Recalibration of temperature dependent calibration factors using temperature slopes

Abstract

The present invention relates to a method for calibrating a spectrometer device (128) for obtaining an item of calibration information on the spectrometer device (128), the method comprising the following steps: a) obtaining at least one item of temperature variation information on at least one component of the spectrometer device (128) by monitoring the temperature of the at least one component of the spectrometer device (128) by using at least one temperature sensor (132) of the spectrometer device (128); b) generating at least one item of measurement information on the spectrometer during a change of the temperature of the at least one component of the spectrometer device (128) by using a measuring unit (134) of the spectrometer device (128), wherein the change of the temperature is determined by evaluating the item of temperature variation information by using an evaluation unit (136) of the spectrometer device (128), wherein the at least one item of measurement information is obtained in a temperature resolved manner, wherein the at least one item of measurement information is a measurement value generated in a measurement process; C) obtaining at least one item of calibration information on the spectrometer device (128) by evaluating the item of measurement information on the spectrometer by further using the evaluation unit (136) of the spectrometer device (128), wherein, for obtaining the at least one item of calibration information on the spectrometer device (128), at least one deviation between an item of reference information on a known reference value and the at least one item of measurement information is determined, wherein generating the item of measurement information is started when any predetermined condition is met, wherein a fourth predetermined condition is that an external device (156) comprising the spectrometer device (128) is in a stand-by mode.

Description

[0001] Recalibration of Temperature Dependent Calibration Factors using Temperature Slopes

[0002] Technical Field

[0003] The invention relates to a method for calibrating a spectrometer device, a method for operating a spectrometer device and a spectrometer device. The invention further relates to a computer program and a non-transitory computer-readable storage medium. The methods and devices according to the present invention specifically may be employed for example in various areas of daily life, security technology, gaming, traffic technology, production technology, photography such as digital photography or video photography for arts, documentation or technical purposes, safety technology, information technology, agriculture, crop protection, maintenance, cosmetics, medical technology or in the sciences. However, other applications are also possible.

[0004] Background art

[0005] Spectrometer devices are, typically, used for obtaining at least one item of spectral information on an object, such as a measurement object. For obtaining the item of spectral information, the spectrometer devices may have to be calibrated.

[0006] The calibration is typically performed in house by the manufacturer. For ensuring the quality over a long-life cycle of the spectrometer device, so called in-field calibrations may have to be performed. Such in-field calibrations may be particularly challenging to perform for components of the spectrometer device having a temperature dependent performance.

[0007] US 2020 / 121244 A1 relates to a spectrum processing apparatus for removing noise, caused by a change in temperature, from a spectrum. The spectrum processing apparatus includes: a temperature modulator configured to perform modulation of a temperature of an object; a spectrometer configured to obtain a first spectrum based on the temperature of the object that is changed by the modulation; and a spectrum processor configured to extract a temperature change vector based on the first spectrum, and to correct a second spectrum based on the extracted temperature change vector.

[0008] WO 2018 / 203831 A1 relates to calibrating a spectrometer module that includes performing measurements using the spectrometer module to generate wavelength- versus-operating parameter calibration data for the spectrometer module, performing measurements using the spectrometer module to generate optical crosstalk and dark noise calibration data for the spectrometer module, and performing measurements using the spectrometer module to generate full system response calibration data, against a known reflectivity standard, for the spectrometer module. The method further includes storing in memory, coupled to the spectrometer module, a calibration record that incorporates the wavelength-versus-operating parameter calibration data, the optical crosstalk and dark noise calibration data, and the full system response calibration data, and applying the calibration record to measurements by the spectrometer module.

[0009] CN 106 352 981 B relates to a multi-dimensional complex calibration method for a fiber optic spectrometer, including multi-dimensional wavelength calibration and multidimensional amplitude calibration. The temperature factor is introduced to perform multidimensional calibration on the wavelength and amplitude to improve the stability of the instrument at high and low temperatures. The various factors affecting the operation of the CCD are fully considered, and the calibration factors of multiple dimensions of space, time, temperature and light intensity are combined to perform multi-dimensional complex calibration on the fiber optic spectrometer to ensure the reliability of the instrument test results.

[0010] DE 10 2014 013848 A1 relates to a microspectrometer, in particular a NIR microspectrometer for mobile applications in battery-operated devices. To overcome the non-miniaturization and handheld-compatible limitations of the above-mentioned system configurations, a microspectrometer system and a calibration procedure are proposed. According to the invention, the miniaturized NIR spectrometer should be designed without active temperature stabilization. Instead, according to the invention, the spectral sensitivity function is recorded at several levels in the expected operating temperature range as part of a factory temperature calibration step (QEA = f(T); measured with an integrated temperature sensor).

[0011] WO 2023 / 041566 A1 relates to a method for calibrating a spectrometer device. The method comprises the following steps: a) illuminating at least one detector device of the spectrometer device with at least one broadband light source through at least one narrow band pass filter, specifically through a plurality of narrow band pass filters, having a plurality of predetermined transmission bands; b) generating, by using the detector device, a plurality of detector signals depending on the illumination of step a), wherein the detector device comprises at least one optical element configured for separating incident light into a spectrum of constituent wavelength components and further comprising a plurality of photosensitive elements, wherein each photosensitive element is configured for receiving at least a portion of one of the constituent wavelength components and for generating a respective detector signal depending on the illumination of the respective photosensitive element by the at least one portion of the respective constituent wavelength component; c) determining at least one item of wavelength calibration information, wherein the item of wavelength calibration information comprises at least one assignment assigning wavelengths, specifically wavelength bands, of incident light to corresponding photosensitive elements being responsive to these wavelengths, specifically assigning at least one of the photosensitive elements to each of the predetermined transmission bands, more specifically assigning one or more of pixel positions and / or identification numbers of the photosensitive elements to the respective predetermined transmission bands, specifically to each of the predetermined transmission bands; and d) determining at least one item of stray light calibration information based on the plurality of detector signals, wherein the item of stray light calibration information comprises at least one signal distribution function, specifically at least one signal distribution matrix, the signal distribution function describing a distribution of responses of the photosensitive elements to incident light having a specific wavelength. Further, a system for calibrating a spectrometer device, a computer program and a computer-readable storage medium are disclosed.

[0012] US 2013 / 093936 A1 relates to an energy dispersion device, spectrograph and method that can be used to evaluate the composition of matter on site without the need for specialized training or expensive equipment. The energy dispersion device or spectrograph can be used with a digital camera or cell phone. A device of the invention includes a stack of single- or double-dispersion diffraction gratings that are rotated about their normal giving rise to a multiplicity of diffraction orders from which meaningful measurements and determinations can be made with respect to the qualitative or quantitative characteristics of matter.

[0013] US 2007 / 035740 A1 relates to an optical system comprising an optical instrument and a processing unit. The optical instrument may comprise an illumination source and a sensor. The processing unit may comprise a data storage having stored thereon a characterization of the illumination source and a characterization of the sensor. The processing unit may also comprise a computer configured to calculate a system response of the illumination source and the receiving element considering the characterization of the illumination source and the characterization of the receiving element.

[0014] Problem to be solved

[0015] It is therefore desirable to provide methods and devices, which at least partially address the above-mentioned technical challenges and at least substantially avoid the disadvantages of known devices.

[0016] In particular, it is an object of the present invention to enable a reliable and temperature resolved in-field calibration process for temperature dependent components of a spectrometer device.

[0017] Summary This problem is, particularly, addressed by the method for calibrating a spectrometer device, the method for operating a spectrometer device and the spectrometer device described by the features of the independent claims. Advantageous embodiments which might be realized in an isolated fashion or in any arbitrary combinations are listed in the dependent claims as well as throughout the specification.

[0018] In a first aspect, a method for calibrating a spectrometer device for obtaining an item of calibration information on the spectrometer device is disclosed. The steps of the method for calibrating the spectrometer device for obtaining the item of calibration information on the spectrometer device may be performed in the given order. A different order, however, may also be feasible. Further, two or more of the method steps may be performed simultaneously. Thereby, the method steps may at least partly overlap in time. Further, the method steps may be performed once or repeatedly. Thus, one or more or even all of the method steps may be performed once or repeatedly. The method may comprise additional method steps, which are not listed herein. For this aspect, reference may be made to any definition, Embodiment, claim and / or aspect as disclosed herein.

[0019] The method may be a computer-implemented method. Alternatively or in addition, at least one of the method steps, such as step a) and / or b) and / or c), preferably any one of the method steps, may be performed by using an evaluation unit, particularly comprised by the spectrometer device. The term "computer implemented method" as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to a method, which involves at least one apparatus, specifically a computer, or a plurality of apparatus, particularly connected via a computer network. The plurality of apparatus may be connected, particularly for transmitting data, via a network by using at least one connection interface at any one of the apparatuses of the plurality of apparatus. The computer-implemented method may be implemented as at least one computer program that may be provided on a storage medium carrying the computer program. Preferably at least one and / or any one of the steps may be performed by using the at least one computer program. Alternatively, the at least one computer program may be accessible by an apparatus which may be adapted for performing the method via a network, such as via an in-house network, via internet, or via a cloud. With particular regard to the present invention, the present method can, thus, be performed on a programmable apparatus, which is configured for this purpose, such as by providing a computer program, which is configured for such a purpose.

[0020] The term “calibrating”, or any grammatical variation thereof, such as “calibrating”, as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically refers, without limitation, to a process for determining at least one deviation between a known reference value, particularly an item of reference information, and a measurement value generated in a measurement process, such as an item of measurement information. The deviation may be related to and / or introduced by, particularly a performance, such as temperature dependent performance of, at least one component of the spectrometer device, particularly influenced by aging effects, drifting effects and / or hysteresis effects of the at least one component. One or more step or any step of the method the method for calibrating a spectrometer device for obtaining an item of calibration information on the spectrometer device may be performed in the field.

