Defect detection card

Abstract

The utility model belongs to the technical field of paint surface defect detection, and provides a defect detection card which is used for detecting defects on a to-be-detected surface, the defect detection card comprises a card body, the card body is provided with a detection surface, at least a first detection area and a second detection area are formed on the detection surface, a plurality of detection holes with different diameters are formed in the first detection area, and a plurality of detection holes with different diameters are formed in the second detection area. The plurality of detection holes are arranged in an array; a plurality of measuring line bodies with different preset lengths are formed in the second detection area, and the measuring line bodies are used for comparing with the lengths of the line-shaped defects. The technical problem that paint surface defect judgment is not visual and inaccurate in the prior art is solved.

Description

Technical Field

[0001] The present application belongs to the technical field of paint surface defect detection, and in particular, relates to a defect detection card. Background Art

[0002] During the painting operation, point defects and scratch defects often appear on the paint surface, especially for the painted surface of the vehicle. Such surface defects cannot be accurately judged visually with the naked eye, resulting in inaccurate detection when inspecting the paint surface, making the defective rate of vehicles too high in the later stage. Utility Model Content

[0003] The purpose of this application is to provide a defect detection card, aiming to solve the technical problem of unintuitive and inaccurate paint defect judgment in the prior art.

[0004] The purpose of the present application is to provide a defect detection card for detecting defects on a surface to be inspected, the defect detection card comprising a card body, the card body having a detection surface, at least a first detection area and a second detection area being formed on the detection surface, a plurality of detection holes with different outer diameters being formed on the first detection area, and the plurality of detection holes being arranged in an array; a plurality of measuring lines with different preset lengths being formed in the second detection area, and the measuring lines are used for comparing with the length of the linear defects.

[0005] In one embodiment, the first detection area includes a first detection sub-area, the first detection sub-area has multiple rows of first detection holes formed along a first direction, the multiple rows of first detection holes form multiple columns in a second direction, and the second direction is perpendicular to the first direction.

[0006] In one embodiment, the outer diameters of the first detection holes in each row are arranged to increase in sequence in the second direction; or

[0007] The first detection holes in each row are arranged in descending order in the second direction.

[0008] In one embodiment, the increasing gradient of each row of the first detection holes is any value in the range of 0.2mm-0.8mm; or

[0009] The decreasing gradient of the first detection holes in each row is any value within the range of 0.2 mm-0.8 mm.

[0010] In one embodiment, a first detection mark is formed at the starting end of each row of the first detection holes, and the first detection mark at least includes an impurity same color mark, an impurity different color mark and a shrinkage hole mark, and the first detection mark of each row is different.

[0011] In one embodiment, a second detection mark is formed at the starting end of each column of the first detection holes, and the second detection mark includes at least two different detection surface marks, and each detection surface mark is used to identify a different quality level.

[0012] In one of the embodiments, the second detection mark includes at least three different detection surface marks, and the quality levels marked by the at least three detection surface marks increase or decrease in the second direction.

[0013] In one embodiment, the first detection area further includes a second detection sub-area, and the second detection sub-area is formed with a plurality of second detection holes arranged in an array and a plurality of detection dark areas for detecting the size of defects on the paint surface.

[0014] In one embodiment, a plurality of the second detection holes are arranged in an array along the second direction, and the aperture sizes of the plurality of the second detection holes increase or decrease successively along the second direction; a plurality of the detection dark areas are arranged in an array along the second direction, and the outer diameter sizes of the plurality of the detection dark areas increase or decrease successively along the second direction.

[0015] In one embodiment, the rows of the second detection holes and the rows of the detection dark areas are spaced apart along the first direction, and the rows of the second detection holes and the rows of the detection dark areas are combined along the second direction to form a plurality of columns.

[0016] In one embodiment, the outer contour shape of the opening of each of the second detection holes is the same as the outer contour shape of each of the detection dark areas; and the outer contour sizes of the second detection holes and the detection dark areas in each column are the same.

[0017] In one embodiment, the outer contour of the opening of the second detection hole is circular, and the outer contour of the detection dark area is circular.

[0018] In one embodiment, the measuring line includes a first measuring line and a second measuring line; the second detection area is divided into a fiber detection area and a scratch detection area along a first direction, the fiber detection area is configured with a plurality of the first measuring lines with preset lengths, the preset lengths of the first measuring lines are different, and the plurality of the first measuring lines are arranged at intervals along a second direction, and the second direction is perpendicular to the first direction; the scratch detection area includes at least one second measuring line with a preset length; the preset length of the second measuring line is greater than the preset length of the first measuring line.

[0019] In one embodiment, the preset length of the first measuring line is configured to increase or decrease in the second direction, the minimum preset length of the first measuring line is 1 mm, and the increasing gradient or decreasing gradient of the first measuring line is any value in the range of 0.5 mm-2 mm.

[0020] In one of the embodiments, at least one of the second measuring lines has a length of 40 mm.

[0021] In one embodiment, each of the first measuring lines and each of the second measuring lines extend along the second direction and are arranged in parallel.

[0022] In one embodiment, the detection surface further includes a third detection area, a measurement scale is formed on the third detection area, the detection surface has an edge extending along the first direction, and the measurement scale is configured to extend along the edge.

