Semiconductor device test fixture

Abstract

The utility model discloses a semiconductor device test fixture, which comprises a test board with a placing plate at the central position, the placing plate is used for placing a device body, push plates are symmetrically arranged on the upper surface of the test board relative to the placing plate, and two fixed plugs are respectively arranged on the opposite sides of the two push plates. Two sides of the device body are respectively provided with a jack corresponding to the fixed plug, a fixed plate is installed on the test bench on the opposite sides of the two push plates, an electric push rod is arranged between the fixed plate and the push plates, the movable end of the electric push rod is fixedly connected with the push plates, the fixed plug is fixedly installed in the middle of a fixed rod, and the fixed plug is fixedly connected with the fixed rod. A connecting rod is arranged between the two ends of the fixing rod and the push plate, and a sliding block is arranged between the push plate and the sliding rod. The semiconductor device test fixture is simple and convenient to operate, greatly saves the fixing time, can be suitable for testing components with different sizes, and expands the overall application range of the device.

Description

Technical Field

[0001] The utility model relates to the technical field of fixtures, in particular to a semiconductor device testing fixture. Background Art

[0002] During product development, semiconductor devices often go through a series of tests to verify device performance and system compatibility, and to remove defective components. This requires the use of fixtures to clamp and fix them before testing.

[0003] After searching, the patent publication number CN206804693U discloses an "electronic semiconductor device test fixture", including a test board, a limiting groove for placing the electronic components to be tested is opened in the middle of the top surface of the test board, and pads and lead grooves are arranged around the limiting groove. There are also multiple first screw holes around the limiting groove of the test board; the fixture also includes a fixing seat and a locking screw. A limiting hole for placing the electronic components to be tested is opened in the middle of the fixing seat, and the position of the limiting hole corresponds to the limiting groove. A second screw hole of the same size and corresponding position as the first screw hole is opened around the limiting hole of the fixing seat, and a surrounding frame surrounding the limiting hole is arranged on the top surface of the fixing seat, and a long crimping groove is opened on the top surface of the surrounding frame; the locking screw matches the first screw hole and the second screw hole. This device helps to quickly carry out the test and verification of alternative devices of multiple manufacturers, reduce product development time, and save product development costs.

[0004] In the prior art, when testing components, the components need to be fixed on a test board by bolts, which takes a lot of time to fix the components, and only components of fixed specifications can be tested, resulting in poor applicability of the device. Utility Model Content

[0005] The utility model aims to provide a semiconductor device testing fixture, which is simple and convenient to operate, greatly saves fixing time, can also be adapted to test components of different sizes, and expands the overall application range of the device.

[0006] To achieve the above-mentioned purpose, the technical solution adopted by the utility model is: a semiconductor device test fixture, comprising: a test bench with a placement plate arranged at the central position, the placement plate is used to place the device body, a push plate is arranged symmetrically with respect to the placement plate on the upper surface of the test bench, and a fixed plug is respectively installed on the opposite sides of the two push plates, and the two sides of the device body are respectively provided with jacks arranged corresponding to the fixed plugs;

[0007] A fixed plate is installed on the test bench at the opposite sides of the two push plates, an electric push rod is arranged between the fixed plate and the push plate, and the movable end of the electric push rod is fixedly connected to the push plate.

[0008] The further improved scheme in the above technical scheme is as follows:

[0009] 1. In the above solution, the fixed plug is fixedly installed in the middle of a fixed rod, and a connecting rod is provided between the two ends of the fixed rod and the push plate.

[0010] 2. In the above scheme, a limit block is respectively installed on both sides of the fixed plug and on the test bench, and a slide bar is arranged between the limit block and the fixed plate, and the push plate is slidably mounted on the outer wall of the slide bar.

[0011] 3. In the above solution, a sliding block is provided between the push plate and the sliding rod.

[0012] 4. In the above solution, a plurality of magnetic blocks are arranged at intervals on the top of the placement plate.

