Speaker audio automation test comparison device, system and test method

Abstract

The speaker audio automation test and comparison device of the present invention includes a microphone, a test circuit electrically connected to the microphone, and a display screen electrically connected to the test circuit. The test circuit is used to process the sound wave signal picked up by the microphone, perform audio processing on the sound wave signal, identify and judge the audio parameters, compare and obtain the audio test results, and display them on the display screen. The test circuit is installed in the test device. The test circuit includes: a microphone circuit, an audio processing circuit electrically connected to the microphone circuit, a frequency extraction circuit and an amplitude extraction circuit electrically connected to the audio processing circuit respectively, a single-chip microcomputer electrically connected to the frequency extraction circuit and the amplitude extraction circuit respectively, and a memory electrically connected to the single-chip microcomputer. This solution is suitable for a test device used in production, has good versatility, is suitable for testing various types of speaker products, and can screen out defective products, has good reliability, has the advantages of high test accuracy, simple operation, high work efficiency, and is suitable for mass production.

Description

Technical Field

[0001] The present invention relates to the field of speaker product manufacturing, and in particular to a speaker audio automatic testing and comparison device, system and testing method. Background Art

[0002] Speakers are a common electronic product with a wide range of uses. The production of speakers is inseparable from the audio testing of speakers. During the production process, audio consistency testing can only be done by human ears or by speaker testing equipment on the market. The existing audio testing methods have the following defects:

[0003] (1) Human hearing is done by artificial hearing to test whether the audio has noise or abnormal sound, which can easily cause auditory fatigue and lead to misjudgment. The test accuracy cannot be guaranteed.

[0004] (2) Existing audio test equipment is costly, bulky, cumbersome to operate, and has low test efficiency, making it unsuitable for mass production on production lines.

[0005] In order to overcome the above problems, we invented a speaker audio automation test comparison device, system and test method. Summary of the invention

[0006] The invention aims to solve the problems of the existing audio testing method, which uses manual listening to test whether the audio has noise or abnormal sound, which is easy to cause auditory fatigue and thus lead to misjudgment, the test accuracy cannot be guaranteed, the audio testing equipment is high in cost, large in size, cumbersome in operation, low in test efficiency, and not suitable for mass production. The specific solution is as follows:

[0007] The invention discloses an automatic audio test and comparison device for a speaker, comprising a microphone, a test circuit electrically connected to the microphone, and a display screen electrically connected to the test circuit. The test circuit is used to process the sound wave signal picked up by the microphone, perform audio processing on the sound wave signal, identify and judge the audio parameters, compare and obtain the audio test results, and display them on the display screen. The test circuit is installed in the test device.

[0008] Furthermore, the test circuit includes: a microphone circuit, an audio processing circuit electrically connected to the microphone circuit, a frequency extraction circuit and an amplitude extraction circuit electrically connected to the audio processing circuit respectively, a single-chip microcomputer electrically connected to the frequency extraction circuit and the amplitude extraction circuit respectively, and a memory electrically connected to the single-chip microcomputer, wherein the memory is used to store standard test data and test results.

[0009] Further, the microphone circuit includes: a resistor R2 having one end electrically connected to the microphone output pin, the other end of the resistor R2 being electrically connected to one end of the resistor R4, the capacitor C14, and the capacitor C16, the other end of the resistor R4 being electrically connected to one end of the resistor R3 and the capacitor C15, the other end of the resistor R3 being electrically connected to one end of the resistor R8 and the VCC power supply end, the other end of the resistor R8 being electrically connected to one end of the capacitor C18, the resistor R12, and the resistor R11, the other ends of the capacitor C18, the resistor R12, the capacitor C15, and the capacitor C16 being grounded at the same time, and the other end of the capacitor C14 being electrically connected to one end of the resistor R5.

