Surface roughness measurement auxiliary support and surface roughness measurement system
By designing a surface roughness measurement auxiliary bracket suitable for infrared material detection of different sizes and shapes, the problems of low detection efficiency, high difficulty and poor accuracy in the prior art are solved, and efficient and stable infrared material surface roughness detection is achieved.
Patent Information
- Application Number
- CN202422186911.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-05
- Publication Date
- 2025-07-08
- Estimated Expiration
- 2034-09-05
AI Technical Summary
Existing surface roughness instruments cannot adapt to the detection of infrared materials of different sizes and shapes, resulting in low detection efficiency, high difficulty, poor accuracy and long time.
A surface roughness measurement auxiliary bracket is designed, including a bottom plate, a two-fold plate and a top plate. The top plate is used to support the sensor probe, the bottom plate is used to support the working platform, and the lifting platform is used to place infrared material. By adjusting the height difference and position of the lifting platform, it is suitable for infrared material detection of different sizes and shapes.
It improves detection efficiency, reduces detection difficulty, ensures detection accuracy, and reduces detection error and time.
Smart Images
Figure CN223076664U_ABST
Abstract
Description
Technical Field
[0001] The present disclosure relates to the field of infrared detection, and more particularly to a surface roughness measurement auxiliary bracket and a surface roughness measurement system. Background Art
[0002] A surface roughness meter is a device used to evaluate the surface quality of materials. Especially in the field of infrared materials, the measurement of surface finish is crucial. A surface roughness meter usually works based on optical principles, using the interaction between light and the material surface to evaluate the surface quality. For example, by measuring the reflected or scattered light to infer the surface roughness and finish. Surface roughness refers to the degree of irregularity or undulation of the surface, usually measured in micrometers or nanometers. For infrared materials, surface roughness may have a significant impact on optical properties, so accurate measurement and control are required. Infrared materials have special optical properties and application requirements, such as applications in infrared sensors, lidar, etc. Therefore, higher requirements for the surface finish of infrared materials are needed, and more precise measurement and control are required. The surface roughness meter plays an important role in the manufacturing, processing, and application processes of infrared materials, which can help optimize the optical properties and technological processes of materials, and improve product quality and performance.
[0003] Figure 1 is a three-dimensional schematic diagram of a surface roughness meter for detecting the surface roughness of infrared materials. Figure 2 is Figure 1 a three-dimensional schematic diagram from another angle of
[0004] As Figure 1 shown, the surface roughness meter 200 has a sensor probe 200a located on the bottom surface and capable of telescoping.
[0005] Regarding Figure 1 the surface roughness meter 200, relying solely on the surface roughness meter 200, whether directly placed on the working plane or held by hand, cannot be applicable to the detection of infrared optical materials of various specifications (such as different sizes and shapes), and has a greater impact on efficiency, detection difficulty, and accuracy. Utility Model Content
[0006] In view of the problems existing in the background art, an object of the present disclosure is to provide a surface roughness measurement auxiliary bracket and a surface roughness measurement system, which can adapt to the surface roughness detection of infrared materials of different sizes and shapes.
[0007] Another object of the present disclosure is to provide a surface roughness measurement auxiliary bracket and a surface roughness measurement system, which can improve the detection efficiency and reduce the detection difficulty.
[0008] Another object of the present disclosure is to provide a surface roughness measurement auxiliary bracket and a surface roughness measurement system, which can ensure the accuracy of detection and reduce detection errors.
[0009] Another object of the present disclosure is to provide a surface roughness measurement auxiliary bracket and a surface roughness measurement system, which can reduce the overall detection time.
