Apparatus and method for analyzing crystal structure

Abstract

Provided are an apparatus and a method for analyzing a crystal structure. The apparatus for analyzing a crystal structure may comprise: an electron backscatter diffraction (EBSD) data acquisition module for acquiring EBSD data for a solid material; an image generation module for generating the shape of the solid material as a first image including a plurality of pixels; a clustering module for performing clustering on the plurality of pixels by using the EBSD data so that the first image includes a plurality of clusters each of which indicates a crystal orientation; an image processing module for generating a second image by processing the first image so that the first image is displayed in different colors for each cluster; and a rendering module for rendering the second image in a display area.

Description

Crystal structure analysis device and method

[0001] Cross-citation with related applications

[0002] This application claims the benefit of priority to Korean Patent Application No. 10-2023-0075601, filed June 13, 2023, the entire contents of which are incorporated herein by reference.

[0003] The disclosure relates to a device and method for analyzing a crystal structure.

[0004] EBSD (Electron Backscatter Diffraction) is a scanning electron microscope (SEM) that detects electrons (backscattered electrons) reflected when accelerated electrons are injected into a sample, allowing analysis of the material's orientation. In other words, EBSD can analyze the crystal structure of the examined area using the diffraction patterns measured from each crystal. For example, a computer system can control the position of the electron beam, record the patterns generated in the area of ​​the specimen where the electron beam resides through a camera, and automatically analyze the recorded patterns to derive crystallographic information for that area of ​​the specimen.

[0005] The task to be solved is to provide a crystal structure analysis device and method that can effectively analyze the crystal structure of a solid material from EBSD data for the solid material.

[0006] According to one embodiment, a crystal structure analysis device may include an EBSD (Electron Backscatter Diffraction) data acquisition module for acquiring EBSD data for a solid material; an image generation module for generating a first image including a plurality of pixels representing the shape of the solid material; a clustering module for performing clustering on the plurality of pixels using the EBSD data so that the first image includes a plurality of clusters each representing a crystal direction; an image processing module for generating a second image by processing the first image so that the first image is displayed in different colors for each cluster; and a rendering module for rendering the second image on a display area.

[0007] In some embodiments, the EBSD data includes a plurality of angular data collected for each crystal unit of a predetermined size forming the solid material, and the clustering module can perform clustering on the plurality of pixels using the plurality of angular data.

[0008] In some embodiments, the first image includes a first pixel and a second pixel, the plurality of angular data includes first angular data corresponding to the first pixel and second angular data corresponding to the second pixel, and the clustering module can group the first pixel and the second pixel into the same first pixel group when a difference value between the first angular data and the second angular data is less than or equal to a predetermined first threshold value.

[0009] In some embodiments, the clustering module may determine the first pixel group as a valid cluster if the number of pixels grouped into the first pixel group is greater than or equal to a second threshold value, and may not determine the first pixel group as a valid cluster if the number of pixels grouped into the first pixel group is less than the second threshold value.

[0010] In some embodiments, the first pixel group includes a third pixel and a fourth pixel, and the clustering module can group the third pixel and the fourth pixel into the same second pixel group when a distance value between a position of the third pixel and a position of the fourth pixel is less than or equal to a predetermined third threshold value.

[0011] In some embodiments, the clustering module may determine the second pixel group as a valid cluster if the number of pixels grouped into the second pixel group is greater than or equal to a fourth threshold value, and may not determine the second pixel group as a valid cluster if the number of pixels grouped into the second pixel group is less than the fourth threshold value.

[0012] In some embodiments, the clustering module may further perform clustering on pixels that are not determined to be valid clusters.

[0013] In some embodiments, the clustering module may calculate the area of ​​the plurality of clusters and assign numbers in ascending or descending order to each of the plurality of clusters based on the size of the area.

[0014] In some embodiments, the rendering module may render the number assigned to each of the plurality of clusters onto the second image.

[0015] In some embodiments, the color may include at least one of an RGB color, an HSL color, an HSV color, a CMYK color, and a grayscale color.

[0016] In some embodiments, the display area includes a first display area and a second display area, and the rendering module can render the first image in the first display area and render the second image in the second display area.

[0017] In some embodiments, the crystal structure analysis device may further include an area removal module for removing an area that does not correspond to an analysis target of the crystal structure, with respect to the first image.

[0018] In some embodiments, the region removal module sets a region to be removed or kept from the first image based on user input for the first image, wherein the user input may include mouse input or touch input.