[0021] The term “spectrometer device” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to an optical device configured for acquiring at least one item of spectral information on at least one object. Specifically, the at least one item of spectral information may refer to at least one optical property or optically measurable property which is determined as a function of a wavelength, for one or more different wavelengths. More specifically, the optical property or optically measurable property, as well as the at least one item of spectral information, may relate to at least one property characterizing at least one of a transmission, an absorption, a reflection and an emission of the at least one object, either by itself or after illumination with external light. The at least one optical property may be determined for one or more wavelengths. The spectrometer device specifically may form an apparatus which is capable of recording a signal intensity with respect to the corresponding wavelength of a spectrum or a partition thereof, such as a wavelength interval, wherein the signal intensity may, specifically, be provided as an electrical signal which may be used for further evaluation.

[0022] The term “spectral information”, also referred to as “spectral information” or as “an item of spectral information”, as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to an item of information, e.g. on at least one object and / or radiation emitted by at least one object, characterizing at least one optical property of the object, more specifically at least one item of information characterizing, e.g. qualifying and / or quantifying, at least one of a transmission, an absorption, a reflection and an emission of the at least one object. As an example, the at least one item of spectral information may comprise at least one intensity information, e.g. information on an intensity of light being at least one of transmitted, absorbed, reflected or emitted by the object, e.g. as a function of a wavelength or wavelength sub-range over one or more wavelengths, e.g. over a range of wavelengths. Specifically, the intensity information may correspond to or be derived from the signal intensity, specifically the electrical signal, recorded by the spectrometer device with respect to a wavelength or a range of wavelengths of the spectrum.

[0023] The method comprises the following steps: a) obtaining at least one item of temperature variation information on at least one component of the spectrometer device by monitoring the temperature of the at least one component of the spectrometer device by using at least one temperature sensor of the spectrometer device; b) generating at least one item of measurement information on the spectrometer during a change of the temperature of the at least one component of the spectrometer device by using a measuring unit of the spectrometer device, wherein the change of the temperature is determined by evaluating the item of temperature variation information by using an evaluation unit of the spectrometer device, wherein the at least one item of measurement information is obtained in a temperature resolved manner, wherein the at least one item of measurement information is a measurement value generated in a measurement process; c) obtaining at least one item of calibration information on the spectrometer device by evaluating the item of measurement information on the spectrometer by further using the evaluation unit of the spectrometer device, wherein, for obtaining the at least one item of calibration information on the spectrometer device, at least one deviation between an item of reference information on a known reference value and the at least one item of measurement information is determined, wherein generating the item of measurement information is started when any predetermined condition is met, wherein a fourth predetermined condition is that an external device comprising the spectrometer device is in a stand-by mode.

[0024] As indicated in the above, the method may comprise a step of obtaining at least one item of temperature variation information on at least one component of the spectrometer device by monitoring the temperature of the at least one component of the spectrometer device by using at least one temperature sensor of the spectrometer device;

[0025] The term “obtaining” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to the procedure of getting and / or becoming access to data, such as information. Obtaining may comprise receiving the data from a sending device. For receiving the data, obtaining may comprise requesting the data from the sending device, such as by sending a query to the sending device. Alternatively or in addition, obtaining may comprise generating the data. The term “obtaining at least one item of temperature variation information” may comprise at least one step of

[0026] - generating the item of temperature variation information on at least one component by using the at least one temperature sensor, particularly wherein the item of temperature variation information is generated in a measurement process involving the at least one temperature sensor;

[0027] - receiving the item of temperature variation information on at least one component from the at least one temperature sensor, such as by receiving one or more temperature signals.

[0028] The term “item of temperature variation information” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to at least one element, such as at least one value, concerning a variation and / or a change in a temperature. Particularly thereby, the item of temperature variation information on the at least one component may indicate a variation and / or a change of the temperature of the at least one component. The item of temperature variation information may comprise information on at least one temperature gradient, particularly for a specific point in time, such as at least one value related to a temperature gradient. The temperature gradient may indicate the variation and / or the change of the temperature of the at least one component. Alternatively or in addition, the at least one item of temperature variation information may comprise at least two temperatures of the at least one component of the spectrometer device for differing points in time, such as at least two values related to a temperature. The at least two temperatures may indicate the variation and / or a change of the at least one component.

[0029] The term “component” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to an arbitrary element, device and / or unit comprised by a device, such as the spectrometer device. The component may be used in the method for operating a spectrometer device for obtaining at least one item of spectroscopic information on at least one object. Alternatively or in addition, the performance of the component may influence the obtaining of the item of spectroscopic information on at least one object, particularly in a manner that a change in the performance of the component causes a change in the obtained item of spectroscopic information. Alternatively or in addition, the component of the spectrometer device may have a temperature dependent performance. The at least one component may be or may comprise a light emitting element of the spectrometer device, particularly wherein the light emitting element may be configured for emitting illumination light onto the object.

[0030] As further used herein, the term “light” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to electromagnetic radiation in one or more of the infrared, the visible and the ultraviolet spectral range. Herein, the term “ultraviolet spectral range”, generally, refers to electromagnetic radiation having a wavelength of 1 nm to 380 nm, preferably of 100 nm to 380 nm. Further, in partial accordance with standard ISO-21348 in a valid version at the date of this document, the term “visible spectral range”, generally, refers to a spectral range of 380 nm to 760 nm. The term “infrared spectral range” (IR) generally refers to electromagnetic radiation of 760 nm to 1000 pm, wherein the range of 760 nm to 1 .5 pm is usually denominated as “near infrared spectral range” (NIR) while the range from 1.5 p to 15 pm is denoted as “mid infrared spectral range” (MidlR) and the range from 15 pm to 1000 pm as “far infrared spectral range” (FIR). Preferably, light used for the typical purposes of the present invention is light in the infrared (IR) spectral range, more preferred, in the near infrared (NIR) and / or the mid infrared spectral range (MidlR), especially the light having a wavelength of 1 pm to 5 pm, preferably of 1 pm to 3 pm. This is due to the fact that many material properties or properties on the chemical constitution of many objects may be derived from the near infrared spectral range. It shall be noted, however, that spectroscopy in other spectral ranges is also feasible and within the scope of the present invention.

[0031] Consequently, the term “light emitting element”, also referred to as an “illumination source”, as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to an arbitrary device configured for generating or providing light, specifically “illumination light” in the sense of the above-mentioned definition for the term “light”. The light emitting element specifically may be or may comprise at least one electrical light source.

[0032] As further used herein, the term “detection light” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to light that is generated by the object, particularly generated in an interaction of the illumination light with the object, such as scattering, reflecting and / or transmitting. The detection light may be illumination light that is reflected and / or scattered back through the sample interface to the at least one detector. At least a portion of the illumination light may be transmitted and / or absorbed by the object in a manner that it is not detected by the at least one detector.

[0033] The light emitting element may be a thermal radiator. The thermal radiator may be selected from an incandescent lamp or a thermal infrared emitter. The term “incandescent lamp” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to an electric light having a heatable element, such as a wire filament heated, which is capable of being heated to a temperature at which it emits light, especially infrared light. Since the incandescent lamp can, therefore, be considered as a thermal emitter within the infrared spectral range, an emission power of the incandescent lamp decreases with increasing wavelength. The thermal radiator may be selected from an incandescent lamp or a thermal infrared emitter. The term “thermal infrared emitter” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to a micro-structured thermally emitting device, which comprises a radiation emitting surface as the light emitting element that emits the optical radiation to be monitored.

[0034] Alternatively or in addition, the light emitting element may be a microelectromechanical system (MEMS)-based emitter. The term “microelectromechanical system (MEMS)- based emitter” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to an arbitrary apparatus configured for generating and / or emitting light comprising at least one element, wherein the element is associated with MEMS technology. MEMS technology, typically, involves the manufacture of mechanical and / or electrical elements on a microscale, typically between 0.01 pm and 1000 pm.

[0035] Alternatively or in addition, the light emitting element may be a laser, specifically a vertical cavity surface emitting laser (VCSEL), particularly emitting at least one wavelength in the infrared region.

[0036] The term “vertical-cavity surface-emitting laser” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to a semiconductor laser diode configured for laser beam emission perpendicular with respect to a top surface. VCSELs are generally known to the skilled person such as from WO 2017 / 222618 A. Alternatively or in addition, the radiation emitting element may be a light-emitting diode (LED), specifically a LED emitting light that is at least partially located in the infrared spectral range. Alternatively or in addition, a LED emitting light that is illuminating a luminescent material, specifically a phosphor, for light-conversion of light generated by the LED, wherein the luminescent material generates converted light that is at least partly located in the near-infrared spectral range.

[0037] The term “light-emitting diode” or briefly “LED”, as used herein, is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to an optoelectronic semiconductor device capable of emitting light when an electrical current flows through the device. The optoelectronic semiconductor device may be configured for generating the light due to various physical processes, including one or more of spontaneous emission, induced emission, decay of metastable excited states and the like. Thus, as an example, the light-emitting diode, may comprise one or more of: a light-emitting diode based on spontaneous emission of light, in particular an organic light emitting diode, a light-emitting diode based on superluminescence (sLED), or a laser diode (LD) In the following, without narrowing the possible embodiments of the light-emitting diode to any of the before-mentioned physical principles or setups, the abbreviation “LED” will be used for any type of light-emitting diode.

[0038] Specifically, the LED may comprise at least two layers of semiconductor material, wherein light may be generated at at least one interface between the at least two layers of semiconductor material, specifically due to a recombination of positive and negative electrical charges, e.g. due to electron-hole recombination. The at least two layers of semiconductor material may have differing electrical properties, such as at least one of the layers being an n-doped semiconductor material and at least one of the layers being a p-doped semiconductor material. Thus, as an example, the LED may comprise at least one pn-junction and / or at least one pin-set up. It shall be noted, however, that other device structures are feasible, too. The at least one semiconductor material may specifically be or may comprise at least one inorganic semiconducting material. It shall be noted, however, that organic semiconducting materials may be used additionally or alternatively.

[0039] Generally, the LED may convert electrical current into light, specifically light that is at least partially located in the infrared spectral range. Alternatively or in addition, LED may convert electrical current into light into primary light, more specifically into blue primary light. The LED, thus, specifically may be a blue LED. The LED may be configured for generating the primary light, particularly for the light-conversion in the phosphor, also referred to as the “pump light”. Thus, the LED may also be referred to as the “pump LED”. The LED specifically may comprise at least one LED chip and / or at least one LED die. Thus, the semiconductor element of the LED may comprise an LED bare chip.