[0023] The defect detection card of the present application has the following beneficial effects compared with the prior art: compared with the prior art, the defect detection card is used for quality inspection of the paint surface after painting, and by configuring a first inspection area with inspection holes and a second inspection area with measuring wires, the first inspection area and the second inspection area form a quick judgment area for paint surface problems, and can quickly detect surface defects and linear defects formed on the paint surface respectively. According to different quality requirement levels of the surface to be inspected, the first inspection area can be configured with multiple inspection holes with different outer diameters, and the second inspection area can be configured with multiple measuring wires with different preset lengths. Inspection holes with corresponding outer diameters and measuring wires with corresponding preset lengths are selected according to the levels. When measuring, it is only necessary to compare the inspection holes with the surface defects and the measuring wires with the linear defects, so as to quickly judge whether the surface defects and linear defects meet the requirements. The judgment process is more intuitive and clear at a glance, and the detection process is faster, which improves the efficiency of judging paint surface problems. The defect detection card is prepared as a unified inspection standard card with consistent judgment standards and strong versatility. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments of the present application or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0025] Figure 1 This is a schematic diagram of the structure of a defect detection card provided in an embodiment of the present application. Figure 1 ;

[0026] Figure 2 This is a schematic diagram of the structure of a defect detection card provided in an embodiment of the present application. Figure 2 ;

[0027] Figure 3 This is a schematic diagram of the structure of a defect detection card provided in an embodiment of the present application. Figure 3 ;

[0028] Figure 4 This is a schematic diagram of the structure of a defect detection card provided in an embodiment of the present application. Figure 4 ;

[0029] Figure 5 This is a schematic diagram of the structure of a defect detection card provided in an embodiment of the present application. Figure 5 ;

[0030] Figure 6 It is a schematic diagram of the appearance of a detection surface of a defect detection card provided in an embodiment of the present application.

[0031] Explanation of the accompanying drawings: 100, first detection area; 101, detection hole; 102, first detection mark; 103, second detection mark; 110, first detection sub-area; 111, first detection hole; 120, second detection sub-area; 121, detection dark area; 122, second detection hole; 200, second detection area; 201, measurement line; 2011, first measurement line; 2012, second measurement line; 300, third detection area; 301, measurement scale; X, second direction; Y, first direction. DETAILED DESCRIPTION

[0032] Embodiments of the present application are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the present application, and should not be construed as limiting the present application.

[0033] In the description of the present application, it should be understood that the terms "length", "width", "upper", "lower", "upward", "vertical", "horizontal", "bottom", "inside", "outside", "inner side", "outer side" and the like indicating orientations or positional relationships are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0034] In addition, the terms "first", "second", etc. are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the feature. In the description of this application, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0035] In this application, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0036] In order to make the objectives, technical solutions and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments.

[0037] See also Figure 1 As shown, an embodiment of the present application provides a defect detection card for detecting defects on a surface to be inspected, the defect detection card includes a card body, the card body has a detection surface, at least a first detection area 100 and a second detection area 200 are formed on the detection surface, a plurality of detection holes 101 with different diameters are formed on the first detection area 100, and the plurality of detection holes 101 are arranged in an array; a plurality of measuring lines 201 with different preset lengths are formed in the second detection area 200, and the measuring lines 201 are used to compare with the length of the linear defects.

[0038] Specifically, the surface to be inspected is a painted surface formed after the object is painted. The painted surface can be referred to as the paint surface. In this example, the surface to be inspected can be a surface formed after the vehicle is painted, for example, the surface of the vehicle body after painting.

[0039] The defects on the surface to be inspected include surface defects, which may include but are not limited to uneven coloring area defects, same color difference area defects, different color difference area defects, impurity area defects, shrinkage area defects, etc.; the defects on the surface to be inspected also include linear defects, which include but are not limited to fiber defects, scratch defects, etc.

[0040] The standard for failure of paint surface inspection is: the area of ​​the surface defect exceeds the area value range specified in the standard (which can be referred to as the surface defect standard value), or the length of the linear defect exceeds the length value range specified in the standard (which can be referred to as the line defect standard value). For different quality requirement levels, the surface defect standard value and the line defect standard value will also be different. It can be seen that the surface defect standard value and the line defect standard value will also have multiple different standard values. Surface defects can be detected through the first detection area 100 of the card body, and linear defects can be detected through the second detection area 200 on the card body.

[0041] Specifically, the detection surface can be a partial area of ​​the surface of the card body. For example, if the card body is in the shape of a sheet, the detection surface can be a surface of the card body, and the detection surface is a plane; the detection surface is an observation surface or a comparison surface, and the detection surface can be compared with the defect to observe whether the defect is within the qualified range.

[0042] In order to achieve the joint detection of surface defects and linear defects, a first detection area 100 and a second detection area 200 are divided on the detection surface, and the first detection area 100 and the second detection area 200 are different areas on the detection surface; a plurality of detection holes 101 are arranged in the first detection area 100, and the central axis direction of each detection hole 101 is along the thickness direction of the card body. It can also be understood that the central axis direction of each detection hole 101 is perpendicular to the detection surface.

[0043] A plurality of detection holes 101 are arranged in an array in the first detection area 100, and the contour shape of the aperture of the detection hole 101 includes a circle, an ellipse, a polygon, etc., and the aperture outer diameters of each detection hole 101 are different. For example, when the aperture of the detection hole 101 is a circle, the diameters of each detection hole 101 are different. In order to improve the convenience and efficiency of detection, the plurality of detection holes 101 can be arranged in an array along a preset direction in the first detection area 100, and the plurality of detection holes 101 are arranged regularly increasing or decreasing according to the size of the aperture outer diameter. For example, the plurality of detection holes 101 are arranged in a row in the first direction Y, and the aperture outer diameters of the plurality of detection holes 101 in the row are arranged increasing or decreasing from one end to the other end in the first direction Y, and the increasing gradient and the decreasing gradient can be less than or equal to 1 mm, for example, the increasing or decreasing gradient is 0.5 mm, etc.

