Contour triangulation method based on wide spectrum light source

Abstract

A contour triangulation method based on a wide spectrum light source, comprising the following steps: firstly, establishing a laser triangulation model; placing a calibration object into the laser triangulation model, measuring object plane coordinates (x, z) of the calibration object by means of a measurement instrument, obtaining object plane coordinates of a plurality of calibration objects and corresponding image plane coordinates by moving the calibration object for multiple times, and obtaining a linear equation in two unknowns determined by coefficients; and finally, placing a measured object into the laser triangulation model. An imaging detector (5) acquires image plane coordinates (u, v) of a measured object surface (3), and the z coordinate of the measured object surface (3) is calculated by means of the function relational expression; a displacement motion mechanism (6) drives the measured object to move in a direction perpendicular to the optical axis of a focusing light beam to measure the y coordinate; the object surface contours (x, z) in the displacement distance are connected to obtain the whole object surface contour of the measured object, so as to obtain the 3D size of the whole measured object. The present invention has the characteristics of large tolerance angle, high compatibility, and high measurement accuracy, and greatly reduces the size and costs.

Description

A triangulation profile measurement method based on a wide-spectrum light source

[0001] This invention claims two priorities: 1. Priority date 2023-06-16, priority number 202310717630X; 2. Priority date 2023-06-16, priority number 2023107176422. Technical Field

[0002] The present invention belongs to the technical field of light measurement, and in particular relates to a triangulation profile measurement method based on a wide-spectrum light source. Background Art

[0003] Triangulation laser measurement and spectral confocal imaging are the most common 3D optical measurement methods. Triangulation laser measurement is superior in terms of cost and efficiency. However, triangulation laser measurement places high demands on the light source. It uses a collimated laser (narrow spectrum, with a spectral width of less than 10nm), resulting in a very small beam divergence angle. The reflected light energy is very sensitive to angle variations, which leads to poor imaging of specularly reflective objects. In contrast, spectral confocal imaging is superior, using a focused beam rather than a collimated one, which offers better angular compatibility and image quality. Furthermore, the spectral confocal sensor uses the same receiving and transmitting lens, compensating for the dispersion of the transmitting lens. A spectrometer is then used to analyze the reflected light spectrum to calculate the height of the reflecting object, as shown in Figure 1. However, the spectral confocal model utilizes a dispersive confocal coupled with spectral measurement, resulting in a complex optical path. The spectrometer setup also results in a larger size and higher cost. Typical spectral confocal products cost more than three times as much as triangulation lasers, increasing the acquisition cost.

[0004] A wide spectrum generally refers to a spectrum with a spectral width greater than 10 nm. Different from a narrow spectrum less than 10 nm, the conditions for obtaining a wide spectrum are relatively easier. Therefore, based on the above-mentioned defects, the inventors propose a triangulated laser 3D measurement technology based on a wide spectrum. Summary of the Invention

[0005] The purpose of the present invention is to provide a triangulation profile measurement method based on a wide-spectrum light source, which has the characteristics of large tolerance angle, high compatibility, high measurement accuracy, and greatly reduces volume and cost.

[0006] To achieve the above objectives, the present invention provides a method for triangulating profiles based on a wide-spectrum light source, comprising the following steps:

[0007] S1 establishes the model: a triangulated laser measurement model is arranged in the dispersion zone. The model includes a wide-spectrum light source, a dispersion lens, a displacement motion mechanism, a measured object surface, a high-resolution imaging lens, an imaging detector, and a data processing system. The wide-spectrum light source emits a divergent light beam. The dispersion lens focuses the different colors of the divergent light beam onto different heights of the measured object surface to form a focused light beam. The measured object surface reflects the focused light beam at an angle to the high-resolution imaging lens. The displacement motion mechanism is used to place the measured object to drive the measured object to move. The movement direction is perpendicular to the optical axis direction of the focused light beam. The displacement motion mechanism is connected to the data processing system. The high-resolution imaging lens focuses the reflected light beam onto the imaging detector to form an image. The imaging detector and the data processing system are used to convert the optical signal into an electrical signal and generate the data required for 3D measurement.

[0008] S2 uses a calibration object: first, the calibration object is placed in the triangulation laser measurement model instead of the object to be measured and a three-dimensional coordinate system is set. Then, the object plane coordinates (x, z) of the calibration object are measured with the help of a high-precision measuring instrument, where the x coordinate represents the coordinate in the direction of the focused beam and the z coordinate represents the vertical coordinate. Then, the image plane coordinates (u, v) on the imaging detector are obtained, where u is the element corresponding to the x coordinate and v is the element corresponding to the z coordinate.