[0010] Further, the audio processing circuit includes: pin 2 of chip U2 electrically connected to the other end of resistor R5, resistor R9, and one end of capacitor C17 at the same time, pin 3 of chip U2 electrically connected to the other end of resistor R11, pin 1 of chip U2 electrically connected to resistor R9, the other end of capacitor C17, and one end of resistor R6 at the same time, pin 8 of chip U2 electrically connected to the other end of resistor 6, resistor R10, one end of capacitor C12, the positive electrode of electrolytic EC3, and the VCC power supply end at the same time, pin 6 of chip U2 electrically connected to the other end of resistor R10 and one end of resistor R13 at the same time, and pin 4 of chip U2, resistor R13, the other end of capacitor C12, and the negative electrode of electrolytic EC3 are grounded at the same time.

[0011] Furthermore, the frequency extraction circuit includes: one end of resistor R23 electrically connected to pin 7 of chip U2, the other end of resistor R23 is electrically connected to resistor R26, one end of capacitor C35, and the first ADC1 interface of the microcontroller, and the other ends of resistor R26 and capacitor C35 are grounded at the same time.

[0012] Further, the amplitude extraction circuit includes: a resistor R14, a capacitor C27, a capacitor C26, and one end of a capacitor C25 electrically connected to pin 5 of the chip U2 at the same time, the other end of the capacitor C25 electrically connected to the positive electrode of the diode D5 and the negative electrode of the diode D6 at the same time, the negative electrode of the diode D5 electrically connected to the capacitor C28, the capacitor C29, the resistor R15, and one end of the resistor R27 at the same time, the other end of the resistor R27 electrically connected to the resistor R29, one end of the capacitor C36, and the second ADC2 interface of the single-chip computer at the same time, and the resistor R14, the capacitor C27, the capacitor C26, the capacitor C28, the capacitor C29, the resistor R15, the resistor R29, the other end of the capacitor C36, and the positive electrode of the diode D5 are grounded at the same time.

[0013] A speaker audio automation test and comparison system based on the above-mentioned speaker audio automation test and comparison device includes a soundproof box, a sound cavity is provided at one end of the soundproof box, which is used to place the speaker under test, a sound hole is provided on the cavity wall of the sound cavity facing the other end of the soundproof box, the sound hole is aimed at the speaker of the speaker under test, a microphone is arranged at the other end of the soundproof box and faces the sound hole, the microphone is electrically connected to the test device outside the soundproof box, and the power amplifier input end of the speaker under test is electrically connected to the audio signal source outside the soundproof box.

[0014] The speaker audio automation test comparison method based on the above speaker audio automation test comparison system is performed according to the following steps:

[0015] Step 1: pre-storing standard test data in the test device;

[0016] Step 2, placing the speaker under test into the sound-emitting cavity in the soundproof box;

[0017] Step 3, the audio signal source inputs the test audio into the speaker under test;

[0018] Step 4, the test device is electrically connected to the microphone in the soundproof box;

[0019] Step 5, according to the preset procedure, the tested speaker plays the test audio;

[0020] Step 6, the microphone collects audio sound wave signals;

[0021] Step 7, the sound wave signal is sent to the microphone circuit of the test device, and after small signal processing, an audio analog signal is obtained and sent to the audio processing circuit;

[0022] Step 8, the audio processing circuit performs audio processing on the audio analog signal and then sends the processed signal to the frequency extraction circuit and the amplitude extraction circuit respectively;

[0023] Step 9, the frequency signal extracted by the frequency extraction circuit is sent to the first ADC1 interface of the single chip microcomputer;

[0024] Step 10, the amplitude signal extracted by the amplitude extraction circuit is sent to the second ADC2 interface of the single chip microcomputer;

[0025] Step 11, the single chip microcomputer detects and identifies the change of ADC value;

[0026] Step 12, comparing and analyzing the single chip computer with the standard test data, and making judgments;

[0027] Step 13, sending the final test result to the display screen for display and storing it in the memory for backup;

[0028] Step 14, take out the tested speaker and put in the next tested speaker;

[0029] Step 15: Repeat steps 2 to 14 until all the speakers are tested.

[0030] Furthermore, the test audio is a sine wave signal of each relevant test frequency point; the first ADC1 interface and the second ADC2 interface are electrically connected to the analog-to-digital converter in the single-chip microcomputer respectively.