[0044] The aperture size of the detection hole 101 is configured according to the standard value of the surface defect. The aperture size of the detection hole 101 is less than or equal to the standard value of the surface defect. The minimum outer diameter of the detection hole 101 can be 0.5mm. The outer diameters of the detection holes 101 can differ by 0.1mm-1.0mm. The detection holes 101 can be adaptively selected according to the different quality requirements of the surface to be inspected. The detection hole 101 is used to detect and compare whether the area size of the surface defect exceeds the standard value of the surface defect.

[0045] The preset length of the measuring wire 201 can be configured according to the line defect standard. The length dimensions of the measuring wire 201 are all less than or equal to the surface defect standard value. The minimum preset length of the measuring wire 201 can be 1mm. The length dimensions of each measuring wire 201 can differ by 0.5mm-1mm. It can be adaptively selected according to the different quality requirements of the surface to be inspected. The measuring wire 201 is used to detect and compare whether the length dimension of the linear defect exceeds the line defect standard value.

[0046] When using this defect detection card, first, according to the type of defect, a suitable detection area is selected. When the defect is a surface defect, the first detection area 100 is used accordingly. According to the quality grade of the surface to be inspected, the corresponding detection hole 101 is selected for detection. The detection hole 101 is compared with the surface defect on the surface to be inspected. If the detection hole 101 can wrap or surround the surface defect, it proves that the area of ​​the surface defect is smaller than the opening area of ​​the detection hole 101. Therefore, the size of the surface defect meets the standard requirements. On the contrary, if the area of ​​the surface defect exceeds the opening of the detection hole 101, the size of the surface defect does not meet the standard requirements. If the defect is a linear defect, the second detection area 200 is used accordingly. According to the quality grade of the surface to be inspected, the corresponding measuring line 201 is selected for detection. The measuring line 201 is compared with the linear defect on the surface to be inspected. If the length of the measuring line 201 is less than or equal to the length of the linear defect, it proves that the length of the linear defect meets the standard requirements. On the contrary, if the length of the linear defect exceeds the length of the linear defect, it proves that the length of the linear defect does not meet the standard requirements.

[0047] In this embodiment, the defect detection card is used to perform quality inspection on the paint surface after painting. By configuring a first inspection area 100 with a detection hole 101 and a second inspection surface with a measuring line 201, the first inspection area 100 and the second inspection area 200 form a quick judgment area for paint surface problems, and can quickly detect surface defects and linear defects formed on the paint surface respectively. According to different quality requirements of the surface to be inspected, the first inspection area 100 can be configured with multiple detection holes 101 with different outer diameters, and the second inspection area 200 can be configured with multiple measuring lines 201 with different preset lengths. The detection holes 101 with corresponding outer diameters and the measuring lines 201 with corresponding preset lengths are selected according to the levels. When measuring, it is only necessary to compare the detection holes 101 with the surface defects and the measuring lines 201 with the linear defects. It is possible to quickly judge whether the surface defects and linear defects meet the requirements. The judgment process is more intuitive and clear at a glance, and the detection process is faster, which improves the efficiency of judging paint surface problems. The defect detection card is prepared as a unified detection standard card with consistent judgment standards and strong versatility.

[0048] In one embodiment, referring to Figure 2As shown, the first detection area 100 includes a first detection sub-area 110, and the first detection sub-area 110 is formed with multiple rows of first detection holes 111 along the first direction Y. The multiple rows of first detection holes 111 form multiple columns in the second direction X, and the second direction X is perpendicular to the first direction Y; the outer diameters of the multiple first detection holes 111 are not exactly the same.

[0049] Specifically, the first detection sub-area 110 may be a partial area of ​​the first detection area 100. In addition to the first detection sub-area 110, the first detection area 100 may also include other sub-areas that can detect defects; the detection hole 101 includes the first detection hole 111; or, the first detection sub-area 110 may also be the entire area of ​​the first detection area 100, and the detection hole 101 is the first detection hole 111.

[0050] The first direction Y is a direction perpendicular to the thickness of the card body. The first direction Y can be a specific set direction on the detection surface. For example, when the detection surface of the card body is rectangular, the first direction Y can be the length direction of the detection surface or the width direction of the detection surface. Alternatively, the first direction Y can be any direction on the detection surface that forms an angle with the length direction or the width direction.

[0051] A plurality of rows of first detection holes 111 are formed in the first detection sub-area 110 along the first direction Y, and the plurality of first detection holes 111 are arrayed into a plurality of rows, and a plurality of first detection holes 111 are evenly distributed on each row, and the plurality of rows of first detection holes 111 are arranged at intervals in the first direction Y; the plurality of first detection holes 111 on each row are arranged at intervals in the second direction X, and the second direction X is perpendicular to the first direction Y, and, along the second direction X, the plurality of first detection holes 111 can form a plurality of columns, and the plurality of first detection holes 111 on each column are arranged at intervals along the first direction Y. It can be understood that the plurality of first detection holes 111 are arrayed to form a rectangular matrix in the first detection sub-area 110, and the plurality of first detection holes 111 are arranged in an array at intervals in the first direction Y and the second direction X, respectively, so as to form a rectangular array structure with a plurality of rows and a plurality of columns in the first direction Y and the second direction X which are perpendicular to each other.

