Test system and three-dimensional camera test method using the test system

Abstract

The present disclosure provides a test system and a three-dimensional camera test method implemented by using the test system. The test system includes an environmental test box, a controller and a multiplexer, wherein: the environmental test box has a containing space, and the containing space is used to place a device to be tested; the controller is electrically connected to the multiplexer, and the controller is used to generate a multi-channel control signal and send the multi-channel control signal to the multiplexer; the multiplexer includes a multiplexing module and a plurality of control switches, wherein the multiplexing module has a plurality of first data ports and a second data port, the first data port is connected to the device to be tested through the control switch, and the multiplexing module is used to transmit the received data in the plurality of first data ports to the controller through the second data port.

Description

Technical Field

[0001] The present disclosure relates to the field of testing technology, and more particularly, to a testing system and a three-dimensional camera testing method implemented by using the testing system. Background Art

[0002] During the test process, in order to more accurately discover problems existing in the device to be tested, it is usually necessary to increase the number of devices to be tested and test multiple devices to be tested simultaneously.

[0003] In the process of realizing the concept of the present disclosure, the inventors discovered that there are at least the following problems in the synchronous testing of multiple devices to be tested during the testing process of the related technology: taking a three-dimensional camera as an example, on the one hand, multiple main controllers are required to drive multiple three-dimensional cameras for testing. When it is found during the test that the three-dimensional camera is working abnormally, the possibility of the main controller working abnormally cannot be directly ruled out, and there are many test variables; on the other hand, the test personnel are required to log in to the main controller one by one at regular intervals to record and analyze the images taken by the three-dimensional camera, and the test efficiency is low. Summary of the invention

[0004] In view of this, the present disclosure provides a testing system and a 3D camera testing method implemented using the testing system.

[0005] One aspect of the present disclosure provides a test system, including an environmental test chamber, a controller and a multiplexer, wherein: the environmental test chamber has a storage space, and the storage space is used to place the device to be tested; the controller is electrically connected to the multiplexer, and the controller is used to generate a multi-channel control signal and send the multi-channel control signal to the multiplexer; the multiplexer includes a multiplexing module and a plurality of control switches, wherein the multiplexing module has a plurality of first data ports and a second data port, the first data port is connected to the device to be tested through the control switch, and the multiplexing module is used to transmit the received data in the plurality of first data ports to the controller through the second data port.

[0006] According to an embodiment of the present disclosure, the environmental test chamber is electrically connected to the controller; the environmental test chamber is used to obtain the environmental parameters in the accommodation space and send the environmental parameters to the controller; and the environmental test chamber is used to adjust the environmental parameters in the accommodation space in response to the environmental parameter configuration signal sent by the controller.

[0007] According to an embodiment of the present disclosure, the above-mentioned device to be tested includes a three-dimensional camera; wherein, the above-mentioned system also includes: a test target, which is arranged in the accommodation space of the above-mentioned environmental test chamber, and the surface of the above-mentioned test target is configured as multiple planes with the same or different depths of field; wherein, the above-mentioned three-dimensional camera has a lens, and the lens of the above-mentioned three-dimensional camera is configured to face the above-mentioned test target to obtain test data.

[0008] According to an embodiment of the present disclosure, the multiplexer is used to control the opening and closing of the plurality of control switches according to the level states of the plurality of control signals, so that when the control switches are closed, the test data of the three-dimensional camera connected to the control switches is sent to the controller.

[0009] According to an embodiment of the present disclosure, it also includes: a memory, which is electrically connected to the controller and is used to store test data received by the controller.

[0010] According to an embodiment of the present disclosure, a test configuration file is stored in the memory; the controller is further configured to send the test configuration file in the memory to the three-dimensional camera through the multiplexer.

