FCT test fixture and method

Abstract

The present invention discloses an FCT test fixture and method. The FCT test fixture is provided with a test device. The test device includes an MCU main control circuit, a power module electrically connected to the MCU main control circuit, an infrared transmitting circuit, a current and voltage detection module, a peripheral function test port module and an alarm circuit. The peripheral function test port module includes one or more test connection circuits. The test connection circuit includes a connection terminal. Each pin of the connection terminal is grounded through a resistor and a voltage regulator tube. The present invention can be used to test according to the test requirements of multiple different functional modules of a circuit board to be tested, and it can be tested and judged in a short time whether the circuits of each functional module of the circuit mainboard of the sweeping machine are normal, thereby effectively improving the work efficiency.

Description

Technical Field

[0001] The present invention relates to the field of FCT testing, and in particular to an FCT testing fixture and method. Background Art

[0002] With the continuous development of artificial intelligence technology, more and more smart homes have emerged. The emergence of sweeping machines has gradually replaced manual cleaning and has been accepted by more and more people. A sweeping robot (abbreviated as a sweeping machine), also known as an automatic sweeping machine, smart vacuum cleaner, robot vacuum cleaner, etc., is a kind of smart home appliance and is currently widely used. The main working process of the existing sweeping robot is as follows: the sweeping robot moves on the ground, absorbs dust and other garbage on the ground into its own dust box, thereby completing the function of cleaning the ground. Then, the user needs to press the dust box release button on the surface of the sweeping robot at regular intervals to take out the dust box, then clean the dust box, remove the garbage in the dust box, and then reinstall the dust box into the sweeping robot.

[0003] In the process of manufacturing sweepers, it is necessary to perform FCT testing (functional testing) on ​​the circuit board of the sweeper. When the circuit board of the sweeper passes the functional tests, the subsequent assembly process can be carried out to intercept defective products in the initial stage of the product, thereby improving product quality and avoiding unnecessary rework. At present, in the functional testing of the circuit board of the sweeper on the existing market, different functional module circuits usually require different testing tools for testing, and the testing method has the disadvantages of long testing time and low work efficiency. Summary of the invention

[0004] In view of this, the present invention provides a FCT test fixture and method to solve the defects of the circuit board testing method of the sweeping machine in the prior art, such as long testing time and low working efficiency.

[0005] To achieve the above object, the present invention provides the following technical solution: an FCT test fixture, which is used in the functional test of the circuit mainboard of the sweeping machine, wherein the FCT test fixture is provided with a test device, and the test device includes an MCU main control circuit,

[0006] A power supply module, electrically connected to the MCU main control circuit, for providing power supply;

[0007] An infrared transmitting circuit, electrically connected to the MCU main control circuit, for sending a preset test infrared code value;

[0008] A current and voltage detection module, electrically connected to the MCU main control circuit, for detecting current and voltage information of the circuit board to be tested;

[0009] A peripheral function test port module is electrically connected to the MCU main control circuit and is used to connect to the circuit board to be tested and perform peripheral function testing;

[0010] An alarm circuit, electrically connected to the MCU main control circuit, for outputting an alarm signal when an abnormality is detected in the function of the circuit board to be tested;

[0011] Wherein, the peripheral function test port module includes one or more test connection circuits, and the test connection circuit includes a connection terminal, and each pin of the connection terminal is grounded through a resistor and a voltage regulator tube respectively;

[0012] The current and voltage detection module includes a connection terminal, which includes at least four pins, one of which is grounded, another pin is connected to the power supply end of the circuit board to be tested, and the third pin and the fourth pin are connected to the MUC main control circuit through resistors respectively.

[0013] Preferably, the power module comprises a DCDC circuit and an LDO conversion circuit which are electrically connected in sequence, and the LDO conversion circuit is electrically connected to the MCU main control circuit.

[0014] Preferably, the test device also includes a display screen module, which is electrically connected to the MCU main control circuit and is used to display test data; the test device also includes a key module, which is electrically connected to the MCU main control circuit and is used to control the working state of the FCT test fixture.

