Time-frequency electromagnetic data processing method and device, equipment and medium

Abstract

The invention relates to the field of geophysical electromagnetic exploration, and provides a time-frequency electromagnetic data processing method, device, equipment and medium, and the method comprises the steps: calculating the similarity offset ratio of each measuring point on a measuring line, and determining a static displacement measuring point on the measuring line based on the similarity offset ratio; calculating equivalent apparent resistivity ratio of static displacement measurement point based on equivalent apparent resistivity of electric field component and corrected equivalent apparent resistivity of magnetic field component corresponding to adjacent measurement points on left and right sides of static displacement measurement point, and updating equivalence of electric field component of static displacement measurement point based on equivalent apparent resistivity ratio and corrected equivalent apparent resistivity of magnetic field component apparent resistivity; and completing static displacement correction in response to the static displacement measuring points on the measuring line, and performing inversion calculation on the magnetic field component amplitude and the electric field component amplitude of each measuring point on the measuring line to obtain resistivity distribution of a preset depth below the measuring line. The scheme disclosed by the invention is beneficial to improving the exploration and prediction precision of the time-frequency electromagnetic oil and gas target.

Description

Technical Field

[0001] The present invention relates to the field of geophysical electromagnetic exploration, and in particular to a method, device, equipment and medium for processing time-frequency electromagnetic data. Background Art

[0002] Time-Frequency Electromagnetic Method (TFEM) is an electromagnetic exploration method that combines frequency domain sounding and time domain sounding in one system. It uses a finite length wire with both ends grounded as the transmitting source, and uses a high-power transmitter to stimulate square wave signals of different frequencies to measure the vertical component B of the time domain magnetic field. z Variation with time (induced vertical magnetic field, db z / dt) and the horizontal component of the electric field in the frequency domain E x Data is inverted to obtain resistivity and polarizability information to achieve the detection of underground oil and gas targets and other geological targets. This method takes advantage of the sensitivity of time domain magnetic field signals to low-resistance layers and frequency domain electric field signals to high-resistance layers, improving the accuracy and ability to simultaneously detect low-resistance and high-resistance layers. Therefore, it is widely used in oil and gas exploration in complex piedmont zones, oil and gas evaluation of igneous rock targets, drilling target optimization, deep buried hill evaluation, horizontal well fracturing monitoring in tight oil and gas reservoirs, shale gas and oil and gas exploration, geothermal resource exploration, hydrological exploration, and geological disaster detection.

[0003] In time-frequency electromagnetic exploration, the uniformity of the resistivity of the medium is changed due to the complex surface and shallow inhomogeneities. The current flows through the surface of the shallow inhomogeneous body and forms an accumulation of charge on it, causing the shallow surface current to be densely or sparsely distributed, which in turn leads to the distortion of the horizontal component of the electric field E measured on the surface. x A sudden increase or decrease is manifested as the horizontal component of the electric field E x Alternatively, the calculated apparent resistivity may shift upward or downward, or exhibit distortion at certain frequencies, compared to the normal curve. This phenomenon is known as the static displacement effect. If static displacement exists in electromagnetic data, it can affect the resistivity obtained from electromagnetic data inversion, leading to a severe "striping" phenomenon in the inversion section, thus compromising detection resolution and exploration effectiveness.

[0004] Techniques for processing time-frequency electromagnetic data typically use horizontal electric field components, unaffected by static displacement, to correct data with static displacement. This is known as the adjacent point reference method, or utilizes static high-frequency characteristics through low-pass filtering, such as spatial filtering. These methods rely heavily on manual experience and are subject to significant human factors, hindering the accuracy of time-frequency electromagnetic oil and gas target exploration and prediction. Summary of the Invention

[0005] In view of this, the present invention proposes a method, device, equipment and medium for processing time-frequency electromagnetic data, which solves the problem that the relevant technologies for time-frequency electromagnetic data processing rely heavily on manual experience, the human factor accounts for a large proportion, and is not conducive to improving the accuracy of time-frequency electromagnetic oil and gas target exploration and prediction.

[0006] Based on the above objectives, an embodiment of the present invention first provides a method for processing time-frequency electromagnetic data, including:

[0007] Determine the survey line for collecting time-frequency electromagnetic data;

[0008] calculating a similarity offset ratio for each measuring point on the measuring line based on the corrected equivalent apparent resistivity of the magnetic field component and the equivalent apparent resistivity of the electric field component of each measuring point on the measuring line, and further confirming a static displacement measuring point on the measuring line based on the similarity offset ratio for each measuring point on the measuring line;

[0009] Calculating an equivalent apparent resistivity ratio of the static displacement measuring point based on the equivalent apparent resistivity of the electric field component and the corrected equivalent apparent resistivity of the magnetic field component of the adjacent measuring points on the left and right sides of the static displacement measuring point;

[0010] updating the equivalent apparent resistivity of the electric field component of the static displacement measuring point based on the equivalent apparent resistivity ratio of the static displacement measuring point and the corrected equivalent apparent resistivity of the magnetic field component, so as to perform static displacement correction on the static displacement measuring point;

[0011] In response to the static displacement correction being completed at the static displacement measuring points on the survey line, an inversion calculation is performed on the magnetic field component amplitude and the electric field component amplitude of each measuring point on the survey line to obtain the resistivity distribution at a preset depth below the survey line.

[0012] In some embodiments, before the step of calculating the similarity offset ratio of each measuring point on the measuring line based on the corrected equivalent apparent resistivity of the magnetic field component and the equivalent apparent resistivity of the electric field component of each measuring point on the measuring line, the method further includes:

[0013] Calculating the equivalent apparent resistivity of the magnetic field component and the equivalent apparent resistivity of the electric field component at each measuring point on the measuring line;

[0014] Based on the first measuring point on the measuring line, the offset distances of the remaining points on the measuring line from the first measuring point are calculated in sequence. The magnetic field component of each measuring point on the measuring line is further corrected based on an adjacent point reference method and a spatial filtering method of the offset distance to obtain a corrected equivalent apparent resistivity of the magnetic field component of each measuring point on the measuring line.

