A device for quickly measuring the verticality between the lip edge and the handle of a hemispherical resonator

Abstract

The present invention relates to a device for quickly measuring the verticality of the lip edge surface and the handle of a hemispherical resonator, comprising a hemispherical resonator, a workbench, a comparator and a pin. The hemispherical resonator comprises a handle and a hemispherical body, one end of the handle is fixedly connected to the hemispherical body, and the handle is located at the center of the hemispherical body; the end face of the hemispherical body is a lip edge; the workbench is a cylindrical table, and a cylindrical hole is opened at the central axis position of the cylindrical table; a probe hole is opened on the side wall of the cylindrical table, and the probe hole is connected to the cylindrical hole, and the probe of the comparator can be inserted into the probe hole; the handle of the hemispherical resonator is placed in the cylindrical hole, and the lip edge is tightly fitted with the upper end face of the workbench; the pin is located on the workbench, and is used to limit the positional relationship between the hemispherical resonator and the comparator. The device used for measurement of the present invention is exquisite, simple, occupies little space, and has low cost, and provides theoretical and practical support for real-time measurement and inspection during the research and processing of the lip edge of the hemispherical resonator.

Description

Technical Field

[0001] The invention relates to a device for quickly measuring the verticality between a lip edge surface of a hemispherical resonator and a handle rod, belonging to the technical field of hemispherical resonant gyroscopes. Background Art

[0002] The hemispherical resonator gyroscope is a new type of solid-state gyroscope suitable for strapdown inertial navigation systems. Due to its many advantages, it can meet performance requirements that are difficult to achieve with other gyroscopes in the fields of navigation, aviation and aerospace. As a key component of the hemispherical resonator gyroscope, the verticality of its handle and lip surface will affect the navigation accuracy.

[0003] During the machining of the hemispherical resonator, the lip surface will inevitably have a certain degree of tilt deviation after machining, which is directly manifested as the perpendicularity error between it and the handle. Therefore, before the subsequent research and development of the lip surface, its existing verticality needs to be checked. Most of the existing methods are to use a three-coordinate measuring instrument to measure the distance between multiple groups of points. In addition, during the research and development of the lip surface, the verticality deviation should be determined in real time as much as possible and the direction of de-determination should be adjusted in time, so as to ensure that the lip surface and the handle have good verticality while ensuring that the lip de-determination is as small as possible to avoid affecting the accuracy of other aspects. This requires timely and reliable measurement of the verticality of the two. At this stage, a three-coordinate measuring instrument is also used for measurement.

[0004] Due to the structure of the hemispherical resonator, when using a three-coordinate measuring machine for measurement, there are problems such as complex clamping and positioning, long measurement time (it takes a total of 15 to 20 minutes to measure a single hemispherical resonator), high cost, and inconvenience for on-site use, which brings great inconvenience to the related processing and inspection processes. Summary of the invention

[0005] The technical problem solved by the present invention is: to overcome the shortcomings of the prior art, to propose a device for quickly measuring the perpendicularity between the lip edge surface and the handle rod of a hemispherical resonator, to solve the problem of difficulty in grasping the perpendicularity between the lip edge surface and the handle rod during research and inspection, to provide support for efficient and precise machining, and to have important significance for improving the accuracy of a hemispherical resonator gyroscope.

[0006] The solution of the present invention is:

[0007] A device for quickly measuring the verticality between the lip edge surface of a hemispherical resonator and a handle rod comprises a hemispherical resonator, a workbench, a comparator and a pin.

[0008] The hemispherical resonator comprises a handle and a hemispherical body, one end of the handle is fixedly connected to the hemispherical body, and the handle is located at the center of the hemispherical body; the end surface of the hemispherical body is a lip edge;

[0009] The tooling table is a cylindrical table with a cylindrical hole at the center axis of the cylindrical table; a probe hole is opened on the side wall of the cylindrical table, the probe hole is connected to the cylindrical hole, and the probe of the comparator can be inserted into the probe hole; the handle of the hemispherical resonator is placed in the cylindrical hole, and the lip edge is tightly fitted with the upper end surface of the tooling table; the pin is located on the tooling table, which is used to limit the positional relationship between the hemispherical resonator and the comparator.

[0010] Furthermore, the upper end surface and the pins of the tooling table are plated with a wear-resistant coating.

[0011] Furthermore, the lip of the hemispherical resonator is adjacent to the outer circle close to the outer cylindrical surface of the pin on the workbench, and the position of the comparator can ensure that there is a sufficient reading interval during measurement.

[0012] Furthermore, during measurement, the hemispherical resonator is rotated and the maximum and minimum values ​​are read out through a comparator. The greater the difference between the maximum and minimum values, the worse the verticality between the handle of the hemispherical resonator and the lip edge, and vice versa.

[0013] Furthermore, the hemispherical resonator has a lip edge with a cylindrical structure, and its total runout value is ≤1 μm.

