Device sequential arrangement method for improving performance of WDM (Wavelength Division Multiplexing) module

Abstract

The invention provides a device sequence arrangement method for improving the performance of a WDM (Wavelength Division Multiplexing) module, which comprises the following steps of: comparing insertion loss values of devices, determining an arrangement sequence of the devices, arranging the device corresponding to the maximum theoretical insertion loss value and the device corresponding to the maximum channel insertion loss value in front, reducing further attenuation of signals in subsequent devices, keeping the integrity and the strength of the signals, and improving the performance of the WDM module. And the signal can be accurately and efficiently transmitted to a subsequent circuit. The signal strength is reduced through a device corresponding to the maximum theoretical insertion loss value, oscillation and interference to the WDM module caused by signals are avoided, and the stability of the WDM module is improved; and meanwhile, the device corresponding to the maximum theoretical insertion loss value can generate an attenuation effect on noise and interference, so that the signal purity is kept, and the communication quality is improved. By comparing the insertion loss values of the devices, the arrangement sequence of the devices is determined, the positions of the devices are rapidly positioned, and the efficiency is improved while the performance of the WDM module is improved.

Description

Technical Field

[0001] The invention relates to the field of communication technology, and in particular to a device sequence arrangement method for improving the performance of a WDM module. Background Art

[0002] Insertion loss refers to the signal loss between the transmitter and the receiver, usually attenuation. There is a close relationship between the arrangement order of channel components and the insertion loss value. Insertion loss, the full name of insertion loss, refers to the signal loss caused by inserting cables or components between the transmitter and the receiver, usually attenuation. The arrangement order of different components will affect the transmission and loss of the signal. The arrangement order of channel components has an important influence on the insertion loss value. When arranging components, it is necessary to sort the components to reduce the insertion loss and improve the performance of the entire system.

[0003] At present, the arrangement of devices is based on the ITU standard channels of the devices. After the device is fused, it is tested to find out the maximum insertion loss value and the minimum insertion loss value. Then, the transmission end of the channel where the minimum insertion loss value is located is attenuated and fused according to the insertion loss difference between the maximum insertion loss value and the minimum insertion loss value. The test method is cumbersome. Take the DWDM module as an example. The DWDM module has 16 channels, and there are about 21 trillion device arrangement combinations, of which only one combination can make the insertion loss value of the DWDM module reach the optimal value. It takes a long time to test the maximum insertion loss value and the minimum insertion loss value; the production efficiency is low. Summary of the invention

[0004] In view of this, the purpose of the present invention is to provide a device sequence arrangement method for improving the performance of a WDM module, compare the insertion loss value of each device, determine the arrangement order of each device, quickly locate the position of the device, improve the performance of the WDM module and speed up the efficiency.

[0005] In order to solve the above technical problems, the technical solution used in the present invention is:

[0006] A device sequence arrangement method for improving WDM module performance according to the present invention comprises the following steps:

[0007] S1. Preset the insertion loss value data of each device in different channels.

[0008] S2. Set the channel where the device corresponding to the maximum theoretical insertion loss value is located as the a-th channel, where the initial value of a is 1; set the channel where the device corresponding to the minimum terminal channel insertion loss value other than the device corresponding to the maximum theoretical insertion loss value is located as the n-th channel.

[0009] S3. The channel where the device corresponding to the maximum channel insertion loss value in the current sorting is located is set as the a+1th channel; the channel where the device corresponding to the minimum end channel other than the device corresponding to the maximum channel insertion loss value in the current sorting is located is set as the n-1th channel.

[0010] S4. Repeat S3 to sort the remaining unsorted devices.

[0011] Preferably, S2 comprises the following steps:

[0012] S2.1. Determine whether the device corresponding to the maximum theoretical insertion loss value and the device corresponding to the minimum end channel insertion loss value are the same device; if not, proceed to S2.2; if yes, proceed to S2.3.

[0013] S2.2. Set the channel where the device corresponding to the maximum theoretical insertion loss value is located as the first channel; set the channel where the device corresponding to the minimum terminal channel insertion loss value is located as the nth channel.

