Circuit inspection device

Abstract

The present invention relates to a circuit inspection device, and more particularly, to a circuit inspection device used for conducting inspection and operating characteristic inspection in the manufacturing process of electronic products. The present invention discloses a circuit inspection device, comprising: a receiving fixture (100) having a plurality of receiving grooves (110) arranged in a row formed on the upper portion; a plurality of probes (1) installed in the plurality of receiving grooves (110); and a main body (200) coupled to the receiving fixture (100) and having openings (210) corresponding to the plurality of receiving grooves (110) formed thereon, so that at least a portion of the probes (1) are exposed to the upper side.

Description

Technical Field

[0001] The present invention relates to a circuit inspection device, and more particularly to a circuit inspection device used for conducting inspection and operating characteristic inspection in the manufacturing process of electronic products. Background Art

[0002] For electronic product modules such as cameras or liquid crystal panels, conductivity checks and operating characteristic checks are performed during their manufacturing process. In order to implement such checks, a probe is used to connect the electrode portion of the FPC contact electrode connected to the main substrate of the electronic product module or the mounted substrate-to-substrate connector to the inspection device.

[0003] That is, when connecting the electrode part and the inspection device in the electronic product module, the probe can be flexibly used to electrically connect the electrode part and the inspection device. At this time, the probe can stably contact between the electrode terminal of the electronic product module and the inspection device through appropriate contact pressure.

[0004] On the other hand, circuit inspection devices using such probe pins have conventionally used spring pins including springs. However, in this case, the number of current paths between the inspection object and the inspection device increases, thereby increasing resistance and requiring high power.

[0005] In addition, conventional circuit inspection devices using probes are manufactured and shipped in modules with the probes or spring pins incorporated in the socket. Therefore, if a portion of the probes or spring pins are defective or damaged, the entire module must be replaced.

[0006] In addition, the circuit inspection device has a problem that a plurality of probes are evenly arranged, and thus there is a limitation in improving characteristics through electrical contact.

[0007] On the other hand, the need for high-speed data transmission technology for high-definition displays, IoT, autonomous vehicles, etc. has recently increased.

[0008] In high-speed data transmission of 1 Gbps or more, the probe should be constructed by differential signals rather than the conventional single-ended method, and impedance matching changes depending on the probe for each frequency band and the module surrounding the probe.

[0009] At this time, impedance matching is necessary according to various conditions, and for this purpose, a process of minimizing the frequency resonance range through HFSS simulation or the like is required. Summary of the invention

[0010] An object of the present invention is to solve the above-mentioned problems of the present invention and to provide a circuit inspection device having low contact resistance while improving the contact reliability between the inspection object and the inspection device.

[0011] The present invention is proposed to achieve the above-mentioned purpose, and discloses a circuit inspection device, including: a receiving fixture 100, on the upper part of which a plurality of receiving grooves 110 arranged in a row are formed; a plurality of probes 1 are installed in the plurality of receiving grooves 110; a main body 200, which is combined with the receiving fixture 100 and is formed with openings 210 corresponding to the plurality of receiving grooves 110, so that at least a portion of the probes 1 are exposed to the upper side.

[0012] The plurality of receiving grooves 110 may be formed symmetrically in the longitudinal direction with reference to a virtual center line L that crosses the width center of the receiving fixture 100 in the longitudinal direction.

[0013] The plurality of receiving grooves 110 are formed alternately and staggered left and right on a plane in the longitudinal direction based on a virtual center line L that crosses the width center of the receiving fixture 100 in the longitudinal direction.

[0014] The plurality of receiving grooves 110 may be formed in a vertical direction with respect to a length direction of the receiving fixture 100 .

[0015] The receiving fixture 100 may further include a first receiving groove 120 and a second receiving groove 130 , which are formed at both ends in a perpendicular direction with respect to the plurality of receiving grooves 110 to respectively receive a single probe 1 .

