A radio frequency circuit, a test system and a test method for a new test machine

Abstract

The present invention provides a novel test machine radio frequency circuit, including: a radio frequency signal selector, wherein the first address decoding end of the radio frequency signal selector controls the radio frequency signal connection end of the radio frequency signal selector to select and receive the radio frequency signal output by the device under test; a radio frequency signal distributor, connected to the radio frequency signal selector, receiving the radio frequency signal output by the radio frequency signal selector, and the second decoding end of the radio frequency signal distributor controls the distribution of the radio frequency signal to the radio frequency signal processing unit for different bandwidth processing; the radio frequency signal processing unit includes a bandwidth adjustable circuit module, connected to the radio frequency signal distributor, receiving the radio frequency signal distributed by the radio frequency signal distributor, and adjusting the radio frequency signal bandwidth before outputting it to the test machine. The present invention achieves the advantages of multiplexing through modular radio frequency circuits, thereby reducing costs and improving test efficiency.

Description

Technical Field

[0001] The present invention relates to the field of radio frequency technology, and in particular to a radio frequency circuit, a test system and a test method for a new type of test machine. Background Art

[0002] In the process of R&D and production in the field of radio communications, a large number of RF signals are usually used. RF testing of devices under test has always been a pain point in the industry. Diversified testing of RF signals may involve different test environment configurations, and the environment construction and configuration of RF testing is very time-consuming. Changing the test environment during large-scale testing in the factory will greatly reduce the test efficiency and affect the calibrated state of the tester, resulting in reduced accuracy or even data errors.

[0003] In the test of device filtering, for different filtering structures, the out-of-band signals are generally filtered out according to the actual needs of the RF signal to ensure the effective bandwidth of the RF signal. A traditional filtering circuit can only achieve filtering of one bandwidth, so for RF signals that need to obtain different passband widths, multiple filtering circuits are required. This leads to limitations in the use of filtering circuits and increases the cost of obtaining the passband width of RF signals. Moreover, the design and manufacture of multiple filtering circuits require a lot of manpower and material resources, and to a certain extent, the time cost and economic cost are relatively high. For operators who obtain the passband width of RF signals, the operation process is even more cumbersome. Summary of the invention

[0004] The purpose of the present invention is to provide a radio frequency circuit, a test system and a test method for a new test machine, which can realize multiplexing in a simple, efficient and low-cost manner.

[0005] The technical solution provided by the present invention is as follows:

[0006] A radio frequency circuit for a new test machine comprises: a radio frequency signal selector, wherein a first address decoding end of the radio frequency signal selector controls a radio frequency signal connection end of the radio frequency signal selector to select and receive a radio frequency signal output by a device under test; a radio frequency signal distributor, connected to the radio frequency signal selector, receives the radio frequency signal output by the radio frequency signal selector, and a second decoding end of the radio frequency signal distributor controls the distribution of the radio frequency signal to a radio frequency signal processing unit for different bandwidth processing; the radio frequency signal processing unit comprises a bandwidth adjustable circuit module, connected to the radio frequency signal distributor, receives the radio frequency signal distributed by the radio frequency signal distributor, and adjusts the bandwidth of the radio frequency signal before outputting it to the test machine.

[0007] Furthermore, the bandwidth adjustable circuit module includes three submodules and a grounding capacitor. The submodule is composed of an inductor and a capacitor in parallel. Filter circuits with different bandwidths are obtained by adjusting the inductor value and the capacitor value.

[0008] Further, the first transmission end of the RF signal selector is connected to the RF signal output end of the first RF signal connection end, and the first RF signal connection end is used to receive the RF signal of the first device under test; the second transmission end of the RF signal selector is connected to the RF signal output end of the second RF signal connection end, and the second RF signal connection end is used to receive the RF signal of the second device under test; the third transmission end of the RF signal selector is connected to the RF signal output end of the third RF signal connection end, and the third RF signal connection end is used to receive the RF signal of the third device under test; the fourth transmission end of the RF signal selector is connected to the RF signal output end of the fourth RF signal connection end, and the fourth RF signal connection end is used to receive the RF signal of the fourth device under test; the fifth transmission end of the RF signal selector is grounded through a resistor; the power supply of the RF signal selector is grounded by connecting two parallel bypass capacitors for inputting a stable power supply; the RF signal control end of the RF signal selector is connected to the first address decoding end to control the selection of the RF signal; the sixth transmission end of the RF signal selector is connected to the first transmission end of the RF signal distributor as the input end / output end of the RF signal.

