A structured light three-dimensional scanning device and its calibration method and use method

Abstract

The present invention discloses a structured light three-dimensional scanning device and its calibration method and use method, including a projection system, configured to project a projection image onto an observed object; the projection system at least includes a projection device and a projection lens capable of projecting the projection image; an imaging system, configured to receive the projection image reflected by the observed object; the imaging system at least includes an imaging device and an imaging lens for receiving the reflected projection image; a control system for controlling the projection system and the imaging system; the control system includes at least two calibration parameters; within the effective measurement range of the scanning device, the calibration parameters correspond to the working distance of the three-dimensional scanning device one by one. The present invention provides a structured light three-dimensional scanning device with a variable working distance, which can directly perform three-dimensional measurement on an observed object without recalibrating the corresponding working parameters when the working distance changes or when different use environments are changed, as well as a calibration method and use method of the device.

Description

Technical Field

[0001] The present invention belongs to the field of optics, and in particular, relates to a structured light three-dimensional scanning device and a calibration method and a use method thereof. Background Art

[0002] The measurement of the surface morphology of three-dimensional objects, also known as reverse engineering in the field of mechanical manufacturing, plays an increasingly important role in modern processing and manufacturing and actual production. With the increasing application of non-contact detection technology of the surface shape of three-dimensional objects in scientific research, medical diagnosis, engineering design, criminal investigation scene trace analysis, automatic online detection, quality control, robotics and many production processes, people's requirements for three-dimensional morphology measurement are getting higher and higher, and its application fields are also expanding.

[0003] In the prior art, the field of view of three-dimensional shape measurement technology is changed mainly by changing the working distance and replacing the lens. The former is equivalent to focusing and the latter is equivalent to zooming. The focusing method requires changing the base distance between the projection light path and the imaging light path, that is, changing the structural size of the three-dimensional scanning device. The larger the field of view, the larger the structural size of the scanning device; the zooming method requires replacing the projection and imaging lenses; although the existing three-dimensional scanning technology also uses marker points to determine the working distance, the marker points are not eccentrically set, and the imaging position of the marker points cannot be changed as the working distance changes, that is, the working distance cannot be distinguished. Furthermore, both the focusing and zooming methods need to be changed and the three-dimensional scanning device must be calibrated before three-dimensional measurement can be performed.

[0004] A Chinese patent application with application number CN201510416362.3 discloses a three-dimensional scanning microscope and a method for three-dimensional scanning by fringe projection, which utilizes a fringe projection device with a synchronous trigger mode and an accurate pixel corresponding mode and a fringe acquisition device with a synchronous trigger installed on a stereo microscope for projection and shooting respectively. The sequential fringe pattern projected by the fringe projection device is emitted from the objective lens through the internal fringe projection optical path of the stereo microscope and then projected onto the surface of the observed object. The fringe acquisition device obtains the sequential fringe image of the surface of the observed object through the internal fringe acquisition optical path of the stereo microscope. The two are performed synchronously, making the projection and shooting more efficient.

[0005] The Chinese patent application number CN201120019181.4 discloses a structured light three-dimensional shape measurement device, including a projector and a camera, the projector and the camera are arranged on a bracket, the distance between the projector and the camera is adjustable, the projection optical path of the projector and the imaging optical path of the camera are parallel, and at least one of the projection lens of the projector and the imaging lens of the camera is eccentric. The measurement device uses the eccentric imaging principle of the projection lens and / or the imaging lens to make the optical center of the projection field coincide with the optical center of the imaging field at the object distance position, and the projection field and the imaging field overlap at the object distance position, thereby increasing the distance between the optical axis of the projector and the optical axis of the camera, thereby forming a shadow-free high-precision measurement area.

[0006] Although the above-mentioned prior art solves the problem of three-dimensional shape measurement to a certain extent, there is still a situation where the three-dimensional scanning device needs to be recalibrated when the working distance or the use environment is changed, which greatly reduces the use efficiency and application scope.

[0007] Therefore, it is necessary to improve the shortcomings and defects of the prior art and provide a structured light three-dimensional scanning device that can directly perform three-dimensional measurement of the observed object without re-calibrating the corresponding working distance parameters when the working distance changes or when a different usage environment is changed, as well as a calibration method and a method of using the device.

[0008] In view of this, the present invention is proposed. Summary of the invention

[0009] The technical problem to be solved by the present invention is to overcome the deficiencies of the prior art and provide a structured light three-dimensional scanning device that can overcome the above problems or at least partially solve the above problems.

[0010] Another object of the present invention is to provide a calibration method for the above-mentioned structured light three-dimensional scanning device.

[0011] Another object of the present invention is to provide a method for using the above-mentioned structured light three-dimensional scanning device.

[0012] In order to solve the above technical problems, the basic concept of the technical solution adopted by the present invention is: a structured light three-dimensional scanning device, comprising

[0013] a projection system configured to project a projection image onto an observed object;

[0014] The projection system at least includes a projection device capable of projecting a projection image and a projection lens;

[0015] an imaging system configured to receive a projected image reflected by an observed object;

[0016] The imaging system at least includes an imaging device for receiving the reflected projection image and an imaging lens;

[0017] A control system for controlling the projection system and the imaging system;

[0018] Said

[0019] The control system includes at least two calibration parameters;

[0020] Within the effective measuring range of the scanning device, the calibration parameters correspond one to one with the working distance of the three-dimensional scanning device.

[0021] Among them, the

[0022] The calibration parameters in the control system are parameter matrices generated by calibrating the parameters of the three-dimensional scanning device using a standard object after the working distance of the three-dimensional scanning device is determined.

[0023] Furthermore, the calibration performed using the working distance of the three-dimensional scanning device is continuous.

[0024] Furthermore, the calibration performed using the working distance of the three-dimensional scanning device is performed according to the depth of field interval corresponding to the working distance or at a certain regular or random interval.

[0025] Furthermore, the projection light path of the projection system and the imaging light path of the imaging system are arranged as parallel light paths.

[0026] In one embodiment, the base distance between the projection system and the imaging system is a fixed value.

[0027] In one embodiment, the base distance between the projection system and the imaging system is greater than the eccentricity of the projection mark point on the image plane of the projection system.

[0028] In addition, a structured light three-dimensional scanning device includes

[0029] a projection system configured to project a projection image onto an observed object;

[0030] The projection system at least includes a projection device capable of projecting a projection mark point and a projection lens;

[0031] an imaging system configured to receive a projected image reflected by an observed object;

[0032] The imaging system at least includes an imaging device and an imaging lens that receive imaging mark points formed by the reflected projection image;

[0033] A control system for controlling the projection system and the imaging system;

[0034] Said

[0035] The projection mark point is set eccentrically with the optical center of the projection lens;

[0036] On the imaging device, the position of the imaging mark point relative to the optical center of the imaging system corresponds one-to-one to the working distance of the three-dimensional scanning device.

[0037] Among them, the

[0038] The control system includes at least two calibration parameters;

[0039] The calibration parameters are configured as a parameter matrix generated by calibrating the position of the imaging mark point relative to the optical center of the imaging system within the effective measurement range of the scanning device.

[0040] Furthermore, the position of the imaging marker point relative to the optical center of the imaging system is calibrated pixel by pixel.

[0041] In one embodiment, the calibration of the imaging mark points relative to the optical center of the imaging system is performed according to the depth of field interval corresponding to the working distance or at a certain regular or random interval.

[0042] Furthermore, the changing of the working distance between the three-dimensional scanning device and the observed object is achieved by changing the distance between the three-dimensional scanning device and the observed object.

[0043] In one embodiment, the projection light path of the projection system and the imaging light path of the imaging system are arranged as parallel light paths.

[0044] In one embodiment, the base distance between the projection system and the imaging system is a fixed value.

[0045] In one embodiment, the base distance between the projection system and the imaging system is greater than the eccentricity of the projection mark point on the image plane of the projection system.

