A DC phase drift parameter test system for multi-channel Y-waveguide devices

Abstract

The present invention discloses a DC phase drift parameter test system for a multi-channel Y-waveguide device, and relates to the field of measurement and photoelectric detection technology, wherein the photoelectric switch unit of the system includes m photoelectric switch modules; each photoelectric switch module includes n photoelectric switches, and the n photoelectric switches share an input end; each photoelectric switch module includes n output ends. In the system, a light source is connected to the first end of a fiber coupler, the second end of the fiber coupler is connected to the input end of a photoelectric switch module, and the input ends of the remaining photoelectric switch modules are connected to a fiber delay ring; the output ends of all photoelectric switch modules are used to connect a multi-channel Y-waveguide device; the third end of the fiber coupler is connected to the input end of a signal processing modulation module through a photoelectric detector, and the output end of the signal processing modulation module is used to connect a multi-channel Y-waveguide device. The present invention can achieve the purpose of multi-channel continuous and rapid measurement of DC phase drift parameters.

Description

Technical Field

[0001] The invention relates to the technical field of measurement and photoelectric detection, and in particular to a direct current phase drift parameter testing system for a multi-channel Y-waveguide device. Background Art

[0002] Y-waveguide phase modulator (Y-waveguide for short) is a multifunctional integrated optical device, a core component of the optical path of a fiber optic gyroscope system, and one of the typical applications of integrated optics.

[0003] The basic working principle of the Y waveguide is to add electrodes on both sides of the waveguide, and change the refractive index of the waveguide by changing the electric field applied on both sides of the waveguide through the electrodes, so that the light waves passing through the waveguide produce a phase difference, thereby realizing dynamic modulation of the phases of the two beams of light in the forward and reverse directions. Its evaluation parameters mainly include optical parameters (insertion loss, splitting ratio and polarization crosstalk of the Y branch, etc.) and electrical parameters (half-wave voltage, residual intensity modulation, etc.). Among them, the deeper DC phase drift parameter after the half-wave voltage parameter is one of the important electro-optical response parameters that affect the accuracy and stability of the high-precision fiber optic gyroscope system.

[0004] DC phase drift is also called waveform slope, which refers to the ratio of the phase difference drift of the optical signal to the phase difference of the waveguide device under the action of DC or low-frequency modulated electric field. When the modulation voltage is applied to the electrodes on both sides of the Y waveguide, the free mobile charges (OH - , K + 、Na + Alkaline metal ions (such as ions in water) will form a spatial induced electric field in the opposite direction of the external voltage, causing the effective electric field strength originally applied to the crystal to decrease, thereby causing the effective voltage applied to the waveguide to change over time. This phenomenon is the so-called DC phase drift.

[0005] At present, there is a relatively mature process for the production of Y-waveguide, especially in terms of how to improve performance. Many scholars have also conducted experimental research on the half-wave voltage test of Y-waveguide, but there is still a big gap in the automated detection technology of the DC phase drift parameters of Y-waveguide. Summary of the invention

[0006] The purpose of the present invention is to provide a DC phase drift parameter testing system for a multi-channel Y-waveguide device, so as to achieve the purpose of continuously and rapidly measuring DC phase drift parameters of multiple channels.

[0007] To achieve the above object, the present invention provides the following solutions:

[0008] A DC phase drift parameter test system for a multi-channel Y-waveguide device, comprising: a light source, an optical fiber coupler, a photoelectric switch unit, an optical fiber delay loop, a photoelectric detector, and a signal processing modulation module; wherein the photoelectric switch unit comprises m photoelectric switch modules; each of the photoelectric switch modules comprises n photoelectric switches, and the n photoelectric switches share one input end; each of the photoelectric switch modules comprises n output ends;

[0009] The light source is connected to the first end of the optical fiber coupler, the second end of the optical fiber coupler is connected to the input end of one of the photoelectric switch modules, and the input ends of the remaining photoelectric switch modules are connected to the optical fiber delay ring;

[0010] The output ends of all the photoelectric switch modules are used to connect to a multi-channel Y-waveguide device; wherein the number of channels of the multi-channel Y-waveguide device is n; and when working, the output ends of the photoelectric switch modules are connected to the ports of the multi-channel Y-waveguide device in a one-to-one correspondence;

[0011] The third end of the optical fiber coupler is connected to the input end of the photodetector, the output end of the photodetector is connected to the input end of the signal processing modulation module, the first output end of the signal processing modulation module is connected to the photoelectric switch module, and the second output end of the signal processing modulation module is used to connect to the multi-channel Y-waveguide device.

