Adjusting test fixture

Abstract

The utility model provides an adjusting test fixture which comprises a carrier platform, an adjusting mechanism, a clamping mechanism and a clamping mechanism, the carrier platform is provided with a containing groove, a mounting groove is formed in the carrier platform, the containing groove is used for containing a substrate to be tested, and the mounting groove is located below the containing groove and communicated with the containing groove; the substrate supporting seat is arranged in the mounting groove in a sliding manner, a plurality of probes are arranged on the substrate supporting seat, and the substrate supporting seat drives the plurality of probes to be in contact with or separated from the test position of the substrate to be tested; and the fixing device is arranged on the carrier platform and is used for fixing the substrate to be tested in the accommodating groove. The adjusting and testing clamp is flexible and simple to operate and low in manufacturing cost, the specific area of the sample substrate to be tested can be flexibly selected to be tested, and the testing efficiency can be improved by using the adjusting and testing clamp.

Description

Technical Field

[0001] The utility model relates to the field of circuit board testing, in particular to an adjustment test fixture. Background Art

[0002] During substrate processing, testing is required. A single substrate typically has multiple test locations. The existing testing solution involves connecting leads to the test locations, then soldering these leads to power lines to enable testing. However, this solution is costly and carries the risk of gold wires falling off, which can easily lead to test errors. This reduces test efficiency and prevents reusability. Utility Model Content

[0003] In view of the above-mentioned shortcomings of the prior art, the purpose of the present invention is to provide an adjustable test fixture to solve the problems of complicated operation and low test efficiency in the related art.

[0004] To achieve the above-mentioned purpose and other related purposes, the present invention provides an adjustment test fixture including: a carrier platform, a receiving groove is provided on the carrier platform, a mounting groove is provided in the carrier platform, the receiving groove is used to receive the substrate to be tested, and the mounting groove is located below the receiving groove and is connected to the receiving groove; a substrate support seat is slidably arranged in the mounting groove, a plurality of probes are provided on the substrate support seat, and the substrate support seat drives the plurality of probes to contact or separate from the test position of the substrate to be tested; a fixing device is provided on the carrier platform, and the fixing device is used to fix the substrate to be tested in the receiving groove.

[0005] Preferably, the adjustment test fixture also includes a test board, which is arranged under the carrier platform. The test board is provided with multiple test ports, and the multiple probes are respectively connected to the multiple test ports in a one-to-one correspondence, and at least some of the test ports are used for external power supply.

[0006] Preferably, the adjustment test fixture also includes a substrate fixing carrier, which is positioned in the accommodating slot. The substrate fixing carrier is provided with a positioning slot for positioning the substrate to be tested on the side facing the accommodating slot. Two fixing clips are rotatably provided on the substrate fixing carrier, and the two fixing clips are respectively provided on both sides of the positioning slot, and are used to rotatably clamp the substrate to be tested to fix the substrate to be tested in the positioning slot.

[0007] Preferably, the substrate fixing carrier is provided with a plurality of positioning pins arranged at intervals, and the plurality of positioning pins are located in the positioning grooves for inserting and positioning the substrate to be tested.

[0008] Preferably, the fixing device includes an upper cover and a lock, one end of the upper cover is rotatably connected to the carrier platform, the lock is located at the other end of the upper cover, and a slot cooperating with the lock is provided on the carrier platform.

[0009] Preferably, a groove is provided on the side of the substrate fixing carrier, and the fixing device includes a positioning mechanism connected to the carrier platform and one end of the positioning mechanism elastically extends and retracts in the accommodating groove to be inserted into or out of the groove.

[0010] Preferably, the end portion of the positioning mechanism for contacting the substrate fixing carrier is arc-shaped.

[0011] Preferably, a plurality of spaced-apart pressing blocks are provided on a side of the upper cover facing the receiving groove, and the plurality of pressing blocks are used to press the substrate to be tested.

[0012] Preferably, the adjustment test fixture further comprises a driving mechanism, wherein the driving mechanism comprises a power source and a transmission member for enabling the substrate support to move.

[0013] Preferably, the transmission member includes a cam structure, a gear rack structure or a pneumatic telescopic member.

[0014] As described above, the adjustable test fixture of the present invention has the following beneficial effects: the adjustable test fixture is flexible and simple to operate, and has low manufacturing costs. Testers can power some probes according to test requirements, so that they can flexibly select specific areas of the sample substrate to be tested for testing. Since there is no need to wire the substrate to be tested during the test process, time is saved and test efficiency is improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 Shown is a schematic diagram of the adjustment test fixture of the present invention.

[0016] Figure 2 Shown is a schematic diagram of the carrier platform, substrate support seat and fixing device in the adjustable test fixture of the present invention.

[0017] Figure 3 Shown is a schematic diagram of adjusting a substrate fixing carrier in a test fixture according to the present invention.

