High and low temperature ventilation aging test device, gas temperature control and ventilation method and test method thereof

Abstract

The invention relates to the technical field of testing equipment, in particular to a high and low temperature ventilation aging testing device, a gas temperature control and ventilation method and a testing method.The high and low temperature ventilation aging testing device comprises a testing cabinet, a heat preservation testing bin and a high and low temperature gas adding cabinet, the heat preservation test bin is used for bearing a tested piece, the high-low temperature gas filling cabinet is located on one side of the test cabinet, when the heat preservation test bin is communicated with the high-low temperature gas filling cabinet, the heat preservation test bin is used for controlling the temperature in the high-low temperature gas filling cabinet, and when the temperature in the high-low temperature gas filling cabinet meets the test requirement, the heat preservation test bin is used for controlling the temperature in the high-low temperature gas filling cabinet. And the thermal insulation test bin can carry out aging test on the tested piece. Through the high-low temperature gas filling cabinet, the whole high-low temperature ventilation aging test device can automatically adjust the temperature in the heat preservation test bin according to the test requirements of different tested pieces, rapid switching from high temperature to low temperature and from low temperature to high temperature is achieved, and high-temperature ventilation aging test and low-temperature ventilation aging test can be compatible at the same time.

Description

Technical Field

[0001] The present invention relates to the technical field of testing equipment, and in particular to a high and low temperature ventilation aging testing device, a gas temperature control and ventilation method and a testing method thereof. Background Art

[0002] High and low temperature ventilation aging test is an indispensable part of gas sensor performance testing. At present, the high and low temperature ventilation test process of gas sensors needs to be divided into two equipment and two stages. Among them: low temperature test means: putting the tested piece into the refrigerator and wait for the temperature to drop to the specified low temperature before taking it out for ventilation test; high temperature test means: putting the tested piece into the oven and wait for the temperature to rise to the specified high temperature before taking it out for ventilation test. During the test, the tested piece will have heat exchange with the environment, causing the temperature of the tested piece to change. It cannot be tested under the specified temperature environment, and it cannot truly simulate the impact of complex test environment on product performance. Existing gas aging equipment has poor compatibility and cannot be compatible with the testing of multiple products. Summary of the invention

[0003] The technical problem to be solved by the present invention is: in order to solve the technical problem of poor compatibility of existing high and low temperature ventilation aging test devices, the present invention provides a high and low temperature ventilation aging test device, a gas temperature control and ventilation method and a testing method thereof. By improving the ventilation aging test device, it can be compatible with high temperature ventilation aging test and low temperature ventilation aging test at the same time.

[0004] The technical solution adopted by the present invention to solve its technical problem is: a high and low temperature ventilation aging test device, comprising: a test cabinet, an insulation test chamber and a high and low temperature gas cabinet, the insulation test chamber is installed in the test cabinet, the insulation test chamber is used to carry the test piece, the high and low temperature gas cabinet is located on one side of the test cabinet, when the insulation test chamber is connected to the high and low temperature gas cabinet, the insulation test chamber is used to control the temperature inside the high and low temperature gas cabinet, and when the temperature inside the high and low temperature gas cabinet meets the test requirements, the insulation test chamber can perform aging test on the test piece.

[0005] Therefore, through the high and low temperature gas cabinet, the entire high and low temperature ventilation aging test device can automatically adjust the temperature in the insulation test chamber according to the test requirements of different test pieces, so as to realize rapid switching from high temperature to low temperature or low temperature to high temperature, and can be compatible with high temperature ventilation aging test and low temperature ventilation aging test at the same time, and can reduce energy loss and unnecessary transportation; at the same time, through the high and low temperature gas cabinet, the temperature of the insulation test chamber can be kept constant during the test process to improve the accuracy of the test results.

[0006] Furthermore, a heat preservation layer is provided on the top of the heat preservation test chamber; two first probes and two pneumatic quick-connect joints are provided on one side of the heat preservation test chamber, and a handle is provided on the other side of the heat preservation test chamber; a temperature sensor is provided inside the heat preservation test chamber; wherein: the tested object is located inside the heat preservation test chamber. Thus, the heat preservation layer can reduce the temperature dissipation of the heat preservation test chamber, thereby further improving the accuracy of the test result; the temperature sensor can realize real-time feedback and control of the temperature.