[0012] Optionally, it also includes: an optical fiber isolator;

[0013] The light source is connected to the first end of the optical fiber coupler through the optical fiber isolator.

[0014] Optionally, it also includes: a first depolarized optical fiber;

[0015] The second end of the optical fiber coupler is connected to the input end of the photoelectric switch module through the first depolarization optical fiber.

[0016] Optionally, it also includes: a connecting flange installed on the output end of the photoelectric switch module;

[0017] When working, the output end of the photoelectric switch module is connected to the multi-channel Y-waveguide device through the connecting flange.

[0018] Optionally, it also includes: a second depolarized optical fiber;

[0019] The optical fiber delay ring is connected to the input end of the photoelectric switch module through the second depolarization optical fiber.

[0020] Optionally, the number of the optical fiber delay rings is one or more.

[0021] Optionally, when the number of the optical fiber delay loops is (m-1) / 2, the DC phase drift parameter test system of the multi-channel Y-waveguide device further includes a second depolarization optical fiber and a third depolarization optical fiber; wherein m≥3, m is the number of the photoelectric switch modules and is an odd number;

[0022] The first fiber optic delay ring is connected to the input end of one of the photoelectric switch modules through the second depolarization fiber, and the first fiber optic delay ring is connected to the input end of another photoelectric switch module through the third depolarization fiber; wherein, one of the photoelectric switch modules and the other photoelectric switch module are adjacent photoelectric switch modules; and the first fiber optic delay ring is one of all the fiber optic delay rings.

[0023] Optionally, the first output end of the signal processing modulation module is used to supply power to the photoelectric switch module; the second output end of the signal processing modulation module is used to provide a modulation signal for the multi-channel Y-waveguide device.

[0024] According to the specific embodiments provided by the present invention, the present invention discloses the following technical effects:

[0025] The present invention uses a photoelectric switch module to control the on and off of the optical path of the multi-channel Y-waveguide device to be tested, without repeatedly performing experimental plugging and unplugging of a single Y-waveguide device.

[0026] Compared with the DC phase drift parameter test system of a single Y-waveguide device, the present invention can effectively reduce the test time, greatly improve the test efficiency, reduce the problems of high manual test cost and large test error, and expand the application prospects of the automated test system. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0028] Figure 1 It is a structural block diagram of a DC phase drift parameter testing system for a multi-channel Y-waveguide device of the present invention;

[0029] Figure 2 It is a structural schematic diagram of a DC phase drift parameter testing system for a multi-channel Y-waveguide device according to the present invention;

[0030] Figure 3 This is a specific example diagram of a DC phase drift parameter testing system for a multi-channel Y-waveguide device of the present invention. DETAILED DESCRIPTION

[0031] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0032] The purpose of the present invention is to provide a DC phase drift parameter testing system for a multi-channel Y-waveguide device, so as to achieve the purpose of continuously and rapidly measuring DC phase drift parameters of multiple channels.

[0033] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the present invention is further described in detail below with reference to the accompanying drawings and specific embodiments.

[0034] At present, the existing test system has a single test channel, low efficiency, and cannot be continuously monitored; and there is no automated test instrument at home and abroad that can perform multi-channel continuous and rapid measurement of the DC phase drift parameters of Y-waveguide devices.

[0035] In view of this, the present invention provides a DC phase drift parameter testing system for a multi-channel Y-waveguide device, which relates to the field of measurement and photoelectric detection technology, and in particular to the multi-channel half-wave voltage and DC phase drift parameter measurement direction of a Y-waveguide device.

[0036] The present invention is based on the Sagnac interference optical path test scheme, uses a Sagnac fiber interferometer with a reciprocal structure to measure the DC phase drift parameters of a Y-waveguide device, and conducts research on a multi-channel automatic test system. The present invention uses a photoelectric switch module (for example: a 3*3n-way photoelectric switch) to control the on and off of the optical path of the multi-channel Y-waveguide device to be tested, without repeatedly performing experimental plugging and unplugging of a single Y-waveguide device. Compared with a single Y-waveguide device DC phase drift parameter test system, the present invention can effectively reduce test time, greatly improve test efficiency, reduce problems such as high manual test costs and large test errors, and expand the application prospects of automated test systems.

