A method for measuring tritium content in solid materials

Abstract

The present invention provides a method for measuring tritium content in solid materials, including: S1: placing the object to be measured between parallel electrode plates, changing the voltage parameters at both ends of the electrode plates, and obtaining multiple sets of energy spectrum data; S2: calculating the X-ray energy spectrum data induced by beta rays under different electric field strengths; S3: establishing a multi-energy spectrum combination inversion model, constructing a functional relationship between the total ray energy spectrum and the ray energy spectrum at different depths under the electric field, and solving the distribution of tritium at different depths based on the inversion model under different electric field strengths. The advantages of the present invention are: enhancing the measurement spectrum by means of adding high voltage, avoiding large errors in the measurement process, providing a guarantee for subsequent data inversion, and improving the accuracy of inversion calculation.

Description

Technical Field

[0001] The invention relates to the technical field of nuclear physics, and in particular to a method for measuring tritium content in solid materials. Background Art

[0002] Tritium is not only an important national strategic material, but also an important fuel for fusion reactors. It is widely used in various fields such as military, aerospace, industry, technology development and scientific research. Researching and developing tritium analysis and measurement technology, and accurately analyzing and measuring tritium are the most basic requirements for the reliability and stability of tritium technology. With the rapid development of science and technology, the amount of tritium involved in various projects has reached the kilogram level, which has brought new challenges to tritium analysis and measurement technology.

[0003] Among the analytical measurement methods for tritium in solids, the β-induced X-ray spectroscopy (BIXS) analysis method is currently the most popular. It is one of the most effective means for non-destructive measurement and analysis of tritium materials and is widely used in developed countries such as Japan and Germany. At present, great progress and breakthroughs have been made in BIXS tritium measurement technology in China, and related technical achievements have also been promoted and applied. However, the BIXS analysis methods used all use a set of experimental spectra to compare with the simulated spectra to estimate the content and depth distribution of tritium. Affected by many factors such as the content and depth of tritium, experimental conditions, simulation algorithms, and the accuracy of the coincidence, the accuracy of the analysis is difficult to guarantee to a large extent.

[0004] The invention patent application with publication number CN 106844996A discloses a method for inverting accidental tritium source terms based on plant tritium monitoring data. It takes advantage of the easy collection and monitoring of plant tritium and solves the technical obstacles in online monitoring of gaseous tritium (HTO / HT) in the traditional method of using atmospheric diffusion models to invert the tritium accident source terms.

[0005] The invention patent application with publication number CN109164115A discloses a BIXS method analysis device for tritium in a sample, which utilizes the characteristics of the interaction between β rays and matter, has a simple structure, small size, low price, fast detection speed, high sensitivity, and supports experiments in two different conditions: vacuum and argon filling.

[0006] However, the above methods are unable to effectively measure the content and distribution depth of tritium in solid materials. The invention patent application with publication number CN110045411A discloses a method for measuring the depth distribution of deuterium and tritium in solid materials. To measure the distribution of deuterium and tritium, it is necessary to analyze the analysis models of deuterium and tritium at the same time. The measurement method is relatively complicated and is not suitable for measuring the distribution of tritium alone. Summary of the invention

[0007] The technical problem to be solved by the present invention is to provide a method capable of accurately measuring the distribution of tritium in a solid material.

[0008] The present invention solves the above technical problems through the following technical solutions: A method for measuring the tritium content in a solid material, comprising:

[0009] S1: Place the object to be measured between parallel electrode plates, change the voltage parameters at both ends of the electrode plates, and obtain multiple sets of energy spectrum data;

[0010] S2: Calculate the X-ray energy spectrum data induced by β rays under different electric field strengths;

[0011] S3: Establish a multi-energy spectrum combined inversion model, construct the functional relationship between the total ray energy spectrum and the ray energy spectrum at different depths under the electric field, and solve the distribution of tritium at different depths based on the inversion model under different electric field strengths.

[0012] The present invention places the object to be measured between parallel electrode plates, obtains multi-energy spectrum data by exciting an electric field, and extracts X-ray energy spectrum data induced by beta rays. The relationship between the tritium content and the energy spectrum of each layer is constructed by stratifying the object to be measured, and the tritium content of each layer is settled based on the values ​​under a variety of different electric fields, thereby obtaining the distribution of tritium content in the object to be measured, and enhancing the measurement spectrum by means of adding high voltage to avoid large errors in the measurement process, thereby providing a guarantee for subsequent data inversion and improving the accuracy of inversion calculation.

[0013] Preferably, the parallel electrode plates are made of β-ray blocking layer material.

[0014] Preferably, the multi-energy spectrum data includes beta-ray and X-ray energy spectra on both sides of the object being measured acquired by an ionization chamber detector and a semiconductor detector.

[0015] Preferably, the energy spectrum data under different electric field strengths are calculated using a Monte Carlo model to obtain the X-ray energy spectrum data induced by the β rays.

[0016] Preferably, the method for establishing the multi-energy spectrum inversion model is:

[0017] The object to be measured is divided into n layers, and the energy spectrum data is measured using m different electric fields. The total X-ray energy spectrum S(E j ) is expressed as,

[0018]

[0019] Among them, f i (E j ) represents the X-ray energy spectrum when only the i-th layer contains tritium under the action of the j-th electric field, a irepresents the tritium content of the i-th layer;

[0020] S(E j ), construct the inversion equations,

[0021]

[0022] Solve the equations to calculate the tritium content a in each layer i .