[0018] Component number description

[0019] 10 vehicle platforms

[0020] 11 storage slots

[0021] 12 card slots

[0022] 20 substrate support seat

[0023] 21 probes

[0024] 30 test boards

[0025] 31 test ports

[0026] 40 substrate fixing carrier

[0027] 41 fixing clip

[0028] 42 positioning pin

[0029] 43 grooves

[0030] 50 top cover

[0031] 51 briquetting

[0032] 60 locks

[0033] 70 positioning mechanism

[0034] 80 knob DETAILED DESCRIPTION

[0035] The following describes the embodiments of the present invention through specific examples. Those skilled in the art will readily understand the other advantages and benefits of the present invention from the disclosure herein. The present invention may also be implemented or applied through various other specific embodiments, and the details in this specification may be modified or altered based on different perspectives and applications without departing from the spirit of the present invention.

[0036] See also Figure 1-Figure 3 It should be noted that the illustrations provided in this embodiment are merely schematic illustrations of the basic concept of the present invention. Therefore, the illustrations only show components relevant to the present invention and are not drawn according to the number, shape, and size of components in actual implementation. In actual implementation, the type, quantity, and proportion of each component may be arbitrarily changed, and the component layout may also be more complex.

[0037] This embodiment provides an adjustment test fixture, which is used to test multiple test locations on a substrate at the same time.

[0038] The adjustable test fixture includes a carrier platform 10, a substrate support seat 20, and a fixing device. The carrier platform 10 is provided with a receiving slot 11, and a mounting slot is provided within the carrier platform 10. The receiving slot 11 is used to accommodate the substrate to be tested. The mounting slot is located below and communicates with the receiving slot 11. The substrate support seat 20 is slidably disposed within the mounting slot. The substrate support seat 20 is provided with multiple probes 21. The substrate support seat 20 can drive the probes 21 to slide along the receiving slot 11 to contact or detach the test position on the substrate to be tested. The fixing device is provided on the carrier platform 10 and is used to fix the substrate to be tested within the receiving slot 11.

[0039] During the process of testing the substrate, the substrate is placed in the receiving groove 11 for positioning, and the fixing device fixes the substrate to prevent the substrate from shifting at will. The substrate support seat 20 is moved to be close to the substrate, so that the substrate support seat 20 contacts the test position on the substrate with the probe 21. It can be understood that each probe 21 contacts a different pin at each test position on the substrate, and each probe 21 can be used to test a different pin. In addition, since the substrate support seat 20 can drive the probe 21 to move, when a substrate is tested, the probe 21 can be retracted to the mounting groove by the substrate support seat 20, thereby achieving the purpose of protecting the probe 21 and preventing the probe 21 from being damaged and broken. Specifically, the number of probes 21 on the substrate support seat 20 is multiple groups, and the number of probes 21 in each group is multiple, and each group of probes 21 corresponds to multiple test positions on the substrate. Through such an arrangement, multiple test positions can be tested at the same time.

[0040] The adjustment test fixture also includes a test plate 30, which is arranged below the carrier platform 10. The test plate 30 is provided with a plurality of test ports 31, and a plurality of probes 21 are respectively connected to the plurality of test ports 31 in a one-to-one correspondence. During the test process, at least some of the test ports 31 are used for external power supply. The receiving groove 11 is opened on the side of the carrier platform 10 away from the test plate 30. The opening connecting the mounting groove and the receiving groove 11 is located at the bottom of the receiving groove 11. When no substrate to be tested is placed in the receiving groove 11, when the substrate support seat 20 slides along the mounting groove, it can drive the probes 21 to protrude or retract into the mounting groove; when a substrate to be tested is placed in the receiving groove 11, when the substrate support seat 20 slides along the mounting groove, it can drive the plurality of probes 21 to contact or detach from the test position of the substrate to be tested.

[0041] Specifically, each test port 31 on the test board 30 is connected to each probe 21 through wiring. With such a design, the tester can design the wiring according to the test requirements at any time. According to the test requirements, some of the test ports 31 can be wired, so as to power different probes 21 and then test different pins. The test operation is not only simple but also fast. Since the substrate support seat 20 is slidably arranged in the mounting groove, the mounting groove not only serves as a container, so that the substrate support seat 20 can drive the probe 21 to retract into the mounting groove, thereby preventing the probe 21 from being damaged, but also the mounting groove serves as a sliding guide for the substrate support seat 20.

[0042] The adjustment test fixture also includes a substrate fixing carrier 40, which is positioned in the receiving groove 11. The substrate fixing carrier 40 is provided with a positioning groove for positioning the substrate to be tested on the side facing the receiving groove 11. Two fixing clamps 41 are rotatably provided on the substrate fixing carrier 40. The two fixing clamps 41 are respectively provided on both sides of the positioning groove and are used to rotate and clamp the substrate to be tested to fix the substrate to be tested in the positioning groove.

