Optical imaging system and method for phase reconstruction
By integrating the structured light generation module and the speckle generation module, a speckle pattern beam with phase distribution is generated, which solves the problem of obtaining precise phase information of complex samples, realizes high-precision phase reconstruction and high-resolution imaging, and avoids sample damage.
Patent Information
- Application Number
- CN202411714954.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-27
- Publication Date
- 2025-03-07
AI Technical Summary
The prior art is difficult to effectively obtain the precise phase information of complex samples, the traditional imaging system has limited resolution, and fluorescence imaging technology causes irreversible damage to the samples.
By integrating the structured light generation module, the speckle generation module, the lighting module, the imaging system module and the detector module, structured light with phase distribution is generated, and the speckle generation module forms a beam with a speckle pattern through the speckle generation module, high-precision phase reconstruction and high-dimensional imaging of complex structural samples are realized.
High-precision phase information extraction of complex structural sample surfaces is realized, imaging resolution is improved, sample damage is avoided, imaging information can be captured and processed in real time, and high-resolution phase reconstruction images are generated.
Smart Images
Figure CN119575629A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of optical imaging technology, and in particular to an optical imaging system and method for phase reconstruction. Background Art
[0002] Optical imaging technology has made significant progress in the fields of adaptive optics, X-ray diffraction, electron microscopy and optical microscopy, but its development still faces many challenges. For example, the traditional interferometry method is limited in its widespread application in microscopic imaging due to complex devices, harsh environments and speckle noise problems. At the same time, the optical diffraction limit restricts the resolution improvement of traditional imaging systems. Although fluorescence imaging technology has achieved high resolution, the irreversible damage to biological samples during its labeling process has become an application obstacle. In addition, with the increase in market demand, phase imaging and high-dimensional imaging technologies of complex structure samples have become research hotspots, but existing technologies are difficult to effectively obtain accurate phase information of complex samples. Phase reconstruction, as a key technology, faces the problem of difficulty in obtaining phase information. Although existing ultra-high resolution imaging technologies such as fluorescent labeling and structured light illumination have their own advantages, they also have shortcomings such as sample damage and complex and expensive equipment. Therefore, how to achieve high-precision phase reconstruction and high-dimensional imaging of complex structure samples is an urgent problem to be solved. Summary of the invention
[0003] The main purpose of this application is to overcome the shortcomings and deficiencies of the prior art and to provide an optical imaging system and method for phase reconstruction, which achieves high-precision phase reconstruction and high-dimensional imaging of complex structured samples by integrating a structured light generation module, a speckle generation module, an illumination module, an imaging system module, and a detector module.
[0004] In order to achieve the above objectives, this application adopts the following technical solutions:
[0005] In a first aspect, the present application provides a phase-reconstructed optical imaging system, including: a structured light generation module, a speckle generation module, an illumination module, an imaging system module, and a detector module;
[0006] Among them, the structured light generation module receives the light signal emitted by the light source, converts the light signal into structured light with phase distribution, and transmits the structured light to the speckle generation module; the speckle generation module receives the structured light, and forms the structured light into a light beam with a speckle pattern with phase distribution; the illumination module is used to uniformly irradiate the light beam with the speckle pattern on the object to be measured placed on the sample stage to realize the illumination of the object; the imaging system module captures the light beam of the object to be measured and images the light beam of the object to be measured; the detector module is used to collect imaging information of the light beam, and process the imaging information to obtain a phase reconstructed image.
[0007] As a preferred technical solution, the structured light generation module includes: a light source, a polarization device, a polarization direction adjustment device, a beam splitting device, a phase information loadable device and a first convex lens.
[0008] As a preferred technical solution, the structured light includes Bessel light and vortex light.
[0009] As a preferred technical solution, the speckle generating module includes: a speckle generating device and a second convex lens.
[0010] As a preferred technical solution, the speckle generating device is selected from one of a spatial light modulator, a digital micromirror array or a phase plate.
