4results about How to "Short marking time" patented technology

The invention discloses a crossing intention judgment method, a medium, equipment and a vehicle. The crossing intention judgment method comprises the following steps: constructing a data set by using a vulnerable road user crossing positive example meeting a first preset condition and a vulnerable road user crossing negative example meeting a second preset condition; wherein the first preset condition is that the vulnerable road user has a passing behavior in front of the vehicle in the region of interest of the vehicle in the future preset time; the second preset condition is that the vulnerable road user is in the region of interest of the vehicle and has a passing behavior behind the vehicle in the future preset time; training a preset dichotomy model by adopting the data set, wherein the dichotomy model is built based on a deep learning model; and deploying the trained dichotomy model to the automatic driving system so as to judge the crossing intention of the vulnerable road user. Through the above mode, the judgment accuracy of the crossing intention of the vulnerable road user can be improved, and then the safety and comfort of passengers are improved.

The utility model belongs to a gauge for marking bad positions on the back of a wafer, which relates to the field of semiconductor integrated circuit manufacture and comprises an upper handle, a lower handle and a connecting ring, the upper handle and the lower handle are symmetrically provided with an upper handle gauge angle and a lower handle gauge angle, the length of the gauge angles is 3 / 4 of the diameter of a silicon wafer, and the upper handle gauge angle and the lower handle gauge angle are symmetrical in size. The front end of the upper handle compass angle and the front end of the lower handle compass angle are triangular, a marking head used for marking is arranged in the upper handle compass angle, an upper handle sleeve is arranged below the upper handle, and when the silicon wafer back metal defect area clamping device is used, the pressing cap is manually controlled, the upper handle sleeve of the upper handle is moved, the marking head is exposed, and a silicon wafer back metal defect area is horizontally clamped. And marking is correspondingly completed on the front surface of the silicon wafer, so that the positions of the bad core particles can be accurately marked, and the problems of inaccurate marking of the bad core particles, influence on production efficiency in the marking process and resource waste in the prior art are solved.

The invention relates to the technical field of radiopharmaceuticals and medical imaging, in particular to an STING-targeted precursor compound, a nuclide marker, a preparation method and application of the STING-targeted precursor compound, a nuclide marker, a pharmaceutical composition and application of the pharmaceutical composition. The STING targeting precursor compound, the pharmaceutically acceptable form of the STING targeting precursor compound, the nuclide marker of the STING targeting precursor compound and the pharmaceutically acceptable form of the STING targeting precursor compound have excellent in-vivo biological performance, can have high specific uptake in tumors or inflammations with high expression of interferon stimulating factors STING, has a high target-to-non-target ratio, and can be used for preparing the target-to-non-target tumor marker of the STING targeting precursor compound and the nuclide marker of the STING targeting precursor compound and the pharmaceutically acceptable form of the STING targeting precursor compound and the nuclide marker of the STING targeting precursor compound. And the non-specific background is low, and unnecessary radioactive injury can be reduced by lower non-target visceral organ uptake, so that the medication safety is high.