Modular probe assembly test socket
The modular design of the probe assembly test base solves the problem of micro-hole processing of probe plates, enabling efficient production and stable testing, and simplifying assembly and maintenance.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SUZHOU UPRECISION TECH CO LTD
- Filing Date
- 2025-07-22
- Publication Date
- 2026-05-26
AI Technical Summary
The existing probe plates are difficult to process micro-holes, and are prone to defects such as chipping and cracking. They also have high precision requirements, resulting in low yield. Traditional processing technology has large cumulative errors when dealing with complex curved surfaces and large-sized workpieces.
The probe board adopts a modular design, which divides the probe board into multiple probe group modules. These modules are assembled using snap-fit and plug-in structures, avoiding the need to machine probe holes on the probe board and achieving a modular assembly.
It reduces processing difficulty, improves yield and shipping efficiency, simplifies assembly and maintenance, offers diverse product styles, ensures stable operation, and provides high testing efficiency.
Smart Images
Figure CN224286975U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of test fixtures, and in particular to a modular probe assembly test fixture. Background Technology
[0002] CPU high-speed test sockets have evolved from "physical connectors" to "signal integrity guardians," with their core strength lying in three major breakthroughs: high bandwidth (>40GHz), micro-pitch (<0.07mm), and environmental toughness (three-temperature cycling). Domestic manufacturers are gradually replacing international brands like Enplas in high-end scenarios through innovations such as coaxial probes (16) and intelligent compensation, but 120GHz+ millimeter-wave testing and 3D heterogeneous integration solutions remain key areas for future development. Future technologies will rely more heavily on the synergistic optimization of "AI + materials + protocols."
[0003] A test fixture typically includes a chip positioning guide frame, the main body of the test fixture, and a probe plate. Current probe plates are one-piece structures, plate-shaped, made of metal or non-metal. Probe holes need to be machined on the probe plate before the probes are inserted into these holes. These probe holes are micro-holes, and conventional machining faces significant challenges in micro-hole machining. Due to the high hardness and brittleness of some materials, defects such as chipping and cracking are prone to occur during micro-hole machining, severely impacting product quality and yield. Furthermore, micro-hole machining requires extremely high precision, reaching micron or even sub-micron levels, which is virtually impossible with traditional machining processes. Although CNC machining is renowned for its high precision and automation, various defects can still occur in actual operation, such as overcutting, dimensional deviations, and surface roughness. These problems may be caused by tool wear, improper parameter settings, and operational errors. Traditional machining relies on three-axis machine tools and manual operation. When dealing with complex curved surfaces, intricately structured irregular parts, and large workpieces, multiple clamping and positioning operations are required, leading to increased cumulative errors and low yield. Utility Model Content
[0004] To overcome the above-mentioned shortcomings, the purpose of this utility model is to provide a modular probe assembly test fixture that eliminates the need to process probe holes on the probe plate, features a modular probe design, and reduces the difficulty of probe installation and replacement.
[0005] To achieve the above objectives, one of the technical solutions adopted by this utility model is: a modular probe assembly test stand, including a test stand main frame and a chip limiting guide frame, wherein a guide frame groove is provided on the upper end face of the inner side of the test stand main frame, and the chip limiting guide frame is installed in the guide frame groove;
[0006] The lower end face of the inner side of the test seat main frame is provided with a needle plate groove, a frame-shaped probe plate is installed in the needle plate groove, and a first snap-fit structure is provided on the inner side wall of the probe plate.
[0007] The probe plate is equipped with multiple probe group modules, and each probe group module is provided with a second snap-fit structure around its perimeter. The multiple probe group modules are arranged in a matrix.
[0008] The probe group modules arranged in a matrix around the perimeter are fixed by a first snap-fit structure and a second snap-fit structure, and each pair of adjacent probe group modules are snapped together by the second snap-fit structure.
[0009] The probe plate is composed of at least two probe plate bodies spliced together.
[0010] Preferably, each pair of adjacent needle plate bodies is spliced and fixed together by a plug-in structure. The plug-in method is simple in structure and convenient and quick to install.
[0011] Preferably, the plug-in structure includes:
[0012] A slot is provided on the side wall of one of the needle plate bodies, with one end of the slot extending in the direction of extension being a closed structure and the other end being an insertion port;
[0013] An insert, disposed on the side wall of another of the needle plate bodies, is inserted into a slot along an insertion port and terminates in a closed structure. The closed structure provides a limit to the insertion.