[0011] As a preferred technical solution, the lighting module includes a third convex lens, an illumination light path system and a sample stage.
[0012] As a preferred technical solution, the sample stage is adjustable.
[0013] In a second aspect, the present application provides a phase reconstruction optical imaging method, which is applied to the phase reconstruction optical imaging system, and comprises the following steps:
[0014] Obtain structured light generated by a structured light generation module;
[0015] Passing the structured light through a speckle generating module to obtain a light beam having a speckle pattern;
[0016] irradiating the light beam having the speckle pattern onto the sample stage through an illumination module, and imaging the light beam through an imaging system;
[0017] Imaging information of the light beam is collected, and the imaging information is processed to obtain a phase reconstructed image.
[0018] As a preferred technical solution, the processing of the imaging information includes a first processing and a second processing;
[0019] The first processing is preprocessing, including denoising, normalization and background correction of imaging information.
[0020] As a preferred technical solution, the second process includes:
[0021] After calculation preprocessing, an imaging pattern carrying phase information is obtained;
[0022] Performing a phase unwrapping operation on the imaging pattern to obtain three-dimensional phase distribution information of the sample;
[0023] Based on the real phase distribution information, the three-dimensional structure of the target object is obtained through a reconstruction algorithm.
[0024] In summary, compared with the prior art, the effective effects brought about by the technical solution provided by this application include at least:
[0025] The present application proposes an optical imaging system and method for phase reconstruction, the system comprising: a structured light generation module, a speckle generation module, an illumination module, an imaging system module, and a detector module; wherein the structured light generation module receives a light signal emitted by a light source, converts the light signal into structured light with a phase distribution, and transmits the structured light to the speckle generation module; the speckle generation module receives the structured light, and forms a light beam with a speckle pattern with a phase distribution; the illumination module is used for uniformly irradiating the light beam with the speckle pattern on an object to be measured placed on a sample stage, so as to realize illumination of the object; the imaging system module captures the light beam of the object to be measured, and images the light beam of the object to be measured; the detector module is used for collecting imaging information of the light beam, and processing the imaging information to obtain a phase reconstructed image. The present application firstly combines a structured light generation module with a speckle generation module to effectively extract subtle phase information of the surface of the object to be measured. The light signal with a specific phase distribution generated by the structured light generation module forms a light beam with a speckle pattern under the action of the speckle generation module. The deformation of these light beams with speckle patterns on the surface of the object directly reflects the three-dimensional or two-dimensional morphology of the object, provides a rich source of information for phase reconstruction, and realizes high-precision phase information extraction of the surface of complex structure samples; secondly, through the efficient capture and data processing of the imaging system and the detector module, this information is captured and processed in real time, and the sample can achieve high-resolution phase reconstruction imaging. BRIEF DESCRIPTION OF THE DRAWINGS
[0026] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.
[0027] Figure 1 A structural diagram of a phase-reconstructed optical imaging system provided by one embodiment of the present application;
[0028] Figure 2 A schematic diagram of common structured light and special structured light provided in one embodiment of the present application; wherein, Figure 2 (a) is a schematic diagram of a traditional Gaussian beam; Figure 2 (b) is a schematic diagram of a Bessel-Gaussian beam; Figure 2 (c) is a schematic diagram of a structured light with a topological number of 1 and a radial wave vector of 15.7 mm provided in this application; Figure 2 (d) is a schematic diagram of a structured light with a topological number of 5 and a radial wave vector of 19.63 mm provided in this application; Figure 2 (e) is a schematic diagram of a structured light with a topological number of 20 and a radial wave vector of 39.25 mm provided in this application;
[0029] Figure 3 A schematic diagram showing a comparison of the imaging background signal-to-noise ratio between the imaging method of the present application and the traditional imaging method provided in one embodiment of the present application;
[0030] Figure 4 A schematic diagram showing a comparison of the resolution of the imaging method of the present application and the traditional imaging method provided in one embodiment of the present application;
[0031] Figure 5 A schematic diagram of phase reconstruction provided in accordance with an embodiment of the present application. DETAILED DESCRIPTION
[0032] In order to enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without making creative work are within the scope of protection of the present application.