[0016] The circuit inspection device may include a cover 300 disposed on the upper side of the main body 200 to be movable in an up-and-down direction, and at least a portion of the probe 1 is exposed to the upper side through the up-and-down movement under pressure.

[0017] The cover portion 300 may include: a cover plate 310 having a plurality of opening grooves 311 formed thereon corresponding to the plurality of receiving grooves 110; and a plurality of elastic bodies 320 disposed between the cover plate 310 and the main body 200, and capable of moving the cover plate 310 up and down by compression and restoring force.

[0018] The circuit inspection device may include a base portion 400 coupled to the main body 200 at a lower side of the receiving fixture 100 and formed with a lower opening portion 410 corresponding to the plurality of receiving grooves 110 to expose at least a portion of the probe 1 to the lower side.

[0019] The circuit inspection device of the present invention has the following advantages: through the coupling structure between the accommodating fixture for accommodating the probes and the main body, when at least a part of the multiple probes in use are defective or damaged, only a part of the probes can be replaced for use.

[0020] That is, the circuit inspection device of the present invention has the following advantages: it has a compact structure, is excellent in assemblability, and can easily replace only at least a part of a plurality of probes to be used.

[0021] In addition, the advantages of the circuit inspection device of the present invention are as follows: the probe includes an elastic part that can be stretched in the length direction, and the cover part also includes an elastic body that can be stretched in the up and down direction, thereby maintaining stable contact between the inspection device and the inspection object in various environments, so the contact reliability is high.

[0022] In addition, the circuit inspection device of the present invention has the following advantages: the receiving grooves of the receiving fixture for receiving the probes are formed in various ways along the length direction of the receiving fixture, thereby improving contact reliability and reducing contact resistance, thereby improving electrical characteristics. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 This is a side view showing one embodiment of the probe of the present invention.

[0024] Figure 2 is a side view showing another embodiment of the probe of the present invention.

[0025] Figure 3 It is an exploded perspective view showing the structure of the circuit inspection device of the present invention.

[0026] Figure 4 It is shown Figure 3 A cross-sectional view showing the probe arrangement of a circuit inspection device.

[0027] Figure 5 It is an exploded perspective view showing the structure of a circuit inspection device according to another embodiment of the present invention.

[0028] Figure 6 It is shown Figure 5 An enlarged plan view of a fixture for accommodating a circuit inspection device.

[0029] Figure 7 It is shown Figure 5 A cross-sectional view showing the arrangement of probes of a circuit inspection device.

[0030] Figure 8 As shown Figure 5 The graph of the TDR test result of the circuit inspection device is a graph showing that the X-axis is time and the Y-axis is resistance.

[0031] Fig. 9 It is shown Figure 5 A graph of the eye diagram of a circuit inspection device.

[0032] Fig.10 As shown Figure 5 The graph of the S-parameter of the circuit inspection device is a graph showing that the X-axis is frequency and the Y-axis is decibel.

[0033] Description of Reference Numerals

[0034] 1: Probe 100: Holding fixture

[0035] 200: Main body 300: Cover

[0036] 400: Base DETAILED DESCRIPTION

[0037] Hereinafter, a probe and a circuit inspection device having the probe according to the present invention will be described with reference to the accompanying drawings.

[0038] like Figures 3 to 7 As shown, the circuit inspection device of the present invention includes: a plurality of receiving grooves 110 arranged in a row are formed at the upper part; a plurality of probes 1 are installed in the plurality of receiving grooves 110; a main body 200 is combined with the receiving fixture 100, and is formed with openings 210 corresponding to the plurality of receiving grooves 110 so that at least a portion of the probes 1 are exposed to the upper side.

[0039] In addition, the circuit inspection device of the present invention may include a cover 300 disposed on the upper side of the main body 200 to be movable in the vertical direction, and at least a portion of the probe 1 is exposed to the upper side by the vertical movement under pressure.