[0023] The advantages of the method for measuring the tritium content in a solid material provided by the present invention are: placing the measured object between parallel electrode plates, obtaining multi-energy spectrum data by exciting an electric field, and extracting X-ray energy spectrum data induced by beta rays, constructing a relationship between the tritium content and the energy spectrum of each layer by stratifying the measured object, and calculating the tritium content of each layer based on the values ​​under a variety of different electric fields, thereby obtaining the distribution of the tritium content in the measured object, enhancing the measurement spectrum by means of adding high voltage, avoiding large errors in the measurement process, providing a guarantee for subsequent data inversion, and improving the accuracy of the inversion calculation. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 A flow chart of a method for measuring tritium content in a solid material provided by an embodiment of the present invention;

[0025] Figure 2 A schematic diagram of a method for measuring tritium content in a solid material provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0026] In order to make the purpose, technical solution and advantages of the present invention more clearly understood, the technical solution of the present invention is clearly and completely described below in combination with specific embodiments and with reference to the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0027] Combination Figure 1 and Figure 2 This embodiment provides a method for measuring tritium content in a solid material, comprising:

[0028] S1: Place the object to be measured between parallel electrode plates, change the voltage parameters at both ends of the electrode plates, and obtain multiple sets of energy spectrum data;

[0029] S2: Calculate the X-ray energy spectrum data induced by β rays under different electric field strengths;

[0030] S3: Establish a multi-energy spectrum combined inversion model, construct the functional relationship between the total ray energy spectrum and the ray energy spectrum at different depths under the electric field, and solve the distribution of tritium at different depths based on the inversion model under different electric field strengths.

[0031] In this embodiment, the object to be measured is placed between parallel electrode plates, multi-energy spectrum data is obtained by exciting an electric field, and X-ray energy spectrum data induced by β rays is extracted. The relationship between the tritium content and the energy spectrum of each layer is constructed by layering the object to be measured, and the tritium content of each layer is calculated based on the values ​​under a variety of different electric fields, thereby obtaining the distribution of tritium content in the object to be measured, and the measurement spectrum is enhanced by means of adding high voltage to avoid large errors in the measurement process, thereby providing a guarantee for subsequent data inversion and improving the accuracy of the inversion calculation.

[0032] Specifically, the method for measuring the tritium content in a solid material provided in this embodiment includes:

[0033] S1: Place the object to be measured between parallel electrode plates, change the voltage parameters at both ends of the electrode plates, and obtain multiple sets of energy spectrum data;

[0034] The parallel electrode plates are made of a β-ray blocking layer material, and in this embodiment, aluminum is used. While changing the voltage parameters at both ends of the electrode plates during the test, the β-rays and X-rays on both sides of the object under test are measured using an ionization detector and a semiconductor detector, respectively, to obtain multi-energy spectrum data as the experimental spectrum.

[0035] S2: Calculate the X-ray energy spectrum data induced by β rays under different electric field strengths;

[0036] In this embodiment, the Monte Carlo model is used to calculate the energy spectrum data under different electric field strengths to obtain the X-ray energy spectrum data induced by the β-rays as the simulated spectrum.

[0037] S3: Establish a multi-energy spectrum combined inversion model, construct the functional relationship between the total ray energy spectrum and the ray energy spectrum at different depths under the electric field, and solve the distribution of tritium at different depths based on the inversion model under different electric field strengths.

[0038] The method for establishing the multi-energy spectrum inversion model is:

[0039] The object to be measured is divided into n layers, and the energy spectrum data is measured using m different electric fields. The total X-ray energy spectrum S(E j ) is expressed as,

[0040]

[0041] Among them, f i (E j) represents the X-ray energy spectrum when only the i-th layer contains tritium under the action of the j-th electric field, and is obtained by the calculation result of S2. i represents the tritium content of the i-th layer;

[0042] S(E j ), construct the inversion equations,

[0043]

[0044] Solve the equations to calculate the tritium content a in each layer i .

[0045] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for measuring tritium content in a solid material, characterized in that: include, S1: Place the object to be measured between parallel electrode plates, change the voltage parameters at both ends of the electrode plates, and obtain multiple sets of energy spectrum data; S2: Calculate the X-ray energy spectrum data induced by β rays under different electric field strengths; S3: Establish a multi-spectrum combined inversion model, construct the functional relationship between the total ray energy spectrum and the ray energy spectrum at different depths under the electric field, and solve the distribution of tritium at different depths based on the inversion model under different electric field strengths; Wherein, the method for establishing the multi-energy spectrum inversion model is: The object to be measured is divided into n layers, and the energy spectrum data is measured using m different electric fields. The total X-ray energy spectrum It is expressed as, in, represents the X-ray energy spectrum when only the i-th layer contains tritium under the action of the j-th electric field, represents the tritium content of the i-th layer; Measured at different electric field strengths , construct the inversion equations, Solve the equations to calculate the tritium content in each layer .

2. The method for measuring tritium content in a solid material according to claim 1, characterized in that: The parallel electrode plates are made of β-ray blocking layer material.

3. The method for measuring tritium content in a solid material according to claim 1, characterized in that: The multi-energy spectrum data includes the beta-ray and X-ray energy spectra on both sides of the object being measured obtained by the ionization chamber detector and the semiconductor detector.

4. The method for measuring tritium content in a solid material according to claim 1, characterized in that: The energy spectrum data under different electric field strengths are calculated using a Monte Carlo model to obtain the X-ray energy spectrum data induced by the beta rays.

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