[0009] By moving the calibration object in the dispersion region, the mapping relationship between the object plane coordinates and the image plane coordinates can be established, and a binary linear function relationship can be generated for calculation:

[0010] x0=au+bv+δ1(1)

[0011] z0=cu+dv+δ2(2)

[0012] Among them, a, b, c, d, δ1, δ2 are all coefficients.

[0013] By moving the calibration object multiple times, multiple sets of object plane coordinates and corresponding image plane coordinates of the calibration object are obtained. Then, these multiple sets of object plane coordinates and image plane coordinates are substituted into formulas (1) and (2) to obtain the values ​​of a, b, c, d, δ1, and δ2, and finally a binary linear function relationship with a determined coefficient is obtained.

[0014] S3 measures the 3D dimensions of the object being measured: The object is placed in a triangulated laser measurement model. The x and z coordinates of each point on the object's surface are calculated using the u and v values ​​and a binary linear function. n points form a line, and n lines form a surface, resulting in the object's surface profile. Simultaneously, a displacement mechanism moves the object perpendicular to the optical axis of the focused beam (i.e., the y direction). The displacement mechanism divides the y direction into multiple motion units. This records the object's surface profile from its appearance to its disappearance within the image plane coordinates. Finally, each recorded motion unit is added together to obtain the object's y coordinate. The surface profile (x, z) within each motion unit is then combined to obtain the entire surface profile of the object. This results in the 3D dimensions of the entire object, including the x, y, and z coordinates of any point on the object, and thus the depth or height of any flaw on the surface.

[0015] Furthermore, step S3 is replaced by: placing the object to be measured in a triangulated laser measurement model, and calculating the x and z coordinates of each point on the surface of the object to be measured using the u and v values ​​and a binary linear function relationship. n points form a line, and n lines form a surface, thereby obtaining the contour of the surface of the object to be measured. At the same time, a displacement motion mechanism drives the object to be measured to move in a direction perpendicular to the optical axis of the focused beam, that is, the movement direction is set to the y direction. A stepper motor is provided in the displacement motion mechanism, and the step length of the stepper motor is first set. Then, the pulse amount of the surface contour of the object to be measured from the time it appears in the image plane coordinate to the time it disappears in the image plane coordinate is recorded. Finally, the pulse amount is converted into a displacement distance to obtain the y coordinate of the object to be measured. Similarly, the surface contour (x, z) within the displacement distance is spliced ​​together to obtain the entire surface contour of the object to be measured, thereby obtaining the 3D size of the entire object to be measured, including the x, y, and z coordinates of any point on the object to be measured, and further obtaining the depth or height of the defect on the surface of the object to be measured.

[0016] Furthermore, the broad spectrum light source is a point spectrum, and the imaging detector is a linear array detector.

[0017] Furthermore, the wide spectrum light source is a multi-point spectrum, and the imaging detector is a multi-line array detector.

[0018] Furthermore, the wide spectrum light source is a line light source, and the imaging detector is a planar array detector.

[0019] Furthermore, the dispersion lens performs dispersion processing on the light emitted by the wide-spectrum light source, and the high-resolution imaging lens is an ordinary imaging lens without dispersion.

[0020] Furthermore, the object surface to be measured is located between the dispersion lens and the high-resolution imaging lens.

[0021] Furthermore, the imaging detector and the data processing system are located at the focal plane of the high-resolution imaging lens.

[0022] Furthermore, in step S2, a mapping relationship between the object plane coordinates and the image plane coordinates can be established by moving the calibration object in the dispersion region, thereby generating a "uv-xz comparison table" or a binary linear function relationship.

[0023] In step S3, the object to be measured is placed in the triangulated laser measurement model, and the image plane coordinates (u, v) of the object to be measured are obtained by the imaging detector. In the "uv-xz comparison table", the object plane coordinates (x, z) of the corresponding point can be found through the u and v values. The x and z coordinates of each point on the surface of the object to be measured are calculated by querying the "uv-xz comparison table" or the binary linear function relationship.

[0024] Furthermore, the triangulated laser measurement model scans and obtains the cross-section, multiple cross-sections or surface profile and multi-layer structure of the target.

