Test tool clamp for diode
By designing a tooling fixture suitable for diode testing and connecting modules, the problems of conductivity polarity degeneration and poor applicability in the prior art are solved, and multiple diodes are simultaneously tested, which improves efficiency and accuracy and reduces costs.
Patent Information
- Application Number
- CN202422534512.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-21
- Publication Date
- 2025-09-05
- Estimated Expiration
- 2034-10-21
AI Technical Summary
During use, existing diode test fixtures have problems such as deterioration of conductivity, poor contact and poor applicability, resulting in low testing efficiency, high cost and inability to adapt to diodes of different packaging types.
Design a diode test tool clamp including a PCB substrate and a test seat, equipped with a positive and negative electrode connection module and a test instrument, realizes a variety of test functions, connect the device under test and the test instrument through wires, improving connection stability and applicability.
Multiple diodes are tested simultaneously, shortening time and improving efficiency, enhancing testing accuracy, reducing costs and ensuring product reliability.
Smart Images
Figure CN223308250U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to a diode testing technology and use equipment, in particular to a fixture for diode testing. Background Art
[0002] During the diode manufacturing process, due to human factors or fluctuations in raw materials, process conditions, and equipment conditions, it is impossible for all final products to achieve the expected inherent reliability. In each batch of finished products, there are always some products with some potential defects and weaknesses. These potential defects and weaknesses will manifest as early failures under certain stress conditions. The average lifespan of components with early failures is much shorter than that of normal products.
[0003] In order to ensure the quality of the products, the components will be tested before they leave the factory or before they are used, and those that barely pass the test will be eliminated. The aging test can shorten the time of early failure of components and fully expose the failure mechanism of most components, so that the components enter the accidental failure period in advance, ensuring the reliability of the components when they are put into use.
[0004] Testing is a relatively important process in the diode production process. The test process is to connect the sample to be tested with the test fixture, and the test fixture is connected to the test machine, so that the sample to be tested is connected to the test machine, and the reliability of the sample to be tested is evaluated. The purpose of the test is to detect electronic components and determine or evaluate the functions and performance of electronic components by testing their functions or performance parameters; by stipulating the test procedures for electronic components at room temperature and high and low temperature environments, the electrical performance tests of electronic components at room temperature and high and low temperature environments meet the standard requirements.
[0005] According to the experience accumulated from experimental tests and usage cases, the polarity conductive electrodes on the test fixture will cause a certain degree of degradation of the conductive metal as the use time and frequency increase, resulting in polarity virtual connection or poor contact. In addition, for diodes of different models and shapes, different specifications of test fixtures need to be selected, forming a dedicated board and dedicated method, which is costly and inconvenient to use. Each package type of the tested sample corresponds to a test fixture, and different test fixtures are made according to different package types. If the tested sample cannot be packaged into a package type supported by the existing test fixture, a new test fixture can only be made, otherwise the test cannot be carried out.
[0006] Therefore, it is necessary to provide a diode testing fixture to solve the above problems. Utility Model Content
[0007] The purpose of the utility model is to provide a fixture for diode testing.
[0008] The utility model achieves the above-mentioned purpose through the following technical solutions:
[0009] A fixture for diode testing includes a PCB substrate, a test-specific seat is provided on the PCB substrate, a product loading portion is provided on the test-specific seat, and the product loading portion has a loading slot for a device under test;
[0010] Several positive and negative connection modules are provided on the PCB substrate corresponding to the device under test. The several positive and negative connection modules are respectively connected and used in conjunction with corresponding test instruments to form a diode test fixture structure capable of performing various tests.
[0011] Furthermore, the testing instruments are a multimeter and a diode tester.
[0012] Furthermore, the positive and negative electrode connection modules include correspondingly arranged positive electrode connection terminals and negative electrode connection terminals.
[0013] Furthermore, the positive electrode connection terminal is connected to the positive electrode of the device under test and the corresponding connection part of the positive electrode of the test instrument through a wire.
[0014] Furthermore, the negative electrode connection terminal is connected to the negative electrode of the device under test and the negative electrode corresponding connection part of the test instrument through a wire.
[0015] Furthermore, the positive connection terminal is connected to the positive pole of the device under test and the corresponding connection part of the positive pole of the test instrument through a wire, and the negative connection terminal is connected to the negative pole of the device under test and the corresponding connection part of the negative pole of the test instrument through a wire. The positive connection terminal and the negative connection terminal are used as extended connection parts of the device under test. The extended connection parts are arranged on the PCB substrate and serve as a quick connection intermediate of the fixture part.
[0016] Compared with the prior art, the beneficial effects of the present invention are: saving time: testing multiple diodes at the same time can greatly shorten the test time, thereby improving production efficiency; improving accuracy: by testing multiple diodes at the same time, their performance can be compared and evaluated, thereby improving the accuracy of the test results; discovering defective products: testing multiple diodes at the same time can more easily discover defective products, because defective products often differ from normal products; reducing costs: testing multiple diodes at the same time can reduce equipment and labor costs, thereby reducing production costs; increasing reliability: by testing multiple diodes at the same time, it can be ensured that their performance meets the requirements, thereby increasing the reliability of the product. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] Figure 1 It is a structural diagram of the present utility model.
