Chip test assembly

Abstract

The utility model discloses a chip test assembly, which comprises a probe seat, a sleeve, a test probe and a first elastic piece, the sleeve, the test probe and the first elastic piece are arranged on the probe seat, the test probe penetrates through the sleeve, and two ends of the test probe are respectively provided with a test head and a wiring port. The first elastic piece abuts against the testing head so as to drive the testing head to move in the direction away from the sleeve. According to the chip test assembly, the test probe penetrates through the sleeve, and the wiring port is arranged on the test probe, so that the test probe can always keep a conducting state with an external signal line in a chip test process, and the accuracy of a test result is effectively ensured.

Description

Technical Field

[0001] This utility model relates to the field of semiconductor chip testing technology, and in particular to a chip testing component. Background Technology

[0002] During chip manufacturing, the chip needs to be powered on to test its performance. Existing chip testing structures typically include a probe holder, a sleeve, and test probes. The probe holder has a sleeve, and the test probes are slidably mounted within the sleeve. A connection port is located at the top of the sleeve, connecting the test probes to external signal lines. Because the sleeve and test probes use a clearance fit, during chip testing, the test probes may completely separate from the sleeve, causing a disconnect between the test probes and external signal lines, leading to inaccurate chip test results. Utility Model Content

[0003] The technical problem to be solved by this utility model is to provide a chip testing component that can work stably and is conducive to ensuring the accuracy of test results.

[0004] To solve the above-mentioned technical problems, the present invention adopts the following technical solution: a chip testing assembly, including a probe holder, a sleeve, a test probe, and a first elastic element mounted on the probe holder. The test probe passes through the sleeve, and a test head and a wiring port are respectively provided at both ends of the test probe. The first elastic element abuts against the test head to drive the test head to move away from the sleeve.

[0005] Furthermore, the first elastic element is a spring, a sheet, or a pad.

[0006] Furthermore, the first elastic element is fitted onto the test probe.

[0007] Furthermore, it also includes a fixed base, a mounting base, a spring, an adjusting bolt, an adjusting nut, and a second elastic element; the fixed base has an assembly cavity that communicates with one end face of the fixed base; the mounting base includes an assembly part, a connecting part, and a top abutment part connected in sequence, the connecting part and the top abutment part are located in the assembly cavity, the assembly part is exposed outside the fixed base, and the probe seat is mounted on the assembly part; one end of the spring is fixedly connected to the assembly part, and the other end of the spring is fixedly connected to the fixed base; the adjusting bolt passes through the connecting part and the top wall of the fixed base in sequence, and is engaged with the adjusting nut; the two ends of the second elastic element abut against the fixed base and the adjusting nut respectively, so as to drive the adjusting nut to move away from the fixed base.

[0008] Furthermore, the second elastic element is a spring, a sheet, or a pad.

[0009] Furthermore, the second elastic element is fitted onto the adjusting bolt.

[0010] Furthermore, the fixed base is provided with an adjusting member, which is movable relative to the fixed base and is located above the top abutment.

[0011] Furthermore, the adjusting member is provided with an external thread, and the fixed seat is provided with an internal thread that mates with the external thread.

[0012] Furthermore, the top abutment is provided with a detachable top block, which is used to abut the adjusting member.

[0013] The beneficial effects of this utility model are as follows: This chip testing component allows the test probe to pass through the sleeve and sets the wiring port on the test probe, so that the test probe can always maintain a conductive state with the external signal line during the chip testing process, effectively ensuring the accuracy of the test results. Attached Figure Description

[0014] Figure 1 This is a schematic diagram of the overall structure of the chip testing component according to Embodiment 1 of this utility model;

[0015] Figure 2 This is a cross-sectional view of the chip testing component according to Embodiment 1 of this utility model.

[0016] Label Explanation:

[0017] 1. Probe holder; 11. Sleeve; 12. Test probe; 121. Test head; 122. Wiring port; 13. First elastic element; 14. Clamping element; 15. Limit pin;

[0018] 2. Fixing base; 21. Assembly cavity;

[0019] 3. Mounting base; 31. Assembly part; 32. Connecting part; 33. Top abutment part; 34. Top block;

[0020] 4. Shrapnel;

[0021] 5. Adjusting bolts;

[0022] 6. Adjusting nut;

[0023] 7. Second elastic element;

[0024] 8. Adjustment components. Detailed Implementation

[0025] To explain in detail the technical content, objectives, and effects of this utility model, the following description is provided in conjunction with the embodiments and accompanying drawings.

[0026] Please refer to Figure 1 and Figure 2 A chip testing assembly includes a probe holder 1, a sleeve 11, a test probe 12, and a first elastic member 13 mounted on the probe holder 1. The test probe 12 is disposed through the sleeve 11. The two ends of the test probe 12 are respectively provided with a test head 121 and a wiring port 122. The first elastic member 13 abuts against the test head 121 to drive the test head 121 to move away from the sleeve 11.