[0009] Furthermore, the RF signal processing unit also includes: a fixed bandwidth circuit module, the RF signal transmission end of the fixed bandwidth circuit module is connected to the transmission end of the RF signal distributor, and is used to filter multiple RF signals to obtain a fixed bandwidth RF signal; and / or a direct circuit module, the RF signal transmission end of the direct circuit is connected to the transmission end of the RF signal distributor, and when the original RF signal needs to be output, the RF signal is output through the direct circuit.

[0010] Furthermore, the through-circuit module includes a first through-circuit and a second through-circuit; wherein the second transmission end of the RF signal distributor is connected to the first through-circuit; and the third transmission end of the RF signal distributor is connected to the second through-circuit.

[0011] Furthermore, the fixed bandwidth circuit module includes a first fixed filtering circuit and a second fixed filtering circuit; wherein, the RF signal input end of the first fixed filtering circuit is connected to the fourth transmission end of the RF signal distributor, and the RF signal input end of the second fixed filtering circuit is connected to the fourth transmission end of the RF signal distributor; the first fixed filtering circuit is used to filter the RF signal of the first fixed frequency band; and the second filtering circuit is used to filter the RF signal of the second fixed frequency band.

[0012] Furthermore, the RF signal control end of the RF signal distributor is connected to the second address decoding end to control the selection of the RF signal through the second address decoding end; the power supply of the RF signal selector is grounded by connecting two parallel bypass capacitors to input a stable power supply.

[0013] The present invention also provides a test system using the radio frequency circuit of the new test machine, including the radio frequency circuit, a control unit, a test machine, and a device to be tested; the first transmission end of the first radio frequency circuit is connected to the test machine through a first switching switch, and is used to transmit the radio frequency signal of the device to be tested to the test machine; the second transmission end of the first radio frequency circuit is connected to the first transmission end of the device to be tested, and is used to obtain the radio frequency signal of the device to be tested; the address decoding end of the first radio frequency circuit is connected to the control unit, and the first radio frequency circuit is controlled by the control unit; the first transmission end of the second radio frequency circuit is connected to the second transmission end of the device to be tested, and is used to obtain the radio frequency signal of the device to be tested; the first transmission end of the second radio frequency circuit is connected to the test machine through a second switching switch, and is used to transmit the radio frequency signal of the device to be tested to the test machine; the address decoding end of the second radio frequency circuit is connected to the control unit, and the second radio frequency circuit is controlled by the control unit.

[0014] The present invention also includes a method for testing using the radio frequency circuit, comprising the steps of: a first address decoding end of a radio frequency signal selector controls a radio frequency signal connection end of the radio frequency signal selector to select and receive a radio frequency signal output by a device under test; a radio frequency signal distributor receives the radio frequency signal output by the radio frequency signal selector, and a second decoding end of the radio frequency signal distributor controls the distribution of the radio frequency signal to a radio frequency signal processing unit for different bandwidth processing; when a bandwidth adjustable circuit module in the radio frequency signal processing unit receives the radio frequency signal distributed by the radio frequency signal distributor, the bandwidth of the radio frequency signal is adjusted and then output to a test machine.

[0015] Furthermore, the method also includes the following steps: when the through circuit module in the RF signal processing unit receives the RF signal allocated by the RF signal distributor, the RF signal is output; when the fixed bandwidth circuit module in the RF signal processing unit receives the RF signal allocated by the RF signal distributor, the RF signal is fixedly filtered.