[0015] In some embodiments, the step of calculating the similarity offset ratio of each measuring point on the measuring line based on the corrected equivalent apparent resistivity of the magnetic field component and the equivalent apparent resistivity of the electric field component of each measuring point on the measuring line comprises:

[0016] The actual value of the similarity offset of each measuring point on the measuring line is calculated based on the equivalent apparent resistivity of the electric field component of each measuring point on the measuring line and the corrected equivalent apparent resistivity of the magnetic field component of each measuring point on the measuring line. The formula for calculating the actual value of the similarity offset of each measuring point on the measuring line is as follows:

[0017]

[0018] Wherein, i is the i-th measuring point on the measuring line, is the equivalent apparent resistivity of the electric field component of the i-th measuring point, is the equivalent apparent resistivity of the magnetic field component of the i-th measuring point after correction, and f is the and the The changing electromagnetic field strength function, f max is the maximum electromagnetic field intensity, f min is the minimum value of electromagnetic field intensity, the C i is the actual value of the similarity offset of the i-th measuring point;

[0019] Calculating an average value of the similarity offset of the survey line based on an actual value of the similarity offset of each measuring point on the survey line and the number of measuring points on the survey line;

[0020] A similarity offset ratio of each measuring point on the measuring line is obtained based on a ratio between an actual similarity offset value of each measuring point on the measuring line and the similarity offset average value.

[0021] In some embodiments, the step of confirming the static displacement measuring point on the measuring line based on the similarity offset ratio of each measuring point on the measuring line includes:

[0022] A static displacement measuring point on the measuring line with static displacement is determined based on the similarity offset ratio being greater than a preset threshold.

[0023] In some embodiments, the step of calculating the equivalent apparent resistivity ratio of the static displacement measuring point based on the equivalent apparent resistivity of the electric field component and the corrected equivalent apparent resistivity of the magnetic field component corresponding to adjacent measuring points on the left and right sides of the static displacement measuring point, respectively, includes:

[0024] Calculating the sum of the equivalent apparent resistivities of the electric field components corresponding to adjacent measuring points on the left and right sides of the static displacement measuring point to obtain a first value;

[0025] Calculating the sum of the corrected equivalent apparent resistivities of the magnetic field components corresponding to adjacent measuring points on the left and right sides of the static displacement measuring point to obtain a second value;

[0026] An equivalent apparent resistivity ratio of the static displacement measuring point is obtained based on a ratio between the first value and the second value.

[0027] In some embodiments, the step of updating the equivalent apparent resistivity of the electric field component of the static displacement measuring point based on the equivalent apparent resistivity ratio of the static displacement measuring point and the corrected equivalent apparent resistivity of the magnetic field component includes:

[0028] The equivalent apparent resistivity of the electric field component of the static displacement measuring point is updated based on the product of the corrected equivalent apparent resistivity of the magnetic field component of the static displacement measuring point and the ratio of the equivalent apparent resistivity of the static displacement measuring point.

[0029] In some embodiments, the step of performing inverse calculation of the magnetic field component amplitude and the electric field component amplitude of each measuring point on the measuring line in response to completing the static displacement correction at the static displacement measuring point on the measuring line comprises:

[0030] In response to the static displacement correction being completed at the static displacement measuring points on the survey line, the magnetic field component amplitude and the electric field component amplitude corresponding to the magnetic field component and the electric field component of each measuring point on the survey line are calculated based on the equivalent apparent resistivity corresponding to the magnetic field component and the electric field component of each measuring point on the survey line, and inversion calculation is further performed based on the magnetic field component amplitude and the electric field component amplitude corresponding to each measuring point on the survey line and the OCCAM inversion algorithm.

[0031] Another aspect of an embodiment of the present invention further provides a time-frequency electromagnetic data processing device, comprising: a first module for determining a survey line for collecting time-frequency electromagnetic data; a second module for calculating a similarity offset ratio of each measuring point on the survey line based on the corrected equivalent apparent resistivity of the magnetic field component and the equivalent apparent resistivity of the electric field component of each measuring point on the survey line, and further confirming a static displacement measuring point on the survey line based on the similarity offset ratio of each measuring point on the survey line; a third module for calculating a similarity offset ratio of each measuring point on the survey line based on the equivalent apparent resistivity and the electric field component corresponding to the adjacent measuring points on the left and right sides of the static displacement measuring point. a fourth module, configured to update the equivalent apparent resistivity of the electric field component of the static displacement measuring point based on the equivalent apparent resistivity ratio of the static displacement measuring point and the corrected equivalent apparent resistivity of the magnetic field component, so as to perform static displacement correction on the static displacement measuring point; and a fifth module, configured to complete the static displacement correction in response to the static displacement measuring point on the survey line, perform inversion calculation on the magnetic field component amplitude and the electric field component amplitude of each measuring point on the survey line, and obtain the resistivity distribution at a preset depth below the survey line.

[0032] Another aspect of an embodiment of the present invention provides an electronic device comprising at least one processor; and a memory storing computer instructions that can be run on the processor, wherein the instructions implement the steps of the above method when executed by the processor.

[0033] According to another aspect of an embodiment of the present invention, a computer-readable storage medium is provided. The computer-readable storage medium stores a computer program that implements the above method steps when executed by a processor.

[0034] The present invention has at least the following beneficial effects: the present invention proposes a method for processing time-frequency electromagnetic data, which determines a measuring point for collecting time-frequency electromagnetic data, calculates a similarity offset ratio for each measuring point on the measuring line to confirm a static displacement measuring point on the measuring line, obtains the equivalent apparent resistivity of the electric field component and the corrected equivalent apparent resistivity of the magnetic field component corresponding to adjacent measuring points on the left and right sides of the static displacement measuring point, and calculates the equivalent apparent resistivity ratio of the static displacement measuring point based on the equivalent apparent resistivity ratio of the static displacement measuring point and the corrected equivalent apparent resistivity of the magnetic field component of the static displacement measuring point. The static displacement of the electric field component is corrected using the magnetic field component, fully utilizing the advantage that data with time-varying magnetic field components have almost no static displacement effect, effectively suppressing the static displacement effect caused by changes in field source position, terrain undulation, and near-surface electrical inhomogeneity, avoiding human factors in the data processing process, fully retaining the true information of the electromagnetic field of the underground medium, and facilitating improving the accuracy of time-frequency electromagnetic oil and gas target exploration and prediction. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other embodiments can be obtained based on these drawings without paying any creative work.