[0010] Accordingly, a surface roughness measurement auxiliary bracket is provided. The surface roughness measurement auxiliary bracket includes a bottom plate, two vertical plates, and a top plate. The bottom plate has a lower surface and an upper surface. The lower surface is an overall horizontal plane and is used to support on the horizontal plane of the work platform. The two vertical plates are installed on both sides of the bottom plate in the front-rear direction and are located at one end of the bottom plate in the left-right direction. The top plate is installed at the top ends of the two vertical plates. The size of the top plate in the left-right direction is smaller than the size of the bottom plate in the left-right direction. The top surface of the top plate is a horizontal plane and is used to support a surface roughness meter for detecting the surface roughness of an infrared material, which has a sensor probe located at the bottom surface and capable of telescoping. The part of the upper surface of the bottom plate that is not occupied by the projection of the top plate in the up-down direction is a horizontal lifting table area for placing a lifting table for lifting the infrared material to be detected.
[0011] A surface roughness measurement system includes the aforementioned surface roughness measurement auxiliary bracket, a surface roughness meter, and a lifting table. The surface roughness meter is used to detect the surface roughness of an infrared material and has a sensor probe located at the bottom surface and capable of telescoping. The lifting table is used to place the infrared material to be detected. The top surface of the top plate of the surface roughness measurement auxiliary bracket is a horizontal plane and is used to support the bottom surface of the surface roughness meter. The lifting table area on the upper surface of the bottom plate of the surface roughness measurement auxiliary bracket is used to place the lifting table.
[0012] The beneficial effects of the present disclosure are as follows.
[0013] In the surface roughness measurement auxiliary bracket and the surface roughness measurement system according to the present disclosure, the horizontal top surface of the top plate is used to support a surface roughness meter for detecting the surface roughness of an infrared material, which has a sensor probe located at the bottom surface and capable of telescoping. The overall horizontal lower surface is used to support on the horizontal plane of the work platform. And the horizontal lifting table area on the upper surface of the bottom plate, which is not occupied by the projection of the top plate in the up-down direction, is for placing a lifting table for lifting the infrared material to be detected. A height difference is formed in the up-down direction between the top surface of the top plate and the lifting table area of the bottom plate, and this height difference remains consistent in the left-right direction and the front-rear direction. By lifting and lowering the infrared material to be detected by the lifting table, the surface roughness meter can be adapted to detect the surface roughness of infrared materials with different sizes and shapes, improving the detection efficiency and reducing the detection difficulty.
[0014] In the surface roughness measurement auxiliary bracket and the surface roughness measurement system according to the present disclosure, the horizontal top surface of the top plate is used to support a surface roughness meter for detecting the surface roughness of an infrared material, which has a sensor probe capable of telescoping on the bottom surface. After the sensor probe extends out, the surface roughness meter is placed on the horizontal top surface of the top plate. The surface roughness meter only needs to be operated by an operator on its working buttons to work without any other interference (i.e., a more stable detection environment is provided), thereby ensuring the accuracy of detection and reducing detection errors.
[0015] In the surface roughness measurement auxiliary bracket and the surface roughness measurement system according to the present disclosure, the horizontal lifting table area on the upper surface of the bottom plate that is not occupied by the projection of the top plate in the up and down direction is provided for placing a lifting table for lifting the infrared material to be detected. After the surface roughness meter with the extended sensor probe is placed on the horizontal top surface of the top plate, the position of the infrared material to be detected relative to the sensor probe in the up and down direction can be adjusted by the lifting of the lifting table. When the position of the infrared material to be detected relative to the sensor probe in the up and down direction reaches the specified position, the lifting table stops lifting and adjusts, and then maintains the position of the infrared material to be detected relative to the sensor probe in the up and down direction. Thus, during the subsequent surface roughness detection process of the infrared material by the surface roughness meter, both the horizontal top surface of the top plate of the surface roughness measurement auxiliary bracket and the lifting table provide a stable detection environment, thereby ensuring the accuracy of detection, reducing detection errors, improving detection efficiency, and reducing the overall detection time. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] Figure 1 is a three-dimensional schematic diagram of a surface roughness meter for detecting the surface roughness of an infrared material.
