Electronic component testing equipment

The test device addresses inefficiencies in PCB testing by providing a locking mechanism with a rotating operating member and driving structure for rapid, stable, and accurate connection between the test system and fixture, improving positional accuracy and reducing costs and space requirements.

CN110488180BActive Publication Date: 2025-01-03SIEMENS NUMERICAL CONTROL
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Patent Information

Application Number
CN201910902788.8
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2019-09-24
Publication Date
2025-01-03
Estimated Expiration
2039-09-24

AI Technical Summary

Technical Problem

Existing testing systems for PCBs require multiple test fixtures, leading to high costs and space inefficiencies, and existing connection methods are not suitable for complex test systems, lacking stability and accuracy in fixture positioning.

Method used

A test device with a locking mechanism featuring a rotating operating member, a locking member, and a driving structure that converts torque into horizontal movement for rapid and stable connection between the test system and fixture, utilizing a hook portion and guide plates for precise alignment and locking.

Benefits of technology

Facilitates a fast, stable, and accurate connection between the test system and fixture, reducing operational complexity and enhancing positional accuracy while minimizing space and cost requirements.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present invention relates to a testing device for electronic components, wherein the testing device comprises: a testing system, which is configured to test electronic components; and a testing fixture, which is configured to fix the electronic components on the testing system, wherein the testing system comprises: a locking mechanism, which is used to connect the testing system with the testing fixture, wherein the locking mechanism comprises: an operating member, which is used to operate in a rotational manner; a locking member, which is used to connect and lock the testing fixture; and a driving structure, which is connected between the operating member and the locking member, and is used to convert the torque of the operating member into a driving force that drives the locking member in a horizontal direction, so that the locking member moves in a horizontal direction to switch between a releasing position located on a first side for releasing the testing fixture and a locking position located on a second side for locking the testing fixture.
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Description

Technical Field

[0001] The present invention relates to a testing device for electronic components. Background Art

[0002] During the production process, PCBs need to undergo single-board functional testing. Usually, one PCB requires one test fixture. In order to save costs and floor space, a test system needs to be compatible with multiple test fixtures. There are two main solutions at present: connecting the test fixture to the test system through the grippers on both sides of the test fixture; or, after the test fixture is installed on the test platform from top to bottom, the test fixture is clamped by the grippers on both sides. This method is only suitable for the case where the test system is relatively simple. Summary of the invention

[0003] An object of the present invention is to provide a testing device for electronic components, which provides a fast and stable connection between a testing system and a testing fixture, and the connection has a more accurate structural positioning.

[0004] The present invention provides a test device for electronic components, the test device comprising: a test system, the test system is configured to test electronic components; and a test fixture, the test fixture is configured to fix the electronic components on the test system, wherein the test system comprises: a locking mechanism for connecting the test system with the test fixture, wherein the locking mechanism comprises: an operating member for operating in a rotating manner; a locking member for connecting and locking the test fixture; and a driving structure connected between the operating member and the locking member, for converting the torque of the operating member into a driving force for driving the locking member in a horizontal direction, so that the locking member moves in a horizontal direction to switch between a release position for releasing the test fixture on a first side and a locking position for locking the test fixture on a second side. In order to connect the test system and the test fixture, the test device according to the present invention has a simple structure and is easy to operate, and the operator only needs to operate an operating member to achieve a fast and stable connection between the test fixture and the test system.

[0005] According to an exemplary embodiment of the test device of the present invention, the locking member has a hook portion, the locking member is in an inclined state at the release position, so that the test fixture is easy to connect with the hook portion, and the locking member is in a horizontal state at the locking position, so that the locking member can lock the test fixture. The locking member is oriented in the horizontal direction by the operating member, so that the locking member can easily align with the test fixture to be locked, so that the locking member can quickly switch between the locking position and the release position.

[0006] According to an exemplary embodiment of the test device of the present invention, the driving structure of the locking mechanism includes: a first rotating shaft and a second rotating shaft, wherein the first rotating shaft is connected to the operating member and the second rotating shaft is fixed to be parallel and spaced from the first rotating shaft; a first rotating plate and a second rotating plate, wherein the first rotating plate and the second rotating plate are fixed on the first rotating shaft and the second rotating shaft, respectively; a connecting plate connected between the first rotating plate and the second rotating plate; and a pulling plate fixed on the connecting plate, and the locking members are rotatably mounted on the pulling plates. In the case where the driving mechanism includes a connecting plate, the pulling force that can be easily transmitted to the pulling plate through the connecting plate can realize the rapid movement of the locking member in a short stroke in the horizontal direction.

