Chip testing device

Abstract

The present invention belongs to the field of chip testing technology, and discloses a chip testing device. The chip testing device includes a test seat, a pressure cover, a pressure head mechanism and a cleaning mechanism. The test seat has a clamping groove, and the clamping groove is used to install the tested chip; the pressure cover is rotatably connected to the test seat; the pressure head mechanism is rotatably arranged on the pressure cover, and the pressure head mechanism can abut against the top surface of the tested chip. The pressure head mechanism is rotated, and the pressure head mechanism can squeeze the tested chip so that the probe on the test seat pierces the solder ball on the tested chip; the cleaning mechanism is arranged on the test seat, and the cleaning mechanism can clean the probe. The chip testing device provided by the present invention is provided with a cleaning mechanism, and the cleaning mechanism cleans the probe to prevent excessive tin slag from adhering to the probe, making the impedance of the probe too large, thereby improving the test stability.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing, and in particular to a chip testing device. Background Art

[0002] With the rapid development of 5G and big data, the frequency and speed of chip operation are getting higher and higher, and the requirements for data stability during chip testing are getting higher and higher.

[0003] When testing BGA products, because the pins of BGA packaged chip products are tin balls, the material of the tin balls is relatively soft. After the probe pierces the tin balls for power-on test, the tin balls are destroyed and some tin slag will stick to the tip of the probe. The impedance of tin material is relatively high. The more tin slag sticks, the greater the impedance change of the probe will be, which will cause the test data of the chip to be unstable, so regular cleaning of the needle tip is very important. Summary of the invention

[0004] The object of the present invention is to provide a chip testing device, aiming to improve the testing stability of the chip testing device on the tested chip.

[0005] To achieve this object, the present invention adopts the following technical solutions:

[0006] A chip testing device, comprising:

[0007] A test socket having a fixing slot, wherein the fixing slot is used to install the chip to be tested;

[0008] A gland, rotatably connected to the test seat;

[0009] A pressure head mechanism is rotatably disposed on the pressure cover, the pressure head mechanism can abut against the top surface of the chip under test, and the pressure head mechanism can be rotated to squeeze the chip under test so that the probe on the test seat pierces the solder ball on the chip under test;

[0010] A cleaning mechanism is arranged on the test seat, and the cleaning mechanism can clean the probe.

[0011] Optionally, a protective bottom plate is provided at the bottom of the test socket.

[0012] Optionally, the pressure cover includes a fixed frame and a cover plate rotatably connected to the fixed frame, the fixed frame is arranged on the test seat, and the pressure head mechanism is rotatably arranged on the cover plate.

[0013] Optionally, the cleaning mechanism comprises a power assembly and a cleaning assembly, and the power assembly can drive the cleaning assembly to move in a direction perpendicular to the axial direction of the probe.

[0014] Optionally, the power assembly includes a driving member and a transmission strip which are transmission-connected to each other, and the cleaning assembly is fixedly connected to the transmission strip.

[0015] Optionally, the driving member is a motor.

[0016] Optionally, the cleaning assembly includes a brush rod and bristles arranged on the brush rod, and the brush rod is connected to the conveying rubber strip.

[0017] Optionally, the power assembly includes two floating buttons and two transmission rubber strips with shifting teeth, the two floating buttons are slidably arranged at one end of the test seat, the cleaning assembly is selectively arranged at the other end of the test seat, the two transmission rubber strips are respectively arranged on the two inner sides of the test seat, the pressure head mechanism can push the floating buttons to move downward to press the shifting teeth, the shifting teeth can drive the transmission rubber strips to move, and the shifting teeth can trigger the cleaning assembly to enable the cleaning assembly to clean the probe.

[0018] Optionally, an elastic member is connected between the picking teeth and the cleaning assembly.

[0019] Optionally, the shifting teeth include a first shifting tooth, a second shifting tooth and a plurality of third shifting teeth, the first shifting teeth and the second shifting teeth are respectively arranged at the two ends of the conveying rubber strip, and the plurality of third shifting teeth are evenly arranged on the conveying rubber strip, one end of the elastic member is connected to the first shifting tooth, and the other end of the elastic member is arranged on the cleaning assembly, and the cleaning assembly can abut against the test seat.

[0020] Beneficial effects of the present invention: When the chip testing device provided by the present invention tests the chip to be tested, the probe on the test socket pierces the solder ball on the chip to be tested, and part of the solder slag will stick to the needle tip of the probe. By setting a cleaning mechanism, the cleaning mechanism cleans the probe to prevent excessive solder slag from sticking to the probe and making the impedance of the probe too large, thereby improving the test stability. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 is a schematic structural diagram of a chip testing device provided in Embodiment 1 of the present invention;

[0022] Figure 2 is a schematic structural diagram of a cleaning mechanism provided in Embodiment 1 of the present invention;

[0023] Figure 3 is a schematic structural diagram of a cleaning mechanism at a viewing angle provided by the second embodiment of the present invention;

[0024] Figure 4 yes Figure 3 A partial enlarged view of the middle A;

[0025] Figure 5 is a schematic structural diagram of a cleaning mechanism from another perspective provided by the second embodiment of the present invention;

[0026] Figure 6 yes Figure 5 A partial enlarged view of point B in the middle;

[0027] Figure 7 It is a structural schematic diagram of the cleaning mechanism provided in another perspective according to the second embodiment of the present invention.