[0046] Furthermore, a calibration method for a structured light three-dimensional scanning device comprises the following steps:

[0047] S1. Place the 3D scanning device at a certain working distance from the object to be observed;

[0048] S2. The projection device projects the mark point to the observed object through the projection lens, and the imaging device receives the imaging mark point reflected back by the observed object;

[0049] S3. Obtaining the position of the imaging mark point on the imaging device relative to the optical center of the imaging system, and calibrating the position;

[0050] S4. Acquire the position parameters of the imaging marker points calibrated in step S3 in the control system to form calibration parameters;

[0051] S5. Change the working distance of the three-dimensional scanning device, repeat steps S2-S4, obtain multiple imaging mark points, and then obtain multiple calibration parameters corresponding to the imaging mark point position parameters.

[0052] Wherein, the projection mark point is eccentrically arranged with respect to the optical center of the projection lens.

[0053] Furthermore, the calibration parameters are configured as a parameter matrix generated by calibration according to the working distance of the three-dimensional scanning device within the effective measurement range of the scanning device.

[0054] In one embodiment, the calibrated imaging marker points are calibrated pixel by pixel in the imaging device relative to the optical center of the imaging system.

[0055] In one embodiment, the calibrated imaging mark points are calibrated at positions in the imaging device relative to the optical center of the imaging system according to the depth of field intervals corresponding to the working distance or at regular or random intervals.

[0056] Furthermore, the changing of the working distance between the three-dimensional scanning device and the observed object is to change the distance between the three-dimensional scanning device and the observed object to achieve the change of the working distance.

[0057] In one embodiment, the projection light path of the projection system and the imaging light path of the imaging system are arranged as parallel light paths.

[0058] In one embodiment, the base distance between the projection system and the imaging system is a fixed value.

[0059] In one embodiment, the base distance between the projection system and the imaging system is greater than the eccentricity of the projection mark point on the image plane of the projection system.

[0060] At the same time, a method for using the structured light three-dimensional scanning device includes the following steps:

[0061] S1. Place the 3D scanning device at a certain working distance from the object to be observed;

[0062] S2. The projection device projects the mark point to the observed object through the projection lens, and the imaging device receives the imaging mark point reflected back by the observed object;

[0063] S3. Acquire the position of the imaging marker point on the imaging device relative to the optical center of the imaging system;

[0064] S4. Determine the calibration parameters by obtaining the position parameters of the imaging marker points calibrated in step S3 in the control system;

[0065] S5. Call the calibration parameters at the calibration position in the control system to perform three-dimensional scanning.

[0066] Wherein, the projection mark point is eccentrically arranged with respect to the optical center of the projection lens.

[0067] Furthermore, the calibration parameters are configured as a parameter matrix generated by calibration according to the working distance of the three-dimensional scanning device within the effective measurement range of the scanning device.

[0068] In one embodiment, the imaging marker point is calibrated pixel by pixel relative to the optical center of the imaging system.

[0069] Furthermore, after the working distance is changed, in the imaging device, the calibration parameters can be obtained by obtaining the position parameters of the imaging mark points.

[0070] In one embodiment, the changing of the working distance between the three-dimensional scanning device and the observed object is achieved by changing the distance between the three-dimensional scanning device and the observed object.

[0071] Furthermore, the projection light path of the projection system and the imaging light path of the imaging system are arranged as parallel light paths.

[0072] In one embodiment, the base distance between the projection system and the imaging system is a fixed value.

[0073] In one embodiment, the base distance between the projection system and the imaging system is greater than the eccentricity of the projection mark point on the image plane of the projection system.

[0074] Furthermore, a method for using the structured light three-dimensional scanning device comprises the following steps:

[0075] S1. Place the 3D scanning device at a certain working distance from the object to be observed;

[0076] S2. The projection device projects the mark point to the observed object through the projection lens, and the imaging device receives the imaging mark point reflected back by the observed object;

[0077] S3. Acquire the position of the imaging marker point on the imaging device relative to the optical center of the imaging system;

[0078] S4. In the control system, the calibration parameters are determined by obtaining the position parameters of the imaging marker points in step S3;

[0079] S5. Compare the acquired imaging mark point position with the calibrated imaging mark point position, adjust the working distance of the three-dimensional scanning device to the observed object, and observe the position of the imaging mark point received by the imaging device on the imaging device until it is aligned with the calibrated position on the imaging device;

[0080] S6. Call the calibration parameters at the calibration position in the control system to perform three-dimensional scanning.

[0081] Wherein, the projection mark point is eccentrically arranged with respect to the optical center of the projection lens.

[0082] Furthermore, the calibration parameters are configured as a parameter matrix generated by calibration according to the working distance of the three-dimensional scanning device within the effective measurement range of the scanning device.

[0083] In one embodiment, the calibrated imaging mark points are calibrated at positions in the imaging device relative to the optical center of the imaging system according to the depth of field intervals corresponding to the working distance or at regular or random intervals.

[0084] Furthermore, after changing the working distance, in the imaging device, the calibration parameters can be obtained by aligning the imaging mark point with the calibration imaging mark point.

[0085] In one embodiment, the changing of the working distance between the three-dimensional scanning device and the observed object is achieved by changing the distance between the three-dimensional scanning device and the observed object.

[0086] Furthermore, the projection light path of the projection system and the imaging light path of the imaging system are arranged as parallel light paths.

[0087] In one embodiment, the base distance between the projection system and the imaging system is a fixed value.

[0088] In one embodiment, the base distance between the projection system and the imaging system is greater than the eccentricity of the projection mark point on the image plane of the projection system.

[0089] After adopting the above technical solution, the present invention has the following beneficial effects compared with the prior art:

[0090] 1. The present invention presets a plurality of calibration parameters calibrated according to different working distances in the three-dimensional scanning device, so that the three-dimensional scanning device can quickly perform three-dimensional measurement work at different working distances, avoiding the inconvenience caused by repeated calibration parameters at different working distances, and improving work efficiency;

[0091] 2. The present invention sets the projection mark point eccentrically to the optical center of the projection lens, so that different working distances correspond to the calibration parameters one by one;

[0092] 3. Setting multiple calibration positions improves the reliability of the 3D scanning device during use and effectively ensures the accuracy of the 3D measurement of the observed object;

[0093] 4. The base distance between the projection system and the imaging system is a fixed value, so that the working distance becomes the only variable during the measurement process, improving the stability of the measurement;

[0094] 5. The imaging optical paths of the projection system and the imaging system are arranged in parallel, which makes the overall structure of the device compact and further improves the portability and adaptability to different working conditions.

[0095] The specific implementation modes of the present invention are further described in detail below in conjunction with the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0096] The accompanying drawings are part of the present invention and are used to provide a further understanding of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention, but do not constitute an improper limitation of the present invention. Obviously, the accompanying drawings described below are only some embodiments. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without creative work.

[0097] In the attached picture:

[0098] Figure 1 It is a schematic structural diagram of a structured light three-dimensional scanning device with a variable working distance according to the present invention.

[0099] In the figure: 1. Projection system; 2. Imaging system; 3. Observed object; 4. Projection device; 5. Imaging device; 6. Projection lens; 7. Imaging lens; 8. Working distance; 9. Calibration parameters; 10. Base distance; 11. Control system.

[0100] It should be noted that these drawings and textual descriptions are not intended to limit the conceptual scope of the present invention in any way, but are intended to illustrate the concept of the present invention for those skilled in the art by referring to specific embodiments. DETAILED DESCRIPTION

[0101] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. The following embodiments are used to illustrate the present invention but are not used to limit the scope of the present invention.

[0102] In the description of the present invention, it should be noted that the directions or positional relationships indicated by terms such as “upper”, “lower”, “front”, “back”, “left”, “right”, “vertical”, “inside” and “outside” are based on the directions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as a limitation on the present invention.