[0040] In addition, the circuit inspection device of the present invention may include a base portion 400 which is coupled to the main body portion 200 at the lower side of the receiving fixture 100 and has a lower opening portion 410 corresponding to the plurality of receiving grooves 110 so that at least a portion of the probe 1 is exposed to the lower side.

[0041] In addition, the circuit inspection device of the present invention may further include a substrate, which is detachably disposed on the lower side of the base portion 400 and contacts one end of the probe 1 for inspecting the inspection object.

[0042] The inspection object of the present invention can be applied to any structure as long as it is an electronic product used through electrical contact.

[0043] For example, the inspection object may be used to inspect FPC (Flexible Printed Circuit), FFC (Flexible, Flat Cable), camera modules used in mobile phones, LCD, OLED, B2B connections, etc.

[0044] Here, the probe 1 of the present invention may have various structures as a structure mounted in the plurality of receiving grooves 110 of the receiving jig 100 .

[0045] For example, Figure 1 and Figure 2 As shown, the probe 1 may include: an elastic portion 10 that is retractable along the length direction; a first contact portion 20 formed at one end of the elastic portion 10 in the length direction; and a second contact portion 30 formed at the other end of the elastic portion 10 in the length direction.

[0046] The elastic portion 10 is a structure that expands and contracts along the length direction and may have various structures.

[0047] For example, the elastic portion 10 may include: a first elastic portion 40, which extends in a direction intersecting the first contact portion 20 with respect to the length direction connecting the first contact portion 20 and the second contact portion 30, and is formed in a direction spaced from the first contact portion 20; a second elastic portion 50, which extends in a direction intersecting the second contact portion 30 and the length direction, and is formed in a direction spaced from the first contact portion 20; and a third elastic portion 60, which is formed between the first elastic portion 40 and the second elastic portion 50 in a direction close to the first contact portion 20.

[0048] The first elastic portion 40 may have various structures as a structure extending in a direction intersecting the first contact portion 20 with respect to the length direction connecting the first contact portion 20 and the second contact portion 30 and formed in a direction spaced apart from the first contact portion 20 .

[0049] For example, the first elastic portion 40 may include: a first straight portion 41 extending in a direction orthogonal to the first contact portion 20 and the length direction; a first curved portion 42 formed in an arc shape, and one end of which is connected to the first straight portion 41 and the other end of which is connected to one end of the third elastic portion 60.

[0050] The first straight portion 41 is a structure extending in a direction perpendicular to the first contact portion 20 and the longitudinal direction, and may have various structures.

[0051] For example, the first straight portion 41 may be bent from the lower end of the first contact portion 20 and formed in a horizontal direction, and thus may be disposed so that the upper portion thereof may be in surface contact with the main body portion 200 .

[0052] The first straight portion 41 can be formed of a stretchable material. When the first contact portion 20 is pressed downward, one end connected to the first contact portion 20 drops downward, while the other end connected to the first curved portion 42 remains unchanged, so that the whole can be stretched and retracted in the length direction.

[0053] On the other hand, the first straight portion 41 can be connected so that the connection surface is parallel to the first contact portion 20 and the length direction; as another example, it can be connected so that the connection surface is orthogonal to the first contact portion 20 and the length direction, and it can also be connected so that the connection surface obliquely intersects with the first contact portion 20 and the length direction.

[0054] The first curved portion 42 is an arc-shaped structure with one end connected to the first straight portion 41 and the other end connected to one end of the third elastic portion 60 , and may have various structures.

[0055] For example, the first curved portion 42 extends from the other end of the first straight portion 41 opposite to one end connected to the first contact portion 20 and may be formed in an arc shape such that a virtual center is located below the first straight portion 41 .

[0056] At this time, when the first straight portion 41 is deformed due to pressure, the first curved portion 42 is conducive to the first straight portion 41 being formed obliquely, so as to expand and contract along the entire length direction of the elastic portion 10, and the central angle of the virtual center can be greater than 180 degrees.