[0028] In the figure:

[0029] 100. chip testing device; 200. chip to be tested;

[0030] 1. Test socket; 2. Pressure cover; 21. Fixed frame; 22. Cover plate; 3. Pressure head mechanism; 31. Knob; 32. Pressure head; 4. Cleaning mechanism; 41. Power assembly; 411. Driving member; 412. Transmission rubber strip; 413. Driving rod; 4131. Ratchet part; 414. Floating button; 4151. First gear; 4152. Second gear; 4153. Third gear; 416. Elastic member; 42. Cleaning assembly; 421. Brush rod; 422. Bristles; 5. Protective bottom plate; 6. Probe; 7. Support column; 8. Support plate. DETAILED DESCRIPTION

[0031] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the present invention, rather than to limit the present invention. It should also be noted that, for ease of description, only parts related to the present invention, rather than all structures, are shown in the accompanying drawings.

[0032] In the description of the present invention, unless otherwise clearly specified and limited, the terms "connected", "connected", and "fixed" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0033] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may include that the first and second features are in direct contact, or may include that the first and second features are not in direct contact but are in contact through another feature between them. Moreover, a first feature being "above", "above" and "above" a second feature includes that the first feature is directly above and obliquely above the second feature, or simply indicates that the first feature is higher in level than the second feature. A first feature being "below", "below" and "below" a second feature includes that the first feature is directly below and obliquely below the second feature, or simply indicates that the first feature is lower in level than the second feature.

[0034] In the description of this embodiment, the terms "upper", "lower", "right", etc., directions or positional relationships are based on the directions or positional relationships shown in the drawings, and are only for the convenience of description and simplification of operation, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are only used to distinguish in the description and have no special meaning.

[0035] Embodiment 1

[0036] like Figure 1 As shown, this embodiment provides a chip testing device 100 , which is used to clean the probes 6 in the chip testing device 100 .

[0037] The chip testing device 100 includes a test seat 1, a pressure cover 2, a pressure head mechanism 3 and a cleaning mechanism 4. The test seat 1 has a fixing groove, which is used to install the tested chip 200; the pressure cover 2 is rotatably connected to the test seat 1; the pressure head mechanism 3 is rotatably arranged on the pressure cover 2, and the pressure head mechanism 3 can abut against the top surface of the tested chip 200. The pressure head mechanism 3 is rotated and can squeeze the tested chip 200 so that the probe 6 on the test seat 1 pierces the solder ball on the tested chip 200; the cleaning mechanism 4 is arranged on the test seat 1, and the cleaning mechanism 4 can clean the probe 6.

[0038] The chip testing device 100 provided by the present invention, when testing the tested chip 200, the probe 6 on the test socket 1 pierces the solder ball on the tested chip 200, and part of the solder slag will adhere to the needle tip of the probe 6. By setting a cleaning mechanism 4, the cleaning mechanism 4 cleans the probe 6 to prevent excessive solder slag from adhering to the probe 6 and making the impedance of the probe 6 too large, thereby improving the test stability.

[0039] In this embodiment, if Figure 2As shown, the cleaning mechanism 4 includes a power assembly 41 and a cleaning assembly 42. The power assembly 41 can drive the cleaning assembly 42 to move in a direction perpendicular to the axial direction of the probe 6. The test seat 1 is often provided with a plurality of parallel probes 6. When cleaning the probes 6, the cleaning assembly 42 moves in a direction perpendicular to the axial direction of the probes 6 to ensure the cleaning effect of the needles of the probes 6 and improve the cleaning efficiency.

[0040] Furthermore, the power assembly 41 includes a driving member 411 and a transmission rubber strip 412 which are connected to each other in a transmission manner, and the cleaning assembly 42 is fixedly connected to the transmission rubber strip 412. When cleaning the probe 6, the driving member 411 drives the transmission rubber strip 412 to move, and the movement of the transmission rubber strip 412 drives the cleaning assembly 42 to move, and the cleaning assembly 42 cleans the probe 6.

[0041] Specifically, a driving rod 413 is provided at the output end of the driving member 411, and a ratchet portion 4131 is provided on the outer peripheral surface of the driving rod 413. One end of the transmission rubber strip 412 is sleeved on the ratchet portion 4131, and the other end of the transmission rubber strip 412 is slidably sleeved on the test seat 1. The ratchet portion 4131 can increase the friction between the driving rod 413 and the transmission rubber strip 412, thereby improving the transmission stability of the transmission rubber strip 412. In this embodiment, the driving member 411 is a motor.