[0011] Another aspect of the present disclosure provides a 3D camera testing method implemented using the testing system, comprising: obtaining a test configuration file and a camera configuration file, wherein the test configuration file includes a total test duration, the total test duration includes multiple test cycles, and the camera configuration file includes imaging parameters; issuing the camera configuration files to multiple 3D cameras to be tested respectively; in each of the above test cycles, sequentially obtaining depth images generated by the multiple 3D cameras to be tested based on the above imaging parameters; and for each of the above 3D cameras to be tested, determining a test result of the 3D camera to be tested based on the depth image generated by the 3D camera to be tested.

[0012] According to an embodiment of the present disclosure, in each of the above-mentioned test cycles, depth images generated by the multiple three-dimensional cameras to be tested based on the above-mentioned imaging parameters are sequentially obtained, including: in each of the above-mentioned test cycles, the level states of multiple control signals are controlled to change according to a preset rule to control multiple control switches to be closed in sequence; and when the above-mentioned control switches are closed, the above-mentioned depth images are obtained from the above-mentioned three-dimensional cameras to be tested in the loop where the above-mentioned control switches are located.

[0013] According to an embodiment of the present disclosure, the depth image includes an initial depth image and a test depth image, wherein the initial depth image is generated by the three-dimensional camera to be tested in the first test cycle of the total test duration; wherein, for each of the three-dimensional cameras to be tested, based on the depth image generated by the three-dimensional camera to be tested, determining the test result of the three-dimensional camera to be tested comprises: performing a difference operation on the initial depth image and the test depth image measured by the three-dimensional camera to be tested in each of the test cycles to obtain a difference matrix; obtaining the number of elements in the difference matrix whose absolute values ​​of each element are greater than a first preset threshold; determining that the three-dimensional camera to be tested has failed the test in the test cycle when the number of the elements is greater than or equal to a second preset threshold; and determining that the three-dimensional camera to be tested has passed the test in the test cycle when the number of the elements is less than the second preset threshold.

[0014] According to an embodiment of the present disclosure, the method further includes: when it is determined that the 3D camera to be tested fails the test in the test cycle, sending feedback information indicating that the 3D camera to be tested is abnormal.

[0015] According to the embodiments of the present disclosure, by using a multiplexer, the controller can use the same data port to simultaneously obtain test data of multiple devices to be tested in the environmental test chamber, at least partially overcoming the technical problems of large number of test variables and low test efficiency in the simultaneous testing of multiple devices to be tested in the testing process of the related technology, effectively reducing the test hardware cost and labor cost, and improving the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The above and other objects, features and advantages of the present disclosure will become more apparent through the following description of the embodiments of the present disclosure with reference to the accompanying drawings, in which:

[0017] Figure 1 A schematic diagram of a testing system according to an embodiment of the present disclosure is schematically shown.

[0018] Figure 2 A schematic diagram of a testing system according to another embodiment of the present disclosure is schematically shown.

[0019] Figure 3A A top view of a test target according to an embodiment of the present disclosure is schematically shown.

[0020] Figure 3B A front view of a test target according to an embodiment of the present disclosure is schematically shown.

[0021] Figure 4 The flowchart of the 3D camera testing method according to the embodiment of the present disclosure is schematically shown.

[0022] Figure 5 The figure schematically shows a three-dimensional camera test process according to another embodiment of the present disclosure. DETAILED DESCRIPTION

[0023] Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings. However, it should be understood that these descriptions are exemplary only and are not intended to limit the scope of the present disclosure. In the following detailed description, for ease of explanation, many specific details are set forth to provide a comprehensive understanding of the embodiments of the present disclosure. However, it is apparent that one or more embodiments may also be implemented without these specific details. In addition, in the following description, descriptions of known structures and technologies are omitted to avoid unnecessary confusion of the concepts of the present disclosure.

[0024] The terms used herein are only for describing specific embodiments and are not intended to limit the present disclosure. The terms "comprise", "include", etc. used herein indicate the existence of the features, steps, operations and / or components, but do not exclude the existence or addition of one or more other features, steps, operations or components.

