Equipment, chip and voltage calibration circuit

Abstract

The utility model discloses a device, a chip and a voltage calibration circuit, the voltage calibration circuit comprises a first analog-to-digital converter, the first analog-to-digital converter is used for quantizing a band-gap reference voltage and a voltage to be calibrated to obtain an actual quantized value, and the actual quantized value represents a voltage value ratio between the band-gap reference voltage and the voltage to be calibrated; the preset quantized value generation module is used for quantizing the band-gap reference voltage and the standard reference voltage to obtain a first quantized value and multiplying the first quantized value and the second quantized value to obtain a preset quantized value, and the preset quantized value represents the voltage value ratio between the band-gap reference voltage and the voltage to be calibrated; and the calibration module is used for comparing the actual quantized value with a preset quantized value and adjusting the voltage value of the to-be-calibrated voltage according to a comparison result, so that the reference voltage with precision deviation caused by high temperature in the chip after the chip is welded to the printed circuit board can be calibrated.

Description

TECHNICAL FIELD

[0001] The utility model relates to integrated circuit technical field, especially a kind of equipment, chip, voltage calibration circuit. BACKGROUND

[0002] The existing display device is provided with driving chip, and some accurate reference voltage is generally needed in driving chip, which is generally generated by reference voltage and trimming circuit.

[0003] Although these reference voltages in driving chip reach the required accuracy after trimming when the chip is shipped, the accuracy of these reference voltages deviates from the preset value due to high temperature in the welding process when the driving chip is welded to the printed circuit board (PCB board), resulting in performance degradation or even failure of the driving chip.

[0004] Therefore, a voltage calibration circuit is needed to calibrate the reference voltage that deviates from the accuracy due to high temperature after the driving chip is welded to the printed circuit board. SUMMARY

[0005] In view of the above problems, the utility model aims to provide a kind of equipment, chip, voltage calibration circuit, so as to calibrate the reference voltage that deviates from the accuracy due to high temperature in the chip after the chip is welded to the printed circuit board.

[0006] According to one aspect of the utility model, a voltage calibration circuit is provided, comprising a first analog-to-digital converter for quantizing a bandgap reference voltage and a voltage to be calibrated to obtain an actual quantization value, wherein the actual quantization value represents the ratio of the voltage value between the bandgap reference voltage and the voltage to be calibrated; a preset quantization value generation module for quantizing the bandgap reference voltage and a standard reference voltage to obtain a first quantization value, and performing a multiplication operation on the first quantization value and the second quantization value to obtain a preset quantization value, wherein the first quantization value represents the ratio of the voltage value between the bandgap reference voltage and the standard reference voltage, and the second quantization value represents the ratio of the voltage value between the standard reference voltage and the ideal value of the voltage to be calibrated; a calibration module for comparing the actual quantization value with the preset quantization value, and adjusting the voltage value of the voltage to be calibrated according to the comparison result.

[0007] Optionally, the calibration module is further configured to adjust the voltage value of the voltage to be calibrated in a successive approximation manner according to the comparison result of the actual quantization value and the preset quantization value, until the voltage value of the voltage to be calibrated reaches a preset accuracy.

[0008] Optionally, the calibration module comprises a comparator configured to compare the actual quantization value with the preset quantization value and output a comparison signal according to a comparison result; a successive approximation logic unit configured to generate a calibration signal according to the comparison signal; and a voltage adjustment unit configured to adjust the voltage value of the voltage to be calibrated according to the calibration signal.

[0009] Optionally, the preset quantization value generation module comprises a second analog-digital converter configured to quantize the bandgap reference voltage and the standard reference voltage to obtain a first quantization value; and a multiplier configured to multiply the first quantization value and the second quantization value to obtain the preset quantization value.

[0010] Optionally, the second analog-digital converter multiplexes the first analog-digital converter.

[0011] Optionally, the voltage calibration circuit further comprises a memory pre-stored with second quantization values corresponding to at least one voltage to be calibrated; the memory is configured to sequentially provide the second quantization values corresponding to the at least one voltage to be calibrated to the multiplier and store the preset quantization values corresponding to the at least one voltage to be calibrated calculated by the multiplier sequentially.

[0012] According to the second aspect of the present application, a chip is provided, comprising the voltage calibration circuit as described above.