[0017] Figure 2 is Figure 1 a three-dimensional schematic diagram of another angle of
[0018] Figure 3 is a three-dimensional view of a surface roughness measurement auxiliary bracket according to the present disclosure.
[0019] Figure 4 is a three-dimensional view of the surface roughness measurement auxiliary bracket according to the present disclosure placing the surface roughness meter and the lifting table.
[0020] Among them, the reference numerals are explained as follows:
[0021] 1000 Surface roughness measurement system 24 Plate surface
[0022] 100 Surface roughness measurement auxiliary bracket 3 Top plate
[0023] 1 Bottom plate 31 top surface
[0024] 11 Lower surface 32 Recess
[0025] 12 Upper surface 33 Top plate screw hole
[0026] 121 Area for lifting table S Space
[0027] 13 Bottom plate threaded hole 200 Surface roughness measuring instrument
[0028] 14 Groove 200a Sensor probe
[0029] 2 Vertical plate 300 Lifting table
[0030] 21 Bottom threaded hole D1 Front - to - back direction
[0031] 22 Top threaded hole D2 Left - to - right direction
[0032] 23 Hollow opening D3 Up - and - down direction Detailed implementation manners
[0033] The accompanying drawings illustrate embodiments of the present disclosure, and it will be understood that the disclosed embodiments are merely examples of the present disclosure, and the present disclosure can be implemented in various forms. Therefore, the specific details disclosed herein should not be construed as limiting, but only as a basis for the claims and as a representative basis for teaching those of ordinary skill in the art to implement the present disclosure in various ways.
[0034] [Auxiliary bracket for surface roughness measurement]
[0035] Referring to Figure 3 and Figure 4 , the auxiliary bracket 100 for surface roughness measurement according to the present disclosure includes a bottom plate 1, two vertical plates 2, and a top plate 3.
[0036] The bottom plate 1 has a lower surface 11 and an upper surface 12. The lower surface 11 is an overall horizontal plane and is used to support on the horizontal plane of a work platform (not shown). The two vertical plates 2 are installed on both sides of the bottom plate 1 in the front - to - back direction D1 and are located at one end of the bottom plate 1 in the left - to - right direction D2. The top plate 3 is installed at the top ends of the two vertical plates 2. The dimension of the top plate 3 in the left - to - right direction D2 is smaller than that of the bottom plate 1 in the left - to - right direction D2. The top surface 31 of the top plate 3 is a horizontal plane and is used to support a surface roughness measuring instrument 200 for detecting the surface roughness of an infrared material, which has a sensor probe 200a that can be telescoped and is located on the bottom surface. The part of the upper surface 12 of the bottom plate 1 that is not occupied by the projection of the top plate 3 in the up - and - down direction D3 is a horizontal area 121 for placing a lifting table 300 for lifting an infrared material to be detected (not shown).
[0037] In the surface roughness measurement auxiliary bracket 100 according to the present disclosure, the top surface 31 of the top plate 3 that is a horizontal plane is used to support a surface roughness meter 200 for detecting the surface roughness of an infrared material, which has a sensor probe 200a that can be telescoped and is located on the bottom surface. The lower surface 11 of the overall horizontal plane is used to support on the horizontal plane of the working platform, and the lifting table use area 12 that is horizontal on the upper surface 12 of the bottom plate 1 and is not occupied by the projection of the top plate 3 in the up and down direction D3 is provided for placing a lifting table 300 for lifting the infrared material to be detected. A height difference is formed between the top surface 31 of the top plate 3 and the lifting table use area 12 of the bottom plate 1 in the up and down direction D3, and this height difference remains consistent in the left and right direction D2 and the front and back direction D1. By lifting and lowering the infrared material to be detected by the lifting table 300, the surface roughness meter 200 can be adapted to detect the surface roughness of infrared materials of different sizes and shapes, improving the detection efficiency and reducing the detection difficulty.
