Test fixture and test apparatus
Patent Information
- Application Number
- CN202522366833.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-11-07
- Publication Date
- 2026-11-03
- Estimated Expiration
- 2035-11-07
AI Technical Summary
In traditional test fixtures, the floating of the module itself leads to instability in the stress test process, easily scratches the module surface, and poor contact of the large probe can cause arcing, affecting the reliability of the test.
Design a test fixture including a substrate, a base, first and second test components, and a floating component. The floating component carries the module under test, ensuring stable contact between it and the test components and guaranteeing accurate terminal alignment. Spring contacts and signal probes are used to achieve stable contact and avoid poor contact.
It improves the stability and reliability of testing, prevents unstable module positioning and surface scratches, ensures the continuity and reliability of signal transmission, and reduces the occurrence of local overheating and arcing.
Smart Images
Figure CN224934043U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of semiconductor testing technology, and in particular to a test fixture and test device. Background Technology
[0002] Power semiconductor modules (such as IGBT modules) typically require quality and performance testing during the manufacturing process. Traditional test fixtures usually rely on the module's own floating positioning and use large probes to contact the module terminals.
[0003] However, the floating of the module itself can cause instability in the stress test process, which can easily scratch the surface of the module; and the large probe is also prone to arcing during the test due to poor contact with the module terminals, which affects the reliability of the test. Utility Model Content
[0004] Therefore, it is necessary to provide a test fixture and test device to address the above problems and ensure test stability and reliability.
[0005] This utility model first provides a test fixture, comprising: a substrate; a base disposed on the substrate and having a first clearance hole; a first test component disposed on the substrate and electrically connected to the substrate, the first test component being located outside the base; a second test component disposed on the substrate and electrically connected to the substrate, the second test component being located within the first clearance hole; and a floating component disposed on the side of the base away from the substrate and capable of rising and falling relative to the base in a preset direction, the floating component having a second clearance hole corresponding to the second test component, the floating component being used to carry the module under test, so that when the floating component descends, the first terminal of the module under test is electrically connected to the first test component, and the second terminal of the module under test is electrically connected to the second test component.
[0006] In the aforementioned test fixture, the module under test is supported on the floating component and floats and rises synchronously with the floating component, making the test process stable and reliable, preventing unstable positioning of the module under test or scratches on its surface; furthermore, by limiting the relative positional relationship between the first and second test components and the base and floating component, when the module under test and the floating component as a whole descend relative to the base, it can be ensured that the first terminal and the first test component, and the second terminal and the second test component are always accurately aligned and in stable contact, avoiding arcing due to poor contact, thereby ensuring test stability and reliability.
[0007] In one embodiment, the first test component includes a mounting post and a spring plate. The mounting post is disposed on the substrate, and one end of the spring plate is connected to the end of the mounting post away from the substrate and is electrically connected to the substrate through the mounting post. When the floating component descends, the first terminal of the module under test is pressed against the end of the spring plate away from the mounting post.
[0008] With this configuration, the spring can form a stable and tight elastic contact with the first terminal, and the contact area is large, making it suitable for high current and high voltage testing; moreover, the structure of the spring and the mounting post is stable, ensuring the continuity and reliability of the signal transmission path.
[0009] In one embodiment, the spring extends at an angle toward the side away from the substrate, from one end near the mounting post to the other end away from the mounting post.
[0010] This configuration ensures that the spring is initially tilted, guaranteeing a large-area, reliable contact between the first terminal and the spring.
[0011] In one embodiment, the first test component further includes a push structure disposed on the substrate, the push structure being located on the side of the spring piece closer to the substrate and capable of pushing the spring piece toward the side away from the substrate.
[0012] With this configuration, the first terminal and the push structure clamp the spring sheet on both sides, preventing momentary disconnection or increased contact resistance caused by spring sheet vibration or insufficient pressure of the first terminal, and ensuring that a stable and tight contact can be formed between the first terminal and the spring sheet.
[0013] In one embodiment, the spring includes two stacked spring structures; and / or, the first test assembly further includes a clamping plate that clamps and fixes one end of the spring to the end of the mounting post away from the substrate; and / or, the first test assembly further includes a gasket connected to the end of the mounting post near the substrate, the outer wall of the mounting post having a protrusion, the protrusion and the gasket being fixed to the two sides of the substrate respectively.