[0007] Furthermore, a high and low temperature part, an air intake valve and an exhaust valve are provided inside the high and low temperature gas filling cabinet, the gas cylinder is connected with the inlet end of the air intake valve, the outlet end of the air intake valve is connected with the inlet end of the high and low temperature part, the outlet end of the high and low temperature part is connected with one of the pneumatic quick connect joints, the other pneumatic quick connect joint is connected with the inlet end of the exhaust valve, and the outlet end of the exhaust valve is connected with the atmosphere.

[0008] Furthermore, it also includes: a first three-way joint, a first port of the first three-way joint is connected to the inlet end of the high and low temperature part, and a second port of the first three-way joint is connected to the outlet end of the intake valve.

[0009] Furthermore, it also includes: a second three-way joint, the first port of the second three-way joint is connected to another of the pneumatic quick-connect joints, the second port of the second three-way joint is connected to the third port of the first three-way joint, and the third port of the second three-way joint is connected to the inlet end of the exhaust valve.

[0010] Furthermore, a first solenoid valve is connected in series between the outlet end of the high and low temperature gas filling cabinet and one of the pneumatic quick-connect joints, and a second solenoid valve is connected in series between the other pneumatic quick-connect joint and the first port of the second three-way joint. Thus, the mutual cooperation of the inlet valve, the exhaust valve, the first three-way joint, the second three-way joint, the first solenoid valve and the second solenoid valve can realize the discharge of the gas in the thermal insulation test chamber and the internal circulation of the gas between the thermal insulation test chamber and the high and low temperature parts.

[0011] Furthermore, it also includes: an automatic positioning and power-on component, which is used to realize automatic point-to-point power-on of the test cabinet.

[0012] Furthermore, the automatic positioning and energizing component includes: a vertical ejector, a first spring, a horizontal ejector, a second spring, a fixed plate, a conductive block, an insulating layer, and a second probe, wherein the vertical ejector is mounted on the fixed plate through the first spring so that the vertical ejector can move along the Z-axis direction, the horizontal ejector is mounted on the fixed plate through the second spring, and the vertical ejector abuts against the horizontal ejector so that the horizontal ejector can move along the X-axis direction, the conductive block is connected to the fixed plate, the insulating layer is connected to the horizontal ejector, and the second probe is connected to the test cabinet. Thus, when the test cabinet is transported to the designated position, the test cabinet moves downward under the action of gravity to push the horizontal ejector to move in the X-axis direction toward the side away from the vertical ejector, driving the insulating layer to move in the X-axis direction toward the side away from the vertical ejector, and the second probe moves downward as the test cabinet moves downward, and finally the second probe is connected to the conductive block to realize automatic point-to-point energization of the test cabinet.

[0013] A gas temperature control and ventilation method for a high and low temperature ventilation aging test device, comprising the following steps:

[0014] S1. Test preparation;

[0015] S2. Installation and calibration of thermal insulation test chamber and high and low temperature gas filling cabinet;

[0016] S3, setting the temperature of the high and low temperature gas filling cabinet;

[0017] S4, start test data;

[0018] S5, ventilation control;

[0019] S6. Collect test data and monitor the test process in real time;

[0020] S7, interrupt the test and handle the test exception.

[0021] A test method for gas temperature control and ventilation method of a high and low temperature ventilation aging test device, the following steps:

[0022] Sa. Transport the test cabinet to the designated location through AGV, and install the thermal insulation test chamber and high and low temperature gas cabinet;

[0023] Sb, start ventilation;

[0024] Sc, determine whether the test environment inside the high and low temperature gas filling cabinet meets the test requirements. If not, return to step Sb until the test requirements are met. If so, execute step Sd;

[0025] Sd, internal circulation of the gas in the thermal insulation test chamber and the high and low temperature gas filling cabinet;

[0026] Se, perform aging test on the tested parts in the high and low temperature gas filling cabinet;

[0027] Sf. After the aging test is completed, the gas in the high and low temperature gas cabinet is discharged, and the tested parts are taken out after the test.

[0028] Compared with the prior art, the present invention has the following beneficial effects:

[0029] The high and low temperature gas cabinet enables the entire high and low temperature ventilation aging test device to automatically adjust the temperature in the insulation test chamber according to the test requirements of different test pieces, so as to achieve rapid switching from high temperature to low temperature or low temperature to high temperature, and can be compatible with high temperature ventilation aging test and low temperature ventilation aging test at the same time, and can reduce energy loss and unnecessary handling; at the same time, the high and low temperature gas cabinet can make the temperature of the insulation test chamber constant during the test process, so as to improve the accuracy of the test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] The present invention is further described below in conjunction with the accompanying drawings and embodiments.