[0033] Reference to "embodiments" in this application means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described in this application may be combined with other embodiments.
[0034] Example:
[0035] See also Figure 1 In one embodiment of the present application, a phase-reconstructed optical imaging system is provided, comprising: a structured light generation module 1, a speckle generation module 2, an illumination module 3, an imaging system module 4, and a detector module 5;
[0036] Among them, the structured light generation module 1 receives the light signal emitted by the light source, and converts the light signal into structured light (such as Bessel light, vortex light, etc.) with a specific phase distribution. These light beams have higher phase resolution and unique wavefront characteristics, and can more effectively generate speckle pattern light beams with specific phase characteristics; and transmits the structured light to the speckle generation module 2; the speckle generation module 2 receives the structured light and forms a light beam with a speckle pattern with a phase distribution; the illumination module 3 is used to uniformly irradiate the light beam with the speckle pattern on the object to be measured placed on the sample stage to realize the illumination of the object; the imaging system module 4 captures the light beam of the object to be measured and images the light beam of the object to be measured; the detector module 5 includes a data acquisition and processing module, which is used to collect imaging information of the light beam, and process the imaging information to obtain a phase reconstructed image.
[0037] As one implementation mode, the structured light generation module 1 of this embodiment includes: a light source 11, a polarization device 12, a polarization direction adjustment device 13, a beam splitter 14, a phase information loadable device 15, and a first convex lens 16. The phase information loadable device 15 can be one of a spatial light modulator (SLM), a digital micromirror array (DMD), or a phase plate.
[0038] Specifically, the light source 11 generates a light signal, and the light signal passes through a polarizing device 12 to filter light vibrations in a specific direction, that is, to generate polarized light. Then, the polarization state of the light signal is adjusted by a polarization direction adjusting device 13 to ensure that the light signal has a consistent polarization direction during subsequent transmission and processing. After the polarization state of the light signal is adjusted, the light signal passes through a beam splitter 14 to transmit the light signal to a phase information loadable device 15, so that the phase distribution of the light signal is modulated in a specific manner. The modulated light signal passes through a first convex lens 16, and the first convex lens 16 performs Fourier transform on the modulated light signal to generate structured light.
[0039] The structured light in this application refers to the precise control of the characteristics of light to generate structured light with a specific spatial distribution and shape. This structured light is a special structured light that is different from the traditional Gaussian beam and has parameters related to the radial distribution of the beam (such as Bessel distribution or Gaussian distribution) and / or has a topological number. The topological number is an integer that describes the vortex or node in the phase distribution of the beam. It is used to indicate the number of times the phase of the beam rotates around the vortex center during propagation and is related to the orbital angular momentum of the beam; please refer to Figure 2 In Figure 2 (a) Traditional Gaussian beam, Figure 2 (b) Bessel-Gaussian beam, three structured lights designed in this application Figure 2 (c) Figure 2(d) and Figure 2 (e).
[0040] The special structured light in this embodiment includes Bessel light, vortex light, and the like.
[0041] As one implementation manner, the wavelength range of the light source may be in the visible light band, such as 400-1000 nm.
[0042] As one implementation manner, the speckle generating module 2 includes: a speckle generating device 21 and a second convex lens 22; wherein the speckle generating device 21 can be selected from one of a spatial light modulator, a digital micromirror array or a phase plate to achieve phase modulation.
[0043] Specifically, the special structured light is transmitted to the speckle generating device. When the special structured light is irradiated onto the surface of the speckle generating device, each point on the surface will emit coherent sub-waves as a secondary light source. These sub-waves meet and coherently superpose during the spatial propagation process. Due to the randomness of the surface roughness, the phase distribution of the sub-waves is also random, thereby generating speckles. Therefore, the structured light forms a light beam with a speckle pattern with a random phase distribution through the speckle device; then, the light beam with a speckle pattern with a random phase distribution is collected by the second convex lens 22.