[0016] Furthermore, before the bandwidth adjustable circuit module in the RF signal processing unit receives the RF signal distributed by the RF signal distributor, the step of: obtaining a filter circuit for filtering RF signals of multiple frequency bands by adjusting the capacitance and inductance of the bandwidth adjustable circuit.

[0017] Through the above scheme, the present invention achieves the advantage of multiplexing through modular radio frequency circuits, thereby reducing costs and improving test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The following will explain the preferred implementation mode in a clear and understandable manner with reference to the accompanying drawings, and further explain the above-mentioned characteristics, technical features, advantages and implementation methods of a radio frequency circuit, a test system and a test method for a new test machine.

[0019] Figure 1 It is a partial circuit schematic diagram of a radio frequency circuit including a radio frequency signal selector in the present invention;

[0020] Figure 2 It is another circuit schematic diagram of a radio frequency circuit in the present invention, which includes a radio frequency signal distributor and a radio frequency signal processing unit;

[0021] Figure 3 It is a circuit principle diagram of a bandwidth adjustable circuit module in the present invention;

[0022] Figure 4 is a circuit schematic diagram of an embodiment of a broadband adjustable circuit module in the present invention;

[0023] Figure 5 It is a structural schematic diagram of a test system in the present invention;

[0024] Figure 6 It is a flow chart of a method for testing a radio frequency circuit of a novel test machine in the present invention;

[0025] Figure 7 It is a flow chart of an embodiment of a method for testing a radio frequency circuit of a novel test machine in the present invention;

[0026] Figure 8 This is a flow chart of another embodiment of a method for testing a radio frequency circuit of a novel test machine described in the present invention. DETAILED DESCRIPTION

[0027] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the specific implementation methods of the present invention will be described below with reference to the accompanying drawings. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings and other implementation methods can be obtained based on these drawings without creative work.

[0028] In order to simplify the drawings, only the parts related to the present invention are schematically shown in each figure, and they do not represent the actual structure of the product. In addition, in order to simplify the drawings and facilitate understanding, in some figures, only one of the parts with the same structure or function is schematically drawn or marked. In this article, "one" not only means "only one", but also means "more than one".

[0029] According to one embodiment of the present invention, a radio frequency circuit for a new test machine includes:

[0030] like Figure 1 In the RF signal selector 10 shown, the first address decoding terminal 17 of the RF signal selector 10 controls the RF signal connection terminal of the RF signal selector 10 to select and receive the RF signal output by the device under test.

[0031] The first transmission terminal 11 of the RF signal selector 10 is connected to the RF signal output terminal of the first RF signal connection terminal A, and the first RF signal connection terminal A is used to receive the RF signal of the first device under test.

[0032] The second transmission terminal 12 of the RF signal selector 10 is connected to the RF signal output terminal of the second RF signal connection terminal B, and the second RF signal connection terminal B is used to receive the RF signal of the second device under test.

[0033] The third transmission terminal 13 of the RF signal selector 10 is connected to the RF signal output terminal of the third RF signal connection terminal C, and the third RF signal connection terminal C is used to receive the RF signal of the third device under test.

[0034] The fourth transmission terminal 14 of the RF signal selector 10 is connected to the RF signal output terminal of the fourth RF signal connection terminal D, and the fourth RF signal connection terminal is used to receive the RF signal of the fourth device under test.

[0035] The fifth transmission terminal 15 of the RF signal selector 10 is grounded via a resistor.

[0036] The power supply 18 of the RF signal selector 10 is grounded by connecting two parallel bypass capacitors for inputting a stable power supply.

[0037] The RF signal control terminal of the RF signal selector 10 is connected to the first address decoding terminal 17 to control the selection of the RF signal.

[0038] like Figure 2The RF signal distributor 20 shown is connected to the RF signal selector 10, and receives the RF signal output by the RF signal selector 10. The second decoding end 22 of the RF signal distributor 20 controls the distribution of the RF signal to the RF signal processing unit for different bandwidth processing.

