Test fixture
By designing a test fixture that includes a substrate and connectors, the problems of cumbersome operation and low efficiency in ESD testing of electronic devices are solved, and non-destructive testing and high-efficiency testing are realized.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- WUHAN BITLAND INFORMATION TECH CO LTD
- Filing Date
- 2025-03-31
- Publication Date
- 2026-04-14
AI Technical Summary
Existing ESD testing methods for electronic devices are cumbersome to operate, and can easily lead to signal cables becoming tangled or difficult to solder, thus affecting testing efficiency.
A test fixture is provided, including a substrate and a connector. The substrate has a plurality of test points, and the connector is electrically connected to the test points for inserting into the interface of the testing equipment to achieve non-destructive testing.
By connecting the connector to the device under test, the test points can be directly tested, improving the testing speed and efficiency, and avoiding problems caused by suspended or soldered signal cables.
Smart Images
Figure CN224122677U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of test fixture technology, and in particular to a test fixture and electronic device. Background Technology
[0002] ESD (Electrostatic Discharge) refers to the rapid and uncontrolled release of static electricity accumulated on the human body or object surface upon contact. This rapid charge transfer can generate high voltage and high current, posing a potential threat to electronic equipment. Throughout the entire lifecycle of electronic products—from production, transportation, and storage to use—ESD events can occur at any stage, damaging the devices and affecting their performance and lifespan. Therefore, rigorous ESD testing is crucial to ensuring the stability and durability of electronic equipment.
[0003] In the process of developing this application, the inventors discovered that: Currently, electronic devices include a main body, cables, and connectors connected to the cables. When testing these devices, the common method is to disconnect one end of the cable and test each signal line within it. This method is cumbersome, and the disconnected signal cables, left unsecured, risk tangling and affecting test results. Another method is to solder a metal cable to the pins of the connector at the end of the device's signal cable and perform electrostatic discharge testing on the metal cable. This method is difficult to solder. Both of these testing methods are cumbersome, requiring wire stripping or soldering, which affects testing efficiency. Utility Model Content
[0004] This application provides a test fixture, which mainly solves the technical problem that the testing method for the device under test is to directly test the metal contacts in the interface of the device under test or to strip the cable of the device under test for testing. The testing steps are cumbersome and the operating space is small, which affects the testing efficiency.
[0005] To solve the above-mentioned technical problems, one technical solution adopted in this application is: to provide a test fixture, including a substrate and a connector, wherein the substrate is provided with a plurality of test points; the connector is disposed on the substrate, the connector is electrically connected to the plurality of test points, and the connector is used to plug into the interface of the device to be tested.
[0006] Optionally, the test point is a metal contact.
[0007] Optionally, the test point is a test slot.
[0008] Optionally, the test slot includes a plug groove and an elastic conductive element housed within the plug groove. One end of the elastic conductive element is fixed to the inner wall of the plug groove and connected to the connecting wire, while the other end of the elastic conductive element extends toward the bottom wall of the plug groove.
[0009] Optionally, the slot opening of the connector is provided with a flared guide portion, which is used to guide the probe of the testing instrument into the connector slot.
[0010] Optionally, the connector includes a plurality of pins, the plurality of pins being electrically connected to the plurality of test points, and one of the pins being electrically connected to one of the test points.
[0011] Optionally, the connector includes a plurality of connecting wires, one end of which is connected to a pin, and the other end of which is connected to a test point, wherein the plurality of connecting wires are embedded in the substrate.
[0012] Optionally, the number of connectors is two, and the two connectors are spaced apart on the substrate. One connector is electrically connected to a portion of the test points, and the other connector is electrically connected to another portion of the test points.
[0013] Optionally, the substrate is further provided with an identification section, which is disposed adjacent to the plurality of test points and is used to indicate to the user.
[0014] Optionally, the substrate is provided with a first groove and a second groove, with some of the test points located at the bottom of the first groove and the other part of the test points located at the bottom of the second groove.