[0007] According to an exemplary embodiment of the test device of the present invention, the driving structure includes: a first rotating shaft and a second rotating shaft, wherein the first rotating shaft is connected to the operating member and the second rotating shaft is fixed to be parallel and spaced from the first rotating shaft; a first rotating plate and a second rotating plate, wherein the first rotating plate and the second rotating plate are fixed on the first rotating shaft and the second rotating shaft respectively; a first connecting plate, connected between the first rotating plate and the second rotating plate; a first connecting rod and a second connecting rod, wherein the first connecting rod and the second connecting rod are connected to the first rotating plate and the second rotating plate respectively; a second connecting plate, connected between the first connecting rod and the second connecting rod; and a pulling plate, fixed on the second connecting plate, and the locking member is rotatably mounted on the pulling plate. In the case where the driving mechanism includes the first and second connecting plates and the first and second connecting rods, the force on the first connecting plate can be easily transmitted to the second connecting plate, so that the pulling force transmitted to the pulling plate by the second connecting plate can realize the rapid movement of the locking member in the horizontal direction within a long stroke.

[0008] According to an exemplary embodiment of the testing device of the present invention, the driving structure further comprises: a plurality of limit plates fixed on both sides of the locking member, the limit plates being configured to limit the rotation state of the locking member during the horizontal movement. When the locking member moves, the limit plates can force the locking member to change its orientation in the horizontal direction by means of the contact friction between the locking member and the limit plates, thereby changing the locking or releasing state of the locking member.

[0009] According to an exemplary embodiment of the test device of the present invention, the test system further includes a guide plate, and the test fixture includes a guide bar, which cooperates with the guide plate to guide the test fixture to move toward or away from the test system in a horizontal direction. Through the precise cooperation between the guide plate and the guide bar, the test fixture can be accurately aligned with the test system and the test fixture can be engaged with the test system in a predetermined orientation.

[0010] According to an exemplary embodiment of the test device of the present invention, the test system further includes a test system interface board, which is arranged on a surface of the test system; and the test fixture includes a test fixture interface board, wherein the test fixture interface board has a second interface structure corresponding to the first interface structure of the test system interface board. The test system is engaged with the interface board of the test fixture through its interface board to achieve mechanical connection and signal communication between the test system and the test fixture, so as to facilitate the test system to accurately test the electronic components on the test fixture.

[0011] According to an exemplary embodiment of the test device of the present invention, the first interface structure of the test system interface board includes: a plurality of positioning pins and one or more signal transfer pins; and the second interface structure of the test fixture interface board includes a plurality of positioning pin holes, one or more signal transfer holes and a plurality of locking holes corresponding to the positioning pins, the signal transfer pin board and the locking member. The test system provides signal connection, precise positioning and mechanical locking connection between it and the test fixture by means of the signal interface, positioning interface and locking interface on its interface structure.

[0012] According to an exemplary embodiment of the test device of the present invention, the locking member is a hook, which provides a simple and effective locking method between the test system and the test fixture, so that effective and quick locking can be achieved by operating only one operating member.

[0013] According to an exemplary embodiment of the test device of the present invention, the operating member is an operating handle, which provides a convenient and effective operating means for the operator, and a simple and effective locking connection between the test system and the test fixture can be achieved by only operating the operating handle. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] The accompanying drawings constitute a part of this specification and are used to help further understand the present invention. These drawings illustrate embodiments of the present invention and are used together with the specification to explain the principles of the present invention. In the accompanying drawings, the same components are represented by the same reference numerals. The drawings show:

[0015] Figure 1 A perspective view showing a test device according to an embodiment of the present invention.

[0016] Figure 2 A perspective view showing a test fixture of a test device according to an embodiment of the present invention.

[0017] Figure 3 A perspective view showing a locking mechanism of a test system according to an embodiment of the present invention in a released state.

[0018] Figure 4 A perspective view showing a locking mechanism of a test system according to an embodiment of the present invention in a locked state.

