Shutter assembly testing system and method

Abstract

The present application discloses a shutter component test system and method, the system includes: a detection and control host computer, the detection and control host computer includes a first processor for outputting shutter test configuration information; a main control circuit system connected to the host computer includes: a communication interface for obtaining shutter test configuration information; a main control chip for outputting a drive command corresponding to the shutter test configuration information; a power drive device connected to the main control chip and responding to the drive command; the main control chip is also used to output electrical action parameters of the shutter component; the first processor is also used to output electrical detection results corresponding to the electrical action parameters; a shutter test platform connected to the power drive device for installing the shutter component; an infrared camera for thermal imaging visual detection of the shutter test platform and outputting video images; the host computer also includes a second processor for outputting visual detection results corresponding to the video image. It can realize the intelligentization of shutter component testing and improve test efficiency.

Description

Technical Field

[0001] The present application relates to the technical field of thermal imagers, and in particular to a shutter assembly testing system and method. Background Art

[0002] The shutter assembly is one of the most important components in thermal imager products. Its related parameters and performance will directly or indirectly affect the imaging quality of the thermal imager. Therefore, various tests and performance verifications of the shutter assembly of thermal imagers are particularly important.

[0003] Traditional thermal imager shutter assembly test equipment has single functions, low efficiency, and a lack of intelligence in the system. Summary of the invention

[0004] In view of this, the purpose of this application is to provide a shutter component testing system and method, which can realize the intelligent testing of shutter components, thereby improving the testing efficiency. The specific scheme is as follows:

[0005] In a first aspect, the present application discloses a shutter assembly testing system, comprising:

[0006] A detection and control host computer, wherein the detection and control host computer comprises a first processor for outputting shutter test configuration information;

[0007] A main control circuit system connected to the detection control host computer, the main control circuit system comprising: a communication interface for obtaining the shutter test configuration information; a main control chip for outputting a drive command corresponding to the shutter test configuration information; a power drive device connected to the main control chip and responding to the drive command; the main control chip is also used to output electrical action parameters of the shutter assembly to the communication interface; the first processor is also used to output electrical detection results corresponding to the electrical action parameters;

[0008] A shutter test platform connected to the power driving device and used for installing the shutter assembly;

[0009] An infrared camera for performing thermal imaging visual inspection of the shutter test platform and outputting corresponding video images;

[0010] The detection control host computer also includes a second processor for outputting a visual detection result corresponding to the video image.

[0011] Optionally, the power driving device further includes a voltage adjustment knob for adjusting the output voltage.

[0012] Optionally, the main control circuit system also includes a digital tube display for displaying the electrical action parameters in real time.

[0013] Optionally, the shutter testing platform includes a plurality of testing modules, each of which is capable of installing and fixing a plurality of the shutter assemblies.

[0014] Optionally, the shutter assembly testing system further includes:

[0015] A voltage-stabilized power supply connected to the main control circuit system and used to output a stable voltage.

[0016] Optionally, the shutter assembly testing system further includes:

[0017] The high and low temperature box containing the shutter test platform and the infrared camera is used to provide a high and low temperature environment.

[0018] Optionally, the infrared camera is installed at a position relatively fixed to the shutter test platform, and a camera head of the infrared camera faces the shutter test platform.

[0019] Optionally, the infrared camera also includes a Gige network port for communicating with the detection control host computer.

[0020] In a second aspect, the present application discloses a shutter assembly testing method, comprising:

[0021] By detecting and controlling the host computer, the shutter test configuration information is sent to the main control circuit system;

[0022] Acquiring the shutter test configuration information and outputting corresponding driving commands through the main control chip of the main control circuit system;

[0023] Responding to the driving command through the power driving device of the main control circuit system to drive the shutter assembly installed on the shutter test platform to perform shutter action;

[0024] The detection control host computer obtains the electrical action parameters of the shutter assembly reported by the main control chip, and outputs the electrical detection results corresponding to the electrical action parameters;

[0025] Performing thermal imaging visual inspection on the shutter test platform by using an infrared camera to obtain a corresponding video image;

[0026] The detection controls the host computer to obtain the video image and output the visual detection result corresponding to the video image.

[0027] Optionally, the shutter assembly testing method further includes:

[0028] The detection control host computer processes and analyzes the electrical action parameters to obtain the average power consumption of the shutter action, and when the average power consumption of the shutter action exceeds the preset action power consumption range, a corresponding first alarm signal is output;

[0029] The detection control host computer processes and analyzes the video image, and when the shutter action of the shutter component meets the preset alarm condition, a corresponding second alarm signal is output.