[0015] The present invention also provides a FCT testing method, which is applied to the FCT testing fixture as described above, and the FCT testing method comprises the following steps:

[0016] S10, placing the circuit board to be tested on the FCT test fixture, and connecting the current and voltage detection module and / or the peripheral function test port module in the FCT test fixture to the corresponding connection terminals of the circuit board to be tested;

[0017] S20, the FCT test fixture and the circuit board to be tested are powered on, the infrared transmitting circuit sends a preset test infrared code value, and the circuit board to be tested enters a test mode after receiving the test infrared code value;

[0018] S30, check whether the corresponding version number is correct, if it is correct, proceed to the next step, if it is wrong, proceed to step S70;

[0019] S40, detecting the charging voltage value and the charging current value of the adapter of the circuit board to be tested by the current and voltage detection module, if the detected charging voltage value and the charging current value are within the preset range, proceed to the next step, otherwise proceed to step S70;

[0020] S50, detecting whether the functions of the functional modules of the sweeper are normal through the peripheral function test port module, if it is detected that the function of a certain functional module is abnormal during the detection process, then proceeding to step S70, if it is detected that the functions of all functional modules are normal, then proceeding to step S60;

[0021] S60, the display screen displays the information that the test has passed, and the process goes to step S80;

[0022] S70, the alarm module sends out an alarm message and / or the display screen displays information that the function of the corresponding functional module is abnormal, and the process goes to step S80;

[0023] S80, test ends.

[0024] Preferably, in the step S50, when the peripheral function test port module is used to detect whether the functions of the functional modules of the sweeping machine are normal, the specific detection steps include:

[0025] S501, detecting the current value and the main wheel grating count value of the sweeper through the peripheral function test port module to determine whether the main wheel function is normal, if normal, proceed to the next step, otherwise proceed to step S70;

[0026] S502, detecting the current value of the peripheral motor of the sweeping machine through the peripheral function test port module to determine whether the function of the external motor is normal, if it is normal, proceed to the next step, otherwise proceed to step S70;

[0027] S503, detecting the sensor data of the sweeping machine through the peripheral function test port module to determine whether the sensor function of the sweeping machine is normal, if normal, proceed to the next step, otherwise proceed to step S70;

[0028] S504, detecting the infrared module data of the sweeping machine through the peripheral function test port module to determine whether the infrared module function of the sweeping machine is normal, if normal, proceed to the next step, otherwise proceed to step S70;

[0029] S505, performing corresponding operations on the buttons of the button module, and detecting the level data of the buttons through the peripheral function test port module to determine whether the button functions of the sweeping machine are normal, if normal, proceeding to the next step, otherwise proceeding to step S70;

[0030] S506. Detect the power ripple data of the sweeping machine through the peripheral function test port module to determine whether the infrared module function of the sweeping machine is normal. If it is normal, proceed to step S60, otherwise proceed to step S70.

[0031] Preferably, in step S503, the sensor data of the sweeping machine is detected, including ground sensor data, omnidirectional sensor data and wall sensor data.

[0032] Preferably, in step S40, if the charging voltage value of the adapter is detected to be between 17V-21V, and the charging current value of the adapter is stabilized between 400-600ma within 2 seconds, it means that the detected charging voltage value and charging current value are within the preset range.

[0033] Preferably, in the step S501, the current value of the main wheel of the sweeper and the main wheel grating count value are detected to determine whether the main wheel function is normal, firstly give 0.5% PWM to control the main wheel, and then collect the current value to prevent the circuit board from burning out due to short circuit. If the current is normal at this time, then increase the PWM to the PWM output during normal running, collect the main wheel current value by the AD port of the MCU, collect the main wheel grating value by the interrupt port, count it, and after the main wheel rotates and stabilizes for 2s, then judge whether the main wheel current is between 20ma-90ma and whether the grating count value is normal;

[0034] Preferably, in step S502, the current value of the peripheral motor of the sweeping machine is detected to determine whether the function of the external motor is normal, and then a 5 / 1000 PWM output is given to control the motor, and then the current value is collected to prevent the motor from short-circuiting and burning the circuit board; if there is no abnormality in the current at this time, the PWM is increased to the normal running PWM test, and the side brush current value and the roller brush current are detected by the AD port of the MCU. After the motor rotates for 2s and stabilizes, data is collected again, and 2s later, it is determined whether the roller brush current value is between 120ma-190ma, and whether the side brush current value is between 20ma-50ma.

