Test probe (flat head SCPC028MG)

CN309042738SActive Publication Date: 2024-12-31DONGGUAN CENTALIC ELECTRONICS TESTING PARTS
View PDF 0 Cites 2 Cited by

Patent Information

Application Number
CN202430357066.0
Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Filing Date
2024-06-12
Publication Date
2024-12-31
Estimated Expiration
2039-06-12

Smart Images

  • Figure 000001_ABST
    Figure 000001_ABST
Patent Text Reader

Abstract

1. The name of this design product: test probe (flat head SCPC028MG). 2. Purpose of this design product: This design is used for semiconductor and chip testing. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: three-dimensional picture.
Need to check novelty before this filing date? Find Prior Art

Citation Information

Cited By

  • Measurement probe head

    USD1116879S

  • Telescoping probe with flexible probe tip connection

    USD1127202S