[0014] With this configuration, the two spring structures can enhance the spring's ability to carry high currents without affecting its deformation capacity; the clamping plate can apply evenly distributed pressure to the spring, preventing it from deforming or being damaged due to excessive local stress, while ensuring a reliable connection and good contact between the spring and the mounting post; the gasket and boss can prevent the mounting post from shaking or shifting relative to the substrate, ensuring a reliable connection and good contact between the substrate and the mounting post.
[0015] In one embodiment, the floating component includes a guide and a carrier for carrying the module under test. The guide is disposed on the base and extends along the preset direction, and the carrier is disposed on the guide and is slidable relative to the guide along the preset direction.
[0016] This configuration ensures that the carrier and the module under test can always move smoothly up and down in the preset direction, while ensuring that the first terminal and the second terminal can contact the corresponding first test component and the second test component in the same posture and path each time, thereby improving the accuracy and consistency of the test results.
[0017] In one embodiment, the carrier is provided with a carrier groove and a positioning groove. The carrier groove is used to accommodate the module under test. The bottom wall of the carrier groove is provided with a second clearance hole. The positioning groove communicates with the inner side wall of the carrier groove and extends along the preset direction.
[0018] With this configuration, the support slot is used to accommodate and limit the module under test, ensuring that after the module under test is placed in the support slot, the first terminal and the second terminal are aligned with the first test component and the second test component, respectively; the positioning slot provides operating space for the user, making it easy for the user to pick up and put down the module under test, and also provides a guiding function for the hand pressure plate.
[0019] In one embodiment, the second test component includes a needle holder and a plurality of signal probes, the needle holder being disposed on the substrate, and each of the signal probes being disposed at intervals on the needle holder and electrically connected to the substrate.
[0020] With this configuration, the signal probe can form a stable and tight elastic contact with the second terminal, ensuring a reliable electrical connection between the two.
[0021] In one embodiment, the first test component and / or the second test component are detachably connected to the substrate.
[0022] This setup allows for the separate replacement or maintenance of the first and second test components, simplifying operations, improving maintenance efficiency, and reducing costs. It also enables the high-performance test fixture to be used for testing different modules under test, expanding its applicability and increasing flexibility.
[0023] This utility model also provides a testing device, including the testing fixture described above. Attached Figure Description
[0024] To more clearly illustrate the technical solutions in the embodiments of this application or the conventional technology, the drawings used in the description of the embodiments or the conventional technology will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0025] Figure 1 This is a three-dimensional structural diagram of the test fixture and the module under test according to one embodiment of the present invention.
[0026] Figure 2 for Figure 1 A partial three-dimensional structural diagram of the test fixture;
[0027] Figure 3 for Figure 2 A partial cross-sectional view of the test fixture;
[0028] Figure 4 for Figure 2 A partial three-dimensional structural diagram of the middle substrate and the second test assembly;
[0029] Figure 5 for Figure 2 A schematic diagram of the structure of the middle substrate and the first test component from a side view;
[0030] Figure 6 for Figure 1 The test fixture and the cross-sectional view of the module under test;
[0031] Figure 7 for Figure 6 Enlarged view of point A in the middle;
[0032] Figure 8 for Figure 6 Enlarged view of point B in the middle.
[0033] Reference numerals: 1. Substrate; 2. Base; 21. First clearance hole; 3. First test assembly; 31. Mounting post; 311. Boss; 32. Spring; 33. Pushing structure; 331. Housing; 332. Pushing member; 333. Second elastic member; 34. Clamping plate; 35. Gasket; 36. Mounting base; 4. Second test assembly; 41. Needle holder; 42. Signal probe; 421. Needle tip; 422. Needle sleeve; 5. Floating assembly; 51. Guide member; 52. Bearing member; 521. Second clearance hole; 522. Bearing groove; 523. Positioning groove; 524. Guide hole; 53. Linear bearing; 54. First elastic member; 6. Module under test; 61. First terminal; 62. Second terminal. Detailed Implementation
[0034] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.
[0035] It should be noted that when a component is referred to as being "fixed to" or "set on" another component, it can be directly on the other component or there may be an intermediate component. When a component is considered to be "connected to" another component, it can be directly connected to the other component or there may be an intermediate component present. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application's specification are for illustrative purposes only and do not represent the only possible implementation.
