Probe module for crystal oscillator frequency testing

Abstract

This invention discloses a probe module for crystal oscillator frequency testing, comprising a test circuit board, a non-metallic block, and several probe assemblies. Each probe assembly includes a probe, a probe sleeve, an insulating sleeve, a metal sleeve, and a shielding wire. The non-metallic block has several holes that match the metal sleeves. The probe is inserted into one end of the probe sleeve, and the inner core of one end of the shielding wire is inserted into the other end of the probe sleeve. The probe sleeve is correspondingly positioned within the insulating sleeve, the insulating sleeve within the metal sleeve, and the metal sleeve within the holes of the non-metallic block. The other end of the shielding wire is electrically connected to the test circuit board. This invention uses a metal sleeve, such as stainless steel, on each probe to create a Faraday cage effect, shielding against external electromagnetic interference. This invention can simultaneously test multiple crystal oscillators, improving testing efficiency.

Description

Technical Field

[0001] This utility model relates to the field of wafer manufacturing technology, and in particular to a probe module for testing crystal oscillator frequency. Background Technology

[0002] In crystal oscillator frequency testing, when using conventional probe testing, the crystal oscillators are close to each other in the fixture, which also causes the probes to be close together. As a result, the electromagnetic waves and parasitic capacitances between the probes will interfere with the tested frequency, causing the tested frequency to deviate. Utility Model Content

[0003] The technical problem to be solved by this utility model embodiment is to provide a probe module for crystal oscillator frequency testing to reduce interference during testing.

[0004] To address the aforementioned technical problems, this utility model provides a probe module for crystal oscillator frequency testing, comprising a test circuit board, a non-metallic block, and several probe assemblies. Each probe assembly includes a probe, a probe sleeve, an insulating sleeve, a metal sleeve, and a shielding wire. The non-metallic block has several holes that match the metal sleeve. The probe is inserted into one end of the probe sleeve, and the inner core of one end of the shielding wire is inserted into the other end of the probe sleeve. The probe sleeve is correspondingly disposed in the insulating sleeve, the insulating sleeve is correspondingly disposed in the metal sleeve, and the metal sleeve is correspondingly disposed in the hole of the non-metallic block. The other end of the shielding wire is electrically connected to the test circuit board.

[0005] Furthermore, the probe module also includes a probe circuit board, which is disposed on a non-metallic block, and one end of the probe sleeve is soldered to the probe circuit board.

[0006] Furthermore, the probe is perpendicular to the probe circuit board.

[0007] Furthermore, the probe assembly also includes a shielded wire connector, with the other end of the shielded wire connected to the shielded wire connector, and electrically connected to the test circuit board through the shielded wire connector.

[0008] Furthermore, the probe tips of each probe assembly are flush.

[0009] The beneficial effects of this invention are as follows: This invention covers each probe with a metal sleeve, such as stainless steel, to form a Faraday cage effect and shield external electromagnetic interference; This invention can test multiple crystal oscillators simultaneously, thus improving testing efficiency. Attached Figure Description

[0010] Figure 1 This is a three-dimensional structural diagram of a probe module for crystal oscillator frequency testing according to an embodiment of the present invention.

[0011] Figure 2 This is a cross-sectional view of the probe assembly according to an embodiment of the present invention.

[0012] Explanation of icon numbers

[0013] 7. Probe circuit board; 8. Probe; 9. Probe sleeve; 10. Insulating sleeve; 11. Stainless steel sleeve; 12. Shielded wire end; 13. Non-metallic block; 14. Shielded wire; 15. Test circuit board. Detailed Implementation

[0014] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of this application can be combined with each other. The present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0015] In this embodiment of the invention, directional indicators (such as up, down, left, right, front, back, etc.) are only used to explain the relative positional relationship and movement of the components in a specific posture (as shown in the attached figure). If the specific posture changes, the directional indicators will also change accordingly.

[0016] Furthermore, in this utility model, descriptions involving "first," "second," etc., are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features.

[0017] Please refer to Figures 1-2 The probe module for crystal oscillator frequency testing according to this embodiment includes a test circuit board, a non-metallic block, a probe circuit board, and several probe components. The probe components include a probe, a probe sleeve, an insulating sleeve, a metal sleeve (which may be a stainless steel sleeve), a shielded wire, and a shielded wire connector (preferably an IPEX connector).

[0018] The non-metallic block has several holes (preferably round holes) that match the metal sleeve. A probe is inserted into one end of the probe sleeve, and the inner core of one end of the shielding wire is inserted into the other end of the probe sleeve. The probe sleeve is correspondingly positioned within an insulating sleeve, which in turn is positioned within a metal sleeve. The metal sleeve is correspondingly positioned within a hole in the non-metallic block. The other end of the shielding wire is electrically connected to the test circuit board. The probe circuit board is mounted on the non-metallic block, and one end of the probe sleeve is soldered to the probe circuit board, with the probe perpendicular to the probe circuit board. The tops of the probes in each probe assembly are flush. The other end of the shielding wire is connected to a shielding wire plug, which electrically connects to the test circuit board.

[0019] In practice, the probe sleeve is first fitted with an insulating sleeve made of Teflon or other materials, and then a stainless steel sleeve is fitted on top, forming a Faraday cage effect to reduce signal interference between probes. The probe circuit board of the soldered probe sleeve is fixed on a non-metallic block (such as fiberglass material). The non-metallic block has circular holes corresponding to the number of probes, and the size of the circular holes matches the stainless steel sleeve. The stainless steel sleeve is inserted into the holes of the non-metallic block, and the shielded cable with an IPEX connector is plugged into the test circuit board. The test accuracy of this embodiment is improved by 50% compared with the ordinary test scheme.

[0020] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A probe module for testing crystal oscillator frequencies, characterized in that, The test circuit includes a test circuit board, a non-metallic block, and several probe assemblies. Each probe assembly includes a probe, a probe sleeve, an insulating sleeve, a metal sleeve, and a shielding wire. The non-metallic block has several holes that match the metal sleeve. The probe is inserted into one end of the probe sleeve, and the inner core of one end of the shielding wire is inserted into the other end of the probe sleeve. The probe sleeve is correspondingly located in the insulating sleeve, the insulating sleeve is correspondingly located in the metal sleeve, and the metal sleeve is correspondingly located in the hole of the non-metallic block. The other end of the shielding wire is electrically connected to the test circuit board.

2. The probe module for crystal oscillator frequency testing as described in claim 1, characterized in that, The probe module also includes a probe circuit board, which is mounted on a non-metallic block, and one end of the probe sleeve is soldered to the probe circuit board.

3. The probe module for crystal oscillator frequency testing as described in claim 2, characterized in that, The probe is perpendicular to the probe circuit board.

4. The probe module for crystal oscillator frequency testing as described in claim 1, characterized in that, The probe assembly also includes a shielded wire connector, with the other end of the shielded wire connected to the shielded wire connector, which is electrically connected to the test circuit board.

5. The probe module for crystal oscillator frequency testing as described in claim 1, characterized in that, The probe tips of each probe assembly are flush.

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