[0031] Figure 1 It is a structural schematic diagram of the high and low temperature ventilation aging test device of the present invention in an open state;

[0032] Figure 2 It is a structural schematic diagram of the high and low temperature ventilation aging test device of the present invention in a closed state;

[0033] Figure 3 It is a structural schematic diagram of the heat preservation test chamber of the present invention;

[0034] Figure 4 The electrical diagram of the test cabinet, the heat preservation test chamber and the high and low temperature gas filling cabinet of the present invention;

[0035] Figure 5 The electrical diagram of the heat preservation test chamber and the high and low temperature gas filling cabinet of the present invention;

[0036] Figure 6 It is a structural schematic diagram of the automatic positioning energizing component of the present invention;

[0037] Figure 7 A flow chart of the gas temperature control and ventilation method of the high and low temperature ventilation aging test device of the invention;

[0038] Figure 8 The present invention is a flow chart of a test method for gas temperature control and ventilation method of a high and low temperature ventilation aging test device.

[0039] In the figure: 1. test cabinet; 2. insulation test chamber; 201. insulation layer; 202. first probe; 203. pneumatic quick connect joint; 204. handle; 3. high and low temperature gas filling cabinet; 301. high and low temperature part; 302. air inlet valve; 303. exhaust valve; 4. first three-way joint; 5. second three-way joint; 6. first solenoid valve; 7. second solenoid valve; 8. automatic positioning power-on component; 801. vertical ejector pin; 802. first spring; 803. horizontal ejector pin; 804. second spring; 805. fixing plate; 806. conductive block; 807. insulating layer; 808. second probe. DETAILED DESCRIPTION

[0040] The present invention will now be described in further detail with reference to the accompanying drawings. These drawings are simplified schematic diagrams, which only illustrate the basic structure of the present invention in a schematic manner, and therefore only show the components related to the present invention.

[0041] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention. In addition, features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, unless otherwise specified, "multiple" means two or more.

[0042] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0043] like Figures 1 to 6As shown, it is the best embodiment of the present invention. The high and low temperature ventilation aging test device of this embodiment includes: a test cabinet 1, an insulation test chamber 2 and a high and low temperature gas cabinet 3. The insulation test chamber 2 is installed in the test cabinet 1. The insulation test chamber 2 is used to carry the test piece. The high and low temperature gas cabinet 3 is located on one side of the test cabinet 1. When the insulation test chamber 2 is connected to the high and low temperature gas cabinet 3, the insulation test chamber 2 is used to control the temperature inside the high and low temperature gas cabinet 3, and when the temperature inside the high and low temperature gas cabinet 3 meets the test requirements, the insulation test chamber 2 can perform aging test on the test piece. Therefore, through the high and low temperature gas cabinet 3, the entire high and low temperature ventilation aging test device can automatically adjust the temperature in the insulation test chamber 2 according to the test requirements of different test pieces, so as to realize the rapid switching from high temperature to low temperature or from low temperature to high temperature, and can be compatible with high temperature ventilation aging test and low temperature ventilation aging test at the same time, and can reduce energy loss and unnecessary handling; at the same time, through the high and low temperature gas cabinet 3, the temperature of the insulation test chamber 2 can be constant during the test process to improve the accuracy of the test results.

[0044] It should be noted that the high-temperature aging test and the low-temperature aging test of the tested component can be achieved by replacing the gas test environment of the heat-insulating test chamber 2 .

[0045] In this embodiment, a heat preservation layer 201 is provided on the top of the heat preservation test chamber 2; two first probes 202 and two pneumatic quick-connect joints 203 are provided on one side of the heat preservation test chamber 2, and a handle 204 is provided on the other side of the heat preservation test chamber 2; a temperature sensor is provided inside the heat preservation test chamber 2; wherein: the tested object is located inside the heat preservation test chamber 2. Therefore, the heat preservation layer 201 can reduce the temperature dissipation of the heat preservation test chamber 2, thereby further improving the accuracy of the test result; the temperature sensor can realize real-time feedback and control of the temperature.