[0025] After adopting the above solution, the gain effect of the present invention is:

[0026] Using a broad-spectrum light source, the emitted light waves are decomposed into converging beams of varying wavelengths, with the convergent wavelengths forming at different heights. This convergent wavelength is the primary wavelength reflected by the object, resulting in minimal variation in the beam at different heights. This solves the problem of convergent beams broadening in a defocused state, enabling the measurement model to maintain excellent accuracy across a wide range of heights.

[0027] In the prior art, the receiving lens and transmitting lens of the spectral confocal sensor are the same, and it is necessary to compensate for the dispersion of the transmitting lens, and then use a spectrometer to analyze the spectrum of the reflected light to calculate the 3D size data of the reflecting object. The receiving end of the present invention uses a receiving lens of a triangular laser, which does not need to compensate for dispersion, can directly image, and does not require a spectrometer, thereby simplifying the optical path. In addition, the overall structure of the system is simpler, which can greatly reduce the volume and cost, thereby achieving better measurement accuracy. The dispersion lens described in the present invention can focus light of different wavelengths from the wide-spectrum light source to different heights of the object surface. For the focused light beam, the reflected light has a certain divergence angle, which improves the model's tolerance for the degree of inclination of the object surface, and the measurement accuracy will also be improved. Therefore, the model of the present invention can measure mirror-reflecting objects such as metal and glass, and can also measure objects with curved or stepped surfaces, such as 3D glass, grooves, welds, etc.

[0028] Compared with the prior art, the advantages of the present invention are:

[0029] The wide-spectrum light beam has a certain divergence angle. Even if specular reflection occurs on the surface of the target being measured, the reflected beam still has a certain divergence angle, reducing the angular sensitivity of the measurement model and improving the model's detection capability for specularly reflective targets. For diffusely reflective targets, this wide-spectrum illumination method still has advantages, namely, it improves the measurement model's detection capability for curved and tilted surfaces. Compared to line laser systems, this system has a wider tolerance angle and higher measurement accuracy. Compared to spectral confocal systems, this system can significantly reduce size and cost. Therefore, the wide-spectrum light beam system can overcome the shortcomings of line laser systems and spectral confocal systems while combining the advantages of both, effectively expanding the application scenarios and scope of the measurement system. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] FIG1 is a schematic diagram showing the principle of an existing spectral confocal model;

[0031] FIG2 is a structural schematic diagram of a triangulation laser measurement model based on a wide spectrum light source according to an embodiment of the present invention;

[0032] FIG3 is a second structural diagram of a triangulation laser measurement model based on a wide-spectrum light source according to an embodiment (imaging changes);

[0033] FIG4 is a schematic diagram showing the principle of a triangulation laser measurement model based on a wide spectrum light source according to an embodiment;

[0034] FIG5 is a schematic diagram of the imaging relationship between the image plane coordinates and the object plane coordinates of the present invention.

[0035] Explanation of reference numerals: spectral light source 1, dispersion lens 2, object surface 3, high-resolution imaging lens 4, imaging detector 5, displacement motion mechanism 6. Modes for Carrying Out the Invention

[0036] Hereinafter, embodiments of the present invention will be described more fully. The present invention is susceptible to various embodiments, and modifications and variations may be made therein. However, it should be understood that there is no intention to limit the scope of the present invention to the specific embodiments disclosed herein, but rather that the present invention is to be construed to encompass all modifications, equivalents, and / or alternatives falling within the spirit and scope of the various embodiments of the present invention.

[0037] The present invention relates to a triangulation laser measurement model based on a wide-spectrum light source, as shown in FIG4 , comprising a wide-spectrum light source 1, a dispersion lens 2, a measured surface 3, a high-resolution imaging lens 4, an imaging detector 5, a data processing system, and a displacement motion mechanism 6.

[0038] The wide spectrum light source 1 emits a divergent light beam, and the wide spectrum light source 1 is located before the dispersive lens 2, and the dispersive lens 2 disperses the light of the wide spectrum light source 1;

[0039] The dispersion lens 2 focuses the different colors of the divergent light beam to different heights of the object surface 3 to form a focused light beam. The displacement motion mechanism 6 is used to place the object to be measured to drive the object to be measured to move, and the movement direction is perpendicular to the optical axis direction of the focused light beam; the object surface to be measured is located between the dispersion lens and the high-resolution imaging lens. The object surface 3 reflects the focused light beam to the high-resolution imaging lens 4. The high-resolution imaging lens 4 focuses the reflected light beam to the imaging detector 5 for imaging. The imaging detector and the data processing system are located on the focal plane of the high-resolution imaging lens. As shown in Figures 2 and 3, when there are defects such as depressions on the object surface, the reflected light beam changes, which causes the imaging on the imaging detector 5 to change. The imaging detector 5 converts the optical signal into an electrical signal and transmits it to the data processing system. The data processing system generates the data required for 3D measurement. The displacement motion mechanism 6 is connected to the data processing system. The displacement motion mechanism 6 in this case can be a mechanism that can generate displacement motion, such as a conveyor belt and a conveyor disk.