[0040] The term “luminescence” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to the process of spontaneous emission of light by a substance not resulting from heat. Specifically, luminescence may refer to a cold-body radiation. More specifically, the luminescence may be initiated or excited by irradiation of light, in which case the luminescence is also referred to as “photoluminescence”. The property of a material being capable of performing luminescence, in the context of the present invention, is referred to by the adjective “luminescent”. The at least one luminescent material specifically may be a photoluminescent material, i.e. a material which is capable of emitting light after absorption of photons or excitation light. Specifically, the luminescent material may have a positive Stokes shift, which generally may refer to the fact that the secondary light is red-shifted with respect to the primary light.

[0041] The at least one luminescent material, thus, may form at least one converter, also referred to as a light converter, transforming primary light into secondary light having different spectral properties as compared to the primary light. Specifically, a spectral width of the secondary light may be larger than a spectral width of the primary light, and / or a center of emission of the secondary light may be shifted, specifically red-shifted, compared to the primary light. Specifically, the at least one luminescent material may have an absorption in the ultraviolet and / or blue spectral range and an emission in the near-infrared and / or infrared spectral range. Thus, generally, the luminescent material or converter may form at least one component of the phosphor LED converging primary light or pump light, specifically in the blue spectral range, into light having a longer wavelength, e.g. in the near-infrared or infrared spectral range.

[0042] The luminescent material, specifically, may, thus, form at least one converter or light converter. The luminescent material may form at least one of a converter platelet, a luminescent and specifically a fluorescent coating on the LED and phosphor coating on the LED. The luminescent material may, as an example, comprise one or more of the following materials: Cerium-doped YAG (YAG:Ce3+, or YsAlsO^Ce3-); rare-earth-doped Sialons; copper- and aluminum-doped zinc sulfide (ZnS:Cu,AI).

[0043] The LED and the luminescent material, together, may form a so-called “phosphor LED”. Consequently, the term “phosphor light-emitting diode” or briefly “phosphor LED”, as used herein, is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to a combination of at least one light-emitting diode configured for generating primary light or pump light, and at least one luminescent material, also referred to as a “phosphor”, configured for lightconversion of the primary light generated by the light-emitting diode. The phosphor LED may form a packaged LED light source, including the LED die, e.g. a blue LED emitting blue pump light, as well as the phosphor, which, as an example, fully or partially coats the LED, which is, as an example, configured for converting the primary light or blue light into light having differing spectral properties, specifically into near-infrared light. Generally, the phosphor LED may be packaged in one housing or may be unpackaged. Thus, the LED and the at least one luminescent material for light-conversion of the primary light generated by the light-emitting diode may specifically be housed in a common housing. Alternatively, however, the LED may also be an unhoused or bare LED which may fully or partially be covered with the luminescent material, such as by disposing one or more layers of the luminescent material on the LED die. The phosphor LED, generally, may form an emitter or light source by itself.

[0044] The at least one luminescent material specifically may form at least one layer. Generally, various alternatives of positioning the luminescent material with respect to the lightemitting diode are feasible, alone or in combination. Firstly, the luminescent material, e.g., at least one layer of the luminescent material, such as the phosphor, may be positioned directly on the light-emitting diode, which is also referred to as a “direct attach”, e.g. with no material in between the LED and the luminescent material or with one or more transparent materials in between, such as with one or more transparent materials, specifically transparent for the primary light, in between the LED and the luminescent material. Thus, as an example, a coating of the luminescent material may be placed directly or indirectly on the LED. Additionally or alternatively, the luminescent material, as an example, may form at least one converter body, such as at least one converter disk, which may be placed on top of the LED, e.g. by adhesive attachment of the converter body to the LED. Additionally or alternatively, the luminescent material may also be placed in a remote fashion, such that the primary light from the LED has to pass an intermediate optical path before reaching the luminescent material. This placement may also be referred to as a “remote placement” or as a “remote phosphor”. Again, as an example, the luminescent material in the remote placement may form a solid body or converter body, such as a disk or converter disk. Further, in case of the remote placement, the luminescent material may also be a coating. In particular, an object which is transmitting light, e.g. a thin glass substrate, module window, comprising and / or being made of glass or plastics, may be coated with the phosphor. Alternatively, a reflective surface may be coated with the phosphor. This could be a flat or rough mirror, which may comprise and / or be made of a high-reflective index material substrate, e.g. silicon, or a gold, silver, aluminum or chromium coated flat or rough surface, e.g. glass, or a plastic. In the intermediate optical path, one or more optical elements may be placed, such as one or more of a lens, a prism, a grating, a mirror, an aperture or a combination thereof. Thus, specifically, an optical system having imaging properties may be placed in between the LED and the luminescent material, in the intermediate optical path. Thereby, as an example, the primary light may be focused, or bundled onto the converter body.

[0045] The light emitting element may be emitting visible light and / or infrared light.

[0046] The at least one component may be or may comprise a detector of the spectrometer device, particularly wherein the detector may be configured for detecting detection light from the object.

[0047] The verb “to detect” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to the process of at least one of determining, measuring and monitoring at least one parameter, qualitatively and / or quantitatively, such as at least one of a physical parameter, a chemical parameter and a biological parameter. Specifically, the physical parameter may be or may comprise an electrical parameter. Consequently, the term “photosensitive detector”, or “detector” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to an arbitrary device configured for detecting, i.e. for at least one of determining, measuring and monitoring, at least one parameter, qualitatively and / or quantitatively, such as at least one of a physical parameter, a chemical parameter and a biological parameter. The at least one detector may be configured for generating at least one detector signal, more specifically at least one electrical detector signal, such as an analogue and / or a digital detector signal, the detector signal providing information on the at least one parameter measured by the detector. The detector signal may directly or indirectly be provided by the at least one detector to the evaluation unit, such that the at least one detector and the evaluation unit may be directly or indirectly connected. The detector signals may be used as a “raw” detector signal and / or may be processed or preprocessed before further used, e.g. by filtering and the like. Thus, the at least one detector may comprise at least one processing device and / or at least one preprocessing device, such as at least one of an amplifier, an analogue / digital converter, an electrical filter and a Fourier transformation.

[0048] The at least one detector may be configured for detecting light propagating from the object to the spectrometer device or more specifically to the at least one detector of the spectrometer device. The at least one detector may be configured for determining at least one optical parameter, such as an intensity and / or a power of light by which at least one sensitive area of the detector is irradiated. More specifically, the at least one detector may comprise at least one photosensitive element and / or at least one optical sensor, such as at least one of a photodiode, a photocell, a photosensitive resistor, a phototransistor, a thermophile sensor, a photoacoustic sensor, a pyroelectric sensor, a photomultiplier and a bolometer. The at least one detector, thus, may be configured for generating at least one detector signal, more specifically at least one electrical detector signal, in the above-mentioned sense, providing information on at least one optical parameter, such as the power and / or intensity of light by which the detector or a sensitive area of the detector is illuminated. The at least one detector may be a Lead Sulfide (PbS) detector.

[0049] The at least one detector may comprise a plurality of photosensitive elements sensitive to differing wavelength intervals. The wavelength intervals may be wavelength sections. Each of the photosensitive elements may comprise at least a photosensitive area which may be adapted for generating an electrical signal depending on the intensity of the incident light, wherein the electrical signal may, in particular, be provided to the evaluation unit, as will be outlined in further detail below.

[0050] The at least one component may be or may comprise a component of the read-out electronics of the spectrometer device.

[0051] The component of the read-out electronics of the spectrometer device may be or may comprise at least one of: an voltage source configured for applying a bias voltage to the at least one detector; a driving unit configured for driving the light emitting element; a modulator configured for modulating the light emitting element; an amplifier, a skimming circuit; an analog-to-digital converter; and a voltage divider, particularly having a matched load resistor.

[0052] The term “monitoring” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to a process of continuously observing at least one process, particularly by continuously generating (such as by measuring and / or recording) and / or evaluating measuring data during the process. Monitoring may comprise generating at least one item of information, such as by measuring and / or recording the at least one item of temperature variation information on the component by using the temperature sensor. Monitoring may further comprise recording the measured at least one item of information, such as recording the at least one item of temperature variation information on the component by using a storage unit. The term “temperature sensor” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to an arbitrary device configured for providing at least one temperature signal being a measure of at least one temperature, specifically of the component. Typically, a temperature sensor may be or may comprise an electrical and / or electronic component for providing the temperature signal. The temperature sensor may be configured to determine the temperature of the component, particularly directly, by performing measurements of the temperature of the component. Alternatively or in addition, the temperature sensor may be configured to determine the temperature of the component, particularly indirectly, such as by performing measurements of a temperature dependent characteristic of the component, e.g. a forward voltage used for driving a light emitting diode of the light emitting element.

[0053] The at least one component may be or may comprise an optical component of the spectrometer device. The term “optical component” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to a least one optical element configured for manipulating and / or interacting with light, such as illumination light and / or detection light, particularly in a manner to control at least one path of the light, to focus the light, to filter the light and so on. The optical component may be and or may comprise at least one of: a wavelength- selective element; an optical filter; an optical mirror; an optical lens.

[0054] The temperature sensor may be or may comprise at least one of: an electrical resistor, particularly a metal layer electrical resistor; a thermocouple; a Negative Temperature Coefficient (NTC) temperature sensor; a Positive Temperature Coefficient (PTC) temperature sensor; a diode; the light emitting element; the at least one detector, particularly wherein the detector has a temperature dependent performance.

[0055] Typically, a “diode” may be used as temperature sensor by applying a low current to the diode for ensuring a negligible self-heating. The forward voltage used for driving the diode may then be a very good measure for the temperature of the diode. The forward voltage may reflect the temperature dependence of the bandgap of the diode. This scheme may work analogously for a light emitting element comprising a diode. However, the ambient temperature would not be determined, but the temperature of the light emitting element itself due to the self-heating of the light emitting element. The dark resistance of a detector, such as a PbS detector, may show a temperature dependence. When a constant bias voltage may be applied, the dark current through the resistor, therefore, may be a measure of the temperature of the resistor.