[0019] Description of reference numerals:

[0020] 10: test system; 11: locking mechanism; 12: guide plate; 13: test system interface board; 20: test fixture; 21: test fixture interface board; 200: drive structure; 201: pin hole; 202: signal transfer hole; 203: locking hole; 204: guide strip; 110: operating handle connecting block; 111: operating handle; 112: hook; 113: first rotating shaft; 114: second rotating shaft; 115: first rotating plate; 116: second rotating plate; 117: first connecting plate; 118: second connecting plate; 119: first connecting rod; 120: second connecting rod; 121: pull plate; 122: first limiting plate; 123: second limiting plate; 124: boss. DETAILED DESCRIPTION

[0021] In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only embodiments of a part of the present invention, not all embodiments. Based on the embodiments of the present invention, all other solutions obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0022] It should be noted that the terms "including" and "having" and any variations thereof in the specification and claims of the present invention and the above-mentioned drawings are intended to cover non-exclusive inclusions. For example, a product or device comprising a series of units is not necessarily limited to those units explicitly listed, but may include other units that are not listed or inherent to these products or devices.

[0023] Figure 1 A perspective view of a test device according to an embodiment of the present invention is shown. Figure 1The test device for electronic components shown in this embodiment includes a test system 10 and a test fixture 20. The test system 10 is configured to test electronic components, such as PCB circuit boards. The test fixture 20 is configured to fix the electronic components on the test system 10. The test system 10 includes a locking mechanism 11, which is used to lock the test fixture 20 on the test system 10 after the test fixture 20 is engaged with the test system 10. A fixture guide plate 12 is provided on the platform of the test system 10, which is used to guide the test fixture 20 to move to engage with the test system 10 or guide the test fixture 20 to move away from the test system 10. On one surface of the test system 10, for example, on the side of the locking mechanism 11 facing the test fixture 20, a test system interface board 13 is provided, and the test system interface board 13 corresponds to the test fixture interface board of the test fixture 20. An interface structure is provided on the test system interface board 13, and the interface structure includes a plurality of positioning pins and one or more signal transfer pins.

[0024] Figure 2 A perspective view showing a test fixture of a test device according to an embodiment of the present invention. Figure 2 FIG. 2 shows an interface structure of the test fixture interface board 21, wherein the interface structure includes Figure 1 The interface structure of the test system interface board 13 shown in the figure has a plurality of positioning pin holes 201, one or more signal transfer holes 202 and a plurality of locking holes 203 corresponding to the positioning pins, signal transfer pin plates and locking members. Moreover, a guide bar 204 is provided on the lower bottom surface of the test fixture. The guide bar 204 of the test fixture corresponds to the guide plate on the platform of the test system. The test fixture is placed on the platform of the test system so that the guide bar 204 is aligned with the guide plate, and the guide plate guides the sliding of the test fixture so that the interface board of the test fixture is engaged with the interface board of the test system. At this time, with the help of the positioning pin holes 201 on the test fixture and the positioning pins on the test system, the test fixture is accurately positioned relative to the test system. Moreover, with the help of the locking member of the locking mechanism of the test system and the locking hole 203 on the test fixture interface board, the test fixture is locked on the test system.

[0025] Figure 3 FIG. 2 is a perspective view showing a locking mechanism of a test system according to an embodiment of the present invention in a released state. Figure 3As shown, the locking mechanism 11 includes: an operating member, for example, implemented as an operating handle 111, for operating in a rotational manner; a locking member, for example, implemented as a hook 112, for connecting and locking the test fixture; and a driving structure 200, connected between the operating handle 111 and the hook 112, for converting the torque of the operating handle 111 into a driving force for driving the hook 112 in a horizontal direction, so that the hook 112 moves in the horizontal direction to switch between a release position located on the outside for releasing the test fixture and a locking position located on the inside for locking the test fixture. The driving structure 200 includes: a first rotating shaft 113 and a second rotating shaft 114, wherein the first rotating shaft 113 is connected to the operating handle 111, and the second rotating shaft 114 is fixed to be parallel and spaced apart from the first rotating shaft 113; a first rotating plate 115 and a second rotating plate 116, wherein the first rotating plate 115 and the second rotating plate 116 are respectively fixed on the first rotating shaft 113 and the second rotating shaft 114; a first connecting plate 117, connected between the first rotating plate 115 and the second rotating plate 116; a first connecting rod 119 and a second connecting rod 120, wherein the first connecting rod 119 and the second connecting rod 120 are respectively connected to the first rotating plate 115 and the second rotating plate 116; a second connecting plate 118, connected between the first connecting rod 119 and the second connecting rod 120; and a pulling plate 121, fixed on the second connecting plate 118, and the hook 112 is rotatably mounted on the pulling plate 121 via a boss 124. The driving structure further includes: a first limit plate 122 and a second limit plate 123 fixed on both sides of the pull plate 121 , and the first limit plate 122 and the second limit plate 123 are configured to limit the rotation state of the hook 112 during the horizontal movement.

