Chip rotation testing mechanism, chip testing device and chip testing machine

Abstract

The utility model provides a chip rotation testing mechanism, a chip testing device and a chip testing machine. The chip rotation testing mechanism comprises a rotating table, a plurality of trays and a material supporting frame. The trays are arranged on the rotating table in the circumferential direction of the rotating table, and a feeding position and a discharging position are arranged on the rotating track of the trays. Each tray comprises two limiting pieces and two jacking pieces, and the two jacking pieces are horizontally opposite to the two limiting pieces respectively and are horizontally and movably arranged. Each jacking piece is connected with a first elastic piece, and the first elastic pieces are used for providing elastic force so that the jacking pieces can move towards the corresponding limiting pieces. Material supporting frames are arranged below the feeding position and the discharging position, each material supporting frame comprises a pushing mechanism and a lifting mechanism, and the lifting mechanisms are connected with the pushing mechanisms and used for driving the pushing mechanisms to ascend and descend so that the pushing mechanisms can be connected with or separated from the two jacking pieces; the pushing mechanism can push the two jacking pieces to move away from the corresponding limiting pieces. The chip testing device and the chip testing machine comprise the chip rotation testing mechanism.

Description

Technical Field

[0001] This utility model relates to the field of testing equipment technology, and in particular to a chip rotation testing mechanism, a chip testing device, and a chip testing machine. Background Technology

[0002] Most electronic products contain internal chips, which typically undergo testing after manufacturing. Testing helps identify any problems with the chip, minimizing issues and improving product reliability before it reaches consumers.

[0003] Existing chip testing fixtures have complex structures and high manufacturing costs.

[0004] Therefore, it is necessary to provide a chip rotation testing mechanism, a chip testing device, and a chip testing machine to solve the above-mentioned technical problems. Utility Model Content

[0005] This invention provides a chip rotation testing mechanism, a chip testing device, and a chip testing machine, which have a simple structure and reduce manufacturing costs.

[0006] The technical solution of this utility model is as follows:

[0007] A chip rotation testing mechanism, comprising:

[0008] A platform rotation mechanism includes a rotating platform that is arranged to rotate vertically, the rotating platform being in the shape of a circular plate;

[0009] Multiple trays are provided for carrying chips. These trays are arranged circumferentially on a rotary table and rotate with it. The rotation path of each tray has loading and unloading positions. Each tray includes two limiting members and two clamping members. The two limiting members respectively limit the adjacent sides of the chip. The two clamping members are horizontally opposite to the two limiting members and are horizontally movable to clamp or release the chip. Each clamping member is connected to a first elastic member, which provides elastic force to move the clamping member towards the corresponding limiting member to clamp the chip.

[0010] The material support frame is provided below both the loading and unloading positions. The material support frame includes a pushing mechanism and a lifting mechanism. The lifting mechanism is connected to the pushing mechanism and is used to drive the pushing mechanism to move up and down so that the pushing mechanism can be connected to or separated from the two clamping members. When the pushing mechanism is connected to the clamping members, the pushing mechanism can push the two clamping members away from the corresponding limiting members to release the chip.

[0011] In the chip rotation testing mechanism of this utility model, the pushing mechanism includes:

[0012] A connecting plate, which is connected to the lifting mechanism;

[0013] Two actuating assemblies, each comprising a push rod and a lifting rod; the push rod includes a first rod and a second rod connected in an L-shape, the joint of the first rod and the second rod being rotatably connected to the connecting plate; the lifting rod moves vertically, its top end engaging with the end of the second rod; and,

[0014] A drive component, which is disposed on the connecting plate and connected to the bottom end of each of the lifting rods, is used to drive each of the lifting rods to move vertically, so that the ends of the two first rods move closer to or further away from the clamping member in the horizontal direction.

[0015] In the chip rotation testing mechanism of this utility model, the tray further includes a base plate, and the two limiting members and the two clamping members are all disposed on the base plate. The base plate is detachably connected to the rotating table.

[0016] In the chip rotation testing mechanism of this utility model, a positioning groove is provided on the base plate; the chip rotation testing mechanism further includes a snap-fit ​​mechanism, which includes:

[0017] A fixed block, which is connected to the rotary table;

[0018] A movable rod, which is vertically movably inserted through the fixed block, is capable of rotating about the vertical direction and moving vertically.

[0019] A latch, connected to the top of the movable rod, is capable of abutting and separating from the base plate. When the latch abuts against the base plate, it is inserted into the positioning groove to restrict rotation.

[0020] A compression spring, sleeved on the movable rod, provides elastic force to move the movable rod downwards, so that the buckle presses down on the base plate.

[0021] In the chip rotation testing mechanism of this utility model, the base plate is provided with a clearance opening; the material support frame also includes a support block, which is vertically movably disposed at the clearance opening, and the support block is connected to the lifting mechanism. Two limiting members and two clamping members are disposed at the clearance opening. The top surface of the support block is provided with four bearing strips, which are arranged in an X-shape along the diagonal of the chip to support the chip and make the four edges of the chip suspended.