[0040] The present invention relates to a triangulation profile measurement method based on a wide-spectrum light source. A data processing system can implement 3D measurement through the following measurement method, which specifically includes the following steps:

[0041] S1: Establish the model: Arrange the above-mentioned triangulated laser measurement model in the dispersion area;

[0042] S2 uses a calibration object: first, place the calibration object instead of the object to be measured into the triangulated laser measurement model and set up a three-dimensional coordinate system. Then, the object plane coordinates (x, z) of the calibration object can be measured with the help of a high-precision measuring instrument (which can be an infrared laser rangefinder, interferometer, etc.), where the x coordinate represents the coordinate in the direction of the focused beam and the z coordinate represents the vertical coordinate. Then, the image plane coordinates (u, v) on the imaging detector are obtained, where u is the element corresponding to the x coordinate and v is the element corresponding to the z coordinate.

[0043] By moving the calibration object in the dispersion region, a complete relationship between the object plane coordinates and the image plane coordinates can be established, and a "uv-xz comparison table" or a binary linear function relationship can be generated for calculation:

[0044] x0=au+bv+δ1(1)

[0045] z0=cu+dv+δ2(2)

[0046] Among them, a, b, c, d, δ1, δ2 are all coefficients.

[0047] By moving the calibration object multiple times, multiple sets of object plane coordinates and corresponding image plane coordinates of the calibration object are obtained. Then, these multiple sets of object plane coordinates and image plane coordinates are substituted into formulas (1) and (2) to obtain the values ​​of a, b, c, d, δ1, and δ2. Finally, a binary linear function relationship with a determined coefficient is obtained. The more sets there are, the more accurate the fitting is.

[0048] S3 measures the 3D size data of the object to be measured: the object to be measured is placed in the triangulated laser measurement model, and the x and z coordinates of the object surface to be measured are calculated by querying the "uv-xz comparison table" or using a binary linear function relationship. Specifically, the object plane coordinates (x, z) corresponding to each point on the object to be measured are detected by the u and v values. For example, as shown in Figure 5, the point coordinates (40, 30) of the image plane coordinate system on the left side of the figure have u and v values ​​of 40 and 30 respectively. The x and z values ​​of the object plane coordinate system mapped on the right side are calculated by the binary linear function relationship to be 4000 and 3000 respectively, that is, the point coordinates of the object plane coordinate system are (4000, 3000). Thus, n points form a line, and n lines form a surface, and the contour of the surface of the object to be measured is obtained. At the same time, the displacement motion mechanism drives the object to be measured to move in the vertical direction relative to the focused beam, that is, the movement direction is set to the y direction. The displacement motion mechanism divides the y direction into multiple motion units. The denser the number of motion units, the more accurate the data. In this way, the motion units of the object surface contour of the object to be measured are recorded from the time it appears in the image plane coordinates to the time it disappears in the image plane coordinates. Finally, each recorded motion unit is added to obtain the y coordinate of the object to be measured, and the object surface contour (x, z) in each motion unit is spliced ​​together to obtain the entire object surface contour of the object to be measured, thereby obtaining the 3D size of the entire object to be measured, including the x, y, and z coordinates of any point on the object to be measured, and then obtaining the depth or height of the defect on the surface of the object to be measured. The higher the density of the motion unit, the finer the 3D size and the higher the accuracy of the measured defect.

[0049] Alternatively, a stepper motor is provided in the displacement motion mechanism, the step length of the stepper motor is set first, and then the pulse amount of the object surface contour of the measured object from the time it appears in the image plane coordinate to the time it disappears in the image plane coordinate is recorded, and finally the pulse amount is converted into a displacement distance to obtain the y coordinate of the measured object, and, similarly, the object surface contour (x, z) within the displacement distance is spliced ​​together to obtain the entire object surface contour of the measured object, thereby obtaining the 3D size of the entire measured object, including the x, y, and z coordinates of any point on the measured object, and then obtaining the depth or height of the defect on the surface of the measured object.

[0050] The calibration object may be an object of any shape, such as a calibration block, a calibration plate, etc.