[0057] The second elastic portion 50 may have various structures as a structure extending in a direction intersecting the second contact portion 30 and the longitudinal direction and formed in a direction spaced apart from the first contact portion 20 .

[0058] For example, the second elastic portion 50 may include: a second straight portion 51 extending in a direction orthogonal to the second contact portion 30 and the length direction; a second curved portion 52 formed in an arc shape, and one end of which is connected to the second straight portion 51 and the other end of which is connected to the other end of the third elastic portion 60.

[0059] The second straight line portion 51 is a structure extending in a direction perpendicular to the second contact portion 30 and the longitudinal direction, and may have various structures.

[0060] The second straight portion 51 may be formed to extend in the same direction as the first straight portion 41 in terms of the length direction, and may be surface-contacted and mounted on a support surface 411 of a base portion 400 to be described later.

[0061] The second straight portion 51 is a structure supported so as to expand and contract when the first contact portion 20 is pressurized, and may be made of a stretchable material, but may also be made of a hard material.

[0062] That is, the second straight portion 51 may be supported by the support surface 411 of the base portion 400 and supported on one side so that the first elastic portion 40 and the third elastic portion 60 can be extended and retracted in the length direction.

[0063] On the other hand, the second straight portion 51 is the same as the first straight portion 41, and is connected to the second contact portion 30 so that the connection surface with the second contact portion 30 is parallel to the length direction; as another example, it can be connected so that the connection surface is orthogonal to or obliquely intersecting with the second contact portion 30 and the length direction.

[0064] The second curved portion 52 is an arc-shaped structure with one end connected to the second straight portion 51 and the other end connected to the other end of the third elastic portion 60 , and may have various structures.

[0065] For example, the second curved portion 52 extends from the other end of the second straight portion 51 opposite to one end connected to the second contact portion 30 and may be formed in an arc shape so that the virtual center is located below the second straight portion 51 .

[0066] At this time, the second curved portion 52 can be formed to facilitate inclination when the second connecting portion 62 described later is deformed due to pressure, so as to expand and contract the entire length direction of the elastic portion 10. For this purpose, the central angle relative to the virtual center can be greater than 180 degrees.

[0067] The third elastic portion 60 is a structure formed between the first elastic portion 40 and the second elastic portion 50 in a direction close to the first contact portion 20 , and may have various structures.

[0068] For example, the third elastic portion 60 may include: a first connecting portion 61, which extends and is connected from the first elastic portion 40 in a direction intersecting the length direction; a second connecting portion 62, which is connected to the second elastic portion 50 in a direction intersecting the length direction; and a third curved portion 63, which is formed in an arc shape and is connected between the first connecting portion 61 and the second connecting portion 62.

[0069] The first connection portion 61 is a structure that extends from the first elastic portion 40 in a direction intersecting the longitudinal direction and is connected, and may have various structures.

[0070] For example, the first connection portion 61 is formed such that one end is connected to the third bent portion 63 and the other end is connected to the first bent portion 42 , and is formed to be inclined in a direction intersecting the longitudinal direction.

[0071] More specifically, the first connection portion 61 may be inclined increasingly upward from the first curved portion 42 to the third curved portion 63 .

[0072] That is, the first connection portion 61 may be formed to extend from the first elastic portion 40 toward the first contact portion 20 .

[0073] Accordingly, when the first connecting portion 61 compresses the elastic portion 10 , the third curved portion 63 contacts the first straight portion 41 and the second straight portion 51 , thereby reducing the total resistance.

[0074] The second connection portion 62 is a structure that extends from the second elastic portion 50 in a direction intersecting the longitudinal direction and is connected thereto, and may have various structures.

[0075] For example, the second connection portion 62 is formed so that one end is connected to the third curved portion 63 and the other end is connected to the first curved portion 42 , and can be inclined in a direction intersecting the longitudinal direction.

[0076] More specifically, the second connection portion 62 may be inclined increasingly downward from the second curved portion 52 to the third curved portion 63 .