[0022] In the chip rotation testing mechanism of this utility model, the limiting member is horizontally adjustable on the base plate so that it can move closer to or further away from the corresponding clamping member.

[0023] The chip rotation testing mechanism of this utility model further includes an adjustment mechanism, which includes:

[0024] A cam mechanism includes a cam that is rotatably mounted on the rotary table about a vertical axis and located at the end of the limiting member away from the chip. The circumferential surface of the cam abuts against the limiting member.

[0025] A second elastic element, connected to the limiting element, provides elastic force to allow the limiting element to move away from the chip and remain in contact with the cam; and

[0026] An adjustment drive mechanism is provided on the material support frame located at the loading position. The adjustment drive mechanism includes a cam drive mechanism and a vertical drive mechanism. The vertical drive mechanism is connected to the cam drive mechanism and can drive the cam drive mechanism to rise and fall, thereby connecting or separating from the cam mechanism. When the cam drive mechanism is connected to the cam mechanism, the cam drive mechanism can drive the cam to rotate.

[0027] In the chip rotation testing mechanism of this utility model, the cam mechanism further includes:

[0028] A fixed platform, which is connected to the rotary platform;

[0029] A rotating shaft, which movably passes through the fixed platform, has its top end connected to the cam, and its bottom end provided with two rotating holes; and,

[0030] A first compression spring, which is sleeved on the rotating shaft, is used to provide a downward elastic force so that the cam remains in contact with the fixed platform;

[0031] The cam drive mechanism includes:

[0032] The transmission block is configured to rotate vertically.

[0033] Two transmission pins are vertically movably disposed on the transmission block, at least one of which is located at an eccentric position on the transmission block, and the bottom of the transmission pin is suspended.

[0034] Two second compression springs are respectively sleeved on the two drive pins to provide an upward elastic force, causing the drive pins to protrude upward from the drive block; and,

[0035] A cam driver, connected to the transmission block, is used to drive the transmission block and the two transmission pins to rotate. When the two transmission pins are located in the two rotation holes, the rotation of the transmission block can cause the rotating shaft and the cam to rotate through the two transmission pins.

[0036] Another technical solution of this utility model is:

[0037] A chip testing apparatus, comprising:

[0038] The chip rotation testing mechanism described above also includes a marking position, a detection position, and a marking position on the rotation trajectory of the tray. The loading position, the marking position, the detection position, the marking position, and the unloading position are arranged in a ring in sequence.

[0039] An alignment mechanism is provided at the mark position;

[0040] A detection head, which is disposed at the detection position; and,

[0041] A marking mechanism is located at the marking position.

[0042] Another technical solution of this utility model is:

[0043] A chip testing machine, comprising:

[0044] The aforementioned chip testing apparatus; and,

[0045] A loading and unloading device for loading chips onto the tray located at the loading position and unloading chips from the tray located at the unloading position.

[0046] Compared to existing technologies, the advantages of this invention are as follows: In operation, when one of the trays rotates to the loading position, the lifting mechanism of the support frame located below the loading position drives the pushing mechanism to rise. The pushing mechanism is connected to the clamping members and pushes the two clamping members away from their corresponding limiting members, ensuring sufficient space between the clamping members and the limiting members to accommodate the chip. After the chip is placed between the clamping members and the limiting members, the pushing mechanism separates from the clamping members, and the first elastic member causes the clamping members to move towards their corresponding limiting members to clamp the chip. The lifting mechanism then drives the pushing mechanism to descend back to its lower position, and the tray continues to rotate. Simultaneously, when one of the trays rotates to the unloading position, the lifting mechanism of the support frame located below the unloading position drives the pushing mechanism to rise. The pushing mechanism is connected to the clamping members and pushes the two clamping members away from their corresponding limiting members to release the chip, allowing it to be removed. The chip rotation testing mechanism of this utility model has a material support frame located below the loading position that can assist the clamping component in clamping the chips in sequence, and a material support frame located below the unloading position that can assist the clamping component in releasing the chips in sequence. Its structure is simple and reduces manufacturing costs. Attached Figure Description

[0047] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the embodiments are briefly introduced below. The drawings described below are only the corresponding drawings of some embodiments of this utility model.

[0048] Figure 1 This is a schematic diagram of the structure of a chip testing machine provided in a preferred embodiment of the present invention.

[0049] Figure 2 A schematic diagram of the chip rotation testing mechanism provided in a preferred embodiment of this utility model.

[0050] Figure 3 for Figure 2 A magnified structural diagram of part B.

[0051] Figure 4 This is a top view of the chip rotation testing mechanism provided in a preferred embodiment of the present invention.

[0052] Figure 5 for Figure 4 A magnified structural diagram of part A in the middle.

[0053] Figure 6 This is a schematic diagram of the chip rotation testing mechanism provided in a preferred embodiment of the present invention, showing the structure of the material support frame located at the loading position.