[0035] Compared with the prior art, the beneficial effects of the present invention are: testing can be performed according to the testing requirements of different functional modules of the circuit board to be tested, such as current and voltage information testing, sensor data testing, infrared module function testing, motor testing, collision testing, water tank testing, dust box testing, and power supply voltage testing and other functional tests can be performed on the circuit board to be tested. If a functional module of the circuit board to be tested is abnormal, the alarm module can promptly issue an alarm message to alarm; using the present invention, it can be tested and determined in a short time whether multiple different functional module circuits of the circuit board of the sweeper are normal, effectively improving work efficiency and improving product quality. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] Figure 1 This is a schematic block diagram of a circuit structure module of the test device described in Example 1 of the present invention;

[0037] Figure 2 This is a specific circuit schematic diagram of the MCU main control circuit in Embodiment 1 of the present invention;

[0038] Figure 3 This is a specific circuit schematic diagram of the power module described in Example 1 of the present invention;

[0039] Figure 4 is a specific circuit schematic diagram of the infrared transmitting circuit described in Example 1 of the present invention;

[0040] Figure 5 This is a specific circuit schematic diagram of the alarm module in Embodiment 1 of the present invention;

[0041] Figure 6 This is a specific circuit schematic diagram of the current and voltage detection module in Example 1 of the present invention;

[0042] Figure 7 This is a specific circuit schematic diagram of the peripheral function test port module described in Example 1 of the present invention;

[0043] Figure 8 This is a schematic flow chart of the FCT testing method described in Example 2 of the present invention;

[0044] Fig. 9 This is a schematic block diagram of the specific process of step S50 described in Example 2 of the present invention. DETAILED DESCRIPTION

[0045] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0046] Example 1

[0047] In this embodiment, a FCT test fixture is provided, which is applied to the functional test of the circuit mainboard of the sweeping machine. The FCT test fixture is provided with a test device, such as the attached Figure 1 The test device comprises an MCU main control circuit,

[0048] A power supply module, electrically connected to the MCU main control circuit, for providing power supply;

[0049] An infrared transmitting circuit, electrically connected to the MCU main control circuit, for sending a preset test infrared code value;

[0050] A current and voltage detection module, electrically connected to the MCU main control circuit, for detecting current and voltage information of the circuit board to be tested;

[0051] A peripheral function test port module is electrically connected to the MCU main control circuit and is used to connect to the circuit board to be tested and perform peripheral function testing;

[0052] An alarm circuit, electrically connected to the MCU main control circuit, for outputting an alarm signal when an abnormality is detected in the function of the circuit board to be tested;

[0053] Wherein, the current and voltage detection module includes a connection terminal, which includes at least four pins, one of which is grounded, another is connected to the power supply end of the circuit board to be tested, and the third and fourth pins are connected to the MUC main control circuit through resistors respectively;

[0054] The peripheral function test port module includes one or more test connection circuits, which include a connection terminal. Each pin of the connection terminal is grounded through a resistor and a voltage regulator tube, and the pin of the connection terminal is electrically connected to the IO port pin of the MCU main control circuit through the resistor.

[0055] In a specific embodiment, the specific circuit of the current and voltage detection module is as shown in the attached Figure 6 As shown, the current and voltage detection module can be used to test the charging current and charging voltage of the circuit board to be tested.

[0056] In the embodiment of the present invention, in order to realize that the FCT test fixture can test whether the various functional module circuits of the circuit board to be tested are normal, the FCT test fixture in this embodiment is provided with a peripheral function test port module, and the peripheral function test port module can be used to implement sensor data testing, infrared module testing, motor testing, collision testing, water tank testing, dust box testing, and power supply voltage testing on the circuit board. In a specific embodiment, the peripheral function test port module includes one or more test connection circuits, and the test connection circuit includes a connection terminal, and each pin of the connection terminal is grounded through a resistor and a voltage regulator tube, and the pin of the connection terminal is electrically connected to the IO port pin of the MCU main control circuit through a resistor. In the attached Figure 7In the figure, a test connection circuit with a connection terminal having 6 pins is shown. In order to implement various functional module circuit tests on the circuit board and connect with different functional module circuits, the test connection circuit can be set to multiple at the same time, and the number of pins of the connection terminal in the test connection circuit can be 2, 3, 4, 5, 6, 8, etc. When implementing various functional module circuit tests on the circuit board, the IO port of the MCU main control circuit can output different high and low levels (such as pulse signals with different pulse widths).