[0103] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0104] like Figure 1 As shown, a structured light three-dimensional scanning device described in the present invention is used in measurement work in which the working distance 8 changes or the working state is frequently changed, for example, three-dimensional scanning work of police scene investigation, three-dimensional scanning measurement of different workpieces, and three-dimensional image scanning and imaging of human face skin, etc. Specifically, it includes a projection system 1, which is configured to project a projection image onto an observed object 3; the projection system 1 at least includes a projection device 4 that can project a projection mark point, and a focusable projection lens 6; the projection mark point is eccentrically arranged with the optical center of the projection lens 6; an imaging system 2, which is configured to receive the projection image reflected by the observed object 3; The imaging system 2 at least includes an imaging device 5 for receiving the projection mark point image, i.e., the imaging mark point, and an imaging lens 7 with adjustable focus; a control system 11 for controlling the projection system 1 and the imaging system 2; on the imaging device 5, the position of the imaging mark point relative to the optical center of the imaging system 2 corresponds to the working distance 8 of the three-dimensional scanning device, and this position is called the working position. The setting of the position of the imaging mark point relative to the optical center of the imaging system 2 and the working distance 8 of the three-dimensional scanning device in a one-to-one correspondence allows the three-dimensional scanning device to accurately locate the working position at different working distances 8, and then perform corresponding operations to achieve three-dimensional scanning measurement. After changing the working distance 8, the calibration parameter 9 can be obtained by aligning the working position with the calibration position on the imaging device 5.

[0105] Among them, the control system 11 includes at least two calibration parameters 9, and the calibration parameters 9 in the control system 11 correspond to the position of the imaging mark point relative to the optical center of the imaging system 2 and the different working distances 8 of the three-dimensional scanning device. Different working distances 8 will show imaging mark points at different positions on the imaging device 5 from the optical center. This position corresponds to the working distance 8, so this position is called the working position. Calibration of this position generates the calibration position and calibration parameter 9. Repeat this operation for different working distances 8 to generate the preset calibration parameters 9 in the control system 11. In the process of generating the calibration parameters 9, the present invention adopts two methods. The first is the full arrangement calibration of the calibration parameters 9, that is, the left and right positions relative to the optical center of the imaging system 2 on the full imaging device 5 are calibrated by pixels. The second is to select some points at the left and right positions to set the calibration parameters 9. Based on the above two methods, the three-dimensional scanning device described in the present invention also has two corresponding methods of use, which are as follows:

[0106] A method for using a structured light three-dimensional scanning device with a variable working distance of 8 includes the structured light three-dimensional scanning device with a variable working distance of 8 as described above, and further includes the following steps:

[0107] S1. Place the device at a certain working distance 8 from the object to be observed;

[0108] S2. The projection device 4 projects the mark point to the observed object 3 through the projection lens 6, and the imaging device 5 receives the image of the projected mark point reflected back by the observed object 3 through the imaging lens 7;

[0109] S3. Calculate the position of the imaging marker point received by the imaging device 5 on the imaging device 5 relative to the optical center of the imaging system 2, which is called the working position;

[0110] S4 obtains the calibration position through the working position, and calls the calibration parameters 9 at the calibration position to perform three-dimensional scanning.

[0111] This method is used in a solution where the calibration parameters 9 are arranged pixel by pixel, that is, all corresponding imaging mark points are distributed on the imaging device 5 relative to the left and right positions of the optical center of the imaging system 2 .

[0112] A method for using a structured light three-dimensional scanning device with a variable working distance of 8 includes the structured light three-dimensional scanning device with a variable working distance of 8 as described above, and further includes the following steps:

[0113] S1. Place the device at a certain working distance 8 from the object to be observed;

[0114] S2. The projection device 4 projects the mark point to the observed object 3 through the projection lens 6, and the imaging device 5 receives the image of the projected mark point reflected back by the observed object 3 through the imaging lens 7;

[0115] S3. Calculate the position (working position) of the imaging mark point received by the imaging device 5 on the imaging device 5 relative to the optical center of the imaging system 2 and compare it with the calibrated position on the imaging device 5;

[0116] S4. Adjust the distance between the three-dimensional scanning device and the observed object 3, and observe the working position received by the imaging device 5 until it is aligned with the calibration position on the imaging device 5;

[0117] S5. Call the calibration parameter 9 of the working distance 8 corresponding to the calibration position to perform three-dimensional scanning.

[0118] This method is used under the scheme of selecting some points to set the calibration parameters 9. This method requires certain adjustments to the position of the three-dimensional scanning device so that the working position received by the imaging device 5 is aligned with the calibration position on the imaging device 5.

[0119] The present invention presets a plurality of calibration parameters 9 calibrated according to different working distances 8 in the three-dimensional scanning device, so that the three-dimensional scanning device can quickly perform three-dimensional measurement at different working distances 8, avoids the inconvenience caused by repeated calibration of parameters 9 at different working distances 8, and improves work efficiency. The projection mark point is eccentrically set to the optical center of the projection lens 6, so that different working distances 8 correspond to the calibration parameters 9 one by one, and a plurality of calibration positions are set at the same time, so as to improve the reliability of the three-dimensional scanning device during use, and effectively ensure the accuracy of the three-dimensional measurement of the observed object.

[0120] Embodiment 1

[0121] like Figure 1 As shown, a structured light three-dimensional scanning device described in this embodiment includes a projection system 1, which is configured to project a projection image onto an observed object 3; the projection system 1 at least includes a projection device 4 that can project a projection image, and a projection lens 6; an imaging system 2, which is configured to receive a projection image reflected by the observed object 3; the imaging system 2 at least includes an imaging device 5 that receives the reflected projection image, and an imaging lens 7; a control system 11, which controls the projection system 1 and the imaging system 2; the control system 11 includes at least two calibration parameters 9; within the effective measurement range of the scanning device, the calibration parameters 9 correspond one-to-one to the working distance 8 of the three-dimensional scanning device. Those skilled in the art can understand the projection system 1 as an industrial-grade optical projection module that can project video images and sequential fringe images, such as an optical projector or other projection devices commonly used by skilled technicians in three-dimensional scanning, and the imaging system 2 can be understood as a device capable of receiving a reflected image, such as a CCD camera or other camera devices commonly used by skilled technicians in three-dimensional scanning.

[0122] Among them, the calibration parameters 9 in the control system 11 are parameter matrices generated after the working distance 8 of the three-dimensional scanning device is determined and the parameters of the three-dimensional scanning device are calibrated using a standard object. When in use, the operator places the three-dimensional scanning device at a certain working distance 8 from the observed object 3, and the projection system 1 projects the corresponding projection image to the observed object 3. The imaging system 2 receives the projection image reflected back by the observed object 3, and after collecting its position relative to the optical center of the imaging system 2, the working distance 8 is transmitted to the control system 11. The control system 11 compares the pre-stored parameters with it, selects the aligned calibration position, and calls the corresponding calibration parameters 9 to perform three-dimensional scanning. After changing the working distance 8, the calibration parameters 9 can be obtained by aligning the working position with the calibration position on the imaging device 5.

[0123] Embodiment 2

[0124] like Figure 1 As shown, this embodiment is a further limitation of the above-mentioned embodiment 1. The calibration performed by the working distance 8 of the three-dimensional scanning device described in this embodiment is continuous. The continuous manner is that the calibration positions are continuously distributed on the imaging device 5 by pixels. There is a calibration parameter 9 corresponding to any working position on the imaging device 5. The operator can directly call the corresponding calibration parameter 9 to perform three-dimensional scanning.

[0125] Embodiment 3

[0126] like Figure 1 As shown, this embodiment is a further limitation of any of the above-mentioned embodiments 1 or 2. The calibration performed by using the working distance 8 of the three-dimensional scanning device in this embodiment is performed according to the depth of field interval corresponding to the working distance 8 or at a certain regular or random interval. In this calibration method, the calibrated positions are distributed at a certain interval on the imaging device 5 where the working position is located, and the working position has calibration parameters 9 corresponding to certain positions. Such a setting requires the operator to move the three-dimensional scanning device when performing three-dimensional scanning so that the working position can coincide with the calibration position, that is, align, so as to call the corresponding calibration parameters 9.

[0127] Embodiment 4

[0128] like Figure 1 As shown, this embodiment is a further limitation of any one of the embodiments described in embodiments 1 to 3 above. In this embodiment, the projection optical path of the projection system 1 and the imaging optical path of the imaging system 2 are arranged as parallel optical paths. The parallel optical paths can reduce the size of the entire device, improve the portability of the device and its adaptability to different environments.