[0039] The RF signal processing unit includes a bandwidth adjustable circuit module 30 , which is connected to the RF signal distributor 20 , receives the RF signal distributed by the RF signal distributor 20 , adjusts the bandwidth of the RF signal and then outputs it to the tester 540 .

[0040] The radio frequency signal processing unit also includes:

[0041] A fixed bandwidth circuit module, the RF signal transmission end of the fixed bandwidth circuit module is connected to the transmission end of the RF signal distributor, and is used to filter multiple RF signals to obtain a fixed bandwidth RF signal; and / or a direct circuit module, the RF signal transmission end of the direct circuit is connected to the transmission end of the RF signal distributor, and when the original RF signal needs to be output, the RF signal is output through the direct circuit.

[0042] The through circuit module includes a first through circuit E and a second through circuit F; wherein the second transmission end 23 of the RF signal distributor 20 is connected to the first through circuit E; and the third transmission end 24 of the RF signal distributor 20 is connected to the second through circuit F.

[0043] The fixed bandwidth circuit module includes a first fixed filter circuit G and a second fixed filter circuit H.

[0044] The RF signal input terminal of the first fixed filter circuit G is connected to the fourth transmission terminal 25 of the RF signal distributor 20 , and the RF signal input terminal of the second fixed filter circuit H is connected to the fourth transmission terminal 26 of the RF signal distributor 20 .

[0045] The first fixed filter circuit G is used to filter radio frequency signals of a first fixed frequency band; the second filter circuit H is used to filter radio frequency signals of a second fixed frequency band.

[0046] The RF signal control terminal of the RF signal distributor 20 is connected to the second address decoding terminal 22 for controlling the selection of the RF signal through the second address decoding terminal 22 .

[0047] The power supply 28 of the RF signal selector 20 is connected to ground by connecting two parallel bypass capacitors for inputting a stable power supply.

[0048] Based on the above embodiment, the sixth transmission terminal 16 of the RF signal selector 10 is connected to the first transmission terminal 21 of the RF signal distributor 20 as an input terminal / output terminal of the RF signal.

[0049] like Figure 3 As shown, the bandwidth adjustable circuit module 30 includes three submodules and a grounding capacitor. The submodule is composed of an inductor and a capacitor in parallel. By adjusting the inductor value and the capacitor value, a filter circuit with different bandwidths can be obtained.

[0050] Specifically, by adjusting the capacitance value and the inductance value of the bandwidth adjustable circuit, a filter circuit for filtering radio frequency signals of multiple frequency bands is obtained.

[0051] Exemplarily, the bandwidth adjustable filter circuit includes 3 submodules, each submodule has a similar structure, and the device models and values ​​can be different. Each submodule is composed of a capacitor and an inductor in parallel, and there is a capacitor connected in parallel to the ground between the RF signal entrance and exit of the bandwidth adjustable filter circuit and the submodule. This solution uses 7 capacitors and 3 inductors in common.

[0052] For example, Figure 4 As shown, adjust the capacitors and inductors to new values:

[0053] C00_5306=0.5Pf

[0054] C00_5301=0.5Pf

[0055] L00_330=1nH

[0056] C00_5302=1Pf

[0057] C00_5304=0.5pf

[0058] L00_300=1nH

[0059] C00_5305=1pf

[0060] C00_5303=0.5pf

[0061] L00_360=1nH

[0062] C00_5300=0.5Pf

[0063] The bandwidth control function of the RF signal is realized by the combination of the capacitance value and the inductance value of the filter circuit, and the filtering of high-frequency RF signals above 4 GHz is realized, so that the high frequency of the link becomes a forbidden band, and the signal frequency higher than 4 GHZ cannot pass through the link.

[0064] like Figure 5As shown, the present invention also provides a test system using the novel tester radio frequency circuit, including the two radio frequency circuits, a control unit 530, a tester 540, and a device to be tested.