[0037] Embodiment 1

[0038] like Figure 1 As shown, the multi-channel Y-waveguide device DC phase drift parameter testing system provided in this embodiment mainly includes: a light source, a fiber coupler, a photoelectric switch unit, a fiber delay loop, a photoelectric detector and a signal processing modulation module; wherein the photoelectric switch unit includes m photoelectric switch modules; each of the photoelectric switch modules includes n photoelectric switches, and the n photoelectric switches share one input end; each of the photoelectric switch modules includes n output ends.

[0039] The light source is connected to the first end of the optical fiber coupler, the second end of the optical fiber coupler is connected to the input end of one of the photoelectric switch modules, and the input ends of the remaining photoelectric switch modules are connected to the optical fiber delay ring.

[0040] The output ends of all the photoelectric switch modules are used to connect to a multi-channel Y-waveguide device; wherein the number of channels of the multi-channel Y-waveguide device is n, that is, the number of channels of the multi-channel Y-waveguide device is the same as the number of photoelectric switches of each of the photoelectric switch modules; and when working, the output ends of the photoelectric switch modules are connected one-to-one with the ports of the multi-channel Y-waveguide device.

[0041] The third end of the optical fiber coupler is connected to the input end of the photodetector, the output end of the photodetector is connected to the input end of the signal processing modulation module, the first output end of the signal processing modulation module is connected to the photoelectric switch module, and the second output end of the signal processing modulation module is used to connect to the multi-channel Y-waveguide device.

[0042] The first output end of the signal processing modulation module is used to supply power to the photoelectric switch module; the second output end of the signal processing modulation module is used to provide a modulation signal to the multi-channel Y-waveguide device.

[0043] As a preferred implementation, the multi-channel Y-waveguide device DC phase drift parameter testing system provided in this embodiment may further include: a fiber isolator, a first depolarized fiber, and a connecting flange installed on the output end of the photoelectric switch module.

[0044] The light source is connected to the first end of the optical fiber coupler through the optical fiber isolator. The second end of the optical fiber coupler is connected to the input end of the photoelectric switch module through the first depolarized optical fiber.

[0045] When working, the output end of the photoelectric switch module is connected to the multi-channel Y-waveguide device through the connecting flange.

[0046] As a preferred implementation, the multi-channel Y-waveguide device DC phase drift parameter testing system provided in this embodiment may further include: a second depolarization optical fiber.

[0047] The number of the optical fiber delay ring can be one; the optical fiber delay ring can be connected to the input end of the remaining photoelectric switch modules through the second depolarized optical fiber; the "remaining" here refers to the photoelectric switch modules other than the photoelectric switch module connected to the optical fiber coupler.

[0048] Furthermore, the number of the optical fiber delay rings described in this embodiment can be multiple; as long as the input ends of the remaining photoelectric switch modules are connected to only one optical fiber delay ring.

[0049] The number of the photoelectric switch modules is the same as the number of the multi-channel Y-waveguide devices.

[0050] An example is: when the number of the optical fiber delay loops is (m-1) / 2, the DC phase drift parameter test system of the multi-channel Y-waveguide device also includes a second depolarized optical fiber and a third depolarized optical fiber; wherein m≥3, m is the number of the photoelectric switch modules and is an odd number.

[0051] The first fiber optic delay ring is connected to the input end of one of the photoelectric switch modules through the second depolarization fiber, and the first fiber optic delay ring is connected to the input end of another photoelectric switch module through the third depolarization fiber; wherein, one of the photoelectric switch modules and the other photoelectric switch module are adjacent photoelectric switch modules; and the first fiber optic delay ring is one of all the fiber optic delay rings.

[0052] Embodiment 2

[0053] like Figure 2 and 3 As shown, the multi-channel Y-waveguide device DC phase drift parameter test system provided in this embodiment includes an optical path part and a circuit part; the optical path part is mainly composed of a high-power broadband light source 1, an optical fiber isolator 2, an optical fiber coupler 3, a first depolarization fiber 4, a second depolarization fiber 7, a third depolarization fiber 8, a 3*3n-way photoelectric switch 5, a multi-channel Y-waveguide device to be tested 6, an optical fiber delay ring 9 and a connecting flange 12; the circuit part is mainly composed of a photodetector 10, a signal processing and modulation module 11 (same as the signal processing and modulation module in the first embodiment). Among them, the 3*3n-way photoelectric switch 5 is specifically composed of three 1*n-way photoelectric switch devices. The number of channels n of the multi-channel Y-waveguide device to be tested 6 is consistent with the number of output ports n of each 1*n-way photoelectric switch in the 3*3n-way photoelectric switch 5.