[0030] It can be seen that the shutter component testing system disclosed in the present application includes: a detection and control host computer, the detection and control host computer includes a first processor for outputting shutter test configuration information; a main control circuit system connected to the detection and control host computer, the main control circuit system includes: a communication interface for obtaining the shutter test configuration information; a main control chip for outputting a drive command corresponding to the shutter test configuration information; a power drive device connected to the main control chip and responding to the drive command; the main control chip is also used to output the electrical action parameters of the shutter component to the communication interface; the first processor is also used to output electrical detection results corresponding to the electrical action parameters; a shutter test platform connected to the power drive device for installing the shutter component; an infrared camera for performing thermal imaging visual detection on the shutter test platform and outputting corresponding video images; the detection and control host computer also includes a second processor for outputting visual detection results corresponding to the video image. In this way, the test results are obtained by using the electrical action parameters of the shutter assembly output by the main control circuit system and the video image output by the infrared camera, which can realize the intelligentization of the shutter assembly test and thus improve the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on the provided drawings without paying any creative work.

[0032] Figure 1 A schematic diagram of the structure of a shutter assembly test system disclosed in this application;

[0033] Figure 2 A schematic diagram of a shutter and shutter driving mode disclosed in this application;

[0034] Figure 3 A schematic diagram of a specific shutter assembly test system disclosed in this application;

[0035] Figure 4 A schematic diagram of a specific shutter assembly test system disclosed in this application;

[0036] Figure 5 A schematic diagram of a specific shutter assembly test system disclosed in this application;

[0037] Figure 6 This is a flow chart of a shutter assembly testing method disclosed in this application. DETAILED DESCRIPTION

[0038] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0039] See also Figure 1 As shown, the embodiment of the present application discloses a shutter assembly testing system, comprising:

[0040] The detection and control host computer 11 includes a first processor for outputting shutter test configuration information.

[0041] A main control circuit system 12 connected to the detection control host computer 11, the main control circuit system 12 includes: a communication interface for obtaining the shutter test configuration information; a main control chip for outputting a drive command corresponding to the shutter test configuration information; a power drive device connected to the main control chip and responding to the drive command; the main control chip is also used to output the electrical action parameters of the shutter assembly to the communication interface; the first processor is also used to output electrical detection results corresponding to the electrical action parameters.

[0042] A shutter test platform 13 connected to the power driving device and used for installing the shutter assembly;

[0043] An infrared camera 14 is used to perform thermal imaging visual inspection on the shutter test platform 13 and output corresponding video images.

[0044] The detection control host computer 11 also includes a second processor for outputting a visual detection result corresponding to the video image.

[0045] It can be seen that the shutter component testing system disclosed in the present application includes: a detection and control host computer, the detection and control host computer includes a first processor for outputting shutter test configuration information; a main control circuit system connected to the detection and control host computer, the main control circuit system includes: a communication interface for obtaining the shutter test configuration information; a main control chip for outputting a drive command corresponding to the shutter test configuration information; a power drive device connected to the main control chip and responding to the drive command; the main control chip is also used to output the electrical action parameters of the shutter component to the communication interface; the first processor is also used to output electrical detection results corresponding to the electrical action parameters; a shutter test platform connected to the power drive device for installing the shutter component; an infrared camera for performing thermal imaging visual detection on the shutter test platform and outputting corresponding video images; the detection and control host computer also includes a second processor for outputting visual detection results corresponding to the video image. In this way, the test results are obtained by using the electrical action parameters of the shutter assembly output by the main control circuit system and the video image output by the infrared camera, which can realize the intelligentization of the shutter assembly test and thus improve the test efficiency.

[0046] Among them, the detection and control host computer 11 obtains the shutter test configuration information input by the user through the shutter test configuration window, and the shutter test configuration information includes the driving mode of the shutter component, the action time parameter corresponding to the driving mode, and the action mode and the first action number of the shutter component; the driving mode includes monostable operation and bistable operation; the action mode includes single action and continuous action, and then the shutter test configuration information is output to the main control chip of the main control circuit system through the first processor, and the main control chip outputs the driving command corresponding to the shutter test configuration information to the power driving device, so that the power driving device drives the shutter component on the shutter test platform connected to it to perform shutter action. The first action number is the preset test number of the shutter component. For example, see Figure 2 As shown, Figure 2 A schematic diagram of a shutter and shutter driving mode disclosed in an embodiment of the present application, specifically a bistable driving mode.