[0054] Figure 7This is a schematic diagram of the chip rotation testing mechanism provided in a preferred embodiment of the present invention, located at another angle of the material support frame at the loading position.

[0055] Figure 8 A schematic diagram of the pushing mechanism of the chip rotation testing mechanism provided in a preferred embodiment of this utility model.

[0056] Figure 9 This is a schematic diagram of the push rod of the chip rotation testing mechanism provided in a preferred embodiment of the present invention.

[0057] Figure 10 A schematic diagram of the cam drive mechanism of the chip rotation testing mechanism provided in a preferred embodiment of this utility model.

[0058] Figure 11 This is a schematic diagram of the cam mechanism of the chip rotation testing mechanism provided in a preferred embodiment of the present invention.

[0059] Figure 12 A schematic diagram of the snap-fit ​​mechanism of the chip rotation testing mechanism provided in a preferred embodiment of this utility model.

[0060] Figure 13 This is a schematic diagram of the support block of the chip rotation testing mechanism provided in a preferred embodiment of the present invention.

[0061] Figure 14 A schematic diagram of the limiting component of the chip rotation testing mechanism provided in a preferred embodiment of this utility model.

[0062] in,

[0063] 100. Chips

[0064] 1. Chip rotation testing mechanism

[0065] 11. Rotary table,

[0066] 12. Pallet; 121. Limiting component; 1211. Extension piece; 122. Tightening component; 123. First elastic component; 124. Base plate; 1241. Positioning groove; 1242. Clearance opening.

[0067] 13. Material support rack

[0068] 131. Pushing mechanism; 1311. Connecting plate; 1312. Pushing assembly; 13121. Push rod; 13122. First rod; 13123. Second rod; 13124. First rotary bearing; 13125. Lifting rod; 13126. Second rotary bearing; 13127. Receiving groove; 1313. Pushing drive component.

[0069] 132. Lifting mechanism,

[0070] 133. Support block; 1331. Bearing strip; 1332. Perforation.

[0071] 134. Distance measuring device,

[0072] 14. Snap-fit ​​mechanism; 141. Fixed block; 142. Movable rod; 1421. Snap-fit ​​piece; 143. Buckle; 144. Compression spring.

[0073] 15. Adjustment mechanism,

[0074] 151. Cam mechanism; 1511. Cam; 1512. Fixed platform; 1513. Rotating shaft; 15131. Rotating hole; 15132. Limiting block; 1514. First compression spring.

[0075] 152. Second elastic element,

[0076] 153. Adjust the drive mechanism.

[0077] 1531, Cam drive mechanism; 15312, Transmission block; 15313, Transmission pin; 15314, Second compression spring; 15315, Cam driver; 15316, Groove.

[0078] 1532. Vertical drive mechanism,

[0079] 2. Alignment mechanism,

[0080] 3. Inspect the machine head.

[0081] 4. Marking agencies,

[0082] 5. Loading and unloading device.

[0083] In the diagram, units with similar structures are represented by the same labels. Detailed Implementation

[0084] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present utility model.

[0085] The directional terms mentioned in this utility model, such as "up", "down", "front", "back", "left", "right", "inner", "outer", "side", "top" and "bottom", are only for reference to the orientation of the accompanying drawings. The directional terms used are for the purpose of explaining and understanding this utility model, and are not intended to limit this utility model.

[0086] The terms "first" and "second" in this utility model are used for descriptive purposes only and should not be construed as indicating or implying relative importance, nor as a restriction on the order of events.

[0087] In this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0088] Existing chip rotation testing mechanisms have complex structures and high manufacturing costs.

[0089] The following is a preferred embodiment of a chip rotation testing mechanism 1, a chip testing device, and a chip testing machine provided by this utility model, which can solve the above technical problems.

[0090] A preferred embodiment of this utility model provides a chip testing machine. Please refer to... Figure 1 and Figure 2 The chip testing machine includes a chip testing device and a loading / unloading device 5. The loading / unloading device 5 is used for loading and unloading chips 100 into the chip testing device.

[0091] Please refer to Figure 1 The chip testing device includes a chip rotation testing mechanism 1, an alignment mechanism 2, a testing head 3, and a marking mechanism 4. The rotation trajectory of the tray 12 is equipped with a loading position, a marking position, a testing position, a marking position, and a unloading position, arranged in a ring. The alignment mechanism 2 is located at the marking position and is used to photograph the chip 100 to determine its position. The testing head 3 is located at the testing position and is used to test the chip. The marking mechanism 4 is located at the marking position and is used to mark the chip 100. The loading / unloading device 5 is used to load the chip 100 onto the tray 12 located at the loading position and unload the chip 100 from the tray 12 located at the unloading position. In this embodiment, the loading / unloading device 5 uses two robotic arms to complete the loading / unloading of the chip 100.