[0077] That is, the second connection portion 62 may be formed to extend from the second elastic portion 50 toward the second contact portion 30 .

[0078] Accordingly, when the second connection portion 62 compresses the elastic portion 10 , the third curved portion 63 contacts the second straight portion 51 , thereby reducing the electrical resistance.

[0079] The third curved portion 63 is an arc-shaped structure connected between the first connecting portion 61 and the second connecting portion 62 , and may have various structures.

[0080] For example, the third curved portion 63 may be formed in an arc shape between the first connection portion 61 and the second connection portion 62 , and may be formed such that a central angle is greater than 180 degrees based on a virtual center.

[0081] Alternatively, the elastic portion 10 may be formed by a pair of elastic sheets 11 and 12 in a strip shape disposed at a distance from each other.

[0082] At least a portion of the first contact portion 20 is exposed to the upper side of the cover portion 300 , and can be in contact with an electrode portion of an inspection object located on the upper side to conduct electricity.

[0083] The first contact portion 20 may include: a first connection portion 21 extending upward from one end of the elastic portion 10; and a first contact surface 22 formed at a distal end of the first connection portion 21 to contact an electrode portion of an inspection object.

[0084] In addition, the first contact portion 20 may further include an opening 23 formed through the first connection portion 21 , thereby improving electrical characteristics.

[0085] The second contact portion 30 is a structure formed at the other end of the elastic portion 10 in the longitudinal direction, and may have various structures.

[0086] In particular, at least a portion of the second contact portion 30 is exposed to the lower side of the base portion 400 , and can be in contact with a substrate or PCB for inspection located at the lower side to conduct electricity.

[0087] The second contact portion 30 may include: a second connection portion 31 extending downward from the other end of the elastic portion 10; and a second contact surface 32 formed at the end of the second connection portion 31 to contact the substrate or the PCB.

[0088] In addition, the second contact portion 30 may further include an extending portion 33 , and the extending portion 33 is formed to extend toward the opposite side of the second straight portion 51 with the second connecting portion 31 as a reference.

[0089] At this time, the side surfaces of the second connecting portion 31 and the extending portion 33 located on the opposite side of the second straight portion 51 are vertically formed to be parallel to the length direction of the elastic portion 10, and then surface-contact with the receiving groove 110 and the receiving portion 140 of the receiving fixture 100 described later, so that the probe 1 can be stably set.

[0090] The receiving jig 100 has a structure in which a plurality of receiving grooves 110 arranged in a row are formed on an upper portion, and may have various structures.

[0091] For example, Figure 3 and Figure 5 As shown, the receiving jig 100 may include a receiving portion 140 formed with a receiving groove 110 in which at least a portion of the probe 1 is exposed to an upper side for installation.

[0092] At this time, the accommodating fixture 100 may be formed with an accommodating groove 110, which is arranged in a row in the length direction on the side of the accommodating portion 140 having a length, and a protrusion may be formed on the upper side of the accommodating portion 140 so that at least a portion of the upper side of the installed probe 1 can be exposed to the outside when combined with the main body 200 described later.

[0093] On the other hand, Figure 3 As shown, the receiving fixture 100 may be configured with more than two, and as shown in Figure 5 The above-mentioned may also be configured as a single one.

[0094] The receiving groove 110 is formed on the side surface including a portion of the upper surface and the ground surface based on a virtual center line L passing through the width center of the receiving portion 140 in the length direction, so that the probe 1 can be inserted and installed.

[0095] In this case, the receiving groove 110 may be formed symmetrically in the longitudinal direction with reference to a virtual center line L that crosses the width center of the receiving jig 100 in the longitudinal direction.

[0096] Thus, the receiving grooves 110 can be formed symmetrically with respect to each other in cross-sections perpendicular to the length direction of the receiving portion 140 with the virtual center line L as a reference. At this time, a blocking portion 141 (i.e., the center of the receiving portion 140) can be formed between the receiving grooves 110.