[0038] In the surface roughness measurement auxiliary bracket 100 according to the present disclosure, the top surface 31 of the top plate 3 that is a horizontal plane is used to support a surface roughness meter 200 for detecting the surface roughness of an infrared material, which has a sensor probe 200a that can be telescoped and is located on the bottom surface. After the sensor probe 200a extends out, the surface roughness meter 200 is placed on the top surface 31 of the top plate 3 that is a horizontal plane. The surface roughness meter 200 only needs to be operated by an operator on its working keys to work without any other interference (that is, a more stable detection environment is provided), thereby ensuring the accuracy of detection and reducing detection errors.
[0039] In the surface roughness measurement auxiliary bracket 100 according to the present disclosure, the lifting table use area 12 that is horizontal on the upper surface 12 of the bottom plate 1 and is not occupied by the projection of the top plate 3 in the up and down direction D3 is provided for placing a lifting table 300 for lifting the infrared material to be detected. After the surface roughness meter 200 with the sensor probe 200a extended out is placed on the top surface 31 of the top plate 3 that is a horizontal plane, the position of the infrared material to be detected relative to the sensor probe 200a in the up and down direction D3 can be adjusted by lifting and lowering the lifting table 300. When the position of the infrared material to be detected relative to the sensor probe 200a in the up and down direction D3 reaches the specified position, the lifting table 300 stops lifting and lowering adjustment, and then maintains the position of the infrared material to be detected relative to the sensor probe 200a in the up and down direction D3. Thus, during the subsequent detection process of the surface roughness of the infrared material by the surface roughness meter 200, both the top surface 31 of the top plate 3 of the surface roughness measurement auxiliary bracket 100 and the lifting table 300 provide a stable detection environment, thereby ensuring the accuracy of detection, reducing detection errors, improving the detection efficiency, and reducing the overall detection time.
[0040] As Figure 3As shown, in one example, the bottom plate 1 is provided with a plurality of bottom plate threaded holes 13 in the area 121 for the lifting table, where screws (not shown) are screwed to fix the lifting table 300. Fixing the lifting table 300 through the bottom plate threaded holes 13 and screws further improves the stability of the detection environment. In addition, by fixing the lifting table 300 through the bottom plate threaded holes 13 and screws, the detachable installation of the lifting table 300 is realized.
[0041] As Figure 3 and Figure 4 shown, in one example, the bottom plate 1 is provided with grooves 14 penetrating in the left - right direction D2 on both sides in the front - back direction D1, and the bottoms of the two vertical plates 2 are seated in the corresponding grooves 14; the top plate 3 is provided with recesses 32 penetrating in the left - right direction D2 on both sides in the front - back direction D1, and the tops of the two vertical plates 2 are seated in the corresponding recesses 32. The arrangement of the grooves 14 and the recesses 32 facilitates the positioning of the two vertical plates 2 at both ends in the up - down direction D3, and also facilitates the top surface 31 of the top plate 3 to be a horizontal plane.
[0042] As Figure 3 and Figure 4 shown, in one example, the bottoms of the two vertical plates 2 are provided with bottom threaded holes 21 penetrating in the front - back direction D1 for screws (not shown) to be screwed and fix the bottoms of the two vertical plates 2 to the grooves 14 of the bottom plate 1; the tops of the two vertical plates 2 are provided with top threaded holes 22 penetrating in the front - back direction D1 for screws (not shown) to be screwed and fix the tops of the two vertical plates 2 to the recesses 32 of the top plate 3. By the cooperation of the screws and the bottom threaded holes 21 and the screws and the top threaded holes 22, the fixing of the two vertical plates 2 to the bottom plate 1 and the top plate 3 is realized, further improving the stability of the detection environment, and also realizing the detachable assembly of the two vertical plates 2 with the bottom plate 1 and the top plate 3.
[0043] As Figure 3 and Figure 4 shown, in one example, the top plate 3 is provided with top plate threaded holes 33 penetrating in the up - down direction D3 for screws (not shown) to be screwed and fix the surface roughness meter 200. Fixing the surface roughness meter 200 through the screws and the top plate threaded holes 33 further improves the stability of the detection environment. In addition, by fixing the surface roughness meter 200 through the screws and the top plate threaded holes 33, the detachable installation of the surface roughness meter 200 is realized.