[0036] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0037] In this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature and the second feature are in indirect contact through an intermediate medium. Furthermore, "above," "over," and "on top" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.
[0038] Unless otherwise defined, all technical and scientific terms used in this application have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in this application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The term "and / or" as used in this application includes any and all combinations of one or more of the associated listed items.
[0039] Power semiconductor modules (such as IGBT modules) typically require quality and performance testing during manufacturing. Traditional test fixtures usually rely on the module's own floating positioning and use large probes to contact the module terminals. However, the module's own floating can lead to instability during the voltage testing process, easily causing scratches on the module surface; furthermore, the large probes are prone to arcing during testing due to poor contact with the module terminals, affecting test reliability.
[0040] To solve the above problems, such as Figures 1 to 8 As shown, this utility model provides a test fixture to ensure test stability and reliability.
[0041] like Figures 1 to 2 As shown, specifically, the test fixture includes a substrate 1, a base 2, a first test component 3, a second test component 4, and a floating component 5. The base 2 is disposed on the substrate 1 and has a first clearance hole 21. The first test component 3 is disposed on the substrate 1 and electrically connected to the substrate 1, located on the outer side of the base 2. The second test component 4 is disposed on the substrate 1 and electrically connected to the substrate 1, located within the first clearance hole 21. The floating component 5 is disposed on the side of the base 2 away from the substrate 1 and can rise and fall relative to the base 2 in a preset direction. The floating component 5 has a second clearance hole 521 corresponding to the second test component 4. The floating component 5 is used to support the module under test 6, so that when the floating component 5 descends, the first terminal 61 of the module under test 6 is electrically connected to the first test component 3, and the second terminal 62 of the module under test 6 is electrically connected to the second test component 4. The module under test 6 includes a module body, a first terminal 61 located on the outside of the module body, and a first test component 3 arranged corresponding to the first terminal 61; a second terminal 62 located on the module body, and a second test component 4 arranged corresponding to the second terminal 62.
[0042] In the test fixture provided in this embodiment of the utility model, the module under test 6 is supported on the floating component 5 and floats and rises and falls synchronously with the floating component 5, making the test process stable and reliable, and preventing the module under test 6 from being unstable in positioning or scratched on the surface due to its own movement. Furthermore, by limiting the relative positional relationship between the first test component 3 and the second test component 4 and the base 2 and the floating component 5, when the module under test 6 and the floating component 5 as a whole descend relative to the base 2, the first terminal 61 contacts the first test component 3, and the second terminal 62 contacts the second test component 4 through the first clearance hole 21 and the second clearance hole 521. This ensures that the first terminal 61 and the first test component 3, and the second terminal 62 and the second test component 4 are always accurately aligned and in stable contact, avoiding arcing due to poor contact, thereby ensuring the stability and reliability of the test.
[0043] The preset direction is the Z-axis direction shown in the figure. In the illustrated embodiment, substrate 1 is parallel to the horizontal plane, and the preset direction is the vertical direction. Of course, in other embodiments, substrate 1 can be set to form an angle with the horizontal plane, or the preset direction can be set to form an angle with the vertical direction, depending on the actual testing needs.
[0044] like Figure 2 and Figure 5 As shown, in one embodiment, the first test component 3 includes a mounting post 31 and a spring piece 32. The mounting post 31 is disposed on the substrate 1. One end of the spring piece 32 is connected to the end of the mounting post 31 away from the substrate 1 and is electrically connected to the substrate 1 through the mounting post 31. When the floating component 5 descends, the first terminal 61 of the module under test 6 is pressed against the end of the spring piece 32 away from the mounting post 31. When the first terminal 61 presses the end of the spring piece 32 away from the mounting post 31 downwards, the spring piece 32 can generate an upward pushing force under its own elastic deformation, forming a stable and tight elastic contact with the first terminal 61. Even with minor processing or assembly errors, the first terminal 61 and the spring piece 32 can still maintain contact, thereby further avoiding local overheating and arcing caused by poor contact, and reducing processing and assembly accuracy requirements, thus lowering costs. The large contact area between the first terminal 61 and the spring piece 32 makes the test fixture suitable for high-current and high-voltage testing. At the same time, the spring piece 32 is fixed and electrically connected to the substrate 1 through the mounting post 31, with a stable structure, ensuring the continuity and reliability of the signal transmission path, thereby improving the durability of the test fixture and the accuracy of the test results. Among them, the spring piece 32 is a copper sheet with a gold-plated surface, and the mounting post 31 is a copper post to ensure the conductivity of the spring piece 32 and the mounting post 31, while also ensuring the oxidation resistance of the spring piece 32. Of course, in other embodiments, the first test component 3 may also be configured as a signal probe, metal braided strip or other crimped terminals, depending on the structure of the module under test 6 and the test requirements. This embodiment of the present invention does not impose specific limitations here.