[0129] Specifically, when the working distance 8 between the three-dimensional scanning device and the observed object 3 changes, the user can focus the projection lens 6 and the imaging lens 7 to make the working position clearly imaged in the imaging device 5, and the projection light path of the projection system 1 and the imaging light path of the imaging system 2 are thus set in parallel. There is no parameter change during the adjustment process, thereby enhancing the measurement stability of the device.

[0130] Embodiment 5

[0131] like Figure 1As shown, this embodiment is a further limitation of any one of the embodiments described in embodiments 1 to 4 above. In this embodiment, the base distance 10 between the projection system 1 and the imaging system 2 is a fixed value. When the working distance 8 between the three-dimensional scanning device and the observed object 3 changes, the user can adjust the projection lens 6 so that the projected image can be clearly imaged in the imaging system 2, while the base distance 10 between the projection system 1 and the imaging system 2 remains unchanged. There is no parameter change during the adjustment process, thereby enhancing the measurement stability of the device.

[0132] Embodiment 6

[0133] like Figure 1 As shown, this embodiment is a further limitation of any one of the embodiments described in embodiments 1 to 7 above. In this embodiment, the base distance 10 between the projection system 1 and the imaging system 2 is greater than the eccentricity of the projection image on the image plane of the projection system 1. This arrangement facilitates projecting the projection image to one side of the image plane of the projection system 1; and the image of the projection image in the imaging system 2 is concentrated on the other side of the imaging device 5, which also makes the structure of the three-dimensional scanning device more compact.

[0134] Embodiment 7

[0135] like Figure 1 As shown, a structured light three-dimensional scanning device described in this embodiment includes a projection system 1, which is configured to project a projection image onto an observed object 3; the projection system 1 at least includes a projection device 4 that can project a projection mark point, and a projection lens 6; an imaging system 2, which is configured to receive a projection image reflected by the observed object 3; the imaging system 2 at least includes an imaging device 5 and an imaging lens 7 that receive imaging mark points formed by the reflected projection image; a control system 11, which controls the projection system 1 and the imaging system 2; the projection mark point is eccentrically arranged with respect to the optical center of the projection lens 6; on the imaging device 5, the position of the imaging mark point relative to the optical center of the imaging system 2 corresponds one-to-one to the working distance 8 of the three-dimensional scanning device, and those skilled in the art may understand the projection system 1 as an industrial-grade optical projection module that can project video images and sequential stripe images, such as an optical projector or other projection devices commonly used by skilled technicians in three-dimensional scanning, and the imaging system 2 may be understood as a device capable of receiving a reflected image, such as a CCD camera or other camera devices commonly used by skilled technicians in three-dimensional scanning.

[0136] The control system 11 includes at least two calibration parameters 9; the calibration parameters 9 are configured as parameter matrices generated by calibration according to the position of the imaging mark points relative to the optical center of the imaging system 2 within the effective measurement range of the scanning device. When in use, the operator places the three-dimensional scanning device at a certain working distance 8 from the observed object 3, and the projection system 1 projects the corresponding projection mark point image to the observed object 3. The imaging system 2 receives the projection mark point image reflected back by the observed object 3, i.e., the imaging mark points, and collects its position relative to the optical center of the imaging system 2, and transmits it to the control system 11. The control system 11 compares the pre-stored calibration position with it, selects the aligned calibration position, and calls the corresponding calibration parameters 9 to perform three-dimensional scanning. After changing the working distance 8, the calibration parameters 9 can be obtained by aligning the working position with the calibration position on the imaging device 5.

[0137] Embodiment 8

[0138] like Figure 1 As shown, this embodiment is a further limitation of the above-mentioned embodiment seven. In this embodiment, the imaging mark point is calibrated relative to the optical center of the imaging system 2 on a pixel-by-pixel basis. The pixel-by-pixel calibration method is that the calibration positions are continuously distributed on the imaging device 5 by pixels. There is a calibration parameter 9 corresponding to any working position on the imaging device 5. The operator can directly call the corresponding calibration parameter 9 to perform three-dimensional scanning.

[0139] Embodiment 9

[0140] like Figure 1 As shown, this embodiment is a further limitation of any of the above-mentioned embodiments 7 or 8. The calibration of the imaging mark point relative to the optical center of the imaging system 2 in this embodiment is performed according to the depth of field interval corresponding to the working distance 8 or at a certain regular or random interval. In this calibration method, the calibrated positions are distributed at a certain interval on the imaging device 5 where the working position is located, and the working position has calibration parameters 9 corresponding to it at certain positions. Such a setting requires the operator to move the three-dimensional scanning device when performing three-dimensional scanning so that the working position can coincide with the calibration position, that is, align, so as to call the corresponding calibration parameters 9.

[0141] Embodiment 10

[0142] like Figure 1 As shown, this embodiment is a further limitation of any one of the above-mentioned embodiments 7 to 9. In this embodiment, the projection light path of the projection system 1 and the imaging light path of the imaging system 2 are arranged as parallel light paths. The parallel light paths can reduce the size of the entire device, improve the portability of the device and its adaptability to different environments.

[0143] Specifically, when the working distance 8 between the three-dimensional scanning device and the observed object 3 changes, the user can focus the projection lens 6 and the imaging lens 7 to make the working position clearly imaged in the imaging device 5, and the projection light path of the projection system 1 and the imaging light path of the imaging system 2 are thus set in parallel. There is no parameter change during the adjustment process, thereby enhancing the measurement stability of the device.

[0144] Embodiment 11

[0145] like Figure 1 As shown, this embodiment is a further limitation of any of the above-mentioned embodiments 7 to 10. In this embodiment, the base distance 10 between the projection system 1 and the imaging system 2 is a fixed value. When the working distance 8 between the three-dimensional scanning device and the observed object 3 changes, the user can adjust the projection lens 6 so that the projection mark point can be clearly imaged in the imaging system 2, while the base distance 10 between the projection system 1 and the imaging system 2 remains unchanged. There is no parameter change during the adjustment process, thereby enhancing the measurement stability of the device.

[0146] Embodiment 12

[0147] like Figure 1 As shown, this embodiment is a further limitation of any one of the above-mentioned embodiments from seventh to eleventh. In this embodiment, the base distance 10 between the projection system 1 and the imaging system 2 is greater than the eccentricity of the projection mark point on the image plane of the projection system 1. This arrangement facilitates projecting the projection mark point to one side of the image plane of the projection system 1; and the imaging mark point is concentrated on the other side of the imaging device 5, which also makes the structure of the three-dimensional scanning device more compact.

[0148] Embodiment 13

[0149] like Figure 1 As shown, the calibration method of a three-dimensional scanning device described in this embodiment includes the following steps:

[0150] S1. Place the three-dimensional scanning device at a certain working distance 8 from the object to be observed;

[0151] S2. The projection device 4 projects the marking point to the observed object 3 through the projection lens 6, and the imaging device 5 receives the imaging marking point reflected back by the observed object 3;

[0152] S3. Obtain the position of the imaging mark point on the imaging device 5 relative to the optical center of the imaging system 2, and calibrate the position;

[0153] S4. Acquire the position parameters of the imaging marker points calibrated in step S3 in the control system 11, and then form the calibration parameters 9;

[0154] S5. Change the working distance 8 of the three-dimensional scanning device, repeat steps S2-S4, obtain multiple imaging mark points, and then obtain multiple calibration parameters 9 corresponding to the imaging mark points.

[0155] Embodiment 14

[0156] like Figure 1 As shown, this embodiment is a further limitation of the above-mentioned embodiment thirteen. The projection mark point described in this embodiment is eccentrically arranged with respect to the optical center of the projection lens 6. On the imaging device 5, the position of the imaging mark point relative to the optical center of the imaging system 2 corresponds one-to-one with the working distance 8 of the three-dimensional scanning device. Those skilled in the art may understand the projection system 1 as an industrial-grade optical projection module that can project video images and sequential fringe images, such as an optical projector or other projection equipment commonly used by skilled technicians in three-dimensional scanning. The imaging system 2 may be understood as a device capable of receiving reflected images, such as a CCD camera or other camera equipment commonly used by skilled technicians in three-dimensional scanning.