[0025] All terms (including technical and scientific terms) used herein have the meanings commonly understood by those skilled in the art, unless otherwise defined. It should be noted that the terms used herein should be interpreted as having a meaning consistent with the context of this specification, and should not be interpreted in an idealized or overly rigid manner.

[0026] In the case of using expressions such as "at least one of A, B, and C, etc.", it should generally be interpreted in accordance with the meaning of the expression generally understood by those skilled in the art (for example, "a system having at least one of A, B, and C" should include but is not limited to a system having A alone, B alone, C alone, A and B, A and C, B and C, and / or A, B, C, etc.). In the case of using expressions such as "at least one of A, B, or C, etc.", it should generally be interpreted in accordance with the meaning of the expression generally understood by those skilled in the art (for example, "a system having at least one of A, B, or C" should include but is not limited to a system having A alone, B alone, C alone, A and B, A and C, B and C, and / or A, B, C, etc.).

[0027] Before entering production, hardware products usually need to undergo reliability tests, such as mechanical tests, environmental tests, etc. Among them, environmental tests are to verify whether the hardware products are reliable in various environments by changing the temperature, humidity, pH, vacuum and other conditions of the operating environment of the hardware products.

[0028] In environmental testing, in order to expose occasional problems of hardware products as much as possible, the number of test samples is usually increased. However, in the related art, testers are usually required to record the test results of environmental testing. When the number of test samples increases, the work pressure of testers will be greatly increased, and the possibility of data recording errors will also increase. For example, the testing method of a three-dimensional camera in the related art generally uses a control motherboard with a USB interface to connect to the three-dimensional camera, and multiple three-dimensional cameras are placed in a high and low temperature box. Every 1 hour or half an hour, the tester needs to log in to the main control board of each three-dimensional camera, save the pictures taken by the current three-dimensional camera, and record the current operating temperature box environmental parameters.

[0029] In view of this, an embodiment of the present disclosure provides a test system and a three-dimensional camera test method implemented by using the test system. The test system includes an environmental test box, a controller and a multiplexer, wherein the environmental test box has a storage space, and the storage space is used to place the device to be tested; the controller is electrically connected to the multiplexer, and the controller is used to generate a multi-channel control signal and send the multi-channel control signal to the multiplexer; the multiplexer includes a multiplexing module and a plurality of control switches, wherein the multiplexing module has a plurality of first data ports and a second data port, the first data port is connected to the device to be tested through the control switch, and the multiplexing module is used to transmit the received data in the plurality of first data ports to the controller through the second data port.

[0030] Figure 1 A schematic diagram of a testing system according to an embodiment of the present disclosure is schematically shown.

[0031] like Figure 1 As shown, the test system includes an environmental test chamber 10 , a controller 20 and a multiplexer 30 .

[0032] According to an embodiment of the present disclosure, the environmental test box 10 may have a containing space 11 , and a plurality of devices to be tested 12 may be placed in the containing space 11 .

[0033] According to an embodiment of the present disclosure, the environmental test box 10 can set environmental parameters in the containing space 11, including but not limited to temperature, humidity, pH, vacuum degree, etc.

[0034] According to the embodiment of the present disclosure, there is no limitation on the model of the environmental test box 10. According to the different structural designs of the environmental test box 10, there can be multiple accommodation spaces 11, and different environmental parameters can be set for each accommodation space 11.

[0035] According to the embodiments of the present disclosure, the device to be tested 12 may be any type of device. When testing some devices to be tested 12, it is also necessary to consider the placement of the device to be tested 12 and whether auxiliary test equipment is needed. For example, the device to be tested 12 may be a power controller. When testing multiple power controllers, the multiple power controllers need to be placed at a certain distance to prevent the self-heating of the power controllers from interfering with other power controllers. The power supply, simulated or real load required for the power controller test can be placed inside or outside the environmental test chamber 10.