[0052] For example, a region of first detection holes 111 distributed in three rows and three columns is formed on the first detection sub-area 110, and multiple first detection holes 111 form a three-by-three array matrix in the first detection sub-area 110, so that multiple first detection holes 111 are formed along the first direction Y.

[0053] The outer diameters of the first inspection holes 111 are not exactly the same. The outer diameters of the first inspection holes 111 are set according to product quality standards. A plurality of surface defect standard values ​​are formed according to the product quality standards. The outer diameters of the first inspection holes 111 are set according to the surface defect standard values. When the area of ​​the surface defect exceeds the external area of ​​the first inspection holes 111, it is determined that the surface defect does not meet the quality requirements. When the area of ​​the surface defect is enclosed within the aperture of the first inspection hole 111, it is determined that the surface defect meets the quality requirements.

[0054] In this embodiment, by configuring multiple first detection holes 111 with different outer diameters, the detection card can divide the surface defects into detection according to the product quality standards. The multiple first detection holes 111 are arranged in rows and columns in a matrix, so that the regularity of the detection surface is improved, which facilitates the observation and selection of the first detection holes 111 corresponding to the standard, thereby improving the convenience of use.

[0055] In one embodiment, referring to Figure 2 As shown, the outer diameters of the first detection holes 111 in each row are arranged in increasing order in the second direction X.

[0056] The contour shape of the opening of each first detection hole 111 includes any one of a circle, an ellipse, and a polygon. For example, the contour shape of the opening of the first detection hole 111 is a circle, and the diameters of the multiple first detection holes 111 in each row increase sequentially in the second direction X. Increasing sequentially in the second direction X means that the diameters of the multiple first detection holes 111 in the second direction X increase sequentially from left to right, or increase sequentially from right to left.

[0057] The range of the increasing gradient can be 0.2mm-0.8mm, that is, the increasing gradient of each row of the first detection holes 111 is any value in the range of 0.2mm-0.8mm, and the increasing gradient of the diameters of the multiple first detection holes 111 in each row may be different. For example, the increasing gradient of the diameters of the multiple first detection holes 111 in the first row is 1.0mm, the increasing gradient of the diameters of the multiple first detection holes 111 in the second row is 0.5mm, the increasing gradient of the diameters of the multiple first detection holes 111 in the third row is 1.0mm, and so on. Of course, the increasing gradient can also be 0.2mm, 0.3mm, and so on.

[0058] Optionally, the outer diameters of the first detection holes 111 in each row are arranged to decrease in sequence in the second direction X.

[0059] Similarly, for example, the aperture contour of the first detection hole 111 is circular, and the diameters of the multiple first detection holes 111 in each row decrease successively in the second direction X. Decreasing successively in the second direction X means that the diameters of the multiple first detection holes 111 in the second direction X decrease successively from left to right, or decrease successively from right to left.

[0060] The range of the decreasing gradient can be 0.2mm-0.8mm, that is, the decreasing gradient of each row of the first detection holes 111 is any value in the range of 0.2mm-0.8mm, and the decreasing gradient of the diameters of the multiple first detection holes 111 in each row may be different. For example, the decreasing gradient of the diameters of the multiple first detection holes 111 in the first row is 1.0mm, the decreasing gradient of the diameters of the multiple first detection holes 111 in the second row is 0.5mm, the decreasing gradient of the diameters of the multiple first detection holes 111 in the third row is 1.0mm, and so on. Of course, the decreasing gradient can also be 0.2mm, 0.3mm, and so on.

[0061] Specifically, for example, along the second direction X, the diameter dimensions of each first detection hole 111 in the first row are 1.0 mm, 2.0 mm, and 3.0 mm, respectively; the diameter dimensions of each first detection hole 111 in the second row are 0.5 mm, 1.0 mm, and 1.5 mm, respectively; and the diameter dimensions of each first detection hole 111 in the third row are 1.0 mm, 2.0 mm, and 3.0 mm, respectively.

[0062] In this embodiment, the multiple first detection holes 111 in each row are installed in a regular increasing or decreasing manner, so that the multiple first detection holes 111 in each row form a detection series, and the multiple first detection holes 111 in a row form one detection series. The first detection holes 111 in the first detection sub-area 110 are classified to facilitate unified detection of surface defects in the same detection series, so that detection is more standardized, standards are more unified, and detection diversity can be richer.

[0063] In one embodiment, referring to Figure 2 As shown, a first detection mark 102 is formed at the starting end of each row of first detection holes 111. The first detection mark 102 at least includes an impurity same color mark, an impurity different color mark and a shrinkage hole mark. The first detection mark 102 of each row is different.

[0064] Specifically, the first detection mark 102 is used to identify and define the functions of multiple first detection holes 111 in each row. By setting the first detection mark 102 in each row, each row is classified and labeled to facilitate the user to distinguish the functions of the first detection holes 111 in each row and perform targeted measurements.

[0065] The starting end of each row of first detection holes 111 refers to a side of the first first detection hole 111 in each row away from the adjacent first detection holes 111 , and the first detection mark 102 serves as a functional mark at the end of each row.

