present invention provides a thermal vacuum test flange 100 , including a flange component 110 , an input interface 120 and an output window 130 .

[0036] The input interface 120 is disposed on the flange component 110 .

[0037] The output window 130 is provided on the flange member 110 .

[0038] Among them, at least one of the input interface 120 and the output window 130 includes multiple ones, and the input interface 120 and the output window 130 are arranged in a circular shape on the first surface of the flange component 110, and the distance between the center of the circular shape and the center of the first surface is less than a preset distance threshold.

[0039] According to an embodiment of the utility model, the flange component 110 can be a disc-shaped component, for example, a component that connects conduits to each other, connected to the pipe end. The flange component 110 has holes, is generally used in pairs, and the two flange components 110 are tightly connected by bolts, wherein the flange components 110 are sealed with gaskets.

[0040] According to the embodiment of the utility model, the input interface 120 and the output window 130 are used in the thermal vacuum test to ensure the maintenance of the vacuum degree of the test system and the transmission of the microwave signal. The output window 130 can be a pressurized component or a non-pressurized component that can play a sealing and isolating role, and can isolate pollutants (such as debris, moisture and dust).

[0041] According to an embodiment of the present invention, the input interface 120 and the output window 130 are on the first surface of the flange component 110 and can also be arranged on the other surface of the flange component 110. The present invention does not limit this, and those skilled in the art can make a selection according to actual needs.

[0042] According to the embodiment of the present invention, the present invention does not limit the size of the preset distance threshold, and those skilled in the art can select it according to actual needs.

[0043] According to the embodiment of the utility model, by arranging a plurality of input interfaces 120 and a plurality of output windows 130 on the flange component 110, it is possible to simultaneously carry out thermal vacuum tests on space traveling wave tubes of multiple frequency bands, thereby improving work efficiency. Since the input interfaces 120 and the output windows 130 are arranged in a circular shape on the first surface of the flange component 110, the positions of the input interfaces 120 and the output windows 130 can be changed by rotating the flange component 110, thereby making the thermal vacuum test more flexible.

[0044] Figure 2 The schematic diagram of the SMA interface according to the embodiment of the utility model is schematically shown.

[0045] like Figure 2 As shown, the input interface includes a vacuum-sealed SMA interface.

[0046] According to an embodiment of the utility model, a coaxial connector (SubMiniature Version A, SMA) can be applied to the measurement or transmission of radio frequency, microwave and millimeter wave signals. The SMA interface can operate at a power of up to 18 GHz and is not limited by the mode; there are also some high-precision SMA interfaces that can operate at a power of up to 26.5 GHz. SMA interfaces are very common in portable test equipment and some laboratory test equipment because they are relatively compact, easy to operate, and not too small to affect their reliable operation.

[0047] According to the embodiment of the utility model, the operating frequency of the SMA interface is DC-29GHz, the insertion loss is ≤0.3dB, the voltage standing wave ratio is <1.1, and the operating temperature range is -65°C to +105°C.

[0048] According to an embodiment of the present utility model, the output window comprises a waveguide vacuum sealing window, wherein the waveguide vacuum sealing window comprises multiple models.

[0049] According to the embodiment of the utility model, the waveguide vacuum sealing window principle refers to that in microwave communication, in order to allow microwave signals to pass through the metal shell, a small hole is opened on the metal shell, and then a metal ring is added around the small hole. This small hole is called a waveguide window. The function of the waveguide vacuum sealing window is to transmit the microwave signal from the metal shell, while preventing the entry of external interference signals, and at the same time preventing contaminants (such as debris, moisture and dust) from entering.

[0050] Figure 3 The schematic diagram of the waveguide vacuum sealing window according to the embodiment of the utility model is schematically shown.

[0051] like Figure 3 As shown, the models of the waveguide vacuum sealing windows include at least one of the following: BJ120 model, BJ180 model and BJ260 model.

[0052] According to the embodiments of the utility model, the waveguide vacuum sealing windows of the BJ120 model, the BJ180 model and the BJ260 model can respectively meet the requirements of simultaneously carrying out thermal vacuum tests on space traveling wave tubes in three frequency bands of 9.84 GHz to 15 GHz, 14.5 GHz to 22 GHz and 21.7 GHz to 29 GHz, thereby improving work efficiency and significantly reducing test costs.

[0053] According to the embodiment of the utility model, the insertion loss of the waveguide vacuum sealing window is ≤0.32dB, and the voltage standing wave ratio is <1.2.

[0054] Figure 4 The schematic diagram of the rotating flange component according to the embodiment of the utility model is schematically shown.