[0013] According to the third aspect of the present application, an apparatus is provided, comprising the chip as described above, and the voltage calibration circuit is configured to calibrate a plurality of voltages to be calibrated in the chip.

[0014] The apparatus, chip and voltage calibration circuit provided by the present application can quantize the bandgap reference voltage and the voltage to be calibrated by the first analog-digital converter to obtain an actual quantization value; quantize the bandgap reference voltage and the standard reference voltage by the preset quantization value generation module to obtain a first quantization value, and multiply the first quantization value and the second quantization value to obtain a preset quantization value; and compare the actual quantization value with the preset quantization value by the calibration module, and adjust the voltage value of the voltage to be calibrated according to a comparison result, so that the voltage to be calibrated in the chip after high-temperature welding can be calibrated to a preset precision. In addition, the voltage calibration circuit provided by the present application only needs to receive one standard reference voltage provided by an external test circuit, so as to realize calibration of a plurality of voltages to be calibrated in the chip, which not only improves the calibration efficiency, but also reduces the calibration cost. BRIEF DESCRIPTION OF DRAWINGS

[0015] The above and other objects, features and advantages of the present application will become more apparent from the following description of embodiments of the present application taken with reference to the accompanying drawings, in which:

[0016] Figure 1A structural schematic diagram of a voltage calibration circuit according to an embodiment of the present application is shown.

[0017] Figure 2 A structural schematic diagram of a preset quantization value generation module according to an embodiment of the present application is shown. DETAILED DESCRIPTION

[0018] Various embodiments of the present application will be described hereinafter with reference to the accompanying drawings. In the drawings, like reference numerals are used to indicate like elements or modules. For the sake of clarity, each part in the drawings is not drawn in proportion.

[0019] It should be understood that, in the following description, "circuitry" can include a single or multiple components or a combination of hardware circuitry, programmable circuitry, state machine circuitry, and / or elements that store instructions for execution by programmable circuitry. When an element or circuitry is referred to as being "connected to" another element or "connected between" two nodes, it can be directly coupled or connected to the other element or there can be intervening elements between the elements, the connection between the elements can be physical, logical, or a combination thereof. In contrast, when an element is referred to as being "directly coupled to" or "directly connected to" another element, it implies that there are no intervening elements between the two.

[0020] Meanwhile, some terms are used in the present patent specification and claims to refer to certain components. It should be understood by those of ordinary skill in the art that hardware manufacturers can use different names to refer to the same component. The present patent specification and claims do not use the difference in name as a way to distinguish components, but rather use the difference in function of components as a criterion for distinction.

[0021] In addition, it should also be noted that, in this document, relational terms such as first and second are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprising", "including", or any other variant thereof are intended to cover non-exclusive inclusion, so that a process, method, article, or apparatus that includes a list of elements does not only include those elements, but also includes other elements not expressly listed, or other elements inherent in such process, method, article, or apparatus. Without more limitations, the element defined by the phrase "comprising a" does not exclude the presence of additional identical elements in the process, method, article, or apparatus that includes the element.

[0022] In order to solve the problem that the reference voltage in the driving chip is affected by high temperature in the welding process, resulting in deviation of precision, the applicant tries to set the existing voltage calibration circuit in the driving chip to calibrate the reference voltage, but the effect is not good, the precision of some modules in the voltage calibration circuit is affected by high temperature and deviates, resulting in that the reference voltage cannot reach the preset precision when calibrating the reference voltage. Based on this, the applicant proposes a new voltage calibration circuit, the precision of the voltage calibration circuit is basically not affected by high temperature in the welding process, and the reference voltage in the chip welded to the printed circuit board by high temperature can be calibrated.

[0023] Figure 1 The structural diagram of the voltage calibration circuit according to the embodiment of the utility model is shown.

[0024] Referring to Figure 1 , the voltage calibration circuit 100 provided by the embodiment of the utility model comprises an analog-to-digital converter (ADC for short) 110, a calibration module 120, a preset quantization value generation module 130 and a memory (not shown in the figure). The analog-to-digital converter 110 is connected with the calibration module 120, receives the to-be-calibrated voltage V text provided by the calibration module 120, and provides the actual quantization value D real to the calibration module 120. The preset quantization value generation module 130 is connected with the calibration module 120, and provides the preset quantization value D ideal to the calibration module 120, and the preset quantization value D ideal characterizes the ratio of the voltage value between the bandgap reference voltage V bg and the ideal value V text1 of the to-be-calibrated voltage, that is, D ideal =V bg / V text1 . Wherein, the bandgap reference voltage V bg is a high-precision voltage, and the voltage value does not change after high temperature.