[0092] Please refer to Figure 2 , Figure 4 , Figure 5 and Figure 6 The chip rotation testing mechanism 1 includes a platform rotation mechanism, multiple trays 12, and a material holder 13. The platform rotation mechanism can drive the multiple trays 12 to rotate, and the material holder 13 is used to clamp or release the chip 100 from the trays 12.

[0093] The platform rotation mechanism includes a rotating platform 11 that rotates vertically and a rotation drive component. The rotating platform 11 is circular and has multiple reinforcing ribs arranged radially. The rotation drive component is connected to the rotating platform 11 and drives the rotating platform 11 to rotate vertically. In this embodiment, the rotation drive component is located below the rotating platform 11, while the alignment mechanism 2, the inspection head 3, and the marking mechanism 4 are all located above the rotating platform 11.

[0094] Trays 12 are used to hold chips, and each tray 12 can hold one chip 100. Multiple trays 12 are arranged circumferentially on the rotary table 11 and rotate with the rotary table 11, so that multiple chips move sequentially at the loading position, marking position, detection position, labeling position, and unloading position. Each tray 12 includes two limiting members 121 and two clamping members 122. The two limiting members 121 are used to limit the adjacent sides of the chip 100, and the two clamping members 122 are horizontally opposite to the two limiting members 121 and are horizontally movable to clamp or release the chip 100. Each clamping member 122 is connected to a first elastic member 123, which provides elastic force to move the clamping member 122 toward the corresponding limiting member 121 to clamp the chip. Below both the loading and unloading positions, there is a material support frame 13. The material support frame 13 includes a pushing mechanism 131 and a lifting mechanism 132. The lifting mechanism 132 is connected to the pushing mechanism 131 and is used to drive the pushing mechanism 131 to move up and down, so that the pushing mechanism 131 can be connected to or separated from the two clamping members 122. When the pushing mechanism 131 is connected to the clamping member 122, the pushing mechanism 131 can push the two clamping members 122 away from the corresponding limiting member 121 to release the chip 100.

[0095] In operation, the chip rotation testing mechanism 1 of this utility model, when one of the trays 12 rotates to the loading position, the lifting mechanism 132 of the material support frame 13 located below the loading position drives the pushing mechanism 131 to rise. The pushing mechanism 131 is connected to the clamping member 122 and pushes the two clamping members 122 away from the corresponding limiting member 121, so that there is enough space between the two clamping members 122 and the two limiting members 121 to accommodate the chip 100. After the chip 100 is placed between the two clamping members 122 and the two limiting members 121, the pushing mechanism 131 separates from the clamping members 122, and the first elastic member 123 causes the clamping members 122 to move toward the corresponding limiting member 121 to clamp the chip 100. The lifting mechanism 132 drives the pushing mechanism 131 to descend back to the low position, and the tray 12 moves to other positions under the drive of the rotating table 11. Meanwhile, when one of the trays 12 rotates with the rotary table 11 to the unloading position, the lifting mechanism 132 of the support frame 13 located below the unloading position drives the pushing mechanism 131 to rise. The pushing mechanism 131 is connected to the clamping member 122 and pushes the two clamping members 122 away from the corresponding limiting member 121 to release the chip 100, allowing the chip 100 to be removed. In this chip rotation testing mechanism 1, the support frame 13 located below the loading position can assist the clamping member 122 in sequentially clamping the chips, and the support frame 13 located below the unloading position can assist the clamping member 122 in sequentially releasing the chips. Its structure is simple, reducing manufacturing costs; loading and unloading can be performed simultaneously, improving testing efficiency.

[0096] Please refer to Figure 6 and Figure 8The pushing mechanism 131 includes a connecting plate 1311, two pushing assemblies 1312, and a pushing drive member 1313. The connecting plate 1311 is connected to the lifting mechanism 132. The pushing assembly 1312 includes a push rod 13121 and a lifting rod 13125. The push rod 13121 includes a first rod 13122 and a second rod 13123 connected in an L-shape, and the joint of the first rod 13122 and the second rod 13123 is rotatably connected to the connecting plate 1311. The lifting rod 13125 moves vertically, and the top end of the lifting rod 13125 is connected to the end of the second rod 13123. The pushing drive member 1313 is disposed on the connecting plate 1311 and connected to the bottom end of each lifting rod 13125, for driving each lifting rod 13125 to move vertically, so that the ends of the two first rods 13122 move closer to or further away from the clamping member 122 in the horizontal direction. Using the L-shaped push rod 13121, the lifting movement of the end of the second rod 13123 can be converted into the horizontal movement of the end of the first rod 13122. Pushing the drive member 1313 drives the lifting rod 13125 upward, causing the end of the second rod 13123 to move upward, while the push rod 13121 rotates, causing the end of the first rod 13122 to move closer to the clamping member 122. Pushing the drive member 1313 drives the lifting rod 13125 downward, causing the end of the second rod 13123 to move downward, while the push rod 13121 rotates in the opposite direction, causing the end of the first rod 13122 to move away from the clamping member 122. With this structure, a single drive member 1313 can simultaneously control the movement of the ends of the two first rods 13122 towards or away from their corresponding clamping members 122 in different horizontal directions, facilitating control and saving costs.