[0031] Furthermore, the ADC values ​​include: total frequency, duty cycle average, maximum, minimum, frequency average, maximum, minimum, amplitude average, maximum, minimum, sampling start position, end position, and sampling frequency.

[0032] In summary, the technical solution of the present invention has the following beneficial effects:

[0033] This solution solves the existing audio testing methods, which use manual listening to test whether the audio has noise or abnormal sound, which is easy to cause auditory fatigue and lead to misjudgment, and the test accuracy cannot be guaranteed. The audio testing equipment is costly, large in size, cumbersome to operate, and has low test efficiency, which is not suitable for mass production. This solution only requires a relatively low cost to produce a test device suitable for production use. This device has good versatility and is suitable for testing various types of speaker products and screening out defective products. It has good reliability and has the advantages of high test accuracy, simple operation, high work efficiency, and is suitable for mass production. This solution can screen out defective speaker products such as frequency distortion, amplitude distortion, abnormal speaker sound, and inadequate assembly, ensuring the qualified rate of speaker products and strong practicality. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments of the present invention. Obviously, the drawings described below are only part of the embodiments of the present invention, and those skilled in the art can obtain other drawings based on these drawings without creative labor.

[0035] Figure 1 A block diagram of a speaker audio automation test and comparison device according to the present invention;

[0036] Figure 2 A test circuit diagram of the present invention;

[0037] Figure 3 It is a structural diagram of the speaker audio automation test comparison system of the present invention.

[0038] Description of reference numerals:

[0039] 10-microphone, 20-test circuit, 21-microphone circuit, 22-audio processing circuit, 23-frequency extraction circuit, 24-amplitude extraction circuit, 25-single-chip microcomputer, 26-memory, 30-display screen, 40-soundproof box, 41-sound cavity, 42-sound hole, 50-sound box under test, 60-test device, 70-audio signal source. DETAILED DESCRIPTION

[0040] The technical scheme in the embodiment of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiment of the present invention. Obviously, the described embodiment is only a part of the embodiment of the present invention, not all of the embodiments. Based on the embodiment of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0041] like Figure 1 , 2 As shown, the speaker audio automatic test and comparison device includes a microphone 10, a test circuit 20 electrically connected to the microphone 10, and a display screen 30 electrically connected to the test circuit 20. The test circuit 20 is used to process the sound wave signal picked up by the microphone 10, perform audio processing on the sound wave signal, identify and judge the audio parameters, and compare and obtain the audio test results, and display them on the display screen 30. The test circuit 20 is installed in the test device 60 (such as Figure 3 shown).

[0042] Furthermore, the test circuit 20 includes: a microphone circuit 21, an audio processing circuit 22 electrically connected to the microphone circuit 21, a frequency extraction circuit 23 and an amplitude extraction circuit 24 electrically connected to the audio processing circuit 22 respectively, a single-chip computer 25 electrically connected to the frequency extraction circuit 23 and the amplitude extraction circuit 24 respectively, and a memory 26 electrically connected to the single-chip computer 25, and the memory 26 is used to store standard test data and test results (a test program is also stored in the memory 26).

[0043] Furthermore, the microphone circuit 21 includes: a resistor R2 having one end electrically connected to the output pin MIC_R+ of the microphone 10, the other end of the resistor R2 being electrically connected to one end of the resistor R4, the capacitor C14, and the capacitor C16, the other end of the resistor R4 being electrically connected to one end of the resistor R3 and the capacitor C15, the other end of the resistor R3 being electrically connected to one end of the resistor R8 and the VCC power supply end, the other end of the resistor R8 being electrically connected to one end of the capacitor C18, the resistor R12, and the resistor R11, the other ends of the capacitor C18, the resistor R12, the capacitor C15, and the capacitor C16 being grounded, and the other end of the capacitor C14 being electrically connected to one end of the resistor R5.