[0014] Preferably, the insert and slot are in a matching T-shape. This T-shaped insert and slot structure prevents the two pin plate bodies from detaching.
[0015] Preferably, each pair of adjacent needle plate bodies has a corresponding closing groove on its upper and / or lower end faces, and a fixing block is engaged within each pair of corresponding closing grooves, with the fixing block having an interference fit with the closing groove. Since the two needle plate bodies would move relative to each other if only the insert and slot were used for connection, the fixing block prevents this relative movement, increasing the stability of the two needle plate bodies after assembly.
[0016] Preferably, the first snap-fit structure is a first groove and a first protrusion, and the probe plate has four inner sidewalls, wherein the first groove is integrally formed on two inner sidewalls and the first protrusion is integrally formed on the other two inner sidewalls.
[0017] Preferably, the second snap-fit structure is a second groove and a second protrusion. The probe assembly module has four outer side walls, two of which are integrally formed with the second groove, and the other two outer side walls are integrally formed with the second protrusion.
[0018] The adjacent second protrusion can engage with the second groove;
[0019] The adjacent first protrusion can engage with the second groove;
[0020] The adjacent first groove can engage with the second protrusion.
[0021] Preferably, at least one of the needle plate bodies includes two sub-bodies in the thickness direction, and the sub-bodies are fixed together by bolts. The first snap-fit structure and the second snap-fit structure are distributed on the two sub-bodies.
[0022] Preferably, the probe assembly module has a block-shaped structure, and the probe assembly module is provided with a matrix of probe holes, with probes installed in at least a portion of the probe holes.
[0023] Preferably, the chip limiting guide frame is fixed in the guide frame groove by bolts.
[0024] The advantages of this modular probe assembly test fixture are as follows: This application transforms the original integrated probe plate into a frame shape, with multiple probe plate modules assembled within the frame. This optimizes the non-standard processing parts that originally required processing from a single piece of material into multiple mass-produced probe assembly modules. By designing and combining probe assembly modules for different signals, a large test board can be assembled using a modular approach. This eliminates the need to process probe holes on a single board, significantly reducing processing time, improving delivery efficiency, optimizing the product manufacturing process, facilitating assembly and matching, allowing for diverse design and expansion styles, ensuring stable operation, high testing efficiency, and simplifying product line changes and maintenance. Attached Figure Description
[0025] Figure 1 This is a 3D view of the assembly of the chip under test with the chip in this embodiment;
[0026] Figure 2 This is an exploded view from the first angle of this embodiment;
[0027] Figure 3 This is an exploded view from the second angle of this embodiment;
[0028] Figure 4 This is a perspective view of the first angle of this embodiment;
[0029] Figure 5 This is a perspective view from the second angle of this embodiment;
[0030] Figure 6 This is a perspective view of the probe plate in this embodiment;
[0031] Figure 7 This is an exploded view of the probe plate portion of this embodiment;
[0032] Figure 8 This is an exploded view of the probe plate in this embodiment;
[0033] Figure 9 This is a perspective view of the different probe group modules in this embodiment;
[0034] Figure 10 This is a three-dimensional view of the probe group module installed for this embodiment.
[0035] In the attached drawings:
[0036] 1. Test socket main body frame; 2. Chip limit guide frame; 3. Guide frame groove; 4. Pin board groove; 5. Probe board; 5a. Pin board main body; 5b. Sub-main body; 6. Probe group module; 7. Slot; 7a. Sealing structure; 7b. Insertion port; 8. Insert bar; 9.收口边槽; 10. Fixed block; 11. First groove; 12. First rib; 13. Second groove; 14. Second rib; 15. Probe hole; 16. Probe; 17. To-be-tested chip. Detailed implementation manners
[0037] The following elaborates on the preferred embodiments of the present utility model in conjunction with the attached drawings, so that the advantages and features of the present utility model can be more easily understood by those skilled in the art, thereby making a clearer and more definite definition of the protection scope of the present utility model.