[0097] Please refer to Figure 8 The first rod 13122 has a first rotary bearing 13124 at its end, which is used to push the clamping member 122 to move. This reduces the friction between the first rod 13122 and the clamping member 122, making it easier to push the clamping member 122 to move.

[0098] Please refer to Figure 8 and Figure 9 The end of the second rod 13123 is provided with a receiving groove 13127. The top end of the lifting rod 13125 is provided with a second rotating bearing 13126, which is rotatably disposed in the receiving groove 13127. This allows the lifting rod 13125 to smoothly push the second rod 13123 to move.

[0099] Please refer to Figure 14The limiting member 121 is provided with a downwardly extending extension piece 1211 for connecting or separating from the first rod 13122. When the first rod 13122 is raised, it can be located on one side of the horizontal direction of the extension piece 1211 and connected to the extension piece 1211. The first rod 13122 pushes the extension piece 1211 to move horizontally, thereby pushing the limiting member 121 away from the corresponding clamping member 122.

[0100] Please refer to Figure 5 The pallet 12 also includes a base plate 124, with two limiting members 121 and two clamping members 122 all disposed on the base plate 124. The base plate 124 is detachably connected to the rotary table 11. If the pallet 12 is damaged, it can be replaced individually, which can save costs.

[0101] Please refer to Figure 5 and Figure 12 The base plate 124 is provided with a positioning groove 1241. The chip rotation testing mechanism 1 also includes a snap-fit ​​mechanism 14, which includes a fixed block 141, a movable rod 142, a snap fastener 143, and a compression spring 144. The fixed block 141 is connected to the rotary table 11. The movable rod 142 is vertically movably inserted through the fixed block 141, and the movable rod 142 can rotate around the vertical direction and move vertically. A snap-fit ​​piece 1421 is provided at the bottom of the movable rod 142. The snap fastener 143 is connected to the top of the movable rod 142 and can abut and separate from the base plate 124. When the snap fastener 143 abuts against the base plate 124, the snap fastener 143 is inserted into the positioning groove 1241 to restrict the rotation of the snap fastener 143. The compression spring 144 is sleeved on the movable rod 142, and its two ends abut against the snap fastener 1421 and the fixed block 141, respectively. A compression spring 144 provides elastic force to move the movable rod 142 downwards, causing the latch 143 to press down on the base plate 124. Under normal conditions, the latch 143 is located in the positioning groove 1241. The compression spring 144 causes the movable rod 142 to move downwards, and the latch 143 presses down on the base plate 124, locking the tray 12 onto the turntable 11. When the tray 12 needs to be replaced, pull the latch 143 upwards to remove it from the positioning groove 1241, and then rotate the latch 143 so that it is vertically misaligned with the base plate 124. This allows the tray 12 to be removed from the turntable 11 for replacement. This structure facilitates the replacement and securing of the tray 12.

[0102] Multiple locking mechanisms 14 can be provided and arranged around the tray 12 to secure the tray 12 firmly and prevent it from loosening. The rotary table 11 can also be provided with anti-foolproof grooves that match the shape of the base plate 124 so that the base plate 124 can be installed on the rotary table 11, while ensuring that the two clamping members 122 correspond to the positions of the two first rods 13122.

[0103] Please refer to Figure 5The base plate 124 is provided with a clearance opening 1242. The material support frame 13 also includes a support block 133, which is vertically movable at the clearance opening 1242. The support block 133 is connected to the lifting mechanism 132. Two limiting members 121 and two clamping members 122 are provided at the clearance opening 1242. The top surface of the support block 133 is provided with four bearing strips 1331, which are arranged in an X-shape along the diagonal of the chip 100 to support the chip 100 and make the four edges of the chip 100 suspended. The two limiting members 121 and the two clamping members 122 clamp the chip 100 at the clearance opening 1242, which allows the chip 100 to be suspended, facilitating double-sided inspection of the chip 100. At the loading position, the lifting mechanism 132 drives the support block 133 to move upward. After the chip 100 falls onto the support block 133, the clamping member 122 clamps the chip, and the support block 133 moves downward. At the unloading position, the support block 133 moves upward so that the chip falls onto the support block 133. After the clamping member 122 releases the chip, the robot arm removes the chip 100, and the support block 133 moves downward, completing the unloading of the chip 100. The empty tray 12 can then continue to move to the loading position. This structure facilitates chip handling. The four support bars 1331 facilitate the clamping of the four sides of the chip by the two limiting members 121 and the two clamping members 122, and reduce the friction between the chip and the support block 133. The four support bars 1331 can avoid interfering with the two limiting members 121 and the two clamping members 122, preventing the support block 133 from contacting the limiting members 121 and the clamping members 122.