[0015] The beneficial effects of this application embodiment are as follows: Unlike the prior art, this application embodiment provides a test fixture including a substrate and a connector. The substrate is provided with a plurality of test points, and the connector is disposed on the substrate. The connector is electrically connected to the plurality of test points, and the connector is used to plug into the interface of the device under test. Through the above structure, this application embodiment can connect the contacts within the interface of the device under test to the test points by plugging in the connector, allowing the user to directly test the test points, thus improving the testing speed. Attached Figure Description
[0016] To more clearly illustrate the technical solutions of the embodiments of this application, the drawings used in the embodiments of this application will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on the drawings without creative effort.
[0017] Figure 1 This is a schematic diagram of the structure of a test fixture provided in an embodiment of this application;
[0018] Figure 2This is a top view schematic diagram of a test fixture provided in an embodiment of this application;
[0019] Figure 3 This is a schematic diagram of another test fixture provided in an embodiment of this application;
[0020] Figure 4 This is a top view schematic diagram of another test fixture provided in the embodiments of this application;
[0021] Figure 5 This is a cross-sectional view of another test fixture provided in an embodiment of this application;
[0022] Figure 6 yes Figure 5 Enlarged view of part A in the image.
[0023] 100. Test fixture;
[0024] 1. Substrate; 11. Test point; 12. First groove; 13. Second groove; 11a. Metal contact; 11b. Test slot; 11b1. Insertion groove; 11b11. Horn-shaped guide; 11b2. Elastic conductive element;
[0025] 2. Connector; 21. Several pins; 22. Connecting wire. Detailed Implementation
[0026] To facilitate understanding of this application, a more detailed description is provided below with reference to the accompanying drawings and specific embodiments. It should be noted that when an element is described as being "fixed to" another element, it can be directly on the other element, or one or more intermediate elements may exist between them. When an element is described as being "connected" to another element, it can be directly connected to the other element, or one or more intermediate elements may exist between them. The terms "vertical," "horizontal," "left," "right," and similar expressions used in this specification are for illustrative purposes only.
[0027] Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the scope of this application. The term "and / or" as used in this specification includes any and all combinations of one or more of the associated listed items.
[0028] There are two existing testing methods for ESD (Electrostatic Discharge) testing of electronic devices. One method involves stripping the insulation from the connecting wires of the electronic device to expose the signal cables inside, and then using testing instruments to test each signal cable individually. In this method, the signal cables are suspended and unfixed, which poses a risk of tangling during the test and affects the test results. The other method involves soldering metal cables to the pins of the connectors of the electronic device and using testing instruments to perform electrostatic testing on the metal cables. This method is difficult to solder and affects the testing efficiency.
[0029] To resolve the above issues, please refer to [link / reference]. Figures 1 to 4 This application provides a test fixture 100, including a substrate 1 and a connector 2. The substrate 1 is provided with a plurality of test points 11, and the connector 2 is disposed on the substrate 1 and electrically connected to the plurality of test points 11. The connector 2 is used to plug into and mate with the interface of the device under test. With the above structure, after the interface of the device under test is plugged into and mates with the connector 2, the test points 11 electrically connected to the connector 2 can be electrically connected to the interface of the device under test. The device under test can be tested simply by using a testing instrument to test the test points 11. This testing method does not damage the device under test, realizing non-destructive testing. Moreover, the space provided by the test points 11 on the substrate 1 for user operation is larger than the two methods mentioned above, improving testing efficiency.
[0030] Understandably, connector 2 can be selected from various models to ensure that test fixture 100 can be adapted to the interfaces of different devices under test. Specifically, the available models include, but are not limited to: USB Type-A, mini-USB, micro-USB, USB Type-B, USB Type-C, DP (Display Port), HDMI (High-Definition Multimedia Interface), VGA (Video Graphics Array), and DVI (Digital Visual Interface).
[0031] Furthermore, the number of internal contacts varies between different interface models, so the number of test points 11 needs to be adapted to correspond to different connectors 2.