[0036] Figure 1 The figure shows a flow chart of a method for processing time-frequency electromagnetic data provided by one embodiment of the present invention;

[0037] Figure 2 The figure shows the amplitude profile of the vertical component Bz of the magnetic field at a measuring point on a measuring line in the ZB area of ​​the Ordos Basin over time;

[0038] Figure 3 Schematic diagram of the amplitude profile of the horizontal component Ex of the electric field at a measuring point on a survey line in the ZB area of ​​the Ordos Basin;

[0039] Figure 4 A schematic diagram of the equivalent apparent resistivity curve of the entire area, showing the vertical component Bz of the magnetic field at all measuring points on the survey line varying with time, provided by one embodiment of the present invention;

[0040] Figure 5 A schematic diagram of the equivalent apparent resistivity curve of the horizontal component Ex of the electric field at all measuring points on the survey line provided by one embodiment of the present invention;

[0041] Figure 6 FIG2 shows a schematic cross-sectional diagram of equivalent apparent resistivity of the entire region, showing a vertical component Bz of the magnetic field varying with time, according to another embodiment of the present invention;

[0042] Figure 7 1 is a schematic cross-sectional diagram of equivalent apparent resistivity of the entire region of the horizontal component Ex of the electric field provided by another embodiment of the present invention;

[0043] Figure 8 1 is a schematic cross-sectional diagram of the equivalent apparent resistivity of the entire region of the vertical component Bz of the magnetic field after correction provided by another embodiment of the present invention;

[0044] Figure 9 The equivalent apparent resistivity ρ of the horizontal component Ex of the electric field provided by another embodiment of the present invention is shown as follows: Ez Curve and equivalent apparent resistivity ρ after correction of the vertical component of the magnetic field Bz over time Bz Schematic diagram of curve similarity offset;

[0045] Figure 10FIG2 shows a schematic cross-sectional diagram of the equivalent apparent resistivity of the entire region of the corrected horizontal component Ex of the electric field provided by another embodiment of the present invention;

[0046] Figure 11 1 is a schematic diagram of a cross-sectional view of an amplitude of an electric field level Ex in the frequency domain after correction provided by another embodiment of the present invention;

[0047] Figure 12 1 is a schematic diagram showing a cross-sectional amplitude diagram of a corrected vertical component Bz of a frequency-domain magnetic field varying with time according to another embodiment of the present invention;

[0048] Figure 13 FIG2 shows a schematic diagram of a resistivity inversion profile obtained by inverting the survey line according to another embodiment of the present invention;

[0049] Figure 14 A schematic diagram of a device for processing time-frequency electromagnetic data provided by an embodiment of the present invention is shown;

[0050] Figure 15 Shown is a schematic diagram of an electronic device provided by an embodiment of the present invention;

[0051] Figure 16 Shown is a schematic diagram of a computer-readable storage medium provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0052] The following describes embodiments of the present invention. However, it is to be understood that the disclosed embodiments are merely examples and other embodiments can take various alternative forms.

[0053] Furthermore, it should be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but may also include elements not expressly listed or inherent to such processes, methods, articles, or apparatuses.

[0054] One or more embodiments of the present application will be described below with reference to the accompanying drawings.

[0055] Based on the above objectives, a first aspect of an embodiment of the present invention provides an embodiment of a method for processing time-frequency electromagnetic data. Figure 1 FIG. 1 is a flow chart of a method for processing time-frequency electromagnetic data provided by an embodiment of the present invention, as shown in FIG. Figure 1 As shown, a method for processing time-frequency electromagnetic data includes:

[0056] S1. Determine the survey line for collecting time-frequency electromagnetic data;

[0057] S2. Calculating a similarity offset ratio for each measuring point on the measuring line based on the corrected equivalent apparent resistivity of the magnetic field component and the equivalent apparent resistivity of the electric field component of each measuring point on the measuring line, and further confirming a static displacement measuring point on the measuring line based on the similarity offset ratio for each measuring point on the measuring line;

[0058] S3, calculating the equivalent apparent resistivity ratio of the static displacement measuring point based on the equivalent apparent resistivity of the electric field component and the corrected equivalent apparent resistivity of the magnetic field component corresponding to the adjacent measuring points on the left and right sides of the static displacement measuring point;

[0059] S4, updating the equivalent apparent resistivity of the electric field component of the static displacement measuring point based on the equivalent apparent resistivity ratio of the static displacement measuring point and the corrected equivalent apparent resistivity of the magnetic field component, so as to perform static displacement correction on the static displacement measuring point;

[0060] S5. In response to the static displacement correction being completed at the static displacement measuring points on the survey line, inversion calculation is performed on the magnetic field component amplitude and the electric field component amplitude of each measuring point on the survey line to obtain the resistivity distribution at a preset depth below the survey line.

[0061] In some embodiments, a survey line for collecting time-frequency electromagnetic data is determined based on the distribution range and component types of the measured time-frequency electromagnetic method transmission frequency, wherein the survey line includes N measurement points. A joint inversion calculation is performed using the data from the N measurement points to ultimately obtain the resistivity distribution at a preset depth below the survey line. In a specific example, the transmission frequency of the multi-source, multi-component time-frequency electromagnetic method for joint inversion ranges from 0.01 to 1000 Hz, the components of the multi-source, multi-component time-frequency electromagnetic method for joint inversion are the horizontal electric field component Ex parallel to the field source and the vertical magnetic field component Bz perpendicular to the ground, and the data for the joint inversion calculation are the amplitudes of the horizontal electric field component Ex and the amplitudes of the vertical magnetic field component Bz that vary with time.

[0062] The above-mentioned method for processing time-frequency electromagnetic data uses the magnetic field component to correct the static displacement of the electric field component, giving full play to the advantage that the data of the magnetic field component changing with time has almost no static displacement effect, effectively suppressing the static displacement effect caused by changes in the field source position, terrain undulations and near-surface electrical inhomogeneities, avoiding human factors in the data processing process, and fully retaining the true information of the electromagnetic field of the underground medium, which is conducive to improving the accuracy of time-frequency electromagnetic oil and gas target exploration and prediction.

[0063] According to some embodiments of the present invention, before the step of calculating the similarity offset ratio of each measuring point on the measuring line based on the corrected equivalent apparent resistivity of the magnetic field component and the equivalent apparent resistivity of the electric field component of each measuring point on the measuring line, the method further includes:

[0064] Calculating the equivalent apparent resistivity of the magnetic field component and the equivalent apparent resistivity of the electric field component at each measuring point on the measuring line;

[0065] Based on the first measuring point on the measuring line, the offset distances of the remaining points on the measuring line from the first measuring point are calculated in sequence. The magnetic field component of each measuring point on the measuring line is further corrected based on an adjacent point reference method and a spatial filtering method of the offset distance to obtain a corrected equivalent apparent resistivity of the magnetic field component of each measuring point on the measuring line.