[0027] As can be seen from the above description, the beneficial effects of this utility model are as follows: This chip testing component allows the test probe 12 to pass through the sleeve 11 and the wiring port 122 to be set on the test probe 12, so that the test probe 12 can always maintain a conductive state with the external signal line during the chip testing process, effectively ensuring the accuracy of the test results.

[0028] Furthermore, the first elastic element 13 is a spring, a spring sheet 4, or a spring pad.

[0029] As can be seen from the above description, the type of the first elastic element 13 can be selected according to actual usage needs or production conditions.

[0030] Furthermore, the first elastic element 13 is sleeved on the test probe 12.

[0031] As can be seen from the above description, the first elastic element 13 is sleeved on the test probe 12 to limit the position of the first elastic element 13 and prevent the first elastic element 13 from accidentally falling off or shifting its position.

[0032] Furthermore, it also includes a fixed base 2, a mounting base 3, a spring 4, an adjusting bolt 5, an adjusting nut 6, and a second elastic element 7; the fixed base 2 is provided with an assembly cavity 21, which communicates with one end face of the fixed base 2; the mounting base 3 includes an assembly part 31, a connecting part 32, and a top abutment part 33 connected in sequence, the connecting part 32 and the top abutment part 33 are disposed in the assembly cavity 21, the assembly part 31 is exposed outside the fixed base 2, and the probe seat 1 is mounted on the assembly part 31; one end of the spring 4 is fixedly connected to the assembly part 31, and the other end of the spring 4 is fixedly connected to the fixed base 2; the adjusting bolt 5 passes through the connecting part 32 and the top wall of the fixed base 2 in sequence, and is connected to the adjusting nut 6; the two ends of the second elastic element 7 abut against the fixed base 2 and the adjusting nut 6 respectively, so as to drive the adjusting nut 6 to move away from the fixed base 2.

[0033] As described above, the spring plate 4 connects the fixing base 2 and the mounting base 3, providing a certain buffer space for the test probe 12 on the mounting base 3 when it contacts the chip. This further prevents excessive pressure from the test probe 12 on the chip, which could damage the chip and cause unnecessary losses. The adjusting bolt 5, in conjunction with the adjusting nut 6, can adjust the deformation of the spring plate 4 to control the magnitude of the downward elastic force, thereby adjusting the pressure exerted by the test probe 12 on the chip when it contacts it, achieving adjustable contact pressure of the test probe 12. The top abutment 33, abutting against the top surface of the assembly cavity 21, limits the minimum height of the probe when it is not in contact with the chip.

[0034] Furthermore, the second elastic element 7 is a spring, a spring sheet 4, or a spring pad.

[0035] As can be seen from the above description, the type of the second elastic element 7 can be selected according to actual usage needs or production conditions.

[0036] Furthermore, the second elastic element 7 is sleeved on the adjusting bolt 5.

[0037] As can be seen from the above description, the second elastic element 7 is sleeved on the adjusting bolt 5 to restrict the position of the second elastic element 7 and prevent the second elastic element 7 from accidentally falling off or shifting its position.

[0038] Furthermore, the fixed base 2 is provided with an adjusting member 8, which is movable relative to the fixed base 2 and is located above the top abutment 33.

[0039] As can be seen from the above description, the minimum height of the test probe 12 when it is not in contact with the chip can be changed by adjusting the height of the adjusting component 8.

[0040] Furthermore, the adjusting member 8 is provided with an external thread, and the fixed seat 2 is provided with an internal thread that mates with the external thread.

[0041] As can be seen from the above description, the relative height between the adjusting component 8 and the fixed base 2 can be changed by turning the adjusting component 8.

[0042] Furthermore, the top abutment 33 is provided with a detachable top block 34, which is used to abut the adjusting member 8.

[0043] As can be seen from the above description, the top block 34 can be replaced as needed to avoid wear on the mounting base 3.

[0044] Please refer to Figure 1 and Figure 2One embodiment of this utility model is as follows: A chip testing assembly includes a probe holder 1, a sleeve 11 mounted on the probe holder 1, a test probe 12, and a first elastic member 13. The test probe 12 passes through the sleeve 11, and its two ends are respectively provided with a test head 121 and a wiring port 122. The first elastic member 13 abuts against the test head 121 to drive the test head 121 to move away from the sleeve 11. Specifically, the test probe 12 is cylindrical, and the sleeve 11 is cylindrical. The chip testing assembly also includes a clamping member 14 and a limiting pin 15. One end of the clamping member 14 clamps the top end of the test probe 12, and the other end has a notch. The limiting pin 15 is threaded onto the probe holder 1, and the limiting pin 15 is engaged in the notch of the clamping member 14 to prevent the test probe 12 from rotating. The first elastic member 13 is a spring, which is sleeved on the test probe 12, and its two ends abut against the probe holder 1 and the test probe 12, respectively. In other embodiments, the first elastic element 13 may be a spring sheet 4 or a spring pad.