[0014] Furthermore, the flatness of the lip edge surface of the hemispherical resonator and the upper end surface of the workbench are better than 0.5μm, and the roughness level is at least level 8.

[0015] Furthermore, the coating material is TiN with a thickness of 2 to 3 μm.

[0016] Furthermore, there are two pins, each having a micron-level cylindricality.

[0017] Furthermore, the measuring needle axis of the comparator has micron-level parallelism with the upper end surface of the workbench, and the distance difference between the two pins relative to the measuring needle axis of the comparator should be within 0.005 mm.

[0018] Furthermore, the relationship between the measured runout value and the inclination angle of the lip edge surface is:

[0019] Where d is the diameter of the handle, l is the distance from the far end of the handle to the ideal lip edge surface, a is the inclination angle of the actual lip edge surface, and n is the measured runout value.

[0020] Furthermore, the relationship between the lip diameter D and the verticality m is:

[0021] m = D·tan(a).

[0022] The beneficial effects of the present invention compared with the prior art are:

[0023] (1) The present invention utilizes the circular runout of the distal end of the handle (the small shaft of the step shaft) to reflect its perpendicularity to the lip edge surface (the adjacent end surface of the small shaft of the step shaft). The measurement method is convenient and fast, which not only solves the difficulties caused by clamping and positioning when using a three-coordinate measuring instrument, but also greatly shortens the measurement time (using the present invention to measure a single hemispherical resonator only takes 0.5 to 1 minute);

[0024] (2) The measuring device of the present invention is exquisite, simple, occupies little space and has low cost, which provides theoretical and practical support for real-time measurement and inspection during the machining process of the lip edge of the hemispherical resonator. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 It is a structural diagram of the present invention;

[0026] Figure 2 This is the external structure diagram of the present invention;

[0027] Figure 3 This is a structural diagram of the hemispherical resonator of the present invention;

[0028] Figure 4 This is a measurement principle diagram of the present invention. DETAILED DESCRIPTION

[0029] The present invention will be further described below in conjunction with the embodiments.

[0030] A device for quickly measuring the perpendicularity between the lip edge surface and the handle of a hemispherical resonator, such as Figure 1-4 As shown, it includes a hemispherical resonator 1, a workbench 2, a comparator 3 and pins 4. There are two pins 4 with a cylindrical degree of micrometer level.

[0031] The hemispherical resonator 1 comprises a handle 11 and a hemispherical body 12, one end of the handle is fixedly connected to the hemispherical body, and the handle is located at the center of the hemispherical body; the end surface of the hemispherical body is a lip edge 13;

[0032] The workbench 2 is a cylindrical table with a cylindrical hole at the center axis of the cylindrical table; a probe hole is opened on the side wall of the cylindrical table, the probe hole is connected to the cylindrical hole, and the probe of the comparator 3 can be inserted into the probe hole; the handle of the hemispherical resonator is placed in the cylindrical hole, and the lip edge is tightly fitted with the upper end surface of the workbench 2; the pin 4 is located on the workbench 2, and is used to limit the positional relationship between the hemispherical resonator 1 and the comparator 3.

[0033] The upper end surface of the tooling table 2 and the pin 4 are both plated with a wear-resistant coating, the coating material is TiN, and the thickness is 2 to 3 μm.

[0034] The adjacent outer circle of the lip edge of the hemispherical resonator 1 is close to the outer cylindrical surface of the pin 4 on the workbench 2. At the same time, the position of the comparator 3 can ensure that there is enough reading interval during measurement. During measurement, the hemispherical resonator 1 is rotated and the maximum and minimum values ​​are read through the comparator 3. The greater the difference between the maximum and minimum values, the worse the verticality between the handle of the hemispherical resonator 1 and the lip edge, and vice versa.

[0035] The hemispherical resonator 1 has a lip edge of a cylindrical structure, and its total runout value is ≤1μm. The relationship between the measured runout value and the inclination angle of the lip edge surface is:

[0036] Where d is the stem diameter, l is the distance from the far end of the stem to the ideal lip edge, a is the inclination angle of the actual lip edge, and n is the measured runout value. The relationship between the lip edge diameter D and the verticality m is:

[0037] m = D·tan(a).

[0038] The flatness of the lip edge surface of the hemispherical resonator 1 and the upper end surface of the tooling table 2 are better than 0.5 μm, and the roughness level is at least level 8.

[0039] The measuring needle axis of the comparator 3 and the upper end surface of the tooling table 2 have micron-level parallelism, and the distance difference between the two pins 4 and the measuring needle axis of the comparator 3 should be within 0.005 mm.

[0040] The probe of comparator 3 adopts a cylindrical flat head made of ruby ​​to ensure the measurement accuracy. Comparator 3 adopts a torsion spring comparator or an inductance comparator, and the measurement accuracy is better than 0.5μm.

[0041] In the application scenario, considering that the actual lip edge inclination angle a is very small (a°<<5°), in order to minimize the impact, tan(a) is approximated as sin(a).

