PCB multifunctional test fixture with rotary probe switching structure

Abstract

The utility model discloses a PCB multifunctional test fixture with a rotary probe switching structure, which relates to the technical field of PCB testing and comprises a tester body, a support frame is fixedly mounted at the top of the tester body, a lifting assembly is arranged in the middle of the support frame, a station frame is mounted at the lifting end of the lifting assembly, and a probe switching mechanism is mounted on the station frame. A mounting frame is fixedly mounted on the inner wall of the supporting frame, bearing sleeves are fixedly mounted at the top and the bottom of the inner wall of the mounting frame, rotating discs are fixedly mounted on the inner walls of the bearing sleeves, and rotating assemblies used for driving the rotating discs to rotate are mounted on the mounting frame. Therefore, different types of probe bodies can be quickly replaced when various electrical performance tests of the PCB are carried out, the whole jig does not need to be replaced or the probe bodies do not need to be manually replaced, and the operation is simple and time-saving.

Description

Technical Field

[0001] The utility model relates to the technical field of PCB testing, and in particular to a multifunctional PCB testing fixture with a rotary probe switching structure. Background Art

[0002] PCB test fixture, also known as test frame, is the main tool used to assist in completing PCB testing. It is widely used in the entire PCB production process. It is used to test PCBs after completing SMT patches and DIP plug-ins to determine whether the product can meet the requirements. The principle of the test frame is to connect the pads or test points on the PCB through metal probes. When the PCB is powered on, the voltage value, current value and other typical values ​​of the test circuit are obtained, so as to observe whether the test circuit is normal through current, voltmeter or equipment.

[0003] At present, during the PCB testing process, it is often necessary to perform a variety of electrical performance tests, such as open circuit, short circuit, resistance, capacitance and other tests. Different tests require the use of different types of probes. Traditional test fixtures usually adopt a fixed probe layout. When different tests are required, the entire fixture needs to be replaced or the probes need to be manually replaced. The operation is cumbersome and time-consuming, and it is easy to introduce human errors, reducing test efficiency and accuracy. Therefore, it is urgent to design a PCB multi-functional test fixture with a rotary probe switching structure to solve the above problems. Utility Model Content

[0004] The purpose of this utility model is to address the shortcomings of the existing technology and propose a multifunctional PCB test fixture with a rotary probe switching structure. Its advantage is that it can quickly change different types of probes when performing various electrical performance tests on PCBs.

[0005] In order to achieve the above purpose, the present invention adopts the following technical solutions:

[0006] A PCB multifunctional test fixture with a rotary probe switching structure includes a tester body, a support frame fixedly mounted on the top of the tester body, a lifting assembly provided in the middle of the support frame, a workstation frame installed at the lifting end of the lifting assembly, a mounting frame fixedly mounted on the inner wall of the support frame, bearing sleeves fixedly mounted on the top and bottom of the inner wall of the mounting frame, a rotating disk fixedly mounted on the inner wall of the bearing sleeve, a rotating assembly for driving the rotating disk to rotate is mounted on the mounting frame, mounting openings equidistantly distributed are provided on the rotating disk, and probe mounting seats are fixedly mounted on the inner walls of the mounting openings, different types of probe bodies are respectively provided on the probe mounting seats, and the probe mounting seats are located directly above the workstation frame.

[0007] The above technical solution enables the rapid replacement of different types of probe bodies when conducting various electrical performance tests on PCBs, without the need to replace the entire fixture or manually replace the probe body, making the operation simple and time-saving.

[0008] The utility model is further configured such that the lifting assembly includes a threaded column rotatably connected to the middle position of the top of the tester body and the middle position of the top of the support frame, and a first motor for driving the threaded column to rotate is fixedly installed at the middle position of the top surface of the support frame, and a lifting seat is fixed to the bottom of one side of the workstation frame, and a screw hole is provided on the lifting seat to be screwed to the threaded column.

[0009] Through the above technical solution, it is easy to drive the workstation frame to rise, so that the PCB can contact the probe body.

[0010] The present invention is further configured such that a guide hole is provided on the lifting seat, and a guide column passing through the guide hole is fixedly mounted on the top inner wall of the support frame and the top outer wall of the tester body.