[0014] S2.3. The channel where the device corresponding to the maximum theoretical insertion loss value is located is set as the first channel; the channel where the device corresponding to the insertion loss value of the other end channel closest to the minimum end channel insertion loss value is located is set as the nth channel.

[0015] Preferably, S3 comprises the following steps:

[0016] S3.1. Determine whether the device corresponding to the maximum channel insertion loss value and the device corresponding to the minimum end channel insertion loss value in the current sorting are the same device; if not, proceed to S3.2; if yes, proceed to S3.3.

[0017] S3.2. Set the channel where the device corresponding to the maximum channel insertion loss value in the current sorting is located as the 1+a section channel, where the initial value of a is 1; set the channel where the device corresponding to the minimum end channel insertion loss value in the current sorting is located as the n-1 section channel.

[0018] S3.3. Set the channel where the device corresponding to the maximum channel insertion loss value in the current sorting is located as the 1+a section channel, where the initial value of a is 1; set the channel where the device corresponding to the other end channel insertion loss value closest to the minimum end channel insertion loss value in the current sorting is located as the nth section channel.

[0019] Preferably, the insertion loss value data includes insertion loss values ​​of each device on different channels.

[0020] Preferably, the end channel insertion loss value is the insertion loss value of the reflection end of the device inserted in the end channel; the maximum end channel insertion loss value is the end channel insertion loss value with the largest value.

[0021] Preferably, the theoretical insertion loss value is the sum of the insertion loss value of the coupler after fusion splicing, the insertion loss value of the C-band pass device after fusion splicing, and the insertion loss value of the device after fusion splicing; the maximum theoretical insertion loss value is the theoretical insertion loss value with the largest value.

[0022] Preferably, the maximum channel insertion loss value is the insertion loss value of the coupler after splicing, the insertion loss value of the C-band pass device after splicing, the insertion loss value of the previously sequenced device after splicing, and the insertion loss value of the current device after splicing.

[0023] Preferably, the insertion loss value of the coupler after welding is the product of the coupler insertion loss value and the coupler welding factor; the insertion loss value of the C-band pass device after welding is the product of the C-band pass device insertion loss value and the C-band pass device welding factor; the insertion loss value of the device after welding is the product of the device insertion loss value and the device welding factor.

[0024] Compared with the prior art, the beneficial effects of the device sequence arrangement method for improving the performance of the WDM module described in the present invention are mainly reflected in: by obtaining the insertion loss values ​​of different devices, the device corresponding to the maximum theoretical insertion loss value and the device corresponding to the maximum channel insertion loss value are arranged in the front, reducing the further attenuation of the signal in the subsequent devices, maintaining the integrity and strength of the signal, and ensuring that the signal can be accurately and efficiently transmitted to the subsequent circuit. By reducing the signal strength through the device corresponding to the maximum theoretical insertion loss value, the oscillation and interference of the WDM module caused by the signal is avoided, and the stability of the WDM module is improved; at the same time, the device corresponding to the maximum theoretical insertion loss value can also produce an attenuation effect on noise and interference, maintain the purity of the signal, and improve the communication quality. By comparing the insertion loss value of each device, the arrangement order of each device is determined, and the position of the device is quickly located, which effectively reduces the maximum insertion loss value of the WDM module, and at the same time can reduce the insertion loss value difference between the maximum insertion loss value and the minimum insertion loss value, thereby improving the performance of the WDM module while speeding up the efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] The above and other purposes, features and advantages of the present invention will become more clear by more specific description of the preferred embodiments of the present invention shown in the accompanying drawings. The same reference numerals indicate the same parts in all the accompanying drawings, and the accompanying drawings are not deliberately scaled to the actual size, and the focus is on illustrating the main purpose of the present invention.

[0026] Figure 1 It is a flow chart of the present invention. DETAILED DESCRIPTION

[0027] The technical solution of the present invention is further described in detail below in conjunction with the accompanying drawings and specific embodiments, so that those skilled in the art can better understand the present invention and implement it. However, the embodiments cited are not intended to limit the present invention. In the present embodiment, it should be understood that the orientations or positional relationships indicated by terms such as "longitudinal", "lateral", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", and "outside" are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation of the present invention.