[0066] In a specific example, a survey line includes N measuring points, and the equivalent apparent resistivity of the magnetic field component and the equivalent apparent resistivity of the electric field component corresponding to the N measuring points on the survey line are calculated. Specifically, the full-field equivalent apparent resistivity of the frequency domain data and the full-field equivalent apparent resistivity of the time domain data corresponding to the N measuring points are calculated. The calculation of the full-field equivalent apparent resistivity of the frequency domain data of one measuring point is described as an example. The calculation formula of the frequency domain electromagnetic field strength of the long wire source is as follows:

[0067] min ρ ∑ i (f(ρ)-d i ) 2 (Formula 1)

[0068] Where f(ρ) refers to the time-varying function of the horizontal component Ex of the electric field or the vertical component Bz of the magnetic field in the frequency domain of the wired long conductor source, d i is the time-varying amplitude of the horizontal electric field component Ex or the vertical magnetic field component Bz corresponding to the i-th measuring point among the N measuring points on the selected survey line, and ρ is the full-field equivalent apparent resistivity of the frequency domain data being sought. The full-field equivalent apparent resistivity of the frequency domain data for the measuring point is obtained by minimizing equation (1) based on the Gauss-Newton method.

[0069] In another specific example, the offset distance of each measuring point on the survey line is calculated. The offset distance of each measuring point refers to the distance between adjacent measuring points, specifically the distance after the cumulative summation starting from the first measuring point. The base 10 logarithm of the frequency in the observation data of each measuring point is taken to obtain the logarithm of the frequency. The base 10 logarithm of the equivalent apparent resistivity of the entire area in the observation data of each measuring point is taken to obtain the logarithm of the equivalent apparent resistivity of the entire area. Based on the calculated offset distance of each measuring point on the survey line, the adjacent point reference method in the prior art is used in combination with the spatial filtering method in the prior art to correct the magnetic field component of each measuring point on the survey line to obtain the corrected equivalent apparent resistivity ρ of the magnetic field component. Bz .

[0070] According to some embodiments of the present invention, the step of calculating the similarity offset ratio of each measuring point on the measuring line based on the corrected equivalent apparent resistivity of the magnetic field component and the equivalent apparent resistivity of the electric field component of each measuring point on the measuring line includes:

[0071] The actual value of the similarity offset of each measuring point on the measuring line is calculated based on the equivalent apparent resistivity of the electric field component of each measuring point on the measuring line and the corrected equivalent apparent resistivity of the magnetic field component of each measuring point on the measuring line. The formula for calculating the actual value of the similarity offset of each measuring point on the measuring line is as follows:

[0072]

[0073] Wherein, i is the i-th measuring point on the measuring line, is the equivalent apparent resistivity of the electric field component of the i-th measuring point, is the equivalent apparent resistivity of the magnetic field component of the i-th measuring point after correction, and f is the and the The changing electromagnetic field strength function, f max is the maximum electromagnetic field intensity, f min is the minimum value of electromagnetic field intensity, the C i is the actual value of the similarity offset of the i-th measuring point;

[0074] Calculating an average value of the similarity offset of the survey line based on an actual value of the similarity offset of each measuring point on the survey line and the number of measuring points on the survey line;

[0075] A similarity offset ratio of each measuring point on the measuring line is obtained based on a ratio between an actual similarity offset value of each measuring point on the measuring line and the similarity offset average value.

[0076] In a specific example, the actual similarity offset value of each measuring point on the survey line is calculated, and the average similarity offset value of the survey line is calculated based on the actual similarity offset value of each measuring point on the survey line and the number of measuring points on the survey line. In this embodiment, the survey line includes N measuring points, and the formula for calculating the average similarity offset value of the survey line is as follows:

[0077]

[0078] Where N is the number of measuring points on the survey line, C i is the actual value of the similarity offset of the i-th measuring point on the survey line, is the sum of the actual values ​​of the similarity offsets of all the measuring points on the measuring line (a total of N measuring points), C mean is the average similarity offset of the survey line, which is the arithmetic mean.

[0079] According to some embodiments of the present invention, the step of confirming the static displacement measuring point on the measuring line based on the similarity offset ratio of each measuring point on the measuring line includes:

[0080] It is determined that a static displacement measuring point with static displacement exists on the measuring line based on that the similarity offset ratio is greater than the preset threshold.

[0081] In a specific example, based on actual needs, the preset threshold is set to γ, and the similarity offset ratio of each measuring point on the measuring line is compared with the preset threshold γ. If the similarity offset ratio of the measuring point is greater than the preset threshold γ, it is confirmed that there is a static displacement in the horizontal component Ex of the frequency domain electric field of the measuring point, that is, the measuring point is a static displacement measuring point.

[0082] According to some embodiments of the present invention, the step of calculating the equivalent apparent resistivity ratio of the static displacement measuring point based on the equivalent apparent resistivity of the electric field component and the corrected equivalent apparent resistivity of the magnetic field component corresponding to adjacent measuring points on the left and right sides of the static displacement measuring point, respectively, includes:

[0083] Calculating the sum of the equivalent apparent resistivities of the electric field components corresponding to adjacent measuring points on the left and right sides of the static displacement measuring point to obtain a first value;

[0084] Calculating the sum of the corrected equivalent apparent resistivities of the magnetic field components corresponding to adjacent measuring points on the left and right sides of the static displacement measuring point to obtain a second value;

[0085] An equivalent apparent resistivity ratio of the static displacement measuring point is obtained based on a ratio between the first value and the second value.

