X-ray analysis equipment

JP1789768SActive Publication Date: 2025-01-24SHIMADZU SEISAKUSHO LTD
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Patent Information

Application Number
JP2024017616D
Authority / Receiving Office
JP · JP
Patent Type
Designs
Current Assignee / Owner
Filing Date
2024-08-27
Publication Date
2025-01-24
Estimated Expiration
2049-08-27

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Abstract

The article according to the design of this application is an apparatus for irradiating a sample with X-rays to perform compositional analysis, etc. It has a drawer (sample holder) for holding the sample to be analyzed.
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