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System and method for projection reconstruction

A technology for projecting and projecting images, which is applied in the field of three-dimensional image reconstruction and can solve the problems of background light interference and high equipment requirements.

Active Publication Date: 2013-01-23
SHENZHEN TAISHAN SPORTS TECH CO LTD
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  • Abstract
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AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a method that can be used according to It is necessary to control the specular reflection device, thereby generating a structured light pattern suitable for the measurement object, and synchronously controlling the system and method for the projection reconstruction of the repeated exposure of the image sensor to the required area

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Embodiment Construction

[0031] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0032] see figure 1 , is the optical path diagram of the projection reconstruction system according to the preferred embodiment of the present invention. like figure 1 As shown, the projection reconstruction system provided by this embodiment mainly includes a projection unit 10 , an image sensor 20 , a data processing unit 30 and a synchronization control unit 40 .

[0033] The projection unit 10 includes a light source 11 and a specular reflection device 12 . The light source of this solution is preferably a semiconductor laser diode.

[0034]The mirror reflection device 12 can be controlled by the synchronous control unit 40 to reflect the light emitted by the light source 11 to the target area to form a preset structured light pattern. Pref...

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Abstract

The invention relates to a system and a method for projection reconstruction. The system comprises a projection unit, an image sensor, a synchronous control unit and a data processing unit, wherein the projection unit comprises a light source and a specular reflection device and is used for forming a preset structured light pattern in a target region, and the image sensor is used for carrying outgradual exposure to shoot a projection image of the structured light pattern in at least part of the region; the synchronous control unit is used for controlling the image sensor to realize that at least part of an exposure region of a continuous two-small-frame image is overlapped, and the overlapped part and the projection region of structured light reflected by the specular reflection device synchronize; and the data processing unit receives multi-small-frame image in real time and carried out differential processing of the multi-small-frame image in the projection image and then obtains aprojection image without background light, and calculates three-dimensional (3D) point cloud data. According to needs, the preset structured light pattern can be projected in the target region, and the image sensor is controlled to carry out offset exposure so as to remove the background light to improve accuracy, and thus the three-dimensional depth data of an object in the target region to achieve the projection reconstruction.

Description

technical field [0001] The present invention relates to a three-dimensional image reconstruction technology, more specifically, to a projection reconstruction system and method. Background technique [0002] Point cloud data is the points obtained by direct sampling of object surface projection by 3D scanning equipment. These points are the initial and most direct representation of 3D model projection. By analyzing the point cloud data, the geometric projection of the model can be reconstructed. [0003] There are many ways to acquire object point clouds. Common methods include using structured light image information to acquire point cloud data, and binocular visible light image information to acquire data. Existing speckle-based method for 3D reconstruction of speckle structured light projected, the speckle pattern is fixed in the pattern generator and does not change, the image sensor must scan to the target area where the entire speckle pattern is located, in order to o...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T17/00G02B26/08G03B21/28
Inventor 陈光吴迪谢琪师丹玮陈俊赵勇胜黄永春黄国君
Owner SHENZHEN TAISHAN SPORTS TECH CO LTD
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