[0044] Further, the audio processing circuit 22 includes: pin 2 of chip U2 electrically connected to the other end of resistor R5, resistor R9, and one end of capacitor C17 at the same time, pin 3 of chip U2 electrically connected to the other end of resistor R11, pin 1 of chip U2 electrically connected to resistor R9, the other end of capacitor C17, and one end of resistor R6 at the same time, pin 8 of chip U2 electrically connected to the other end of resistor 6, resistor R10, one end of capacitor C12, the positive electrode of electrolytic EC3, and the VCC power supply end at the same time, pin 6 of chip U2 electrically connected to the other end of resistor R10 and one end of resistor R13 at the same time, and pin 4 of chip U2, resistor R13, the other end of capacitor C12, and the negative electrode of electrolytic EC3 are grounded at the same time.

[0045] Furthermore, the frequency extraction circuit 23 includes: one end of a resistor R23 electrically connected to pin 7 of the chip U2, the other end of the resistor R23 electrically connected to a resistor R26, one end of a capacitor C35, and a first ADC1 interface of the single-chip computer, and the other ends of the resistor R26 and the capacitor C35 are grounded at the same time. (ADC is the abbreviation of Analog to Digital Converter, which refers to an analog-to-digital converter and is located inside the single-chip computer.)

[0046] Furthermore, the amplitude extraction circuit 24 includes: a resistor R14, a capacitor C27, a capacitor C26, and one end of a capacitor C25 which are electrically connected to pin 5 of the chip U2 at the same time; the other end of the capacitor C25 is electrically connected to the positive electrode of the diode D5 and the negative electrode of the diode D6 at the same time; the negative electrode of the diode D5 is electrically connected to the capacitor C28, the capacitor C29, the resistor R15, and one end of the resistor R27 at the same time; the other end of the resistor R27 is electrically connected to the resistor R29, one end of the capacitor C36, and the second ADC2 interface of the microcontroller at the same time; the resistor R14, the capacitor C27, the capacitor C26, the capacitor C28, the capacitor C29, the resistor R15, the resistor R29, the other end of the capacitor C36, and the positive electrode of the diode D5 are grounded at the same time.

[0047] The single chip microcomputer 25 of this solution belongs to the prior art, and its specific working principle will not be described in detail here. Figure 2 The specific parameters or models of the components (including chips, capacitors, resistors, diodes, microphones, etc.) can be adjusted according to the specific products and actual conditions, and some components can be appropriately cancelled.

[0048] like Figure 3As shown, a speaker audio automation test and comparison system based on the above-mentioned speaker audio automation test and comparison device includes a soundproof box 40, and a sound cavity 41 is provided at one end of the soundproof box 40 for accommodating a speaker 50 under test. A sound hole 42 is provided on the cavity wall of the sound cavity 41 facing the other end of the soundproof box 40, and the sound hole 42 is aimed at a speaker (not shown in the figure) of the speaker 50 under test. A microphone 10 is arranged at the other end of the soundproof box 40 and faces the sound hole 42. The microphone 10 is electrically connected to a test device 60 outside the soundproof box 40, and the power amplifier input end of the speaker 50 under test is electrically connected to an audio signal source 70 outside the soundproof box 40.

[0049] The speaker audio automation test comparison method based on the above speaker audio automation test comparison system is performed according to the following steps:

[0050] Step 1, pre-storing standard test data in the test device 60;

[0051] Step 2, placing the tested sound box 50 into the sound cavity 41 in the soundproof box 40;

[0052] Step 3, the audio signal source 70 inputs the test audio into the tested speaker; (the test audio is a sine wave signal of each relevant test frequency point, and the relevant test frequency point is selected according to the specific product standard.)

[0053] Step 4, the testing device 60 is electrically connected to the microphone 10 in the soundproof box 40;

[0054] Step 5, according to a preset procedure (referred to as a test procedure), the tested speaker 50 plays the test audio;

[0055] Step 6, the microphone 10 collects audio sound wave signals;

[0056] Step 7, the sound wave signal is sent to the microphone circuit 21 of the test device 60, and after small signal processing, an audio analog signal is obtained and sent to the audio processing circuit 22;

[0057] Step 8, the audio processing circuit 22 performs audio processing on the audio analog signal and sends it to the frequency extraction circuit 23 and the amplitude extraction circuit 24 respectively;

[0058] Step 9, the frequency signal extracted by the frequency extraction circuit 23 is sent to the first ADC1 interface of the single chip microcomputer 25;

[0059] Step 10, the amplitude signal extracted by the amplitude extraction circuit 24 is sent to the second ADC2 interface of the single chip microcomputer 25;

[0060] Step 11, the single chip microcomputer 25 detects and identifies the change of ADC value; (ADC value includes: total frequency, duty cycle average value, maximum value, minimum value, frequency average value, maximum value, minimum value, amplitude average value, maximum value, minimum value, sampling start position, end position, sampling frequency.)