[0045] like Figure 5 As shown, in one embodiment, the spring piece 32 extends at an angle away from the mounting post 31 from one end near the mounting post 31 to the other end away from the mounting post 31. This ensures that the spring piece 32 is initially in an inclined state. When the first terminal 61 is pressed down, the spring piece 32 can change from an inclined state to a horizontal state parallel to the substrate 1, further ensuring a large-area, reliable contact between the first terminal 61 and the spring piece 32, avoiding localized overheating and arcing, and improving the safety and reliability of the test. Of course, in other embodiments, the initial state of the spring piece 32 can also be a horizontal state parallel to the substrate 1.
[0046] like Figure 5As shown, in one embodiment, the spring 32 includes two stacked spring structures. The two spring structures significantly increase the cross-sectional area and path for current conduction, enhancing the spring 32's ability to carry large currents, while not affecting its deformation capacity. This ensures a stable and tight elastic contact with the first terminal 61, thereby further improving the safety and reliability of the test. Of course, in other embodiments, the spring 32 can be a single independent spring structure, or it can include three, four, or more stacked spring structures, as long as the normal operation of the test can be ensured. This embodiment of the present invention does not impose specific limitations.
[0047] like Figure 5 As shown, in one embodiment, the first test component 3 further includes a clamping plate 34, which clamps and fixes one end of the spring piece 32 to the end of the mounting post 31 away from the substrate 1. Specifically, fasteners such as screws and bolts can be used to sequentially pass through the clamping plate 34 and the spring piece 32 and then lock and fix it to the mounting post 31. The contact area between the clamping plate 34 and the spring piece 32 is relatively large, which can convert the concentrated stress generated when the fastener is tightened into a uniformly distributed pressure, avoiding deformation or damage to the spring piece 32 due to excessive local stress. At the same time, it can also ensure a reliable connection and good contact between the spring piece 32 and the mounting post 31, extending the service life of the first test component 3. Of course, in other embodiments, fasteners such as screws and bolts can be used directly, or snap-fitting, welding, or other methods can be used to fix the spring piece 32 to the mounting post 31, as long as the stability and reliability of the connection between the two can be ensured. This embodiment of the present invention does not impose specific limitations here.
[0048] like Figure 5 As shown, in one embodiment, the first test component 3 further includes a gasket 35 connected to the end of the mounting post 31 near the substrate 1. A boss 311 protrudes from the outer wall of the mounting post 31, and the boss 311 and gasket 35 are respectively fixed to the two sides of the substrate 1. Specifically, screws, bolts, or other fasteners can be used to pass through the gasket 35 and the substrate 1 sequentially and then lock and fix them to the mounting post 31. Preferably, the depth of the threaded hole in the mounting post 31 is not less than 8 mm. Simultaneously, screws, bolts, or other fasteners can be used to pass through the boss 311 and then lock and fix them to the substrate 1. Thus, by clamping the gasket 35 and the boss 311 to the substrate 1, the mounting post 31 is prevented from shaking or shifting relative to the substrate 1, ensuring a reliable connection and good contact between the substrate 1 and the mounting post 31. Of course, in other embodiments, screws, bolts, or other fasteners can be directly used, or snap-fitting, welding, or other methods can be used to fix the mounting post 31 to the substrate 1, as long as the stability and reliability of the connection between the two can be ensured. This embodiment of the present invention does not impose specific limitations here.
[0049] like Figures 5 to 7As shown, the first test assembly 3 also includes a push structure 33 disposed on the substrate 1. The push structure 33 is located on the side of the spring piece 32 closer to the substrate 1 and can push the spring piece 32 toward the side away from the substrate 1. When the first terminal 61 presses the spring piece 32 downward, the push structure 33 can push the spring piece 32 upward, so that the first terminal 61 and the push structure 33 clamp the spring piece 32 on both sides of the spring piece 32, preventing instantaneous disconnection or increased contact resistance due to vibration of the spring piece 32 or insufficient pressure of the first terminal 61, thereby further ensuring that a stable and tight contact can be formed between the first terminal 61 and the spring piece 32, avoiding local overheating and arcing, and improving the safety and reliability of the test.