[0028] It should be noted that when an element is considered to be "connected" to another element, it may be directly connected to the other element and integrated therewith, or there may be an intermediate element at the same time. The terms "installed", "one end", "the other end" and similar expressions used in the present invention are for illustrative purposes only.

[0029] This embodiment provides a method for arranging components in order to improve the performance of a WDM module, comprising the following steps:

[0030] S1. Preset the insertion loss value data of each device. In this embodiment, the insertion loss value data of the device is preset according to the model of the device.

[0031] S2. Set the channel where the device corresponding to the maximum theoretical insertion loss value is located as the a-th channel, and the initial value of a is 1; set the channel where the device corresponding to the minimum terminal channel insertion loss value other than the device corresponding to the maximum theoretical insertion loss value is located as the n-th channel.

[0032] S3. The channel where the device corresponding to the maximum channel insertion loss value in the current sorting is located is set as the a+1th channel; the channel where the device corresponding to the minimum end channel other than the device corresponding to the maximum channel insertion loss value in the current sorting is located is set as the n-1th channel.

[0033] S4. Repeat S3 to sort the remaining devices.

[0034] In a preferred embodiment, the end channel insertion loss value is the insertion loss value of the reflection end of the device inserted in the end channel.

[0035] In this embodiment, the coupler is a coupler (FBT). In another embodiment, the C-band communication device can be replaced by other communication devices of different optical communication bands, which can be set according to different transmission requirements.

[0036] In this embodiment, the theoretical insertion loss value is the sum of the insertion loss value of the coupler (FBT) after splicing, the insertion loss value of the C-band pass device (Filter-A) after splicing, and the insertion loss value of the device after splicing; the maximum theoretical insertion loss value is the theoretical insertion loss value with the largest value. The maximum channel insertion loss value is the insertion loss value of the coupler (FBT) after splicing, the insertion loss value of the C-band pass device (Filter-A) after splicing, the insertion loss value of the previously sorted device after splicing, and the insertion loss value of the current device after splicing.

[0037] The insertion loss value of the coupler (FBT) after splicing is the product of the coupler (FBT) insertion loss value and the coupler (FBT) splicing factor; the insertion loss value of the C-band pass device (Filter-A) after splicing is the product of the C-band pass device (Filter-A) insertion loss value and the C-band pass device (Filter-A) splicing factor; the insertion loss value of the device after splicing is the product of the device insertion loss value and the device splicing factor. The coupler (FBT) splicing factor, the C-band pass device (Filter-A) splicing factor and the device splicing factor are all preset values.

[0038] The above method obtains the insertion loss values ​​of different devices, and then arranges the devices corresponding to the maximum theoretical insertion loss value and the devices corresponding to the maximum channel insertion loss value in the front, reducing the further attenuation of the signal in the subsequent devices, maintaining the integrity and strength of the signal, and ensuring that the signal can be accurately and efficiently transmitted to the subsequent circuit. By reducing the signal strength through the device corresponding to the maximum theoretical insertion loss value, the signal is prevented from causing oscillation and interference to the WDM module, thereby improving the stability of the WDM module; at the same time, the device corresponding to the maximum theoretical insertion loss value can also produce an attenuation effect on noise and interference, maintain the purity of the signal, and improve the communication quality. By comparing the insertion loss value of each device, the arrangement order of each device is determined, and the position of the device is quickly located, effectively reducing the maximum insertion loss value of the WDM module, and at the same time reducing the insertion loss value difference between the maximum insertion loss value and the minimum insertion loss value, improving the performance of the WDM module while speeding up efficiency.

[0039] In the above method

[0040] S2 includes the following steps:

[0041] S2.1. Determine whether the device corresponding to the maximum theoretical insertion loss value and the device corresponding to the minimum end channel insertion loss value are the same device; if not, proceed to S2.2; if yes, proceed to S2.3.

[0042] S2.2. Set the channel where the device corresponding to the maximum theoretical insertion loss value is located as the first channel; set the channel where the device corresponding to the minimum terminal channel insertion loss value is located as the nth channel.