[0104] Please refer to Figure 13 and Figure 6 The support block 133 has a vertically penetrating perforation 1332. The support frame 13 also includes a ranging device 134, which is connected to the connecting plate 1311 so that the ranging device 134 and the support block 133 can be raised and lowered together. The ranging device 134 is vertically positioned opposite to the perforation 1332. The ranging device 134 can determine whether the chip is correctly placed, so as to control the movement of the two clamping members 122 and thus accurately clamp the four sides of the chip.

[0105] Please refer to Figure 5 The limiting member 121 is horizontally adjustable on the base plate 124 so that it can move closer to or further away from the corresponding clamping member 122. The horizontal position of the two limiting members 121 can be adjusted according to the chip size so that the chip can be clamped in the middle position of the clearance opening 1242 for accurate testing.

[0106] More specifically, please refer to Figure 5 , Figure 7 and Figure 11The chip rotation testing mechanism 1 also includes an adjustment mechanism 15. The adjustment mechanism 15 includes a cam mechanism 151, a second elastic element 152, and an adjustment drive mechanism 153. The cam mechanism 151 includes a cam 1511, which is rotatably mounted on the rotary table 11 about a vertical axis and located at the end of the limiting member 121 away from the chip. The circumferential surface of the cam 1511 abuts against the limiting member 121. The second elastic element 152 is connected to the limiting member 121 and provides elastic force, causing the limiting member 121 to move away from the chip and remain abutting against the cam 1511. When the cam 1511 rotates, the limiting member 121 can move horizontally to achieve position adjustment. The adjustment drive mechanism 153 is mounted on the material support frame 13 located at the loading position. The adjustment drive mechanism 153 includes a cam drive mechanism 1531 and a vertical drive mechanism 1532. The vertical drive mechanism 1532 is connected to the cam drive mechanism 1531, enabling it to move up and down, thus connecting or disconnecting from the cam mechanism 151. When the cam drive mechanism 1531 is connected to the cam mechanism 151, it drives the cam 1511 to rotate. The vertical drive mechanism 1532 drives the cam drive mechanism 1531 upwards, connecting it to the cam mechanism 151. The movement of the cam drive mechanism 1531 causes the cam 1511 to rotate, adjusting the position of the limiting member 121. The second elastic member 152 keeps the limiting member 121 in contact with the cam 1511, ensuring that the limiting member 121 remains stationary after adjustment. The vertical drive mechanism 1532 drives the cam drive mechanism 1531 downwards without obstructing the rotation of the rotary table 11.

[0107] Please refer to Figure 11 The cam mechanism 151 also includes a fixed platform 1512, a rotating shaft 1513, and a first compression spring 1514. The fixed platform 1512 is connected to the rotary table 11. The rotating shaft 1513 movably passes through the fixed platform 1512, with the top end of the rotating shaft 1513 connected to the cam 1511. A limit block 15132 is provided at the bottom end of the rotating shaft 1513, and two rotating holes 15131 are provided therein. The first compression spring 1514 is sleeved on the rotating shaft 1513, with both ends of the first compression spring 1514 abutting against the limit block 15132 and the fixed platform 1512, respectively. The first compression spring 1514 provides a downward elastic force to keep the cam 1511 abutting against the fixed platform 1512.

[0108] Please refer to Figure 10The cam drive mechanism 1531 includes a transmission block 15311, two transmission pins 15312, two second compression springs 15313, and a cam driver 15314. The transmission block 15311 is rotatably mounted vertically. The two transmission pins 15312 are movably mounted vertically on the transmission block 15311, with at least one of them located at an eccentric position on the transmission block 15311, and the bottom of the transmission pin 15312 is suspended. The two second compression springs 15313 are respectively sleeved on the two transmission pins 15312 to provide an upward elastic force, causing the transmission pins 15312 to protrude upward from the transmission block 15311. The cam driver 15314 is connected to the transmission block 15311 and is used to drive the transmission block 15311 and the two transmission pins 15312 to rotate. When the two transmission pins 15312 are located in the two rotating holes 15131, the rotation of the transmission block 15311 can cause the rotating shaft 1513 and the cam 1511 to rotate through the two transmission pins 15312.

[0109] The vertical drive mechanism 1532 drives the cam drive mechanism 1531 to rise. Two transmission pins 15312 are located within two rotating holes 15131. The cam driver 15314 drives the transmission block 15311 and the two transmission pins 15312 to rotate, causing the cam 1511 to rotate. The first compression spring 1514 provides a downward force to keep the cam 1511 in contact with the fixed platform 1512, preventing the cam 1511 from shifting vertically. The two transmission pins 15312 can rotate vertically and are suspended at the bottom, preventing them from jamming during the rotation of the cam 1511. Two second compression springs 15313 provide an upward force, causing the transmission pins 15312 to protrude upwards from the transmission block 15311. When the two transmission pins 15312 are inserted into the two rotating holes 15131, both the first compression spring 1514 and the second compression spring 15313 can be compressed to provide a buffering force during contact, preventing damage caused by rigid contact.