[0025] The analog-to-digital converter 110 is used for quantizing the bandgap reference voltage V bg and the to-be-calibrated voltage V text to obtain the actual quantization value D real , and the actual quantization value D real characterizes the ratio of the voltage value between the bandgap reference voltage V bg and the to-be-calibrated voltage V text , that is, D real= V bg / V text .

[0026] The calibration module 120 is used for comparing the actual quantization value D real with the preset quantization value Dideal The comparison is performed, and the voltage V to be calibrated is adjusted based on the comparison results. text The voltage value. Specifically, the calibration module 120 calibrates based on the actual quantization value D. real With preset quantization value D ideal Based on the comparison results, the voltage V to be calibrated is adjusted using a successive approximation method. text The voltage value until the voltage V to be calibrated. text Achieve the preset accuracy.

[0027] The preset quantization value generation module 130 is used to generate the standard reference voltage V. EXT and bandgap reference voltage V bg Quantization is performed to obtain a first quantized value D1, and then a multiplication operation is performed between the first quantized value D1 and the second quantized value D2 to obtain a preset quantized value D. ideal D ideal =D1*D2. Where the first quantized value D1 represents the bandgap reference voltage V. bg Compared with the standard reference voltage V EXT The ratio of the voltage values ​​between them, i.e., D1 = V bg / V EXT The second quantization value, D2, represents the standard reference voltage V. EXT Compared with the ideal value V of the voltage to be calibrated text1 The ratio of the voltage values ​​between them, i.e., D2 = V EXT / V text1 The second quantization value D2 is pre-stored in memory. For example, the second quantization value D2 is obtained before the chip undergoes high-temperature soldering. The ideal value V of the voltage to be calibrated. text1 The voltage value of the voltage to be calibrated can be used when the chip leaves the factory, that is, the voltage value of the voltage to be calibrated obtained when the chip is not soldered to the printed circuit board.

[0028] Substitute the calculation formulas for the first quantization value D1 and the second quantization value D2 into the preset quantization value D. ideal The calculation formula yields the preset quantization value D. ideal =V bg / V text1 .

[0029] Assuming the voltage to be calibrated is V text Compared with the ideal value V of the voltage to be calibrated text1 The deviation between them is Then the voltage V to be calibrated text It can be represented as V text= V text1 + Actual quantized value D real It can be represented as:

[0030] (1)

[0031] After performing a Fourier transform on the above formula (1), we can obtain

[0032] (2)

[0033] Therefore, when the voltage V to be calibrated text Compared with the ideal value V of the voltage to be calibrated text1 When there is no deviation, the actual quantized value D real Equal to the preset quantization value D ideal When the actual quantized value D real Approximating the preset quantization value D ideal At that time, the voltage V to be calibrated text It will also approach the ideal value V of the voltage to be calibrated. text1 .

[0034] The calibration module 120 and the analog-to-digital converter 110 form a closed loop. The calibration module 120 calculates the actual quantization value D provided by the analog-to-digital converter 110. real The voltage V to be calibrated text The voltage value is adjusted by the analog-to-digital converter 110 according to the voltage V to be calibrated provided by the calibration module 120. text For the bandgap reference voltage V bg and the voltage to be calibrated V text Quantization is performed to obtain the actual quantized value D. real until the voltage V to be calibrated text The voltage value reaches the preset accuracy.

[0035] For example, calibration module 120 includes comparator COMP, successive approximation logic unit 121, and voltage adjustment unit 122.

[0036] The comparator COMP is used to convert the actual quantized value D real With preset quantization value D ideal The comparison is performed, and a comparison signal D is output based on the comparison result. compn For example, the non-inverting input of comparator COMP receives the actual quantized value D. real The inverting input of comparator COMP receives the preset quantization value D. ideal The output provides a comparison signal D. compn .

[0037] Successive approximation logic unit 121 is used to determine the successive approximation logic unit based on the comparison signal D. compn Generate calibration signal TEST_TRIM <n:0>. wherein the calibration signal TEST_TRIM <n:0>is n+1 (n>0) bits of binary number. It can be understood that the greater the value of n, the higher the accuracy of the final to-be-calibrated voltage V text .