[0043] S2.3. The channel where the device corresponding to the maximum theoretical insertion loss value is located is set as the first channel; the channel where the device corresponding to the insertion loss value of the other end channel closest to the minimum end channel insertion loss value is located is set as the nth channel.

[0044] S3 includes the following steps:

[0045] S3.1. Determine whether the device corresponding to the maximum channel insertion loss value and the device corresponding to the minimum end channel insertion loss value in the current sorting are the same device; if not, proceed to S3.2; if yes, proceed to S3.3.

[0046] S3.2. Set the channel where the device corresponding to the maximum channel insertion loss value in the current sorting is located as the 1+a section channel, where the initial value of a is 1; set the channel where the device corresponding to the minimum end channel insertion loss value in the current sorting is located as the n-1 section channel.

[0047] S3.3. Set the channel where the device corresponding to the maximum channel insertion loss value in the current sorting is located as the 1+a section channel, where the initial value of a is 1; set the channel where the device corresponding to the other end channel insertion loss value closest to the minimum end channel insertion loss value in the current sorting is located as the nth section channel.

[0048] The following is explained through data:

[0049] Table 1.1 shows the insertion loss data of the unsorted devices C20-C27

[0050] CH FBT Filter-A C20 C21 C22 C23 C24 C25 C26 C27 C20 0.171 0.122 0.405 0.133 0.154 0.161 0.161 0.154 0.182 0.112 C21 0.171 0.122 0.091 0.45 0.154 0.161 0.161 0.154 0.182 0.112 C22 0.171 0.122 0.091 0.133 0.342 0.161 0.161 0.154 0.182 0.112 C23 0.171 0.122 0.091 0.133 0.154 0.261 0.161 0.154 0.182 0.112 C24 0.171 0.122 0.091 0.133 0.154 0.161 0.378 0.154 0.182 0.112 C25 0.171 0.122 0.091 0.133 0.154 0.161 0.161 0.369 0.182 0.112 C26 0.171 0.122 0.091 0.133 0.154 0.161 0.161 0.154 0.369 0.112 C27 0.171 0.122 0.091 0.133 0.154 0.161 0.161 0.154 0.182 0.342

[0051] Table 1.1 and Table 1.2 show the insertion loss data of the unsorted devices C28-C32

[0052] CH FBT Filter-A C28 C29 C30 C31 C32 C33 C34 C35 C28 0.171 0.122 0.396 0.126 0.133 0.119 0.147 0.147 0.175 0.126 C29 0.171 0.122 0.161 0.324 0.133 0.119 0.147 0.147 0.175 0.126 C30 0.171 0.122 0.161 0.126 0.477 0.119 0.147 0.147 0.175 0.126 C31 0.171 0.122 0.161 0.126 0.133 0.234 0.147 0.147 0.175 0.126 C32 0.171 0.122 0.161 0.126 0.133 0.119 0.369 0.147 0.175 0.126 C33 0.171 0.122 0.161 0.126 0.133 0.119 0.147 0.423 0.175 0.126 C34 0.171 0.122 0.161 0.126 0.133 0.119 0.147 0.147 0.378 0.126 C35 0.171 0.122 0.161 0.126 0.133 0.119 0.147 0.147 0.175 0.369

[0053] Table 1.2

[0054] In this embodiment, n devices are included, where n is 16, including C20, C21, C22, C23, C24, C25, C26, C27, C28, C29, C30, C31, C32 and C33.

[0055] Referring to Table 1.1 and Table 1.2, the product of the coupler (FBT) insertion loss value and the coupler (FBT) splicing factor FBT is 0.17; the product of the C-band pass device (Filter-A) insertion loss value and the C-band pass device (Filter-A) splicing factor FA is 0.12.