[0046] In this embodiment, the interior of the high and low temperature gas filling cabinet 3 is provided with a high and low temperature part 301, an air intake valve 302 and an exhaust valve 303, the gas cylinder is connected with the inlet end of the air intake valve 302, the outlet end of the air intake valve 302 is connected with the inlet end of the high and low temperature part 301, the outlet end of the high and low temperature part 301 is connected with a pneumatic quick connect joint 203, another pneumatic quick connect joint 203 is connected with the inlet end of the exhaust valve 303, and the outlet end of the exhaust valve 303 is connected with the atmosphere.

[0047] In this embodiment, it also includes: a first three-way joint 4 and a second three-way joint 5, the first port of the first three-way joint 4 is connected to the inlet end of the high and low temperature part 301, the second port of the first three-way joint 4 is connected to the outlet end of the intake valve 302, the first port of the second three-way joint 5 is connected to another pneumatic quick-connect joint 203, the second port of the second three-way joint 5 is connected to the third port of the first three-way joint 4, and the third port of the second three-way joint 5 is connected to the inlet end of the exhaust valve 303.

[0048] In this embodiment, a first solenoid valve 6 is connected in series between the outlet end of the high and low temperature gas filling cabinet 3 and a pneumatic quick-connect joint 203, and a second solenoid valve 7 is connected in series between another pneumatic quick-connect joint 203 and the first port of the second three-way joint 5. Thus, the mutual cooperation of the inlet valve 302, the exhaust valve 303, the first three-way joint 4, the second three-way joint 5, the first solenoid valve 6 and the second solenoid valve 7 can realize the discharge of the gas in the thermal insulation test chamber 2 and the internal circulation of the gas between the thermal insulation test chamber and the high and low temperature part 301.

[0049] Specifically, a pump is arranged between the first solenoid valve 6 and the first three-way joint 4, and between the second solenoid valve 7 and the second three-way joint 5, and the pump is used as a power source to realize gas transportation; before the test (a test environment needs to be built, that is, the gas in the insulation test chamber 2 needs to be discharged): at this time, the air inlet valve 302, the exhaust valve 303, the first solenoid valve 6, the second solenoid valve 7 and the pump are opened, and the third port of the first three-way joint 4 and the second port of the second three-way joint 5 are closed (that is, the two ports are not conductive). At this time, the gas in the gas cylinder passes through the high and low temperature part 301 and the insulation test chamber 2 in turn, and is finally discharged through the exhaust valve 303. In this way, the gas in the insulation test chamber 2 can be discharged, and the interior of the insulation test chamber 2 is filled with the gas required for the aging test; during the test (the gas required in the insulation test chamber 2 circulates between the insulation test chamber 2 and the high and low temperature part 301. The purpose of this is to avoid the gas Waste and ensure that the test temperature of the insulation test chamber 2 remains stable), at this time, close the air inlet valve 302 and the exhaust valve 303, and make the third port of the first three-way joint 4 and the second port of the second three-way joint 5 in a conductive state, at this time, the gas circulates between the insulation test chamber 2 and the high and low temperature part 301; after the test (the gas required for the aging test needs to be replaced), at this time, open the air inlet valve 302, the exhaust valve 303, the first solenoid valve 6, the second solenoid valve 7 and the pump, and make the third port of the first three-way joint 4 and the second port of the second three-way joint 5 in a closed state (that is, the two ports are not conductive), at this time, the gas in the gas cylinder passes through the high and low temperature part 301 and the insulation test chamber 2 in turn, and is finally discharged through the exhaust valve 303, so that the gas in the insulation test chamber 2 can be discharged, and the interior of the insulation test chamber 2 is filled with protective gas (for example: nitrogen) to protect the test piece.

[0050] In this embodiment, it also includes: an automatic positioning and power-on component 8, which is used to realize automatic point power-on of the test cabinet 1; the automatic positioning and power-on component 8 includes: a vertical ejector 801, a first spring 802, a horizontal ejector 803, a second spring 804, a fixed plate 805, a conductive block 806, an insulating layer 807 and a second probe 808, the vertical ejector 801 is installed on the fixed plate 805 through the first spring 802, so that the vertical ejector 801 can move along the Z-axis direction, the horizontal ejector 803 is installed on the fixed plate 805 through the second spring 804, and the vertical ejector 801 is abutted against the horizontal ejector 803, so that the horizontal ejector 803 can move along the X-axis direction, the conductive block 806 is connected to the horizontal ejector 803, the insulating layer 807 is connected to the fixed plate 805, and the second probe 808 is connected to the test cabinet 1. Therefore, when the test cabinet 1 is transported to the designated position, the test cabinet 1 moves downward under the action of gravity to push the horizontal ejector pin 803 to move in the X-axis direction toward the side away from the vertical ejector pin 801, driving the insulating layer 807 to move in the X-axis direction toward the side away from the vertical ejector pin 801, and the second probe 808 moves downward as the test cabinet 1 moves downward, and finally the second probe 808 is connected to the conductive block 806 to realize automatic point-to-point power-on of the test cabinet 1.