[0057] In a specific embodiment, the circuit board is a sweeper circuit mainboard, the chip model of the MCU in the MCU main control circuit is BK2535, and the specific circuit of the MCU main control circuit is as shown in the attached Figure 2 As shown. Since the sweeper circuit mainboard has a 19V fast charging function, in order to provide universal adaptability and improve the convenience during the test process, the power module in this embodiment is provided with a DCDC circuit and an LDO conversion circuit electrically connected in sequence, wherein the LDO conversion circuit is electrically connected to the MCU main control circuit. The DCDC circuit is used to convert the high voltage 19V into 5V, and the LDO conversion circuit converts the 5V into a 3.3V voltage, thereby being able to power the MCU in the MCU main control circuit. The specific circuit of the power module in this embodiment is shown in the attached Figure 3 shown.

[0058] The specific circuit of the infrared transmitting circuit is shown in the attached Figure 4 As shown, the MCU main control circuit can control the infrared transmitting circuit to send a preset test infrared code value. When the circuit board to be tested receives the preset test infrared code value, it can enter the test mode. Then the FCT test fixture can perform various functional module tests on the circuit board to be tested through the current and voltage detection module and the peripheral function test port module, such as the current and voltage information test of the circuit board, the sensor data test, the infrared module test, the motor test, the collision test, the water tank test, the dust box test, and the power supply voltage test.

[0059] In a preferred embodiment, the alarm circuit is a buzzer alarm circuit (as shown in the attached Figure 5As shown); in addition, in order to facilitate the display of test data, the FCT test fixture can also be provided with a display screen module electrically connected to the MCU main control circuit, and the display screen module can be used to display test data, so that the staff can timely analyze the bad conditions of the test circuit board according to the test data. In addition, the FCT test fixture also includes a key module, which is electrically connected to the MCU main control circuit and is used to control the working state of the FCT test fixture. For example, by pressing one of the keys, the infrared transmitting circuit can be controlled to send a preset test infrared code value; by pressing another key, the display screen in the display screen module can be controlled to display test data; by pressing a key, the alarm information of the alarm module can be released, etc.

[0060] The brief working process in this embodiment is as follows: the FCT test fixture is connected to the circuit board to be tested (hereinafter referred to as the circuit board) and powered on, and relevant operations are performed on the key module to make the infrared transmitting circuit of the FCT test fixture send the test infrared code value. After the circuit board receives the test infrared code value for verification, it enters the test mode. The current and voltage detection module can detect whether the charging current and charging voltage of the circuit board are stable. The detected charging current and voltage information can be displayed on the display screen. If the detected charging current and charging voltage are not within the preset range, the buzzer in the alarm module sends an alarm message to alarm; the peripheral Functional test port module, according to the needs of testing different functional module circuits, the MUC IO port outputs the corresponding pulse signal for testing, which can realize functional tests such as sensor data testing, infrared module testing, motor testing, collision testing, water tank testing, dust box testing, and power supply voltage testing. During the test, if the function of a certain functional module is abnormal, the buzzer in the alarm module will send out an alarm message, and the test data information can also be displayed on the display screen; the test time of the entire test process is less than 20 seconds, the test time is short, the work efficiency is high, and the test of various functional modules can be completed in a short time.