[0097] On the other hand, as another example, Figure 5 As shown, the receiving grooves 110 are formed alternately and staggered left and right in the length direction on a plane based on a virtual center line L that crosses the width center of the receiving fixture 100 in the length direction.

[0098] More specifically, if Figure 6 As shown, the receiving grooves 110 are formed in a plane so as to alternately receive the fixture 100 left and right in the length direction, and thus can be formed alternately in a plane so as to be staggered left and right in the length direction based on the virtual center line L.

[0099] On the other hand, in this case, the probes 1 are also mounted in the receiving grooves 110 , and can be arranged alternately left and right in the longitudinal direction with reference to the virtual center line L.

[0100] like Figure 6 As shown, the receiving groove 110 may be formed to a portion opposite to the virtual center line L of the blocking portion 141 so that the first contact portion 20 and the second contact portion 30 of the installed probe 1 completely overlap with the first contact portion 20 and the second contact portion 30 of the adjacent probe 1 on the front side.

[0101] On the other hand, as another example, the receiving groove 110 may be formed to a portion opposite to the virtual center line L of the receiving portion 140 so that the first contact portion 20 and the second contact portion 30 of the installed probe 1 at least partially overlap with the adjacent probe 1 .

[0102] In this case, in order to prevent the adjacent probes 1 from overlapping in front, they may be arranged alternately left and right.

[0103] On the other hand, the plurality of receiving grooves 110 may be formed in a vertical direction with respect to the length direction of the receiving jig 100 , and more specifically, may be formed in a vertical direction with respect to the virtual center line L on the side of the receiving portion 140 .

[0104] In addition, the receiving fixture 100 of the present invention may further include a first receiving groove 120 and a second receiving groove 130 , wherein the first receiving groove 120 and the second receiving groove 130 are formed at both ends of the plurality of receiving grooves 110 in a vertical direction to respectively receive a single probe 1 .

[0105] More specifically, if Figure 5As shown, the first receiving groove 120 and the second receiving groove 130 are structures respectively formed at two ends of the receiving fixture 100 to install the probe 1, and can have various structures.

[0106] In this case, the first receiving groove 120 and the second receiving groove 130 may be formed at both ends of the receiving fixture 100 in a perpendicular direction to the receiving groove 110 , that is, may be formed in parallel with the length direction of the receiving portion 140 .

[0107] The main body 200 is a structure that is coupled to the receiving jig 100 and is formed with openings 210 corresponding to the plurality of receiving grooves 110 to expose at least a portion of the probe 1 to the upper side, and may have various structures.

[0108] For example, Figure 3 and Figure 5 As shown, the main body 200 may include: a main body 220 having an opening 210 corresponding to a plurality of receiving grooves 110 of the receiving fixture 100 ; and a step 223 formed so that a base 400 described later can be inserted into the lower side of the main body 220 .

[0109] On the other hand, the main body 200 may be formed with a plurality of through holes 221 , and the plurality of through holes 221 penetrate the main body 220 , so as to be bolted to the cover 300 .

[0110] In addition, the main body 200 may further form a plurality of insertion holes 222 into which the elastic body 320 is inserted, so that the cover 300 described later can move relatively in the vertical direction.

[0111] The cover 300 is a structure that can move in the vertical direction on the upper side of the main body 200 and expose at least a portion of the probe 1 to the upper side by the vertical movement under pressure, and can have various structures.

[0112] For example, the cover 300 may include: a cover plate 310 having a plurality of opening grooves 311 corresponding to the plurality of receiving grooves 110; and a plurality of elastic bodies 320 disposed between the cover plate 310 and the main body 200 to move the cover plate 310 up and down through compression and restoring force.

[0113] The cover plate 310 may have various structures as a structure in which a plurality of opening grooves 311 are formed corresponding to the plurality of receiving grooves 110 to expose a portion of the upper side of the plurality of probes 1 installed in the plurality of receiving grooves 110 when moving up and down.

