Intelligent temperature simulation system

Abstract

The utility model discloses an intelligent temperature simulation system, and relates to the technical field of circuit detection, the intelligent temperature simulation system comprises a resistor simulation side and a controller, the resistor simulation side comprises an adjusting end and a simulation end, the controller controls and is connected with the adjusting end of the resistor simulation side, the simulation side is powered by a power supply unit, and the adjusting end of the resistor simulation side is connected with the simulation end. And the simulation end is externally connected with a detection system to be tested. The technical problems that in the prior art, when a circuit in a temperature detection system is detected or debugged, input resistance control is difficult, and stability is low can be solved, and the circuit has the advantages of being accurate, easy to adjust and high in reliability.

Description

Technical Field

[0001] The present invention relates to the technical field of circuit detection, and specifically to an intelligent temperature simulation system. Background Art

[0002] In a temperature detection system, temperature is generally collected through an NTC (thermistor). When testing or debugging the temperature measurement system, if the NTC is normally connected to the temperature measurement system to be tested, different temperature ranges need to be adjusted. Or in the prior art, a potentiometer controlled by a knob is used to simulate the input resistance value, and the potentiometer is rotated manually to simulate. The delay difference of the temperature acquisition system and the blindness of manual rotation make it difficult to quickly and accurately find the simulated resistance value by this method.

[0003] In the prior art, the control methods for temperature detection are relatively mature, but the hardware support applied generally has a relatively high cost. Since the detection accuracy is proportional to the hardware cost, balancing the accuracy and hardware cost is an important issue in this type of circuit design. The present application provides an intelligent temperature simulation system that is more stable and more cost-effective while ensuring the detection function and accuracy. Summary of the Invention

[0004] The present invention proposes an intelligent temperature simulation system, which can overcome the technical problems of difficult input resistance value control and low stability in the circuit detection or debugging of the temperature detection system in the traditional technology, and has the characteristics of accuracy, easy adjustment, strong reliability, easy maintenance, and high economic cost.

[0005] The technical solution of the present invention is as follows:

[0006] An intelligent temperature simulation system includes a resistance simulation side and a controller. The resistance simulation side includes an adjustment end and a simulation end. The controller is connected to the adjustment end of the resistance simulation side for control. The simulation side is powered by a power supply unit. The adjustment end and the simulation end of the resistance simulation side are externally connected to a detection system to be tested.

[0007] As a further optimization of this solution, the model of the core chip of the simulation side is AD5272 or AD5274.

[0008] As a further optimization of this solution, the resistance simulation side includes a test circuit. The test circuit includes a chip U1. The VCC pin and the RESSTER pin of the chip U1 are connected to a high potential. The A pin and the W pin of the chip U1 are connected to a debugging end. The VSS pin of the chip U1 is grounded. The ETX_CAP pin of the chip U1 is left floating. The ADDR pin and the GND pin of the chip U1 are grounded. The SCL pin and the SDA pin of the chip U1 are used as the adjustment end.

[0009] As a further optimization of this solution, there are three test circuits with the same principle. The adjustment terminals of the three test circuits are in a parallel relationship, and the analog terminals of the three test circuits do not affect each other complementarily.

[0010] As a further optimization of this solution, a boosting voltage is connected to the adjustment terminal on the resistor analog side.

[0011] As a further optimization of this solution, the controller is controllably connected to a display screen interface, the controller is also connected to an input module, and the controller is connected to a download and power supply module.

[0012] As a further optimization of this solution, the controller is also connected to a variety of communication interfaces.

[0013] The working principle and beneficial effects of the present invention are as follows:

[0014] This application uses AD5272 to simulate the resistance value of a variable resistor. Different NTC resistance values corresponding to different temperatures are input in advance through the controller, and the corresponding resistance values are input into the register on the resistor analog side. When a certain temperature needs to be simulated, only the resistance value corresponding to that temperature needs to be input to the controller, and the controller controls the chip AD5272, thereby achieving precise input of different resistance values, increasing the reliability, stability, and convenience in the test process.

[0015] This solution can select the desired temperature at any time through a button, quickly simulate the resistance value, and has simple operation. It can support 3-channel analog output simultaneously. It can set NTC with different B values through software, has a wide practical range, and strong operability. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The following further elaborates on the present invention in detail in conjunction with the drawings and specific embodiments.

[0017] Figure 1 is the circuit schematic diagram of the resistor analog side in this application;

[0018] Figure 2 is the controller and its peripheral circuit in the embodiment;

[0019] Figure 3 is the circuit schematic diagram of the LCD interface circuit in the controller in the embodiment;

[0020] Figure 4 is the circuit schematic diagram of the expansion interface in the controller in the embodiment;

[0021] Figure 5 is the circuit schematic diagram of the 485 circuit serial port in the controller in the embodiment;

[0022] Figure 6Circuit schematic diagram of the independent EEPROM bus in the controller in the embodiment;

[0023] Figure 7 Circuit schematic diagram of the download and power supply circuit in the controller in the embodiment;

[0024] Figure 8 Circuit schematic diagram of the NRF interface in the controller in the embodiment;

[0025] Figure 9 Circuit schematic diagram of the external FLASH in the controller in the embodiment;

[0026] Figure 10 Circuit schematic diagram of the wifi interface esp8266 in the controller in the embodiment;

[0027] Figure 11 Button scan diagram of the controller in the embodiment. Detailed implementation manners

[0028] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without making creative efforts fall within the scope of protection of the present invention.

[0029] An intelligent temperature simulation system includes a resistance simulation side and a controller. The resistance simulation side includes an adjustment end and a simulation end. The controller is controllably connected to the adjustment end of the resistance simulation side. The simulation side is powered by a power supply unit. The adjustment end of the resistance simulation side and the simulation end are externally connected to a detection system to be tested.