[0045] The chip testing assembly further includes a fixed base 2, a mounting base 3, a spring 4, an adjusting bolt 5, an adjusting nut 6, and a second elastic element 7. The fixed base 2 has an assembly cavity 21, which communicates with one end face of the fixed base 2. The mounting base 3 includes an assembly part 31, a connecting part 32, and a top abutment part 33 connected in sequence. The connecting part 32 and the top abutment part 33 are located in the assembly cavity 21, while the assembly part 31 is exposed outside the fixed base 2. The probe holder 1 is mounted on the assembly part 31. One end of the spring 4 is fixedly connected to the assembly part 31, and the other end is fixedly connected to the fixed base 2. The adjusting bolt 5 passes through the connecting part 32 and the top wall of the fixed base 2 in sequence, and is engaged with the adjusting nut 6. Both ends of the second elastic element 7 abut against the fixed base 2 and the adjusting nut 6, respectively, to drive the adjusting nut 6 to move away from the fixed base 2. Optionally, the probe holder 1 is welded to the assembly part 31, press-fitted, or connected by screws.

[0046] In simple terms, the spring 4 connects the fixing base 2 and the mounting base 3, providing a buffer space for the test probe 12 on the mounting base 3 when it contacts the chip. This prevents excessive pressure from the test probe 12 on the chip, which could damage the chip and cause unnecessary losses. The adjusting bolt 5, in conjunction with the adjusting nut 6, can adjust the deformation of the spring 4 to control the magnitude of the downward elastic force, thereby adjusting the pressure exerted by the test probe 12 on the chip when it contacts it, making the contact pressure of the test probe 12 adjustable. The top abutment 33, abutting against the top surface of the assembly cavity 21, limits the minimum height of the test probe 12 when it is not in contact with the chip.

[0047] In this embodiment, the second elastic element 7 is a spring, and it is sleeved on the adjusting bolt 5. In other embodiments, the second elastic element 7 can also be a spring sheet 4 or a spring washer. The fixing base 2 is provided with a receiving hole, and the second elastic element 7 is inserted into the receiving hole. The bottom of the receiving hole is provided with a through hole communicating with the assembly cavity 21, and the adjusting screw passes through the through hole.

[0048] The fixed base 2 is provided with an adjusting member 8, which can be raised and lowered relative to the fixed base 2. The adjusting member 8 is located above the top abutment 33. Specifically, the adjusting member 8 is provided with an external thread, and the fixed base 2 is provided with an internal thread that mates with the external thread.

[0049] The top abutment 33 is provided with a removable top block 34, which is used to abut the adjusting member 8. Optionally, the top block 34 is interference-fitted with the adjusting member 8 or connected by threads. The top block 34 can be replaced as needed to avoid wear on the mounting base 3.

[0050] In summary, the chip testing assembly provided by this utility model allows the test probe to penetrate the sleeve and sets the wiring port on the test probe, so that the test probe can always maintain a conductive state with the external signal line during the chip testing process, effectively ensuring the accuracy of the test results.

[0051] The above description is merely an embodiment of this utility model and does not limit the patent scope of this utility model. Any equivalent modifications made based on the content of this utility model specification and drawings, or direct or indirect applications in related technical fields, are similarly included within the patent protection scope of this utility model.

Claims

1. A chip testing assembly, characterized by: The probe base, the sleeve, the test probe and the first elastic member are provided, the test probe is arranged through the sleeve, two ends of the test probe are respectively provided with a test head and a connecting port, and the first elastic member abuts against the test head to drive the test head to move away from the sleeve. The fixed base, the mounting base, the elastic sheet, the adjusting bolt, the adjusting nut and the second elastic member are further provided, an assembly cavity is arranged on the fixed base, the assembly cavity is communicated with one end surface of the fixed base, the mounting base comprises an assembly part, a connecting part and a top abutting part which are connected in sequence, the connecting part and the top abutting part are arranged in the assembly cavity, the assembly part is exposed to the fixed base, the probe base is mounted on the assembly part, one end of the elastic sheet is fixedly connected with the assembly part, the other end of the elastic sheet is fixedly connected with the fixed base, the adjusting bolt is sequentially arranged through the connecting part and the top wall of the fixed base and is connected with the adjusting nut in a matched mode, and two ends of the second elastic member abut against the fixed base and the adjusting nut respectively to drive the adjusting nut to move away from the fixed base.

2. A chip testing assembly according to claim 1, wherein: The first elastic member is a spring, an elastic sheet or an elastic pad.

3. The chip testing assembly of claim 1, wherein: The first elastic member is sleeved on the test probe.

4. The chip testing assembly of claim 1, wherein: The second elastic member is a spring, an elastic sheet or an elastic pad.

5. The chip testing assembly of claim 1, wherein: The second elastic member is sleeved on the adjusting bolt.

6. The chip testing assembly of claim 1, wherein: An adjusting member is arranged on the fixed base, the adjusting member is liftable relative to the fixed base, and the adjusting member is arranged above the top abutting part.

7. A chip testing assembly according to claim 6, wherein: An external thread is arranged on the adjusting member, and an internal thread matched with the external thread is arranged on the fixed base.

8. The chip testing assembly of claim 6, wherein: A detachable top block is arranged on the top abutting part, and the top block is used for abutting against the adjusting member.

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