[0011] Through the above technical solution: ensure the lifting stability of the workstation frame.

[0012] The utility model is further configured such that a center hole is opened in the middle of the rotating disk, and a protective cylinder passing through the center hole is fixedly installed in the middle of the top inner wall of the support frame, and the protective cylinder is sleeved on the threaded column and the guide column.

[0013] The utility model is further configured such that the rotating assembly includes teeth grooves equidistantly arranged in the middle position of the outer wall of the rotating disk, and the inner wall of the mounting frame is rotatably connected to a driving gear, and a second motor for driving the driving gear to rotate is fixedly installed on the top of the mounting frame, and the driving gear is engaged with the teeth grooves.

[0014] Through the above technical solution: it is convenient to switch between different types of probes.

[0015] The utility model is further configured such that a plurality of mounting holes are provided on the probe mounting seat, and a buffer groove is provided in the middle position of the mounting holes, a sliding sleeve is fixed to the top and bottom of the inner wall of the mounting hole, the probe body passes through the two sliding sleeves, a fixing ring inserted in the buffer groove is fixed to the outer wall of the probe body, and a spring is fixed to the top of the fixing ring and the top of the buffer groove.

[0016] Through the above technical solution, the probe body can have good tensioning performance and can be fully fitted on the PCB.

[0017] The utility model is further configured such that L-shaped limit plates are fixedly installed on both sides of the bottom of the probe mounting seat, and the bottom surface of the L-shaped limit plate is higher than the bottom surface of the probe body, and the position of the L-shaped limit plate corresponds to the top two sides of the work station frame.

[0018] Through the above technical solution: the rising distance of the workstation frame can be limited.

[0019] The utility model is further configured such that a plurality of jacking holes are opened at the bottom of the work station frame, and a plurality of jacking columns passing through the jacking holes are fixedly installed on one side of the top of the tester body, and the top surface of the jacking columns is higher than the top surface of the work station frame.

[0020] Through the above technical solution: the function of quickly taking out PCB is realized.

[0021] The beneficial effects of the utility model are:

[0022] 1. The utility model comprises a tester body, a work station frame, a mounting frame, a rotating disk, a rotating assembly, a lifting assembly, a probe mounting seat and a probe body, etc., which form a PCB test fixture with a rotary probe switching structure. The lifting assembly can drive the work station frame to rise, so that the probe body and the PCB are tightly fitted together, which is convenient for testing and processing. The rotating assembly can also drive the rotating disk to rotate at a certain angle, so that the probe mounting seat and different types of probe bodies can be rotated to the top of the work station frame, so that different types of probe bodies can be quickly replaced when performing various electrical performance tests on the PCB. There is no need to replace the entire fixture or manually replace the probe body, which is simple and time-saving.

[0023] 2. The utility model provides a work station frame, a lifting assembly, and a lifting column. After the test is completed, the work station frame and the PCB are reset by the reset action of the lifting assembly, so that the lifting holes of the lifting columns gradually emerge. As a result, the PCB can be quickly ejected from the work station frame under the action of the lifting columns, realizing the function of quickly taking out the PCB. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 This is a three-dimensional diagram of a PCB multi-function test fixture with a rotary probe switching structure proposed by the present invention;

[0025] Figure 2 This is a schematic diagram of the threaded column and jacking column structure of a PCB multi-function test fixture with a rotary probe switching structure proposed by the present invention;

[0026] Figure 3 This is a schematic diagram of the lifting hole and lifting seat structure of a PCB multi-function test fixture with a rotary probe switching structure proposed by the utility model;

[0027] Figure 4 This is a schematic diagram of the L-shaped limit plate and center hole structure of a PCB multi-function test fixture with a rotary probe switching structure proposed by the present invention;

[0028] Figure 5 This is a schematic diagram of the drive gear and tooth groove structure of a PCB multi-function test fixture with a rotary probe switching structure proposed by the present invention;

[0029] Figure 6 This is a schematic diagram of the structure of a probe mounting base of a PCB multi-function test fixture with a rotary probe switching structure proposed by the present invention;

[0030] Figure 7 This is a schematic diagram of the spring and fixing ring structure of a PCB multi-function test fixture with a rotary probe switching structure proposed by the present invention;

[0031] Figure 8 This is a front view of a PCB multifunctional test fixture with a rotary probe switching structure proposed by the present invention.