[0032] It should be noted that as the requirements of the device for the transmission speed and interface compatibility of the interface increase, the number of pins inside the same model connector 2 also increases with the version updates. Therefore, the number of test points 11 can be greater than the number of metal pins inside connector 2, so as to facilitate the adaptation to the updated connector 2.
[0033] For connector 2 mentioned above, please refer to... Figure 2 and Figure 4 The connector 2 includes a plurality of pins 21, which are electrically connected to a plurality of test points 11, wherein one pin 21 is electrically connected to one test point 11. The plurality of pins 21 are used to fix the connector 2 to the substrate 1, and the plurality of pins 21 also serve as a bridge for the electrical connection between the connector 2 and the test points 11.
[0034] It should be noted that the connection methods between the pins 21 and the substrate 1 include, but are not limited to: soldering, spring probe connection, connector 2 socket, etc. For example, in this embodiment, soldering is used.
[0035] In some embodiments, the connector 2 includes a plurality of connecting wires 22, one end of which is connected to a pin 21 and the other end of which is connected to a test point 11. The plurality of connecting wires 22 are embedded in the substrate 1, thereby insulating the different connecting wires 22 from each other and reducing the probability of damage to the connecting wires 22 by the external environment, thus improving the durability of the test fixture 100.
[0036] Understandably, in some embodiments, the connecting wires 22 are exposed on the substrate 1, thereby reducing the processing cost of the test fixture 100.
[0037] It is understandable that there are multiple connectors 2, which enables the integration of different connectors 2 onto a single substrate 1, thereby enabling the same test fixture 100 to test electronic devices with different interfaces, improving the versatility of the test fixture 100. Compared to the method of carrying a separate test fixture 100 for each type of electronic device, the solution of integrating multiple connectors 2 onto a single substrate 1 in this application improves the portability of user operation and optimizes the user experience.
[0038] For example, in this embodiment, the number of connectors 2 is preferably two, and the two connectors 2 are spaced apart on the substrate 1. One connector 2 is electrically connected to a portion of the test points 11, and the other connector 2 is electrically connected to another portion of the test points 11.
[0039] Furthermore, in some embodiments, please refer to Figure 1 and Figure 3 The substrate 1 is provided with a first groove 12 and a second groove 13. Some test points 11 are located at the bottom of the first groove 12, and other test points 11 are located at the bottom of the second groove 13. One connector 2 is adjacent to the first groove 12, and the other connector 2 is adjacent to the second groove 13. The structure realizes the division of the two connectors 2, improves the identification, and reduces the misjudgment caused by the mismatch between the connector 2 and the test point 11 when the user uses it.
[0040] In some embodiments, the substrate 1 is provided with a marking portion (not shown), which is disposed adjacent to a plurality of test points 11 and is used to indicate to the user. Furthermore, different marking portions can be disposed near different test points 11 corresponding to different connectors 2 according to the type of connector 2, so as to improve the user's identification when using the test fixture 100.
[0041] It should be noted that the markings include, but are not limited to, text, graphics, symbols, color blocks, etc. For example, in some embodiments, the markings of the test fixture 100 are preferably text.
[0042] Understandably, the structure of test point 11 includes, but is not limited to, contacts, slots, probes, etc. Different test points 11 can be set according to different testing instruments.
[0043] In some embodiments, please refer to Figure 1 and Figure 2 Test point 11 is a metal contact 11a. The preferred design of metal contact 11a enables rapid point testing using testing instruments, thereby improving testing speed.
[0044] In other embodiments, please refer to Figure 3 and Figure 4 Test point 11 is test slot 11b. The preferred design of test slot 11b enables multi-channel parallel testing when using test instruments, thereby improving testing efficiency.
[0045] For further details, please refer to Figure 5 and Figure 6 The test slot 11b includes a insertion groove 11b1 and an elastic conductive element 11b2 housed within the insertion groove 11b1. One end of the elastic conductive element 11b2 is fixed to the inner wall of the insertion groove 11b1 and electrically connected to the connector 2, while the other end extends towards the bottom wall of the insertion groove 11b1. The presence of the elastic conductive element 11b2 enables it to generate a resistive force on the probe when it is inserted into the test slot 11b, thereby improving the stability of the probe inserted into the test slot 11b and optimizing the user experience when using the test fixture 100 for testing.