[0047] Specifically, the main control chip can be a CPLD (complex programmable logic device) main control chip, the communication interface can be an RS232 serial port or other interfaces, and the detection and control host computer can be a PC (personal computer). That is, the CPLD main control chip communicates with the detection and control host computer through the RS232 serial port or other communication methods, receives and feeds back instructions, and drives the power drive device so that the power drive device drives the shutter assembly to move.

[0048] Among them, the main control circuit system may include multiple power drive devices, each of which can drive multiple shutter components, and the power drive module has the function of adjusting the output DC voltage. Specifically, the power drive device also includes a voltage adjustment knob for adjusting the output voltage. The voltage adjustment knob can adjust the output voltage according to the shutter components of different models. Furthermore, the power drive device is also used for switching between unidirectional output of DC voltage and positive and negative bidirectional output to meet the working voltage requirements of monostable shutters and bistable shutters.

[0049] In addition, the main control circuit system also includes a digital tube display for real-time display of the electrical action parameters, wherein the electrical action parameters are the action voltage and action current when the shutter assembly performs shutter action.

[0050] Furthermore, the shutter test platform 13 includes a plurality of test modules, each of which can be installed and fixed with a plurality of shutter assemblies. The modules can be spliced ​​and fixed to each other to achieve expansion, or used as a single module. In addition, a single module can be used as a shutter assembly impact and vibration tooling fixture.

[0051] In this embodiment, the infrared camera 14 can be a high-precision and high-sensitivity infrared camera. The infrared camera pixel array meets 384×288 and above, and the frame rate meets 50Hz and above. The high-resolution and high-frame-rate infrared camera is used as the visual detection sensor of this system. It communicates with the PC detection control host computer at high speed through the Gige network interface or other communication methods, and specifically communicates with the second processor of the detection control host computer to realize the interaction of video and control signals. Of course, the infrared camera pixel array is lower than 384×288, and the frame rate is lower than 50Hz. In addition, the infrared camera is installed in a relatively fixed position relative to the position of the shutter test platform, the camera head of the infrared camera is facing the shutter test platform, and the infrared camera is highly fixed to improve the precision and accuracy of the detection.

[0052] Furthermore, the shutter assembly testing system also includes a voltage-stabilizing power supply connected to the main control circuit system and configured to output a stable voltage.

[0053] For example, see Figure 3 As shown, Figure 3This is a schematic diagram of the structure of a specific shutter component test system disclosed in this embodiment. The shutter component to be tested is installed and fixed on the shutter test platform ④, and the power driving device of the main control circuit system ① is connected to provide it with a working driving power supply; the voltage stabilizing source ⑤ is connected to the main control circuit system ① to provide a stable power supply for the operation of the entire system; the main control circuit system ① is connected to the PC detection and control host computer ③ through the RS232 serial port or other communication methods to achieve communication control with the first processor in the detection and control host computer; the main control circuit system ① provides the necessary working power supply for the infrared camera ②, and the infrared camera ② is connected to the PC ③ through the Gige network or other communication methods to achieve communication control with the second processor in the detection and control host computer.

[0054] In a specific implementation, the main control circuit system may include M power drive devices, each of which can drive N shutter components, and a total of M*N shutter components can be driven to perform corresponding test verification. The corresponding shutter test platform can be composed of M modules, which can meet the test requirements of M×N shutters. It can be understood that the larger the data of the test platform M×N, the higher the test efficiency, and batch production testing can be achieved, such as 6×6, 8×8, and 36 and 64 groups of shutters can be tested each time, which solves the mass testing requirements. For example, see Figure 4 As shown, Figure 4 This is a schematic diagram of a specific shutter component test system structure disclosed in the embodiment of the present application. Each power drive device drives N shutter components. The shutter test platform is in the form of a module, and the modules can be spliced ​​and fixed to each other. It can be used as a single module or multiple modules to achieve expansion. It is flexible to use and easy to operate, and can be flexibly adjusted according to the test volume.