[0032] In the figure: 1. Tester body; 2. Work station frame; 3. Support frame; 4. Mounting frame; 5. Rotating disk; 6. Protective tube; 7. Lifting assembly; 701. Threaded column; 702. Guide column; 703. First motor; 704. Lifting seat; 705. Guide hole; 706. Screw hole; 8. Probe mounting seat; 9. Probe body; 10. Lifting column; 11. Lifting hole; 12. Second motor; 13. Bearing sleeve; 14. L-shaped limit plate; 15. Center hole; 16. Drive gear; 17. Tooth groove; 18. Mounting port; 19. Sliding sleeve; 20. Mounting hole; 21. Buffer groove; 22. Spring; 23. Fixing ring. DETAILED DESCRIPTION

[0033] The technical solution of the present utility model will be further described in detail below in conjunction with specific implementation methods.

[0034] The following describes embodiments of the present invention in detail. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended only to explain the present invention and are not to be construed as limiting the present invention.

[0035] In the description of the present invention, it should be understood that the terms "center", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0036] In the description of this utility model, it should be noted that, unless otherwise expressly specified or limited, the terms "installed," "connected," "connected," and "disposed" should be understood in a broad sense. For example, they may refer to fixed connection or disposition, detachable connection or disposition, or integral connection or disposition. Those skilled in the art will understand the specific meanings of the above terms in this utility model based on specific circumstances.

[0037] Reference Figures 1-8 , a PCB multifunctional test fixture with a rotary probe switching structure, including a tester body 1, a support frame 3 is fixedly installed on the top of the tester body 1, and a lifting component 7 is provided in the middle position of the support frame 3, a work station frame 2 is installed at the lifting end of the lifting component 7, the lifting component 7 includes a threaded column 701 rotatably connected to the middle position of the top of the tester body 1 and the middle position of the top of the support frame 3, and a first motor 703 for driving the threaded column 701 to rotate is fixedly installed in the middle position of the top surface of the support frame 3, a lifting seat 704 is fixed to the bottom of one side of the work station frame 2, a screw hole 706 is provided on the lifting seat 704 and is screwed to the threaded column 701, a mounting frame 4 is fixedly installed on the inner wall of the support frame 3, and a bearing sleeve 13 is fixedly installed on the top and bottom of the inner wall of the mounting frame 4, a rotating disk 5 is fixedly installed on the inner wall of the bearing sleeve 13, and a rotating disc 5 is installed on the mounting frame 4 for driving the rotating disc 5 to rotate. The rotating assembly includes a tooth groove 17 equidistantly provided in the middle position of the outer wall of the rotating disk 5, and the inner wall of the mounting frame 4 is rotatably connected to the driving gear 16. The top of the mounting frame 4 is fixedly installed with a second motor 12 for driving the driving gear 16 to rotate. The driving gear 16 is meshed with the tooth groove 17. The rotating disk 5 is provided with mounting openings 18 distributed at equal distances, and the inner walls of the mounting openings 18 are fixedly installed with probe mounting seats 8. Different types of probe bodies 9 are respectively provided on the probe mounting seats 8. The probe mounting seats 8 are located directly above the work station frame 2. The above-mentioned rotating assembly can drive the rotating disk 5 to rotate at a certain angle, so that the probe mounting seat 8 and different types of probe bodies 9 can be rotated to directly above the work station frame 2, so that different types of probe bodies 9 can be quickly replaced when performing various electrical performance tests on the PCB, without replacing the entire fixture or manually replacing the probe body 9.

[0038] In order to ensure the lifting stability of the station frame 2, refer to Figure 2 and Figure 8 A guide hole 705 is provided on the lifting seat 704, and a guide column 702 passing through the guide hole 705 is fixedly installed on the top inner wall of the support frame 3 and the top outer wall of the tester body 1. The above-mentioned guide column 702 and guide hole 705 can make the lifting seat 704 slide on the guide column 702 to ensure the lifting stability of the workstation frame 2.