[0054] The output end of the high-power wide-spectrum light source 1 is connected to the input end of the optical fiber isolator 2, the output end of the optical fiber isolator 2 is connected to the first port of the optical fiber coupler 3, the second port of the optical fiber coupler 3 is connected to one end of the first depolarized optical fiber 4, the other end of the first depolarized optical fiber 4 is connected to the P1 port of the 3*3n-way photoelectric switch 5 (i.e., the input end described in Example 1), the right side of the 3*3n-way photoelectric switch 5 has multiple groups of output ports, each 3 output ports (An, Bn, Cn) are a group, and there are n groups in total; the right side port An of the 3*3n-way photoelectric switch 5 is correspondingly connected to the input port An of the multi-channel Y-waveguide device 6 to be tested, the right side ports Bn and Cn of the 3*3n-way photoelectric switch 5 are respectively connected to the output ports Bn and Cn of the multi-channel Y-waveguide device 6 to be tested, and the ports are connected by a connecting flange 12 for easy plugging and unplugging. The internal optical path of the 3*3n-way photoelectric switch 5 is connected in sequence according to each group of 3 ports (An, Bn, Cn), as shown in the following. Figure 2 The dotted line combinations are connected in sequence; the P2 port of the 3*3n-way photoelectric switch 5 is connected to one end of the second depolarization fiber 7, the other end of the second depolarization fiber 7 is connected to one end of the optical fiber delay ring 9, the other end of the optical fiber delay ring 9 is connected to one end of the third depolarization fiber 8, and the other end of the third depolarization fiber 8 is connected to the P3 port of the 3*3n-way photoelectric switch 5.

[0055] The third port of the optical fiber coupler 3 is connected to the input end of the photodetector 10, and the output end of the photodetector 10 is connected to the input end of the signal processing and modulation module 11. The signal processing and modulation module 11 is provided with two output ends, one end is connected to the photoelectric switch 5 to supply power thereto, and the other end is connected to the multi-channel Y-waveguide device 6 to be tested to add a modulation signal thereto.

[0056] The transmission process of optical signals is:

[0057] The high-power wide-spectrum light source 1 outputs an optical signal which is transmitted to the optical fiber isolator 2, and then is transmitted to the first port of the optical fiber coupler 3 via the optical fiber isolator 2. The optical signal is output from the second port of the optical fiber coupler 3 to the first depolarized optical fiber 4. The light output by the first depolarized optical fiber 4 is transmitted to the first 1*n-way photoelectric switch of the 3*3n-way photoelectric switch 5 via the P1 port. The optical signal is then output from the A1 port of the first 1*n-way photoelectric switch to the input port A1 of the multi-channel Y-waveguide device 6 to be tested via the connecting flange 12. After passing through the Y-waveguide branch to be tested, the optical signal is output from the output port B1 and the output port C1, and then connected to the B1 port and the C1 port on the right side of the second and third 1*n-way photoelectric switches of the 3*3n-way photoelectric switch 5 via the connecting flange 12. The optical signal enters the second depolarized optical fiber 7 and the third depolarized optical fiber 8 via the P2 port and the P3 port, and finally enters the optical fiber delay loop 9 to return.

[0058] The optical signal returns from the optical fiber delay loop 9, passes through the second depolarization optical fiber 7 and the third depolarization optical fiber 8, enters the P2 port and the P3 port, and then is output from the B port and the C port of the 3*3n-way photoelectric switch 5 through the connecting flange 12 to the input port A of the multi-channel Y-waveguide device 6 to be tested, and then is connected to the port A on the right side of the 3*3n-way photoelectric switch 5 through the connecting flange 12, and the optical signal enters the first depolarization optical fiber 4 through the P1 port, and finally enters the optical fiber coupler 3.

[0059] The optical signal enters the photodetector 10 through the third port of the optical fiber coupler 3; the photodetector 10 converts the collected optical signal into a voltage signal and transmits it to the signal processing and modulation module 11. The signal processing and modulation module 11 has two output ports, one port outputs power to the 3*3n-way photoelectric switch 5, and the other port adds a modulation signal to the multi-channel Y-waveguide device 6 to be tested.

