A server burn-in test rack

Abstract

The application belongs to the technical field of aging test racks, and discloses a server aging test rack, which comprises a profile frame, the adjusting hole is a sliding groove profile comprising a vertical vertical frame and a horizontal horizontal frame, a sliding block is arranged in the sliding groove of the vertical frame, and every two sliding blocks form a group; a plurality of adjusting holes are uniformly arranged on the vertical frame, and a fixing hole with the same size as the adjusting hole is arranged on the sliding block; a bracket is arranged on the bracket, the bracket comprises a horizontally arranged supporting plate and a vertically arranged baffle, the supporting plate and the baffle form a right-angle structure, the head and tail ends of the baffle are detachably connected with the fixing hole, two brackets on the same plane form a group, and a plurality of groups of brackets are horizontally arranged in the profile frame.

Description

Technical Field

[0001] This application relates to the field of aging test rack technology, and more specifically, to a server aging test rack. Background Technology

[0002] In traditional aging chambers, aging racks are mainly designed to accommodate products assembled on assembly lines. Their structure is relatively fixed and they are only suitable for aging tests of single products.

[0003] When production lines change, if the size and specifications of the new products are different from those of the original products and cannot completely fill the aging racks, a large number of aging positions will be left idle and wasted, resulting in the unreasonable use of resources.

[0004] Meanwhile, traditional aging racks may lack convenient design in terms of server placement, fixation, and power and network connections, affecting the efficiency and reliability of aging tests.

[0005] To address these issues, this invention proposes a novel server aging test rack to improve its versatility, space utilization, ease of operation, and test reliability. Utility Model Content

[0006] To address the aforementioned issues, this application provides a server aging test rack.

[0007] The server aging test rack provided in this application adopts the following technical solution:

[0008] A server aging test rack, comprising:

[0009] A profile frame, wherein the profile frame is a groove profile including a vertical frame and a horizontal frame, wherein a slider is slidably disposed in the groove of the vertical frame, and every two sliders form a group; a plurality of adjustment holes are evenly opened on the vertical frame, and a fixing hole of the same size as the adjustment hole is provided on the slider;

[0010] The bracket includes a horizontally arranged support plate and a vertically arranged baffle. The support plate and the baffle form a right-angle structure. The first and last ends of the baffle are detachably connected to the fixing holes. Two brackets on the same plane form a group. Multiple groups of brackets are horizontally arranged within the profile frame.

[0011] Furthermore, the upper surface of the pallet is provided with roller strips, which are low rolling resistance rollers.

[0012] By using the above technical solution, low rolling resistance rollers are set on the upper surface of the pallet, which greatly facilitates the movement of the server on the pallet. When it is necessary to place or remove the server for aging test, the operator only needs to push or pull gently, and the server can easily slide onto the carrier with the help of the low resistance of the rollers. This not only reduces the physical exertion of the operator, but also improves the operating efficiency, and at the same time reduces the risk of collision damage that may be caused by moving the server.

[0013] Furthermore, any one of the multiple sets of brackets is also provided with an I-shaped reinforcing member, which connects to the horizontally adjacent brackets, and the reinforcing member is also provided with the roller strip.

[0014] Through the above technical solutions, on the one hand, the reinforcing components enhance the stability of the bracket structure, enabling the test rack to support heavier servers and ensuring that the bracket will not deform or be damaged due to excessive force during aging tests; on the other hand, the roller strips on the reinforcing components further optimize the smoothness of the server's transition between trays, improving the overall user experience.

[0015] Furthermore, a buffer pad is provided at the tail end of the bracket, and the height of the buffer pad is the same as the height of the baffle; a guide plate extending outward is provided at the head end of the baffle, and the guide plates on the same plane expand outward in opposite directions.

[0016] Through the above technical solution, the buffer pad can cushion the server when it slides to the end of the bracket, preventing damage to the server due to collision; while the guide plate at the head of the baffle extends outward and expands outward in the opposite direction on the same plane, which can guide the server when it is placed, making it easier and more accurate to place the server on the bracket, improving the convenience and accuracy of operation.

[0017] Furthermore, a limiting pin is vertically provided at the front end of the tray, with the pin head facing upwards.