[0030] As shown in the attached Figure 1 description, the model number of the core chip of the simulation side is AD5272 or AD5274. The resistance simulation side includes a test circuit. The test circuit includes a chip U1. The VCC pin and the RESSTER pin of the chip U1 are connected to a high potential. The A pin and the W pin of the chip U1 are connected to a debugging end. The VSS pin of the chip U1 is grounded. The ETX_CAP pin of the chip U1 is left floating. The ADDR pin and the GND pin of the chip U1 are grounded. The SCL pin and the SDA pin of the chip U1 are used as the adjustment end. There are three paths of the test circuits with the same principle. The adjustment ends of the three paths of the test circuits are in a parallel relationship, and the simulation ends of the three paths of the test circuits do not affect each other. A boosting voltage is connected to the adjustment end of the resistance simulation side.

[0031] As shown in the attached Figure 2As described above, the controller is connected to a display interface, and the controller is also connected to an input module. The controller is connected to a download and power supply module. The controller is also connected to a variety of communication interfaces. Among them, Figure 2-11 This is an embodiment applied to this application, a way of building a single-chip microcomputer circuit. When the operator uses it, first select the start key, select one of the test circuits on the resistor simulation side that needs to be applied, and input the resistance value corresponding to the temperature required for this channel to the resistor simulation side through the single-chip microcomputer. By adjusting the test circuit, an appropriate resistance value output can be completed.

[0032] The wiper setting of AD5272 can be controlled through an I²C-compatible digital interface. The content of the RDAC register determines the wiper position of the resistor. The RDAC register is used as a temporary register, allowing unrestricted change of the resistor setting. The RDAC register can be programmed with any position setting using the I²C interface. When the required wiper position is found,

[0033] this value can be stored in the 50-TP memory register. The wiper position will always be restored to this position when powered on later.

[0034] This solution has a total of 3 test terminals, through a 6P socket with a pitch of 2.0 (P2). When testing the temperature of a certain path, connect the test circuit to this path (for example: when testing the first path, connect the test interface to the NTC1 port). The resistance value of AD5272 can be programmed and written into the 50-TP memory through SCT8A8K64S4A12, and unlimited adjustments can be made.

[0035] Select the corresponding channel on the LCD display screen with the up and down keys. After confirming OK, input the corresponding number through the keyboard. After SCT8A8K64S4A12 obtains the array, it communicates with the corresponding AD5272.

[0036] The content of the RDAC register of AD5272 determines the wiper position of the resistor. The RDAC register is used as a temporary register, allowing unrestricted change of the resistor setting. SCT8A8K64S4A12 can write to and read the RDAC register through the I²C interface. When the required wiper position is found, this value can be stored in the 50-TP memory register. The wiper position will always be restored to this position when powered on later. Storing 50-TP data takes about 350 ms; during this period, AD5272 / AD5274 will be locked and will not respond to any new commands, thus preventing any changes. The response bit can be polled to verify whether the fuse programming command is completed.

[0037] The intelligent temperature simulation system can simulate the resistance values of ntc3950 at different temperatures directly at room temperature without bringing ntc3950 to different temperatures for testing. The NTC-resistance correspondence table can be programmed into the MCU. During testing, only the required temperature value needs to be input on the panel and the test circuit is connected to the corresponding interface, then the resistance values of various temperature acquisition systems can be simulated. There is no need to manually adjust the potentiometer. Additionally, it avoids the inaccuracy caused by the error of the sampling rate of the temperature acquisition system during manual simulation when the potentiometer is adjusted back and forth. It can be used in R & D platforms and various laboratory scenarios, with strong direct visibility, no need for manual calculation, saving time and being more simple and convenient to operate.

[0038] This application only protects the circuit hardware and provides an economically strong circuit design. The description of the temperature detection method in this application is only for easy understanding.

[0039] The above are only the preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. An intelligent temperature simulation system, characterized in that, It includes a resistance simulation side and a controller. The resistance simulation side includes an adjustment terminal and an analog terminal. The controller is controllably connected to the adjustment terminal of the resistance simulation side. The analog side is powered by a power supply unit. The adjustment terminal of the resistance simulation side and the analog terminal are externally connected to a detection system to be tested.

2. An intelligent temperature simulation system according to claim 1, characterized in that, The core chip of the resistance simulation side is of the model AD5272 or AD5274.

3. An intelligent temperature simulation system according to claim 2, characterized in that, The resistance simulation side includes a test circuit. The test circuit includes a chip U1. The VCC pin and the RESSTER pin of the chip U1 are connected to a high potential. The A pin and the W pin of the chip U1 are connected to a debugging terminal. The VSS pin of the chip U1 is grounded. The ETX_CAP pin of the chip U1 is left floating. The ADDR pin and the GND pin of the chip U1 are grounded. The SCL pin and the SDA pin of the chip U1 serve as the adjustment terminal.

4. An intelligent temperature simulation system according to claim 3, characterized in that, There are three paths of the test circuits with the same principle. The adjustment terminals of the three paths of test circuits are in a parallel relationship, and the analog terminals of the three paths of test circuits do not affect each other complementarily.

5. An intelligent temperature simulation system according to claim 3, characterized in that, A boosting voltage is connected to the adjustment terminal of the resistance simulation side.

6. An intelligent temperature simulation system according to claim 1, characterized in that, The controller is controllably connected to a display screen interface. The controller is also connected to an input module. The controller is connected to a download and power supply module.

7. An intelligent temperature simulation system according to claim 6, characterized in that, The controller is also connected to a variety of communication interfaces.

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