High-voltage relay aging test controller circuit

Abstract

The utility model discloses a high-voltage relay aging test controller circuit comprising a master control chip, the master control chip is connected with a memory module, an opening and closing control module, an on-off detection module, a communication module, a power supply module, a button module, an indicating lamp module and a debugging module, the opening and closing control module is connected with a relay coil to be tested, and the on-off detection module is connected with the communication module. The on-off detection module is connected to the output end of a relay to be tested, the communication module is connected with a display screen and a computer, the power supply module comprises a voltage conversion module, the voltage conversion module supplies power to other modules, the key module comprises a test key and a reset key, the key module is connected to the master control chip, and a plurality of indicator lamp modules are arranged. According to the utility model, through the arrangement of the opening and closing control module, the detected relay is opened and closed at a certain frequency, the on-off detection module is used for detecting on-off, the number of times of connection of the relay in a certain number of opening and closing processes is tested, and the working performance of the relay is detected.

Description

Technical Field

[0001] This utility model belongs to the field of control circuit technology and relates to a high-voltage relay aging test controller circuit. Background Technology

[0002] A high-voltage relay is an electrical device that causes a predetermined step change in the controlled variable in the electrical output circuit when the change in the input quantity of a high-voltage circuit reaches a specified requirement. It has both a control system and a controlled system, and is commonly used in automatic control circuits.

[0003] High-voltage relays operate with a high frequency of switching, controlling the on / off state of the circuit. Therefore, during the testing of high-voltage relays, it is necessary to perform multiple opening and closing tests. However, current testing tools mostly inspect the relay's structure and appearance, lacking methods for testing the relay's operational state. Utility Model Content

[0004] To address the aforementioned problems, this invention proposes a high-voltage relay aging test controller circuit, which effectively solves the problems in the prior art.

[0005] To achieve the above objectives, the technical solution adopted by this utility model is as follows:

[0006] A high-voltage relay aging test controller circuit includes:

[0007] A master control chip, which is connected to a memory module;

[0008] An opening and closing control module is connected to the main control chip. The opening and closing control module includes an opening and closing control chip and is connected to the coil of the relay under test. The opening and closing control module is used to control the on and off states of the relay under test.

[0009] A continuity detection module is connected to the output terminal of the relay under test. The continuity detection module includes a rectifier bridge, through which AC power is rectified and then enters the main control chip.

[0010] A communication module, which is connected to the main control chip, and a display screen and a computer are also connected to the communication module.

[0011] A power module, the power module including a voltage conversion module, the voltage conversion module supplying power to other modules;

[0012] A button module, comprising a test button and a reset button, is connected to the main control chip;

[0013] An indicator light module is provided, which is connected to the main control chip, and multiple indicator light modules are provided;

[0014] A debugging module, which is connected to the main control chip.

[0015] Optionally, it also includes a current detection module, which is connected to the main control chip. The current detection module is connected to a current sensor, which is connected to the relay under test.

[0016] Optionally, it also includes a coil voltage detection module, which is connected to the main control chip and is used to detect the voltage of the relay under test.

[0017] Optionally, it also includes a resistance calibration module, which includes a power switch chip connected to a load resistor and connected to the relay under test.

[0018] Optionally, the main control chip is an automotive-grade chip AC7811QBGE.

[0019] Compared with the prior art, the present invention has the following advantages: by setting an opening and closing control module, the relay under test is opened and closed at a certain frequency, and the continuity detection module detects the continuity and disconnection, testing the number of times the relay is connected in a certain number of opening and closing processes, thereby testing the working performance of the relay. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of the overall structure of an embodiment of the present utility model;

[0021] Figure 2 This is a circuit diagram of a portion of the main control chip channel in an embodiment of this utility model;

[0022] Figure 3 This is a schematic diagram of the memory module circuit according to an embodiment of the present invention;

[0023] Figure 4 This is a schematic diagram of the opening and closing control module circuit of an embodiment of this utility model;

[0024] Figure 5 This is a schematic diagram of the continuity detection module circuit according to an embodiment of the present invention;

[0025] Figure 6 This is a schematic diagram of the communication module circuit according to an embodiment of the present invention;

[0026] Figure 7 This is a schematic diagram of the 24V to 8V conversion circuit of the power module according to an embodiment of this utility model;

[0027] Figure 8 This is a schematic diagram of the 8V to 5V conversion circuit and filter circuit of the power module according to an embodiment of this utility model;

[0028] Figure 9 This is a schematic diagram of the button module circuit according to an embodiment of the present invention;

[0029] Figure 10 This is a circuit diagram of the indicator light module and the debugging module according to an embodiment of the present invention;

[0030] Figure 11 This is a schematic diagram of the current detection module circuit according to an embodiment of the present invention;

[0031] Figure 12 This is a schematic diagram of the coil voltage detection module and its protection circuit according to an embodiment of the present invention;

[0032] Figure 13 This is a schematic diagram of the resistance calibration module circuit according to an embodiment of the present invention;

[0033] Figure 14 This is a schematic diagram of the wiring terminal circuit of the relay under test in an embodiment of this utility model. Detailed Implementation

[0034] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0035] Please see Figures 1-14 This invention discloses a high-voltage relay aging test controller circuit, including a main control chip. Please refer to [link to relevant documentation]. Figure 1 The main control chip is connected to a memory module, an opening / closing control module, a continuity detection module, a communication module, a power supply module, a button module, an indicator light module, and a debugging module. The opening / closing control module includes an opening / closing control chip and is connected to the coil of the relay under test. The opening / closing control module is used to control the on / off state of the relay under test. The continuity detection module is connected to the output terminal of the relay under test and includes a rectifier bridge. The AC power enters the main control chip after being rectified by the rectifier bridge. The communication module is connected to a display screen and a computer. The power supply module includes a voltage conversion module, which supplies power to other modules. The button module includes a test button and a reset button and is connected to the main control chip. The indicator light module has multiple buttons.