[0018] The above technical solution prevents the server from sliding forward due to vibration or other reasons during the test, ensuring that the server maintains a stable position on the tray, thereby ensuring the smooth progress of the aging test and improving the reliability of the test.

[0019] Furthermore, adjacent profile frames are fixedly connected, and multiple power interfaces and network interfaces are provided at the connection points of the fixed connection.

[0020] The above technical solution facilitates power supply and network connection for servers during aging tests, eliminating the need for additional complex cabling, saving cabling costs and space, and also making it easier to centrally manage and control multiple servers, thus improving the overall efficiency of aging tests.

[0021] In summary, this application includes at least one of the following beneficial technical effects:

[0022] (1) Through the flexible combination design of profile frame and bracket, the position of bracket can be adjusted according to the size and layout of different server products, which effectively avoids the problem of aging rack wasting aging space due to single product and line replacement, improves the adaptability of aging rack to different products, and makes full use of aging rack space.

[0023] (2) From the roller strips on the pallet that facilitate server movement, to the optimization of server placement and fixation by components such as buffer pads, guide plates, and limit pins, as well as the power and network interfaces set at the connection points of adjacent frames, all these greatly improve the convenience for operators in placing and fixing servers and connecting power and network, while ensuring the stability of the server during the aging test and improving the reliability of the test. Attached Figure Description

[0024] Figure 1 is a schematic diagram of the structure of this application;

[0025] Figure 2 is a three-dimensional structural diagram of this application;

[0026] Figure 3 is a schematic diagram of the bracket structure of this application. Figure 1 ;

[0027] Figure 4 is a schematic diagram of the bracket structure of this application. Figure 2 .

[0028] The following are the labels in the diagram: 1. Profile frame; 2. Slider; 3. Adjustment hole; 4. Support plate; 5. Baffle; 6. Roller strip; 7. Reinforcing member; 8. Buffer pad; 9. Guide plate; 10. Limit pin; 11. Power interface; 12. Network interface. Detailed Implementation

[0029] The technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of the embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.

[0030] In the description of this application, it should be noted that the terms "upper," "lower," "inner," "outer," "top / bottom," etc., indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0031] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "installed," "equipped with," "sleeved / connected," "connected," etc., should be interpreted broadly. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be a connection within two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0032] Example:

[0033] The present application will be further described in detail below with reference to Figures 1-4.

[0034] This application discloses a server aging test rack, comprising:

[0035] Profile frame 1, profile frame 1 is a sliding profile including a vertical frame and a horizontal frame, a slider 2 is slidably installed in the sliding groove of the vertical frame, and every two sliders 2 form a group; a number of adjustment holes 3 are evenly opened on the vertical frame, and the slider 2 is provided with a fixing hole of the same size as the adjustment hole 3;

[0036] The bracket includes a horizontally arranged support plate 4 and a vertically arranged baffle 5. The support plate 4 and the baffle 5 form a right-angle structure. The first and last ends of the baffle 5 are detachably connected to the fixing holes. Two brackets on the same plane form a group. Multiple groups of brackets are horizontally arranged inside the profile frame 1.

[0037] Referring to Figures 1, 2, 3, and 4, the upper surface of the tray 4 is equipped with rollers 6, which are low-rolling-resistance rollers. The low-rolling-resistance rollers 6 on the upper surface of the tray 4 greatly facilitate the movement of the server on the tray 4. When it is necessary to place or remove the server for aging tests, the operator only needs to gently push or pull, and the server can easily slide onto the carrier using the low resistance of the rollers 6.

[0038] This not only reduces the physical exertion of operators and improves operational efficiency, but also reduces the risk of collision damage that may be caused by moving servers.

[0039] See Figures 1, 2, and 3. Figure 4 Each of the multiple sets of trays is also equipped with an I-shaped reinforcing member 7, which connects to the horizontally adjacent trays 4. The reinforcing member 7 is also equipped with roller strips 6. On the one hand, the reinforcing member 7 enhances the stability of the tray structure, enabling the test rack to support heavier servers and ensuring that the tray will not deform or be damaged due to excessive force during aging tests. On the other hand, the roller strips 6 on the reinforcing member 7 further optimize the smoothness of the server transition between trays 4, improving the overall user experience.