[0065] Among them, the first transmission terminal 23, the second transmission terminal 24, the third transmission terminal 25 and the fourth transmission terminal 26 of the first RF circuit 510 are connected to the test machine 540 through a first switching switch, and are used to transmit the RF signal of the device under test to the test machine 540; the fifth transmission terminal 11, the sixth transmission terminal 12, the seventh transmission terminal 13, and the eighth transmission terminal 14 of the first RF circuit 510 are respectively connected to the first transmission terminals of the four devices under test, and are used to obtain the RF signal of the device under test; the address decoding terminal 17 of the first RF circuit 510 is connected to the control unit 530, and the first RF circuit 510 is controlled by the control unit 530; the first transmission terminal 11, the second transmission terminal 12, the third transmission terminal 13 of the second RF circuit 520 3. The fourth transmission terminal 14 is respectively connected to the second transmission terminals of the four devices under test, so as to obtain the radio frequency signal of the devices under test; the fifth transmission terminal 23 of the second radio frequency circuit 520 is connected to the first direct-through circuit E, the sixth transmission terminal 24 is connected to the second direct-through circuit F, the seventh transmission terminal 25 is connected to the first fixed filter circuit G, the eighth transmission terminal 26 is connected to the second fixed filter circuit H, and the ninth transmission terminal 26 is connected to the bandwidth adjustable circuit 30, and is connected to the test machine 540 through a second switching switch, so as to transmit the radio frequency signal of the device under test to the test machine; the address decoding terminal 22 of the second radio frequency circuit 520 is connected to the control unit 530, and the second radio frequency circuit 520 is controlled by the control unit 530.

[0066] Specifically, the first RF circuit 510 is connected to four devices under test, including a first device under test DUT1, a second device under test DUT2, a third device under test DUT3, and a fourth device under test DUT4, and the first transmission end of the second RF circuit 520 is connected to the four devices under test. When the same test needs to be performed on the four devices under test, the control unit can control the address decoding end of the RF circuit according to the demand and then control the selection and allocation of the RF signal. When the four devices under test are processed, the RF signal is output to the tester.

[0067] Exemplarily, the control unit 530 controls the first RF circuit 510 and the second RF circuit 520. When it is necessary to obtain the original performance of the RF signal of the first device under test DUT1, the control unit 530 controls the RF signal selector in the first RF circuit 510 to select the through circuit, and the control unit 530 controls the RF signal distributor in the first RF circuit 510 to select the first device under test DUT1; the control unit 530 controls the RF signal selector of the second RF circuit 520 to select the first device under test DUT1, and the control unit 530 controls the RF signal distributor of the second RF circuit 520 to select the through circuit, and outputs the RF signal to the tester 540 through the through circuit to obtain the original performance of the first device under test DUT1.

[0068] In addition, the RF signal transmission end of the first RF circuit 510 and the RF signal transmission end of the second RF circuit 520 are bidirectional propagation, therefore, when it is necessary to obtain the original performance of the RF signal of the first device under test DUT1, the control unit 530 can control the RF signal selector in the second RF circuit 520 to select the first device under test DUT1, and the control unit 530 controls the RF signal distributor in the second RF circuit 520 to select the through circuit; the control unit 530 controls the RF signal distributor of the first RF circuit 510 to select the first device under test DUT1, and the control unit 530 controls the RF signal selector of the first RF circuit 510 to select the through circuit, and outputs the RF signal to the tester 540 through the through circuit of the first RF circuit 510 to obtain the original performance of the first device under test DUT1.

[0069] Exemplarily, when it is necessary to obtain the filtered RF signal of the first device under test DUT1, the control unit 530 controls the RF signal selector in the first RF circuit 510 to select the pass-through circuit, and the control unit 530 controls the RF signal distributor in the first RF circuit 510 to select the first device under test DUT1; the control unit 530 controls the RF signal selector of the second RF circuit 520 to select the first device under test DUT1, and the control unit 530 controls the RF signal distributor of the second RF circuit 520 to select the filtering circuit, filters the RF signal through the filtering circuit, and outputs the filtered RF signal to the tester 540 to obtain the filtered performance of the first device under test DUT1.