[0055] like Figure 4 As shown, the flange component is configured to adjust the position of the output window according to the rotation of the flange component, or to adjust the position of the input interface according to the rotation of the flange component.

[0056] According to the embodiment of the utility model, the position of the input interface or the output window is adjusted by rotating the flange component at a certain angle. For example, different waveguide vacuum sealing windows can be selected according to different power frequencies of the space traveling wave tube, so that the operating frequency range of the thermal vacuum flange is extended to 9.84 GHz to 29 GHz.

[0057] According to the embodiment of the utility model, since the air pressure at the same position will change in different time periods, it is necessary to adjust the height of the input interface or the output window for different time periods to keep the air pressure consistent. By rotating the flange at a certain angle to adjust the position of the input interface or the output window, there is no need to replace thermal vacuum test flanges of different specifications, which enhances the universal applicability of the thermal vacuum test flange of the utility model, further reduces the test cost and improves work efficiency.

[0058] Figure 5 A schematic diagram of a traditional thermal vacuum test flange according to an embodiment of the utility model is schematically shown. Figure 6 The schematic diagram of the flange component according to the embodiment of the utility model is schematically shown.

[0059] like Figure 5 As shown in the figure, the traditional thermal vacuum test flange only includes one input interface and output window. Its working frequency band is single, and the working frequency range can only be one of 9.84GHz~15GHz, 14.5GHz~22GHz or 21.7GHz~29GHz, and it can only support one space traveling wave tube for thermal vacuum test. At the same time, the position of the input interface and the output window cannot be adjusted, and the thermal vacuum test flange of different specifications can only be replaced multiple times to meet different needs.

[0060] like Figure 6 As shown, a plurality of SMA interface mounting holes and a plurality of waveguide holes of different specifications are provided on the flange component for installing input interfaces and output windows. The utility model does not limit the number and specifications of the SMA interface mounting holes and the waveguide holes, and those skilled in the art can make selections according to actual needs. By providing a plurality of input interfaces and a plurality of output windows on the flange component, it is possible to simultaneously carry out thermal vacuum tests on space traveling wave tubes of multiple frequency bands, improve work efficiency, and by rotating the flange component to change the position of the input interface and the output window, it is possible to meet thermal vacuum tests under different requirements, thus making up for the shortcomings of traditional thermal vacuum test flanges.

[0061] Figure 7The schematic diagram of the space traveling wave tube thermal vacuum test system according to the embodiment of the utility model is schematically shown.

[0062] like Figure 7 As shown, another aspect of the present invention provides a space traveling wave tube thermal vacuum test system, comprising a vacuum device 200, an atmosphere device 300 and a thermal vacuum test flange 100. The atmosphere device 300 is connected to the vacuum device 200 via the thermal vacuum test flange 100.

[0063] According to the embodiment of the utility model, the space traveling wave tube needs to use the space traveling wave tube thermal vacuum test system to conduct a thermal vacuum test on the ground to simulate the space environment, and its reliability can be verified before it can be used on the satellite.

[0064] According to an embodiment of the utility model, the vacuum device 200 may be a thermal vacuum tank, which simulates the space environment after the vacuum operation, so as to facilitate a large number of thermal vacuum tests on the space traveling wave tube and assess its reliability.

[0065] According to the embodiment of the present utility model, the atmospheric device 300 provides the space traveling wave tube with the microwave signal required for testing and performs detection.

[0066] According to the embodiment of the utility model, the thermal vacuum test flange 100 of the utility model is used to connect the product in the vacuum device 200 and the test system in the atmosphere device 300. It can meet the requirements of the thermal vacuum test system of the space traveling wave tube in multiple frequency bands, and carry out thermal vacuum tests at the same time, thereby improving work efficiency. In addition, the thermal vacuum test flange 100 can be rotated to meet the requirements of different air pressures or different models, making the space traveling wave tube thermal vacuum test system more flexible.

[0067] Figure 8 A specific schematic diagram of a space traveling wave tube thermal vacuum test system according to an embodiment of the utility model is schematically shown.

[0068] like Figure 8 As shown, the vacuum device 200 includes: a shell, a specimen mounting cold plate 210 and a space traveling wave tube 220 .

[0069] The specimen mounting cold plate 210 is disposed in the housing.

[0070] The space traveling wave tube 220 is disposed on the specimen mounting cold plate 210 , wherein the model of the space traveling wave tube 220 matches the model of the output window 130 of the thermal vacuum test flange 100 .