[0043] Specifically, the positioning groove can be a closed form, that is, the positioning groove is surrounded by four groove walls, and the substrate is embedded in the positioning groove. The four groove walls of the positioning groove are arranged around the circumference of the substrate to position it. The positioning groove can be a through groove, that is, the positioning groove passes through the substrate fixing carrier 40 along the width direction of the substrate fixing carrier 40. When the substrate is embedded in the positioning groove, the two groove walls of the positioning groove position the substrate.

[0044] To secure the substrate, the clamp 41 rotates, causing a portion of the fixture to rotate above the substrate. The clamp 41 then positions the substrate, preventing it from escaping the receiving slot 11. For example, the clamp 41 is semicircular. When one end of the semicircular shape rotates above the substrate, the clamp 41 secures the substrate within the receiving slot 11. When the semicircular end of the clamp 41 rotates away from the substrate, the substrate can be removed from the receiving slot 11. Since the substrate can be secured and released simply by rotating the clamp 41, operation is simple and easy.

[0045] In order to accurately position the substrate, the substrate fixing carrier 40 is provided with a plurality of positioning pins 42 arranged at intervals. The plurality of positioning pins 42 are located in the positioning grooves. When the substrate is placed in the positioning grooves, the plurality of positioning pins 42 are inserted into the substrate.

[0046] The fixing device includes an upper cover 50 and a lock 60 . One end of the upper cover 50 is rotatably connected to the carrier platform 10 . The lock 60 is located at the other end of the upper cover 50 . The carrier platform 10 is provided with a slot 12 for the lock to cooperate with.

[0047] Specifically, the upper cover 50 is used to press the substrate against the carrier platform 10 to prevent movement during testing, thereby avoiding affecting the test results. For example, a latch 60 is rotatably connected to the upper cover 50. One end of the latch 60 is configured to engage within the latch slot 12, and the other end of the latch 60 is configured to be disposed between the latch 60 and the upper cover 50 to provide a torsion spring or spring. When the upper cover 50 is positioned over the receiving slot 11 on the carrier platform 10, the latch 60 is engaged within the latch slot 12 under the action of the torsion spring or spring.

[0048] In order to press the substrate, a plurality of spaced-apart pressing blocks 51 are provided on the side of the upper cover 50 facing the receiving groove 11. When fixing the substrate, each pressing block 51 presses each test position on the substrate. This arrangement can fix the substrate more firmly.

[0049] A groove 43 is formed on the side of the substrate fixing carrier 40 . The fixing device includes a positioning mechanism 70 connected to the carrier platform 10 . One end of the positioning mechanism 70 elastically extends and retracts within the receiving groove 11 to be inserted into or out of the groove 43 .

[0050] Specifically, a plurality of grooves 43 are provided on the side of the substrate fixing carrier 40, and the plurality of grooves 43 are spaced apart along the length direction of the substrate fixing carrier 40. A receiving hole is provided on at least one side wall of the receiving groove 11, and a portion of the structure of the positioning mechanism 70 is slidably disposed in the receiving hole. A spring is provided between the positioning mechanism 70 and the bottom of the receiving hole, and the positioning mechanism 70 elastically contacts the substrate fixing carrier 40 under the action of the spring. When the substrate fixing carrier 40 is placed in the receiving groove 11, the positioning mechanism 70 elastically inserts into the groove 43 under the action of the spring to press the substrate fixing carrier 40. The positioning mechanism 70 can effectively prevent the substrate fixing carrier 40 from shaking. The positioning mechanism 70 is cylindrical, and in other embodiments, the positioning mechanism 70 is spherical.

[0051] In order to facilitate the insertion and removal of the positioning mechanism 70 into or out of the groove 43 , the end of the positioning mechanism 70 for contacting the substrate fixing carrier 40 is arc-shaped.

[0052] The adjustment test fixture also includes a driving mechanism, which includes a power source and a transmission member. The power source can enable the substrate support seat to move. The transmission member can be a cam structure. Specifically, the transmission member is a cam. The transmission member is rotatably connected to the carrier platform 10. The transmission member is located in the mounting groove and is located below the substrate support seat 20. The bottom surface of the substrate support seat 20 is provided with a curved groove adapted to the transmission member. When the transmission member rotates, the transmission member always remains in contact with the curved groove. As the transmission member rotates, the transmission member drives the substrate support seat 20 to achieve lifting movement. The power source of the transmission member can be a motor or a knob 80. The knob 80 is connected to the transmission member by an axis. The knob 80 is provided on the outer side of the carrier platform 10. By rotating the knob 80, the transmission member can be driven to rotate, thereby causing the substrate support seat 20 to rise and fall relative to the carrier platform 10.