[0026] exist Figure 3In the illustrated embodiment, the hook 112 has a hook portion, and the hook 112 is in an inclined state with the outer end tilted downward in the release position, so that the test fixture is easy to connect with the hook portion, and the hook 112 is in a horizontal state in the locking position, so that the hook 112 can lock the test fixture. The operating handle 111 shown in the figure is fixed on the operating handle connecting block 110, and the operating handle connecting block 110 is connected to the first rotating shaft 113 through a locking pin, so that the operating handle 111 and the first rotating shaft 113 can rotate in the same direction. The first rotating shaft 113 and the second rotating shaft 114 are respectively fixed to the fixed base plates on the left and right sides through pin sleeves, and the first rotating shaft 113 and the second rotating shaft 114 can rotate in the pin sleeves. The first rotating plate 115 shown in the figure is fixed to the first rotating shaft 113 through a locking pin, so that the first rotating plate 115 and the first rotating shaft 113 can rotate in the same direction. The first connecting plate 117 is fixed to the first rotating plate 115 at the lower end, and the second connecting plate 118 is connected to the first rotating plate 115 at the lower end through the first connecting rod 119. Similarly, the first connecting plate 117 is fixed to the second rotating plate 116 at the upper end, and the second connecting plate 118 is connected to the second rotating plate 116 at the upper end through the second connecting rod 120. When the first rotating plate 115 and the second rotating plate 116 rotate, the first connecting plate 117 and the second connecting plate 118 move forward and backward in the plane. At this time, the hook 112 tilts downward and extends, and the operating handle 111 tilts at an angle of 45 degrees, for example.

[0027] In an embodiment not shown, the driving structure of the locking mechanism includes a first rotating shaft 113 and a second rotating shaft 114, wherein the first rotating shaft 113 is connected to the operating handle 111, and the second rotating shaft 114 is fixed to be parallel and spaced from the first rotating shaft 113; a first rotating plate 115 and a second rotating plate 116, wherein the first rotating plate 115 and the second rotating plate 116 are fixed to the first rotating shaft 113 and the second rotating shaft 114, respectively; a connecting plate connected between the first rotating plate 115 and the second rotating plate 116; and a pulling plate 121 fixed to the connecting plate, and the hook 112 is rotatably mounted on the pulling plate 121. Figure 3 The embodiment shown is different in that this embodiment does not have the second connecting plate 118 and the corresponding connecting rod, but only has the first connecting plate 117 and the corresponding rotating plate, and the pulling plate 121 is installed on the first connecting plate 117, so that the pulling plate 121 pulls the hook 112 in the horizontal direction by means of the first connecting plate 117 and the corresponding rotating plate. This further simplifies the driving structure of the locking mechanism.

[0028] Figure 4 FIG. 2 shows a perspective view of a locking mechanism of a test system according to an embodiment of the present invention in a locked state. Figure 4As shown, at this time, the hook 112 is in a horizontal state and retracted, and the operating handle 111 is in a vertical state. The hook 112 can be released and locked by rotating the operating handle 111 about 45 degrees. Specifically, the pull plate 121 is connected to the second connecting plate 118 by screws, and the hook 112 is embedded in the hole of the pull plate 121 through the boss 124. When the second connecting plate 118 moves backward, the pull plate 121 will move backward at the same time, and the hook 112 will move backward under the limiting action of the first limiting plate 122 and the second limiting plate 123, and change from an inclined state to a horizontal state. When the operating handle 111 is pushed to a vertical state, the first connecting rod 119, the second connecting rod 120, the pull plate 121 and the hook 112 are all kept in a horizontal state. At this time, the locking mechanism is in a locked state, and the test fixture is firmly connected to the test system.