[0114] The cover plate 310 may be a structure where the inspection object is located at the upper side and is moved downward by pressure applied to the inspection object so that a portion of the upper side of the probe 1 exposed contacts the electrode portion of the inspection object.

[0115] Thus, the cover plate 310 is accompanied with contact with the inspection object, and thus may be made of an insulating material.

[0116] In addition, the cover plate 310 may include a cover bolt hole 312 through which a bolt 330 bolted to the main body 200 passes.

[0117] That is, the cover plate 310 is coupled to the main body 200 by means of bolts 330 penetrating through the cover bolt holes 312 . At this time, the diameter of the cover bolt holes 312 may be larger than the bolts 330 so as to be able to move up and down.

[0118] The plurality of elastic bodies 320 are disposed between the cover plate 310 and the main body 200 to allow the cover plate 310 to move up and down, and may have various structures.

[0119] For example, the structure of the multiple elastomers 320 can be as follows: configured so that a portion is inserted into at least one of the upper surface of the main body 200 or the lower surface of the cover 310, and is compressed when the cover 310 moves downward due to the weight of the inspection object or the pressure of the user, and when the external force is removed, the cover 310 is moved upward by the restoring force.

[0120] On the other hand, the plurality of elastic bodies 320 may be disposed at corners of the rectangular cover plate 310 and the main body 200 , respectively.

[0121] The base 400 is coupled to the body 200 at the lower side of the receiving jig 100 and has lower openings 410 corresponding to the plurality of receiving grooves 110 to expose at least a portion of the probe 1 to the lower side. The base 400 may have various structures.

[0122] For example, the base portion 400 may include: a base body 420; a lower opening portion 410 formed on the inner bottom surface of the base body 420, protruding at least a portion of the probe 1, more preferably protruding the second contact surface 32, to electrically connect to the substrate or PCB.

[0123] To this end, the base portion 400 may be in electrical contact with a substrate for inspection disposed at a lower side, that is, a PCB.

[0124] At this time, the base portion 400 is formed with at least one base bolt hole, and more preferably, four base bolt holes corresponding to the corners are formed, and can be combined with the main body portion 200 by bolt combination.

[0125] In addition, a groove having a step and formed inwardly may be included so that the receiving jig 100 is installed inside. Since the receiving jig 100 is installed and inserted into the groove, the receiving jig 100 can be easily coupled.

[0126] In this case, when a plurality of receiving jigs 100 are arranged according to the number of receiving jigs 100 , a plurality of grooves may be formed.

[0127] On the other hand, the base portion 400 is provided with the second straight portion 51 of the probe 1 in surface contact with the bottom surface of the groove portion, ie, the supporting surface 411 , thereby supporting the stable contraction of the elastic portion 10 .

[0128] On the other hand, the effects of the circuit inspection device of the present invention will be described below with reference to the drawings.

[0129] like Figure 8 As shown, the result of TDR (Time Domain Reflectometry) measurement performed by the circuit inspection device of the present invention shows that the impedance value has a value between 94.98Ω and 120.62Ω.

[0130] It can be confirmed that the abnormal range of the TDR test of the high-speed signal probe previously disclosed is close to that of PCI-e gen3, that is, it has a range value close to 100Ω, and thus is within the appropriate range compared to the previous technical impedance range value. Therefore, the cable has fewer defects and the signal is transmitted without defects.

[0131] On the other hand, in this case, as Figure 8 The numbers shown, 3 refers to the start point of the probe, 4 refers to the end point of the probe, 1 refers to the lowest impedance value in the range, and 2 refers to the highest impedance value in the range.

[0132] In addition, if Fig. 9 As shown, in order to determine the noise in the signal, the circuit inspection device of the present invention measured the Eye-Diagram, and the result confirmed that the noise was smaller than before, so the quality was excellent.