[0086] In a specific example, the equivalent apparent resistivity of the electric field component corresponding to the adjacent measuring points on the left and right sides of the static displacement measuring point is obtained, that is, the equivalent apparent resistivity of the electric field component of the adjacent measuring point on the left is and the equivalent apparent resistivity of the electric field component of the adjacent measuring point on the right calculate and The sum of the two is used to obtain the first value; obtain the corrected equivalent apparent resistivity of the magnetic field components corresponding to the adjacent measuring points on the left and right sides of the static displacement measuring point, that is, the corrected equivalent apparent resistivity of the magnetic field component of the adjacent measuring point on the left and the corrected equivalent apparent resistivity of the magnetic field component of the adjacent measuring point on the right calculate and The sum of the two values ​​is the second value; the ratio between the first value and the second value is calculated to obtain the equivalent apparent resistivity ratio β of the static displacement measuring point. Middle, where the equivalent apparent resistivity ratio β of the static displacement measuring point is Middle The calculation formula is as follows:

[0087]

[0088] According to some embodiments of the present invention, the step of updating the equivalent apparent resistivity of the electric field component of the static displacement measuring point based on the equivalent apparent resistivity ratio of the static displacement measuring point and the corrected equivalent apparent resistivity of the magnetic field component includes:

[0089] The equivalent apparent resistivity of the electric field component of the static displacement measuring point is updated based on the product of the corrected equivalent apparent resistivity of the magnetic field component of the static displacement measuring point and the ratio of the equivalent apparent resistivity of the static displacement measuring point.

[0090] In some embodiments, the corrected equivalent apparent resistivity ρ based on the time-varying magnetic field component of the static displacement measuring point is Bz The equivalent apparent resistivity ratio β of the static displacement measuring point Middle , and obtain the corrected equivalent apparent resistivity of the horizontal component of the electric field at the static displacement measuring point Use together The equivalent apparent resistivity of the original electric field component of the static displacement measuring point is replaced to update the equivalent apparent resistivity of the horizontal component of the electric field of the static displacement measuring point.

[0091] According to some embodiments of the present invention, the step of performing inverse calculation of the magnetic field component amplitude and the electric field component amplitude of each measuring point on the measuring line in response to completing static displacement correction at the static displacement measuring point on the measuring line includes:

[0092] In response to the static displacement correction being completed at the static displacement measuring points on the survey line, the magnetic field component amplitude and the electric field component amplitude corresponding to the magnetic field component and the electric field component of each measuring point on the survey line are calculated based on the equivalent apparent resistivity corresponding to the magnetic field component and the electric field component of each measuring point on the survey line, and inversion calculation is further performed based on the magnetic field component amplitude and the electric field component amplitude corresponding to each measuring point on the survey line and the OCCAM inversion algorithm.

[0093] In a specific example, the equivalent apparent resistivity ρ after correction based on the time-varying frequency domain electric field horizontal component Ex and magnetic field vertical component Bz at N measuring points on the survey line is: Ez and ρ Bz Calculate the time-varying electric and magnetic fields of the horizontal component of the frequency domain electric field Ex and the vertical component of the magnetic field Bz. Ex The calculation formula for the horizontal component Ex of the frequency domain electric field is as follows:

[0094]

[0095] Where ρ is the resistivity of the uniform half space, that is, the equivalent apparent resistivity of the full field area of ​​the frequency domain data, l is half of the distance between the long wire source AB, and x and y are the coordinates of the measuring point. ζ is the coordinate of the integration point, ω is the angular frequency, μ=4π10 -7 ,

[0096] Based on the corrected equivalent apparent resistivity ρ Bz The calculation formula for the horizontal component Bz of the frequency domain electric field is as follows:

[0097]

[0098] A joint inversion is performed based on the time-varying amplitudes of the horizontal component of the electric field (Ex) and the vertical component of the magnetic field (Bz) at N points along the survey line. Specifically, the resistivity distribution at a certain depth beneath the survey line is determined using the OCCAM inversion algorithm, which employs a time-frequency electromagnetic 1D nonlinear search. The OCCAM inversion algorithm is an inversion method based on iterative optimization of an objective function. During the inversion process, an optimal resistivity model is sought to minimize the sum of squared residuals. The resistivity distribution beneath the survey line is obtained by jointly inverting the time-varying data of the horizontal component of the electric field (Ex) and the vertical component of the magnetic field (Bz) measured by the time-frequency electromagnetic method. By converting the time-varying data of the horizontal component of the electric field (Ex) and the vertical component of the magnetic field (Bz) measured by the time-frequency electromagnetic method into a full-area equivalent apparent resistivity, the influence of acquisition parameters such as current, transmission and reception distance, and offset distance is eliminated. The calculated equivalent apparent resistivity reflects the true high and low distribution characteristics of the subsurface resistivity. The static displacement of the electric field component is corrected using the magnetic field component, leveraging the advantage of the near-zero static displacement effect of the time-varying magnetic field component data. This effectively suppresses the static displacement effects caused by changes in the field source position, topographical fluctuations, and near-surface electrical inhomogeneities. Furthermore, a similarity calculation method for two equivalent apparent resistance curves eliminates human factors in the data processing process, fully retaining the true electromagnetic field information of the subsurface medium. This provides high-quality time-varying data for the horizontal component Ex in the frequency domain and the vertical component Bz of the magnetic field for time-frequency electromagnetic data processing. Joint inversion improves the ability to simultaneously detect low- and high-resistance thin layers, more consistently with known information, and facilitates improved accuracy in time-frequency electromagnetic exploration and prediction of oil and gas targets.

[0099] To further understand the present invention's method for processing time-frequency electromagnetic data, the following detailed example illustrates this approach. The exploration area, located in the ZB region of the Ordos Basin, involved artificial source time-frequency electromagnetic exploration. Using the present invention's method, the time-frequency electromagnetic data were subjected to static displacement, field source effect correction, and data inversion.

[0100] Figure 2 The figure shows the amplitude profile of the vertical component Bz of the magnetic field at a measuring point on a measuring line in the ZB area of ​​the Ordos Basin over time. Figure 3 This is a schematic diagram of the amplitude profile of the horizontal component Ex of the electric field at the measuring points on a survey line in the ZB area of ​​the Ordos Basin. There are 231 measuring points on this survey line. The inversion is performed based on the amplitude data of the horizontal component Ex of the electric field and the vertical component Bz of the magnetic field at the 231 measuring points that change with time. The point numbers are 81-311, and the frequency range is 0.0331Hz-20Hz.

[0101] The full-field equivalent resistivity of the frequency domain data of 231 measuring points on the survey line was calculated, and the full-field equivalent resistivity curve of the vertical component Bz of the magnetic field of all measuring points on the survey line changing with time was obtained. Figure 4 A schematic diagram of the full-area equivalent apparent resistivity curve of the vertical component Bz of the magnetic field at all measuring points on the survey line varying with time, provided by one embodiment of the present invention; the full-area equivalent apparent resistivity curve of the electric field horizontal component Ex at all measuring points on the survey line varying with time is obtained by calculating the full-area equivalent apparent resistivity of the time domain data of 231 measuring points on the survey line. Figure 5 A schematic diagram of the equivalent apparent resistivity curve of the entire area of ​​the horizontal component Ex of the electric field at all measuring points on the survey line provided by one embodiment of the present invention.