[0053] The transmission member may also be a gear and rack structure, with the gear and rack both disposed in the mounting slot, the gear connected to the knob 80 via a shaft, and the rack disposed on the substrate support 20, with the gear and rack meshing with each other. In other embodiments, the pneumatic telescopic member may be a cylinder, with the power source being an air source, and the substrate support 20 being raised and lowered by the cylinder.

[0054] In summary, the implementation process of adjusting the test fixture in this embodiment is as follows: place the substrate in the positioning groove, and insert the positioning pin 42 into the substrate, and then rotate the fixing clamp 41 to fix the substrate to the substrate fixing carrier 40. The substrate is placed toward the carrier platform 10 and the substrate fixing carrier 40 is placed in the receiving groove 11. At this time, the positioning mechanism 70 is inserted into the groove 43 of the substrate fixing carrier 40 to press the substrate fixing carrier 40. Then, the upper cover 50 is rotated so that the upper cover 50 is covered on the substrate fixing carrier 40. The pressure block 51 presses the substrate to the carrier platform 10, and the lock 60 is engaged with the card slot 12. Under the action of the lock 60, the upper cover 50 always maintains the state of pressing the substrate fixing carrier 40. Finally, the knob 80 is turned so that the probe 21 on the substrate support seat 20 contacts the test position of the substrate, and then the external power supply supplies power to the test port 31 for testing. After a test operation is completed, the upper cover 50 is released, and the untested test position on the substrate is continuously advanced to the receiving groove 11, and then the above operation is repeated to continue the test. Therefore, the utility model effectively overcomes the various shortcomings of the prior art and has high industrial application value.

[0055] The above embodiments are merely illustrative of the principles and effects of the present invention and are not intended to limit the present invention. Anyone skilled in the art may modify or alter the above embodiments without departing from the spirit and scope of the present invention. Therefore, all equivalent modifications or alterations made by one of ordinary skill in the art without departing from the spirit and technical principles disclosed in the present invention are intended to be covered by the claims of the present invention.

Claims

1. An adjustment test fixture, characterized in that: include: A carrier platform, wherein a receiving groove is provided on the carrier platform, a mounting groove is provided in the carrier platform, the receiving groove is used to receive the substrate to be tested, and the mounting groove is located below the receiving groove and communicated with the receiving groove; A substrate support seat is slidably disposed in the mounting groove, and a plurality of probes are provided on the substrate support seat, and the substrate support seat drives the plurality of probes to contact or separate from the test position of the substrate to be tested; A fixing device is provided on the carrier platform, and is used for fixing the substrate to be tested in the receiving groove.

2. The adjustment test fixture according to claim 1, characterized in that: The adjustment test fixture also includes a test board, which is arranged under the carrier platform. The test board is provided with multiple test ports, and the multiple probes are respectively connected to the multiple test ports in a one-to-one correspondence. At least some of the test ports are used for external power supply.

3. The adjustment test fixture according to claim 1, wherein: The adjustment test fixture also includes a substrate fixing carrier, which is positioned in the accommodating slot. The substrate fixing carrier is provided with a positioning slot for positioning the substrate to be tested on one side facing the accommodating slot. Two fixing clips are rotatably provided on the substrate fixing carrier, and the two fixing clips are respectively provided on both sides of the positioning slot, and are used to rotatably clamp the substrate to be tested to fix the substrate to be tested in the positioning slot.

4. The adjustment test fixture according to claim 3, characterized in that: The substrate fixing carrier is provided with a plurality of positioning pins arranged at intervals, and the plurality of positioning pins are located in the positioning grooves for inserting and positioning the substrate to be tested.

5. The adjustment test fixture according to claim 1, wherein: The fixing device includes an upper cover and a lock. One end of the upper cover is rotatably connected to the carrier platform. The lock is located at the other end of the upper cover. A slot cooperating with the lock is provided on the carrier platform.

6. The adjustment test fixture according to claim 3, characterized in that: A groove is provided on the side of the substrate fixing carrier. The fixing device includes a positioning mechanism connected to the carrier platform. One end of the positioning mechanism is elastically extended in the receiving groove to be inserted into or out of the groove.

7. The adjustment test fixture according to claim 6, characterized in that: The end portion of the positioning mechanism for contacting the substrate fixing carrier is arc-shaped.

8. The adjustment test fixture according to claim 5, characterized in that: A plurality of spaced-apart pressing blocks are provided on a side of the upper cover facing the receiving groove, and the plurality of pressing blocks are used to press the substrate to be tested.

9. The adjustment test fixture according to claim 1, wherein: The adjustment test fixture further includes a driving mechanism, which includes a power source and a transmission member for enabling the substrate support seat to move.

10. The adjustment test fixture according to claim 9, characterized in that: The transmission member includes a cam structure, a gear rack structure or a pneumatic telescopic member.

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