[0013] Due to the application of the above technical solution, the utility model has the following advantages compared with the prior art:

[0014] The utility model relates to a semiconductor device testing fixture, wherein opposite sides of two push plates are respectively provided with a fixing plug, and two sides of a device body are respectively provided with sockets arranged corresponding to the fixing plugs, a fixing plate is arranged on the opposite sides of the two push plates and is installed on a test bench, and an electric push rod is arranged between the fixing plate and the push plate, and the two push plates are pushed toward each other by the two electric push rods, so that the fixing plugs on the opposite sides of the push plates are embedded in the sockets of the device body, thereby realizing the connection of components, and the operation is simple and convenient, and compared with the method of fixing with screws, the fixing time is greatly saved, and it can also adapt to the testing of components of different sizes, thereby expanding the application scope of the overall device. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Attached Figure 1 This is a schematic diagram of the structure of the semiconductor device test fixture of the utility model from a first perspective;

[0016] Attached Figure 2 This is a schematic diagram of the structure of the semiconductor device test fixture of the utility model from a second viewing angle;

[0017] Attached Figure 3 The figure is a schematic diagram of the exploded structure of the semiconductor device test fixture of the present utility model.

[0018] In the above figures: 1. test bench; 2. fixed plate; 3. electric push rod; 4. push plate; 5. connecting rod; 6. fixed rod; 7. fixed plug; 8. sliding rod; 9. limit block; 10. slider; 11. placement plate; 12. magnetic block; 13. device body; 14. socket. DETAILED DESCRIPTION

[0019] The present invention can be further understood through the specific embodiments given below, but they are not intended to limit the present invention.

[0020] Embodiment 1: A semiconductor device test fixture, comprising: a test bench 1 having a placement plate 11 disposed at a central position, the placement plate 11 being used to place a device body 13, a push plate 4 being disposed symmetrically about the placement plate 11 on the upper surface of the test bench 1, and a fixed plug 7 being installed on opposite sides of two push plates 4, respectively, and both sides of the device body 13 having sockets 14 disposed corresponding to the fixed plug 7;

[0021] Place the device body on the placement plate, adsorb it through the magnetic block, start the electric push rod, drive the push plate to move through the electric push rod, the push plate moves on the slide bar through the slider, and the movement of the push plate is limited by the limit block and the fixed plate, which improves the stability of the push plate when moving and avoids shaking;

[0022] A fixed plate 2 is installed on the test bench 1 at the opposite sides of the two push plates 4, an electric push rod 3 is arranged between the fixed plate 2 and the push plate 4, and the movable end of the electric push rod 3 is fixedly connected to the push plate 4;

[0023] The connecting rod is driven to move by the push plate, the fixing rod is driven to move by the connecting rod, and the fixing plug is driven to move by the fixing rod, so that the fixing plug is moved to the inside of the socket, the device body is clamped, and then the test can be carried out, thereby saving the fixing time and being able to flexibly adjust the fixation according to the size of the components, which is more convenient for people to use.

[0024] The fixed plug 7 is fixedly mounted in the middle of a fixed rod 6 , and a connecting rod 5 is provided between the two ends of the fixed rod 6 and the push plate 4 .

[0025] A limit block 9 is respectively installed on both sides of the fixed plug 7 and on the test bench 1 , and a slide bar 8 is arranged between the limit block 9 and the fixed plate 2 , and the push plate 4 is slidably mounted on the outer wall of the slide bar 8 .

[0026] A slider 10 is provided between the push plate 4 and the slide rod 8 .

[0027] A plurality of magnetic blocks 12 are arranged at intervals on the top of the placement plate 11 .

[0028] Embodiment 2: A semiconductor device test fixture, comprising: a test bench 1 having a placement plate 11 disposed at a central position, the placement plate 11 being used to place a device body 13, a push plate 4 being disposed symmetrically about the placement plate 11 on the upper surface of the test bench 1, and a fixed plug 7 being installed on opposite sides of two push plates 4, respectively, and both sides of the device body 13 having sockets 14 disposed corresponding to the fixed plug 7;

[0029] A fixed plate 2 is installed on the test bench 1 at the opposite sides of the two push plates 4, an electric push rod 3 is arranged between the fixed plate 2 and the push plate 4, and the movable end of the electric push rod 3 is fixedly connected to the push plate 4;

[0030] The two push plates are pushed towards each other by two electric push rods, so that the fixed plugs on the opposite sides of the push plates are embedded in the sockets of the device body, thereby realizing the connection of the components. The operation is simple and convenient. Compared with the method of fixing with screws, it greatly saves the fixing time, and can also adapt to the testing of components of different sizes, expanding the overall application scope of the device.