[0157] The control system 11 includes at least two calibration parameters 9; the calibration parameters 9 are configured as parameter matrices generated by calibration according to the position of the imaging mark points relative to the optical center of the imaging system 2 within the effective measurement range of the scanning device. When in use, the operator places the three-dimensional scanning device at a certain working distance 8 from the observed object 3, and the projection system 1 projects the corresponding projection mark point image to the observed object 3. The imaging system 2 receives the projection mark point image reflected back by the observed object 3, i.e., the imaging mark points, and collects its position relative to the optical center of the imaging system 2, and transmits it to the control system 11. The control system 11 compares the pre-stored calibration position with it, selects the aligned calibration position, and calls the corresponding calibration parameters 9 to perform three-dimensional scanning. After changing the working distance 8, the calibration parameters 9 can be obtained by aligning the working position with the calibration position on the imaging device 5.

[0158] Embodiment 15

[0159] like Figure 1 As shown, this embodiment is a further limitation of any of the above-mentioned embodiments thirteen or fourteen. In this embodiment, the calibration of the imaging mark point relative to the optical center of the imaging system 2 is performed pixel by pixel. The pixel-by-pixel calibration method is that the calibration positions are continuously distributed on the imaging device 5 by pixels. There is a calibration parameter 9 corresponding to any working position on the imaging device 5. The operator can directly call the corresponding calibration parameter 9 to perform three-dimensional scanning.

[0160] Embodiment 16

[0161] like Figure 1As shown, this embodiment is a further limitation of any of the above-mentioned embodiments 13 to 15. The calibration of the imaging mark point relative to the optical center of the imaging system 2 in this embodiment is performed according to the depth of field interval corresponding to the working distance 8 or at a certain regular or random interval. In this calibration method, the calibrated positions are distributed at a certain interval on the imaging device 5 where the working position is located, and the working position has calibration parameters 9 corresponding to certain positions. Such a setting requires the operator to move the three-dimensional scanning device when performing three-dimensional scanning so that the working position can coincide with the calibration position, that is, align, so as to call the corresponding calibration parameters 9.

[0162] Embodiment 17

[0163] like Figure 1 As shown, this embodiment is a further limitation of any one of the embodiments described in Examples 13 to 16 above. The three-dimensional scanning device described in this embodiment realizes the calibration of the calibration parameter 9 in the control system 11 by changing the working distance 8 between the three-dimensional scanning device and the observed object 3. Furthermore, the change of the working distance 8 between the three-dimensional scanning device and the observed object 3 is to change the distance between the three-dimensional scanning device and the observed object 3, and\or, adjust the projection lens 6, and\or, the focal length or magnification of the imaging lens 7, and any one or a combination of several methods to realize the change of the working distance 8.

[0164] Embodiment 18

[0165] like Figure 1 As shown, this embodiment is a further limitation of any one of the embodiments 13 to 17 above. In this embodiment, the projection light path of the projection system 1 and the imaging light path of the imaging system 2 are arranged as parallel light paths. The parallel light paths can reduce the size of the entire device, improve the portability of the device and its adaptability to different environments.

[0166] Specifically, when the working distance 8 between the three-dimensional scanning device and the observed object 3 changes, the user can focus the projection lens 6 and the imaging lens 7 to make the working position clearly imaged in the imaging device 5, and the projection light path of the projection system 1 and the imaging light path of the imaging system 2 are thus set in parallel. There is no parameter change during the adjustment process, thereby enhancing the measurement stability of the device.

[0167] Embodiment 19

[0168] like Figure 1As shown, this embodiment is a further limitation of any one of the embodiments 13 to 18 above. In this embodiment, the base distance 10 between the projection system 1 and the imaging system 2 is a fixed value. When the working distance 8 between the three-dimensional scanning device and the observed object 3 changes, the user can adjust the projection lens 6 so that the projection mark point can be clearly imaged in the imaging system 2, while the base distance 10 between the projection system 1 and the imaging system 2 remains unchanged. There is no parameter change during the adjustment process, thereby enhancing the measurement stability of the device.

[0169] Embodiment 20

[0170] like Figure 1 As shown, this embodiment is a further limitation of any one of the above-mentioned embodiments thirteen to nineteen. In this embodiment, the base distance 10 between the projection system 1 and the imaging system 2 is greater than the eccentricity of the projection mark point on the image plane of the projection system 1. This arrangement facilitates projecting the projection mark point to one side of the image plane of the projection system 1; and the imaging mark point is concentrated on the other side of the imaging device 5, which also makes the structure of the three-dimensional scanning device more compact.

[0171] Embodiment 21

[0172] like Figure 1 As shown, the method for using a three-dimensional scanning device described in this embodiment includes the following steps:

[0173] S1. Place the three-dimensional scanning device at a certain working distance 8 from the object to be observed;

[0174] S2. The projection device 4 projects the marking point to the observed object 3 through the projection lens 6, and the imaging device 5 receives the imaging marking point reflected back by the observed object 3;

[0175] S3. Obtain the position of the imaging mark point on the imaging device 5 relative to the optical center of the imaging system 2, and calibrate the position;

[0176] S4. Acquire the position parameters of the imaging marker points calibrated in step S3 in the control system 11, and then form the calibration parameters 9;

[0177] S5. Call the calibration parameters 9 at the calibration position in the control system 11 to perform three-dimensional scanning.

[0178] This method is used in a solution in which the calibration parameter 9 is fully arranged, that is, all corresponding projection mark points are fully distributed at the positions of the optical center of the imaging system 2 .

[0179] Embodiment 22

[0180] like Figure 1As shown, this embodiment is a further limitation of the above-mentioned embodiment twenty-one. The projection mark point described in this embodiment is eccentrically arranged with respect to the optical center of the projection lens 6. On the imaging device 5, the position of the imaging mark point relative to the optical center of the imaging system 2 corresponds one-to-one to the working distance 8 of the three-dimensional scanning device. Those skilled in the art may understand the projection system 1 as an industrial-grade optical projection module that can project video images and sequential fringe images, such as an optical projector or other projection equipment commonly used by skilled technicians in three-dimensional scanning. The imaging system 2 may be understood as a device capable of receiving a reflected image, such as a CCD camera or other camera equipment commonly used by skilled technicians in three-dimensional scanning.

[0181] The control system 11 includes at least two calibration parameters 9; the calibration parameters 9 are configured as parameter matrices generated by calibration according to the position of the imaging mark points relative to the optical center of the imaging system 2 within the effective measurement range of the scanning device. When in use, the operator places the three-dimensional scanning device at a certain working distance 8 from the observed object 3, and the projection system 1 projects the corresponding projection mark point image to the observed object 3. The imaging system 2 receives the projection mark point image reflected back by the observed object 3, i.e., the imaging mark points, and collects its position relative to the optical center of the imaging system 2, and transmits it to the control system 11. The control system 11 compares the pre-stored calibration position with it, selects the aligned calibration position, and calls the corresponding calibration parameters 9 to perform three-dimensional scanning. After changing the working distance 8, the calibration parameters 9 can be obtained by aligning the working position with the calibration position on the imaging device 5.

[0182] Embodiment 23

[0183] like Figure 1 As shown, this embodiment is a further limitation of any of the above-mentioned embodiments 21 or 22. In this embodiment, the calibration of the position of the imaging mark point relative to the optical center of the imaging system 2 is performed pixel by pixel. The pixel-by-pixel calibration method is that the calibration positions are continuously distributed on the imaging device 5 by pixels. The working position has a corresponding calibration parameter 9 at any position on the imaging device 5. The operator can directly call the corresponding calibration parameter 9 to perform three-dimensional scanning.