[0019] In some embodiments, the region removal module may analyze the first image using a predetermined algorithm and set a region to be removed or kept from the first image.

[0020] In one embodiment, a crystal structure analysis device may include the steps of: obtaining EBSD data for a solid material, the EBSD data including a plurality of angle data collected for each crystal unit of a predetermined size forming the solid material; generating a shape of the solid material as a first image including a plurality of pixels; performing clustering on the plurality of pixels using the EBSD data such that the first image includes a plurality of clusters each representing a crystal direction; generating a second image by processing the first image such that the first image is displayed in a different color for each cluster; and rendering the second image on a display area.

[0021] In some embodiments, the first image includes a first pixel and a second pixel, the plurality of angular data includes first angular data corresponding to the first pixel and second angular data corresponding to the second pixel, and the performing of the clustering may include a step of grouping the first pixel and the second pixel into the same first pixel group when a difference value between the first angular data and the second angular data is less than or equal to a predetermined first threshold value.

[0022] In some embodiments, the step of performing the clustering may further include the step of determining the first pixel group as a valid cluster if the number of pixels grouped into the first pixel group is greater than or equal to a second threshold value, and not determining the first pixel group as a valid cluster if the number of pixels grouped into the first pixel group is less than the second threshold value.

[0023] In some embodiments, the first pixel group includes a third pixel and a fourth pixel, and the step of performing the clustering may further include the step of grouping the third pixel and the fourth pixel into the same second pixel group when a distance value between a position of the third pixel and a position of the fourth pixel is less than or equal to a predetermined third threshold value.

[0024] In some embodiments, the step of performing the clustering may further include the step of determining the second pixel group as a valid cluster if the number of pixels grouped into the second pixel group is greater than or equal to a fourth threshold value, and not determining the second pixel group as a valid cluster if the number of pixels grouped into the second pixel group is less than the fourth threshold value.

[0025] In one embodiment, a computer-readable medium may record a program for causing a computer including a processor executing a program or command stored in a memory or storage device to perform the steps of: obtaining EBSD data for a solid material; generating a first image including a plurality of pixels representing a shape of the solid material; performing clustering on the plurality of pixels using the EBSD data such that the first image includes a plurality of clusters each representing a crystal direction; generating a second image by processing the first image such that the first image is displayed in a different color for each cluster; and rendering the second image on a display area.

[0026] According to embodiments, by extracting and visualizing information on how crystal orientations are distributed across all particles from data collected from an EBSD system, the crystal structure of a solid material can be effectively analyzed from EBSD data on the solid material. Furthermore, when a user adjusts parameter values ​​while the crystal structure is visually represented, the results are immediately reflected, allowing the connection pattern of crystal orientations to be analyzed quickly from EBSD data provided as two-dimensional data in a general computing environment.

[0027] FIG. 1 is a block diagram illustrating a crystal structure analysis device according to one embodiment.

[0028] FIGS. 2 and 3a to 3c are drawings for explaining the operation of a crystal structure analysis device according to one embodiment.

[0029] FIG. 4 is a drawing for explaining an implementation example of a crystal structure analysis device according to one embodiment.

[0030] Figure 5 is a flowchart illustrating a crystal structure analysis method according to one embodiment.

[0031] FIG. 6 is a drawing for explaining an implementation example of a crystal structure analysis device according to one embodiment.

[0032] FIG. 7 is a drawing for explaining an implementation example of a crystal structure analysis device according to one embodiment.

[0033] FIG. 8 is a block diagram illustrating a crystal structure analysis device according to one embodiment.

[0034] FIGS. 9 and 10 are drawings for explaining implementation examples of a crystal structure analysis device according to one embodiment.

[0035] FIG. 11 is a diagram illustrating a computing device according to one embodiment.

[0036] Below, with reference to the attached drawings, embodiments of the present invention are described in detail so that those skilled in the art can easily implement the present invention. However, the present invention may be implemented in various different forms and is not limited to the embodiments described herein. In addition, in the drawings, parts irrelevant to the description are omitted for clarity of description, and similar parts are designated with similar reference numerals throughout the specification.

[0037] Throughout the specification and claims, whenever a part is referred to as "comprising" a component, this does not exclude other components, but rather includes other components, unless otherwise stated. Terms including ordinal numbers, such as "first," "second," etc., may be used to describe various components, but these components are not limited by these terms. These terms are used solely to distinguish one component from another.