[0044] As Figure 3 and Figure 4 shown, in one example, each vertical plate 2 is provided with a through - hole 23 penetrating in the front - back direction D1. Further, the area of the through - hole 23 is larger than half of the area of the plate surface 24 of the vertical plate 2, thereby reducing the weight of each vertical plate 2, and further facilitating the operator to manually carry the surface roughness measurement auxiliary bracket 100, and even the fixed surface roughness meter 200 and the lifting table 300.
[0045] As Figure 3 and Figure 4 shown, in one example, the bottom plate 1, the front vertical plate 2, and the top plate 3 are coplanar on the front side; the bottom plate 1, the rear vertical plate 2, and the top plate 3 are coplanar on the rear side. By being coplanar on the front and rear sides, it is more convenient to visually determine the parallelism of the top plate 3 on the front and rear sides, and further facilitate the realization that the top surface 31 of the top plate 3 is a horizontal plane.
[0046] As Figure 3 and Figure 4 shown, in one example, the space S enclosed by the bottom plate 1, the two vertical plates 2, and the top plate 3 is larger than the volume of the lifting platform 300 when it is completely folded together. Thus, the space S can be used to accommodate the lifting platform 300 that is not fixed or removed when completely folded together. Further, the area of the hollow opening 23 is set to be smaller than the area of the corresponding side when the lifting platform 300 is completely folded together and placed within the space S enclosed by the bottom plate 1, the two vertical plates 2, and the top plate 3.
[0047] [Surface Roughness Measurement System]
[0048] Referring Figure 4 , the surface roughness measurement system 1000 according to the present disclosure includes the aforementioned surface roughness measurement auxiliary bracket 100, surface roughness meter 200, and lifting platform 300.
[0049] The surface roughness meter 200 is used to detect the surface roughness of the infrared material. The surface roughness meter 200 has a sensor probe 200a located on the bottom surface and capable of telescoping. The lifting platform 300 is used to place the infrared material to be detected (not shown). The top surface 31 of the top plate 3 of the surface roughness measurement auxiliary bracket 100 is a horizontal plane and is used to support the bottom surface of the surface roughness meter 200; the lifting platform use area 121 of the upper surface 12 of the bottom plate 1 of the surface roughness measurement auxiliary bracket 100 is used to place the lifting platform 300.
[0050] For the specific structure, operation, and effects of the surface roughness measurement auxiliary bracket 100, refer to the foregoing, and no repeated description will be given here.
[0051] The surface roughness meter 200 having a sensor probe 200a located on the bottom surface and capable of telescoping can adopt any suitable commercially available brand, such as the surface roughness meter TR200 produced by Changzhou Mitutoyo Corporation.
[0052] The lifting platform 300 can adopt any suitable structure, such as Figure 4 the scissor lift shown or other forms of lifting platforms. The lifting platform 300 can adopt any commercially available device with a lifting function, such as the Z-axis manual lifting platform HTZ120.
[0053] Multiple exemplary embodiments are described with the detailed description above, but the present disclosure is not intended to be limited to the explicitly disclosed combinations. Thus, unless otherwise specified, the various features disclosed herein may be combined together to form multiple additional combinations not shown for purposes of brevity.