[0018] Figure 2 Schematic diagram of a circuit for a forward voltage test according to an embodiment of the present invention.
[0019] Figure 3 Schematic diagram of a reverse leakage test circuit according to an embodiment of the present invention. DETAILED DESCRIPTION
[0020] Example:
[0021] See Figure 1 This embodiment shows a fixture for diode testing, including a PCB substrate 1, a dedicated test seat 5 is provided on the PCB substrate 1, a product loading portion is provided on the dedicated test seat 5, and the product loading portion has a loading slot for a device under test;
[0022] Several positive and negative connection modules are provided on the PCB substrate 1 corresponding to the device under test 6. The several positive and negative connection modules are respectively connected and used in conjunction with corresponding test instruments to form a diode test fixture structure capable of performing various tests.
[0023] The test instruments are multimeter and diode tester.
[0024] The positive and negative electrode connection modules include correspondingly arranged positive electrode connection terminals 2 and negative electrode connection terminals 3 .
[0025] The positive electrode connection terminal 2 is connected to the positive electrode of the device under test and the corresponding positive electrode connection part of the test instrument through the wire 4.
[0026] The negative electrode connection terminal 3 is connected to the negative electrode of the device under test and the corresponding negative electrode connection part of the test instrument through the wire 4.
[0027] The positive connection terminal 2 is connected to the positive pole of the device under test and the corresponding connection part of the positive pole of the test instrument through a wire 4, and the negative connection terminal 3 is connected to the negative pole of the device under test and the corresponding connection part of the negative pole of the test instrument through a wire 4. The positive connection terminal 3 and the negative connection terminal 3 are used as extended connection parts of the device under test. The extended connection parts are set on the PCB substrate and serve as a quick connection intermediate of the fixture part.
[0028] This embodiment can be performed:
[0029] Forward voltage test: See Figure 2 , adjust the specified test current IF by changing the variable voltage source or resistor R. Use an ammeter to measure the IF value and a DC voltmeter to measure the forward voltage VF. The voltmeter should be connected to the specified point of the device and always within the current path;
[0030] Reverse current test: The DC voltage is adjusted to the specified value through the voltmeter V and the reverse current IR is measured through the ammeter A. This allows various potential defects hidden inside the components to be exposed early, thereby achieving the purpose of eliminating premature failure products.
[0031] Compared with the prior art, the beneficial effects of the present invention are: saving time: testing multiple diodes at the same time can greatly shorten the test time, thereby improving production efficiency; improving accuracy: by testing multiple diodes at the same time, their performance can be compared and evaluated, thereby improving the accuracy of the test results; discovering defective products: testing multiple diodes at the same time can more easily discover defective products, because defective products often differ from normal products; reducing costs: testing multiple diodes at the same time can reduce equipment and labor costs, thereby reducing production costs; increasing reliability: by testing multiple diodes at the same time, it can be ensured that their performance meets the requirements, thereby increasing the reliability of the product.
[0032] The above are only some embodiments of the present invention. For those skilled in the art, several modifications and improvements can be made without departing from the inventive concept of the present invention, and these all fall within the scope of protection of the present invention.
Claims
1. A fixture for diode testing, characterized by: The PCB substrate is provided with a test-specific seat, the test-specific seat is provided with a product loading portion, and the product loading portion has a loading slot for a device under test; Several positive and negative connection modules are provided on the PCB substrate corresponding to the device under test. The several positive and negative connection modules are respectively connected and used in conjunction with corresponding test instruments to form a diode test fixture structure capable of performing various tests.
2. The diode testing fixture according to claim 1, characterized in that: The test instruments are multimeter and diode tester.
3. The diode testing fixture according to claim 2, characterized in that: The positive and negative electrode connection modules include correspondingly arranged positive electrode connection terminals and negative electrode connection terminals.
4. The diode testing fixture according to claim 3, characterized in that: The positive electrode connection terminal is connected to the positive electrode of the device under test and the corresponding positive electrode connection part of the test instrument through a wire.
5. The diode testing fixture according to claim 4, characterized in that: The negative electrode connection terminal is connected to the negative electrode of the device under test and the corresponding negative electrode connection part of the test instrument through a wire.
6. The diode testing fixture according to claim 5, characterized in that: The positive connection terminal is connected to the positive pole of the device under test and the corresponding connection part of the positive pole of the test instrument through a wire, and the negative connection terminal is connected to the negative pole of the device under test and the corresponding connection part of the negative pole of the test instrument through a wire. The positive connection terminal and the negative connection terminal are used as extended connection parts of the device under test. The extended connection parts are arranged on the PCB substrate and serve as a quick connection intermediate of the fixture part.