[0036] Specifically, the relay under test is connected to the opening and closing control module. The opening and closing control module controls the relay under test to open and close at a set frequency. During the opening and closing process, the current is detected by the continuity detection module. A communication module is set up to connect the display screen and the computer. The computer analyzes the test results and displays them on the display screen.

[0037] In this way, by setting up an opening and closing control module, the relay under test is opened and closed at a certain frequency, and the continuity detection module detects the continuity and breaks, testing the number of times the relay is switched on during a certain number of opening and closing cycles, thereby testing the relay's working performance.

[0038] Among the feasible methods, please refer to Figure 2 The main control chip is the automotive-grade AC7811QBGE, which can be configured with multiple test channels for simultaneous testing. In this embodiment, four test channels are configured. Please refer to [link / reference]. Figure 3 The memory module uses the 24LC16BT-E-SN chip.

[0039] Please see Figure 4 and Figure 5 The opening and closing control chip is a BTT6030-2ERA chip. The master control chip controls the opening and closing of the relay under test through the opening and closing control chip. During the closing process, the current is converted from AC to DC by the continuity detection module and enters the master control chip. The master control chip counts the number of times the current enters and exits, i.e., the number of times the relay closes and opens, and thus tests the lifespan of the relay and the failure rate during use. Please refer to [link / reference]. Figure 6 The communication module is an RS485 communication circuit based on the SN65HVD3082EDR chip. This module facilitates information transfer between the central control chip, the computer, and other devices. Please refer to [link / reference]. Figure 7 and Figure 8 The power module includes a 24V to 8V conversion circuit based on the SCT2632STER chip and an 8V to 5V conversion circuit based on the L78M05ABDT-TR chip, as well as a protection filter circuit.

[0040] Please see Figure 9 and Figure 10 The button module is equipped with at least a test button and a reset button, and the indicator light module is an LED light.

[0041] As one specific implementation of the high-voltage relay aging test controller circuit provided in the application, please refer to Figure 1 and Figure 11 It also includes a current detection module, which is connected to the main control chip. The current detection module is connected to a current sensor, which is connected to the relay under test.

[0042] It should be understood that during the manufacturing process of relays, the contacts of the relays differ, resulting in varying resistances at the contact points and consequently, different currents passing through them. By setting up a current detection module, the current is detected when the contacts are closed, thereby detecting the quality and working status of the contacts.

[0043] As one specific implementation of the high-voltage relay aging test controller circuit provided in the application, please refer to Figure 1 and Figure 12 It also includes a coil voltage detection module, which is connected to the main control chip and is used to detect the voltage of the relay under test.

[0044] Overall, the relays being tested include relays of different specifications, including 24V and 12V. After the coil is connected through the IN12V port, the current passes through the coil voltage detection module circuit and enters the main control chip. The main control chip identifies the voltage and selects either 12V or 24V power supply based on the identification result.

[0045] As another specific implementation of the high-voltage relay aging test controller circuit provided in the application, please refer to [link / reference needed]. Figures 1 to 14 It also includes a resistance calibration module, which includes a power switch chip connected to a load resistor and connected to the relay under test.

[0046] Depending on the specific application scenario, due to differences in manufacturing processes and individual electronic components, the resistance of different relays varies. During testing, this can cause differences in the test current of the relays. By using a resistance calibration module, the resistance value of the relay can be adjusted by adding an external resistor during relay testing, so that the relay current is close to the test current, facilitating more accurate testing.

[0047] In some feasible approaches, the resistance calibration module is a switching circuit based on the BTT6200-4ESA switch, which makes the relay current close to the test current by switching different resistors.

[0048] Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A high-voltage relay aging test controller circuit, characterized in that, It includes: A total control chip connected with a memory module; An opening and closing control module connected with the total control chip, the opening and closing control module including an opening and closing control chip, the opening and closing control module being connected with a relay coil to be tested and used for controlling the on-off of the relay to be tested; An on-off detection module connected with an output end of the relay to be tested, the on-off detection module including a rectifier bridge through which alternating current is rectified and then enters the total control chip; A communication module connected with the total control chip, the communication module being connected with a display screen and a computer; A power module including a voltage conversion module for supplying power to other modules; A key module including test keys and a reset key, the key module being connected with the total control chip; An indicating lamp module connected with the total control chip, the indicating lamp module being provided with a plurality of indicating lamps; A debugging module connected with the total control chip.

2. The high voltage relay aging test controller circuit according to claim 1, characterized in that: It also includes a current detection module connected with the total control chip, the current detection module being connected with a current sensor connected with the relay to be tested.

3. The high voltage relay aging test controller circuit according to claim 1, wherein: It also includes a coil voltage detection module connected with the total control chip, the coil voltage detection module being used for detecting the voltage of the relay to be tested.

4. The high voltage relay aging test controller circuit according to claim 1, wherein: It also includes a resistance calibration module including a power switch chip connected with a load resistance, the power switch chip being connected with the relay to be tested.

5. The high voltage relay aging test controller circuit according to claim 1, wherein: The total control chip is a vehicle-grade chip AC7811QBGE.

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