[0066] The first detection mark 102 includes at least an impurity same color mark, an impurity different color mark and a shrinkage hole mark. The impurity same color defect refers to a defect in which the color of the impurities on the surface to be inspected is similar to the color of the surface to be inspected. The impurity same color defect on the surface to be inspected is not easy to find compared with the impurity different color. Therefore, the outer diameter size of the first detection hole 111 used to detect the impurity same color defect can be larger than the outer diameter size of the first detection hole 111 used to detect the impurity different color defect. The impurity different color defect refers to the impurity color on the surface to be inspected is different from the color of the surface to be inspected, there is a big difference, and it is easy to find with the naked eye. Shrinkage hole refers to the gap defect formed during the painting process.

[0067] The impurity same-color mark is used to mark the multiple first detection holes 111 in the row for detecting impurity same-color defects in the inspection surface. The apertures and increasing or decreasing gradients of the multiple first detection holes 111 in the row can be set according to the impurity same-color defect standard; the impurity different-color mark is used to mark the multiple first detection holes 111 in the row for detecting impurity different-color defects in the inspection surface. The apertures and increasing or decreasing gradients of the multiple first detection holes 111 in the row can be set according to the impurity different-color defect standard; the shrinkage hole mark is used to mark the multiple first detection holes 111 in the row for detecting shrinkage hole defects in the inspection surface. The apertures and increasing or decreasing gradients of the multiple first detection holes 111 in the row can be set according to the defect standard of shrinkage holes.

[0068] In this embodiment, by configuring the first detection mark 102 at the starting end of each row of first detection holes 111, the operator can easily distinguish the function of each first detection hole 111 and perform targeted comparison and detection, which is beneficial to improving the accuracy and efficiency of detection.

[0069] In one embodiment, referring to Figure 1 and Figure 2 As shown, a second detection mark 103 is formed at the starting end of each column of first detection holes 111. The second detection mark 103 includes at least two different detection surface marks, and each detection surface mark is used to mark (or indicate) a different quality level.

[0070] Specifically, for a vehicle, the vehicle or body has multiple different surfaces to be inspected. When inspecting the body surface, the multiple surfaces to be inspected need to be inspected separately, and the inspection surface identification is used to represent the different surfaces to be inspected; in addition, the quality requirement levels of different surfaces to be inspected of the vehicle are different, so each inspection surface identification can be used to identify different quality levels.

[0071] In this embodiment, multiple first detection holes 111 in the first detection sub-area 110 are arranged in a matrix, and each row of first detection holes 111 is used to detect a type of surface defect, specifically, defects with the same color as impurities, defects with different colors as impurities, and defects with shrinkage cavities can be classified and detected. In addition, each column of first detection holes 111 is aimed at a surface to be inspected of a quality grade, so that for each quality grade of the surface to be inspected, at least comparative detection of impurity defects with the same color, impurity defects with different colors, and shrinkage cavities can be performed, so that the detection function of the detection card is further enhanced and the scope of application is improved.

[0072] In one embodiment, referring to Figure 1 and Figure 2 As shown, the second detection mark 103 includes at least three different detection surface marks, and the quality levels marked by the at least three detection surface marks increase or decrease in the second direction X.

[0073] Specifically, the detection surface identifier can identify the quality level of the surface to be detected. In the second direction X, the quality level represented by the detection surface identifier can be configured in an ascending manner or in a descending manner. For example, the three detection surface identifiers are respectively the A-side detection surface identifier, the B-side detection surface identifier and the C-side detection surface identifier. The quality level represented by the A-side detection surface identifier > the quality level represented by the B-side detection surface identifier > the quality level represented by the C-side detection surface identifier. Then, in the second direction X, from left to right, the detection surface identifiers can be arranged in the order of the A-side detection surface identifier, the B-side detection surface identifier and the C-side detection surface identifier. Alternatively, from left to right, the detection surface identifiers can be arranged in the order of the C-side detection surface identifier, the B-side detection surface identifier and the A-side detection surface identifier.

[0074] In this embodiment, the second detection mark 103 is arranged once according to the quality level of the surface to be detected, so that the arrangement of the first detection holes 111 in the first detection sub-area 110 can be more regular and regular, so as to facilitate the operator to distinguish, so as to achieve the effect of rapid measurement and comparison, and improve the measurement efficiency. The first detection area 100 is a quick judgment area for paint surface defects. Usually, in the process of inspecting vehicle paint surface defects, the most common problems are impurities (including particles, paint residues, etc.) and shrinkage holes. Among them, impurities usually have a separate appearance standard because of the sensory difference of the same color / different colors. By dividing the product quality standards and covering the limit standards (maximum acceptable defect size) corresponding to the A-surface defects, B-surface defects and C-surface defects in the table, the impurities, shrinkage holes and other point or circle problems can be quickly judged.

[0075] In one embodiment, referring to Figure 3As shown, the first detection area 100 further includes a second detection sub-area 120 , which is formed with a plurality of second detection holes 122 arranged in an array and a plurality of detection dark areas 121 for detecting and comparing the sizes of defects on the paint surface.

[0076] Specifically, the central axis of the second detection hole 122 is along the thickness direction of the card body, and the hole mouth contour of the second detection hole 122 can be circular, elliptical or polygonal, etc. The second detection hole 122 can be used to compare irregular point defects (or surface defects), and the area size of the point defects can be intuitively observed and judged from the detection surface of the card body.