[0102] Calculate the offset distance of 231 measuring points on the survey line, take the logarithm of the frequency in the observation data of each measuring point to obtain the logarithm of the frequency, and take the logarithm of the equivalent apparent resistivity of the whole area in the observation data of each measuring point to obtain the logarithm of the equivalent apparent resistivity of the whole area. Figure 6 FIG. 1 is a schematic cross-sectional diagram of equivalent apparent resistivity of the entire region, showing a vertical component Bz of the magnetic field varying with time, according to another embodiment of the present invention. Figure 7 Shown is a schematic cross-sectional diagram of the equivalent apparent resistivity of the entire region of the horizontal component Ex of the electric field provided by another embodiment of the present invention.

[0103] Based on the spatial filtering method and the offset-based adjacent point reference method, the equivalent apparent resistivity of the entire field area where the vertical component of the magnetic field Bz changes with time is corrected to obtain the corrected equivalent apparent resistivity ρ Bz , Figure 8 Shown is a schematic cross-sectional diagram of the equivalent apparent resistivity of the entire region of the corrected vertical component of the magnetic field Bz provided in another embodiment of the present invention.

[0104] Calculate the equivalent apparent resistivity ρ of the horizontal component Ex of the frequency domain data of the electric field at 231 measuring points on the survey line Ez Curve and equivalent apparent resistivity ρ after correction of the vertical component of the magnetic field Bz over time BzCurve similarity offset. Calculate the equivalent apparent resistivity ρ of the horizontal component Ex of the frequency domain data of the electric field at 231 measuring points on the survey line Ez Curve and equivalent apparent resistivity ρ after correction of the vertical component of the magnetic field Bz over time Bz The arithmetic mean of the curve similarity offsets, Figure 9 The equivalent apparent resistivity ρ of the horizontal component Ex of the electric field provided by another embodiment of the present invention is shown as follows: Ez Curve and equivalent apparent resistivity ρ after correction of the vertical component of the magnetic field Bz over time Bz Schematic diagram of curve similarity offset.

[0105] Based on the similarity offset ratio being greater than the preset threshold, the static displacement measurement points on the survey line are determined to have static displacement. After judgment, there are 44 measurement points with static displacement in the horizontal component Ex of the frequency domain data of the electric field of the 231 measurement points on the survey line, namely points 81-93, points 123-128, point 134, points 144-157, points 179-184, points 187-188, and points 206-207. The equivalent apparent resistivity ρ of the horizontal component Ex of the frequency domain data of the electric field of the 44 adjacent measurement points on the left and right sides with static displacement is obtained. Ez Curve and equivalent apparent resistivity ρ after correction of the vertical component of the magnetic field Bz over time Bz , furthermore, the equivalent apparent resistivity ρ of the horizontal component Ex of the frequency domain data of the electric field of the 44 adjacent measuring points on the left and right sides of the static displacement measuring points is calculated Ez Curve and equivalent apparent resistivity ρ after correction of the vertical component of the magnetic field Bz over time Ez The ratio β Middle Furthermore, the equivalent apparent resistivity of the horizontal component Ex of the frequency domain data of 44 static displacement measurement points was calculated.

[0106] Correction of equivalent apparent resistivity using the horizontal component Ex of the electric field from frequency domain data of 44 static displacement measuring points Replacing the equivalent apparent resistivity with static displacement, the equivalent apparent resistivity ρ after correction of the horizontal component Ex of the frequency domain data of 231 measuring points on this survey line is obtained. Ez , Figure 10 Shown is a schematic cross-sectional diagram of the equivalent apparent resistivity of the entire region of the corrected horizontal component Ex of the electric field provided by another embodiment of the present invention.

[0107] The equivalent apparent resistivity ρ after correction of the time-varying horizontal component of the electric field Ex and vertical component of the magnetic field Bz at 231 measuring points on the survey line is used. Ez and ρ Bz Calculate the time-varying electric and magnetic fields of the horizontal component Ex of the frequency domain electric field and the vertical component Bz of the magnetic field. Figure 11 FIG. 1 shows a schematic cross-sectional diagram of the amplitude of the electric field level Ex in the frequency domain after correction provided by another embodiment of the present invention. Figure 12 FIG2 shows a schematic diagram of an amplitude cross-section of a corrected vertical component Bz of a frequency-domain magnetic field changing with time according to another embodiment of the present invention.

[0108] The amplitude of the horizontal component Ex of the frequency domain electric field and the vertical component Bz of the magnetic field at 231 measuring points on the survey line after correction are used for joint inversion to obtain the resistivity distribution at a preset depth below the survey line. Figure 13 Shown is a schematic diagram of a resistivity inversion profile obtained by inverting the survey line provided by another embodiment of the present invention.

[0109] A second aspect of the embodiments of the present invention provides a device for processing time-frequency electromagnetic data. Figure 14 FIG. 1 is a schematic diagram showing a device for processing time-frequency electromagnetic data provided by an embodiment of the present invention. Figure 14 As shown, it includes: a first module 011 for determining a survey line for collecting time-frequency electromagnetic data; a second module 012 for calculating a similarity offset ratio of each measuring point on the survey line based on the corrected equivalent apparent resistivity of the magnetic field component and the equivalent apparent resistivity of the electric field component of each measuring point on the survey line, and further confirming a static displacement measuring point on the survey line based on the similarity offset ratio of each measuring point on the survey line; a third module 013 for calculating a similarity offset ratio of each measuring point on the survey line based on the equivalent apparent resistivity of the electric field component and the corrected equivalent apparent resistivity of the magnetic field component corresponding to the adjacent measuring points on the left and right sides of the static displacement measuring point. The method further comprises: calculating an equivalent apparent resistivity ratio of the static displacement measuring point based on the resistivity; updating the equivalent apparent resistivity of the electric field component of the static displacement measuring point based on the equivalent apparent resistivity ratio of the static displacement measuring point and the corrected equivalent apparent resistivity of the magnetic field component, so as to perform static displacement correction on the static displacement measuring point; and performing an inverse calculation on the magnetic field component amplitude and the electric field component amplitude of each measuring point on the measuring line in response to the static displacement correction being completed for the static displacement measuring point on the measuring line, so as to obtain the resistivity distribution at a preset depth below the measuring line.