[0060] Compared with the prior art, the innovative parts of the present invention are:

[0061] 1. A multi-channel photoelectric switch design is adopted to realize a device for multi-channel testing of the DC phase drift parameters of Y-waveguide devices; specifically, three 1*n-channel photoelectric switches are adopted to connect the reusable test part and the multi-channel Y-waveguide part to be tested by means of the photoelectric switches.

[0062] 2. By utilizing the device combination of multi-channel photoelectric switch, connection flange and dual power supply of signal processing and modulation module, the multi-channel Y-waveguide part to be tested can be quickly connected and separated with the multi-channel photoelectric switch, and the multiplexing test part is ready to be tested by the external multi-channel Y-waveguide part at any time, further improving the test efficiency.

[0063] 3. The test system can realize multi-channel continuous and stable testing of the DC phase drift parameters of the Y-waveguide part to be tested at all temperatures.

[0064] The various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the various embodiments can be referenced to each other.

[0065] The principles and implementation methods of the present invention are described in this article using specific examples. The description of the above embodiments is only used to help understand the method and core idea of ​​the present invention. At the same time, for those skilled in the art, according to the idea of ​​the present invention, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as limiting the present invention.

Claims

1. A DC phase drift parameter test system for a multi-channel Y-waveguide device, characterized in that: include: A light source, a fiber coupler, a photoelectric switch unit, a fiber delay loop, a photoelectric detector, and a signal processing modulation module; wherein the photoelectric switch unit includes m photoelectric switch modules; each of the photoelectric switch modules includes n photoelectric switches, and the n photoelectric switches share one input terminal; each of the photoelectric switch modules includes n output terminals; The light source is connected to the first end of the optical fiber coupler, the second end of the optical fiber coupler is connected to the input end of one of the photoelectric switch modules, and the input ends of the remaining photoelectric switch modules are connected to the optical fiber delay ring; The output ends of all the photoelectric switch modules are used to connect to a multi-channel Y-waveguide device; wherein the number of channels of the multi-channel Y-waveguide device is n; and when working, the output ends of the photoelectric switch modules are connected to the ports of the multi-channel Y-waveguide device in a one-to-one correspondence; The third end of the optical fiber coupler is connected to the input end of the photodetector, the output end of the photodetector is connected to the input end of the signal processing modulation module, the first output end of the signal processing modulation module is connected to the photoelectric switch module, and the second output end of the signal processing modulation module is used to connect to the multi-channel Y-waveguide device; The number of the optical fiber delay rings is one or more; When the number of the optical fiber delay loops is (m-1) / 2, the DC phase drift parameter test system of the multi-channel Y-waveguide device further includes a second depolarization optical fiber and a third depolarization optical fiber; wherein m≥3, m is the number of the photoelectric switch modules and is an odd number; The first fiber optic delay ring is connected to the input end of one of the photoelectric switch modules through the second depolarization fiber, and the first fiber optic delay ring is connected to the input end of another photoelectric switch module through the third depolarization fiber; wherein, one of the photoelectric switch modules and the other photoelectric switch module are adjacent photoelectric switch modules; and the first fiber optic delay ring is one of all the fiber optic delay rings.

2. A DC phase drift parameter test system for a multi-channel Y-waveguide device according to claim 1, characterized in that: Also includes: Fiber optic isolators; The light source is connected to the first end of the optical fiber coupler through the optical fiber isolator.

3. The DC phase drift parameter test system of a multi-channel Y-waveguide device according to claim 1, characterized in that: Also includes: a first depolarized optical fiber; The second end of the optical fiber coupler is connected to the input end of the photoelectric switch module through the first depolarization optical fiber.

4. The DC phase drift parameter test system of a multi-channel Y-waveguide device according to claim 1, characterized in that: Also includes: A connecting flange mounted on the output end of the photoelectric switch module; When working, the output end of the photoelectric switch module is connected to the multi-channel Y-waveguide device through the connecting flange.

5. The DC phase drift parameter test system of a multi-channel Y-waveguide device according to claim 1, characterized in that: Also includes: a second depolarized optical fiber; The optical fiber delay ring is connected to the input end of the photoelectric switch module through the second depolarization optical fiber.

6. A DC phase drift parameter test system for a multi-channel Y-waveguide device according to claim 1, characterized in that: The first output end of the signal processing modulation module is used to supply power to the photoelectric switch module; the second output end of the signal processing modulation module is used to provide a modulation signal to the multi-channel Y-waveguide device.

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