[0061] Example 2

[0062] The present invention also provides a FCT testing method, which is applied to the FCT testing fixture as described in Example 1, as shown in the attached Figure 8 As shown, the FCT test method includes the following steps:

[0063] S10, placing the circuit board to be tested on the FCT test fixture, and connecting the current and voltage detection module and / or the peripheral function test port module in the FCT test fixture to the corresponding connection terminals of the circuit board to be tested;

[0064] S20, the FCT test fixture and the circuit board to be tested are powered on, the infrared transmitting circuit sends a preset test infrared code value, and the circuit board to be tested enters a test mode after receiving the test infrared code value;

[0065] S30, check whether the corresponding version number is correct, if it is correct, proceed to the next step, if it is wrong, proceed to step S70;

[0066] S40, detecting the charging voltage value and the charging current value of the adapter of the circuit board to be tested by the current and voltage detection module, if the detected charging voltage value and the charging current value are within the preset range, proceed to the next step, otherwise proceed to step S70;

[0067] S50, detecting whether the functions of the functional modules of the sweeper are normal through the peripheral function test port module, if it is detected that the function of a certain functional module is abnormal during the detection process, then proceeding to step S70, if it is detected that the functions of all functional modules are normal, then proceeding to step S60;

[0068] S60, the display screen displays the information that the test has passed, and the process goes to step S80;

[0069] S70, the alarm module sends out an alarm message and / or the display screen displays information that the function of the corresponding functional module is abnormal, and the process goes to step S80;

[0070] S80, test ends.

[0071] Specifically, in step S50, when the functions of the functional modules of the sweeping machine are detected by the peripheral function test port module to see whether they are normal, the specific detection steps are as shown in the attached figure. Fig. 9 As shown, it includes:

[0072] S501, detecting the current value and the main wheel grating count value of the sweeper through the peripheral function test port module to determine whether the main wheel function is normal, if normal, proceed to the next step, otherwise proceed to step S70;

[0073] S502, detecting the current value of the peripheral motor of the sweeping machine through the peripheral function test port module to determine whether the function of the external motor is normal, if it is normal, proceed to the next step, otherwise proceed to step S70;

[0074] S503, detecting the sensor data of the sweeping machine through the peripheral function test port module to determine whether the sensor function of the sweeping machine is normal, if normal, proceed to the next step, otherwise proceed to step S70;

[0075] S504, detecting the infrared module data of the sweeping machine through the peripheral function test port module to determine whether the infrared module function of the sweeping machine is normal, if normal, proceed to the next step, otherwise proceed to step S70;

[0076] S505, performing corresponding operations on the buttons of the button module, and detecting the level data of the buttons through the peripheral function test port module to determine whether the button functions of the sweeping machine are normal, if normal, proceeding to the next step, otherwise proceeding to step S70;

[0077] S506. Detect the power ripple data of the sweeping machine through the peripheral function test port module to determine whether the infrared module function of the sweeping machine is normal. If it is normal, proceed to step S60, otherwise proceed to step S70.

[0078] It should be noted that the test steps between the above steps S501-S506 can be replaced in any order. For example, in step S501, the current value of the peripheral motor of the sweeping machine can be tested first to determine whether the function of the external motor is normal, or the infrared module data of the sweeping machine can be detected to determine whether the infrared module function of the sweeping machine is normal, or the infrared module data of the sweeping machine can be detected to determine whether the infrared module function of the sweeping machine is normal, and so on. Examples will not be given one by one here.

[0079] In a specific embodiment, in step S40, if the charging voltage value of the adapter is detected to be between 17V-21V, and the charging current value of the adapter is stable between 400-600ma within 2 seconds, it means that the detected charging voltage value and charging current value are within the preset range.

[0080] In the step S501, when detecting the current value and the main wheel grating count value of the sweeper to determine whether the main wheel function is normal, first give 0.5 PWM to control the main wheel, and then collect the current value to prevent the circuit board from burning out due to short circuit. If the current is normal at this time, increase the PWM to the PWM output during normal running, collect the main wheel current value through the AD port of the MCU, collect the main wheel grating value through the interrupt port, count it, and after the main wheel rotates for 2s and stabilizes, determine whether the main wheel current is between 20ma-90ma and whether the grating count value is normal;

[0081] In the step S502, when detecting the current value of the peripheral motor of the sweeping machine to determine whether the function of the external motor is normal, first give 5 thousandths of PWM output to control the motor, and then collect the current value to prevent the motor from short-circuiting and burning the circuit board; if there is no abnormality in the current at this time, increase the PWM to the normal running PWM test, and use the AD port of the MCU to detect the side brush current value and the roller brush current. After the motor rotates for 2s and stabilizes, collect data again, and after 2s, judge whether the roller brush current value is between 120ma-190ma and whether the side brush current value is between 20ma-50ma.