[0039] To isolate the threaded column 701, refer to Figure 1 、 Figure 4 and Figure 8 A center hole 15 is provided in the middle of the rotating disk 5, and a protective tube 6 passing through the center hole 15 is fixedly installed in the middle of the top inner wall of the support frame 3. The protective tube 6 is sleeved on the threaded column 701 and the guide column 702. The above-mentioned protective tube 6 can isolate the threaded column 701 and the guide column 702 to prevent the lead wire of the probe body 9 from being entangled on the threaded column 701 and the guide column 702 and affecting the operation of the threaded column 701.

[0040] In order to ensure the fitting performance between the probe body 9 and the PCB, refer to Figure 4 、 Figure 6 、 Figure 7 and Figure 8 , a plurality of mounting holes 20 are provided on the probe mounting seat 8, and a buffer groove 21 is provided in the middle position of the mounting hole 20, and a sliding sleeve 19 is fixed to the top and bottom of the inner wall of the mounting hole 20, and the probe body 9 passes through the two sliding sleeves 19, and the outer wall of the probe body 9 is fixed with a fixing ring 23 inserted in the buffer groove 21, and the top of the fixing ring 23 and the top of the buffer groove 21 are fixedly installed with a spring 22, and L-shaped limit plates 14 are fixedly installed on both sides of the bottom of the probe mounting seat 8, and the bottom surface of the L-shaped limit plate 14 is higher than the bottom surface of the probe body 9, and the position of the L-shaped limit plate 14 corresponds to the two sides of the top of the work station frame 2. The use of the above-mentioned fixing ring 23 and spring 22 can make the probe body 9 have good tensioning performance, and can make the probe body 9 fully fit on the PCB.

[0041] In order to facilitate the removal of the PCB, refer to Figure 1 、 Figure 2 、 Figure 3 and Figure 8 A plurality of lifting holes 11 are provided at the bottom of the work station frame 2, and a plurality of lifting columns 10 passing through the lifting holes 11 are fixedly installed on one side of the top of the tester body 1. The top surface of the lifting column 10 is higher than the top surface of the work station frame 2. By adopting the above-mentioned lifting columns 10, after the test is completed, the work station frame 2 and the PCB can be reset by the reset action of the lifting assembly 7, and the PCB can be quickly ejected from the work station frame 2 by utilizing the lifting action of the lifting column 10, thereby realizing the function of quickly taking out the PCB.

[0042] Working principle: When in use, the tester places the PCB on the lifting column 10, and the first motor 703 in the lifting assembly 7 is selected on the threaded column 701 to drive the lifting seat 704, the work station frame 2 and the PCB to rise. When the lifting column 10 moves below the lifting hole 11, the PCB will fall into the work station frame 2 and fit on the bottom inner wall of the work station frame 2. At this time, as the lifting assembly 7 continues to rise, the probe body 9 will enter the work station frame 2 and fit on the PCB. When the work station frame 2 contacts the L-shaped limit plate 14, it stops rising. At this time, the probe body 9 is used in conjunction with the tester body 1 to test the electrical performance of the PCB. After the test is completed, the tester The resetting action of the lifting assembly 7 drives the work station frame 2 and the PCB to reset, so that the lifting column 10 gradually makes the lifting hole 11 emerge, so that the PCB can be quickly ejected from the work station frame 2 under the action of the lifting column 10, which is convenient for quickly taking out the PCB. When other electrical performance tests of the PCB are required, the tester uses the second motor 12 in the rotating assembly to drive the driving gear 16 to rotate, and the engagement of the driving gear 16 with the tooth groove 17 drives the rotating disk 5 to rotate at a certain angle, so that the probe mounting seat 8 and different types of probe bodies 9 rotate to the top of the work station frame 2, and repeats the above test process to test different electrical performances of the PCB.