[0055] In a specific implementation, the first processor is specifically used to process and analyze the electrical action parameters to obtain the average power consumption of the shutter action. When the average power consumption of the shutter action exceeds the preset action power consumption range, the first processor outputs a corresponding first alarm signal and sends a corresponding power-off instruction to the main control circuit so that the main control circuit performs power-off protection on the corresponding shutter component. Specifically, the first processor can obtain the action current and action voltage of the shutter component when the main control circuit system outputs the action. The single action power consumption and continuous action average power consumption of the shutter component can be determined by the action current and action voltage. When the continuous action average power consumption exceeds the preset shutter action power consumption range, the corresponding power consumption abnormality alarm is output. Among them, the preset shutter action power consumption range is the power consumption alarm range input by the user obtained by the first processor through the corresponding alarm parameter configuration window. In addition, the first processor is also used to obtain the corresponding alarm processing strategy through the alarm parameter configuration window, so that when the average power consumption of the shutter action exceeds the preset action power consumption range, the corresponding shutter component is powered off for protection.

[0056] In a specific implementation, the second processor is also used to determine the target position, the grayscale threshold range in place, and the target image parameters of the video image according to the acquired video image, and the target image parameters include image brightness, image contrast, etc. For example, in this embodiment, after the second processor acquires the video image, it acquires the target position identified by the user through the preset interactive window, the grayscale threshold range in place, the brightness, contrast and other parameters set, and can also acquire the alarm switch and alarm processing strategy configured by the user, and clear the in-place action counter, that is, the target position, the grayscale threshold range in place, and the target image parameters can be adjusted according to the video image, and the second processor is specifically used to use the video image to detect whether the shutter action of the shutter component reaches the preset position, and to count the number of second actions that reach the preset position. Specifically, the second processor is used to determine that the shutter action of the shutter component reaches the preset position when it is detected that the snapshot action of the snapshot component in the video image reaches the target position, and the grayscale value of the current video image is within the grayscale threshold range in place. During the test process, the in-place action counter is used to count the number of the second action, and compared with the preset number of the first action, the second processor can determine the corresponding action in place.

[0057] Furthermore, the second processor is also used to output a corresponding second alarm signal when the shutter action of the shutter component meets the preset alarm condition. Specifically, when it is detected that the shutter action of the shutter component does not reach the preset position or any shutter action is not performed or the shutter action is stuck in the continuous shutter action, a corresponding alarm signal is generated, and the shutter component is processed accordingly according to the preset alarm processing strategy. For example, the alarm processing strategy is to suspend the alarm shutter component test or record the alarm shutter component abnormality and continue the test, and the shutter component is processed according to the corresponding alarm processing strategy, and other shutter components are still tested normally, without affecting other normal test shutter components.

[0058] Furthermore, in a specific implementation, the first processor obtains the shutter test configuration information, outputs it to the main control circuit, drives the shutter to be tested to perform a shutter action, and then, the second processor determines the target position, the in-place grayscale threshold range, and the target image parameters of the video image based on the acquired video image. Thereafter, the voltage of the output shutter component is adjusted through the main control circuit, and when the first processor obtains the test start instruction, the test is started.

[0059] After the test is completed, the system automatically counts the test data, forms relevant test charts, and automatically generates a test report through detection and control of the host computer.

[0060] In a specific implementation, the shutter component testing system can be used for shutter component life test. Under experimental conditions, the shutter component is set to operate continuously for a long time, the number of continuous actions and the driving mode are set according to the parameters in the shutter component technical specification. During the process, the upper computer is controlled by detection to detect the actual number of actions of the shutter component and the completion of the actions. Intermittent operation, jamming and the like should not occur in the middle. At the end of the test, there should be no loss in product function, performance and structural condition to complete the shutter component life test.

[0061] In a specific embodiment, the shutter assembly test system can be used for the temperature uniformity and consistency test of the shutter assembly blades. Under the test conditions, the shutter assembly blades are placed in a folded state indoors for more than 2 hours, and then the blades are opened and stabilized for 1 hour. The temperature uniformity and reflection of the blades are observed with an infrared camera in a pseudo-color removed state (the temperature uniformity of the blades must be consistent). That is, the shutter assembly blades are subjected to thermal imaging visual inspection using an infrared camera in a pseudo-color removed state, and the acquired video image is then uploaded to the detection control host computer. The second processor analyzes the blade temperature grayscale threshold data based on the acquired video image to determine the temperature uniformity of the blades.