[0036] According to an embodiment of the present disclosure, the controller 20 is electrically connected to the multiplexer 30 , and the controller 20 can send a control signal 21 to the multiplexer 30 and receive test data transmitted by the multiplexer 30 .

[0037] According to an embodiment of the present disclosure, the control signal 21 may have two states, a high level state and a low level state. The specific voltage values ​​of the high level state and the low level state may be set arbitrarily and are not limited here.

[0038] According to an embodiment of the present disclosure, the controller 20 may have a USB data interface and be electrically connected to the multiplexer 30 via a USB data line, wherein the USB data line includes at least a D+ / D- data path, and the D+ / D- data path can realize the transmission of test data.

[0039] According to an embodiment of the present disclosure, the multiplexer 30 may include a multiplexing module 31 and a plurality of control switches 32. The multiplexing module 31 may have a plurality of first data ports and a second data port, each of which may be connected to a device under test 12 through a control switch 32, and the multiplexing module 31 may receive test data in the device under test 12 through the first data port when the control switch 32 is closed, and send the test data to the controller 20 through the second data port.

[0040] According to an embodiment of the present disclosure, the multiplexing module 31 can send data received by any first data port among multiple first data ports to the second data port, or send data received by the second data port to any first data port among multiple first data ports.

[0041] According to the embodiments of the present disclosure, the control switch 32 can be implemented using components of any type and model, including but not limited to transistors, MOS tubes, relays, etc.

[0042] According to an embodiment of the present disclosure, the controller 20 and the multiplexer 30 may be implemented using different hardware circuits, or integrated on the same hardware circuit, such as a field programmable gate array (FPGA), a programmable logic array (PLA), a system on a chip, a system on a substrate, a system on a package, an application specific integrated circuit (ASIC), etc., or may be implemented by hardware or firmware such as any other reasonable method of integrating or packaging the circuit, or may be implemented in any one of the three implementation methods of software, hardware, and firmware, or in an appropriate combination of any of them.

[0043] According to an embodiment of the present disclosure, the controller 20 may also be integrated into an electronic device, which may be a computer, a PLC, or the like.

[0044] According to the embodiments of the present disclosure, by using a multiplexer, the controller can use the same data port to simultaneously obtain test data of multiple devices to be tested in the environmental test chamber, at least partially overcoming the technical problems of large number of test variables and low test efficiency in the simultaneous testing of multiple devices to be tested in the testing process of the related technology, effectively reducing the test hardware cost and labor cost, and improving the test efficiency.

[0045] According to an embodiment of the present disclosure, the environmental testing chamber 10 can obtain, record or adjust environmental parameters in the containing space 11 .

[0046] According to an embodiment of the present disclosure, the environmental test box 10 can be electrically connected to the controller 20 through a data port such as RS232. The environmental test box 10 can obtain the environmental parameters in the accommodation space 11 and send the environmental parameters to the controller 20; or, the environmental test box 10 can also receive the environmental parameter configuration signal sent by the controller 20, and adjust the environmental parameters in the accommodation space 11 according to the environmental parameter configuration signal.

[0047] According to an embodiment of the present disclosure, the controller 20 can generate a multi-channel control signal 21 , and can control the opening and closing of a plurality of control switches 32 in the multiplexer 30 by controlling the combination of high and low levels of the multi-channel control signal 21 .

[0048] For example, the controller 20 can generate three control signals 21 of IO1, IO2 and IO3, and the multiplexer 30 is connected to five devices under test 12 through five control switches SW1, SW2, SW3, SW4 and SW5. The control logic can be shown in Table 1.

[0049] Table 1

[0050] IO1 IO2 IO3 same Low Low SW1 closed Low high Low SW2 closed high high Low SW3 closed Low Low high SW4 closed same Low same SW5 closed

[0051] According to an embodiment of the present disclosure, the relationship between the number of devices to be tested 12 that can be tested in the test system and the number of control signals 21 that can be generated by the controller 20 can be shown as formula (1):

[0052] m≤2 n (1)

[0053] Wherein, m represents the number of devices to be tested 12 that can be tested; and n represents the number of control signals 21 that can be generated by the controller 20 .