[0038] The voltage adjustment unit 122 is configured to adjust the voltage of the to-be-calibrated voltage V <n:0>adjusting the voltage value of the voltage to be calibrated V text to make the voltage value of the voltage to be calibrated V text successively approach the ideal value V text1 of the voltage to be calibrated. Wherein the calibration signal TEST_TRIM <n:0>The greater the value of the number of times of counting text The greater the value of the voltage of the voltage value <n:0>The smaller the value, the lower the voltage V to be calibrated. text The smaller the voltage value, the better. For example, the voltage adjustment unit 122 can be implemented using circuit structures such as digital-to-analog converters and digital potentiometers.

[0039] With calibration signal TEST_TRIM <n:0>Taking a four-bit binary number as an example, the working principle of the calibration module 120 is as follows: the successive approximation logic unit 121 sets the initial value of the calibration signal TEST_TRIM<3:0> to 1000 and outputs it; the voltage adjustment unit 122 adjusts the voltage V to be calibrated according to the calibration signal TEST_TRIM<3:0> output by the successive approximation logic unit 121. text The voltage value is then used by the analog-to-digital converter 110 based on the voltage V to be calibrated. text Obtain the actual quantified value D real The comparator COMP compares the actual quantized value D. real With preset quantization value D ideal Compare and output comparison signal D. compn When comparing signal D compn When the value is 1, the successive approximation logic unit 121 determines that the highest bit of the calibration signal TEST_TRIM<3:0> is 1, and when the comparison signal D compn When the value is 0, the successive approximation logic unit 121 determines that the most significant bit of the calibration signal TEST_TRIM<3:0> is 0. Then, it sets the second most significant bit of the calibration signal TEST_TRIM<3:0> to 1, and outputs a calibration signal TEST_TRIM<3:0> with the most significant bit set to x (where x represents the previously determined value of the most significant bit), the second most significant bit set to 1, and the remaining bits set to 0. This process is repeated three times to determine the values ​​of the remaining bits of the calibration signal TEST_TRIM<3:0>. Once the value of the least significant bit of the calibration signal TEST_TRIM<3:0> is determined, the voltage adjustment unit 122 obtains the ideal voltage V that is closest to the voltage to be calibrated based on the calibration signal TEST_TRIM<3:0> finally output by the successive approximation logic unit 121. text1 The voltage V to be calibrated text .

[0040] Figure 2 A schematic diagram of the preset quantization value generation module according to an embodiment of the present invention is shown.

[0041] See Figure 2 The preset quantization value generation module 130 includes an analog-to-digital converter 131 and a multiplier 132. The analog-to-digital converter 131 is used to generate a standard reference voltage V. EXT and bandgap reference voltage V bg Quantization is performed to obtain the first quantized value D1.

[0042] Multiplier 132 is used to perform multiplication on the first quantized value D1 and the second quantized value D2 to obtain a preset quantized value D. ideal Because the calibration module 120 is at the voltage V to be calibrated. text During calibration, the corresponding preset quantization value D needs to be used multiple times. ideal Therefore, the multiplier 132 can also be connected with the memory to calculate the preset quantization value D of the to-be-calibrated voltage V text The corresponding preset quantization value D ideal and then store it in the memory.

[0043] As can be seen from the above formula (2), when at least one to-be-calibrated voltage in the chip needs to be calibrated, only a standard reference voltage needs to be provided by an external test pin (not shown in the figure), and the second quantization value corresponding to the at least one to-be-calibrated voltage is pre-stored in the memory. The voltage value of the standard reference voltage can be any value. At this time, the memory provides the second quantization value corresponding to the at least one to-be-calibrated voltage to the multiplier in turn, and stores the preset quantization value corresponding to the at least one to-be-calibrated voltage calculated by the multiplier in turn.

[0044] Further, in order to save the chip area, the analog-to-digital converter 110 in the preset quantization value generation module 130 is multiplexed, at this time, when the voltage calibration circuit 100 calibrates any to-be-calibrated voltage V text , the analog-to-digital converter 110 is first applied to the preset quantization value generation module 130, and after the first quantization value D1 is obtained in the preset quantization value generation module 130, the bandgap reference voltage V bg and the to-be-calibrated voltage V text are quantized.