[0051] The broadband light source described in this invention can be a single-point spectrum, resulting in a single-point measurement model; a multi-point spectrum, resulting in a multi-point measurement model; or a line light source, resulting in a line measurement model. Accordingly, the imaging detector can be a linear array, a multi-linear array, or a planar array. Depending on the measurement requirements, scanning can produce a target's cross-section, multiple cross-sections, surface profile, or multi-layer structure.

[0052] The dispersion lens described in the present invention can focus light of different wavelengths from the broadband light source onto different heights above the object surface. For a focused beam, the reflected light has a certain divergence angle, which increases the model's tolerance to surface tilt and improves measurement accuracy. Therefore, the model of the present invention can measure specularly reflective objects such as metal and glass, as well as objects with curved or stepped surfaces, such as 3D glass, grooves, and welds.

[0053] The high-resolution imaging lens described in this invention is a conventional imaging lens with chromatic aberration correction. It measures the height of the focused beam rather than its color. Because it doesn't require color differentiation, it eliminates the need for a subsequent spectral measurement model, significantly saving cost and space. As a result, this model offers higher accuracy than conventional triangulation laser measurement models and a better price-performance ratio than spectral confocal models.

[0054] The imaging detector and data processing system described in this invention consists of two components: an imaging detector and a data processing system. Depending on the light source, the imaging detector can be single-line, multi-line, or area array, thus forming single-point, multi-point, or line measurement models. The data processing system converts the signals detected by the imaging detector into data information and stores it, providing high-speed signal processing and transmission capabilities.

[0055] In the present invention, the light emitted by the wide-spectrum light source is a convergent beam after being dispersed by a dispersive lens. Light of different wavelengths converges at different heights, so each height has a convergent wavelength, and the main wavelength reflected by the object is this convergent wavelength. Since light beams of different wavelengths are all converging, the width of the light beam at different heights does not change much. This solves the problem of the convergent light beam becoming wider in the defocused state, so that the system can maintain good measurement accuracy within a larger height range. At the receiving end, a triangulated laser receiving lens is used instead of a spectral measurement method. The structure of this system is relatively simple, which can greatly reduce the volume and cost. This structure combines the advantages of spectral confocal and triangulated laser, and overcomes the disadvantages of both, which can expand the application scenarios and scope of the measurement system.

[0056] The above is a detailed introduction to the triangulation profile measurement method based on a wide-spectrum light source provided by an embodiment of this patent. This article uses specific examples to illustrate the principles and implementation methods of this patent. The description of the above embodiments is only used to help understand the method of this patent and its core idea; at the same time, for general technical personnel in this field, based on the ideas of this patent, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as a limitation on this patent.

Claims

1. A triangulation profile measurement method based on a wide spectrum light source, characterized in that: The following steps are involved: S1. Model building: Arrange the triangulated laser measurement model in the dispersion zone. The model includes a wide-spectrum light source, a dispersion lens, a displacement motion mechanism, a measured object surface, a high-resolution imaging lens, an imaging detector, and a data processing system. The wide-spectrum light source emits a divergent light beam. The dispersion lens focuses the light of different colors of the divergent light beam to different heights of the measured object surface to form a focused light beam. The measured object surface reflects the focused light beam at an angle to the high-resolution imaging lens. The displacement motion mechanism is used to place the measured object to drive the measured object to move. The moving direction is perpendicular to the optical axis direction of the focused light beam. The displacement motion mechanism is connected to the data processing system. The high-resolution imaging lens focuses the reflected light beam onto the imaging detector for imaging. The imaging detector and the data processing system are used to convert the optical signal into an electrical signal and generate the data required for 3D measurement. S2 uses a calibration object: first, place the calibration object instead of the object to be measured into the triangulated laser measurement model and set up a three-dimensional coordinate system. Then, use a high-precision measuring instrument to measure the object plane coordinates (x, z), where the x coordinate represents the coordinate in the direction of the focused beam, and the z coordinate represents the vertical coordinate. Then, obtain the image plane coordinates (u, v) on the imaging detector, where u is the element corresponding to the x coordinate and v is the element corresponding to the z coordinate. By moving the calibration object in the dispersion region, the mapping relationship between the object plane coordinates and the image plane coordinates can be established, and a binary linear function relationship can be generated for calculation: x0=au+bv+δ1(1) z0=cu+dv+δ2(2) Among them, a, b, c, d, δ1, δ2 are all coefficients. By moving the calibration object multiple times, multiple sets of object plane coordinates and corresponding image plane coordinates of the calibration object are obtained, and then the multiple sets of object plane coordinates and image plane coordinates are substituted into formulas (1) and (2) to obtain the values ​​of a, b, c, d, δ1, and δ2, and finally a binary linear function relationship with determined coefficients is obtained; S3 measures the 3D size data of the object to be measured: the object to be measured is placed in the triangulated laser measurement model, and the x and z coordinates of each point on the surface of the object to be measured are calculated through the u, v values ​​and the binary linear function relationship. n points form a line, and n lines form a surface, and the contour of the surface of the object to be measured is obtained. At the same time, the displacement motion mechanism drives the object to be measured to move in the direction perpendicular to the optical axis of the focused beam, that is, the moving direction is set to the y direction, and the displacement motion mechanism is divided into multiple motion units in the y direction. In this way, the motion unit of the object surface contour of the object to be measured is recorded from the appearance in the image plane coordinate to the disappearance in the image plane coordinate. Finally, each recorded motion unit is added to obtain the y coordinate of the object to be measured, and the object surface contour (x, z) in each motion unit is spliced ​​to obtain the entire object surface contour of the object to be measured, thereby obtaining the 3D size of the entire object to be measured, including the x, y, and z coordinates of any point on the object to be measured, and then the depth or height of the defect on the surface of the object to be measured is obtained.