[0110] A retaining ring is provided on the transmission pin 15312, and a groove 15315 is provided on the transmission block 15311. A second compression spring 15313 is provided in the groove 15315. The two ends of the second compression spring 15313 abut against the bottom wall of the groove 15315 and the lower surface of the retaining ring, respectively, so as to provide an upward force to the transmission pin 15312 through the retaining ring.

[0111] The working principle of the chip testing machine of the preferred embodiment of this utility model:

[0112] The vertical drive mechanism 1532 drives the cam drive mechanism 1531 to rise. Two transmission pins 15312 are located within two rotating holes 15131. The cam driver 15314 drives the transmission block 15311 and the two transmission pins 15312 to rotate, causing the cam 1511 to rotate. This adjusts the position of the limiting member 121 to match the chip's size. The second elastic member 152 keeps the limiting member 121 in contact with the cam 1511, ensuring that the limiting member 121 remains stationary after its position is adjusted. The vertical drive mechanism 1532 drives the cam drive mechanism 1531 to descend without obstructing the rotation of the rotary table 11.

[0113] When one of the trays 12 rotates to the loading position, the lifting mechanism 132 of the support frame 13 located below the loading position drives the pushing mechanism 131 and the support block 133 to rise. The pushing drive 1313 drives the lifting rod 13125 to move upward, causing the end of the second rod 13123 to move upward. The push rod 13121 rotates, and the end of the first rod 13122 moves closer to the clamping member 122, pushing the two clamping members 122 away from the corresponding limiting members 121, so that there is enough space between the two clamping members 122 and the two limiting members 121 to accommodate the chip. The loading and unloading device 5 places the chip on the four support bars 1331 of the support block 133. The pushing drive 1313 drives the lifting rod 13125 to move downward, causing the end of the second rod 13123 to move downward. The push rod 13121 rotates in the opposite direction, and the end of the first rod 13122 moves away from the clamping member 122. The first elastic member 123 causes the clamping member 122 to move toward the corresponding limiting member 121 to clamp the chip.

[0114] The mechanism 131 and support block 133 were moved down.

[0115] The rotating table 11 rotates, causing the chip to pass through the marking position, detection position, and labeling position in sequence from the loading position to the unloading position.

[0116] When one of the trays 12 rotates to the unloading position, the lifting mechanism 132 of the material rack 13 located below the unloading position drives the pushing mechanism 131 and the support block 133 to rise. The pushing mechanism 131 is connected to the clamping member 122 and pushes the two clamping members 122 away from the corresponding limiting member 121 to release the chip. The chip falls onto the support block 133, and the unloading device 5 takes away the chip.

[0117] The push mechanism 131 and the support block 133 are moved down. The rotary table 11 rotates, moving the empty pallet 12 to the loading position.

[0118] The two material support frames 13 at the loading and unloading positions can operate simultaneously, allowing loading and unloading to be carried out at the same time, thus improving efficiency.

[0119] This completes the working process of the chip testing machine in this preferred embodiment.

[0120] This novel chip rotation testing mechanism operates as follows: When one of the trays rotates to the loading position, the lifting mechanism of the support frame located below the loading position drives the pushing mechanism to rise. The pushing mechanism is connected to the clamping members and pushes the two clamping members away from their corresponding limiting members, ensuring sufficient space between the clamping members and the limiting members to accommodate the chip. After the chip is placed between the clamping members and the limiting members, the pushing mechanism separates from the clamping members, and a first elastic member causes the clamping members to move towards their corresponding limiting members to clamp the chip. The lifting mechanism then drives the pushing mechanism to descend back to its lower position, and the tray continues to rotate. Simultaneously, when one of the trays rotates to the unloading position, the lifting mechanism of the support frame located below the unloading position drives the pushing mechanism to rise. The pushing mechanism is connected to the clamping members and pushes the two clamping members away from their corresponding limiting members to release the chip, allowing it to be removed. The chip rotation testing mechanism of this utility model has a material support frame located below the loading position that can assist the clamping component in clamping the chips in sequence, and a material support frame located below the unloading position that can assist the clamping component in releasing the chips in sequence. Its structure is simple and reduces manufacturing costs.

[0121] In summary, although the present invention has been disclosed above with reference to preferred embodiments, the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the concept of the technical solution of the present invention, should be included within the scope of protection of the present invention.

Claims

1. A chip spin test mechanism, characterized by, include: A platform rotation mechanism includes a rotating platform that is arranged to rotate vertically, the rotating platform being in the shape of a circular plate; Multiple trays are provided for carrying chips. These trays are arranged circumferentially on a rotary table and rotate with it. The rotation path of each tray has loading and unloading positions. Each tray includes two limiting members and two clamping members. The two limiting members respectively limit the adjacent sides of the chip. The two clamping members are horizontally opposite to the two limiting members and are horizontally movable to clamp or release the chip. Each clamping member is connected to a first elastic member, which provides elastic force to move the clamping member towards the corresponding limiting member to clamp the chip. The material support frame is provided below both the loading and unloading positions. The material support frame includes a pushing mechanism and a lifting mechanism. The lifting mechanism is connected to the pushing mechanism and is used to drive the pushing mechanism to move up and down so that the pushing mechanism can be connected to or separated from the two clamping members. When the pushing mechanism is connected to the clamping members, the pushing mechanism can push the two clamping members away from the corresponding limiting members to release the chip.