[0062] In another specific embodiment, the shutter component testing system can be used for shutter component action power consumption, voltage, and current testing. Under experimental conditions, by using a detection control host computer and setting parameters in the shutter component technical specification, the shutter component single action power consumption, voltage, and current testing and the shutter component continuous action average action power consumption, voltage, and current testing can be completed.

[0063] See also Figure 5 As shown, Figure 5 A specific shutter component test system structure disclosed in the embodiment of the present application includes: ① main control circuit system, ② high-precision and high-sensitivity infrared camera, ③ PC and host computer control software, ④ shutter test platform, ⑤ external voltage-stabilized power supply, and ⑥ high and low temperature box. That is, the shutter component test system may also include a high and low temperature box containing the shutter test platform and the infrared camera to provide a high and low temperature environment.

[0064] In a specific implementation manner, the shutter assembly test system can be used for high and low temperature working tests of shutter assemblies. Specifically, the shutter assembly and the infrared camera are placed in ⑥ high and low temperature box; under experimental conditions, the continuous action of the shutter assembly, the number of continuous actions and the driving mode are set according to the parameters of the shutter assembly technical specification book. During the process, the upper computer is controlled by detection to detect the actual number of actions of the shutter assembly and the status of the actions. Intermittent work, jamming, etc. should not occur in the middle. After the test is completed and the temperature is restored to normal, there should be no loss in the product function, performance, and structure, and the high and low temperature working test of the shutter assembly is completed.

[0065] See also Figure 6 As shown, the present application discloses a shutter assembly testing method, comprising:

[0066] Step S11: The host computer sends shutter test configuration information to the main control circuit system through detection control.

[0067] Step S12: obtaining the shutter test configuration information through the main control chip of the main control circuit system and outputting a corresponding driving command.

[0068] Step S13: Responding to the driving command through the power driving device of the main control circuit system to drive the shutter assembly installed on the shutter test platform to perform shutter action.

[0069] Step S14: the detection control host computer obtains the electrical action parameters of the shutter assembly reported by the main control chip, and outputs electrical detection results corresponding to the electrical action parameters.

[0070] Step S15: performing thermal imaging visual inspection on the shutter test platform by using an infrared camera to obtain a corresponding video image;

[0071] Step S16: controlling the host computer to acquire the video image through the detection, and outputting the visual detection result corresponding to the video image.

[0072] It can be seen that the present application sends shutter test configuration information to the main control circuit system through the detection control host computer; obtains the shutter test configuration information and outputs the corresponding drive command through the main control chip of the main control circuit system; responds to the drive command through the power drive device of the main control circuit system to drive the shutter component installed on the shutter test platform to perform shutter action; obtains the electrical action parameters of the shutter component reported by the main control chip through the detection control host computer, and outputs the electrical detection results corresponding to the electrical action parameters; performs thermal imaging visual detection on the shutter test platform through an infrared camera to obtain the corresponding video image; obtains the video image through the detection control host computer, and outputs the visual detection results corresponding to the video image. In this way, the test results are obtained by using the electrical action parameters of the shutter component output by the main control circuit system and the video image output by the infrared camera, which can realize the intelligentization of shutter component testing, thereby improving the test efficiency.