[0044] In this embodiment, the speckle generated by the speckle generating module 2 through the special structured light can effectively suppress the noise in the imaging, improve the image quality (such as signal-to-noise ratio), and further improve the resolution of the phase imaging.
[0045] As one embodiment, the illumination module 3 includes a third convex lens 31, an illumination optical path system 32 and a sample stage 33. The sample stage 33 is three-dimensionally or two-dimensionally adjustable, that is, it has the ability of three-dimensional or two-dimensional scale scanning, and has the ability of precise adjustment and positioning on the X-axis, Y-axis or Z-axis, so as to ensure that the sample can be accurately placed and adjusted in a three-dimensional or two-dimensional space, so as to realize three-dimensional or two-dimensional scanning imaging of the object or sample.
[0046] Specifically, the light beam with the phase-distributed speckle pattern passes through the third convex lens 31 and the illumination optical path system 32 in sequence, and the light beam is uniformly and accurately irradiated onto the sample stage 33 .
[0047] As one implementation manner, the detector 5 may be a CCD camera and may be placed on a displacement platform device for scanning in the axial (Z) direction.
[0048] In another embodiment of the present application, a phase reconstruction optical imaging method is provided, comprising the following steps:
[0049] Obtain structured light generated by a structured light generation module;
[0050] Passing the structured light through a speckle generating module to obtain a light beam having a speckle pattern;
[0051] irradiating the light beam having the speckle pattern onto the sample stage through an illumination module, and imaging the light beam through an imaging system;
[0052] Imaging information of the light beam is collected, and the imaging information is processed to obtain a phase reconstructed image.
[0053] Further, processing the imaging information includes a first processing and a second processing;
[0054] The first processing is preprocessing, including denoising, normalization and background correction of imaging information.
[0055] The second treatment includes:
[0056] After calculation preprocessing, an imaging pattern carrying phase information is obtained;
[0057] Performing a phase unwrapping operation on the imaging pattern to obtain three-dimensional phase distribution information of the sample;
[0058] Based on the real phase distribution information, the three-dimensional structure of the target object is obtained through a reconstruction algorithm.
[0059] Among them, since the phase information in the interference pattern is usually wrapped in the (-π,π] interval, the phase unwrapping process aims to restore the continuous phase distribution, and the phase distribution information can be calculated using the TIE method.
[0060] Reconstruction algorithms include iterative methods or GS (Gerchberg-Saxton) algorithms, etc. Among them, the GS (Gerchberg-Saxton) algorithm is a specific iterative algorithm that iteratively solves the phase information by alternating constraints between the spatial domain (object plane) and the frequency domain (Fourier transform plane).
[0061] In addition, after obtaining the three-dimensional structure or other information of the target object through the reconstruction algorithm, post-processing such as filtering, contrast enhancement and edge detection is also included to improve the image quality and accuracy. The accuracy of the reconstruction results is verified through experiments or simulations, and finally the data is visualized using software coding technology to obtain an accurate phase reconstruction image.
[0062] This application effectively extracts the subtle phase information of the surface of the object to be measured by combining the structured light generation module with the speckle generation module, and can generate a light beam with a speckle pattern with a specific phase distribution as an illumination light source. The complexity and randomness of the speckle pattern cleverly suppress the interference of background noise. Figure 3 A schematic diagram showing a comparison of the imaging background signal-to-noise ratio between the imaging method of the present application and the traditional imaging method, Figure 3 (a) is the background noise of the traditional imaging method. Figure 3 (b) is the background noise of the imaging method of the present application. Figure 3 (c) is a schematic diagram of the signal-to-noise ratio of the traditional imaging method and the imaging method of the present application in the same target area, wherein: Figure 3 The left side of (c) is the signal-to-noise ratio of the traditional imaging method, and the right side is the signal-to-noise ratio of the imaging method of the present application. Figure 3 (a) Figure 3 (b) It can be seen that the background noise of the traditional imaging method is large, and the background noise of the imaging method of the present application is low (the cleaner the background, the greater the signal-to-noise ratio, and the lower the noise); Figure 3 As can be seen in (c), in the same target area (the upper left box in a and b), the signal-to-noise ratio of the present application is higher.