[0038] Terms such as “part,” “unit,” and “module” described in the specification may mean a unit capable of processing at least one function or operation described in the specification, which may be implemented by hardware or a circuit, software, or a combination of hardware or a circuit and software.

[0039] FIG. 1 is a block diagram illustrating a crystal structure analysis device according to one embodiment.

[0040] Referring to FIG. 1, a crystal structure analysis device (10) according to one embodiment can analyze the crystal structure of a solid material. The crystal structure analysis device (10) can extract and visualize information on how crystal directions are distributed across all particles from data collected from an EBSD system. In some embodiments, the crystal structure analysis device (10) may be a server that services a web application, which is software that runs on a web browser. Accordingly, the crystal structure analysis device (10) can enable users to easily analyze the crystal structure of a solid material using only a web browser without having to install separate software on their computers. However, the scope of the present invention is not limited thereto, and the functions provided by the crystal structure analysis device (10) may be implemented as various arbitrary forms of software.

[0041] The crystal structure analysis device (10) may include an EBSD data acquisition module (110), an image generation module (120), a clustering module (130), an image processing module (140), and a rendering module (150).

[0042] The EBSD data acquisition module (110) can acquire EBSD data for a solid material. The EBSD data can include spatially linked crystallographic orientation and phase information, and the EBSD data acquisition module (10) can acquire data in various formats collected from an external EBSD system. For example, the EBSD data can be a file generated to follow the CSV (Comma Separated Values) format as two-dimensional data distinguished by a delimiter such as a comma. As another example, the EBSD data can be in the form of a compressed file composed of a collection of multiple CSV files. As yet another example, the EBSD data can be data that has undergone data cleaning in specific software (e.g., AZtecCrystal) that processes data collected using EBSD.

[0043] The image generation module (120) can generate a first image of the shape of a solid material that is the subject of crystal structure analysis. Here, the first image may be in the form of a pixel image including a plurality of pixels. For example, the image generation module (120) can generate the first image as a two-dimensional image that can be displayed on a display device electrically connected to the crystal structure analysis device (10).

[0044] The clustering module (130) may perform clustering on a plurality of pixels included in the first image using EBSD data acquired by the EBSD data acquisition module (110). In some embodiments, the clustering module (130) may use the EBSD data to cause the first image to include a plurality of clusters, wherein each cluster may be formed according to a crystal direction.

[0045] For example, EBSD data may include a plurality of angle data. The plurality of angle data may be a plurality of angle data collected for each crystal unit of a predetermined size forming a solid material to be analyzed. Here, the crystal unit is not determined to have a specific size, but may be a unit having a predetermined size that can correspond to at least one included in the first image, taking into account the resolution according to the environment that the crystal structure analysis device according to the embodiments can display. The clustering module (130) may perform clustering on a plurality of pixels expressing the first image using the plurality of angle data.

[0046] The image processing module (140) can generate a second image representing the result of clustering performed by the clustering module (130). That is, the image processing module (140) can process the first image generated by the image generation module (120) so that the first image is displayed in different colors for each cluster and output the processed first image as a second image. In some embodiments, the color may include at least one of RGB color, HSL color, HSV color, CMYK color, and grayscale color. RGB color is a color expressed using red, green, and blue, and HSL (or HSB) color may be a color expressed using hue, saturation, and lightness (or brightness). HSV color is a color expressed using Hue, Saturation, and Value, and CMYK color can be a color expressed using Cyan, Magenta, Yellow, and Black.

[0047] The rendering module (150) can render the second image generated by the image processing module (140) onto a display area provided on the display device. Accordingly, by displaying each cluster in different colors, the user can visualize the crystal orientation of all particles at a glance, effectively analyzing the crystal structure from EBSD data collected in a non-intuitive manner.

[0048] In some embodiments, the clustering module (130) may perform clustering based on a first parameter value that is adjustable by a user. Here, the first parameter value may represent a threshold value indicating an angular difference that can be determined as the same crystal direction, and may be identified by a parameter name such as "angle_threshold", for example. The clustering module (130) may group the first pixel and the second pixel into the same first pixel group when the difference value between the first angle data and the second angle data is less than or equal to a first threshold value that is predetermined. Here, the predetermined first threshold value may correspond to a first parameter value that is set to be adjustable by a user, the first pixel and the second pixel are pixels constituting the first image, the first angle data may be angle data corresponding to a first pixel among a plurality of angle data of EBSD data, and the second angle data may be angle data corresponding to a second pixel among a plurality of angle data.