[0073] In a specific implementation, the detection control host computer obtains the shutter test configuration information input by the user through the shutter test configuration window, and the shutter test configuration information includes the driving mode of the shutter component, the action time parameter corresponding to the driving mode, and the action mode and the first action number of the shutter component; the driving mode includes monostable operation and bistable operation; the action mode includes single action and continuous action, and then the detection control host computer outputs the shutter test configuration information to the main control chip of the main control circuit system, and the main control chip outputs the driving command corresponding to the shutter test configuration information to the power driving device, so that the power driving device drives the shutter component on the shutter test platform connected thereto to perform shutter action. The first action number is the preset test number of the shutter component. Then, the shutter test platform is subjected to thermal imaging visual inspection by an infrared camera to obtain a corresponding video image. Then, according to the obtained video image, the target position, the grayscale threshold range in place, and the target image parameters of the video image are determined. The target image parameters include image brightness, image contrast, etc. For example, the target position identified by the user, the grayscale threshold range in place, the set brightness, contrast and other parameters are obtained through a preset interactive window. The alarm switch and alarm processing strategy configured by the user can also be obtained, and the in-place action counter is cleared. That is, the target position, the grayscale threshold range in place, and the target image parameters can be adjusted according to the video image. Then, according to the technical parameters of the shutter component to be tested, the voltage of the output shutter component is adjusted through the main control circuit. When the detection control host computer obtains the test start instruction, the test is started. That is, the user can start the test after configuring the parameters. During the test, the video image is processed and analyzed by the detection control host computer. Specifically, the present embodiment can use the video image to detect whether the shutter action of the shutter component reaches the preset position, and count the number of second actions reaching the preset position. Specifically, when it is detected that the snapshot action of the snapshot component in the video image reaches the target position, and the grayscale value of the current video image is within the in-place grayscale threshold range, it is determined that the shutter action of the shutter component reaches the preset position. During the test, the in-place action counter is used to count the number of the second action, and compared with the preset number of the first action, the in-place status of the corresponding action can be determined. And, when the shutter action of the shutter component meets the preset alarm condition, the corresponding second alarm signal is output. Specifically, when it is detected that the shutter action of the shutter component does not reach the preset position or any shutter action is not performed or the shutter action is stuck in the continuous shutter action, a corresponding alarm signal is generated, and the shutter component is processed accordingly according to the preset alarm processing strategy.In addition, the present embodiment can process and analyze the electrical action parameters through the detection control host computer to obtain the average power consumption of the shutter action. When the average power consumption of the shutter action exceeds the preset action power consumption range, a corresponding first alarm signal is output, and a corresponding power-off instruction is sent to the main control circuit. After the test is completed, the system automatically counts the test data, forms relevant test charts, and automatically generates a test report through the detection control host computer.

[0074] In addition, in a specific implementation, the shutter test platform control software and the visual detection control software can be written to generate a computer program, and the corresponding computer program can be stored in the memory of the detection control host computer. When the processor in the detection control host computer executes the corresponding computer program, the shutter component test system and method described above are implemented. The visual detection control software mainly controls the infrared camera as a visual sensor to realize the shutter action visual detection, judgment and statistical output, as well as the alarm output function of the shutter action stuck or not in place; the shutter test platform control software mainly controls the main control circuit system to realize the selection of monostable or bistable shutter drive mode and the setting of shutter action time, the setting of shutter single action or continuous action number, the detection of shutter action power consumption, current, voltage and the detection of over-power consumption alarm output, etc. Specifically, according to the technical parameters of the shutter component to be tested, the user can select and set the driving mode of the shutter component through the shutter test platform control software: the monostable or bistable working state of the shutter component, the action time parameters of the monostable shutter or the bistable shutter, and set the shutter single action or continuous action and the number of continuous actions according to the requirements of the test items. The shutter component video image transmitted by the infrared camera is obtained through the visual detection control software, and the action position of the shutter component to be detected, that is, the aforementioned target position, and the image brightness, contrast, alarm switch, alarm processing strategy and other parameters are adjusted on the video image. According to the actual situation, the threshold range of the alarm count of the setting software detection is adjusted, that is, the grayscale threshold range, the shutter component action counter is cleared, and the detection system of the visual detection control software is started. The visual detection control software configuration is ready. Then, according to the technical parameters of the shutter component to be tested, the output shutter component adaptation voltage parameters are adjusted through the main control circuit system. After the above settings are completed, the shutter test platform control software is used to start the control of the shutter component to move; the visual detection control software determines the shutter action and the position of the action through image intelligent detection, counts the number of shutter actions, and compares it with the preset number of shutter actions to determine the position of the shutter action; during the process, the visual detection control software detects and determines whether the shutter action has leakage, stagnation, or insufficiency, and outputs an alarm signal in real time. The visual detection control software records the abnormal alarm signal in real time and processes it according to the preset alarm processing strategy. After the test is completed, the system automatically counts the test data, forms relevant test charts, and automatically generates a test report. In the shutter action project, the main control circuit system can monitor and display the action voltage and current of the shutter component in real time, and upload it to the shutter test platform control software. The shutter test platform uses current and voltage to calculate the action power consumption and display the shutter action power consumption: according to the shutter test platform control software settings, the single action power consumption and continuous action average power consumption detection can be realized.The shutter action power consumption range can be set in the shutter test platform control software, and abnormal power consumption during shutter action can be detected and output in real time to alarm and cut off the power supply of abnormal power consumption shutter. After the test is completed, the system automatically counts the test data, forms relevant test charts, and automatically generates a test report.

[0075] In this specification, each embodiment is described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the embodiments can be referred to each other. For the method disclosed in the embodiment, since it corresponds to the system disclosed in the embodiment, the description is relatively simple, and the relevant parts can be referred to the system part description.