[0056] The product of the C20 device insertion loss value and the device welding factor is 0.405; the product of the C21 device insertion loss value and the device welding factor is 0.45; the product of the C22 device insertion loss value and the device welding factor is 0.342; the product of the C23 device insertion loss value and the device welding factor is 0.261; the product of the C24 device insertion loss value and the device welding factor is 0.378; the product of the C25 device insertion loss value and the device welding factor is 0.369; the product of the C26 device insertion loss value and the device welding factor is 0.369; the product of the C27 device insertion loss value and the device welding factor is 0.342; The product of the insertion loss value of the C28 device and the device welding factor is 0.396; the product of the insertion loss value of the C29 device and the device welding factor is 0.324; the product of the insertion loss value of the C30 device and the device welding factor is 0.477; the product of the insertion loss value of the C31 device and the device welding factor is 0.234; the product of the insertion loss value of the C32 device and the device welding factor is 0.369; the product of the insertion loss value of the C33 device and the device welding factor is 0.423; the product of the insertion loss value of the C34 device and the device welding factor is 0.378; the product of the insertion loss value of the C35 device and the device welding factor is 0.369.

[0057] Then, the theoretical insertion loss value of each device is calculated by summing the product of the insertion loss value of each device and the device splicing factor, the product of the insertion loss value of the router and the splicing factor of the coupler (FBT), and the product of the insertion loss value of the C-band pass device (Filter-A) and the splicing factor of the C-band pass device (Filter-A); specifically, the theoretical insertion loss value of device C20 is 0.698; the theoretical insertion loss value of device C21 is 0.743; the theoretical insertion loss value of device C22 is 0.635; the theoretical insertion loss value of device C23 is 0.554; the theoretical insertion loss value of device C24 is 0.671; The theoretical insertion loss value of device C25 is 0.653; the theoretical insertion loss value of device C26 is 0.662; the theoretical insertion loss value of device C27 is 0.635; the theoretical insertion loss value of device C28 is 0.689; the theoretical insertion loss value of device C29 is 0.617; the theoretical insertion loss value of device C30 is 0.77; the theoretical insertion loss value of device C31 is 0.527; the theoretical insertion loss value of device C32 is 0.662; the theoretical insertion loss value of device C33 is 0.716; the theoretical insertion loss value of device C34 is 0.671; the theoretical insertion loss value of device C25 is 0.662. In this way, the maximum theoretical insertion loss value can be determined to be the theoretical insertion loss value of device C30, which is 0.77

[0058] Table 1.3 shows the theoretical insertion loss values ​​and end channel insertion loss values ​​corresponding to parts C28-C35

[0059]

[0060]

[0061] Table 1.3

[0062] Referring to Table 1.3, by obtaining the preset end channel insertion loss value, the end channel insertion loss value of each device can be obtained. It can be determined that the maximum theoretical insertion loss value corresponds to device C30; the minimum end channel insertion loss value corresponds to device C23; device C30 and device C23 are different devices; therefore, in S2, the channel where device C30 is located is set as the first channel; and the channel where device C23 is located is set as the nth channel.

[0063] Table 2.1 and Table 2.2 show the insertion loss data for unsorted devices other than C23 and C30.

[0064]

[0065] Table 2.1

[0066] CH FBT Filter-A C30 C28 C29 C31 C32 C33 C34 C35 C23 C30 0.171 0.122 0.477 0.161 0.126 0.119 0.147 0.147 0.175 0.126 0.161 C28 0.171 0.122 0.133 0.396 0.126 0.119 0.147 0.147 0.175 0.126 0.161 C29 0.171 0.122 0.133 0.161 0.324 0.119 0.147 0.147 0.175 0.126 0.161 C31 0.171 0.122 0.133 0.161 0.126 0.234 0.147 0.147 0.175 0.126 0.161 C32 0.171 0.122 0.133 0.161 0.126 0.119 0.369 0.147 0.175 0.126 0.161 C33 0.171 0.122 0.133 0.161 0.126 0.119 0.147 0.423 0.175 0.126 0.161 C34 0.171 0.122 0.133 0.161 0.126 0.119 0.147 0.147 0.378 0.126 0.161 C35 0.171 0.122 0.133 0.161 0.126 0.119 0.147 0.147 0.175 0.369 0.161 C23 0.171 0.122 0.133 0.161 0.126 0.119 0.147 0.147 0.175 0.126 0.261

[0067] Table 2.2 and Table 2.3 show the theoretical insertion loss values ​​and end channel insertion loss values ​​corresponding to devices other than C23 and C30