[0082] In the step S503, the sensor data of the sweeper is detected, which includes ground detection sensor data, omnidirectional sensor data and wall sensor data. Specifically, the peripheral function test port module is used to detect whether the feedback data of the four ground detection sensors of the sweeper are between 150-4095. When the ground detection sensor is suspended, the value is within 80. The closer to the ground, the higher the value. In the embodiment of the present invention, the height of the ground detection sensor from the ground is about 3 cm; the peripheral function test port module detects whether the three groups of omnidirectional sensor feedback data of the sweeper are between 500-4095. The omnidirectional value is less than 200 in the case of no obstacles. The closer to the obstacle, the higher the value; in this embodiment, the omnidirectional sensor is about 4 cm away from the wall; the peripheral function test port module is used to detect whether the feedback data of the two groups of wall sensors of the sweeper are between 550-4095. When the wall is unobstructed, the value is within 120. The closer to the wall, the higher the value; in this embodiment, the wall sensor is about 3 cm away from the wall.

[0083] In the step S504, when detecting the infrared module data of the sweeping machine to determine whether the infrared module of the sweeping machine functions normally, the infrared transmitting circuit continuously transmits a special fixed infrared code value, and the tested circuit board performs infrared decoding through IO interruption. The decoded code value is compared with the program set code value to determine whether the function of the infrared module is normal. If all infrared modules receive the code value, the detection is passed.

[0084] In the step S505, when detecting the level data of the button to determine whether the button function of the sweeping machine is normal, the tester presses the button. If it is detected that the button IO level is flipped, the test passes.

[0085] In an optional embodiment, in the step S50, when detecting whether the functions of each functional module of the sweeping machine are normal through the peripheral function test port module, the sweeping machine can also be subjected to a fan function test, a dust box function test, a water tank function test, an air pump function test, and a collision function test, etc. These function tests are not necessary and can be used as optional tests.

[0086] By utilizing the FCT testing method provided in the embodiment of the present invention, the FCT testing fixture can be used to quickly test the various functional module circuits of the circuit board of the sweeping machine, and the testing time is short (the entire testing time is less than 20 seconds), which can effectively improve work efficiency. It is possible to determine whether the function of the circuit board is normal in the initial stage, effectively intercept defective products, and effectively improve product quality.

Claims

1. A FCT testing method, characterized in that: Applied to the FCT test fixture, the FCT test method includes the following steps: S10, placing the circuit board to be tested on the FCT test fixture, and connecting the current and voltage detection module and / or the peripheral function test port module in the FCT test fixture to the corresponding connection terminals of the circuit board to be tested; S20, the FCT test fixture and the circuit board to be tested are powered on, the infrared transmitting circuit sends a preset test infrared code value, and the circuit board to be tested enters the test mode after receiving the test infrared code value; S30, check whether the corresponding version number is correct, if it is correct, proceed to the next step, if it is wrong, proceed to step S70; S40, detecting the charging voltage value and the charging current value of the adapter of the circuit board to be tested by the current and voltage detection module, if the detected charging voltage value and the charging current value are within the preset range, proceed to the next step, otherwise proceed to step S70; S50, detecting whether the functions of the functional modules of the sweeper are normal through the peripheral function test port module. If it is detected that the function of a functional module is abnormal during the detection process, the process proceeds to step S70. If it is detected that the functions of all functional modules are normal, the process proceeds to step S60; In step S50, when the peripheral function test port module is used to detect whether the functions of the functional modules of the sweeping machine are normal, the specific detection steps include: S501, detecting the current value and the main wheel grating count value of the sweeper through the peripheral function test port module to determine whether the main wheel function is normal, if it is normal, proceed to the next step, otherwise proceed to step S70; S502, detecting the current value of the peripheral motor of the sweeping machine through the peripheral function test port module to determine whether the function of the external motor is normal, if it is normal, proceed to the next step, otherwise proceed to step S70; S503, detecting the sensor data of the sweeping machine through the peripheral function test port module to determine whether the sensor function of the sweeping machine is normal, if normal, proceed to the next step, otherwise proceed to step S70; S504, detecting the infrared module data of the sweeping machine through the peripheral function test port module to determine whether the infrared module function of the sweeping machine is normal, if normal, proceed to the next step, otherwise proceed to step S70; S505, perform corresponding operations on the buttons of the button module, and detect the level data of the buttons through the peripheral function test port module to determine whether the button function of the sweeping machine is normal, if it is normal, proceed to the next step, otherwise proceed to step S70; S506, detecting the power ripple data of the sweeping machine through the peripheral function test port module to determine whether the infrared module function of the sweeping machine is normal, if normal, proceeding to step S60, otherwise, proceeding to step S70; S60, the display screen displays the information that the test has passed, and the process goes to step S80; S70, the alarm module sends out an alarm message and / or the display screen displays information that the function of the corresponding functional module is abnormal, and the process goes to step S80; S80, test ends.