[0042] Optionally, the cleaning assembly 42 includes a brush rod 421 and bristles 422 disposed on the brush rod 421, and the brush rod 421 is connected to the transmission rubber strip 412. When the transmission rubber strip 412 moves, the brush rod 421 is driven to move, and the bristles 422 on the brush rod 421 clean the probe 6.

[0043] During actual installation, a plurality of probes 6 are often arranged in a matrix on the test seat 1, and two transmission rubber strips 412 are respectively arranged in parallel on the two inner side surfaces of the test seat 1, and two ratchet parts 4131 are provided on the driving rod 413. One ends of the two transmission rubber strips 412 are respectively sleeved on the two ratchet parts 4131, and the other ends of the two transmission rubber strips 412 can be rotatably sleeved on the corresponding inner side surfaces, and the two ends of the brush rod 421 are respectively connected to the two transmission rubber strips 412 to improve the movement stability of the brush rod 421.

[0044] Exemplarily, an extension rod is provided on the inner side of the test seat 1 , and the other end of the transmission rubber strip 412 can be rotatably sleeved on the extension rod, so as to facilitate the installation of the transmission rubber strip 412 .

[0045] Optionally, a protective base plate 5 is provided at the bottom of the test socket 1 , and the protective base plate 5 can improve the stability of the test socket 1 .

[0046] Optionally, the pressure cover 2 includes a fixed frame 21 and a cover plate 22 rotatably connected to the fixed frame 21, the fixed frame 21 is arranged on the test seat 1, and the pressure head mechanism 3 is rotatably arranged on the cover plate 22. The cover plate 22 is connected to the test seat 1 through the fixed frame 21, and the installation is simple.

[0047] Preferably, the pressure cover 2 is detachably connected to the test socket 1. This arrangement facilitates disassembly and assembly.

[0048] In this embodiment, the pressure head mechanism 3 includes a knob 31 and a pressure head 32. The knob 31 is rotatably disposed on the pressure cover 2, and the pressure head 32 is disposed at the bottom of the knob 31 and can abut against the chip under test 200. By rotating the knob 31, the knob 31 can drive the pressure head 32 to move toward the chip under test 200, which is convenient to operate.

[0049] Furthermore, the pressure head mechanism 3 also includes an elastic body, which is arranged between the knob 31 and the pressure head 32, and the two ends of the elastic body are respectively abutted against the knob 31 and the pressure head 32. By providing the elastic body, the impact force of the pressure head 32 on the tested chip 200 can be effectively buffered. Exemplarily, the elastic body can be a spring.

[0050] Embodiment 2

[0051] This embodiment provides another chip testing device 100, and the basic structure of the chip testing device 100 provided in this embodiment is the same as that of the first embodiment, and only some structures are different. This embodiment only describes the structures different from the first embodiment.

[0052] like Figure 3-Figure 7 As shown, in this embodiment, the power assembly 41 includes two floating buttons 414 and two transmission rubber strips 412 with teeth, the two floating buttons 414 are slidably arranged at one end of the test seat 1, the cleaning assembly 42 is selectively arranged at the other end of the test seat 1, and the two transmission rubber strips 412 are respectively arranged on the two inner sides of the test seat 1, and the pressure head mechanism 3 can push the floating button 414 to move downward to press the teeth, the teeth can drive the transmission rubber strip 412 to move, and the teeth can touch the cleaning assembly 42 so that the cleaning assembly 42 cleans the probe 6. When the pressure head mechanism 3 squeezes the chip 200 under test, it will press the floating button 414 at the same time, and the floating button 414 will press the teeth on the transmission rubber strip 412 during the downward movement, and the structure is simple.

[0053] Furthermore, an elastic member 416 is connected between the shifting teeth and the cleaning assembly 42 , and the elastic member 416 drives the cleaning assembly 42 to move, so that the cleaning assembly 42 cleans the probe 6 .

[0054] Specifically, the shifting teeth include a first shifting tooth 4151, a second shifting tooth 4152 and a plurality of third shifting teeth 4153. The first shifting tooth 4151 and the second shifting tooth 4152 are respectively arranged at the two ends of the transmission rubber strip 412, and the plurality of third shifting teeth 4153 are evenly arranged on the transmission rubber strip 412. One end of the elastic member 416 is connected to the first shifting tooth 4151, and the other end of the elastic member 416 is arranged on the cleaning assembly 42. The cleaning assembly 42 can abut against the test seat 1. When in use, each pair of tested chips 200 is tested once, the pressure head 32 presses the floating button 414, and the floating button 414 presses a third tooth 4153 to drive the transmission rubber strip 412 to move. At the same time, the transmission rubber strip 412 drives the first tooth 4151 to move, so that the first tooth 4151 is away from the cleaning component 42, and the first tooth 4151 drives the elastic member 416 to move to stretch the elastic member 416. When the second tooth 4152 moves to the cleaning component 42, the second tooth 4152 can push the cleaning component 42 to make the cleaning component 42 separate from the test seat 1. Under the action of the stretching force, the cleaning component 42 quickly swings to one end close to the first tooth 4151 to complete the cleaning process of the probe 6. When the pressure head mechanism 3 squeezes the tested chip 200 again, the tested chip 200 can abut against the test seat 1.