[0068] STEP-2 MAX MIN CH P-#2 P-#15 C30 C20 0.831 2.707 C21 0.876 2.710 C22 0.768 2.581 C24 0.804 2.610 C25 0.786 2.599 C26 0.795 2.580 C27 0.768 2.623 C28 0.822 2.628 C29 0.750 2.591 C31 0.660 2.508 C32 0.795 2.615 C33 0.849 2.690 C34 0.804 2.596 C35 0.795 2.636 C23 VALUE 0.876 2.508

[0069] Table 2.3

[0070] After setting the devices of the 1st and nth channel sections; perform S3 to sort the remaining devices; set the remaining unsorted devices in the 2nd and n-1th channel sections; refer to Tables 2.1-2.3; the post-splicing insertion loss value corresponding to C21 is the largest; when calculating the current maximum channel insertion loss value, the device corresponding to the maximum channel insertion loss value is calculated to be C21 through the post-splicing insertion loss value of the coupler (FBT), the post-splicing insertion loss value of the C-band pass device (Filter-A), the post-splicing insertion loss value of the previously sorted device C30, and the post-splicing insertion loss value of the current device C21; then set the channel where device C21 is located to be the 2nd channel section; at the same time, by obtaining the end channel insertion loss value of the unsorted devices, it is determined that the device corresponding to the current minimum end channel insertion loss value is C31; then set the channel where device C31 is located to be the n-1th channel section.

[0071] Table 3.1 shows the theoretical insertion loss values ​​and end channel insertion loss values ​​corresponding to devices other than C23, C30, C20, and C31

[0072] STEP-3 MAX MIN CH P-#3 P-#14 C30 C21 C20 0.96 2.59 C22 0.90 2.46 C24 0.94 2.49 C25 0.92 2.48 C26 0.93 2.46 C27 0.90 2.50 C28 0.95 2.51 C29 0.88 2.47 C32 0.93 2.50 C33 0.98 2.57 C34 0.94 2.48 C35 0.93 2.52 C31 C23 VALUE 0.98 2.46

[0073] Table 3.1

[0074] After setting the devices of the 1st channel, the 2nd channel, the n-1th channel, and the nth channel; perform S3 to sort the remaining devices; set the remaining unsorted devices in the 3rd channel and the n-2nd channel; refer to Tables 2.1-2.3 and Table 3.1; the post-splicing insertion loss value corresponding to C33 is the largest; when calculating the current maximum channel insertion loss value, the device corresponding to the maximum channel insertion loss value is calculated to be C33 through the post-splicing insertion loss value of the coupler (FBT), the post-splicing insertion loss value of the C-band pass device (Filter-A), the post-splicing insertion loss value of the previously sorted device C30, the post-splicing insertion loss value of the previously sorted device C21, and the post-splicing insertion loss value of the current device C33; and then set the channel where device C33 is located to be the 3rd channel; at the same time, by obtaining the end channel insertion loss value of the unsorted devices, it is determined that the device corresponding to the current minimum end channel insertion loss value is C26; and then set the channel where device C26 is located to be the n-2nd channel.

[0075] Then continue to repeat step S3, and set the channel where device C20 is located as the 4th channel in sequence; set the channel where device C28 is located as the 5th channel; set the channel where device C24 is located as the 6th channel, and set the channel where device C32 is located as the 7th channel; set the channel where device C35 is located as the 8th channel; at the same time, the numerical value of the insertion loss value of the data end channel is calculated; set the channel where device C26 is located as the n-3rd channel in sequence; set the channel where device C22 is located as the n-4th channel; set the channel where device C29 is located as the n-4th channel; set the channel where device C34 is located as the n-5th channel; set the channel where device C25 is located as the n-6th channel; and set the channel where device C27 is located as the n-7th channel.

[0076] In this embodiment, the devices are arranged in the following order: device C30, device C21, device C33, device C20, device C28, device C24, device C32, device C35, device C27, device C25, device C34, device C29, device C22, device C26, device C31, device C23.

[0077] In this specification, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being "above", "above" or "above" a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being "below", "below" or "below" a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0078] In the description of this specification, the description with reference to the terms "preferred embodiment", "further embodiment", "other embodiments" or "specific example" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, unless they are contradictory.