[0051] It should be noted that: there are multiple insulation test chambers 2, which can simultaneously realize aging tests on multiple test pieces. At the same time, through AGV transportation and workshop MES docking, during the test process, the MES system can monitor the test progress and test results in real time, and adjust and optimize the test equipment as needed to realize intelligent production.

[0052] like Figure 7 As shown, a gas temperature control and ventilation method for a high and low temperature ventilation aging test device comprises the following steps:

[0053] S1. Test preparation;

[0054] S2, installation and calibration of thermal insulation test chamber 2 and high and low temperature gas filling cabinet 3;

[0055] S3, setting of temperature of high and low temperature gas filling cabinet 3;

[0056] S4, start test data;

[0057] S5, ventilation control;

[0058] S6. Collect test data and monitor the test process in real time;

[0059] S7, interrupt the test and handle test abnormalities. Specifically, it can control the type of aging gas, ventilation rate and ventilation time, and can also issue an alarm in time and automatically interrupt the test when abnormalities occur in the aging test (for example: temperature out of control, failure of the tested device, data abnormality, etc.), so as to protect the entire low-temperature ventilation aging test device and ensure the accuracy of the aging test data.

[0060] like Figure 8 As shown, a test method for gas temperature control and ventilation method of a high and low temperature ventilation aging test device, the following steps:

[0061] Sa. Transport the test cabinet 1 to the designated location through AGV, and install the thermal insulation test chamber 2 and the high and low temperature gas cabinet 3;

[0062] Sb, start ventilation;

[0063] Sc, determine whether the test environment inside the high and low temperature gas filling cabinet 3 meets the test requirements. If not, return to step Sb until the test requirements are met. If so, execute step Sd;

[0064] Internal circulation of gas between Sd, insulation test chamber 2 and high and low temperature gas filling cabinet 3;

[0065] Se, perform aging test on the tested parts in the high and low temperature gas filling cabinet 3;

[0066] Sf. After the aging test is completed, the gas in the high and low temperature gas filling cabinet 3 is discharged, and the tested parts are taken out after the test.

[0067] To sum up, the present invention uses a high and low temperature gas filling cabinet 3 to enable the entire high and low temperature ventilation aging test device to automatically adjust the temperature in the thermal insulation test chamber 2 according to the test requirements of different test pieces, so as to achieve rapid switching from high temperature to low temperature or low temperature to high temperature, and can be compatible with high temperature ventilation aging test and low temperature ventilation aging test at the same time, and can reduce energy loss and unnecessary transportation; at the same time, the high and low temperature gas filling cabinet 3 can make the temperature of the thermal insulation test chamber 2 constant during the test process to improve the accuracy of the test results.

[0068] The above description is based on the ideal embodiment of the present invention. Through the above description, relevant personnel can make various changes and modifications without departing from the technical concept of the present invention. The technical scope of the present invention is not limited to the content in the specification, and its technical scope must be determined according to the scope of the claims.

Claims

1. A high and low temperature ventilation aging test device, characterized in that: include: a test cabinet (1), and A heat-insulating test chamber (2), the heat-insulating test chamber (2) being installed in the test cabinet (1), the heat-insulating test chamber (2) being used to carry a test piece; A high and low temperature gas filling cabinet (3), the high and low temperature gas filling cabinet (3) is located on one side of the test cabinet (1); when the heat preservation test chamber (2) is connected to the high and low temperature gas filling cabinet (3), the heat preservation test chamber (2) is used to control the temperature inside the high and low temperature gas filling cabinet (3); and when the temperature inside the high and low temperature gas filling cabinet (3) meets the test requirements, the heat preservation test chamber (2) can perform an aging test on the test piece.