[0133] That is, referring to Fig. 9 From the Eye-Diagram shown, it can be seen that the circuit inspection device of the present invention has a large eye opening size, so it can be intuitively known that the signal quality is excellent and the noise is small.

[0134] Thus, it can be confirmed that the signal quality of the entire device including other components combined with the circuit inspection device of the present invention is excellent. Even if some noise is generated due to the combination of the entire device, the probe has excellent quality, thereby having the advantage of minimizing the generation of noise.

[0135] In addition, if Fig.10As shown, the circuit inspection device of the present invention only detects the insertion loss and return loss of the probe itself. The results show that the insertion loss has a value between -1dB and 0dB based on the frequency of 4GHz in the high-speed signal band, and the return loss has a value below -10dB.

[0136] Thus, in the 4 GHz range, the insertion loss has a value between -1 dB and 0.5 dB, and the return loss exists in a range of values ​​below -10 dB, and thus it is confirmed that the signal loss is sufficiently reduced compared to the conventional technology.

[0137] The following is only a part of the description of the preferred embodiments that can be implemented by the present invention. It is well known that the scope of the present invention is not limited to the above-mentioned embodiments, but the technical ideas of the present invention described above and its fundamental technical ideas are all included in the scope of the present invention.

Claims

1. A circuit inspection device, characterized in that: include: A receiving fixture (100) having a plurality of receiving grooves (110) arranged in a row formed on the upper portion; A plurality of probes (1) installed in the plurality of receiving slots (110); A main body (200) is combined with the receiving fixture (100) and is formed with an opening (210) corresponding to the plurality of receiving grooves (110) so that at least a portion of the probe (1) is exposed to the upper side. The plurality of receiving grooves (110) are installed with the plurality of probes (1) being alternately formed in a plane staggered left and right in the length direction, based on a virtual center line (L) that crosses the width center of the receiving fixture (100) in the length direction. The probe (1) comprises: An elastic portion (10) is retractable along the length direction of the probe (1); A first contact portion (20) formed at one end of the elastic portion (10); A second contact portion (30) is formed at the other end of the elastic portion (10), The elastic portion (10) is formed on one side with a virtual line connecting the first contact portion (20) and the second contact portion (30) as a reference, The receiving groove (110) is formed so that the first contact portion (20) and the second contact portion (30) of the installed probe (1) can completely overlap with the first contact portion (20) and the second contact portion (30) of the adjacent probe (1) on the front side, and the elastic portions (10) of the installed probe (1) and the adjacent probe (1) are alternately arranged left and right on the plane.

2. The circuit inspection device according to claim 1, characterized in that: The plurality of receiving grooves (110) are formed in a perpendicular direction to the length direction of the receiving fixture (100).

3. The circuit inspection device according to claim 2, characterized in that: The receiving fixture (100) further comprises a first receiving groove (120) and a second receiving groove (130). The first accommodating groove (120) and the second accommodating groove (130) are formed at both ends in a vertical direction with respect to the plurality of accommodating grooves (110) so as to respectively accommodate a single probe (1).

4. The circuit inspection device according to claim 1, characterized in that: include: The cover part (300) is arranged on the upper side of the main body part (200) so as to be movable in the up-and-down direction, and exposes at least a part of the probe (1) to the upper side through the up-and-down movement under pressure.

5. The circuit inspection device according to claim 4, characterized in that: The cover portion (300) comprises: The cover plate (310) is formed with a plurality of opening grooves (311) corresponding to the plurality of receiving grooves (110); and a plurality of elastic bodies (320) are arranged between the cover plate (310) and the main body (200), and the cover plate (310) can be moved up and down by compression and restoring force.

6. The circuit inspection device according to claim 1, characterized in that: include: The base portion (400) is coupled to the main body portion (200) at the lower side of the receiving fixture (100), and is formed with a lower opening portion (410) corresponding to the plurality of receiving grooves (110) so as to expose at least a portion of the probe (1) to the lower side.

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