[0079] Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and cannot be understood as limitations on the present application. Ordinary technicians in this field can change, modify, replace and modify the above embodiments within the scope of the present application.

Claims

1. A device sequence arrangement method for improving WDM module performance, characterized in that: The following steps are involved: S1. Preset the insertion loss value data of each device; S2. Set the channel where the device corresponding to the maximum theoretical insertion loss value is located as the a-th channel, and the initial value of a is 1; set the channel where the device corresponding to the minimum terminal channel insertion loss value other than the device corresponding to the maximum theoretical insertion loss value is located as the n-th channel; S3, setting the channel where the device corresponding to the maximum channel insertion loss value in the current sorting is located as the a+1th channel; setting the channel where the device corresponding to the minimum end channel other than the device corresponding to the maximum channel insertion loss value in the current sorting is located as the n-1th channel; S4. Repeat S3 to sort the remaining devices.

2. The method for arranging components in order to improve the performance of a WDM module according to claim 1, characterized in that: S2 includes the following steps: S2.1, determine whether the device corresponding to the maximum theoretical insertion loss value and the device corresponding to the minimum end channel insertion loss value are the same device; if not, proceed to S2.2; if yes, proceed to S2.3; S2.

2. The channel where the device corresponding to the maximum theoretical insertion loss value is located is set as the first channel; the channel where the device corresponding to the minimum terminal channel insertion loss value is located is set as the nth channel; S2.

3. The channel where the device corresponding to the maximum theoretical insertion loss value is located is set as the first channel; the channel where the device corresponding to the insertion loss value of the other end channel closest to the minimum end channel insertion loss value is located is set as the nth channel.

3. The method for sequentially arranging components to improve WDM module performance according to claim 1, characterized in that: S3 includes the following steps: S3.1, determine whether the device corresponding to the maximum channel insertion loss value in the current sorting is the same device as the device corresponding to the minimum end channel insertion loss value; if not, proceed to S3.2; if yes, proceed to S3.3; S3.2, set the channel where the device corresponding to the maximum channel insertion loss value in the current sorting is located as the 1+a section channel, where the initial value of a is 1; set the channel where the device corresponding to the minimum end channel insertion loss value in the current sorting is located as the n-1 section channel; S3.

3. Set the channel where the device corresponding to the maximum channel insertion loss value in the current sorting is located as the 1+a section channel, where the initial value of a is 1; set the channel where the device corresponding to the other end channel insertion loss value closest to the minimum end channel insertion loss value in the current sorting is located as the nth section channel.

4. The method for sequentially arranging components to improve the performance of a WDM module according to claim 1, characterized in that: The insertion loss value data includes the insertion loss values ​​of each device on different channels.

5. The method for sequentially arranging components to improve WDM module performance according to claim 1, characterized in that: The end channel insertion loss value is the insertion loss value of the reflection end of the device inserted in the end channel; the maximum end channel insertion loss value is the end channel insertion loss value with the largest value.

6. The method for sequentially arranging components to improve the performance of a WDM module according to claim 1, characterized in that: The theoretical insertion loss value is the sum of the insertion loss value of the coupler after splicing, the insertion loss value of the C-band pass device after splicing, and the insertion loss value of the device after splicing; The maximum theoretical insertion loss value is the theoretical insertion loss value with the largest value.

7. The method for sequentially arranging components to improve the performance of a WDM module according to claim 6, characterized in that: The maximum channel insertion loss value is the insertion loss value of the coupler after splicing, the insertion loss value of the C-band pass device after splicing, the insertion loss value of the previously sequenced device after splicing, and the insertion loss value of the current device after splicing.

8. The method for sequentially arranging components to improve the performance of a WDM module according to claim 7, characterized in that: The insertion loss value of the coupler after splicing is the product of the coupler insertion loss value and the coupler splicing factor; the insertion loss value of the C-band pass device after splicing is the product of the C-band pass device insertion loss value and the C-band pass device splicing factor; the insertion loss value of the device after splicing is the product of the device insertion loss value and the device splicing factor.

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