[0110] According to a third aspect of the embodiments of the present invention, an electronic device is provided. Figure 15 FIG. 1 is a schematic diagram of an electronic device provided by an embodiment of the present invention. Figure 15 As shown, an electronic device provided by an embodiment of the present invention includes the following modules: at least one processor 021; and a memory 022, wherein the memory 022 stores computer instructions 023 that can be run on the processor 021, and the computer instructions 023 implement the steps of the method described above when executed by the processor 021.

[0111] The present invention also provides a computer-readable storage medium. Figure 16 FIG. 1 is a schematic diagram showing the structure of a computer-readable storage medium provided by an embodiment of the present invention. Figure 16 As shown, the computer readable storage medium 031 stores a computer program 032 for executing the steps of the method described above when executed by a processor. The method executed is the same as above.

[0112] Finally, it should be noted that those skilled in the art will understand that all or part of the processes in the above-mentioned embodiments can be implemented by instructing the relevant hardware through a computer program. The program for setting the system parameters can be stored in a computer-readable storage medium. When the program is executed, it can include the processes of the embodiments of the above-mentioned methods. The storage medium of the program can be a magnetic disk, an optical disk, a read-only memory (ROM), or a random access memory (RAM). The above-mentioned computer program embodiments can achieve the same or similar effects as any of the corresponding aforementioned method embodiments.

[0113] In addition, the method disclosed in the embodiment of the present invention can also be implemented as a computer program executed by a processor, and the computer program can be stored in a computer-readable storage medium. When the computer program is executed by the processor, the above functions defined in the method disclosed in the embodiment of the present invention are performed.

[0114] In addition, the above method steps and system units can also be implemented using a controller and a computer-readable storage medium for storing a computer program that enables the controller to implement the above steps or unit functions.

[0115] It will also be appreciated by those skilled in the art that the various exemplary logic blocks, modules, circuits and algorithmic steps described in conjunction with the disclosure herein can be implemented as electronic hardware, computer software or a combination of the two. In order to clearly illustrate this interchangeability of hardware and software, a general description has been given of the functions of various schematic components, blocks, modules, circuits and steps. Whether this function is implemented as software or hardware depends on specific applications and the design constraints imposed on the entire system. Those skilled in the art can implement the function in various ways for each specific application, but this implementation decision should not be interpreted as causing a departure from the disclosed scope of the embodiments of the present invention.

[0116] In one or more exemplary designs, the function can be implemented in hardware, software, firmware or any combination thereof. If implemented in software, the function can be stored as one or more instructions or codes on a computer-readable medium or transmitted via a computer-readable medium. Computer-readable media include computer storage media and communication media, and the communication media include any media that helps to transmit a computer program from one location to another. The storage medium can be any available medium that can be accessed by a general or special-purpose computer. As an example and not limitation, the computer-readable medium can include RAM, ROM, EEPROM, CD-ROM or other optical disk storage devices, magnetic disk storage devices or other magnetic storage devices, or any other medium that can be used to carry or store the required program code in the form of an instruction or data structure and can be accessed by a general or special-purpose computer or a general or special-purpose processor. In addition, any connection can be appropriately referred to as a computer-readable medium. For example, if a coaxial cable, fiber optic cable, twisted pair, digital subscriber line (DSL) or wireless technologies such as infrared, radio and microwaves are used to send software from a website, server or other remote source, the above-mentioned coaxial cable, fiber optic cable, twisted pair, DOL or wireless technologies such as infrared, radio and microwaves are all included in the definition of medium. As used herein, disk and disc include compact disc (CD), laser disc, optical disc, digital versatile disc (DVD), floppy disk, and Blu-ray disc, where disks usually reproduce data magnetically, while discs reproduce data optically with lasers. Combinations of the above should also be included within the scope of computer-readable media.

[0117] The above are exemplary embodiments disclosed in the present invention, but it should be noted that various changes and modifications may be made without departing from the scope of the embodiments disclosed in the claims. The functions, steps and / or actions of the method claims according to the disclosed embodiments described herein do not need to be performed in any particular order. In addition, although the elements disclosed in the embodiments of the present invention may be described or required in individual form, they may also be understood as multiple unless expressly limited to the singular.

[0118] It should be understood that, as used herein, the singular forms "a" and "an" are intended to include the plural forms as well, unless the context clearly supports an exception. It should also be understood that, as used herein, "and / or" is intended to include any and all possible combinations of one or more of the associated listed items.

[0119] The serial numbers of the embodiments disclosed in the above embodiments of the present invention are only for description and do not represent the advantages or disadvantages of the embodiments.

[0120] Those skilled in the art will understand that all or part of the steps to implement the above embodiments may be accomplished by hardware, or may be accomplished by a program instructing the relevant hardware, and the program may be stored in a computer-readable storage medium, and the above-mentioned storage medium may be a read-only memory, a disk, or an optical disk, etc.

[0121] Those skilled in the art should understand that the discussion of any of the above embodiments is merely illustrative and is not intended to imply that the scope of the disclosure of the embodiments of the present invention (including the claims) is limited to these examples. Within the spirit of the embodiments of the present invention, the technical features of the above embodiments or different embodiments may be combined, and there are many other variations of different aspects of the above embodiments of the present invention, which are not provided in detail for the sake of simplicity. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the embodiments of the present invention should be included in the scope of protection of the embodiments of the present invention.

Claims

1. A method for processing time-frequency electromagnetic data, characterized in that: The method for processing time-frequency electromagnetic data includes: Determine the survey line for collecting time-frequency electromagnetic data; calculating a similarity offset ratio for each measuring point on the measuring line based on the corrected equivalent apparent resistivity of the magnetic field component and the equivalent apparent resistivity of the electric field component of each measuring point on the measuring line, and further confirming a static displacement measuring point on the measuring line based on the similarity offset ratio for each measuring point on the measuring line; Calculating an equivalent apparent resistivity ratio of the static displacement measuring point based on the equivalent apparent resistivity of the electric field component and the corrected equivalent apparent resistivity of the magnetic field component of the adjacent measuring points on the left and right sides of the static displacement measuring point; updating the equivalent apparent resistivity of the electric field component of the static displacement measuring point based on the equivalent apparent resistivity ratio of the static displacement measuring point and the corrected equivalent apparent resistivity of the magnetic field component, so as to perform static displacement correction on the static displacement measuring point; In response to the static displacement correction being completed at the static displacement measuring points on the survey line, an inversion calculation is performed on the magnetic field component amplitude and the electric field component amplitude of each measuring point on the survey line to obtain the resistivity distribution at a preset depth below the survey line.