[0056] As indicated in the above, the method comprises a step of generating at least one item of measurement information on the spectrometer during a change of the temperature of the at least one component of the spectrometer device by using a measuring unit of the spectrometer device, wherein the change of the temperature is determined by evaluating the item of temperature variation information by using an evaluation unit of the spectrometer device. The item of measurement information on the spectrometer may be an item of measurement information on the spectrometer device.

[0057] The at least one item of measurement information may exclusively be generated when the temperature of the at least one component of the spectrometer device changes. The at least one item of measurement information may not be generated when the temperature of the at least one component of the spectrometer device is constant.

[0058] The term “generating” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to a process a measuring and / or recording data, such as at least one item of information. The term “measuring” may refer the active process of determining by using a measuring apparatus, such as a measuring unit. The measurement process may be performed as part of the respective method, such as the method for calibrating a spectrometer device for obtaining an item of calibration information on the spectrometer device. The term “recording” may refer the process of capturing and / or storing data, particularly by using a measuring unit (e.g. for capturing) and / or a storage device (e.g. for storing). The recording process may be performed as part of the respective method, such as the method for calibrating a spectrometer device for obtaining an item of calibration information on the spectrometer device.

[0059] The term “item of measurement information” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to at least one measured element, such as a value, that is related to the performance of the element under a specific condition. The item of measurement information may be particularly compared to a known item of reference information, particularly in the process of obtaining the at least one item of calibration information. The item of measurement information may be or may comprise information on the component for which the temperature is monitored. The term “change” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to a process becoming different and / or transforming from one state and / or condition to another, particularly over time. The term change of temperature refer to the fact that a first temperature of the component at a first time deviates from a second temperature of the component at a later second time. The change of the temperature may be related to a heating-up of the component, such as when the temperature of the component raises. Alternatively or in addition, the change of the temperature may be related to a coolingdown of the component, such as when the temperature of the component falls.

[0060] Determining if the temperature profile of the at least one component of the spectrometer device changes may comprise evaluating the item of temperature variation information for obtaining a slope of the temperature of the at least one component.

[0061] Generating the item of measurement information is started when at least one or any predetermined condition is met.

[0062] The term “predetermined condition” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to a specific circumstance, a specific requirement and / or a specific criterion that is required to be established in advance of an event and / or decision taking place.

[0063] The terms “first”, “second”, “third” and so on may not be intended to imply any specific order. Neither may those terms intend to imply that a certain amount of items, to which the terms refer, may have to be present. Exemplarily, the term third element does not necessarily imply that a first element and / or second element is required to be present.

[0064] A first predetermined condition may be that the change in the temperature of the at least one component of the spectrometer device may be above or below a predetermined, particularly absolute, value. The predetermined value may be 5 Kelvin.

[0065] A second predetermined condition may be that the change in the temperature is related to at least one of: a cooling-down of the at least one component; a heating-up of the at least one component. A third predetermined condition may be that a workload of an external component changes. In addition, for monitoring the workload of the external component, the spectrometer device may comprise a connection interface.

[0066] The external component may be comprised by a device further comprising the spectrometer device, particularly in a manner that the external component is in thermal contact with the spectrometer device, more particularly in a manner that the temperature of the external component transfers to the spectrometer device, specifically the component of the spectrometer device.

[0067] The device may be at least one of: a mobile communication device; a wearable, such as a smart watch; a tablet; a medical mobile device, particularly free of a thermoelectric cooling (TEC); a computing device, specifically connected to the internet.

[0068] The external component may be or may comprise at least one of: a processing unit; a graphics card; an image generation unit; a battery; a display.

[0069] A fourth predetermined condition is that an external device comprising the spectrometer device is in a stand-by mode. Alternatively or in addition, a further condition may be that the external device is entering and / or leaving and / or out of a stand-by mode.

[0070] The term “stand-by mode” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to a state of a device in which at least one and / or any intended function of the device is temporarily deactivated, but can be reactivated at any time. Typically, a low amount of power consumption, which is reduced compared to normal operation, is required to maintain the standby state.

[0071] Generating the item of measurement information may be stopped when at least one or any predetermined condition is no longer met. Alternatively or in addition, generating the item of measurement information may be stopped when at least one further predetermined condition is no longer met. The further predetermined condition may be at least one of: starting to charge the battery comprised by the external device, bringing the external device into a stand-by mode, bringing the external device out of a stand-by mode, the external device being out or being in a stand-by mode, turning the external device on or off. Particularly thereby, it may be ensured that generating the item of measurement information is performed within one single heating-up cycle and / or one single cooling-down cycle. A heating-up cycle may be a period in time in which the temperature, particularly of the component, exclusively raises. A cooling-down cycle may be a period in time in which the temperature, particularly of the component, exclusively falls.

[0072] The least one item of measurement information may be generated in a temperature resolved manner. The term “generated in a temperature resolved manner” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to the respective item of information being temperature resolved. The respective item of information may be temperature resolved when for a plurality of different temperatures specific information for each different temperature comprised by the respective item of information is available.

[0073] The term “measuring unit” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to an arbitrary device, particularly comprised by the spectrometer device, configured for performing at least one measurement on the at least one component for determining the performance of the component, particularly by using a reference target.

[0074] The method may be performed in the field, specifically generating the item of measurement information may be performed in the field.

[0075] The term “in the field” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to a process of calibrating an arbitrary device, such as a component, at their actual usage location and / or operational environment, particularly contrary to a process of calibrating in a controlled laboratory and / or calibration facility, specifically by the manufacturer. Generating the item of measurement information may be performed in in-field operation.

[0076] As indicated in the above, the method may comprise a step of obtaining at least one item of calibration information on the spectrometer device by evaluating the item of measurement information on the spectrometer by further using the evaluation unit of the spectrometer device. Evaluating the item of measurement information on the spectrometer may comprise comparing the item of measurement information and the item of reference information, particularly in order determine a deviation between the item of measurement information and the item of reference information. The item of reference information may also be an item of initial calibration information, wherein the item of initial calibration information may be determined in a factory calibration, particularly after manufacturing the spectrometer device.

[0077] The term “obtaining at least one item of calibration information” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning may refer, without limitation, to

[0078] - receiving the at least one item of calibration information on the spectrometer device from the at least one evaluation unit;

[0079] - generating the at least one item of calibration information on the spectrometer device by using the at least one evaluation unit.

[0080] The term “item of calibration information” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to at least one element, such as a value, concerning a compensation instruction and / or a correction instruction between a reference element and a measured element. The item of calibration information may be obtained in a manner that the item of calibration information compensates and / or corrects the determined deviation between the item of measurement information and the item of reference information.

[0081] The item of calibration information may be considered, particularly as a compensation and / or a correction information, when evaluating the detector signal for obtaining the item of spectroscopic information. Particularly thereby, the measured item of spectroscopic information may correspond to an item of reference spectroscopic information. The item of calibration information may be or may comprise information on the component for which the temperature is monitored. The item of calibration information may be or may comprise temperature information on at least one signal of and / or generated by the at least one component. Alternatively or in addition, the item of calibration information may be or may comprise information on at least one ratio of two signals of and / or generated by the at least one component. The at least one item of calibration information may be obtained in a temperature resolved manner. The at least one item of calibration information may be temperature resolved.

[0082] The method may comprise a further step of d) updating at least one item of outdated calibration information on the spectrometer device with the, particularly in step c), obtained at least one item of calibration information on the spectrometer device. The term “updating” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to the process of bringing something, such as information, up to date, particularly for improving its current state, such as by making at least one change and / or at least one modification. Updating may be performed in a manner that the obtained item of calibration information is considered, particularly as a compensation and / or a correction information, when evaluating the detector signal for obtaining the item of spectroscopic information. Particularly consequently, the item of outdated calibration information on the spectrometer device is no longer considered, particularly as a compensation and / or a correction information, when evaluating the detector signal for obtaining the item of spectroscopic information.

[0083] The term “outdated calibration information” as used herein is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to calibration information determined in a factory calibration process and / or in a previous cycle of the method for calibrating a spectrometer device for obtaining an item of calibration information on the spectrometer device, particularly comprising any one of the steps a) to d).

[0084] In a further aspect, a method for operating a spectrometer device for obtaining at least one item of spectroscopic information on at least one object is disclosed. The steps of the method for operating a spectrometer device for obtaining at least one item of spectroscopic information on at least one object may be performed in the given order. A different order, however, may also be feasible. Further, two or more of the method steps may be performed simultaneously. Thereby the method steps may at least partly overlap in time. Further, the method steps may be performed once or repeatedly. Thus, one or more or even all of the method steps may be performed once or repeatedly. The method may comprise additional method steps, which are not listed herein. For this aspect, reference may be made to any definition, Embodiment, claim and / or aspect as disclosed herein.

[0085] The method comprises the following steps: i. obtaining an item of calibration information on the spectrometer device by performing a method for calibrating a spectrometer device as disclosed elsewhere herein;

[0086] II. illuminating the object with illumination light generated by using at least one light emitting element of the spectrometer device in order to generate detection light from the at least one object; iii. detecting the detection light from the object by using at least one detector of the spectrometer device and, thereby, generating at least one detector signal; and iv. evaluating the detector signal for obtaining the item of spectroscopic information on the object by using the at least one evaluation unit of the spectrometer device, wherein at least one item of calibration information on the spectrometer device is considered when evaluating the detector signal for obtaining the item of spectroscopic information.

[0087] In a further aspect, a spectrometer device for obtaining at least one item of spectroscopic information on at least one object by spectroscopic measurement is disclosed. The spectrometer device comprises:

[0088] (1 ) at least one temperature sensor, wherein the temperature sensor is configured for obtaining at least one item of temperature variation information on at least one component of the spectrometer device by monitoring the temperature of the at least one component of the spectrometer device;

[0089] (2) at least one measuring unit, wherein the measuring unit is configured for generating at least one item of measurement information on the spectrometer during a change of the temperature of the at least one component of the spectrometer device wherein the at least one item of measurement information is obtained in a temperature resolved manner, wherein the at least one item of measurement information is a measurement value generated in a measurement process,

[0090] (3) at least one evaluation unit, wherein the evaluation unit is configured for determining the change of the temperature by evaluating the item of temperature variation information; wherein the evaluation unit is further configured for obtaining at least one item of calibration information on the spectrometer device by evaluating the item of measurement information on the spectrometer, wherein, for obtaining the at least one item of calibration information on the spectrometer device, at least one deviation between an item of reference information on a known reference value and the at least one item of measurement information is determined, wherein generating the item of measurement information is started when any predetermined condition is met, wherein a fourth predetermined condition is that an external device comprising the spectrometer device is in a stand-by mode.