[0054] Figure 2 A schematic diagram of a testing system according to another embodiment of the present disclosure is schematically shown.

[0055] like Figure 2 As shown, the device to be tested 12 in the test system may be a three-dimensional camera. In addition to the environmental test chamber 10 , the controller 20 and the multiplexer 30 , the test system may also include a memory 40 and a test target 50 .

[0056] According to an embodiment of the present disclosure, the memory 40 may be any type of memory, including but not limited to a random access memory (RAM), a read-only memory (ROM), a flash memory, and the like.

[0057] According to an embodiment of the present disclosure, the memory 40 may be integrated into the controller 20 , or the memory 40 may be an independent hardware device and electrically connected to the controller 20 via a data interface such as a USB to store test data received by the controller 20 .

[0058] According to an embodiment of the present disclosure, the configuration file of the 3D camera to be tested can be pre-stored in the memory 40. After the test starts, the controller 20 can read the configuration file and send the configuration file to the corresponding 3D camera to be tested when the control switch 32 is closed.

[0059] According to an embodiment of the present disclosure, the configuration file may include parameters such as resolution, exposure time, and time interval between two imaging operations.

[0060] According to an embodiment of the present disclosure, the test target 50 may be disposed in the accommodation space 11 of the environmental testing chamber 10 , and the test target 50 may be made of any material that is not prone to physical or chemical property changes within a set environmental parameter range.

[0061] Figure 3A A top view of a test target according to an embodiment of the present disclosure is schematically shown.

[0062] like Figure 3AAs shown, the test target 50 can be arranged in parallel with an array composed of multiple three-dimensional cameras to be tested, and the lenses of the multiple three-dimensional cameras to be tested are all facing the test target 50.

[0063] According to an embodiment of the present disclosure, the 3D camera to be tested may have a field of view, and the distance between the test target 50 and the 3D camera to be tested may be adjusted to ensure that the test target 50 is within the field of view of all the 3D cameras to be tested.

[0064] According to an embodiment of the present disclosure, the side of the test target 50 facing the 3D camera to be tested may have protrusions and depressions, so that the test target 50 has at least two different depths of field, L1 and L2, relative to the 3D camera to be tested.

[0065] Figure 3B A front view of a test target according to an embodiment of the present disclosure is schematically shown.

[0066] like Figure 3B As shown, the test surface of the test target 50 is evenly divided into a plurality of staggered light-colored rectangular blocks and dark-colored rectangular blocks, wherein the light-colored rectangular blocks indicate that the depth of field of the plane is smaller, and the dark-colored rectangular blocks indicate that the depth of field of the plane is larger.

[0067] According to the embodiment of the present disclosure, the shape of the test surface of the test target 50 is not limited.

[0068] Figure 4 The flowchart of the 3D camera testing method according to the embodiment of the present disclosure is schematically shown.

[0069] like Figure 4 As shown, this method can be Figure 1 or Figure 2 The method is implemented by the test system shown in the figure, and includes operations S401-S404.

[0070] In operation S401 , a test configuration file and a camera configuration file are acquired.

[0071] In operation S402, camera configuration files are respectively sent to a plurality of 3D cameras to be tested.

[0072] In operation S403, in each test cycle, depth images generated by a plurality of three-dimensional cameras to be tested based on imaging parameters are sequentially acquired.

[0073] In operation S404 , for each 3D camera to be tested, a test result of the 3D camera to be tested is determined based on a depth image generated by the 3D camera to be tested.

[0074] According to an embodiment of the present disclosure, the test configuration file may include a total test duration, and the total test duration may include multiple test cycles.