[0050] like Figure 7 As shown in the illustrated embodiment, the pushing structure 33 includes a housing 331, a pushing member 332, and a second elastic member 333. The first test assembly 3 also includes a mounting base 36 fixed to the substrate 1 by fasteners such as screws and bolts. The housing 331 is fixed to the side of the mounting base 36 away from the substrate 1 by fasteners such as screws and bolts, or the housing 331 can be directly fixed to the substrate 1 by fasteners such as screws and bolts. The pushing member 332 is telescopically disposed within the housing 331. The second elastic member 333 is disposed between the pushing member 332 and the inner wall of the housing 331, and can apply a pushing force toward the spring piece 32 to the pushing member 332, causing the pushing member 332 to push the spring piece 32 upward. The number of second elastic members 333 can be one, two, or more, and multiple second elastic members 333 are arranged at intervals. The pusher 332 can be made of materials such as polyphenylene sulfide (PPS) or polyoxymethylene (POM) to avoid short circuits or scratches on the spring 32, ensuring the safety and reliability of the test. Of course, in other embodiments, the pusher structure 33 can also be set as an electric push rod, a pneumatic cylinder, a hydraulic cylinder, or other structures that can apply an upward pushing force to the spring 32. This embodiment of the present invention does not impose specific limitations.
[0051] like Figure 4 and Figure 8As shown, in one embodiment, the second test component 4 includes a needle holder 41 and a plurality of signal probes 42. The needle holder 41 is disposed on the substrate 1, and each signal probe 42 is spaced apart on the needle holder 41 and electrically connected to the substrate 1. The signal probes 42 are arranged one-to-one with the second terminals 62. When the floating component 5 descends, the signal probes 42 are compressed and can form a stable and tight elastic contact with the second terminals 62, ensuring a reliable electrical connection between the two. Specifically, the needle holder 41 can be fixedly disposed on the substrate 1 by fasteners such as screws and bolts. The signal probes 42 can be steel needles, including a needle head 421 and a needle sleeve 422. The needle sleeve 422 is fixedly disposed on the needle holder 41, passes through the solder pad holes on the substrate 1, and is fixedly connected to the substrate 1 by soldering. The needle head 421 is movably disposed within the needle sleeve 422, and the needle sleeve 422 has an inwardly contracting ring (not shown) to prevent the needle head 421 from falling out of the needle sleeve 422. The thickness of the needle holder 41 can be adjusted according to the length of the signal probes 42. Of course, in other embodiments, the second test component 4 can also be a metal contact, a spring, or other crimp-type terminal block. This embodiment of the present invention does not impose specific limitations here.
[0052] like Figure 2 and Figure 4 As shown, in one embodiment, the first test component 3 and the second test component 4 are detachably connected to the substrate 1. Thus, the first test component 3 and the second test component 4 are modularly configured. When the structure of the module under test 6 changes, or when some of the first test components 3 and 4 are damaged, the corresponding first test component 3 and second test component 4 can be replaced or maintained individually without replacing or discarding the substrate 1 or the entire test fixture. This simplifies the operation, improves maintenance efficiency, and reduces costs. Furthermore, it allows the high-performance test fixture to be applied to the testing of different modules under test 6, expanding its applicability and increasing flexibility.
[0053] In the illustrated embodiment, there are nine first test components 3, arranged opposite each other on both sides of the base 2, and each corresponding to a first terminal 61 of the module under test 6; there is one second test component 4. Of course, the number of first test components 3 can also be one, two, three, four, five, six, seven, eight, ten, or more, and the number of second test components 4 can also be two, three, four, or more. The specific number can be adjusted according to the structure of the module under test 6 and the testing requirements, and this embodiment does not impose specific limitations. In other embodiments, the first test components 3 and the second test components 4 can also be fixedly mounted on the substrate 1, and the entire test fixture can be replaced synchronously when the structure of the module under test 6 changes.