[0091] For this aspect, reference may be made to any definition, Embodiment, claim and / or aspect as disclosed herein.

[0092] The spectrometer device may further comprise: (4) at least one light emitting element, wherein the light emitting element is configured for emitting illumination light for illuminating the at least one object in order to generate detection light from the at least one object;

[0093] (5) at least one detector, wherein the detector is configured for generating at least one detector signal when receiving the detection light from the object; wherein the evaluation unit is configured for evaluating the detector signal for obtaining the item of spectroscopic information on the object, wherein the evaluation unit is further configured for considering the at least one item of calibration information on the at least one component of the spectrometer device when evaluating the detector signal for obtaining the item of spectroscopic information.

[0094] The spectrometer may further comprise an optical system configured for modulating and / or directing the optical path of at least one of: the illumination light; the detection light. The spectrometer device may be configured for performing a method as disclosed elsewhere herein.

[0095] The light emitting element may be at least one of: a thermal radiator; a microelectromechanical system (MEMS)-based emitter; a laser, specifically a vertical cavity surface emitting laser (VCSEL), particularly emitting at least one wavelength in the infrared region; a light-emitting diode (LED), particularly o a LED emitting light that is at least partially located in the infrared spectral range and / or o a LED illuminating a phosphor for light-conversion of light generated by the LED, wherein the luminescent material generates converted light that is at least partly located in the near-infrared spectral range.

[0096] The light emitting element may be emitting visible light and / or infrared light.

[0097] The at least one detector may comprise a plurality of photosensitive elements sensitive to differing wavelength intervals. The spectrometer device may further comprise at least one wavelength-selective element, wherein the wavelength-selective element is disposed in a beam path of the illumination light. Alternatively or in addition, the wavelength-selective element is disposed in a beam path of the detection light.

[0098] As used herein, the term “wavelength-selective element” is a broad term and is to be given its ordinary and customary meaning to a person of ordinary skill in the art and is not to be limited to a special or customized meaning. The term specifically may refer, without limitation, to an arbitrary optical element which interacts with differing spectral portions of incident light in a different manner, e.g. by having at least one wavelength- dependent optical property, such as at least one wavelength-dependent optical property selected from the list consisting of a degree of reflection, a direction of reflection, a degree of refraction, a direction of refraction, an absorption, a transmission, an index of refraction.

[0099] The wavelength-selective element may be selected from the group of a tunable wavelength-selective element and a wavelength-selective element having a fixed transmission spectrum. By using a tunable wavelength selective element, as an example, differing wavelength ranges may be selected sequentially, whereas, by using a wavelength-selective element having a fixed transmission spectrum, the selection of the wavelength ranges may be fixed and may, however, be dependent e.g. on a detection position, thereby allowing, as an example, in the detection light beam path, for simultaneously exposing different photosensitive elements of the detector to differing spectral ranges of light.

[0100] The at least one the wavelength-selective element may be configured and / or arranged in a manner that at least two photosensitive elements of the plurality of photosensitive elements are each exposed to an individual spectral range of detection light from the object. Thus the at least one wavelength-selective element may comprise at least one of a filter, a grating, a prism, a plasmonic filter, a diffractive optical element and a metamaterial. More specifically, the spectrometer device may comprise at least one wavelength-selective element disposed in a beam path of the light from the object, i.e. in the beam path of the detection light, wherein the wavelength-selective element, specifically may be configured such that each of the photosensitive detectors is exposed to an individual spectral range of the light from the object. As an example, a variable wavelength-selective element may be used, the transmission of which depends on a position on the wavelength-selective element, such that, when the variable wavelength- selective element is placed on top of the array of photosensitive detectors, the individual photosensitive detectors are exposed to differing spectral ranges of the incident light, specifically the detection light from the object. Additionally or alternatively the at least one wavelength-selective element may comprise at least one of the following elements: an array of individual bandpass filters, an array of patterned filters, an MEMS- Interferometer, an MEMS-Fabry Perot interferometer. Further elements are feasible.

[0101] In a further aspect, an external device is disclosed, wherein the external device is comprising the spectrometer device. For this aspect, reference may be made to any definition, Embodiment, claim and / or aspect as disclosed herein.

[0102] In a further aspect, a computer program is disclosed wherein the computer program comprises instructions which, when the program is executed by a computer, cause the computer to perform a method as disclosed elsewhere herein, specifically the method steps performed by the evaluation unit of the spectrometer device, such as step c) and / or iv.. The computer may be an evaluation unit of a spectrometer device as disclosed elsewhere herein. For this aspect, reference may be made to any definition, Embodiment, claim and / or aspect as disclosed herein.

[0103] As used herein, the “computer program” specifically may refer to a computer software, such as an app. A computer program may comprise at least one instruction that a computer, such as a computing device, can interpret and execute.

[0104] In a further aspect, a non-transitory computer-readable storage medium is disclosed, wherein the computer-readable storage medium includes instructions that when executed by a computer, cause the computer to perform the method as disclosed elsewhere herein, specifically the method steps performed by the evaluation unit of the spectrometer device, such as step c) and / or iv.. The computer may be an evaluation unit of a spectrometer device as disclosed elsewhere herein. For this aspect, reference may be made to any definition, Embodiment, claim and / or aspect as disclosed herein.

[0105] As used herein, the “computer-readable storage medium” specifically may refer to non- transitory data storage means, such as a hardware storage medium having stored thereon computer-executable instructions. The stored computer-executable instruction may be associate with the computer program. The computer-readable data carrier or storage medium specifically may be or may comprise a storage medium such as a random-access memory (RAM) and / or a read-only memory (ROM).

[0106] As used herein, the terms “have”, “comprise” or “include” or any arbitrary grammatical variations thereof are used in a non-exclusive way. Thus, these terms may both refer to a situation in which, besides the feature introduced by these terms, no further features are present in the entity described in this context and to a situation in which one or more further features are present. As an example, the expressions “A has B”, “A comprises B” and “A includes B” may both refer to a situation in which, besides B, no other element is present in A (i.e. a situation in which A solely and exclusively consists of B) and to a situation in which, besides B, one or more further elements are present in entity A, such as element C, elements C and D or even further elements.

[0107] Further, it shall be noted that the terms “at least one”, “one or more” or similar expressions indicating that a feature or element may be present once or more than once typically are used only once when introducing the respective feature or element. In most cases, when referring to the respective feature or element, the expressions “at least one” or “one or more” are not repeated, notwithstanding the fact that the respective feature or element may be present once or more than once. Further, as used herein, the terms "preferably", "more preferably", "particularly", "more particularly", "specifically", "more specifically" or similar terms are used in conjunction with optional features, without restricting alternative possibilities. Thus, features introduced by these terms are optional features and are not intended to restrict the scope of the claims in any way. The invention may, as the skilled person will recognize, be performed by using alternative features. Similarly, features introduced by "in an embodiment of the invention" or similar expressions are intended to be optional features, without any restriction regarding alternative embodiments of the invention, without any restrictions regarding the scope of the invention and without any restriction regarding the possibility of combining the features introduced in such way with other optional or non- optional features of the invention.

[0108] The method for calibrating a spectrometer device, the method for operating a spectrometer device and the spectrometer device according to the present invention, in one or more of the above-mentioned embodiments and / or in one or more of the embodiments described in further detail below, provide a large number of advantages over known devices and methods of similar kind.

[0109] Particularly a reliable and temperature resolved in field calibration process for temperature dependent components of a spectrometer device is advantageously described.

[0110] The in-field calibration may be performed once temperature slopes occur, e.g. during a cooling-down cycle. The temperature based at least one item of calibration information, e.g. a calibration factor, may be obtained after an external device comprising the spectrometer device, such as a smartphone, is heavily used, e.g. for video gaming, high- resolution video recording and / or high-resolution rendering. Thereby, the external device may be put on a table and / or in a stand-by mode. The calibration may also be performed after the spectrometer device and / or the external device is being charged. During the cooling-down of the external device, the at least one item of calibration information may be determined, exemplary by performing a measurement and then evaluating the measurement results. Existing items of calibration information may then be updated.

[0111] Alternatively or in addition, the calibration may be performed during a heating-up cycle. The external device may heat up while it is charged. The item of calibration information may be obtained during the heating-up of the external device, particularly by performing a measurement and then evaluating the measurement results. In addition, once a turned off external device may be turned on again, it may heating-up and the item of calibration information may be obtained then, exemplary, by performing a measurement and then evaluating the measurement results. This may be particularly advantageous because hysteresis effects and / or drift effects that may occur over time may be compensated, particularly when the measurements are a single cycle.

[0112] Summarizing and without excluding further possible embodiments, the following embodiments may be envisaged:

[0113] Embodiment 1 : A method for calibrating a spectrometer device for obtaining an item of calibration information on the spectrometer device, the method comprising the following steps: a) obtaining at least one item of temperature variation information on at least one component of the spectrometer device by monitoring the temperature of the at least one component of the spectrometer device by using at least one temperature sensor of the spectrometer device; b) generating at least one item of measurement information on the spectrometer during a change of the temperature of the at least one component of the spectrometer device by using a measuring unit of the spectrometer device, wherein the change of the temperature is determined by evaluating the item of temperature variation information by using an evaluation unit of the spectrometer device; c) obtaining at least one item of calibration information on the spectrometer device by evaluating the item of measurement information on the spectrometer by further using the evaluation unit of the spectrometer device.

[0114] Embodiment 2: The method according to the preceding Embodiment, wherein the at least one item of temperature variation information comprises at least two temperatures of the at least one component of the spectrometer device for differing points in time.

[0115] Embodiment 3: The method according to any one of the preceding Embodiments, wherein the at least one item of temperature variation information comprises at least one temperature gradient of the at least one component of the spectrometer device, particularly for a specific point.

[0116] Embodiment 4: The method according to any one of the preceding Embodiments, wherein the at least one component is or comprises a detector of the spectrometer device, particularly wherein the detector is configured for detecting detection light from the object. Embodiment 5: The method according to the preceding Embodiment, wherein the at least one detector comprises a plurality of photosensitive elements sensitive to differing wavelength intervals.