[0063] In addition, the optical imaging system of the present application integrates the structured light generation module 1, the speckle generation module 2, the illumination module 3, the imaging system module 4, and the detector module 5, so as to achieve accurate capture of minute details on the surface of an object and high-resolution imaging, thus overcoming the resolution limitation of the traditional imaging method; Figure 4 , Figure 4 (a) is the imaging resolution of the traditional imaging method, Figure 4 (b) is the imaging resolution of the imaging method of the present application; it can be seen that the imaging resolution of the imaging method of the present application is higher. Figure 4 (b) The upper and right graphs represent the ability to resolve white lines in the sample; the results show good imaging resolution.
[0064] The present application provides an optical imaging system and method for phase reconstruction. The imaging system in the present application uses special structured light (such as Bessel light, vortex light, etc.), which is different from traditional Gaussian beams. Special structured light has non-trivial phase distribution and topological characteristics (such as topological charge and radial wave vector). For example, Bessel light has non-diffraction and self-healing properties, and vortex light has unique phase singularities. These lights enhance the ability to extract phase information through their unique wavefront characteristics and topological characteristics, so that they have significant advantages in generating high-resolution phase imaging, can accurately capture and reconstruct the complex structure of the sample, and achieve higher-precision phase reconstruction imaging. The present application is particularly suitable for the field of biological imaging, such as in applications such as cell structure observation, tissue section analysis, and living tissue imaging, and can provide high-resolution phase imaging. In addition, the system is also suitable for other application scenarios such as materials science, micro-nano processing monitoring, and precision industrial detection, and reveals the fine structure and characteristics of the sample through phase imaging technology.
[0065] This application firstly combines the structured light generation module with the speckle generation module to effectively extract the subtle phase information of the surface of the object to be measured. The light signal with a specific phase distribution generated by the structured light generation module forms a light beam with a speckle pattern under the action of the speckle generation module. The deformation of these light beams with speckle patterns on the surface of the object directly reflects the three-dimensional morphology of the object, provides a rich information source for phase reconstruction, and realizes high-precision phase information extraction of the surface of complex structure samples; secondly, through the efficient capture and data processing of the imaging system and the detector module, it is possible to capture and process this information in real time, and accurately reconstruct the phase image of the sample, please refer to Figure 5 , Figure 5 (a) is the image before phase reconstruction. Figure 5 (b) is the image after phase reconstruction. In addition, the present application is applicable to reconstruction imaging of three-dimensional phase information and reconstruction imaging of two-dimensional phase information; the system can obtain high-resolution phase information in two-dimensional plane and three-dimensional space through optimized optical path design and data processing algorithm. This flexibility enables the system to operate effectively in different research and application scenarios, especially in phase imaging of three-dimensional complex structure samples, showing superior performance.
[0066] It should be noted that, for the sake of convenience of description, the aforementioned method embodiments are all expressed as a series of action combinations, but those skilled in the art should know that the present application is not limited to the described order of actions, because according to the present application, certain steps can be performed in other orders or simultaneously.
[0067] In another embodiment, an electronic device for a phase-reconstructed optical imaging method is provided, comprising a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor; when the processor executes the computer program, a phase-reconstructed optical imaging method of any embodiment of the present application is implemented.
[0068] Exemplarily, in this embodiment, the computer program may be divided into one or more modules, which are stored in the memory and executed by the processor to complete the present application. The one or more module elements may be a series of computer program instruction segments capable of completing specific functions, which are used to describe the execution process of the computer program in the device.
[0069] The device may be a computing device such as a desktop computer, a notebook, a PDA, a cloud server, etc. The device may include, but is not limited to, a processor and a memory.