[0046] In some embodiments, the slot opening of the insertion groove 11b1 is provided with a flared guide portion 11b11, which is used to guide the probe of the testing instrument into the insertion groove 11b1. Compared with the right-angled slot opening of the insertion groove 11b1, the insertion groove 11b1 with the flared guide portion 11b11 used in this application operates more smoothly during insertion, improving the user experience.
[0047] It should be noted that the aforementioned test points 11 can also adopt a structure in which metal contacts 11a are paired with test slots 11b. For example, when there are two connectors 2, the portion of test points 11 electrically connected by one connector 2 is preferably metal contacts 11a; the other portion of test points 11 electrically connected by the other connector 2 is preferably test slots 11b. It is understood that when the number of connectors 2 continues to increase, the test points 11 can also be combined with probes or the like.
[0048] In this embodiment, the test fixture 100 includes a substrate 1 and a connector 2. The substrate 1 is provided with a plurality of test points 11. The connector 2 is disposed on the substrate 1 and electrically connected to the plurality of test points 11. The connector 2 is used to plug into and mate with the interface of the device under test. Through the above structure, the contacts in the connector 2 are guided to the test points 11 located on the substrate 1. When the user has a testing requirement for the device under test, he / she only needs to plug and mate the interface of the device under test with the connector 2. The user only needs to test the test points 11 to realize the testing of the device under test. The test fixture 100 achieves non-destructive testing of the device under test, and the large operating space on the substrate 1 improves the testing efficiency.
[0049] It should be noted that while preferred embodiments of this application are provided in the specification and accompanying drawings, this application can be implemented in many different forms and is not limited to the embodiments described herein. These embodiments are not intended to impose additional limitations on the content of this application; their purpose is to provide a more thorough and comprehensive understanding of the disclosure of this application. Furthermore, the above-described technical features can be combined with each other to form various embodiments not listed above, all of which are considered to be within the scope of this application's specification. Moreover, those skilled in the art can make improvements or modifications based on the above description, and all such improvements and modifications should fall within the protection scope of the appended claims.
Claims
1. A test fixture, characterized in that, include: The substrate has several test points set on it; A connector is disposed on the substrate and is electrically connected to the plurality of test points. The connector is used to plug into the interface of the device under test.
2. The test fixture according to claim 1, characterized in that, The test points are metal contacts.
3. The test fixture according to claim 1, characterized in that, The test points are test slots.
4. The test fixture according to claim 3, characterized in that, The test slot includes a plug slot and an elastic conductive element housed within the plug slot. One end of the elastic conductive element is fixed to the inner wall of the plug slot and electrically connected to the connector, while the other end of the elastic conductive element extends toward the bottom wall of the plug slot.
5. The test fixture according to claim 4, characterized in that, The slot opening of the connector is provided with a flared guide portion, which is used to guide the probe of the testing instrument into the connector slot.
6. The test fixture according to claim 1, characterized in that, The connector includes a plurality of pins, which are electrically connected to a plurality of test points, and one of the pins is electrically connected to one of the test points.
7. The test fixture according to claim 6, characterized in that, The connector includes a plurality of connecting wires, one end of which is connected to a pin, and the other end of which is connected to a test point. The plurality of connecting wires are embedded in the substrate.
8. The test fixture according to any one of claims 1-7, characterized in that, The number of connectors is two, and the two connectors are spaced apart on the substrate. One connector is electrically connected to a portion of the test points, and the other connector is electrically connected to another portion of the test points.
9. The test fixture according to claim 8, characterized in that, The substrate is also provided with an identification section, which is arranged adjacent to the plurality of test points and is used to indicate to the user.
10. The test fixture according to claim 8, characterized in that, The substrate is provided with a first groove and a second groove, with some of the test points located at the bottom of the first groove and the other part of the test points located at the bottom of the second groove.