[0043] The above is only a preferred specific implementation method of the present invention, but the protection scope of the present invention is not limited to this. Any technician familiar with the technical field within the technical scope disclosed by the present invention can make equivalent replacements or changes based on the technical solution and utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A PCB multifunctional test fixture with a rotary probe switching structure, comprising a tester body (1), characterized in that: A support frame (3) is fixedly mounted on the top of the tester body (1), and a lifting assembly (7) is provided in the middle of the support frame (3), a workstation frame (2) is installed on the lifting end of the lifting assembly (7), a mounting frame (4) is fixedly mounted on the inner wall of the support frame (3), and a bearing sleeve (13) is fixedly mounted on the top and bottom of the inner wall of the mounting frame (4), a rotating disk (5) is fixedly mounted on the inner wall of the bearing sleeve (13), a rotating assembly for driving the rotating disk (5) to rotate is installed on the mounting frame (4), the rotating disk (5) is provided with mounting openings (18) distributed at equal distances, and probe mounting seats (8) are fixedly mounted on the inner walls of the mounting openings (18), and different types of probe bodies (9) are respectively provided on the probe mounting seats (8), and the probe mounting seats (8) are located directly above the workstation frame (2).

2. The PCB multifunctional test fixture with a rotary probe switching structure according to claim 1, characterized in that: The lifting assembly (7) includes a threaded column (701) rotatably connected to the middle position of the top of the tester body (1) and the middle position of the top of the support frame (3), and a first motor (703) for driving the threaded column (701) to rotate is fixedly installed at the middle position of the top surface of the support frame (3), and a lifting seat (704) is fixed at the bottom of one side of the workstation frame (2), and a screw hole (706) is provided on the lifting seat (704) to be screwed to the threaded column (701).

3. The PCB multifunctional test fixture with a rotary probe switching structure according to claim 2, characterized in that: A guide hole (705) is provided on the lifting seat (704), and a guide column (702) passing through the guide hole (705) is fixedly mounted on the top inner wall of the support frame (3) and the top outer wall of the tester body (1).

4. The PCB multifunctional test fixture with a rotary probe switching structure according to claim 3, characterized in that: A center hole (15) is provided in the middle of the rotating disk (5), and a protective tube (6) passing through the center hole (15) is fixedly installed in the middle of the top inner wall of the support frame (3), and the protective tube (6) is sleeved on the threaded column (701) and the guide column (702).

5. The PCB multifunctional test fixture with a rotary probe switching structure according to claim 1, characterized in that: The rotating assembly comprises tooth grooves (17) equidistantly arranged in the middle of the outer wall of the rotating disk (5), and the inner wall of the mounting frame (4) is rotatably connected to a driving gear (16), and a second motor (12) for driving the driving gear (16) to rotate is fixedly installed on the top of the mounting frame (4), and the driving gear (16) is meshed with the tooth grooves (17).

6. The PCB multifunctional test fixture with a rotary probe switching structure according to claim 1, characterized in that: The probe mounting seat (8) is provided with a plurality of mounting holes (20), and a buffer groove (21) is provided in the middle of each mounting hole (20). Slide sleeves (19) are fixed to the top and bottom of the inner wall of the mounting hole (20), and the probe body (9) passes through the two slide sleeves (19). A fixing ring (23) inserted into the buffer groove (21) is fixed to the outer wall of the probe body (9), and a spring (22) is fixedly installed between the top of the fixing ring (23) and the top of the buffer groove (21).

7. The PCB multifunctional test fixture with a rotary probe switching structure according to claim 6, characterized in that: L-shaped limiting plates (14) are fixedly mounted on both sides of the bottom of the probe mounting seat (8), and the bottom surface of the L-shaped limiting plates (14) is higher than the bottom surface of the probe body (9), and the position of the L-shaped limiting plates (14) corresponds to both sides of the top of the workstation frame (2).

8. The PCB multifunctional test fixture with a rotary probe switching structure according to claim 7, characterized in that: A plurality of lifting holes (11) are provided at the bottom of the workstation frame (2), and a plurality of lifting columns (10) passing through the lifting holes (11) are fixedly mounted on one side of the top of the tester body (1), wherein the top surface of the lifting columns (10) is higher than the top surface of the workstation frame (2).

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