2. The die spin test mechanism of claim 1, wherein, The propulsion mechanism includes: A connecting plate, which is connected to the lifting mechanism; Two actuating assemblies, each comprising a push rod and a lifting rod; the push rod includes a first rod and a second rod connected in an L-shape, the joint of the first rod and the second rod being rotatably connected to the connecting plate; the lifting rod moves vertically, its top end engaging with the end of the second rod; and, A drive component, which is disposed on the connecting plate and connected to the bottom end of each of the lifting rods, is used to drive each of the lifting rods to move vertically, so that the ends of the two first rods move closer to or further away from the clamping member in the horizontal direction.

3. The die spin test mechanism of claim 1, wherein, The tray also includes a base plate, and the two limiting members and the two clamping members are all disposed on the base plate. The base plate is detachably connected to the rotary table.

4. The die spin test mechanism of claim 3, wherein, The base plate is provided with a positioning groove; the chip rotation testing mechanism also includes a snap-fit ​​mechanism, which includes: A fixed block, which is connected to the rotary table; A movable rod, which is vertically movably inserted through the fixed block, is capable of rotating about the vertical direction and moving vertically. A latch, connected to the top of the movable rod, is capable of abutting and separating from the base plate. When the latch abuts against the base plate, it is inserted into the positioning groove to restrict rotation. A compression spring, sleeved on the movable rod, provides elastic force to move the movable rod downwards, so that the buckle presses down on the base plate.

5. The die spin test mechanism of claim 3, wherein, The base plate is provided with a clearance opening; the material support frame also includes a support block, which is vertically movably disposed at the clearance opening. The support block is connected to the lifting mechanism. Two limiting members and two clamping members are disposed at the clearance opening. The top surface of the support block is provided with four bearing strips, which are arranged in an X-shape along the diagonal of the chip to support the chip and make the four edges of the chip suspended.

6. The die spin test mechanism of claim 5, wherein, The limiting member is horizontally adjustable on the base plate so that it can move closer to or further away from the corresponding clamping member.

7. The die spin test mechanism of claim 6, wherein, The chip rotation testing mechanism further includes an adjustment mechanism, which comprises: A cam mechanism includes a cam that is rotatably mounted on the rotary table about a vertical axis and located at the end of the limiting member away from the chip. The circumferential surface of the cam abuts against the limiting member. A second elastic element, connected to the limiting element, provides elastic force to allow the limiting element to move away from the chip and remain in contact with the cam; and An adjustment drive mechanism is provided on the material support frame located at the loading position. The adjustment drive mechanism includes a cam drive mechanism and a vertical drive mechanism. The vertical drive mechanism is connected to the cam drive mechanism and can drive the cam drive mechanism to rise and fall, thereby connecting or separating from the cam mechanism. When the cam drive mechanism is connected to the cam mechanism, the cam drive mechanism can drive the cam to rotate.

8. The die spin test mechanism of claim 7, wherein, The cam mechanism also includes: A fixed platform, which is connected to the rotary platform; A rotating shaft, which movably passes through the fixed platform, has its top end connected to the cam, and its bottom end provided with two rotating holes; and, A first compression spring, which is sleeved on the rotating shaft, is used to provide a downward elastic force so that the cam remains in contact with the fixed platform; The cam drive mechanism includes: The transmission block is configured to rotate vertically. Two transmission pins are vertically movably disposed on the transmission block, at least one of which is located at an eccentric position on the transmission block, and the bottom of the transmission pin is suspended. Two second compression springs are respectively sleeved on the two drive pins to provide an upward elastic force, causing the drive pins to protrude upward from the drive block; and, A cam driver, connected to the transmission block, is used to drive the transmission block and the two transmission pins to rotate. When the two transmission pins are located in the two rotation holes, the rotation of the transmission block can cause the rotating shaft and the cam to rotate through the two transmission pins.

9. A chip testing device, characterized in that, include: The chip rotation testing mechanism according to any one of claims 1-8, wherein the rotation trajectory of the tray is further provided with a marking position, a detection position and a marking position, and the loading position, the marking position, the detection position, the marking position and the unloading position are arranged in a ring in sequence; An alignment mechanism is provided at the mark position; A detection head, which is disposed at the detection position; and, A marking mechanism is located at the marking position.

10. A chip tester characterized by comprising: include: The chip testing apparatus according to claim 9; as well as, A loading and unloading device for loading chips onto the tray located at the loading position and unloading chips from the tray located at the unloading position.

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