[0049] Next, the clustering module (130) can determine whether the first pixel group is a valid cluster based on a second parameter value that is adjustable by the user. Here, the second parameter value can represent a threshold value that means the number of pixels having the same decision direction required to determine whether a cluster is formed, and can be identified by a parameter name such as "angle_min_samples", for example. The clustering module (130) can determine the first pixel group as a valid cluster if the number of pixels grouped into the first pixel group is greater than or equal to the second threshold value, and can, on the other hand, not determine the first pixel group as a valid cluster if the number of pixels grouped into the first pixel group is less than the second threshold value. Here, the predetermined second threshold value can correspond to a second parameter value that is set to be adjustable by the user.

[0050] Accordingly, the clustering module (130) can determine as a valid cluster only when the number of pixels having a difference in angular data that does not exceed a range determined based on the first threshold value is greater than or equal to a number determined based on the second threshold value. In other words, pixels having angular data exceeding a range determined based on the first threshold value cannot belong to a valid cluster, and even if there are pixels having a difference in angular data that does not exceed a range determined based on the first threshold value, if the number does not exceed a number determined based on the second threshold value, they also cannot belong to a valid cluster. For pixels that do not belong to a valid cluster, additional clustering may be performed, or sometimes they may be treated as noise.

[0051] Meanwhile, the clustering module (130) can perform clustering in the first stage as described above using the first parameter value and the second parameter value, and then perform clustering in the second stage using the third parameter value and the fourth parameter value described below.

[0052] Specifically, the clustering module (130) may perform clustering based on a third parameter value that is set to be adjustable by the user. Here, the third parameter value may represent a threshold value indicating a distance between pixels that can be determined as neighboring positions, and may be identified by a parameter name such as "pos_eps", for example. As a result of performing the first clustering, if the first pixel group includes the third pixel and the fourth pixel, the clustering module (130) may group the third pixel and the fourth pixel into the same second pixel group if the distance value between the positions of the third pixel and the fourth pixel is less than or equal to the third threshold value set in advance. Here, the third threshold value set in advance may correspond to a third parameter value that is set in an adjustable manner by the user.

[0053] Next, the clustering module (130) can determine whether the second pixel group is a valid cluster based on a fourth parameter value that is adjustable by the user. Here, the fourth parameter value can represent a threshold value indicating the number of pixels corresponding to neighbors required to determine whether a cluster is formed, and can be identified by a parameter name of, for example, “pos_min_samples.” The clustering module (30) can determine the second pixel group as a valid cluster if the number of pixels grouped into the second pixel group is greater than or equal to the fourth threshold value, and can, on the other hand, not determine the second pixel group as a valid cluster if the number of pixels grouped into the second pixel group is less than the fourth threshold value. Here, the predetermined fourth threshold value can correspond to a parameter value that is set to be adjustable by the user.

[0054] Accordingly, the clustering module (130) can determine as a valid cluster only when the number of pixels having a distance between pixels that does not exceed the distance determined based on the third threshold value is greater than or equal to the number determined based on the fourth threshold value. In other words, pixels having a distance between pixels that exceeds the distance determined based on the third threshold value cannot belong to a valid cluster, and even if pixels have a distance between pixels that does not exceed the distance determined based on the third threshold value, they cannot belong to a valid cluster if the number does not exceed the number determined based on the fourth threshold value. For pixels that do not belong to a valid cluster, additional clustering may be performed, or sometimes they may be treated as noise.

[0055] In this way, the clustering module (130) can easily change the level of clustering according to the values ​​of the first to fourth parameters that can be specified by the user. Accordingly, not only is it easy to visually identify the crystal orientation extracted from the EBSD data, but also, by changing the values ​​of the first to fourth parameters, it is possible to easily search for a desired crystal orientation pattern from the clustering results and the crystal orientations corresponding to each cluster, which are displayed differently. For example, a certain crystal orientation connection pattern that can be formed between adjacent clusters can be used as a meaningful analysis result, but analyzing such a crystal orientation connection pattern from EBSD data provided as two-dimensional data requires a lot of computing resources and a considerable amount of work time. In contrast, according to the present embodiment, when the crystal orientation is visually expressed for each cluster, the result is immediately reflected visually by changing only the values ​​of the first to fourth parameters, so that the connection pattern of the crystal orientation can be searched for quickly in a general computing environment.

[0056] FIGS. 2 and 3a to 3c are drawings for explaining the operation of a crystal structure analysis device according to one embodiment.