2. The high and low temperature ventilation aging test device according to claim 1, characterized in that: A thermal insulation layer (201) is provided on the top of the thermal insulation test chamber (2); Two first probes (202) and two pneumatic quick-connect joints (203) are arranged on one side of the thermal insulation test chamber (2), and a handle (204) is arranged on the other side of the thermal insulation test chamber (2); A temperature sensor is provided inside the heat-insulating test chamber (2); Wherein: the tested object is located inside the heat-insulating test chamber (2).

3. The high and low temperature ventilation aging test device according to claim 2, characterized in that: The high and low temperature gas filling cabinet (3) is provided with a high and low temperature part (301), an air intake valve (302) and an exhaust valve (303) inside, the gas cylinder is connected to the inlet end of the air intake valve (302), the outlet end of the air intake valve (302) is connected to the inlet end of the high and low temperature part (301), the outlet end of the high and low temperature part (301) is connected to one of the pneumatic quick-connect joints (203), the other pneumatic quick-connect joint (203) is connected to the inlet end of the exhaust valve (303), and the outlet end of the exhaust valve (303) is connected to the atmosphere.

4. The high and low temperature ventilation aging test device according to claim 3, characterized in that: Also includes: A first three-way joint (4), wherein a first port of the first three-way joint (4) is connected to an inlet end of the high and low temperature portion (301), and a second port of the first three-way joint (4) is connected to an outlet end of the air intake valve (302).

5. The high and low temperature ventilation aging test device according to claim 4, characterized in that: Also includes: A second three-way connector (5), wherein the first port of the second three-way connector (5) is connected to another of the pneumatic quick-connect connectors (203), the second port of the second three-way connector (5) is connected to the third port of the first three-way connector (4), and the third port of the second three-way connector (5) is connected to the inlet end of the exhaust valve (303).

6. The high and low temperature ventilation aging test device according to claim 5, characterized in that: A first solenoid valve (6) is connected in series between the outlet end of the high and low temperature gas filling cabinet (3) and one of the pneumatic quick-connect joints (203), and a second solenoid valve (7) is connected in series between the other pneumatic quick-connect joint (203) and the first port of the second three-way joint (5).

7. The high and low temperature ventilation aging test device according to claim 1, characterized in that: Also includes: An automatic positioning and power-on component (8), wherein the automatic positioning and power-on component (8) is used to realize automatic point-by-point power-on of the test cabinet (1).

8. The high and low temperature ventilation aging test device according to claim 7, characterized in that: The automatic positioning energizing component (8) comprises: A vertical ejector pin (801), a first spring (802), a horizontal ejector pin (803), a second spring (804), a fixed plate (805), a conductive block (806), an insulating layer (807) and a second probe (808), wherein the vertical ejector pin (801) is mounted on the fixed plate (805) via the first spring (802) so that the vertical ejector pin (801) can move along the Z-axis direction, the horizontal ejector pin (803) is mounted on the fixed plate (805) via the second spring (804), and the vertical ejector pin (801) is in contact with the horizontal ejector pin (803) so that the horizontal ejector pin (803) can move along the X-axis direction, the conductive block (806) is connected to the fixed plate (805), the insulating layer (807) is connected to the horizontal ejector pin (803), and the second probe (808) is connected to the test cabinet (1).

9. A gas temperature control and ventilation method for a high and low temperature ventilation aging test device according to any one of claims 1 to 8, characterized in that: The following steps are described: S1. Test preparation; S2. Installation and calibration of the thermal insulation test chamber (2) and the high and low temperature gas filling cabinet (3); S3, setting the temperature of the high and low temperature gas filling cabinet (3); S4, start test data; S5, ventilation control; S6. Collect test data and monitor the test process in real time; S7. Interrupt the test and handle the test exception.

10. A test method for the gas temperature control and ventilation method of the high and low temperature ventilation aging test device according to claim 9, characterized in that: The following steps are described: Sa. The test cabinet (1) is transported to a designated location by an AGV, and the heat preservation test chamber (2) and the high and low temperature gas filling cabinet (3) are installed; Sb, start ventilation; Sc, judging whether the test environment inside the high and low temperature gas filling cabinet (3) meets the test requirements, if not, returning to step Sb until the test requirements are met, if so, executing step Sd; Sd, internal circulation of gas between the thermal insulation test chamber (2) and the high and low temperature gas filling cabinet (3); Se, performing an aging test on the tested parts in the high and low temperature gas filling cabinet (3); Sf. After the aging test is completed, the gas in the high and low temperature gas cabinet (3) is discharged, and the tested component is taken out after the test is completed.

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