[0184] Embodiment 24

[0185] like Figure 1As shown, this embodiment is a further limitation of any one of the embodiments described in Examples 21 to 23 above. The three-dimensional scanning device described in this embodiment realizes the calibration of the calibration parameter 9 in the control system 11 by changing the working distance 8 between the three-dimensional scanning device and the observed object 3. Furthermore, the change of the working distance 8 between the three-dimensional scanning device and the observed object 3 is to change the distance between the three-dimensional scanning device and the observed object 3, and\or, adjust the projection lens 6, and\or, the focal length or magnification of the imaging lens 7, or a combination of any one or more of the above methods to realize the change of the working distance 8.

[0186] Embodiment 25

[0187] like Figure 1 As shown, this embodiment is a further limitation of any one of the embodiments described in Embodiments 21 to 24 above. In this embodiment, the projection optical path of the projection system 1 and the imaging optical path of the imaging system 2 are arranged as parallel optical paths. The parallel optical paths can reduce the size of the entire device, improve the portability of the device and its adaptability to different environments.

[0188] Specifically, when the working distance 8 between the three-dimensional scanning device and the observed object 3 changes, the user can focus the projection lens 6 and the imaging lens 7 to make the working position clearly imaged in the imaging device 5, and the projection light path of the projection system 1 and the imaging light path of the imaging system 2 are thus set in parallel. There is no parameter change during the adjustment process, thereby enhancing the measurement stability of the device.

[0189] Embodiment 26

[0190] like Figure 1 As shown, this embodiment is a further limitation of any one of the embodiments described in Embodiments 21 to 25 above. In this embodiment, the base distance 10 between the projection system 1 and the imaging system 2 is a fixed value. When the working distance 8 between the three-dimensional scanning device and the observed object 3 changes, the user can adjust the projection lens 6 so that the projection mark point can be clearly imaged in the imaging system 2, while the base distance 10 between the projection system 1 and the imaging system 2 remains unchanged. There is no parameter change during the adjustment process, thereby enhancing the measurement stability of the device.

[0191] Embodiment 27

[0192] like Figure 1 As shown, this embodiment is a further limitation of any one of the embodiments described in Examples 21 to 26 above. In this embodiment, the base distance 10 between the projection system 1 and the imaging system 2 is greater than the eccentricity of the projection mark point on the image plane of the projection system 1. This arrangement facilitates projecting the projection mark point to one side of the image plane of the projection system 1; and the imaging mark point is concentrated on the other side of the imaging device 5, which also makes the structure of the three-dimensional scanning device more compact.

[0193] Embodiment 28

[0194] like Figure 1 As shown, the method for using a three-dimensional scanning device described in this embodiment includes the following steps:

[0195] S1. Place the three-dimensional scanning device at a certain working distance 8 from the object to be observed;

[0196] S2. The projection device 4 projects the marking point to the observed object 3 through the projection lens 6, and the imaging device 5 receives the imaging marking point reflected back by the observed object 3;

[0197] S3. Obtain the position of the imaging mark point on the imaging device 5 relative to the optical center of the imaging system 2, and calibrate the position;

[0198] S4. Acquire the position parameters of the imaging marker points calibrated in step S3 in the control system 11, and then form the calibration parameters 9;

[0199] S5. Compare the obtained working position with the calibration position, adjust the working distance 8 of the three-dimensional scanning device to the observed object 3, and observe the working position of the imaging mark point received by the imaging device 5 on the imaging device 5 until it is aligned with the calibration position on the imaging device 5;

[0200] S6. Call the calibration parameters 9 at the calibration position in the control system 11 to perform three-dimensional scanning.

[0201] This method is used under the scheme of selecting some points to set the calibration parameters 9. This method requires certain adjustments to the position of the three-dimensional scanning device so that the position of the mark point received by the imaging device 5 on the imaging device 5 relative to the optical center of the imaging system 2 is aligned with the calibration position in the control system 11.

[0202] Embodiment 29

[0203] like Figure 1 As shown, this embodiment is a further limitation of the above-mentioned embodiment twenty-eight. The projection mark point described in this embodiment is eccentrically arranged with respect to the optical center of the projection lens 6. On the imaging device 5, the position of the imaging mark point relative to the optical center of the imaging system 2 corresponds one-to-one with the working distance 8 of the three-dimensional scanning device. Those skilled in the art may understand the projection system 1 as an industrial-grade optical projection module that can project video images and sequential fringe images, such as an optical projector or other projection devices commonly used by skilled technicians in three-dimensional scanning. The imaging system 2 may be understood as a device capable of receiving a reflected image, such as a CCD camera or other camera devices commonly used by skilled technicians in three-dimensional scanning.

[0204] The control system 11 includes at least two calibration parameters 9; the calibration parameters 9 are configured as parameter matrices generated by calibration according to the position of the imaging mark points relative to the optical center of the imaging system 2 within the effective measurement range of the scanning device. When in use, the operator places the three-dimensional scanning device at a certain working distance 8 from the observed object 3, and the projection system 1 projects the corresponding projection mark point image to the observed object 3. The imaging system 2 receives the projection mark point image reflected back by the observed object 3, i.e., the imaging mark points, and collects its position relative to the optical center of the imaging system 2, and transmits it to the control system 11. The control system 11 compares the pre-stored calibration position with it, selects the aligned calibration position, and calls the corresponding calibration parameters 9 to perform three-dimensional scanning. After changing the working distance 8, the calibration parameters 9 can be obtained by aligning the working position with the calibration position on the imaging device 5.

[0205] Embodiment 30

[0206] like Figure 1 As shown, this embodiment is a further limitation of any of the above-mentioned embodiments 28 or 29. The calibration of the imaging mark point relative to the optical center of the imaging system 2 described in this embodiment is performed according to the depth of field interval corresponding to the working distance 8 or at a certain regular or random interval. In this calibration method, the calibrated positions are distributed at a certain interval on the imaging device 5 where the working position is located, and the working position has calibration parameters 9 corresponding to certain positions. Such a setting requires the operator to move the three-dimensional scanning device when performing a three-dimensional scan so that the working position can coincide with the calibration position, that is, align, so as to call the corresponding calibration parameters 9. Furthermore, after changing the working distance 8, in the imaging device 5, the calibration parameters 9 can be obtained by aligning the imaging mark point with the calibration.

[0207] Embodiment 31

[0208] like Figure 1 As shown, this embodiment is a further limitation of any one of the embodiments described in Examples 28 to 30 above. The three-dimensional scanning device described in this embodiment realizes the calibration of the calibration parameter 9 in the control system 11 by changing the working distance 8 between the three-dimensional scanning device and the observed object 3. Furthermore, the change of the working distance 8 between the three-dimensional scanning device and the observed object 3 is to change the distance between the three-dimensional scanning device and the observed object 3, and\or, adjust the projection lens 6, and\or, the focal length or magnification of the imaging lens 7, and any one or a combination of several methods to realize the change of the working distance 8.

[0209] Embodiment 32

[0210] like Figure 1As shown, this embodiment is a further limitation of any one of the embodiments described in Examples 28 to 31 above. In this embodiment, the projection optical path of the projection system 1 and the imaging optical path of the imaging system 2 are arranged as parallel optical paths. The parallel optical paths can reduce the size of the entire device, improve the portability of the device and its adaptability to different environments.

[0211] Specifically, when the working distance 8 between the three-dimensional scanning device and the observed object 3 changes, the user can focus the projection lens 6 and the imaging lens 7 to make the working position clearly imaged in the imaging device 5, and the projection light path of the projection system 1 and the imaging light path of the imaging system 2 are thus set in parallel. There is no parameter change during the adjustment process, thereby enhancing the measurement stability of the device.

[0212] Embodiment 33

[0213] like Figure 1 As shown, this embodiment is a further limitation of any one of the embodiments described in Examples 28 to 32 above. In this embodiment, the base distance 10 between the projection system 1 and the imaging system 2 is a fixed value. When the working distance 8 between the three-dimensional scanning device and the observed object 3 changes, the user can adjust the projection lens 6 so that the projection mark point can be clearly imaged in the imaging system 2, while the base distance 10 between the projection system 1 and the imaging system 2 remains unchanged. There is no parameter change during the adjustment process, thereby enhancing the measurement stability of the device.