[0057] Referring to FIG. 2, the clustering module (130) can group pixels having an angular difference that can be determined to be the same crystal direction in the first image (IMG) into the same first pixel group using a first threshold value corresponding to a first parameter value that is adjustable by the user. Then, the clustering module (130) can determine whether the first pixel group is a valid cluster using a second threshold value corresponding to a second parameter value that is adjustable by the user. Accordingly, the clustering module (130) can determine as a valid cluster (CLS1, CLS2, CLS3) only when the number of pixels having an angular data difference that does not exceed a range determined based on the first threshold value is greater than or equal to a number determined based on the second threshold value.

[0058] That is, a cluster (CLS1) is a group of pixels having a difference in angle data that does not exceed a range determined based on a first threshold value, and a number or more determined based on a second threshold value are gathered together; a cluster (CLS2) is a group of pixels having a difference in angle data that does not exceed a range determined based on a first threshold value, and a number or more determined based on a second threshold value are gathered together, and the distribution of the angle data does not overlap with the distribution of the angle data of the cluster (CLS1); and a cluster (CL3) is a group of pixels having a difference in angle data that does not exceed a range determined based on a first threshold value, and a number or more determined based on a second threshold value are gathered together, and the distribution of the angle data does not overlap with the distribution of the angle data of the clusters (CLS1) and (CLS2).

[0059] Referring to FIG. 3A, the clustering module (130) treats the cluster (CLS1), which is the result of the first clustering in FIG. 2, as a valid first pixel group using a third threshold value corresponding to a third parameter value that is adjustable by the user, and groups it into a second pixel group having an inter-pixel distance that can be determined as a neighboring position. Next, the clustering module (130) can determine whether the second pixel group is a valid cluster using a fourth threshold value corresponding to a fourth parameter value that is adjustable by the user. Accordingly, the clustering module (130) can determine as a valid cluster (CLS11, CLS12, CLS13, CLS14, CLS15) only when the number of pixels having an inter-pixel distance that does not exceed the distance determined based on the third threshold value is greater than or equal to the number determined based on the fourth threshold value.

[0060] Similarly, referring to FIG. 3b, the clustering module (130) can determine clusters (CLS21, CLS22) from cluster (CLS2), which is the result of primary clustering in FIG. 2, in a similar manner to the case of FIG. 3a, and referring to FIG. 3c, the clustering module (130) can determine clusters (CLS31, CLS32, CLS33) from cluster (CLS3), which is the result of primary clustering in FIG. 2, in a similar manner to the case of FIG. 3a.

[0061] FIG. 4 is a drawing for explaining an implementation example of a crystal structure analysis device according to one embodiment.

[0062] Referring to FIG. 4, the left side is an image (IMG1) generated by the image generation module (120) of the shape of a solid material to be analyzed for crystal structure, and the right side is an image (IMG2) in which the values ​​of angle data are expressed in color based on angle data obtainable from EBSD data acquired by the EBSD data acquisition module (110). Here, the color may be expressed using hue, saturation, and value based on the Euler angle of the crystal. After clustering is performed by the clustering module (130), each cluster may be expressed in a different color, and the color that distinguishes one cluster may be determined by averaging the hue, saturation, and value of all angle data belonging to one cluster, for example. Accordingly, since visualization is possible so that the user can grasp the crystal direction for all particles at a glance, the crystal structure can be effectively analyzed from EBSD data collected in a non-intuitive form. For an example of how clusters are displayed in different colors after clustering, refer to the image (IMG3) in Fig. 6.

[0063] Figure 5 is a flowchart illustrating a crystal structure analysis method according to one embodiment.

[0064] Referring to FIG. 5, a crystal structure analysis method according to an embodiment may include a step (S501) of obtaining EBSD data for a solid material, the step including a plurality of angle data collected for each crystal unit of a predetermined size forming the solid material, a step (S502) of generating a shape of the solid material as a first image including a plurality of pixels, a step (S503) of performing clustering on the plurality of pixels using the EBSD data so that the first image includes a plurality of clusters each representing a crystal direction, a step (S504) of processing the first image so that the first image is displayed in a different color for each cluster to generate a second image, and a step (S505) of rendering the second image on a display area.

[0065] For details on the above method, reference may be made to the description given above with respect to FIGS. 1 to 4 and the description given below with respect to FIGS. 6 to 10, so redundant descriptions are omitted here.