[0061] Step 12, the single chip microcomputer 25 compares and analyzes the standard test data and makes a judgment;

[0062] Step 13, the final test result is sent to the display screen 30 for display, and stored in the memory 26 for backup;

[0063] Step 14, taking out the tested speaker 50 and putting in the next tested speaker 50;

[0064] Step 15, repeat steps 2 to 14 until all the tested speakers 50 are tested.

[0065] Furthermore, the first ADC1 interface and the second ADC2 interface are electrically connected to the analog-to-digital converter in the single-chip microcomputer 25 respectively.

[0066] In summary, the technical solution of the present invention has the following beneficial effects:

[0067] This solution solves the existing audio testing methods, which use manual listening to test whether the audio has noise or abnormal sound, which is easy to cause auditory fatigue and lead to misjudgment, and the test accuracy cannot be guaranteed. The audio testing equipment is costly, large in size, cumbersome to operate, and has low test efficiency, which is not suitable for mass production. This solution only requires a relatively low cost to produce a test device suitable for production use. This device has good versatility and is suitable for testing various types of speaker products and screening out defective products. It has good reliability and has the advantages of high test accuracy, simple operation, high work efficiency, and is suitable for mass production. This solution can screen out defective speaker products such as frequency distortion, amplitude distortion, abnormal speaker sound, and inadequate assembly, ensuring the qualified rate of speaker products and strong practicality.

[0068] The above-mentioned implementation modes do not constitute a limitation on the protection scope of the technical solution. Any modification, equivalent replacement and improvement made within the spirit and principle of the above-mentioned implementation modes shall be included in the protection scope of the technical solution.

Claims

1. A speaker audio automation test and comparison device, characterized by: It includes a microphone, a test circuit electrically connected to the microphone, and a display screen electrically connected to the test circuit. The test circuit is used to process the sound wave signal picked up by the microphone, perform audio processing on the sound wave signal, identify and judge the audio parameters, compare and obtain the audio test results, and display them on the display screen. The test circuit is installed in the test device; The test circuit comprises: a microphone circuit, an audio processing circuit electrically connected to the microphone circuit, a frequency extraction circuit and an amplitude extraction circuit electrically connected to the audio processing circuit respectively, a single-chip microcomputer electrically connected to the frequency extraction circuit and the amplitude extraction circuit respectively, and a memory electrically connected to the single-chip microcomputer, wherein the memory is used to store standard test data and test results; The microphone circuit includes: a resistor R2 with one end electrically connected to the microphone output pin, the other end of the resistor R2 is electrically connected to the resistor R4, the capacitor C14, and one end of the capacitor C16, the other end of the resistor R4 is electrically connected to the resistor R3 and one end of the capacitor C15, the other end of the resistor R3 is electrically connected to one end of the resistor R8 and the VCC power supply end, the other end of the resistor R8 is electrically connected to the capacitor C18, the resistor R12, and one end of the resistor R11, the other ends of the capacitor C18, the resistor R12, the capacitor C15, and the capacitor C16 are grounded, and the other end of the capacitor C14 is electrically connected to one end of the resistor R5; The audio processing circuit includes: pin 2 of chip U2 electrically connected to the other end of resistor R5, resistor R9, and one end of capacitor C17 at the same time, pin 3 of chip U2 electrically connected to the other end of resistor R11, pin 1 of chip U2 electrically connected to resistor R9, the other end of capacitor C17, and one end of resistor R6 at the same time, pin 8 of chip U2 electrically connected to the other end of resistor 6, resistor R10, one end of capacitor C12, the positive electrode of electrolytic EC3, and the VCC power supply end at the same time, pin 6 of chip U2 electrically connected to the other end of resistor R10 and one end of resistor R13 at the same time, and pin 4 of chip U2, resistor R13, the other end of capacitor C12, and the negative electrode of electrolytic EC3 are grounded at the same time; The frequency extraction circuit includes: one end of a resistor R23 electrically connected to pin 7 of the chip U2, the other end of the resistor R23 electrically connected to a resistor R26, one end of a capacitor C35, and a first ADC1 interface of the single-chip computer, and the other ends of the resistor R26 and the capacitor C35 are grounded at the same time; The amplitude extraction circuit includes: a resistor R14, a capacitor C27, a capacitor C26, and one end of a capacitor C25 which are electrically connected to pin 5 of the chip U2 at the same time; the other end of the capacitor C25 is electrically connected to the positive electrode of the diode D5 and the negative electrode of the diode D6 at the same time; the negative electrode of the diode D5 is electrically connected to the capacitor C28, the capacitor C29, the resistor R15, and one end of the resistor R27 at the same time; the other end of the resistor R27 is electrically connected to the resistor R29, one end of the capacitor C36, and the second ADC2 interface of the single-chip computer at the same time; the resistor R14, the capacitor C27, the capacitor C26, the capacitor C28, the capacitor C29, the resistor R15, the resistor R29, the other end of the capacitor C36, and the positive electrode of the diode D5 are grounded at the same time.