[0038] Refer to Figures 1 to 10 As shown, this embodiment discloses a modular probe group assembled test socket, including a test socket main body frame 1 and a chip limit guide frame 2. A guide frame groove 3 is provided on the upper end surface inside the test socket main body frame 1. The chip limit guide frame 2 is installed in the guide frame groove 3 through bolts, and the to-be-tested chip 17 is installed in the chip limit guide frame 2; a pin board groove 4 is provided on the lower end surface inside the test socket main body frame 1, and a frame-shaped probe board 5 is installed in the pin board groove 4, and the two are fixed by bolt locking. A first clamping structure is provided on the inner side wall of the probe board 5; multiple probe group modules 6 are installed in the probe board 5, and a second clamping structure is provided around each probe group module 6, and multiple probe group modules 6 are arranged in a matrix; the probe group modules 6 around the matrix arrangement are clamped and fixed through the first clamping structure and the second clamping structure, and every two adjacent probe group modules 6 are clamped through the second clamping structure; the probe board 5 in this embodiment is composed of two pin board main bodies 5a spliced together. The cross-section of one pin board main body 5a is rectangular, and the cross-section of the other pin board main body 5a is in the shape of "冂", and the two pin board main bodies 5a form a frame structure.
[0039] The two pin board main bodies 5a are spliced and fixed through a plug-in structure, and the plug-in structure includes:
[0040] Slot 7, provided on the side wall of one of the pin board main bodies 5a, and one end of the extending direction of the slot 7 is a sealing structure 7a, and the other end is an insertion port 7b;
[0041] Insert bar 8, provided on the side wall of the other pin board main body 5a, and the insert bar 8 is inserted into the slot 7 along the insertion port 7b and terminates at the sealing structure 7a.
[0042] In this embodiment, the insert bar 8 and the slot 7 are in a matching T shape to prevent the two needle plate bodies 5a from separating.
[0043] In this embodiment, corresponding closing edge grooves 9 are provided on the upper end faces adjacent to each other of every two adjacent needle plate bodies 5a. A fixing block 10 is clamped in each pair of corresponding closing edge grooves 9, and the fixing block 10 is in interference fit with the closing edge grooves 9. The fixing block 10 is used to prevent the two needle plate bodies 5a from moving relative to each other, increasing the stability after the two needle plate bodies 5a are spliced; the closing edge grooves 9 can also be provided on the lower end faces of the needle plate bodies 5a.
[0044] The first clamping structure in this embodiment is a first groove 11 and a first rib 12. The probe plate 5 has four inner side walls, and the first grooves 11 are integrally formed on two of the inner side walls, and the first ribs 12 are integrally formed on the other two inner side walls.
[0045] Similarly, the second clamping structure in this embodiment is a second groove 13 and a second rib 14. The probe group module 6 has four outer side walls, and the second grooves 13 are integrally formed on two of the outer side walls, and the second ribs 14 are integrally formed on the other two outer side walls; the adjacent second ribs 14 can be engaged with the second grooves 13; the adjacent first ribs 12 can be engaged with the second grooves 13; the adjacent first grooves 11 can be engaged with the second ribs 14.
[0046] The "冂"-shaped needle plate body 5a includes two sub-bodies 5b in the thickness direction, and the sub-bodies 5b are fixed by bolt locking. The first clamping structure and the second clamping structure are distributed on the two sub-bodies 5b.
[0047] The probe group module 6 is in a block structure, and probe holes 15 arranged in a matrix are provided on the probe group module 6, and at least some of the probe holes 15 are installed with probes 16.
[0048] During assembly, the probe plate 5 is disassembled from the needle plate groove 4, the fixing block 10 is taken out, the two needle plate bodies 5a are slid relative to each other, and the two needle plate bodies 5a are in an open state. The two sub-bodies 5b of the "冂"-shaped needle plate body 5a can be separated. An appropriate number of probe group modules 6 are installed into the "冂"-shaped needle plate body 5a until the probe group module 6 fills the probe plate 5. Then, the rectangular needle plate body 5a is installed on the "冂"-shaped needle plate body 5a. Finally, the fixing block 10 is installed, and the probe plate 5 is locked in the needle plate groove 4.