[0117] Embodiment 6: The method according to any one of the two preceding

[0118] Embodiments, wherein the at least one detector is a Lead Sulfide (PbS) detector.

[0119] Embodiment 7: The method according to any one of the preceding Embodiments, wherein the at least one component is or comprises a light emitting element of the spectrometer device, particularly wherein the light emitting element is configured for emitting illumination light onto the object.

[0120] Embodiment 8: The method according to the preceding Embodiment, wherein the light emitting element is at least one of:

[0121] - a thermal radiator;

[0122] - a microelectromechanical system (MEMS)-based emitter;

[0123] - a laser, specifically a vertical cavity surface emitting laser (VCSEL), particularly emitting at least one wavelength in the infrared region;

[0124] - a light-emitting diode (LED), particularly o a LED emitting light that is at least partially located in the infrared spectral range and / or o a LED illuminating a phosphor for light-conversion of light generated by the LED, wherein the luminescent material generates converted light that is at least partly located in the near-infrared spectral range.

[0125] Embodiment 9: The method according any one of the two preceding Embodiments, wherein the light emitting element is emitting visible light and / or infrared light.

[0126] Embodiment 10: The method according to any one of the preceding Embodiments, wherein the at least one component is or comprises a component of the read-out electronics of the spectrometer device.

[0127] Embodiment 11 : The method according to the preceding Embodiment, wherein the component of the read-out electronics of the spectrometer device is or comprises at least one of:

[0128] - an voltage source configured for applying a bias voltage to the at least one detector;

[0129] - a driving unit configured for driving the light emitting element;

[0130] - a modulator configured for modulating the light emitting element;

[0131] - an amplifier,

[0132] - a skimming circuit; - an analog-to-digital converter; and

[0133] - a voltage divider, particularly having a matched load resistor.

[0134] Embodiment 12: The method according to any one of the preceding Embodiments, wherein the at least one component is or comprises an optical component of the spectrometer device.

[0135] Embodiment 13: The method according to the preceding Embodiment, wherein the optical component of the spectrometer device is or comprises at least one of:

[0136] - a wavelength-selective element;

[0137] - an optical mirror;

[0138] - an optical lens

[0139] Embodiment 14: The method according to any one of the preceding Embodiments, wherein the temperature sensor is or comprises at least one of:

[0140] - an electrical resistor, particularly a metal layer electrical resistor;

[0141] - a thermocouple;

[0142] - a Negative Temperature Coefficient (NTC) temperature sensor;

[0143] - a Positive Temperature Coefficient (NTC) temperature sensor;

[0144] - a diode;

[0145] - the light emitting element;

[0146] - the at least one detector, particularly wherein the detector has a temperature dependent performance.

[0147] Embodiment 15: The method according to any one of the preceding Embodiments, wherein the component of the spectrometer device has a temperature dependent performance.

[0148] Embodiment 16: The method according to any one of the preceding Embodiments, wherein the item of measurement information is or comprises information on the component for which the temperature is monitored.

[0149] Embodiment 17: The method according to any one of the preceding Embodiments, wherein determining if the temperature profile of the at least one component of the spectrometer device changes comprises evaluating the item of temperature variation information for obtaining a slope of the temperature of the at least one component.

[0150] Embodiment 18: The method according to any one of the preceding Embodiments, wherein generating the item of measurement information is started when at least one or any predetermined condition is met. Embodiment 19: The method according to the preceding Embodiment, wherein a first predetermined condition is that the change in the temperature of the at least one component of the spectrometer device is above or below a predetermined, particularly absolute, value.

[0151] Embodiment 20: The method according to any one of the two preceding Embodiments, wherein a second predetermined condition is that the change in the temperature is related to at least one of:

[0152] - a cooling-down of the at least one component;

[0153] - a heating-up of the at least one component.

[0154] Embodiment 21 : The method according to any one of the three preceding Embodiments, wherein a third predetermined condition is that a workload of an external component changes, wherein, for monitoring the workload of the external component, the spectrometer device comprises a connection interface.

[0155] Embodiment 22: The method according to the preceding Embodiment, wherein the external component is comprised by a device further comprising the spectrometer device.

[0156] Embodiment 23: The method according to the preceding Embodiment, wherein the device is at least one of:

[0157] - a mobile communication device;

[0158] - a wearable, such as a smart watch;

[0159] - a tablet;

[0160] - a medical mobile device, particularly free of a thermoelectric cooling (TEC);

[0161] - a computing device connected to the internet.

[0162] Embodiment 24: The method according to any one of the three preceding Embodiments, wherein the external component is or comprises at least one of:

[0163] - a processing unit;

[0164] - a graphics card;

[0165] - an image generation unit;

[0166] - a battery;

[0167] - a display.

[0168] Embodiment 25: The method according to any one of the four preceding Embodiments, wherein a fourth predetermined condition is that an external device comprising the spectrometer device is in a stand-by mode.. Embodiment 26: The method according to any one of the preceding Embodiments, wherein generating the item of measurement information is stopped when at least one or any predetermined condition is no longer met.

[0169] Embodiment 27: The method according to any one of the preceding Embodiments, wherein the least one item of measurement information is obtained in a temperature resolved manner.

[0170] Embodiment 28: The method according to any one of the preceding Embodiments, wherein the method is performed in the field, particularly generating the item of measurement information is performed in the field.

[0171] Embodiment 29: The method according to any one of the preceding Embodiments, wherein the method comprises a further step of d) updating at least one item of outdated calibration information on the spectrometer device with the obtained at least one item of calibration information on the spectrometer device.

[0172] Embodiment 30: A method for operating a spectrometer device for obtaining at least one item of spectroscopic information on at least one object, wherein the method comprises the following steps: i. obtaining an item of calibration information on the spectrometer device by performing a method for calibrating a spectrometer device according to the preceding Embodiments;

[0173] II. illuminating the object with illumination light generated by using at least one light emitting element of the spectrometer device in order to generate detection light from the at least one object; ill. detecting the detection light from the object by using at least one detector of the spectrometer device and, thereby, generating at least one detector signal; and iv. evaluating the detector signal for obtaining the item of spectroscopic information on the object by using the at least one evaluation unit of the spectrometer device, wherein at least one item of calibration information on the spectrometer device is considered when evaluating the detector signal for obtaining the item of spectroscopic information.

[0174] Embodiment 31 : A spectrometer device for obtaining at least one item of spectroscopic information on at least one object by spectroscopic measurement, wherein the spectrometer device comprises:

[0175] (1 ) at least one temperature sensor, wherein the temperature sensor is configured for obtaining at least one item of temperature variation information on at least one component of the spectrometer device by monitoring the temperature of the at least one component of the spectrometer device;

[0176] (2) at least one measuring unit, wherein the measuring unit is configured for generating at least one item of measurement information on the spectrometer during a change of the temperature of the at least one component of the spectrometer device,

[0177] (3) at least one evaluation unit, wherein the evaluation unit is configured for determining the change of the temperature by evaluating the item of temperature variation information; wherein the evaluation unit is further configured for obtaining at least one item of calibration information on the spectrometer device by evaluating the item of measurement information on the spectrometer.

[0178] Embodiment 32: The spectrometer device according to the preceding Embodiment referring to a spectrometer device, wherein the spectrometer device further comprises:

[0179] (4) at least one light emitting element, wherein the light emitting element is configured for emitting illumination light for illuminating the at least one object in order to generate detection light from the at least one object;

[0180] (5) at least one detector, wherein the detector is configured for generating at least one detector signal when receiving the detection light from the object; wherein the evaluation unit is configured for evaluating the detector signal for obtaining the item of spectroscopic information on the object, wherein the evaluation unit is further configured for considering the at least one item of calibration information on the at least one component of the spectrometer device when evaluating the detector signal for obtaining the item of spectroscopic information.

[0181] Embodiment 33: The spectrometer device according to any one of the preceding Embodiment referring to a spectrometer device, wherein the spectrometer device is configured for performing a method according to any one of the preceding method Embodiments.

[0182] Embodiment 34: The spectrometer device according to any one of the preceding Embodiment referring to a spectrometer device, wherein the light emitting element is at least one of:

[0183] - a thermal radiator;

[0184] - a microelectromechanical system (MEMS)-based emitter;

[0185] - a laser, specifically a vertical cavity surface emitting laser (VCSEL), particularly emitting at least one wavelength in the infrared region;

[0186] - a light-emitting diode (LED), particularly o a LED emitting light that is at least partially located in the infrared spectral range and / or o a LED illuminating a phosphor for light-conversion of light generated by the LED, wherein the luminescent material generates converted light that is at least partly located in the near-infrared spectral range.

[0187] Embodiment 35: The spectrometer device according to any one of the preceding referring to a spectrometer device, wherein the light emitting element is emitting visible light and / or infrared light.

[0188] Embodiment 36: The spectrometer device according to any one of the preceding Embodiments referring to a spectrometer device, wherein the at least one detector comprises a plurality of photosensitive elements sensitive to differing wavelength intervals.

[0189] Embodiment 37: The spectrometer device according to any one of the preceding Embodiments referring to a spectrometer device, wherein the spectrometer device further comprises at least one wavelength-selective element, wherein the wavelength-selective element is disposed in at least one of:

[0190] - a beam path of the illumination light; and

[0191] - a beam path of the detection light.

[0192] Embodiment 38: The spectrometer device according to the preceding Embodiment referring to a spectrometer device, wherein the at least one the wavelength-selective element is configured and / or arranged in a manner that at least two photosensitive elements of the plurality of photosensitive elements are each exposed to an individual spectral range of detection light from the object.

[0193] Embodiment 39: An external device, wherein the external device is comprising the spectrometer device according to any one of the preceding claims.

[0194] Embodiment 40: A computer program comprising instructions which, when the program is executed by a computer, cause the computer to perform the method according to any one of the method Embodiments.

[0195] Embodiment 41 : The computer program according to the preceding Embodiment, wherein the computer is an evaluation unit of a spectrometer device according to any one of the preceding Embodiments referring to the spectrometer device.

