Integrated circuit test fixture

By introducing a guide arc plate and a fixing clamp into the integrated circuit test fixture, the problem of poor contact caused by the positional offset of the integrated circuit is solved, ensuring the stability and accuracy of the test signal and adapting to the testing needs of integrated circuits of different sizes.

CN224081760UActive Publication Date: 2026-04-03贵州亚芯微电子有限公司
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Patent Information

Application Number
CN202520686739.6
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-04-11
Publication Date
2026-04-03
Estimated Expiration
2035-04-11

AI Technical Summary

Technical Problem

During integrated circuit testing, the position of the integrated circuit may shift, resulting in poor contact with the test fixture and affecting the stability and accuracy of the test signal.

Method used

An integrated circuit test fixture was designed, comprising test equipment and auxiliary mechanisms. The auxiliary mechanisms include a fixed frame, a guide arc plate, and a fixed clamping plate. The guide arc plate guides the movement direction of the integrated circuit, and the limit arc plate and the fixed clamping plate clamp and fix the integrated circuit to ensure its stability and accuracy during the test process.

Benefits of technology

It enables precise placement and stable clamping of integrated circuits during the testing process, avoiding positional deviation, ensuring the stability and accuracy of test signals, and adapting to the needs of integrated circuits of different sizes.

✦ Generated by Eureka AI based on patent content.

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    Figure CN224081760U_ABST
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Abstract

The utility model discloses an integrated circuit test fixture. The integrated circuit test fixture comprises a test device and an auxiliary mechanism. The test equipment comprises a tester and a placement table for placing an integrated circuit to be tested, and the placement table is mounted in the tester; the auxiliary mechanism comprises a fixing frame, a guide arc plate and a fixing clamping plate, the guide arc plate can guide the placement direction of the integrated circuit, the fixing clamping plate is used for clamping and fixing the integrated circuit, and the fixing frame is arranged at the top of the placement table. The moving direction of the integrated circuit is guided, so that the integrated circuit is accurately placed in the testing equipment, the situation that the stability and accuracy of a testing signal are affected due to poor contact between the integrated circuit and a testing jig caused by the fact that the placing position deviates is avoided, and the position of the integrated circuit can be clamped and fixed. The stability of the integrated circuit in the test process is ensured, and the accuracy of the test signal of the integrated circuit can be ensured.
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