[0071] According to an embodiment of the utility model, the space traveling wave tube 220 is a microwave electron tube that realizes the amplification function by continuously modulating the speed of the electron beam. In the space traveling wave tube 220, the electron beam interacts with the microwave field traveling in the slow wave circuit. In the slow wave circuit of 6 to 40 wavelengths, the electron beam continuously transfers kinetic energy to the microwave signal field, thereby amplifying the signal. The space traveling wave tube 220 allows electrons to pass through a long slow wave structure. Due to the long action time, the gain is very high, and there is no resonant cavity, so the working bandwidth is greatly increased. The function of the space traveling wave tube 220 is to amplify the microwave signal. The microwave signal to be amplified enters the slow wave circuit through the input energy coupler and travels along the slow wave circuit. The electrons exchange energy with the traveling microwave field, so that the microwave signal is amplified.

[0072] According to the embodiments of the utility model, the space traveling wave tube 221 with an operating frequency in the range of 9.84 to 15 GHz matches the waveguide vacuum sealing window of the BJ120 model; the space traveling wave tube 222 with an operating frequency in the range of 14.5 to 22 GHz matches the waveguide vacuum sealing window of the BJ180 model; the space traveling wave tube 223 with an operating frequency in the range of 21.7 to 33 GHz matches the waveguide vacuum sealing window of the BJ260 model.

[0073] like Figure 8 As shown, the atmospheric device 300 includes a signal generator 310 and a test module 320 .

[0074] The signal generator 310 is electrically connected to the space traveling wave tube 220 , and is adapted to provide a first microwave signal to the space traveling wave tube 220 , wherein the number of the signal generators 310 corresponds to the number of the space traveling wave tubes 220 .

[0075] The test module 320 is electrically connected to the space traveling wave tube 220 ; it is adapted to receive the second microwave signal output by the space traveling wave tube 220 and detect the second microwave signal, wherein the model of the test module 320 corresponds to the model of the space traveling wave tube 220 .

[0076] The test module 321 with an operating frequency in the range of 9.84 to 15 GHz matches the space traveling wave tube 221 ; the test module 322 with an operating frequency in the range of 14.5 to 22 GHz matches the space traveling wave tube 222 ; the test module 232 with an operating frequency in the range of 21.7 to 33 GHz matches the space traveling wave tube 223 .

[0077] According to an embodiment of the present invention, the signal generator 310 is a device that can provide electrical signals of various frequencies, waveforms and output levels. In the thermal vacuum test system of the space traveling wave tube 220 of the present invention, the signal generator 310 is used as a signal source to provide a first microwave signal to the space traveling wave tube 220. The frequency range of the output signal of the signal generator 310 is DC to 40 GHz.

[0078] According to the embodiment of the present invention, the operating frequency of the test module 320 matches the operating frequency of the space traveling wave tube 220 .

[0079] According to an embodiment of the present invention, the second microwave signal received by the test module 320 is obtained by amplifying the first microwave signal based on the space traveling wave tube 220 .

[0080] like Figure 8 As shown, the space traveling wave tube 220 thermal vacuum test system further includes an input cable 400. The input cable 400 passes through the input interface 120 of the thermal vacuum test flange 100 and is electrically connected to the signal generator 310 and the space traveling wave tube 220, wherein the number of the input cables 400 corresponds to the number of the output windows 130.

[0081] According to the embodiment of the present invention, the signal generator 310 inputs the first microwave signal to the input end of the space traveling wave tube 220 through the input cable 400 .

[0082] like Figure 8 As shown, the space traveling wave tube 220 thermal vacuum test system further includes a connecting waveguide 500. The connecting waveguide 500 passes through the output window 130 of the thermal vacuum test flange 100 and is connected to the test module 320 and the space traveling wave tube 220, wherein the model of the connecting waveguide 500 corresponds to the model of the output window 130 respectively.

[0083] The connecting waveguide 501 is of model BJ260, and is connected to the space traveling wave tube 221 through a waveguide vacuum sealing window of model BJ260; the connecting waveguide 502 is of model BJ180, and is connected to the space traveling wave tube 222 through a waveguide vacuum sealing window of model BJ180; the connecting waveguide 503 is of model BJ120, and is connected to the space traveling wave tube 223 through a waveguide vacuum sealing window of model BJ120.

[0084] According to an embodiment of the present invention, the output end of the space traveling wave tube 220 inputs the second microwave signal to the test module 320 through the connecting waveguide 500. Since the connecting waveguide 500 passes through the output window 130, the model of the connecting waveguide 500 needs to match the model of the corresponding waveguide vacuum sealing window.