[0070] In addition, the RF signal transmission end of the first RF circuit 510 and the RF signal transmission end of the second RF circuit 520 are bidirectional propagation, therefore, when it is necessary to obtain the filtered performance of the RF signal of the first device under test DUT1, the control unit 530 can control the RF signal selector in the second RF circuit 520 to select the first device under test DUT1, and the control unit 530 controls the RF signal distributor in the second RF circuit 520 to select the through circuit; the control unit 530 controls the RF signal distributor of the first RF circuit 510 to select the first device under test DUT1, and the control unit 530 controls the RF signal selector of the first RF circuit 510 to select the filtering circuit, the RF signal is filtered by the filtering circuit of the first RF circuit 510, and the filtered RF signal is output to the test machine 540, so as to obtain the filtered performance of the first device under test DUT1.

[0071] In this way, the effect of multiplexing can be achieved, and the RF circuit, as an independent module, does not need to be redesigned, reducing manpower and material resources. Through this test system, multiplexing of multiple test options can be achieved, thereby improving test efficiency, enhancing test convenience, and making operation easier.

[0072] For example, when it is necessary to filter four RF signals and filter high-frequency RF signals above 4 GHz to obtain RF signals below 4 GHZ, the RF circuit is controlled by the control unit to select the RF signal, and the four RF signals are passed through the filtering circuit successively, without the need to repeatedly design the filtering circuit, thereby achieving a multiplexing effect.

[0073] The present invention also provides an embodiment, such as Figure 6 As shown, a method for testing the radio frequency circuit of the novel test machine includes the steps of:

[0074] S610 The first address decoding end of the radio frequency signal selector controls the radio frequency signal connection end of the radio frequency signal selector to select and receive the radio frequency signal output by the device under test.

[0075] S620: The RF signal distributor receives the RF signal output by the RF signal selector, and the second decoding end of the RF signal distributor controls the distribution of the RF signal to the RF signal processing unit for different bandwidth processing.

[0076] S630: When the bandwidth adjustable circuit module in the radio frequency signal processing unit receives the radio frequency signal distributed by the radio frequency signal distributor, it adjusts the bandwidth of the radio frequency signal and then outputs it to the test machine.

[0077] Specifically, when the device under test needs to be filtered, the first address decoding end will control the RF signal selector to select the input of the RF signal of the device under test that needs to be tested, and control the RF signal distributor through the second address decoding end to input the RF signal into the filtering circuit. After the filtering circuit filters the RF signal, the RF signal is output to the tester.

[0078] In addition, it may be necessary to filter multiple devices under test. The first address decoding end will control the RF signal selector to select and receive the input of the RF signal of the first device under test to be tested, and control the RF signal distributor through the second address decoding end to input the RF signal into the filtering circuit. After the filtering circuit filters the RF signal, the RF signal is output to the tester. If it is necessary to filter the second device under test, the first address decoding end will control the RF signal selector to select and receive the input of the RF signal of the second device under test to be tested, and control the RF signal distributor through the second address decoding end to input the RF signal into the filtering circuit. After the filtering circuit filters the RF signal, the RF signal is output to the tester. Similarly, multiple devices under test can undergo the same filtering process through this RF circuit.

[0079] This RF circuit can filter multiple RF signals and realize multiplexing, which saves test costs and improves test efficiency.

[0080] The present invention also provides an embodiment, such as Figure 7 As shown, a method for testing the radio frequency circuit of the novel test machine includes the steps of:

[0081] S710 The first address decoding end of the radio frequency signal selector controls the radio frequency signal connection end of the radio frequency signal selector to select and receive the radio frequency signal output by the device under test.

[0082] S720 The RF signal distributor receives the RF signal output by the RF signal selector, and the second decoding end of the RF signal distributor controls the distribution of the RF signal to the RF signal processing unit for different bandwidth processing.

[0083] S730: When the through circuit module in the radio frequency signal processing unit receives the radio frequency signal distributed by the radio frequency signal distributor, it outputs the radio frequency signal.