[0077] By setting a plurality of second inspection holes 122, the outer diameters of the second inspection holes 122 are not completely equal or completely unequal. Different outer diameters of the second inspection holes 122 represent different quality standard levels. A plurality of second inspection holes 122 with different outer diameters are set to achieve the purpose of detecting and comparing the surface defects on the inspection surface according to different quality standard levels.

[0078] The detection dark area 121 is an opaque dark area formed on the detection surface, for example, a black area. The outer contour of the detection dark area 121 can be circular, elliptical, polygonal, etc. The detection dark area 121 is used to compare regular or relatively regular dot-shaped defects (or surface defects). The area size of the dot-shaped defects can be intuitively observed and judged from the detection surface of the card body to see whether it exceeds the outside of the dark area.

[0079] By setting a plurality of detection dark areas 121, the outer diameters of the detection dark areas 121 are not completely equal or completely unequal, and the outer diameters of different detection dark areas 121 represent different quality standard levels. A plurality of detection dark areas 121 with different outer diameters are set to achieve the purpose of detecting and comparing the surface defects on the inspection surface according to different quality standard levels.

[0080] In one embodiment, referring to Figure 3 As shown, the plurality of second detection holes 122 are arranged in an array along the second direction X, and the aperture sizes of the plurality of second detection holes 122 are sequentially increased or sequentially decreased along the second direction X; the plurality of detection dark areas 121 are arranged in an array along the second direction X, and the outer diameter sizes of the plurality of detection dark areas 121 are sequentially increased or sequentially decreased along the second direction X.

[0081] Specifically, the plurality of second detection holes 122 are arranged at intervals along the second direction X to form a row. The plurality of second detection holes 122 are regularly arranged in the second direction X, for example, arranged according to the size of the aperture size. The aperture sizes of the plurality of second detection holes 122 are arranged in an array in the second direction X in a manner that increases or decreases from left to right.

[0082] Similarly, multiple detection dark areas 121 are arranged at intervals in the second direction X to form a row, and the multiple detection dark areas 121 are regularly arranged in the second direction X. For example, they are arranged according to the size of the outer diameter of the detection dark area 121. The outer contour diameters of the multiple detection dark areas 121 are arranged in an array in the second direction X in a pattern of increasing or decreasing from left to right; wherein, the multiple second detection holes 122 and the multiple detection dark areas 121 may increase or decrease in the same direction, and the change pattern may be the same.

[0083] In this embodiment, all the second detection holes 122 and all the detection dark areas 121 in the second detection sub-area 120 are arranged regularly, which is beneficial to improving the regularity of the detection surface on the one hand, and on the other hand, it is convenient for users to perform regular comparison and observation, thereby improving detection efficiency.

[0084] In one embodiment, referring to Figure 3 As shown, the rows of second detection holes 122 and the rows of detection dark areas 121 are spaced apart along the first direction Y, and the rows of second detection holes 122 and the rows of detection dark areas 121 are combined along the second direction X to form a plurality of columns.

[0085] Specifically, a plurality of second detection holes 122 form a row in the second direction X, a plurality of detection dark areas 121 form a row in the second direction X, the rows of second detection holes 122 and the rows of detection dark areas 121 are arranged at intervals in the second direction X, and, in the first direction Y, one second detection hole 122 corresponds to one detection dark area 121, then, it can be seen that one second detection hole 122 and one detection dark area 121 form a column and are combined into a group.

[0086] The outer contour shape of the opening of each second detection hole 122 is made the same as the outer contour shape of each detection dark area 121 ; and the outer contour dimensions of the second detection holes 122 and the detection dark area 121 in each column are the same.

[0087] Specifically, the second detection holes 122 are circular in shape of the outer contour, and the detection dark area 121 is circular in shape. The number of the second detection holes 122 is the same as the number of the detection dark areas 121, and the diameter of the second detection holes 122 in a row is equal to the diameter of the detection dark area 121. For the same planar defect, the second detection holes 122 of the same size can be used for comparison, and the detection dark area 121 of the same size can also be used for comparison to intuitively judge the shape and area size of the planar defect, so as to facilitate the subsequent selection of different detection dark areas 121 and second detection holes 122 of appropriate sizes for continued measurement, or to facilitate the determination of whether the planar defect is qualified. In this embodiment, the second detection holes 122 and the detection dark areas 121 are arranged in groups to facilitate the comparison of the same planar defect, so as to quickly judge whether the shape and area size of the planar defect meet the requirements, thereby improving the accuracy of the detection.

[0088] In one embodiment, referring to Figure 1-3 As shown, the measuring wire 201 includes a first measuring wire 2011 and a second measuring wire 2012; the second detection area 200 is divided into a fiber detection area and a scratch detection area along a first direction Y, the fiber detection area is configured with a plurality of first measuring wires 2011 with preset lengths, each of the first measuring wires 2011 has a different preset length, and the plurality of first measuring wires 2011 are spaced apart along a second direction X, and the second direction X is perpendicular to the first direction Y; the scratch detection area includes at least one second measuring wire 2012 with a preset length; the preset length of the second measuring wire 2012 is greater than the preset length of the first measuring wire 2011.