[0054] like Figures 2 to 3As shown, the floating component 5 includes a guide 51 and a carrier 52 for supporting the module under test 6. The guide 51 is disposed on the base 2 and extends along a preset direction, while the carrier 52 is disposed on the guide 51 and can slide relative to the guide 51 along the preset direction. The guide 51 extends along the preset direction, providing precise guidance for the floating of the carrier 52, ensuring that the carrier 52 and the module under test 6 can always rise and fall smoothly along the preset direction, preventing the module under test 6 from being scratched or having poor contact due to tilting or offset of the carrier 52. At the same time, it ensures that the first terminal 61 and the second terminal 62 of the module under test 6 can contact the corresponding first test component 3 and the second test component 4 in the same posture and path each time, thereby improving the accuracy and consistency of the test results.
[0055] In the illustrated embodiment, the guide member 51 is a guide shaft, and the carrier member 52 is provided with a guide hole 524 extending along a preset direction. The floating component 5 also includes a linear bearing 53 disposed within the guide hole 524 and slidingly engaged with the guide shaft to ensure that the carrier member 52 can smoothly slide relative to the guide member 51 along the preset direction and avoid jamming. The number of guide members 51 is four, arranged opposite each other on both sides of the base 2 where the first test component 3 is not located, to avoid interference between the guide members 51 and the first test component 3, and also to ensure that the carrier member 52 can float smoothly. Alternatively, the number of guide members 51 can be set to one, two, three, five, or more as needed, with multiple guide members 51 arranged at intervals along the circumference of the base 2. Of course, in other embodiments, the guide member 51 can also be a guide groove, guide rail, or other guiding structure, as long as it ensures that the carrier member 52 and the tested module 6 can always rise and fall smoothly along the preset direction. This embodiment of the present invention does not impose specific limitations here.
[0056] like Figure 3 As shown, the floating assembly 5 also includes a first elastic element 54 corresponding to each guide shaft. The first elastic element 54 is sleeved on the corresponding guide shaft, and its two ends abut against the support member 52 and the base 2, respectively. When the support member 52 is lowered, the first elastic element 54 is compressed and can apply a force to the support member 52 to make it move upward. Thus, after the external force is removed, the support member 52 and the tested module 6 can automatically reset under the action of the elastic force of the first elastic element 54, thereby simplifying the operation steps.
[0057] like Figures 2 to 3As shown, the carrier 52 is provided with a carrier groove 522 and a positioning groove 523. The carrier groove 522 is used to accommodate the module under test 6. The bottom wall of the carrier groove 522 is provided with a second clearance hole 521. The positioning groove 523 communicates with the inner wall of the carrier groove 522 and extends along a preset direction. The carrier groove 522 is used to accommodate and limit the module under test 6, ensuring that after the module under test 6 is placed in the carrier groove 522, the first terminal 61 and the second terminal 62 are aligned with the first test assembly 3 and the second test assembly 4, respectively. In addition, a small gap can be left between the inner wall of the carrier groove 522 and the module under test 6 to avoid the first terminal 61 and the second terminal 62 failing to align with the first test assembly 3 and the second test assembly 4 due to processing and assembly errors, and at the same time to ensure that the module under test 6 will not move relative to the carrier 52 during the test. The positioning groove 523 provides operating space for the user, making it convenient for the user to pick up and put down the module under test 6, and also provides a guiding function for the hand pressure plate (not shown) of the test device. Specifically, during the test, a hand pressure plate is placed on the floating component 5 and the module under test 6, providing downward pressure to both, causing them to descend as a whole. The side of the hand pressure plate facing the floating component 5 has a positioning block corresponding to the positioning groove 523, facilitating user positioning and ensuring the hand pressure plate does not move relative to the support member 52 during the test. The support member 52 can be made of materials such as polyphenylene sulfide (PPS) or polyoxymethylene (POM) to prevent short circuits or scratches on the spring 32, ensuring the safety and reliability of the test. In the illustrated embodiment, there are four positioning grooves 523, arranged opposite each other on the sides of the base 2 where the first test component 3 is not located, preventing interference between the positioning grooves 523 and the first test component 3, and also facilitating user placement and removal of the module under test 6. Alternatively, the number of positioning grooves 523 can be set to one, two, three, five, or more as needed, with multiple positioning grooves 523 spaced apart circumferentially along the support member 52.