[0029] In the embodiments provided by the present invention, it should be understood that the disclosed technical content can be implemented in other ways. Among them, the device embodiments described above are only schematic, for example, the division of the units or modules is only a logical function division, and there may be other division methods in actual implementation, for example, multiple units or modules or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling shown or discussed can be indirect coupling through some interfaces, modules or units, which can be electrical or other forms.

[0030] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A testing device for electronic components, characterized in that The test equipment includes: a testing system (10) configured to test the electronic component; and A test fixture (20) is configured to fix the electronic component on the test system, wherein: The testing system (10) comprises: A locking mechanism (11) for connecting the test system to the test fixture, wherein the locking mechanism comprises: An operating member (111) for operating in a rotational manner; a locking member (112) for connecting and locking the test fixture; and A driving structure (200) is connected between the operating member and the locking member, and the locking member is rotationally connected to the driving structure; the driving structure is used to convert the torque of the operating member into a driving force that drives the locking member in a horizontal direction, so that the locking member can move along the horizontal direction under the action of the driving force and can rotate relative to the driving mechanism, thereby switching between a release position located on the first side for releasing the test fixture and a locking position located on the second side for locking the test fixture.

2. The test device according to claim 1, characterized in that The locking member (112) has a hook portion, and the locking member (112) is in an inclined state at the release position, so that the test fixture is easy to connect with the hook portion, and the locking member (112) is in a horizontal state at the locking position, so that the locking member can lock the test fixture.

3. The testing device according to claim 1, characterized in that The driving structure (200) of the locking mechanism comprises: A first rotating shaft (113) and a second rotating shaft (114), wherein the first rotating shaft is connected to the operating member, and the second rotating shaft is fixed to be parallel to and spaced from the first rotating shaft; A first rotating plate (115) and a second rotating plate (116), wherein the first rotating plate and the second rotating plate are fixed on the first rotating shaft and the second rotating shaft respectively; a connecting plate (117) connected between the first rotating plate and the second rotating plate; and A pull plate (121) is fixed on the connecting plate, and the locking members are rotatably mounted on the pull plate.

4. The testing device according to claim 1, characterized in that The driving structure (200) comprises: A first rotating shaft (113) and a second rotating shaft (114), wherein the first rotating shaft is connected to the operating member, and the second rotating shaft is fixed to be parallel to and spaced from the first rotating shaft; A first rotating plate (115) and a second rotating plate (116), wherein the first rotating plate and the second rotating plate are fixed on the first rotating shaft and the second rotating shaft respectively; A first connecting plate (117), connected between the first rotating plate and the second rotating plate; A first connecting rod (119) and a second connecting rod (120), wherein the first connecting rod and the second connecting rod are connected to the first rotating plate and the second rotating plate respectively; a second connecting plate (118) connected between the first connecting rod and the second connecting rod; and A pull plate (121) is fixed on the second connecting plate, and the locking member is rotatably mounted on the pull plate.

5. The testing device according to claim 1, characterized in that The driving structure (200) further comprises: A plurality of limit plates (122, 123) are fixed on both sides of the locking member, and the limit plates are configured to limit the rotation state of the locking member during the movement in the horizontal direction.

6. The testing device according to claim 1, characterized in that The test system further comprises a guide plate (12), and the test fixture comprises a guide bar (204) which cooperates with the guide plate to guide the test fixture to move toward or away from the test system in a horizontal direction.

7. The testing device according to claim 1, characterized in that The test system further comprises a test system interface board (13) disposed on a surface of the test system; and The test fixture comprises a test fixture interface board (21), wherein the test fixture interface board has a second interface structure corresponding to the first interface structure of the test system interface board.

8. The testing device according to claim 7, characterized in that The first interface structure of the test system interface board (13) comprises: a plurality of positioning pins and one or more signal transfer pins; and The second interface structure of the test fixture interface board (21) comprises a plurality of positioning pin holes, one or more signal transfer holes and a plurality of locking holes corresponding to the positioning pins, the signal transfer pin plate and the locking member.

9. The testing device according to any one of claims 1 to 8, characterized in that The locking member (112) is a hook.

10. The testing device according to any one of claims 1 to 8, characterized in that The operating member (111) is an operating handle.