[0075] According to the embodiments of the present disclosure, the length of each test cycle can be set arbitrarily, for example, it can be set to 60 seconds, 2 minutes, etc.

[0076] According to an embodiment of the present disclosure, a test may include multiple test phases, and the test configuration file may also include the settings and changes of environmental parameters in each test phase, as well as the disposal methods for samples in each test phase, as shown in Table 2, for example.

[0077] Table 2

[0078]

[0079] According to an embodiment of the present disclosure, the camera configuration file may include imaging parameters such as resolution, exposure time, and time interval between two imaging operations.

[0080] According to an embodiment of the present disclosure, by Figure 1 or Figure 2 The test system shown can realize simultaneous testing of multiple cameras by a single controller, and realize real-time recording of images taken by a three-dimensional camera and corresponding environmental parameters, effectively reducing the test hardware cost and labor cost, and improving the test efficiency.

[0081] Figure 5 The figure schematically shows a three-dimensional camera test process according to another embodiment of the present disclosure.

[0082] like Figure 5 As shown in the left figure, the method includes operations S501 to S504.

[0083] According to the embodiment of the present disclosure, in this test experiment, a total of five 3D cameras to be tested were tested, and the controller generated three control signals IO1, IO2 and IO3, and the level states of the three control signals changed according to the rule of low-low-low->high-low-low->low-high-low->high-high-low->low-low-high->high-low-high->low-high-high->low-low-low. Among them, when the level states of the three control signals are high-low-low, SW1 is closed and other switches are disconnected; when the level states of the three control signals are low-high-low, SW2 is closed and other switches are disconnected; when the level states of the three control signals are high-high-low, SW3 is closed and other switches are disconnected; when the level states of the three control signals are low-low-high, SW4 is closed and other switches are disconnected; when the level states of the three control signals are high-low-high, SW5 is closed and other switches are disconnected; when the level states of the three control signals are low-high-high, high-high-high and low-low-low, all switches are disconnected.

[0084] According to the embodiment of the present disclosure, in each test cycle, the three control signals complete the above-mentioned change of the combination of high and low levels once.

[0085] According to an embodiment of the present disclosure, when the control switch is closed, the 3D camera to be tested, the multiplexer and the controller corresponding to the control switch can form a data path to facilitate information exchange between the 3D camera to be tested and the controller.

[0086] In operation S501 , before the test starts, IO1 , IO2 and IO3 are controlled to sequentially close SW1 , SW2 , SW3 , SW4 and SW5 , so as to write camera configuration files to five 3D cameras to be tested respectively.

[0087] In operation S502, after the test starts, SW1, SW2, SW3, SW4 and SW5 are closed in sequence to obtain initial depth images of five 3D cameras to be tested as comparison standards, and the initial depth images are stored in a memory.

[0088] In operation S503, SW1, SW2, SW3, SW4 and SW5 are closed in sequence according to a preset cycle to obtain test depth images of five 3D cameras to be tested, and the test depth images are stored in a memory together with the environmental parameters of the environmental test chamber that are read.

[0089] According to an embodiment of the present disclosure, before the test begins, a test target with depth characteristics may be placed in front of the camera to ensure that the field of view of the camera to be tested is entirely within the test target. The test target may be: Figure 3A and Figure 3B A test target 50 is shown.

[0090] According to an embodiment of the present disclosure, when performing a test, a test configuration file for the test may be set to configure environmental parameters for the test. The test configuration file may be as shown in Table 2.

[0091] According to an embodiment of the present disclosure, the obtained initial depth image 510 and the test depth image 520 can be respectively as follows: Figure 5 As shown in the right figure of . The initial depth image 510 can be obtained from the 3D camera to be tested in the first test cycle at the beginning of the test. Each test phase can include multiple test cycles, and the length of each test cycle is T. At time t1, the test process enters the low-temperature operation test phase. For each 3D camera to be tested, a frame of test depth image 520 can be obtained every test cycle T.