[0085] According to the embodiment of the utility model, the vacuum device 200 is evacuated to obtain a vacuum environment for the test, so that the area where the space traveling wave tube 220 is located is a vacuum area, and the area where the test system is located is an atmospheric area. The first microwave signal is emitted by the signal generator 310, transmitted by the input cable 400, and enters the vacuum device 200 through the input interface 120 of the thermal vacuum test flange 100. After the first microwave signal is amplified by the space traveling wave tube 220, a second microwave signal is obtained. The second microwave signal is transmitted by the connecting waveguide 500, enters the atmospheric device 300 through the output window 130 of the thermal vacuum test flange 100, and is input to the test module 320. The test module 320 detects the second microwave signal.

[0086] According to the embodiment of the utility model, by adopting the space traveling wave tube 220 thermal vacuum test system of the utility model, since the input interface 120 and the output window 130 of the thermal vacuum test flange 100 of the utility model include multiple ones, it is possible to simultaneously carry out thermal vacuum tests of multiple groups of space traveling wave tubes 220, and the adapted working frequency is within the range of 9.84 to 33 GHz. The work efficiency is improved and the test cost is reduced. The problem that the thermal vacuum test needs to replace and install the thermal vacuum test flange 100 multiple times, which leads to waste of time, labor and other resources is solved.

[0087] Those skilled in the art will appreciate that the features described in the various embodiments and / or claims of the present invention may be combined and / or combined in various ways, even if such combinations and / or combinations are not explicitly described in the present invention. In particular, the features described in the various embodiments and / or claims of the present invention may be combined and / or combined in various ways without departing from the spirit and teachings of the present invention. All of these combinations and / or combinations fall within the scope of the present invention.

[0088] The embodiments of the present invention are described above. However, these embodiments are for illustrative purposes only and are not intended to limit the scope of the present invention. Although the embodiments are described above separately, this does not mean that the measures in the various embodiments cannot be used in combination to advantage. The scope of the present invention is defined by the attached claims and their equivalents. Without departing from the scope of the present invention, a person skilled in the art may make a variety of substitutions and modifications, which should all fall within the scope of the present invention.

Claims

1. A thermal vacuum test flange, characterized in that: include: Flange parts; An input interface, arranged on the flange component; An output window is arranged on the flange component; Among them, at least one of the input interface and the output window includes multiple ones, and the input interface and the output window are arranged in a circular shape on the first surface of the flange component, and the distance between the center of the circular shape and the center of the first surface is less than a preset distance threshold.

2. The thermal vacuum test flange according to claim 1, characterized in that: The input interface includes a vacuum-sealed SMA interface.

3. The thermal vacuum test flange according to claim 1, characterized in that: The output window comprises a waveguide vacuum sealing window, wherein the waveguide vacuum sealing window has multiple models.

4. The thermal vacuum test flange according to claim 3, characterized in that: The model of the waveguide vacuum sealing window includes at least one of the following: BJ120 model, BJ180 model and BJ260 model.

5. The thermal vacuum test flange according to claim 1, characterized in that: The flange component is configured to adjust the position of the output window according to the rotation of the flange component, or to adjust the position of the input interface according to the rotation of the flange component.

6. A space traveling wave tube thermal vacuum test system, characterized in that: include: Vacuum device; Atmospheric devices; According to the thermal vacuum test flange according to any one of claims 1 to 5, the atmospheric device is connected to the vacuum device through the thermal vacuum test flange.

7. The system according to claim 6, characterized in that The vacuum device comprises: case; A test piece mounting cold plate is arranged in the shell; A space traveling wave tube is arranged on the specimen mounting cold plate, wherein the model of the space traveling wave tube matches the model of the output window of the thermal vacuum test flange.

8. The system according to claim 6, characterized in that The atmospheric device comprises: A signal generator, electrically connected to the space traveling wave tube; and adapted to provide a first microwave signal to the space traveling wave tube, wherein the number of the signal generators corresponds to the number of the space traveling wave tubes; The test module is electrically connected to the space traveling wave tube and is adapted to receive a second microwave signal output by the space traveling wave tube and detect the second microwave signal, wherein the model of the test module corresponds to the model of the space traveling wave tube.

9. The system according to claim 8, characterized in that The space traveling wave tube thermal vacuum test system also includes: An input cable passes through an input interface of the thermal vacuum test flange and is electrically connected to the signal generator and the space traveling wave tube, wherein the number of the input cables corresponds to the number of the output windows.

10. The system according to claim 8, characterized in that The space traveling wave tube thermal vacuum test system also includes: A connecting waveguide passes through the output window of the thermal vacuum test flange and is connected to the test module and the space traveling wave tube, wherein the models of the connecting waveguide correspond to the models of the output window respectively.

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