[0042]

[0043] It can be deduced that,

[0044]

[0045] At the same time, for the verticality m, there is the following relationship:

[0046] m=D·tan(a) (4)

[0047] Therefore, by combining Formula 3 and Formula 4, the relationship between the measured runout value n and the verticality m can be deduced, as shown in Formula 5.

[0048]

[0049] The present invention utilizes the good coaxiality between the handle and the lip of the hemispherical resonator and the structural characteristics of the quasi-step shaft, and uses the lip surface as the positioning reference surface of the hemispherical resonator to limit its axial displacement and rotation around the horizontal axis. At the same time, the adjacent outer circle of the lip is used to limit its radial displacement, so that the hemispherical resonator can only rotate around its axis, and then the circular runout of the far end of the handle can be measured by a high-precision comparator. Since the circular runout of the far end of the handle can directly reflect the change in its distance relative to the outer cylindrical surface of the lip, and the cylindrical structure of the lip can ensure that the measured circular runout value is not affected by the spherical structure and generates errors, the measured circular runout can be used as a basis for evaluating the verticality of the handle and the lip surface. That is, according to the definition of verticality, the deviation of the far end of the structure (handle) is converted into the runout value of the reference circle when rotating around the axis of the workpiece (hemispherical resonator) with the trimmed surface (lip surface) as the reference.

[0050] The present invention utilizes the circular runout of the distal end of the handle (the small shaft of the step shaft) to reflect its perpendicularity to the lip edge surface (the adjacent end surface of the small shaft of the step shaft). The measurement method is convenient and fast, which not only solves the difficulties caused by clamping and positioning when using a three-coordinate measuring instrument, but also greatly shortens the measurement time (using the present invention to measure a single hemispherical resonator only takes 0.5 to 1 minute);

[0051] The measuring device of the present invention is exquisite, simple, occupies little space and has low cost, and provides theoretical and practical support for real-time measurement and inspection during the research and development of the lip edge of the hemispherical resonator.

[0052] Although the present invention has been disclosed as above in the form of a preferred embodiment, it is not intended to limit the present invention. Any person skilled in the art may make possible changes and modifications to the technical solution of the present invention by using the methods and technical contents disclosed above without departing from the spirit and scope of the present invention. Therefore, any simple modifications, equivalent changes and modifications made to the above embodiments based on the technical essence of the present invention without departing from the content of the technical solution of the present invention shall fall within the protection scope of the technical solution of the present invention.

Claims

1. A device for quickly measuring the verticality between the lip edge of a hemispherical resonator and the handle, characterized in that: Includes hemispherical resonator, workbench, comparator and pins, The hemispherical resonator comprises a handle and a hemispherical body, one end of the handle is fixedly connected to the hemispherical body, and the handle is located at the center of the hemispherical body; the end surface of the hemispherical body is a lip edge; The tooling table is a cylindrical table, and a cylindrical hole is opened at the center axis position of the cylindrical table; a probe hole is opened on the side wall of the cylindrical table, and the probe hole is connected with the cylindrical hole, and the probe of the comparator can be inserted into the probe hole; the handle of the hemispherical resonator is placed in the cylindrical hole, and the lip edge is tightly fitted with the upper end surface of the tooling table; the pin is located on the tooling table, and is used to limit the position relationship between the hemispherical resonator and the comparator; The hemispherical resonator has a lip edge of a cylindrical structure, and its total runout value is ≤1μm; The flatness of the lip edge of the hemispherical resonator and the upper end surface of the workbench are better than 0.5μm, and the roughness level is at least level 8; The coating material is TiN with a thickness of 2 to 3 μm; There are two pins with micrometer-level cylindricity; The comparator's probe axis and the upper end surface of the workbench have micron-level parallelism, and the distance difference between the two pins relative to the comparator's probe axis should be within 0.005mm; During measurement, the hemispherical resonator is rotated and the maximum and minimum values ​​are read out through a comparator. The greater the difference between the maximum and minimum values, the worse the verticality between the handle of the hemispherical resonator and the lip edge, and vice versa. The relationship between the measured runout value and the inclination angle of the lip edge surface is: Where, d is the diameter of the stem, l is the distance between the distal end of the stem and the ideal lip edge surface, a is the inclination angle of the actual lip edge surface, and n is the measured runout value; The relationship between the lip diameter D and the verticality m is: m = D·tan(a).

2. A device for quickly measuring the perpendicularity between the lip surface of a hemispherical resonator and the handle according to claim 1, characterized in that: The upper end surface and pins of the workbench are plated with wear-resistant coating.

3. The device for quickly measuring the perpendicularity between the lip surface and the handle of a hemispherical resonator according to claim 1 is characterized in that: The adjacent outer circle of the lip of the hemispherical resonator is close to the outer cylindrical surface of the pin on the fixture table. At the same time, the position of the comparator can ensure that there is a sufficient reading interval during measurement.

Images