[0214] Embodiment 34

[0215] like Figure 1 As shown, this embodiment is a further limitation of any one of the embodiments described in Examples 28 to 33 above. In this embodiment, the base distance 10 between the projection system 1 and the imaging system 2 is greater than the eccentricity of the projection mark point on the image plane of the projection system 1. This arrangement facilitates projecting the projection mark point to one side of the image plane of the projection system 1; and the imaging mark point is concentrated on the other side of the imaging device 5, which also makes the structure of the three-dimensional scanning device more compact.

[0216] In the description provided herein, a large number of specific details are described. However, it is understood that embodiments of the present invention can be practiced without these specific details. In some instances, well-known methods, structures and techniques are not shown in detail so as not to obscure the understanding of this description.

[0217] Similarly, it should be understood that in order to streamline the present disclosure and aid in understanding one or more of the various inventive aspects, in the above description of exemplary embodiments of the present invention, various features of the present invention are sometimes grouped together into a single embodiment, figure, or description thereof. However, this disclosed method should not be interpreted as reflecting the intention that the claimed invention requires more features than those explicitly recited in each claim. More specifically, as reflected in the claims below, inventive aspects lie in less than all the features of the individual embodiments disclosed above. Therefore, the claims that follow the specific embodiment are hereby expressly incorporated into the specific embodiment, with each claim itself serving as a separate embodiment of the present invention.

[0218] All features disclosed in this specification (including accompanying claims, abstracts and drawings) and all processes or units of any method or device disclosed in this specification (including accompanying claims, abstracts and drawings) may be combined in any combination, except that at least some of such features and / or processes or units are mutually exclusive. Unless otherwise expressly stated, each feature disclosed in this specification (including accompanying claims, abstracts and drawings) may be replaced by an alternative feature providing the same, equivalent or similar purpose.

[0219] In addition, those skilled in the art will appreciate that, although some embodiments described herein include certain features included in other embodiments but not other features, the combination of features of different embodiments is meant to be within the scope of the present invention and form different embodiments. For example, in the claims below, any one of the claimed embodiments may be used in any combination.

[0220] It should be noted that the above embodiments illustrate the present invention rather than limit it, and that those skilled in the art may design alternative embodiments without departing from the scope of the appended claims. In the claims, any reference symbol between brackets should not be constructed as a limitation to the claims. The word "comprising" does not exclude the presence of elements or steps not listed in the claims. The word "one" or "an" preceding an element does not exclude the presence of multiple such elements. In a unit claim that lists several devices, several of these devices may be embodied by the same hardware item. The use of the words first, second, and third, etc. does not indicate any order. These words may be interpreted as names.

[0221] The above is only a preferred embodiment of the present invention, and does not limit the present invention in any form. Although the present invention has been disclosed as a preferred embodiment, it is not used to limit the present invention. Any technician familiar with this patent can make some changes or modify the technical contents suggested above into equivalent embodiments without departing from the scope of the technical solution of the present invention. However, any simple modification, equivalent change and modification made to the above embodiments according to the technical essence of the present invention without departing from the content of the technical solution of the present invention still fall within the scope of the solution of the present invention.

Claims

1. A structured light three-dimensional scanning device, comprising: A projection system (1) configured to project a projection image onto an observed object (3); The projection system (1) comprises at least a projection device (4) capable of projecting a projection image, and a projection lens (6); An imaging system (2) configured to receive a projected image reflected by an observed object (3); The imaging system (2) comprises at least an imaging device (5) for receiving the reflected projection image and an imaging lens (7); A control system (11) for controlling the projection system (1) and the imaging system (2); Features: The projected image at least includes a projection mark point, the projection mark point is eccentrically arranged with respect to the optical center of the projection lens (6), the projection mark point imaged by the imaging system (2) is the imaging mark point, the position of the imaging mark point relative to the optical center of the imaging system (2) corresponds one-to-one to the working distance of the three-dimensional scanning device, and this position is referred to as the working position; The control system (11) includes at least two calibration parameters (9); Within the effective measurement range of the scanning device, the calibration parameters (9) correspond to the working distance (8) of the three-dimensional scanning device one by one; after changing the working distance (8), the calibration parameters can be obtained by aligning the working position with the calibration position on the imaging device (5); The three-dimensional scanning device can accurately locate the working position at different working distances (8), and then perform corresponding operations to achieve three-dimensional scanning measurement.

2. The structured light 3D scanning device according to claim 1, characterized in that: The calibration parameters (9) in the control system (11) are parameter matrices generated by calibrating the parameters of the three-dimensional scanning device using a standard object after the working distance (8) of the three-dimensional scanning device is determined.

3. A structured light three-dimensional scanning device according to claim 1 or 2, characterized in that: The calibration performed using the working distance (8) of the three-dimensional scanning device is continuous.

4. A structured light three-dimensional scanning device according to claim 1 or 2, characterized in that: The calibration performed using the working distance (8) of the three-dimensional scanning device is performed according to the depth of field interval corresponding to the working distance (8) or at a certain regular or random interval.

5. A structured light 3D scanning device according to any one of claims 1-2, characterized in that: The projection light path of the projection system (1) and the imaging light path of the imaging system (2) are arranged as parallel light paths; The calibrated position is the position of a pre-stored calibrated imaging mark point relative to the optical center of the imaging system (2).

6. The structured light 3D scanning device according to claim 5, characterized in that: The base distance (10) between the projection system (1) and the imaging system (2) is a fixed value.

7. The structured light three-dimensional scanning device according to claim 6, characterized in that: The base distance (10) between the projection system (1) and the imaging system (2) is greater than the eccentricity of the projection mark point on the image plane of the projection system (1).

8. A structured light three-dimensional scanning device, comprising: A projection system (1) configured to project a projection image onto an observed object (3); The projection system (1) comprises at least a projection device (4) capable of projecting a projection mark point, and a projection lens (6); An imaging system (2) configured to receive a projected image reflected by an observed object (3); The imaging system (2) comprises at least an imaging device (5) for receiving imaging mark points formed by the reflected projection image, and an imaging lens (7); A control system (11) for controlling the projection system (1) and the imaging system (2); Features: Said The projection mark point is eccentrically arranged with respect to the optical center of the projection lens (6); On the imaging device (5), the position of the imaging mark point relative to the optical center of the imaging system (2) corresponds one-to-one to the working distance (8) of the three-dimensional scanning device; A plurality of calibration parameters (9) calibrated according to different working distances (8) are preset, and different working distances (8) are made to correspond to the calibration parameters (9) one by one, and working positions are made to correspond to the working distances (8) one by one.

9. The structured light three-dimensional scanning device according to claim 8, characterized in that: Said The control system (11) includes at least two calibration parameters (9); The calibration parameters (9) are configured as a parameter matrix generated by calibrating the position of the imaging mark point relative to the optical center of the imaging system (2) within the effective measurement range of the scanning device.

10. A structured light three-dimensional scanning device according to claim 8 or 9, characterized in that: The position of the imaging mark point relative to the optical center of the imaging system (2) is calibrated pixel by pixel.

11. A structured light three-dimensional scanning device according to claim 8 or 9, characterized in that: The calibration of the position of the imaging mark point relative to the optical center of the imaging system (2) is performed according to the depth of field interval corresponding to the working distance (8) or at a certain regular or random interval.

12. The structured light 3D scanning device according to claim 9, characterized in that: The three-dimensional scanning device achieves calibration of calibration parameters (9) in a control system (11) by changing a working distance (8) between the three-dimensional scanning device and an observed object (3).

13. The structured light 3D scanning device according to claim 12, characterized in that: The changing of the working distance (8) between the three-dimensional scanning device and the observed object (3) is achieved by changing the distance between the three-dimensional scanning device and the observed object (3).

14. A structured light three-dimensional scanning device according to any one of claims 8 to 9, characterized in that: The projection light path of the projection system (1) and the imaging light path of the imaging system (2) are arranged as parallel light paths.

