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Test circuit board and method of operation thereof

An operation method and circuit board technology, applied in the direction of measuring electricity, measuring electrical variables, and electronic circuit testing, etc., can solve the problems of misjudgment by the test machine, increasing the loss rate of line 12, and misjudging the test results of the test machine. The effect of reducing the loss rate and avoiding misjudgment of test results

Active Publication Date: 2022-01-14
SV PROBE PTE LTD
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Problems solved by technology

[0005] However, when the existing probe card 1 performs high-frequency test signal operations, the bandwidth of the relay 11 is too small (at most 4GHz (8Gbps)), which makes it difficult to transmit high-frequency test signals, thereby causing the test machine The platform is prone to misjudgment of test results
[0006] In addition, because the high-frequency test signal path L2 for transmitting the high-frequency test signal is long (via the probe 100 of the substrate 10, the relay 11 and the line 12), a relatively large impedance value is generated on the high-frequency test signal path L2 , thus increasing the loss rate of the line 12, and also making the test machine prone to misjudgment of test results

Method used

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  • Test circuit board and method of operation thereof
  • Test circuit board and method of operation thereof
  • Test circuit board and method of operation thereof

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[0034] The implementation of the present invention will be described below with reference to specific examples, and those skilled in the art can easily understand other advantages and technical effects of the present invention from the contents disclosed in this specification.

[0035] It should be noted that the structures, proportions, sizes, etc. shown in the drawings of this specification are only used to cooperate with the content disclosed in the specification for the understanding and reading of those skilled in the art, and are not used to limit the implementation of the present invention. , so it has no technical substantive meaning, and any modification of structure, change of proportional relationship or adjustment of size shall still fall within the scope of the present invention without affecting the technical effect and the achievable purpose of the present invention. The disclosed technical content must be within the scope covered. At the same time, terms such a...

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Abstract

A circuit board for testing and its operation method, by disposing a relay on the circuit board body with probes, and disposing at least one external wire between the probes and the relay, so that when performing high-frequency test signal operations, The transmission path of the high-frequency test signal passes through the external wire to a test machine instead of passing through the relay to the test machine, so as to avoid being limited by the bandwidth condition of the relay.

Description

technical field [0001] The invention relates to an electrical property detection device, in particular to a circuit board used for electrical property detection. Background technique [0002] The traditional probe card uses its probes to touch the signal contacts of the chip to test whether the circuit of the chip is normal. [0003] With the advancement of digital technology, the computing speed of the chip to be tested and the amount of signal transmission per second are also increasing, so that the frequency of the test signal generated by the traditional probe card cannot meet the high frequency test signal required by the chip to be tested. For this reason, the industry achieves the purpose of high-frequency testing through the relay (Relay) configured on the probe card. The types of the relay include such as electromagnetic mechanical relay (Electro-mechanical A reed relay and a semiconductor relay, wherein the semiconductor relay has the smallest volume and the lowes...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/2851
Inventor 曾胜煜巫政毅
Owner SV PROBE PTE LTD
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