[0070] The processor may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor, etc. The processor is the control center of the device, and various interfaces and lines are used to connect various parts of the entire device.
[0071] The memory can be used to store the computer program and / or module, and the processor realizes various functions of the device by running or executing the computer program and / or module stored in the memory, and calling the data stored in the memory. The memory can mainly include a program storage area and a data storage area, wherein the program storage area can store an operating system, at least one application required for a function, etc.; in addition, the memory can include a high-speed random access memory, and can also include a non-volatile memory, such as a hard disk, a memory, a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card), at least one disk storage device, a flash memory device, or other volatile solid-state storage devices.
[0072] Accordingly, the present application also provides a computer-readable storage medium, which includes a stored computer program, wherein when the computer program is running, the device where the computer-readable storage medium is located is controlled to perform a phase reconstruction optical imaging method as described in any one of the above embodiments.
[0073] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the program can be stored in a non-volatile computer-readable storage medium. When the program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in this application can include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).
[0074] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0075] The above embodiments are preferred implementation modes of the present application, but the implementation modes of the present application are not limited to the above embodiments. Any other changes, modifications, substitutions, combinations, and simplifications that do not deviate from the spirit and principles of the present application should be equivalent replacement methods and are included in the protection scope of the present application.
Claims
1. A phase reconstruction optical imaging system, characterized in that: include: Structured light generation module, speckle generation module, lighting module, imaging system module, detector module; The structured light generation module receives the light signal emitted by the light source, converts the light signal into structured light with phase distribution, and transmits the structured light to the speckle generation module; the speckle generation module receives the structured light, and forms the structured light into a light beam with a speckle pattern with phase distribution; The illumination module is used to evenly illuminate the light beam of the speckle pattern on the object to be measured placed on the sample stage to realize the illumination of the object; the imaging system module captures the light beam of the object to be measured and images the light beam of the object to be measured; the detector module is used to collect the imaging information of the light beam and process the imaging information to obtain a phase reconstructed image.
2. The phase reconstruction optical imaging system according to claim 1, characterized in that: The structured light generation module comprises: a light source, a polarization device, a polarization direction adjustment device, a beam splitting device, a phase information loadable device and a first convex lens.
3. The phase reconstruction optical imaging system according to claim 1, characterized in that: The structured light includes Bessel light and vortex light.
4. The phase reconstruction optical imaging system according to claim 1, characterized in that: The speckle generating module comprises: a speckle generating device and a second convex lens.
5. The phase reconstruction optical imaging system according to claim 4, characterized in that: The speckle generating device is selected from one of a spatial light modulator, a digital micromirror array or a phase plate.
6. The phase reconstruction optical imaging system according to claim 1, characterized in that: The lighting module includes a third convex lens, an illumination light path system and a sample stage.
7. The phase reconstruction optical imaging system according to claim 6, characterized in that: The sample stage is adjustable.
8. A phase reconstruction optical imaging method, applied to a phase reconstruction optical imaging system according to any one of claims 1 to 7, characterized in that: The steps include: Obtain structured light generated by a structured light generation module; Passing the structured light through a speckle generating module to obtain a light beam having a speckle pattern; irradiating the light beam having the speckle pattern onto the sample stage through an illumination module, and imaging the light beam through an imaging system; Imaging information of the light beam is collected, and the imaging information is processed to obtain a phase reconstructed image.
9. The optical imaging method of phase reconstruction according to claim 8, characterized in that: The processing of the imaging information includes a first processing and a second processing; The first processing is preprocessing, including denoising, normalization and background correction of imaging information.
10. The optical imaging method of phase reconstruction according to claim 9, characterized in that: The second process comprises: After calculation preprocessing, an imaging pattern carrying phase information is obtained; Performing a phase unwrapping operation on the imaging pattern to obtain three-dimensional phase distribution information of the sample; Based on the real phase distribution information, the three-dimensional structure of the target object is obtained through a reconstruction algorithm.