[0084] Specifically, for radio frequency signals that do not need to be filtered, they can be output to the tester through a direct circuit, thus achieving a multifunctional multiplexing effect.

[0085] The present invention also provides an embodiment, such as Figure 8 As shown, a method for testing the radio frequency circuit of the novel test machine includes the steps of:

[0086] S810 The first address decoding end of the radio frequency signal selector controls the radio frequency signal connection end of the radio frequency signal selector to select and receive the radio frequency signal output by the device under test.

[0087] S820 The RF signal distributor receives the RF signal output by the RF signal selector, and the second decoding end of the RF signal distributor controls the distribution of the RF signal to the RF signal processing unit for different bandwidth processing.

[0088] S830: When the fixed bandwidth circuit module in the radio frequency signal processing unit receives the radio frequency signal distributed by the radio frequency signal distributor, it performs fixed filtering on the radio frequency signal.

[0089] In addition, there may be four devices under test that require different processing methods. The first device under test needs to be filtered, the second device under test does not need to be processed, the third device under test needs to be processed by a first fixed filter, and the fourth device under test needs to be processed by a second fixed filter. At this time, the RF signal selector and the RF signal distributor can be controlled by the address decoding end to achieve multifunctional multiplexing. At the same time, modularizing the RF circuit can make the RF circuit more practical and easy to operate in the system.

[0090] Based on the above embodiment, before the bandwidth adjustable circuit module in the radio frequency signal processing unit receives the radio frequency signal distributed by the radio frequency signal distributor, the following steps are included:

[0091] By adjusting the capacitance value and the inductance value of the bandwidth adjustable circuit, a filter circuit for filtering radio frequency signals of multiple frequency bands is obtained.

[0092] It should be noted that the above embodiments can be freely combined as needed. The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principle of the present invention, and these improvements and modifications should also be considered as the protection scope of the present invention.

Claims

1. A radio frequency circuit for a test machine, characterized in that: include: A radio frequency signal selector, wherein the first address decoding end of the radio frequency signal selector controls the radio frequency signal connection end of the radio frequency signal selector to select and receive the radio frequency signal output by the device under test; A radio frequency signal distributor connected to the radio frequency signal selector receives the radio frequency signal output by the radio frequency signal selector, and a second decoding end of the radio frequency signal distributor controls the distribution of the radio frequency signal to the radio frequency signal processing unit for different bandwidth processing; The RF signal processing unit includes a bandwidth adjustable circuit module, which is connected to the RF signal distributor, receives the RF signal distributed by the RF signal distributor, adjusts the bandwidth of the RF signal and then outputs it to the test machine; The first transmission end of the radio frequency signal selector is connected to the radio frequency signal output end of the first radio frequency signal connection end, and the first radio frequency signal connection end is used to receive the radio frequency signal of the first device under test; The second transmission end of the radio frequency signal selector is connected to the radio frequency signal output end of the second radio frequency signal connection end, and the second radio frequency signal connection end is used to receive the radio frequency signal of the second device under test; The third transmission end of the radio frequency signal selector is connected to the radio frequency signal output end of the third radio frequency signal connection end, and the third radio frequency signal connection end is used to receive the radio frequency signal of the third device under test; The fourth transmission end of the radio frequency signal selector is connected to the radio frequency signal output end of the fourth radio frequency signal connection end, and the fourth radio frequency signal connection end is used to receive the radio frequency signal of the fourth device under test; The fifth transmission terminal of the radio frequency signal selector is grounded via a resistor; The power supply of the radio frequency signal selector is connected to ground by connecting two bypass capacitors in parallel, so as to input a stable power supply; The RF signal control terminal of the RF signal selector is connected to the first address decoding terminal to control the selection of the RF signal; The sixth transmission end of the radio frequency signal selector is connected to the first transmission end of the radio frequency signal distributor as an input end / output end of the radio frequency signal; The radio frequency signal processing unit also includes: A fixed bandwidth circuit module, the radio frequency signal transmission end of the fixed bandwidth circuit module is connected to the transmission end of the radio frequency signal distributor, and is used to filter multiple radio frequency signals to obtain a radio frequency signal with a fixed bandwidth; and / or A through circuit module, wherein the RF signal transmission end of the through circuit is connected to the transmission end of the RF signal distributor, and when the original RF signal needs to be output, the RF signal is output through the through circuit; The through circuit module includes a first through circuit and a second through circuit; Wherein, the second transmission end of the RF signal distributor is connected to the first direct circuit; the third transmission end of the RF signal distributor is connected to the second direct circuit; The fixed bandwidth circuit module includes a first fixed filtering circuit and a second fixed filtering circuit; Wherein, the RF signal input terminal of the first fixed filter circuit is connected to the fourth transmission terminal of the RF signal distributor, and the RF signal input terminal of the second fixed filter circuit is connected to the fourth transmission terminal of the RF signal distributor; The first fixed filter circuit is used for filtering radio frequency signals of a first fixed frequency band; the second fixed filter circuit is used for filtering radio frequency signals of a second fixed frequency band.