2. A speaker audio automation test and comparison system based on the speaker audio automation test and comparison device according to claim 1, characterized in that: It includes a soundproof box, one end of which is provided with a sound cavity for accommodating the sound box under test, a sound hole is provided on the cavity wall of the sound cavity facing the other end of the soundproof box, the sound hole is aimed at the speaker of the sound box under test, a microphone is arranged at the other end of the soundproof box and faces the sound hole, the microphone is electrically connected to a test device outside the soundproof box, and the power amplifier input end of the sound box under test is electrically connected to an audio signal source outside the soundproof box.

3. The speaker audio automation test and comparison method based on the speaker audio automation test and comparison system according to claim 2 is characterized in that: Follow these steps: Step 1: pre-storing standard test data in the test device; Step 2, placing the speaker under test into the sound-emitting cavity in the soundproof box; Step 3, the audio signal source inputs the test audio into the speaker under test; Step 4, the test device is electrically connected to the microphone in the soundproof box; Step 5, according to the preset procedure, the tested speaker plays the test audio; Step 6, the microphone collects audio sound wave signals; Step 7, the sound wave signal is sent to the microphone circuit of the test device, and after small signal processing, an audio analog signal is obtained and sent to the audio processing circuit; Step 8, the audio processing circuit performs audio processing on the audio analog signal and then sends the processed signal to the frequency extraction circuit and the amplitude extraction circuit respectively; Step 9, the frequency signal extracted by the frequency extraction circuit is sent to the first ADC1 interface of the single chip microcomputer; Step 10, the amplitude signal extracted by the amplitude extraction circuit is sent to the second ADC2 interface of the single chip microcomputer; Step 11, the single chip microcomputer detects and identifies the change of ADC value; Step 12, comparing and analyzing the single chip computer with the standard test data, and making judgments; Step 13, sending the final test result to the display screen for display and storing it in the memory for backup; Step 14, take out the tested speaker and put in the next tested speaker; Step 15: Repeat steps 2 to 14 until all the speakers are tested.

4. The speaker audio automation test comparison method according to claim 3 is characterized by: The test audio is a sine wave signal of each relevant test frequency point; the first ADC1 interface and the second ADC2 interface are electrically connected to the analog-to-digital converter in the single-chip microcomputer respectively.

5. The speaker audio automation test comparison method according to claim 3 is characterized in that: The ADC values ​​include: total frequency, duty cycle average, maximum, minimum, frequency average, maximum, minimum, amplitude average, maximum, minimum, sampling start position, end position, and sampling frequency.

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