Claims
1. A surface roughness measurement auxiliary bracket, characterized in that the surface roughness measurement auxiliary bracket (100) includes a bottom plate (1), two vertical plates (2) and a top plate (3); The bottom plate (1) has a lower surface (11) and an upper surface (12). The lower surface (11) is an overall horizontal plane and is used to support on the horizontal plane of the working platform; The two vertical plates (2) are installed on both sides of the bottom plate (1) in the front-back direction (D1) and are located at one end of the bottom plate (1) in the left-right direction (D2); The top plate (3) is installed at the top ends of the two vertical plates (2). The size of the top plate (3) in the left-right direction (D2) is smaller than the size of the bottom plate (1) in the left-right direction (D2). The top surface (31) of the top plate (3) is a horizontal plane and is used to support a surface roughness meter (200) for detecting the surface roughness of an infrared material, which has a sensor probe (200a) located at the bottom and capable of telescoping; The part of the upper surface (12) of the bottom plate (1) that is not occupied by the projection of the top plate (3) in the up-down direction (D3) is a horizontal lifting table use area (121) for placing a lifting table (300) for lifting the infrared material to be detected.
2. The surface roughness measurement auxiliary bracket according to claim 1, characterized in that The bottom plate (1) is provided with a plurality of bottom plate threaded holes (13) in the lifting table use area (121) for screw connection of screws to fix the lifting table (300).
3. The surface roughness measurement auxiliary bracket according to claim 1, characterized in that The bottom plate (1) is provided with grooves (14) penetrating in the left-right direction (D2) on both sides in the front-back direction (D1). The bottoms of the two vertical plates (2) are seated in the corresponding grooves (14); The top plate (3) is provided with recesses (32) penetrating in the left-right direction (D2) on both sides in the front-back direction (D1). The tops of the two vertical plates (2) are seated in the corresponding recesses (32).
4. The surface roughness measurement auxiliary bracket according to claim 3, characterized in that The bottoms of the two vertical plates (2) are provided with bottom threaded holes (21) penetrating in the front-back direction (D1) for screw connection of screws to fix the bottoms of the two vertical plates (2) at the grooves (14) of the bottom plate (1); The tops of the two vertical plates (2) are provided with top threaded holes (22) penetrating in the front-back direction (D1) for screw connection of screws to fix the tops of the two vertical plates (2) at the recesses (32) of the top plate (3).
5. The surface roughness measurement auxiliary bracket according to claim 1, characterized in that The top plate (3) is provided with top plate screw holes (33) penetrating in the up-down direction (D3) for screw connection of screws to fix the surface roughness meter (200).
6. The surface roughness measurement auxiliary bracket according to claim 1, characterized in that Each vertical plate (2) is provided with a through hollow opening (23) in the front-back direction (D1).
7. The surface roughness measurement auxiliary bracket according to claim 6, characterized in that The area of the hollow opening (23) is larger than half of the area of the plate surface (24) of the vertical plate (2).
8. The surface roughness measurement auxiliary bracket according to claim 1, characterized in that The bottom plate (1), the front vertical plate (2) and the top plate (3) are coplanar on the front side; The bottom plate (1), the rear vertical plate (2) and the top plate (3) are coplanar on the rear side.
9. The auxiliary bracket for measuring surface roughness according to claim 7, characterized in that The space (S) enclosed by the bottom plate (1), the two vertical plates (2) and the top plate (3) is larger than the volume of the lifting platform (300) when it is completely folded together; The area of the hollow opening (23) is set to be smaller than the area of the corresponding side when the lifting platform (300) is completely folded together and placed in the space (S) enclosed by the bottom plate (1), the two vertical plates (2) and the top plate (3).
10. A surface roughness measurement system, characterized in that, It includes the auxiliary bracket (100) for measuring surface roughness according to any one of claims 1-9, a surface roughness meter (200) and a lifting platform (300); The surface roughness meter (200) is used to detect the surface roughness of the infrared material, and the surface roughness meter (200) has a sensor probe (200a) located on the bottom surface and capable of telescoping; The lifting platform (300) is used to place the infrared material to be detected, The top surface (31) of the top plate (3) of the auxiliary bracket (100) for measuring surface roughness is a horizontal plane and is used to support the bottom surface of the surface roughness meter (200); The area (121) for the lifting platform on the upper surface (12) of the bottom plate (1) of the auxiliary bracket (100) for measuring surface roughness is used to place the lifting platform (300).