[0076] The steps of the method or algorithm described in conjunction with the embodiments disclosed herein may be implemented directly using hardware, a software module executed by a processor, or a combination of the two. The software module may be placed in a random access memory (RAM), a memory, a read-only memory (ROM), an electrically programmable ROM, an electrically erasable programmable ROM, a register, a hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.

[0077] The shutter component testing system and method provided by the present application are introduced in detail above. Specific examples are used in this article to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method of the present application and its core idea. At the same time, for those skilled in the art, according to the idea of ​​the present application, there will be changes in the specific implementation method and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.

Claims

1. A shutter assembly testing system, characterized in that: include: A detection and control host computer, wherein the detection and control host computer comprises a first processor for outputting shutter test configuration information; A main control circuit system connected to the detection and control host computer, the main control circuit system comprising: a communication interface for obtaining the shutter test configuration information; a main control chip for outputting a drive command corresponding to the shutter test configuration information; a power drive device connected to the main control chip and responding to the drive command; the main control chip is also used to output the electrical action parameters of the shutter component to the communication interface; the first processor is also used to output the electrical detection results corresponding to the electrical action parameters; the first processor obtains the action current and action voltage of the shutter component when it is in action output by the main control circuit system, and determines the single action power consumption and continuous action average power consumption of the shutter component by using the action current and action voltage, and when the continuous action average power consumption exceeds the preset shutter action power consumption range, outputs a corresponding power consumption abnormality alarm; A shutter test platform connected to the power driving device and used for installing the shutter assembly; An infrared camera for performing thermal imaging visual inspection of the shutter test platform and outputting corresponding video images; The detection control host computer also includes a second processor for outputting a visual detection result corresponding to the video image.

2. The shutter assembly testing system according to claim 1, characterized in that: The power driving device also includes a voltage adjustment knob for adjusting the magnitude of the output voltage.

3. The shutter assembly testing system according to claim 1, characterized in that: The main control circuit system also includes a digital tube display for displaying the electrical action parameters in real time.

4. The shutter assembly testing system according to claim 1, characterized in that: The shutter testing platform includes a plurality of testing modules, each of which is capable of installing and fixing a plurality of the shutter assemblies.

5. The shutter assembly testing system according to claim 1, characterized in that: Also includes: A voltage-stabilized power supply connected to the main control circuit system and used to output a stable voltage.

6. The shutter assembly testing system according to claim 1, characterized in that: Also includes: The high and low temperature box containing the shutter test platform and the infrared camera is used to provide a high and low temperature environment.

7. The shutter assembly testing system according to claim 1, characterized in that: The infrared camera is installed at a relatively fixed position relative to the shutter test platform, and the camera head of the infrared camera faces the shutter test platform.

8. The shutter assembly testing system according to claim 1, characterized in that: The infrared camera also includes a Gige network port for communicating with the detection control host computer.

9. A shutter assembly testing method, characterized in that: include: By detecting and controlling the host computer, the shutter test configuration information is sent to the main control circuit system; Acquiring the shutter test configuration information and outputting corresponding driving commands through the main control chip of the main control circuit system; Responding to the driving command through the power driving device of the main control circuit system to drive the shutter assembly installed on the shutter test platform to perform shutter action; The detection control host computer obtains the electrical action parameters of the shutter assembly reported by the main control chip, and outputs the electrical detection results corresponding to the electrical action parameters; The electrical action parameters are processed and analyzed by the detection control host computer to obtain the average power consumption of the shutter action. When the average power consumption of the shutter action exceeds the preset action power consumption range, a corresponding first alarm signal is output; the action current and action voltage of the shutter component when the shutter component is in action are obtained by the detection control host computer's first processor, and the single action power consumption and continuous action average power consumption of the shutter component are determined by using the action current and action voltage. When the continuous action average power consumption exceeds the preset shutter action power consumption range, a corresponding power consumption abnormality alarm is output; Performing thermal imaging visual inspection on the shutter test platform by using an infrared camera to obtain a corresponding video image; The detection controls the host computer to obtain the video image and output the visual detection result corresponding to the video image.

10. The shutter assembly testing method according to claim 9, characterized in that: Also includes: The detection control host computer processes and analyzes the video image, and when the shutter action of the shutter component meets the preset alarm condition, a corresponding second alarm signal is output.

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