[0092] According to an embodiment of the present disclosure, the initial depth image 510 and the test depth image 520 can be represented as grayscale images. A pixel of each frame of grayscale image can be described by a quantized grayscale, for example, 1 byte can represent 256 levels of grayscale, and 2 bytes can represent 65536 levels of grayscale. After each pixel of the grayscale image is represented by a quantized grayscale, the grayscale image can be converted into a matrix.

[0093] In operation S504, difference operations are performed on the obtained test depth image and the initial depth image in sequence to determine whether the 3D camera to be tested operates abnormally.

[0094] For example, a matrix subtraction operation can be performed on the matrix obtained by transforming the test depth image 520 and the matrix obtained by transforming the initial depth image 510. For the obtained difference matrix, the absolute value of each element in the difference matrix can be taken, and the size of the element value and the first preset threshold value can be determined; the value of the first preset threshold value is related to the grayscale level of each pixel of the depth image, for example, if the grayscale level is 256, the first preset value can be set to 20; if the grayscale level is 65536, the first preset threshold value can be set to 500. Afterwards, it can be determined whether the number of elements whose element values ​​are greater than the first preset threshold value is greater than the second preset threshold value, so as to determine whether the three-dimensional camera to be tested passes the test; the value of the second preset threshold value is related to the number of pixels of the depth image, for example, the second preset threshold value can be set to 10% of the number of pixels of the depth image.

[0095] According to an embodiment of the present disclosure, when it is detected that a 3D camera to be tested fails the test in the current cycle, feedback information indicating that the 3D camera to be tested has an abnormality can be issued and current environmental parameters can be recorded to facilitate testers to analyze the cause of the problem.

[0096] According to the embodiments of the present disclosure, the flowcharts and block diagrams in the accompanying drawings illustrate the possible architecture, functions and operations of the systems, methods and computer program products according to various embodiments of the present disclosure. In this regard, each box in the flowchart or block diagram may represent a module, a program segment, or a part of a code, and the above-mentioned module, program segment, or a part of the code contains one or more executable instructions for implementing the specified logical functions. It should also be noted that in some alternative implementations, the functions marked in the box may also occur in an order different from that marked in the accompanying drawings. For example, two boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram or flowchart, and the combination of boxes in the block diagram or flowchart, can be implemented with a dedicated hardware-based system that performs the specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions. It can be understood by those skilled in the art that the features recorded in the various embodiments and / or claims of the present disclosure can be combined and / or combined in a variety of ways, even if such a combination or combination is not explicitly recorded in the present disclosure. In particular, without departing from the spirit and teaching of the present disclosure, the features described in the various embodiments and / or claims of the present disclosure may be combined and / or combined in a variety of ways. All of these combinations and / or combinations fall within the scope of the present disclosure.

[0097] The embodiments of the present disclosure are described above. However, these embodiments are only for illustrative purposes and are not intended to limit the scope of the present disclosure. Although the embodiments are described above separately, this does not mean that the measures in the various embodiments cannot be used in combination to advantage. The scope of the present disclosure is defined by the attached claims and their equivalents. Without departing from the scope of the present disclosure, those skilled in the art may make a variety of substitutions and modifications, which should all fall within the scope of the present disclosure.