2. The FCT testing method according to claim 1, characterized in that: In the step S503, the sensor data of the sweeping robot is detected, including ground sensor data, omnidirectional sensor data and wall sensor data.

3. The FCT testing method according to claim 1, characterized in that: In the step S40, if the charging voltage value of the adapter is detected to be between 17V-21V, and the charging current value of the adapter is stabilized between 400-600ma within 2 seconds, it means that the detected charging voltage value and charging current value are within the preset range.

4. The FCT testing method according to claim 1, characterized in that: In the step S501, the current value of the main wheel of the sweeper and the main wheel grating count value are detected to determine whether the main wheel function is normal. First, 0.5% PWM is applied to control the main wheel, and then the current value is collected to prevent the circuit board from burning out due to a short circuit. If there is no abnormality in the current at this time, the PWM is increased to the PWM output during normal running. The main wheel current value is collected by the AD port of the MCU, and the main wheel grating value is collected by the interrupt port. The counting process is performed on the main wheel. After the main wheel rotates and stabilizes for 2s, it is determined whether the main wheel current is between 20ma-90ma and whether the grating count value is normal.

5. An FCT test fixture using any one of the test methods of claims 1 to 4, applied to the functional test of the circuit mainboard of a sweeping machine, the FCT test fixture being provided with a test device, characterized in that: The test device comprises an MCU main control circuit, A power supply module, electrically connected to the MCU main control circuit, for providing power supply; An infrared transmitting circuit, electrically connected to the MCU main control circuit, for sending a preset test infrared code value; A current and voltage detection module, electrically connected to the MCU main control circuit, for detecting current and voltage information of the circuit board to be tested; A peripheral function test port module is electrically connected to the MCU main control circuit and is used to connect to the circuit board to be tested and perform peripheral function testing; An alarm circuit, electrically connected to the MCU main control circuit, for outputting an alarm signal when an abnormality is detected in the function of the circuit board to be tested; Wherein, the peripheral function test port module includes one or more test connection circuits, and the test connection circuit includes a connection terminal, and each pin of the connection terminal is grounded through a resistor and a voltage regulator tube respectively; The current and voltage detection module includes a connection terminal, which includes at least four pins, one of which is grounded, another pin is connected to the power supply end of the circuit board to be tested, and the third pin and the fourth pin are respectively connected to the MCU main control circuit through resistors.

6. The FCT test fixture according to claim 5, characterized in that: The power module comprises a DCDC circuit and an LDO conversion circuit which are electrically connected in sequence, and the LDO conversion circuit is electrically connected to the MCU main control circuit.

7. The FCT test fixture according to claim 5, characterized in that: The alarm circuit is a buzzer alarm circuit.

8. The FCT test fixture according to any one of claims 5 to 7, characterized in that: The testing device also includes a display screen module, which is electrically connected to the MCU main control circuit and is used to display test data.

9. The FCT test fixture according to claim 5, characterized in that: The test device also includes a key module, which is electrically connected to the MCU main control circuit and is used to control the working state of the FCT test fixture.

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