[0066] FIG. 6 is a drawing for explaining an implementation example of a crystal structure analysis device according to one embodiment.

[0067] Referring to FIG. 6, in some embodiments, the clustering module (130) may calculate an area for each of a plurality of clusters and, based on the size of the area, assign numbers to each of the plurality of clusters in ascending or descending order. The rendering module (150) may render the image (IMG3) so that each of the plurality of clusters is displayed in a different color, and may also render the assigned numbers to each of the plurality of clusters on the image (IMG3). The numbers assigned to each cluster may be displayed overlapping the center of the corresponding cluster, thereby making it easy to visually identify the tendency for crystal orientation extracted from the EBSD data.

[0068] FIG. 7 is a drawing for explaining an implementation example of a crystal structure analysis device according to one embodiment.

[0069] Referring to FIG. 7, the rendering module (150) can render the second image generated by the image processing module (140) to a display area (30) provided on the display device. Here, the display area (30) includes a first display area (31) and a second display area (32), and the rendering module (150) can render the first image to the first display area (31) and the second image to the second display area (32). Accordingly, convenience can be provided to the user so that the entire particles before and after clustering can be visually compared.

[0070] Meanwhile, a parameter value adjustment area (33) may be arranged in the display area (30). A parameter value input control (34) for setting an analysis result unit may be displayed in the parameter value adjustment area (33). In addition, the parameter value adjustment area (33) may include parameter value input controls (35 to 38) for allowing a user to adjust the level of clustering performed by the clustering module (130).

[0071] Here, the parameter value input control (35) may be a control that can input the value of a first parameter that can be identified by the parameter name "angle_threshold", the parameter value input control (36) may be a control that can input the value of a third parameter that can be identified by the parameter name "pos_eps", the parameter value input control (37) may be a control that can input the value of a second parameter that can be identified by the parameter name "angle_min_samples", and the parameter value input control (38) may be a control that can input the value of a fourth parameter that can be identified by the parameter name "pos_min_samples". For more detailed information on the first to fourth parameters, reference may be made to the description given above with respect to FIG. 1.

[0072] By providing such controls to the user, the user can adjust the values ​​of the first to fourth parameters in a timely manner, thereby easily changing the level of clustering of the clustering module (130) at a desired time. Accordingly, not only is it easy to visually identify the crystal orientation extracted from EBSD data, but also, by changing the values ​​of the first to fourth parameters, the clustering results and the crystal orientations corresponding to each cluster can be displayed differently, thereby easily exploring the desired crystal orientation pattern.

[0073] FIG. 8 is a block diagram illustrating a crystal structure analysis device according to one embodiment.

[0074] Referring to FIG. 8, a crystal structure analysis device (10) according to one embodiment may include an EBSD data acquisition module (110), an image generation module (120), a clustering module (130), an image processing module (140), a rendering module (150), and an area removal module (160). With respect to the EBSD data acquisition module (110), the image generation module (120), the clustering module (130), the image processing module (140), and the rendering module (150), reference may be made to the descriptions given above with respect to FIGS. 1 to 7.

[0075] The region removal module (160) can remove regions that do not correspond to the analysis target of the crystal structure for the first image, thereby preventing unnecessary waste of computing resources due to clustering being performed on unwanted regions during analysis of the crystal structure.

[0076] In some embodiments, the region removal module (160) may set a region to be removed or kept from the first image based on user input for the first image. Here, the user input may include mouse input or touch input.

[0077] In some embodiments, the region removal module (160) may analyze the first image using a predetermined algorithm to be run on the crystal structure analysis device (10) and set regions to be removed or kept from the first image.

[0078] FIGS. 9 and 10 are drawings for explaining implementation examples of a crystal structure analysis device according to one embodiment.

[0079] Referring to FIG. 9, the left side is an image (IMG1) in which the image generation module (120) generates a shape of a solid material to be analyzed for crystal structure, and the right side is an image (IMG3) in which an area in which crystal structure analysis is not performed is removed from the image (IMG1). In some embodiments, the region removal module (160) may distinguish between an area to be analyzed and an area that is not by receiving a user input in the form of L1, and set an area to be removed or maintained from the first image. Alternatively, the region removal module (160) may analyze the first image using a predetermined algorithm that is executed so that the result has the form of L2, and set an area to be removed or maintained from the first image. In some embodiments, the two methods may be combined, such as first attempting to remove an area based on user input such as mouse input or touch input, and then, if it fails a predetermined number of times, second analyzing the first image using a predetermined algorithm, and set an area to be removed or maintained from the first image.