[0089] Specifically, the fiber detection area and the scratch detection area are arranged at intervals in the first direction Y, and the multiple first measuring lines 2011 may have different preset lengths. For example, the preset lengths of the first measuring lines 2011 in the second direction X are configured to increase or decrease. The minimum preset length of the first measuring line 2011 is 1 mm, and the increasing gradient or decreasing gradient of the first measuring line 2011 is any value in the range of 0.5 mm-2 mm. The length of the fiber defect is generally not too long. Therefore, for example, the lengths of the multiple first measuring lines 2011 can be 1 mm, 2 mm, 4 mm, etc.

[0090] The second measuring line 2012 may also be provided in plurality, and the second measuring line 2012 also has a preset length. For example, the length of a second measuring line 2012 is 40 mm. The second measuring line 2012 is used to measure scratches on the surface of the vehicle paint. Scratches are generally longer, so the length of the second measuring line 2012 may be greater than the length of the first measuring line 2011.

[0091] Each of the first measurement lines 2011 and each of the second measurement lines 2012 may extend along the second direction X and be arranged in parallel, so as to improve the regularity and uniformity of the entire second detection area 200 .

[0092] In this embodiment, the second detection area 200 is further divided into a fiber detection area for detecting fiber defects and a scratch detection area for detecting paint scratches. A plurality of first measuring wire bodies 2011 with preset lengths are arranged in the fiber detection area, and the length of the fibers on the paint surface is detected by the first measuring bodies. A second measuring body with a longer length is arranged in the scratch detection area, and the length of the paint scratch is measured by the second measuring body, so as to further refine the function of the second detection area 200, enhance the function of the detection card, and improve the detection accuracy of the detection card.

[0093] In one embodiment, referring to Figure 4 and Figure 5 As shown, the detection surface further includes a third detection area 300 , a measurement scale 301 is formed on the third detection area 300 , the detection surface has an edge extending along the first direction Y, and the measurement scale 301 is arranged extending along the edge.

[0094] The card body is rectangular, and the length of the card body along the first direction Y is 90mm-120mm, and the length of the card body perpendicular to the first direction Y is 50mm-80mm, that is, the length of the card body in the second direction X is 50mm-80mm. For example, the length of the card body in the first direction Y is 105mm, and the length in the second direction X is 65mm.

[0095] The length of the measuring scale 301 on the third detection area 300 can be 10 cm, that is, 100 mm; the third detection area 300 is used to measure the frequency of occurrence of particles or impurities within a range of 100 mm, that is, a preset number of defects such as particles or impurities are allowed to appear within a length range of 100 mm or within an area range of 100 mm×100 mm, and the preset number is generally 0, 1, 2, 3, etc., to ensure the quality of the paint surface.

[0096] In this embodiment, the measurement scale 301 on the third detection area 300 can be used to detect the number of particles and impurities within a preset area to ensure that the number of particles or impurities is within the qualified number to ensure the quality of the paint surface.

[0097] In one of the embodiments, the card body is made of transparent PET material to ensure the light transmittance of the detection card, and has a certain toughness so that the detection card can fit on different paint surfaces. In order to ensure the scratch resistance requirements during use, the production process of the detection card needs to adopt a lamination process, which applies pressure and heat to improve the hardness and wear resistance of the detection surface of the card body, so that the film material forms a uniform, high-hardness protective layer on the detection surface, thereby improving the scratch resistance of the detection card.

[0098] In a specific embodiment, referring to Figure 5 and Figure 6As shown, the defect detection card includes a card body, the card body has a detection surface, and at least a first detection area 100 and a second detection area 200 are formed on the detection surface. A plurality of detection holes 101 with different outer diameters are formed on the first detection area 100, and the plurality of detection holes 101 are arranged in an array; a plurality of measuring lines 201 with different preset lengths are formed in the second detection area 200, and the measuring lines 201 are used to compare with the length of the linear defect; the first detection area 100 includes a first detection sub-area 110, and the first detection sub-area 110 is formed with a plurality of rows of first detection holes 111 along a first direction Y, and the plurality of rows of first detection holes 111 form a plurality of columns in a second direction X, and the second direction X is perpendicular to the first direction Y; the outer diameter size of each row of the first detection holes 111 in the second direction X is arranged in ascending order; or each row of first detection holes 111 is arranged in descending order in the second direction X; a first detection mark 102 is formed at the starting end of each row of first detection holes 111, and the first detection mark 102 at least includes an impurity same color mark, an impurity different color mark and a shrinkage mark, and the first detection marks 102 of each row are different; a second detection mark 103 is formed at the starting end of each column of first detection holes 111, and the second detection mark 103 includes at least two different detection surface marks, and each detection surface mark is used to identify a different quality grade; the second detection mark 103 includes at least three different detection surface marks, and the quality grades marked by at least three detection surface marks increase or decrease in the second direction X; the first detection area 100 also includes a second detection sub-area 12 0, the second detection sub-area 120 is formed with a plurality of second detection holes 122 and a plurality of detection dark areas 121 arranged in an array, so as to detect the size of defects on the paint surface; the plurality of second detection holes 122 are arranged in an array along the second direction X, and the aperture sizes of the plurality of second detection holes 122 are sequentially increased or sequentially decreased along the second direction X; the plurality of detection dark areas 121 are arranged in an array along the second direction X, and the outer diameter sizes of the plurality of detection dark areas 121 are sequentially increased or sequentially decreased along the second direction X; the plurality of second detection holes 122 and the plurality of detection dark areas 121 are spaced apart along the first direction Y, and the plurality of second detection holes 122 and the plurality of detection dark areas 121 are combined along the second direction X to form a plurality of columns; the measuring line body 201 includes a first measuring line body 2011 and a second measuring line body 2012. The second detection area 200 is divided into a fiber detection area and a scratch detection area along the first direction Y. The fiber detection area is configured with a plurality of first measuring wires 2011 with preset lengths. The preset lengths of the first measuring wires 2011 are different. The plurality of first measuring wires 2011 are arranged at intervals along the second direction X, and the second direction X is perpendicular to the first direction Y. The scratch detection area includes at least one second measuring wire 2012 with a preset length. The preset length of the second measuring wire 2012 is greater than the preset length of the first measuring wire 2011. The detection surface also includes a third detection area 300. A measuring scale 301 is formed on the third detection area 300. The detection surface has an edge extending along the first direction Y, and the measuring scale 301 is arranged extending along the edge.