[0196] Embodiment 42: A non-transitory computer-readable storage medium, the computer- readable storage medium including instructions that when executed by a computer, cause the computer to perform the method according to any one of the method Embodiments.

[0197] Embodiment 43: The non-transitory computer-readable storage medium according to the preceding Embodiment, wherein the computer is an evaluation unit of a spectrometer device according to any one of the preceding Embodiments referring to a spectrometer device.

[0198] Brief description of the figures

[0199] Further optional details and features of the invention are evident from the description of preferred exemplary embodiments which follows in conjunction with the dependent claims. In this context, the particular features may be implemented in an isolated fashion or in combination with other features. The invention is not restricted to the exemplary embodiments. The exemplary embodiments are shown schematically in the figures. Identical reference numerals in the individual figures refer to identical elements or elements with identical function, or elements which correspond to one another with regard to their functions.

[0200] In the Figures:

[0201] Figure 1 shows an exemplary method for calibrating a spectrometer device for obtaining an item of calibration information on the spectrometer device;

[0202] Figure 2 shows an exemplary method for operating a spectrometer device for obtaining at least one item of spectroscopic information on at least one object; and

[0203] Figure 3 shows an exemplary embodiment of a spectrometer device.

[0204] Detailed description of the embodiments

[0205] Figure 1 shows an exemplary method for calibrating a spectrometer device 110 for obtaining an item of calibration information on the spectrometer device 128. The method 110 comprises the following steps: a) in a step 112, obtaining at least one item of temperature variation information on at least one component 138, 144, 146 of the spectrometer device 128 by monitoring the temperature of the at least one component 138, 144, 146 of the spectrometer device 128 by using at least one temperature sensor 132 of the spectrometer device 128; b) in a step 114, generating at least one item of measurement information on the spectrometer during a change of the temperature of the at least one component 138, 144, 146 of the spectrometer device 128 by using a measuring unit 134 of the spectrometer device 128, wherein the change of the temperature is determined by evaluating the item of temperature variation information by using an evaluation unit 136 of the spectrometer device 128, wherein the at least one item of measurement information is obtained in a temperature resolved manner, wherein the at least one item of measurement information is a measurement value generated in a measurement process; c) in a step 116, obtaining at least one item of calibration information on the spectrometer device 128 by evaluating the item of measurement information on the spectrometer by further using the evaluation unit 136 of the spectrometer device 128, wherein, for obtaining the at least one item of calibration information on the spectrometer device 128, at least one deviation between an item of reference information on a known reference value and the at least one item of measurement information is determined, wherein generating the item of measurement information is started when any predetermined condition is met, wherein a fourth predetermined condition is that an external device 156 comprising the spectrometer device 128 is in a stand-by mode.

[0206] The at least one item of temperature variation information may comprise at least two temperatures of the at least one component 138, 144, 146 of the spectrometer device 128 for differing points in time. Alternatively or in addition, the at least one item of temperature variation information may comprise at least one temperature gradient of the at least one component 138, 144, 146 of the spectrometer device 128, particularly for a specific point.

[0207] The component 138, 144, 146 of the spectrometer device 128 may have a temperature dependent performance. The item of calibration information may be or may comprise calibration information on the component 138, 144, 146 for which the temperature is monitored.

[0208] The at least one component 138, 144, 146 may be or may comprise a detector 144 of the spectrometer device 128, particularly wherein the detector 144 may be configured for detecting detection light 142 from the object 130. The at least one detector 144 may comprise a plurality of photosensitive elements 150 sensitive to differing wavelength intervals. The at least one detector 144 may be a Lead Sulfide (PbS) detector.

[0209] The at least one component 138, 144, 146 may be or may comprise a light emitting element 138 of the spectrometer device 128, particularly wherein the light emitting element 138 may be configured for emitting illumination light onto the object 130. The light emitting element 138 may be at least one of: a thermal radiator; a microelectromechanical system (MEMS)-based emitter; a laser, specifically a vertical cavity surface emitting laser (VCSEL), particularly emitting at least one wavelength in the infrared region; a light-emitting diode (LED), particularly o a LED emitting light that is at least partially located in the infrared spectral range and / or o a LED illuminating a phosphor for light-conversion of light generated by the LED, wherein the luminescent material generates converted light that is at least partly located in the near-infrared spectral range.

[0210] The light emitting element 138 may be emitting visible light and / or infrared light.

[0211] The at least one component 138, 144, 146, 147 may be or may comprise a component 138, 144, 146, 147 of the read-out electronics 146 of the spectrometer device 128. The component 138, 144, 146, 147 of the read-out electronics 146 of the spectrometer device 128 may be or may comprise at least one of: an voltage source configured for applying a bias voltage to the at least one detector 144; a driving unit configured for driving the light emitting element; a modulator configured for modulating the light emitting element; an amplifier, a skimming circuit; an analog-to-digital converter; and a voltage divider, particularly having a matched load resistor.

[0212] The at least one component 138, 144, 146, 147 may be or may comprise an optical component 147 of the spectrometer device 128. The optical component 147 of the spectrometer device 128 may be or may comprise at least one of: a wavelength-selective element 148 (depicted in the exemplary spectrometer device 128 shown in Figure 3). Alternatively or in addition, the optical component 147 of the spectrometer device 128 may be or comprises at least one of: an optical mirror; an optical lens (not depicted in the exemplary spectrometer device 128 shown in Figure 3).

[0213] The temperature sensor 132 may be or may comprise at least one of: an electrical resistor, particularly a metal layer electrical resistor; a thermocouple; a Negative Temperature Coefficient (NTC) temperature sensor; a Positive Temperature Coefficient (NTC) temperature sensor; a diode; the light emitting element; the at least one detector 144, particularly wherein the detector 144 has a temperature dependent performance. Determining if the temperature profile of the at least one component 138, 144, 146, 147 of the spectrometer device 128 changes may comprise evaluating the item of temperature variation information for obtaining a slope of the temperature of the at least one component 138, 144, 146, 147.

[0214] Generating the item of measurement information, particularly in the step 114, is started when at least one or any predetermined condition is met. A first predetermined condition may be that the change in the temperature of the at least one component 138, 144, 146, 147 of the spectrometer device 128 may be above a predetermined, particularly absolute, value.

[0215] A second predetermined condition may be that the change in the temperature is related to at least one of: a cooling-down of the at least one component 138, 144, 146, 147; a heating-up of the at least one component 138, 144, 146, 147.

[0216] A third predetermined condition may be that a workload of an external component 138, 144, 146, 147 changes. In addition, for monitoring the workload of the external component 138, 144, 146, 147, the spectrometer device 128 may comprise a connection interface.

[0217] The external component 138, 144, 146, 147 may be comprised by a device further comprising the spectrometer device 128. The device may be at least one of: a mobile communication device; a wearable, such as a smart watch; a tablet; a medical mobile device, particularly free of a thermoelectric cooling (TEC); a computing device connected to the internet.

[0218] The external component 138, 144, 146, 147 may be or may comprise at least one of: a processing unit; a graphics card; an image generation unit; a battery; a display.

[0219] A fourth predetermined condition is that an external device 156 comprising the spectrometer device 128 is in a stand-by mode. Generating the item of measurement information, particularly in the step 114, may be stopped when at least one or any predetermined condition is no longer met. The least one item of measurement information is obtained in a temperature resolved manner. The method 110 may be performed in the field. Alternatively or in addition, generating the item of measurement information, in the step 114, is performed in the field.

[0220] The method 110 may comprise a further step 117 of d) updating at least one item of outdated calibration information on the spectrometer device 128 with the, particularly in step c) 116, obtained at least one item of calibration information on the spectrometer device 128.

[0221] Figure 2 shows an exemplary method for operating a spectrometer device 118 for obtaining at least one item of spectroscopic information on at least one object 130. The method 118 comprises the following steps: i. in a step 120, obtaining an item of calibration information on the spectrometer device 128 by performing a method for calibrating a spectrometer device 110 as disclosed elsewhere herein;

[0222] II. in a step 122, illuminating the object 130 with illumination light generated by using at least one light emitting element 138 of the spectrometer device 128 in order to generate detection light 142 from the at least one object 130; ill. in a step 124, detecting the detection light 142 from the object 130 by using at least one detector 144 of the spectrometer device 128 and, thereby, generating at least one detector 144 signal; and iv. in a step 126, evaluating the detector 144 signal for obtaining the item of spectroscopic information on the object 130 by using the at least one evaluation unit 136 of the spectrometer device 128, wherein at least one item of calibration information on the spectrometer device 128 is considered when evaluating the detector 144 signal for obtaining the item of spectroscopic information.

[0223] Figure 3 shows an exemplary spectrometer device 128 for obtaining at least one item of spectroscopic information on at least one object 130 by spectroscopic measurement is disclosed. The exemplary spectrometer device 128 may be comprised by an external device 156. The spectrometer device 128 comprises:

[0224] (1 ) at least one temperature sensor 132, wherein the temperature sensor 132 is configured for obtaining at least one item of temperature variation information on at least one component 138, 144, 146, 147 of the spectrometer device 128 by monitoring the temperature of the at least one component 138, 144, 146, 147 of the spectrometer device 128;

[0225] (2) at least one measuring unit 134, wherein the measuring unit 134 is configured for generating at least one item of measurement information on the spectrometer during a change of the temperature of the at least one component 138, 144, 146, 147 of the spectrometer device 128, wherein the at least one item of measurement information is obtained in a temperature resolved manner, wherein the at least one item of measurement information is a measurement value generated in a measurement process,

[0226] (3) at least one evaluation unit 136, wherein the evaluation unit 136 is configured for determining the change of the temperature by evaluating the item of temperature variation information; wherein the evaluation unit 136 is further configured for obtaining at least one item of calibration information on the spectrometer device 128 by evaluating the item of measurement information on the spectrometer, wherein, for obtaining the at least one item of calibration information on the spectrometer device 128, at least one deviation between an item of reference information on a known reference value and the at least one item of measurement information is determined, wherein generating the item of measurement information is started when any predetermined condition is met, wherein a fourth predetermined condition is that an external device 156 comprising the spectrometer device 128 is in a stand-by mode.