[0040] Referring to Figures 1, 2, 3, and 4, a buffer pad 8 is provided at the rear end of the bracket, and the height of the buffer pad 8 is the same as the height of the baffle 5. A guide plate 9 extending outward is provided at the front end of the baffle 5, and the guide plates 9 on the same plane expand outward in opposite directions. The buffer pad 8 can buffer the server when it slides to the end of the bracket, preventing the server from being damaged by collision. The guide plate 9 at the front end of the baffle 5, which extends outward and expands outward in opposite directions on the same plane, can guide the server when it is placed, making it easier and more accurate to place the server on the bracket, thus improving the convenience and accuracy of operation.

[0041] Referring to Figures 1, 2, 3, and 4, a limit pin 10 is vertically installed at the front end of the pallet 4.

[0042] The pin of pin 10 faces upward; this prevents the server from sliding forward due to vibration or other reasons during the test, ensuring that the server maintains a stable position on tray 4, thereby ensuring the smooth progress of the aging test and improving the reliability of the test.

[0043] Referring to Figures 1, 2, 3 and 4, adjacent profile frames 1 are fixedly connected, and multiple power interfaces 11 and network interfaces 12 are provided at the connection points of the fixed connection.

[0044] The above technical solution simplifies power supply and network connectivity for servers during aging tests, eliminating the need for complex cabling and saving on cabling costs and space. It also facilitates centralized management and control of multiple servers, improving the overall efficiency of aging tests.

[0045] See Figures 1, 2, 3 and 4.

[0046] The implementation principle of a server aging test rack in this application embodiment is as follows:

[0047] When the server aging test rack is in operation, firstly, according to the size and layout requirements of the server, slide the slider in the groove of the profile frame vertical frame to the appropriate position, and fix the slider by cooperating with the adjustment holes on the vertical frame through the fixing holes.

[0048] Then, the bracket baffle is detachably connected to the slider fixing holes at both ends and installed into the profile frame to form a multi-layer placement structure.

[0049] When placing the server, ensure that the limit pin is lowered. Use a support vehicle or other relevant equipment to lift the server, and then use a guide plate to guide the server to be accurately placed on the tray. The roller strips facilitate the server to slide on the tray. After the server is completely placed, push the limit pin upward to prevent the server from sliding forward. The buffer pads provide cushioning protection when the server slides to the end of the tray.

[0050] After the server is placed, power it and connect it to the network through the power interface and network interface on the adjacent frame connection point for aging test.

[0051] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. A server aging test rack, characterized in that, include: The profile frame (1) is a groove profile including a vertical frame and a horizontal frame. A slider (2) is slidably arranged in the groove of the vertical frame. Every two sliders (2) form a group. Several adjustment holes (3) are evenly opened on the vertical frame. The slider (2) is provided with a fixing hole of the same size as the adjustment hole (3). The bracket includes a horizontally arranged support plate (4) and a vertically arranged baffle (5). The support plate (4) and the baffle (5) form a right-angle structure. The first and last ends of the baffle (5) are detachably connected to the fixing hole. Two brackets on the same plane form a group. Multiple groups of brackets are horizontally arranged inside the profile frame (1).

2. The server aging test rack according to claim 1, characterized in that: The upper surface of the pallet (4) is provided with roller strips (6), which are low rolling resistance rollers.

3. A server aging test rack according to claim 2, characterized in that: The brackets located in any one of the multiple brackets are also provided with an I-shaped reinforcing member (7), the reinforcing member (7) is connected to the horizontally adjacent tray (4), and the reinforcing member (7) is also provided with the roller strip (6).

4. A server aging test rack according to claim 1, characterized in that: The bracket is provided with a buffer pad (8) at its tail end. The height of the buffer pad (8) is the same as the height of the baffle (5). The baffle (5) is provided with a guide plate (9) extending outward at its head end. The guide plates (9) on the same plane extend outward in opposite directions.

5. A server aging test rack according to claim 1, characterized in that: The first end of the tray (4) is vertically provided with a limiting pin (10), and the pin head of the limiting pin (10) is upward.

6. A server aging test rack according to claim 1, characterized in that: The adjacent profile frames (1) are fixedly connected, and multiple power interfaces (11) and network interfaces (12) are provided at the connection points of the fixed connection.

Images