[0099] The above are only preferred embodiments of the present application, and only specifically describe the technical principles of the present application. These descriptions are only for explaining the principles of the present application and cannot be interpreted as limiting the scope of protection of the present application in any way. Based on the explanation here, any modifications, equivalent substitutions and improvements made within the spirit and principles of the present application, and other specific implementation methods of the present application that can be associated with the technicians in this field without creative work, should be included in the scope of protection of the present application.

Claims

1. A defect detection card, used for detecting defects on a surface to be inspected, characterized in that: The defect detection card includes a card body, which has a detection surface, on which at least a first detection area and a second detection area are formed, and the first detection area is formed with a plurality of detection holes with different outer diameters, and the plurality of detection holes are arranged in an array; the second detection area is formed with a plurality of measuring lines with different preset lengths, and the measuring lines are used to compare with the length of the linear defects.

2. The defect detection card according to claim 1, characterized in that: The first detection area includes a first detection sub-area, wherein a plurality of rows of first detection holes are formed along a first direction, and the plurality of rows of first detection holes form a plurality of columns in a second direction, and the second direction is perpendicular to the first direction.

3. The defect detection card according to claim 2, characterized in that: The outer diameters of the first detection holes in each row are arranged to increase in sequence in the second direction; or The first detection holes in each row are arranged in descending order in the second direction.

4. The defect detection card according to claim 2 or 3, characterized in that: A first detection mark is formed at the starting end of each row of the first detection holes. The first detection mark at least includes an impurity same color mark, an impurity different color mark and a shrinkage hole mark. The first detection mark of each row is different.

5. The defect detection card according to claim 2 or 3, characterized in that: A second detection mark is formed at the starting end of each column of the first detection holes. The second detection mark includes at least two different detection surface marks, and each detection surface mark is used to identify a different quality level.

6. The defect detection card according to claim 2 or 3, characterized in that: The first detection area also includes a second detection sub-area, and the second detection sub-area is formed with a plurality of second detection holes arranged in an array and a plurality of detection dark areas for detecting the size of defects on the paint surface.

7. The defect detection card according to claim 6, characterized in that: A plurality of the second detection holes are arranged in an array along the second direction, and the aperture sizes of the plurality of the second detection holes increase or decrease successively along the second direction; a plurality of the detection dark areas are arranged in an array along the second direction, and the outer diameter sizes of the plurality of the detection dark areas increase or decrease successively along the second direction.

8. The defect detection card according to claim 7, characterized in that: The rows of the second detection holes and the rows of the detection dark areas are spaced apart along the first direction, and the rows of the second detection holes and the rows of the detection dark areas are combined along the second direction to form a plurality of columns.

9. The defect detection card according to any one of claims 1 to 3, characterized in that: The measuring wire body includes a first measuring wire body and a second measuring wire body; the second detection area is divided into a fiber detection area and a scratch detection area along a first direction, the fiber detection area is configured with a plurality of the first measuring wire bodies with preset lengths, the preset lengths of the first measuring wire bodies are different, and the plurality of the first measuring wire bodies are arranged at intervals along a second direction, and the second direction is perpendicular to the first direction; the scratch detection area includes at least one second measuring wire body with a preset length; the preset length of the second measuring wire body is greater than the preset length of the first measuring wire body.

10. The defect detection card according to claim 6, characterized in that: The detection surface further includes a third detection area, a measurement scale is formed on the third detection area, the detection surface has an edge extending along the first direction, and the measurement scale is arranged to extend along the edge.

11. The defect detection card according to claim 9, characterized in that: The preset length of the first measuring line in the second direction is configured to increase or decrease, the minimum preset length of the first measuring line is 1 mm, and the increasing gradient or decreasing gradient of the first measuring line is any value within the range of 0.5 mm-2 mm.

12. The defect detection card according to claim 9, characterized in that: At least one of the second measuring lines has a length of 40 mm.

13. The defect detection card according to claim 9, characterized in that: Each of the first measuring lines and each of the second measuring lines extend along the second direction and are arranged in parallel.

14. The defect detection card according to claim 8, characterized in that: The outer contour shape of the opening of each of the second detection holes is the same as the outer contour shape of each of the detection dark areas; the outer contour dimensions of the second detection holes and the detection dark areas in each column are the same.

15. The defect detection card according to claim 6, characterized in that: The outer contour of the opening of the second detection hole is circular, and the outer contour of the detection dark area is circular.

16. The defect detection card according to claim 5, characterized in that: The second detection mark includes at least three different detection surface marks, and the quality levels marked by the at least three detection surface marks increase or decrease in the second direction.

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