15. The structured light three-dimensional scanning device according to claim 14, characterized in that: The base distance (10) between the projection system (1) and the imaging system (2) is a fixed value.

16. The structured light three-dimensional scanning device according to claim 14, characterized in that: The base distance (10) between the projection system (1) and the imaging system (2) is greater than the eccentricity of the projection mark point on the image plane of the projection system (1).

17. A calibration method using the structured light 3D scanning device according to any one of claims 1 to 16, characterized in that: The following steps are included: S1. The three-dimensional scanning device is placed at a certain working distance (8) from the object to be observed (3); S2. The projection device (4) projects a marking point onto the observed object (3) through the projection lens (6), and the imaging device (5) receives the imaging marking point reflected back by the observed object (3); S3. Obtain the position of the imaging mark point on the imaging device (5) relative to the optical center of the imaging system (2), and calibrate the position; S4. Obtaining the position parameters of the imaging marker points calibrated in step S3 in the control system (11), thereby forming calibration parameters (9); S5. Change the working distance (8) of the three-dimensional scanning device, repeat steps S2-S4, obtain multiple imaging mark points, and then obtain multiple calibration parameters (9) corresponding to the imaging mark point position parameters.

18. The calibration method of a structured light 3D scanning device according to claim 17, characterized in that: The projection mark point is eccentrically arranged with respect to the optical center of the projection lens (6).

19. The calibration method of a structured light 3D scanning device according to claim 18, characterized in that: The calibration parameters (9) are configured as a parameter matrix generated by calibration according to the working distance (8) of the three-dimensional scanning device within the effective measurement range of the scanning device.

20. A calibration method for a structured light 3D scanning device according to any one of claims 17 to 19, characterized in that: The calibration of imaging marker points is a pixel-by-pixel calibration of the position of the imaging device (5) relative to the optical center of the imaging system (2).

21. A calibration method for a structured light 3D scanning device according to any one of claims 17 to 19, characterized in that: The calibrated imaging mark points are calibrated at positions in the imaging device (5) relative to the optical center of the imaging system (2) according to the depth of field interval corresponding to the working distance (8) or at certain regular or random intervals.

22. The calibration method of a structured light 3D scanning device according to claim 17, characterized in that: The changing of the working distance (8) between the three-dimensional scanning device and the observed object (3) is to change the distance between the three-dimensional scanning device and the observed object (3) to achieve the change of the working distance (8).

23. A calibration method for a structured light 3D scanning device according to any one of claims 17 to 19, characterized in that: The projection light path of the projection system (1) and the imaging light path of the imaging system (2) are arranged as parallel light paths.

24. The calibration method of a structured light 3D scanning device according to claim 23, characterized in that: The base distance (10) between the projection system (1) and the imaging system (2) is a fixed value.

25. The calibration method of a structured light 3D scanning device according to claim 23, characterized in that: The base distance (10) between the projection system (1) and the imaging system (2) is greater than the eccentricity of the projection mark point on the image plane of the projection system (1).

26. A method for using the structured light three-dimensional scanning device according to any one of claims 1 to 16, characterized in that: The following steps are included: S1. The three-dimensional scanning device is placed at a certain working distance (8) from the object to be observed (3); S2. The projection device (4) projects a marking point onto the observed object (3) through the projection lens (6), and the imaging device (5) receives the imaging marking point reflected back by the observed object (3); S3. Obtaining the position of the imaging marker point on the imaging device (5) relative to the optical center of the imaging system (2); S4. In the control system (11), the calibration parameters (9) are determined by obtaining the position parameters of the imaging marker points calibrated in step S3; S5. Call the calibration parameters (9) at the calibration position in the control system (11) to perform three-dimensional scanning.

27. The method for using the structured light three-dimensional scanning device according to claim 26, characterized in that: The projection mark point is eccentrically arranged with respect to the optical center of the projection lens (6).

28. The method for using the structured light three-dimensional scanning device according to claim 26, characterized in that: The calibration parameters (9) are configured as a parameter matrix generated by calibration according to the working distance (8) of the three-dimensional scanning device within the effective measurement range of the scanning device.

29. A method for using a structured light three-dimensional scanning device according to any one of claims 26 to 28, characterized in that: The position of the imaging mark point relative to the optical center of the imaging system (2) is calibrated pixel by pixel.

30. A method for using a structured light three-dimensional scanning device according to any one of claims 26 to 28, characterized in that: After the working distance (8) is changed, in the imaging device (5), the position parameters of the imaging mark points are obtained to obtain the calibration parameters (9).

31. The method for using the structured light three-dimensional scanning device according to claim 30, characterized in that: Changing the working distance (8) between the three-dimensional scanning device and the observed object (3) is achieved by changing the distance between the three-dimensional scanning device and the observed object (3).

32. A method for using a structured light three-dimensional scanning device according to any one of claims 26-28, characterized in that: The projection light path of the projection system (1) and the imaging light path of the imaging system (2) are arranged as parallel light paths.

33. The method for using the structured light three-dimensional scanning device according to claim 32, characterized in that: The base distance (10) between the projection system (1) and the imaging system (2) is a fixed value.

34. The method for using the structured light three-dimensional scanning device according to claim 33, characterized in that: The base distance (10) between the projection system (1) and the imaging system (2) is greater than the eccentricity of the projection mark point on the image plane of the projection system (1).

35. A method for using the structured light three-dimensional scanning device according to any one of claims 1 to 16, characterized in that: The following steps are included: S1. The three-dimensional scanning device is placed at a certain working distance (8) from the object to be observed (3); S2. The projection device (4) projects a marking point onto the observed object (3) through the projection lens (6), and the imaging device (5) receives the imaging marking point reflected back by the observed object (3); S3. Obtaining the position of the imaging marker point on the imaging device (5) relative to the optical center of the imaging system (2); S4. In the control system (11), the calibration parameters (9) are determined by obtaining the position parameters of the imaging marker points in step S3; S5. Compare the acquired imaging mark point position with the calibrated imaging mark point position, adjust the working distance (8) of the three-dimensional scanning device to the observed object (3), and observe the position of the imaging mark point received by the imaging device (5) on the imaging device (5) until it is aligned with the calibrated position on the imaging device (5); S6. Call the calibration parameters (9) at the calibration position in the control system (11) to perform three-dimensional scanning.

36. The method for using the structured light three-dimensional scanning device according to claim 35, characterized in that: The projection mark point is eccentrically arranged with respect to the optical center of the projection lens (6).

37. The method for using the structured light three-dimensional scanning device according to claim 35, characterized in that: The calibration parameters (9) are configured as a parameter matrix generated by calibration according to the working distance (8) of the three-dimensional scanning device within the effective measurement range of the scanning device.

38. A method for using a structured light three-dimensional scanning device according to any one of claims 35 to 37, characterized in that: The calibrated imaging mark points are calibrated at positions in the imaging device (5) relative to the optical center of the imaging system (2) according to the depth of field interval corresponding to the working distance (8) or at certain regular or random intervals.

39. A method for using a structured light three-dimensional scanning device according to any one of claims 35 to 37, characterized in that: After the working distance (8) is changed, in the imaging device (5), the imaging mark point is aligned with the calibration imaging mark point to obtain the calibration parameter (9).

40. The method for using the structured light three-dimensional scanning device according to claim 39, characterized in that: Changing the working distance (8) between the three-dimensional scanning device and the observed object (3) is achieved by changing the distance between the three-dimensional scanning device and the observed object (3).

41. A method for using a structured light three-dimensional scanning device according to any one of claims 35 to 37, characterized in that: The projection light path of the projection system (1) and the imaging light path of the imaging system (2) are arranged as parallel light paths.

42. The method for using the structured light three-dimensional scanning device according to claim 41, characterized in that: The base distance (10) between the projection system (1) and the imaging system (2) is a fixed value.

43. The method for using the structured light three-dimensional scanning device according to claim 42, characterized in that: The base distance (10) between the projection system (1) and the imaging system (2) is greater than the eccentricity of the projection mark point on the image plane of the projection system (1).

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