2. The triangulation profile measurement method based on a wide spectrum light source according to claim 1, characterized in that: Step S3 is replaced by: placing the object to be measured into the triangulated laser measurement model, calculating the x and z coordinates of each point on the surface of the object to be measured by using the u and v values ​​and the binary linear function relationship, n points form a line, n lines form a surface, and the contour of the surface of the object to be measured is obtained. At the same time, the displacement motion mechanism drives the object to be measured to move in a direction perpendicular to the optical axis of the focused beam, that is, the moving direction is set to the y direction, and a stepper motor is set in the displacement motion mechanism. The step length of the stepper motor is first set, and then the pulse amount of the surface contour of the object to be measured from the appearance in the image plane coordinate to the disappearance in the image plane coordinate is recorded, and finally the pulse amount is converted into a displacement distance to obtain the y coordinate of the object to be measured, and, similarly, the surface contour (x, z) within the displacement distance is spliced ​​to obtain the entire surface contour of the object to be measured, thereby obtaining the 3D size of the entire object to be measured, including the x, y, and z coordinates of any point on the object to be measured, and then the depth or height of the defect on the surface of the object to be measured is obtained.

3. The triangulation profile measurement method based on a wide spectrum light source according to claim 1, characterized in that: The wide spectrum light source is a point spectrum, and the imaging detector is a linear array detector.

4. The triangulation profile measurement method based on a wide spectrum light source according to claim 1, characterized in that: The wide spectrum light source is a multi-point spectrum, and the imaging detector is a multi-line array detector.

5. The triangulation profile measurement method based on a wide spectrum light source according to claim 1, characterized in that: The wide spectrum light source is a line light source, and the imaging detector is a planar array detector.

6. The triangulation profile measurement method based on a wide spectrum light source according to claim 1, characterized in that: The dispersion lens performs dispersion processing on the light emitted by the wide spectrum light source, and the high-resolution imaging lens is an ordinary imaging lens without dispersion.

7. The triangulation profile measurement method based on a wide spectrum light source according to claim 1, characterized in that: The object surface to be measured is located between the dispersion lens and the high-resolution imaging lens.

8. The triangulation profile measurement method based on a wide spectrum light source according to claim 1, characterized in that: The imaging detector and data processing system are located at the focal plane of the high-resolution imaging lens.

9. The triangulation profile measurement method based on a wide spectrum light source according to claim 1, characterized in that: In step S2, a mapping relationship between object plane coordinates and image plane coordinates can be established by moving the calibration object in the dispersion region, and a "uv-xz comparison table" or a binary linear function relationship can be generated; In step S3, the object to be measured is placed in the triangulated laser measurement model, and the image plane coordinates (u, v) of the object surface are obtained by the imaging detector. In the "uv-xz comparison table", the object plane coordinates (x, z) of the corresponding point can be found through the u and v values. The x and z coordinates of each point on the surface of the object to be measured are calculated by querying the "uv-xz comparison table" or the binary linear function relationship.

10. The triangulation profile measurement method based on a wide spectrum light source according to claim 1, characterized in that: The triangulated laser measurement model scans and obtains the cross-section line, multiple cross-section lines or surface profile and multi-layer structure of the target object.

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