2. The radio frequency circuit for a tester according to claim 1, characterized in that: The bandwidth adjustable circuit module includes three submodules and a grounding capacitor. The submodule is composed of an inductor and a capacitor connected in parallel. Filter circuits with different bandwidths are formed by adjusting the inductance value and the capacitance value.

3. The radio frequency circuit for a test machine according to claim 1, characterized in that: The RF signal control terminal of the RF signal distributor is connected to the second address decoding terminal, so as to control the selection of the RF signal through the second address decoding terminal; The power supply of the radio frequency signal selector is grounded by connecting two parallel bypass capacitors for inputting a stable power supply.

4. A testing system, characterized in that: A radio frequency circuit for a tester comprising any one of claims 1 to 3, and further comprising a control unit, a tester, and a device under test; The first transmission end of the first radio frequency circuit is connected to the test machine through a first switching switch, and is used to transmit the radio frequency signal of the device under test to the test machine; The second transmission end of the first radio frequency circuit is connected to the first transmission end of the device under test, and is used to obtain the radio frequency signal of the device under test; The address decoding end of the first radio frequency circuit is connected to a control unit, and the first radio frequency circuit is controlled by the control unit; The first transmission end of the second radio frequency circuit is connected to the second transmission end of the device under test, and is used to obtain the radio frequency signal of the device under test; The first transmission end of the second RF circuit is connected to the tester through a second switching switch, and is used to transmit the RF signal of the device under test to the tester; the address decoding end of the second RF circuit is connected to the control unit, and the second RF circuit is controlled by the control unit.

5. A testing method for a radio frequency circuit used in a testing machine as claimed in any one of claims 1 to 3, characterized in that: Includes steps: The first address decoding end of the radio frequency signal selector controls the radio frequency signal connection end of the radio frequency signal selector to select and receive the radio frequency signal output by the device under test; The RF signal distributor receives the RF signal output by the RF signal selector, and the second decoding end of the RF signal distributor controls the distribution of the RF signal to the RF signal processing unit for different bandwidth processing; When the bandwidth adjustable circuit module in the radio frequency signal processing unit receives the radio frequency signal distributed by the radio frequency signal distributor, it adjusts the bandwidth of the radio frequency signal and then outputs it to the test machine.

6. The testing method according to claim 5, characterized in that: Also includes the steps: When the through circuit module in the radio frequency signal processing unit receives the radio frequency signal distributed by the radio frequency signal distributor, it outputs the radio frequency signal; When the fixed bandwidth circuit module in the radio frequency signal processing unit receives the radio frequency signal distributed by the radio frequency signal distributor, it performs fixed filtering on the radio frequency signal.

7. The testing method according to claim 6, characterized in that: Before the bandwidth adjustable circuit module in the radio frequency signal processing unit receives the radio frequency signal distributed by the radio frequency signal distributor, the steps include: By adjusting the capacitance value and the inductance value of the bandwidth adjustable circuit, a filter circuit for filtering radio frequency signals of multiple frequency bands is obtained.

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