[0045] The voltage calibration circuit provided by the embodiment of the utility model can realize the calibration of multiple to-be-calibrated voltages through only one standard reference voltage, which not only improves the calibration efficiency, but also reduces the calibration cost. In addition, in the calibration process of the to-be-calibrated voltage, the digital comparator is used to compare two digital signals, i.e. the actual quantization value and the preset quantization value, which has stronger anti-interference ability and anti-high-temperature ability compared with the analog comparator used in the prior art to compare two analog signals, i.e. the to-be-calibrated voltage and the ideal value of the to-be-calibrated voltage, so that the calibration accuracy of the reference voltage in the chip whose accuracy deviates due to high temperature can be improved.

[0046] Further, the utility model also provides a chip, the chip includes above-mentioned voltage calibration circuit 100. The chip is driving chip for example.

[0047] Further, the utility model also provides a kind of equipment, and the equipment includes above-mentioned chip. The equipment is display equipment for example.

[0048] It can be understood that although the embodiment of the utility model takes the reference voltage in the chip whose accuracy deviates due to high temperature after the voltage calibration circuit is used to calibrate the chip welded to printed circuit board as an example for illustration, the voltage calibration circuit provided by the embodiment of the utility model can realize the calibration of all to-be-calibrated voltages.

[0049] In accordance with the embodiments of the present application as described above, those embodiments are not described in detail with all of the possible configurations but are intended to be illustrative only. Clearly, many modifications and changes can be made to what is described above without departing from the spirit and scope of this application. This description has selected and described these embodiments in order to best explain the principles of the present application and its practical application and to thereby enable others skilled in the art to best utilize the present application and various embodiments with various modifications as are suited to the particular use contemplated. It is intended that the scope of the present application be defined by the following claims and their equivalents.

Claims

1. A voltage calibration circuit, characterized by, The voltage calibration circuit comprises: a first analog-to-digital converter configured to quantize a bandgap reference voltage and a voltage to be calibrated to obtain an actual quantization value, wherein the actual quantization value represents a ratio of voltage values between the bandgap reference voltage and the voltage to be calibrated; a preset quantization value generation module configured to quantize the bandgap reference voltage and a standard reference voltage to obtain a first quantization value, and perform a multiplication operation on the first quantization value and a second quantization value to obtain a preset quantization value, wherein the first quantization value represents a ratio of voltage values between the bandgap reference voltage and the standard reference voltage, and the second quantization value represents a ratio of voltage values between the standard reference voltage and an ideal value of the voltage to be calibrated; a calibration module configured to compare the actual quantization value with the preset quantization value, and adjust a voltage value of the voltage to be calibrated according to a comparison result.

2. The voltage calibration circuit of claim 1, wherein, The calibration module is further configured to adjust the voltage value of the voltage to be calibrated in a successive approximation manner according to the comparison result of the actual quantization value and the preset quantization value, until the voltage value of the voltage to be calibrated reaches a preset accuracy.

3. The voltage calibration circuit of claim 2, wherein, The calibration module comprises: a comparator configured to compare the actual quantization value with the preset quantization value, and output a comparison signal according to a comparison result; a successive approximation logic unit configured to generate a calibration signal according to the comparison signal; and a voltage adjustment unit configured to adjust the voltage value of the voltage to be calibrated according to the calibration signal.

4. The voltage calibration circuit of claim 3, wherein, The preset quantization value generation module comprises: a second analog-to-digital converter configured to quantize the bandgap reference voltage and the standard reference voltage to obtain the first quantization value; and a multiplier configured to perform a multiplication operation on the first quantization value and the second quantization value to obtain the preset quantization value.

5. The voltage calibration circuit of claim 4, wherein, The second analog-to-digital converter is multiplexed with the first analog-to-digital converter.

6. The voltage calibration circuit of claim 4, wherein, The voltage calibration circuit further comprises: a memory pre-stored with a second quantization value corresponding to at least one voltage to be calibrated; the memory is configured to sequentially provide the second quantization value of the at least one voltage to be calibrated to the multiplier, and store preset quantization values corresponding to the at least one voltage to be calibrated and calculated by the multiplier sequentially.

7. A chip, characterized by The voltage calibration circuit comprises: The voltage calibration circuit according to any one of claims 1-6.

8. An apparatus, comprising: The chip comprises: The voltage calibration circuit according to claim 7, wherein the voltage calibration circuit is configured to calibrate a plurality of voltages to be calibrated in the chip.

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