[0058] Furthermore, the base 2 and the floating assembly 5 can also be detachably connected to the substrate 1 using fasteners such as screws and bolts. In this modular configuration, the base 2 and the floating assembly 5 can be replaced or maintained individually when the structure of the module under test 6 changes or the floating assembly 5 is damaged, without needing to replace or discard the substrate 1 or the entire test fixture. This simplifies operation, improves maintenance efficiency, and reduces costs. It also allows the high-performance test fixture to be used for testing different modules under test 6, expanding its applicability and increasing flexibility.
[0059] This utility model embodiment also provides a testing device, including the aforementioned testing fixture. Specifically, the testing device further includes a hand pressure plate. During the testing process, the hand pressure plate covers the floating component 5 and the module under test 6. The user can manually or with the aid of a pressing structure such as an elbow clamp press the hand pressure plate downwards. The hand pressure plate provides downward pressure on the floating component 5 and the module under test 6, causing the floating component 5 and the module under test 6 to descend as a whole.
[0060] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0061] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the scope of protection of this application. Therefore, the patent protection scope of this application should be determined by the appended claims.
Claims
1. A test fixture, characterized in that, include: substrate(1); The base (2) is disposed on the substrate (1) and is provided with a first clearance hole (21); A first test component (3) is disposed on the substrate (1) and electrically connected to the substrate (1), and the first test component (3) is located on the outside of the base (2); A second test component (4) is disposed on the substrate (1) and electrically connected to the substrate (1), the second test component (4) being located within the first clearance hole (21); and, A floating component (5) is disposed on the side of the base (2) away from the substrate (1) and can rise and fall relative to the base (2) in a preset direction. The floating component (5) is provided with a second clearance hole (521) corresponding to the second test component (4). The floating component (5) is used to carry the module under test (6) so that when the floating component (5) descends, the first terminal (61) of the module under test (6) is electrically connected to the first test component (3), and the second terminal (62) of the module under test (6) is electrically connected to the second test component (4).
2. The test fixture according to claim 1, characterized in that, The first test component (3) includes a mounting post (31) and a spring piece (32). The mounting post (31) is disposed on the substrate (1). One end of the spring piece (32) is connected to the end of the mounting post (31) away from the substrate (1) and is electrically connected to the substrate (1) through the mounting post (31). When the floating component (5) descends, the first terminal (61) of the module under test (6) is pressed against the end of the spring piece (32) away from the mounting post (31).
3. The test fixture according to claim 2, characterized in that, From one end near the mounting post (31) to the other end away from the mounting post (31), the spring piece (32) extends obliquely toward the side away from the substrate (1).
4. The test fixture according to claim 2, characterized in that, The first test component (3) further includes a push structure (33) disposed on the substrate (1). The push structure (33) is located on the side of the spring piece (32) close to the substrate (1) and can push the spring piece (32) toward the side away from the substrate (1).
5. The test fixture according to claim 2, characterized in that, The spring (32) comprises two stacked spring structures; and / or, The first test component (3) further includes a clamping plate (34), which clamps and fixes one end of the spring piece (32) to the end of the mounting post (31) away from the substrate (1); and / or, The first test component (3) further includes a gasket (35) connected to one end of the mounting post (31) near the substrate (1). The outer wall of the mounting post (31) is provided with a boss (311), and the boss (311) and the gasket (35) are respectively fixed to the two sides of the substrate (1).
6. The test fixture according to claim 1, characterized in that, The floating component (5) includes a guide (51) and a carrier (52) for carrying the module under test (6). The guide (51) is disposed on the base (2) and extends along the preset direction. The carrier (52) is disposed on the guide (51) and can slide relative to the guide (51) along the preset direction.
7. The test fixture according to claim 6, characterized in that, The carrier (52) is provided with a carrier groove (522) and a positioning groove (523). The carrier groove (522) is used to accommodate the module under test (6). The bottom wall of the carrier groove (522) is provided with a second clearance hole (521). The positioning groove (523) is connected to the inner wall of the carrier groove (522) and extends along the preset direction.
8. The test fixture according to claim 1, characterized in that, The second test component (4) includes a needle holder (41) and a plurality of signal probes (42). The needle holder (41) is disposed on the substrate (1), and each of the signal probes (42) is disposed at intervals on the needle holder (41) and electrically connected to the substrate (1).
9. The test fixture according to any one of claims 1-8, characterized in that, The first test component (3) and / or the second test component (4) are detachably connected to the substrate (1).
10. A testing apparatus, characterized in that, Includes the test fixture as described in any one of claims 1-9.