[0080] Referring to FIG. 10, the left side is an image (IMG4) corresponding to a portion of the image (IMG1), and the right side is an image (IMG5) obtained by removing an area in which a crystal structure is not analyzed from the image (IMG4). As with FIG. 9, in some embodiments, the region removal module (160) may receive a user input in the form of L1 to distinguish between an area to be analyzed and an area that is not, and set an area to be removed or kept from the first image. Alternatively, the region removal module (160) may analyze the first image using a predetermined algorithm that is executed so that the result has the form of L2, and set an area to be removed or kept from the first image. In some embodiments, the two methods may be combined, such as first attempting to remove an area based on user input such as mouse input or touch input, and then, if it fails a predetermined number of times, second analyzing the first image using a predetermined algorithm, and setting an area to be removed or kept from the first image.

[0081] FIG. 11 is a diagram illustrating a computing device according to one embodiment.

[0082] Referring to FIG. 11, the crystal structure analysis device and method according to the embodiments can be implemented using a computing device (50).

[0083] The computing device (50) may include at least one of a processor (510), a memory (530), a user interface input device (540), a user interface output device (550), and a storage device (560) that communicate via a bus (520). The computing device (50) may also include a network interface (570) electrically connected to a network (40). The network interface (570) may transmit or receive signals to or from other entities via the network (40).

[0084] The processor (510) may be implemented in various types such as an MCU (Micro Controller Unit), an AP (Application Processor), a CPU (Central Processing Unit), a GPU (Graphics Processing Unit), an NPU (Neural Processing Unit), etc., and may be any semiconductor device that executes instructions stored in a memory (530) or a storage device (560). The processor (510) may be configured to implement the functions and methods described above with respect to FIGS. 1 to 10.

[0085] The memory (530) and storage device (560) may include various types of volatile or non-volatile storage media. For example, the memory may include read-only memory (ROM) (531) and random access memory (RAM) (532). In the present embodiment, the memory (530) may be located inside or outside the processor (510), and the memory (530) may be connected to the processor (510) through various known means.

[0086] In some embodiments, at least some components or functions of the crystal structure analysis devices and methods according to the embodiments may be implemented as a program or software running on a computing device (50), and the program or software may be stored on a computer-readable medium.

[0087] In some embodiments, at least some components or functions of the crystal structure analysis devices and methods according to the embodiments may be implemented using hardware or circuitry of the computing device (50), or may be implemented as separate hardware or circuitry that can be electrically connected to the computing device (50).

[0088] According to the embodiments described thus far, by extracting and visualizing information on how crystal orientations are distributed across all particles from data collected from an EBSD system, the crystal structure of a solid material can be effectively analyzed from EBSD data. Furthermore, when the user adjusts parameter values ​​while the crystal structure is visually represented, the results are immediately reflected, allowing the connection pattern of crystal orientations to be analyzed quickly from EBSD data provided as two-dimensional data in a general computing environment.

[0089] Although the embodiments of the present invention have been described in detail above, the scope of the present invention is not limited thereto, and various modifications and improvements made by a person of ordinary skill in the art to which the present invention pertains using the basic concept of the present invention defined in the following claims also fall within the scope of the present invention.

Claims

1. EBSD data acquisition module that acquires EBSD (Electron Backscatter Diffraction) data for solid materials; An image generation module for generating a shape of the solid material as a first image including a plurality of pixels; A clustering module that performs clustering on the plurality of pixels using the EBSD data so that the first image includes a plurality of clusters each representing a crystal direction; An image processing module that processes the first image to generate a second image so that the first image is displayed in different colors for each cluster; and A rendering module that renders the second image to a display area. Crystal structure analysis device.

2. In paragraph 1, The above EBSD data includes a plurality of angle data collected for each crystal unit of a predetermined size forming the solid material, The above clustering module, A crystal structure analysis device that performs clustering on the plurality of pixels using the plurality of angle data.

3. In paragraph 2, The first image includes a first pixel and a second pixel, The above plurality of angle data includes first angle data corresponding to the first pixel and second angle data corresponding to the second pixel, The above clustering module, A crystal structure analysis device that groups the first pixel and the second pixel into the same first pixel group when the difference value between the first angle data and the second angle data is less than or equal to a predetermined first threshold value.