Claims

1. A test system comprising an environmental test chamber, a controller and a multiplexer, wherein: The environmental test box has a containing space, and the containing space is used to place the equipment to be tested; The controller is electrically connected to the multiplexer, and is used to generate multiple control signals and send the multiple control signals to the multiplexer; The multiplexer includes a multiplexing module and a plurality of control switches, wherein the multiplexing module has a plurality of first data ports and a second data port, the first data port is connected to the device under test through the control switch, and the multiplexing module is used to transmit the received data in the plurality of first data ports to the controller through the second data port; Wherein, the device to be tested includes a three-dimensional camera; The system further comprises: A test target is arranged in the accommodation space of the environmental test box, the test target is arranged in parallel with an array composed of a plurality of the three-dimensional cameras, and the distance between the test target and the array satisfies that the test target is located within the field of view of all the three-dimensional cameras; The system is also used to: Performing a difference operation on the test depth image measured by the three-dimensional camera and the initial depth image to determine whether the three-dimensional camera works abnormally, including: A matrix subtraction operation is performed on the matrix obtained by transforming the test depth image and the matrix obtained by transforming the initial depth image. For the obtained difference matrix, the absolute value of each element in the difference matrix is ​​taken, and the size of the element value of each element and the first preset threshold is determined, and whether the number of elements whose element values ​​are greater than the first preset threshold is greater than or equal to the second preset threshold is determined, so as to determine whether the three-dimensional camera is working abnormally.

2. The system according to claim 1, wherein: The environmental test box is electrically connected to the controller; The environmental test box is used to obtain environmental parameters in the containing space and send the environmental parameters to the controller; and The environmental test box is used to adjust the environmental parameters in the containing space in response to the environmental parameter configuration signal sent by the controller.

3. The system according to claim 1, wherein: The surface of the test target is configured as a plurality of planes having the same or different depths of field; The three-dimensional camera has a lens, and the lens of the three-dimensional camera is configured to face the test target to obtain test data.

4. The system according to claim 3, wherein: The multiplexer is used to control the opening and closing of the plurality of control switches according to the level states of the multi-channel control signals, so that when the control switches are closed, the test data of the three-dimensional camera connected to the control switches are sent to the controller.

5. The system according to claim 4, further comprising: A memory is electrically connected to the controller, and is used to store test data received by the controller.

6. The system according to claim 5, wherein: The memory stores a test configuration file; The controller is further configured to send the test configuration file in the memory to the three-dimensional camera through the multiplexer.

7. A three-dimensional camera testing method implemented using the testing system according to any one of claims 1 to 6, comprising: Acquire a test configuration file and a camera configuration file, wherein the test configuration file includes a total test duration, the total test duration includes a plurality of test cycles, and the camera configuration file includes imaging parameters; Sending the camera configuration files to multiple 3D cameras to be tested respectively; In each of the test cycles, sequentially acquiring depth images generated by a plurality of the three-dimensional cameras to be tested based on the imaging parameters; and For each of the three-dimensional cameras to be tested, a test result of the three-dimensional camera to be tested is determined based on the depth image generated by the three-dimensional camera to be tested.

8. The method according to claim 7, wherein: In each of the test cycles, sequentially acquiring depth images generated by a plurality of the three-dimensional cameras to be tested based on the imaging parameters, including: In each of the test cycles, the level states of the multiple control signals are controlled to change according to a preset rule, so as to control the multiple control switches to be closed in sequence; and When the control switch is closed, the depth image is acquired from the three-dimensional camera to be tested in the loop where the control switch is located.

9. The method according to claim 7, wherein: The depth image comprises an initial depth image and a test depth image, wherein the initial depth image is generated by the three-dimensional camera to be tested in the first test cycle of the total test duration; Wherein, for each of the three-dimensional cameras to be tested, determining a test result of the three-dimensional camera to be tested based on the depth image generated by the three-dimensional camera to be tested includes: In each of the test cycles, performing a difference operation on the initial depth image and the test depth image measured by the three-dimensional camera to be tested to obtain a difference matrix; Obtaining the number of elements in the difference matrix whose absolute values ​​are greater than a first preset threshold; When the number of the elements is greater than or equal to a second preset threshold, determining that the three-dimensional camera to be tested fails the test in the test cycle; and When the number of the elements is less than a second preset threshold, it is determined that the 3D camera to be tested passes the test in the test cycle.

10. The method according to claim 9, further comprising: When it is determined that the 3D camera to be tested fails the test in the test cycle, feedback information indicating that the 3D camera to be tested is abnormal is issued.

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