2. The method for processing time-frequency electromagnetic data according to claim 1, characterized in that: Before the step of calculating the similarity offset ratio of each measuring point on the measuring line based on the corrected equivalent apparent resistivity of the magnetic field component and the equivalent apparent resistivity of the electric field component of each measuring point on the measuring line, the method further comprises: Calculating the equivalent apparent resistivity of the magnetic field component and the equivalent apparent resistivity of the electric field component at each measuring point on the measuring line; Based on the first measuring point on the measuring line, the offset distances of the remaining points on the measuring line from the first measuring point are calculated in sequence. The magnetic field component of each measuring point on the measuring line is further corrected based on an adjacent point reference method and a spatial filtering method of the offset distance to obtain a corrected equivalent apparent resistivity of the magnetic field component of each measuring point on the measuring line.

3. The method for processing time-frequency electromagnetic data according to claim 1, characterized in that: The step of calculating the similarity offset ratio of each measuring point on the measuring line based on the corrected equivalent apparent resistivity of the magnetic field component and the equivalent apparent resistivity of the electric field component of each measuring point on the measuring line comprises: The actual value of the similarity offset of each measuring point on the measuring line is calculated based on the equivalent apparent resistivity of the electric field component of each measuring point on the measuring line and the corrected equivalent apparent resistivity of the magnetic field component of each measuring point on the measuring line. The formula for calculating the actual value of the similarity offset of each measuring point on the measuring line is as follows: Wherein, i is the i-th measuring point on the measuring line, is the equivalent apparent resistivity of the electric field component of the i-th measuring point, is the equivalent apparent resistivity of the magnetic field component of the i-th measuring point after correction, and f is the and the The changing electromagnetic field strength function, f max is the maximum electromagnetic field intensity, f min is the minimum value of electromagnetic field intensity, the C i is the actual value of the similarity offset of the i-th measuring point; Calculating an average value of the similarity offset of the survey line based on an actual value of the similarity offset of each measuring point on the survey line and the number of measuring points on the survey line; A similarity offset ratio of each measuring point on the measuring line is obtained based on a ratio between an actual similarity offset value of each measuring point on the measuring line and the similarity offset average value.

4. The method for processing time-frequency electromagnetic data according to claim 1, characterized in that: The step of confirming the static displacement measuring point on the measuring line based on the similarity offset ratio of each measuring point on the measuring line comprises: A static displacement measuring point on the measuring line with static displacement is determined based on the similarity offset ratio being greater than a preset threshold.

5. The method for processing time-frequency electromagnetic data according to claim 1, characterized in that: The step of calculating the equivalent apparent resistivity ratio of the static displacement measuring point based on the equivalent apparent resistivity of the electric field component and the corrected equivalent apparent resistivity of the magnetic field component corresponding to adjacent measuring points on the left and right sides of the static displacement measuring point comprises: Calculating the sum of the equivalent apparent resistivities of the electric field components corresponding to adjacent measuring points on the left and right sides of the static displacement measuring point to obtain a first value; Calculating the sum of the corrected equivalent apparent resistivities of the magnetic field components corresponding to adjacent measuring points on the left and right sides of the static displacement measuring point to obtain a second value; An equivalent apparent resistivity ratio of the static displacement measuring point is obtained based on a ratio between the first value and the second value.

6. The method for processing time-frequency electromagnetic data according to claim 1, characterized in that: The step of updating the equivalent apparent resistivity of the electric field component of the static displacement measuring point based on the equivalent apparent resistivity ratio of the static displacement measuring point and the corrected equivalent apparent resistivity of the magnetic field component comprises: The equivalent apparent resistivity of the electric field component of the static displacement measuring point is updated based on the product of the corrected equivalent apparent resistivity of the magnetic field component of the static displacement measuring point and the ratio of the equivalent apparent resistivity of the static displacement measuring point.

7. The method for processing time-frequency electromagnetic data according to claim 1, characterized in that: The step of completing the static displacement correction in response to the static displacement measuring points on the measuring line and performing inverse calculation on the magnetic field component amplitude and the electric field component amplitude of each measuring point on the measuring line comprises: The static displacement correction is completed in response to the static displacement measuring points on the survey line, and the magnetic field component amplitude and the electric field component amplitude corresponding to the magnetic field component and the electric field component of each measuring point on the survey line are calculated based on the equivalent apparent resistivity corresponding to the magnetic field component and the electric field component of each measuring point on the survey line, and inversion calculation is further performed based on the magnetic field component amplitude and the electric field component amplitude corresponding to each measuring point on the survey line and the OCCAM inversion algorithm.

8. A device for processing time-frequency electromagnetic data, characterized in that: The device comprises: The first module is used to determine the survey line for collecting time-frequency electromagnetic data; A second module is configured to calculate a similarity offset ratio for each measuring point on the measuring line based on the corrected equivalent apparent resistivity of the magnetic field component and the equivalent apparent resistivity of the electric field component of each measuring point on the measuring line, and further confirm a static displacement measuring point on the measuring line based on the similarity offset ratio for each measuring point on the measuring line; The third module is used to calculate the equivalent apparent resistivity ratio of the static displacement measuring point based on the equivalent apparent resistivity of the electric field component and the corrected equivalent apparent resistivity of the magnetic field component corresponding to the adjacent measuring points on the left and right sides of the static displacement measuring point; A fourth module is configured to update the equivalent apparent resistivity of the electric field component of the static displacement measuring point based on the equivalent apparent resistivity ratio of the static displacement measuring point and the corrected equivalent apparent resistivity of the magnetic field component, so as to perform static displacement correction on the static displacement measuring point; The fifth module is used to complete the static displacement correction in response to the static displacement measuring point on the survey line, perform inversion calculation on the magnetic field component amplitude and the electric field component amplitude of each measuring point on the survey line, and obtain the resistivity distribution at a preset depth below the survey line.

9. An electronic device, characterized in that: include: at least one processor; and a memory storing computer instructions executable on the processor, wherein the instructions, when executed by the processor, implement the steps of the method according to any one of claims 1 to 7.

10. A computer-readable storage medium storing a computer program for implementing the steps of the method according to any one of claims 1 to 7 when the computer-readable storage medium is executed by a processor.

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