4. In paragraph 3, The above clustering module, A crystal structure analysis device that determines the first pixel group as a valid cluster when the number of pixels grouped into the first pixel group is greater than or equal to a second threshold value, and does not determine the first pixel group as a valid cluster when the number of pixels grouped into the first pixel group is less than the second threshold value.

5. In paragraph 4, The first pixel group includes a third pixel and a fourth pixel, The above clustering module, A crystal structure analysis device that groups the third pixel and the fourth pixel into the same second pixel group when the distance value between the position of the third pixel and the position of the fourth pixel is less than or equal to a predetermined third threshold value.

6. In paragraph 5, The above clustering module, A crystal structure analysis device, wherein if the number of pixels grouped into the second pixel group is greater than or equal to a fourth threshold value, the second pixel group is determined to be a valid cluster, and if the number of pixels grouped into the second pixel group is less than the fourth threshold value, the second pixel group is not determined to be a valid cluster.

7. In paragraph 5, The above clustering module, A crystal structure analysis device that performs additional clustering on pixels that are not determined as valid clusters.

8. In paragraph 1, The above clustering module, A crystal structure analysis device that calculates the area of ​​the plurality of clusters and assigns numbers in ascending or descending order to each of the plurality of clusters according to the size of the area.

9. In paragraph 8, The above rendering module, A crystal structure analysis device that renders the number assigned to each of the plurality of clusters on the second image.

10. In paragraph 1, A crystal structure analysis device, wherein the above color includes at least one of RGB color, HSL color, HSV color, CMYK color and grayscale color.

11. In paragraph 1, The above display area includes a first display area and a second display area, The above rendering module, Rendering the first image in the first display area, A crystal structure analysis device that renders the second image in the second display area.

12. In paragraph 1, A crystal structure analysis device further comprising an area removal module for removing an area that does not correspond to the analysis target of the crystal structure, for the first image.

13. In paragraph 12, The above area removal module, Setting an area to be removed or kept from the first image based on user input for the first image; The above user input includes a mouse input or a touch input, and is a crystal structure analysis device.

14. In paragraph 12, The above area removal module, A crystal structure analysis device that analyzes the first image using a predetermined algorithm and sets an area to be removed or maintained from the first image.

15. A step of obtaining EBSD data for a solid material, the step including a plurality of angle data collected for each crystal unit of a predetermined size forming the solid material; A step of generating a shape of the solid material as a first image including a plurality of pixels; A step of performing clustering on the plurality of pixels using the EBSD data so that the first image includes a plurality of clusters each representing a crystal direction; A step of processing the first image to generate a second image so that the first image is displayed in different colors for each cluster; and comprising a step of rendering the second image to a display area; Methods for analyzing crystal structures.

16. In paragraph 15, The first image includes a first pixel and a second pixel, The above plurality of angle data includes first angle data corresponding to the first pixel and second angle data corresponding to the second pixel, The steps for performing the above clustering are: A crystal structure analysis method, comprising a step of grouping the first pixel and the second pixel into the same first pixel group when the difference value between the first angle data and the second angle data is less than or equal to a predetermined first threshold value.

17. In paragraph 16, The steps for performing the above clustering are: A crystal structure analysis method further comprising the step of determining the first pixel group as a valid cluster if the number of pixels grouped into the first pixel group is greater than or equal to a second threshold value, and not determining the first pixel group as a valid cluster if the number of pixels grouped into the first pixel group is less than the second threshold value.

18. In paragraph 17, The first pixel group includes a third pixel and a fourth pixel, The steps for performing the above clustering are: A crystal structure analysis method further comprising a step of grouping the third pixel and the fourth pixel into the same second pixel group when the distance value between the position of the third pixel and the position of the fourth pixel is less than or equal to a predetermined third threshold value.

19. In paragraph 18, The steps for performing the above clustering are: A crystal structure analysis method further comprising the step of determining the second pixel group as a valid cluster if the number of pixels grouped into the second pixel group is greater than or equal to a fourth threshold value, and not determining the second pixel group as a valid cluster if the number of pixels grouped into the second pixel group is less than the fourth threshold value.

20. In a computer including a processor that executes programs or instructions stored in memory or storage devices, Step of obtaining EBSD data for solid materials; A step of generating a shape of the solid material as a first image including a plurality of pixels; A step of performing clustering on the plurality of pixels using the EBSD data so that the first image includes a plurality of clusters each representing a crystal direction; A step of processing the first image to generate a second image so that the first image is displayed in different colors for each cluster; and A program is written to execute the step of rendering the above second image to the display area. A computer-readable medium.

Images