[0031] The fixed plug 7 is fixedly mounted in the middle of a fixed rod 6 , and a connecting rod 5 is provided between the two ends of the fixed rod 6 and the push plate 4 .

[0032] A limit block 9 is respectively installed on both sides of the fixed plug 7 and on the test bench 1 , and a slide bar 8 is arranged between the limit block 9 and the fixed plate 2 , and the push plate 4 is slidably mounted on the outer wall of the slide bar 8 .

[0033] A slider 10 is provided between the push plate 4 and the slide rod 8 .

[0034] A plurality of magnetic blocks 12 are arranged at intervals on the top of the placement plate 11 .

[0035] The electric push rod 3 is fixedly installed inside the fixing plate 2 .

[0036] The magnetic blocks 12 are distributed at equal intervals.

[0037] The working principle of the utility model is as follows:

[0038] When in use, first place the device body on the placement plate, adsorb it through the magnetic block, start the electric push rod, drive the push plate to move through the electric push rod, the push plate moves on the slide bar through the slider, and the movement of the push plate is limited by the limit block and the fixed plate, which improves the stability of the push plate when moving and avoids shaking;

[0039] The connecting rod is driven to move by the push plate, the fixing rod is driven to move by the connecting rod, and the fixing plug is driven to move by the fixing rod, so that the fixing plug is moved to the inside of the socket, the device body is clamped, and then the test can be carried out, thereby saving the fixing time and being able to flexibly adjust the fixation according to the size of the components, which is more convenient for people to use.

[0040] When the above-mentioned semiconductor device test fixture is used, the two push plates are pushed closer to each other by two electric push rods, so that the fixed plugs on the opposite sides of the push plates are embedded in the sockets of the device body, thereby realizing the connection of components. The operation is simple and convenient. Compared with the method of fixing with screws, it greatly saves the fixing time, and can also adapt to the testing of components of different sizes, expanding the overall application range of the device.

[0041] The above embodiments are only for illustrating the technical concept and features of the utility model, and their purpose is to enable people familiar with the technology to understand the content of the utility model and implement it accordingly, and they cannot be used to limit the protection scope of the utility model. Any equivalent changes or modifications made according to the spirit of the utility model should be included in the protection scope of the utility model.

Claims

1. A semiconductor device test fixture, comprising: A test bench (1) having a placement plate (11) disposed at a central position, the placement plate (11) being used to place a device body (13), characterized in that: a push plate (4) is disposed symmetrically with respect to the placement plate (11) on the upper surface of the test bench (1), and a fixed plug (7) is installed on opposite sides of the two push plates (4), and both sides of the device body (13) have sockets (14) disposed corresponding to the fixed plugs (7); A fixed plate (2) is installed on the test bench (1) and is located on opposite sides of the two push plates (4). An electric push rod (3) is arranged between the fixed plate (2) and the push plate (4), and a movable end of the electric push rod (3) is fixedly connected to the push plate (4).

2. The semiconductor device test fixture according to claim 1, wherein: The fixed plug (7) is fixedly mounted on the middle part of a fixed rod (6), and a connecting rod (5) is provided between the two ends of the fixed rod (6) and the push plate (4).

3. The semiconductor device test fixture according to claim 1, wherein: A limit block (9) is respectively installed on both sides of the fixed plug (7) and on the test bench (1), and a slide bar (8) is arranged between the limit block (9) and the fixed plate (2), and the push plate (4) is slidably mounted on the outer wall of the slide bar (8).

4. The semiconductor device test fixture according to claim 3, characterized in that: A sliding block (10) is provided between the push plate (4) and the sliding rod (8).

5. The semiconductor device test fixture according to claim 1, wherein: A plurality of magnetic blocks (12) are arranged at intervals on the top of the placement plate (11).

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