[0227] The spectrometer device 128 may further comprise:

[0228] (4) at least one light emitting element 138, wherein the light emitting element 138 is configured for emitting illumination light 140 for illuminating the at least one object 130 in order to generate detection light 142 from the at least one object 130;

[0229] (5) at least one detector 144, wherein the detector 144 is configured for generating at least one detector 144 signal when receiving the detection light 142 from the object 130; wherein the evaluation unit 136 is configured for evaluating the detector 144 signal, particularly provided from the detector 144 to the evaluation unit 136 by read-out electronics 146 comprised by the spectrometer device 128, for obtaining the item of spectroscopic information on the object 130, wherein the evaluation unit 136 is further configured for considering the at least one item of calibration information on the at least one component 138, 144, 146, 147 of the spectrometer device 128 when evaluating the detector 144 signal for obtaining the item of spectroscopic information. The spectrometer device 128 may be configured for performing a method 110, 118 as disclosed elsewhere herein.

[0230] As may be exemplarily derived from Fig. 3, at least one of: the at least one temperature sensor 132, the at least one measuring unit 134 may be connected to the at least one evaluation unit 136 for providing at least one respective measurement signal to the at least one evaluation unit 136. Exemplarily, the connection may be implemented by using wires 152. As may further be exemplarily derived from Fig. 3, at least one of: the at least one temperature sensor 132, the at least one measuring unit 134 may be connected to the at least one component 138, 144, 146, 147. In Figure 3 the temperature sensor 132 is thermally connected to the light emitting element 138 for performing at least one respective temperature measurement on the component 138. Alternatively or in addition, the temperature sensor may be thermally connected to a different component 144, 146, 147 for performing at least one respective measurement on the respective component 144, 146, 147. Exemplarily, the connection may be implemented by using wires 154. There may be further ways to determine the temperature of a component, e.g. by monitoring a temperature dependent characteristic of the component, in this case the respective component may be considered as a temperature sensor. Alternatively, the temperature of the light emitting element 138 may be obtained by evaluating a forward voltage used for driving a light emitting diode of the light emitting element 138.There may be further implementations.

[0231] The light emitting element 138 may be at least one of: a thermal radiator; a microelectromechanical system (MEMS)-based emitter; a laser, specifically a vertical cavity surface emitting laser (VCSEL), particularly emitting at least one wavelength in the infrared region; a light-emitting diode (LED), particularly o a LED emitting light that is at least partially located in the infrared spectral range and / or o a LED illuminating a phosphor for light-conversion of light generated by the LED, wherein the luminescent material generates converted light that is at least partly located in the near-infrared spectral range.

[0232] The light emitting element 138 may be emitting visible light and / or infrared light.

[0233] The at least one detector 144 may comprise a plurality of photosensitive elements 150 150 sensitive to differing wavelength intervals.

[0234] The spectrometer device 128 may further comprise at least one wavelength-selective element 148, wherein the wavelength-selective element 148 is disposed in at least one of: a beam path of the illumination light; and a beam path of the detection light 142.

[0235] The at least one the wavelength-selective element 148 may be configured and / or arranged in a manner that at least two photosensitive elements 150 of the plurality of photosensitive elements 150 are each exposed to an individual spectral range of detection light 142 from the object 130. In a further aspect, a computer program is disclosed (not depicted) wherein the computer program comprises instructions which, when the program is executed by a computer, cause the computer to perform a method as disclosed elsewhere herein. The computer may be an evaluation unit 136 of a spectrometer device 128 as disclosed elsewhere herein.

[0236] In a further aspect, a non-transitory computer-readable storage medium is disclosed (not depicted), wherein the computer-readable storage medium includes instructions that when executed by a computer, cause the computer to perform the method as disclosed elsewhere herein. The computer may be an evaluation unit 136 of spectrometer device 128 as disclosed elsewhere herein.

[0237] List of reference numbers

[0238] 110 method for calibrating a spectrometer device

[0239] 112 step a): obtaining at least one item of temperature

[0240] 114 step b): generating at least one item of measurement information

[0241] 116 step c): obtaining at least one item of calibration information

[0242] 117 step d): updating at least one item of outdated calibration information

[0243] 118 method for operating a spectrometer device

[0244] 120 step i): obtaining an item of calibration information

[0245] 122 step ii): illuminating the object with illumination light

[0246] 124 step iii): detecting the detection light from the object

[0247] 126 step iv): obtaining the item of spectroscopic information on the object

[0248] 128 spectrometer device

[0249] 130 object

[0250] 132 temperature sensor

[0251] 134 measuring unit

[0252] 136 evaluation unit

[0253] 138 light emitting element

[0254] 140 illumination light

[0255] 142 detection light

[0256] 144 detector

[0257] 146 read-out electronics

[0258] 147 optical component

[0259] 148 wavelength-selective element

[0260] 150 photosensitive element

[0261] 152 wires

[0262] 154 further wires 156 external device

Claims

Claims1 . A method for calibrating a spectrometer device (110) for obtaining an item of calibration information on the spectrometer device (128), the method comprising the following steps: a) obtaining at least one item of temperature variation information on at least one component of the spectrometer device (128) by monitoring the temperature of the at least one component of the spectrometer device (128) by using at least one temperature sensor (132) of the spectrometer device (128); b) generating at least one item of measurement information on the spectrometer during a change of the temperature of the at least one component of the spectrometer device (128) by using a measuring unit (134) of the spectrometer device (128), wherein the at least one item of measurement information is obtained in a temperature resolved manner, wherein the at least one item of measurement information is a measurement value generated in a measurement process, wherein the change of the temperature is determined by evaluating the item of temperature variation information by using an evaluation unit (136) of the spectrometer device (128); c) obtaining at least one item of calibration information on the spectrometer device (128) by evaluating the item of measurement information on the spectrometer by further using the evaluation unit (136) of the spectrometer device (128), wherein, for obtaining the at least one item of calibration information on the spectrometer device (128), at least one deviation between an item of reference information on a known reference value and the at least one item of measurement information is determined, wherein generating the item of measurement information is started when any predetermined condition is met, wherein a fourth predetermined condition is that an external device (156) comprising the spectrometer device (128) is in a stand-by mode.

2. The method (110) according to the preceding claim, wherein the at least one item of temperature variation information comprises at least two temperatures of the at least one component of the spectrometer device (128) for differing points in time.

3. The method (110) according to any one of the preceding claims, wherein the at least one component is or comprises at least one of:- a light emitting element (138) of the spectrometer device (128), wherein the light emitting element (138) is configured for emitting illumination light (140) onto the object (130);- a detector (144) of the spectrometer device (128), wherein the detector (144) is configured for detecting detection light (142) from the object (130); and- a component of the read-out electronics (146) of the spectrometer device (128);- an optical component (147) of the spectrometer device (128).

4. The method (110) according to any one of the preceding claims, wherein a first predetermined condition is that the change in the temperature of the at least one component of the spectrometer device (128) is above or below a predetermined value.

5. The method (110) according to any one of the preceding claims, wherein a second predetermined condition is that the change in the temperature is related to at least one of:- a cooling-down of the at least one component;- a heating-up of the at least one component.

6. The method (110) according to any one of the preceding claims, wherein a third predetermined condition is that a workload of an external component changes, wherein, for monitoring the workload of the external component, the spectrometer device (128) comprises a connection interface.

7. The method (110) according to any one of the preceding claims, wherein generating the item of measurement information is stopped when at least one or any predetermined condition is no longer met.

8. The method (110) according to any one of the preceding claims, wherein generating the item of measurement information is performed in the field.

9. A method (118) for operating a spectrometer device (128) for obtaining at least one item of spectroscopic information on at least one object (130), wherein the method comprises the following steps: i. obtaining an item of calibration information on the spectrometer device (128) by performing a method for calibrating a spectrometer device (110) according to the preceding claims;II. illuminating the object (130) with illumination light (140) generated by using at least one light emitting element (138) of the spectrometer device (128) in order to generate detection light (142) from the at least one object (130); ill. detecting the detection light (142) from the object (130) by using at least one detector (144) of the spectrometer device (128) and, thereby, generating at least one detector (144) signal; andiv. evaluating the detector (144) signal for obtaining the item of spectroscopic information on the object (130) by using the at least one evaluation unit (136) of the spectrometer device (128), wherein at least one item of calibration information on the spectrometer device (128) is considered when evaluating the detector signal for obtaining the item of spectroscopic information.

10. A spectrometer device (128) for obtaining at least one item of spectroscopic information on at least one object (130) by spectroscopic measurement, wherein the spectrometer device (128) comprises:(1) at least one temperature sensor (132), wherein the temperature sensor (132) is configured for obtaining at least one item of temperature variation information on at least one component of the spectrometer device (128) by monitoring the temperature of the at least one component of the spectrometer device (128);(2) at least one measuring unit (134), wherein the measuring unit (134) is configured for generating at least one item of measurement information on the spectrometer during a change of the temperature of the at least one component of the spectrometer device (128), wherein the at least one item of measurement information is obtained in a temperature resolved manner, wherein the at least one item of measurement information is a measurement value generated in a measurement process,(3) at least one evaluation unit (136), wherein the evaluation unit (136) is configured for determining the change of the temperature by evaluating the item of temperature variation information; wherein the evaluation unit (136) is further configured for obtaining at least one item of calibration information on the spectrometer device (128) by evaluating the item of measurement information on the spectrometer, wherein, for obtaining the at least one item of calibration information on the spectrometer device (128), at least one deviation between an item of reference information on a known reference value and the at least one item of measurement information is determined, wherein generating the item of measurement information is started when any predetermined condition is met, wherein a fourth predetermined condition is that an external device (156) comprising the spectrometer device (128) is in a stand-by mode.

11. An external device (156), wherein the external device (156) is comprising the spectrometer device (128) according to the preceding claim.

12. A computer program comprising instructions which, when the program is executed by a computer, cause the computer to perform the method according to any one of the method claims, wherein the computer is the evaluation unit (136) of thespectrometer device (128) according to any one of the preceding claims referring to the spectrometer device (128).

13. A non-transitory computer-readable storage medium, the computer-readable storage medium including instructions that when executed by a computer, cause the computer to perform the method according to any one of the method claims, wherein the computer is the evaluation unit (136) of the spectrometer device (128) according to any one of the preceding claims referring to a spectrometer device (128).

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