[0049] The chip limiting guide frame 2 and the test socket main body frame 1 in this embodiment are not significantly different from conventional designs. The main difference lies in the design of the probe plate 5. Conventional probe plates 5 are designed as a single piece. In this embodiment, the probe array position in the middle of the single-piece probe plate is hollowed out, and grooves and protrusions are reserved at the corresponding positions of the probe plate 5 for splicing with the probe group module 6. The probe group modules 6 are processed according to the signal arrangement of conventional chips. When assembling the product, it is only necessary to assemble them in a modular manner according to the different chip distributions. Compared with the prior art, this application has a modular structure, reduces production costs, facilitates assembly and matching, allows for various design expansion styles, ensures stable operation, high testing efficiency, simplifies product line changeover and maintenance, and makes repair and maintenance simpler.
[0050] The above embodiments are only for illustrating the technical concept and features of this utility model. Their purpose is to enable those skilled in the art to understand the content of this utility model and implement it. They cannot be used to limit the protection scope of this utility model. All equivalent changes or modifications made in accordance with the spirit and essence of this utility model should be covered within the protection scope of this utility model.
Claims
1. A modular probe assembly test fixture, comprising a test fixture main frame (1) and a chip positioning guide frame (2), wherein a guide frame groove (3) is provided on the upper inner surface of the test fixture main frame (1), and the chip positioning guide frame (2) is installed in the guide frame groove (3); characterized in that: The lower end face of the inner side of the test seat main frame (1) is provided with a needle plate groove (4), and a frame-shaped probe plate (5) is installed in the needle plate groove (4). The inner side wall of the probe plate (5) is provided with a first snap-fit structure. The probe plate (5) is equipped with multiple probe group modules (6), and each probe group module (6) is provided with a second snap-fit structure around its perimeter. The multiple probe group modules (6) are arranged in a matrix. The probe group modules (6) arranged in a matrix around the perimeter are fixed by a first snap-fit structure and a second snap-fit structure, and each pair of adjacent probe group modules (6) are snapped together by the second snap-fit structure. The probe plate (5) is composed of at least two probe plate bodies (5a) spliced together.
2. The modular probe card assembly test socket of claim 1, wherein: Each pair of adjacent needle plate bodies (5a) are spliced and fixed together by a plug-in structure.
3. The modular probe card assembly test socket of claim 2, wherein: The plug-in structure includes: A slot (7) is provided on the side wall of one of the needle plate bodies (5a), one end of the slot (7) in the extension direction is a closed structure (7a), and the other end is an insertion port (7b); Insert (8) is disposed on the side wall of another said needle plate body (5a), the insert (8) is inserted into the slot (7) along the insertion port (7b) and terminates at the closed structure (7a).
4. The modular probe assembly test stand according to claim 3, characterized in that: The insert (8) and slot (7) are in a matching T-shape.
5. The modular probe assembly test stand according to claim 3, characterized in that: Each pair of adjacent needle plate bodies (5a) has a corresponding closing groove (9) on its upper and / or lower end face. A fixing block (10) is engaged in each pair of closing grooves (9), and the fixing block (10) is interference-fitted with the closing groove (9).
6. The modular probe assembly test stand according to claim 1, characterized in that: The first snap-fit structure is a first groove (11) and a first protrusion (12). The probe plate (5) has four inner sidewalls, two of which are integrally formed with the first groove (11) and the other two are integrally formed with the first protrusion (12).
7. The modular probe assembly test fixture according to claim 6, characterized in that: The second snap-fit structure is a second groove (13) and a second protrusion (14). The probe group module (6) has four outer side walls, two of which are integrally formed with the second groove (13) and the other two are integrally formed with the second protrusion (14). The adjacent second protrusion (14) can engage with the second groove (13); The adjacent first protrusion (12) can engage with the second groove (13); The adjacent first groove (11) can engage with the second protrusion (14).
8. The modular probe assembly test fixture according to claim 7, characterized in that: At least one of the needle plate bodies (5a) includes two sub-bodies (5b) in the thickness direction, and the sub-bodies (5b) are fixed together by bolts. The first snap-fit structure and the second snap-fit structure are distributed on the two sub-bodies (5b).
9. The modular probe assembly test stand according to claim 1, characterized in that: The probe module (6) has a block structure and is provided with a matrix of probe holes (15), with probes (16) installed in at least some of the probe holes (15).
10. The modular probe assembly test fixture according to claim 1, characterized in that: The chip limiting guide frame (2) is fixed in the guide frame groove (3) by bolts.