[0055] In this embodiment, the third shifting tooth 4153 is a wedge-shaped shifting tooth, and the wedge-shaped surface of the wedge-shaped shifting tooth cooperates with the floating button 414 to ensure that the transmission rubber strip 412 rotates in one direction.

[0056] Furthermore, the second tooth 4152 is a long tooth. When the second tooth 4152 moves to contact the cleaning assembly 42 , the second tooth 4152 can push the cleaning assembly 42 to detach from the test seat 1 .

[0057] Specifically, the floating button 414 includes a pressing rod and an abutting portion provided at one end of the pressing rod, the abutting portion abuts against the upper surface of the test seat 1, the pressing rod is slidably arranged on the test seat 1, and an elastic member 416 is sleeved on the pressing rod, and one end of the elastic member 416 is connected to the abutting portion. The elastic member 416 can buffer the impact force of the pressure head 32 on the floating button 414, and improve the reliability of pressing the floating button 414.

[0058] Specifically, two support columns 7 are respectively provided on the two inner sides of the test seat 1, and the two ends of the transmission rubber strip 412 are respectively sleeved on the two support columns 7. The ends of the support columns 7 are provided with a slot, and the end of the cleaning component 42 can be inserted into the slot. When the second tooth 4152 moves to contact the cleaning component 42, the second tooth 4152 can push the cleaning component 42 to disengage from the slot. This arrangement improves the stability of the cleaning component 42 abutting.

[0059] Optionally, a support plate 8 is provided between the two support columns 7 to improve the force stability of the support columns 7 .

[0060] Obviously, the above embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention. For those skilled in the art, various obvious changes, readjustments and substitutions can be made without departing from the protection scope of the present invention. It is not necessary and impossible to list all the embodiments here. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the claims of the present invention.

Claims

1. A chip testing device, characterized in that: include: A test socket (1) having a fixing groove, wherein the fixing groove is used to install a chip to be tested (200); A gland (2) rotatably connected to the test seat (1); A pressing head mechanism (3) is rotatably disposed on the pressing cover (2), the pressing head mechanism (3) can abut against the top surface of the chip under test (200), and the pressing head mechanism (3) can be rotated to press the chip under test (200) so that the probe (6) on the test seat (1) pierces the solder ball on the chip under test (200); A cleaning mechanism (4) is disposed on the test seat (1), and the cleaning mechanism (4) can clean the probe (6); The cleaning mechanism (4) comprises a power component (41) and a cleaning component (42), wherein the power component (41) can drive the cleaning component (42) to move in a direction perpendicular to the axial direction of the probe (6); The power assembly (41) comprises two floating buttons (414) and two transmission rubber strips (412) with shifting teeth, the two floating buttons (414) are slidably arranged at one end of the test seat (1), the cleaning assembly (42) is selectively arranged at the other end of the test seat (1), and the two transmission rubber strips (412) are respectively arranged on two inner side surfaces of the test seat (1); An elastic member (416) is connected between the picking teeth and the cleaning assembly (42); The teeth include a first tooth (4151), a second tooth (4152) and a plurality of third teeth (4153); the first tooth (4151) and the second tooth (4152) are respectively arranged at two ends of the transmission rubber strip (412); the plurality of third teeth (4153) are evenly arranged on the transmission rubber strip (412); one end of the elastic member (416) is connected to the first tooth (4151); the other end of the elastic member (416) is arranged on the cleaning assembly (42); and the cleaning assembly (42) can abut against the test seat (1); The pressing head mechanism (3) pushes the floating button (414) to move downward to press one of the third teeth (4153), thereby driving the transmission rubber strip (412) to move. The transmission rubber strip (412) drives the first tooth (4151) away from the cleaning component (42). The first tooth (4151) drives the elastic member (416) to move to stretch the elastic member (416). When the second tooth (4152) moves to the cleaning component (42), it pushes the cleaning component (42) to separate from the test seat (1). Under the action of the stretching force of the elastic member (416), the cleaning component (42) quickly swings to an end close to the first tooth (4151) to clean the probe (6).

2. The chip testing device according to claim 1, characterized in that: A protective bottom plate (5) is provided at the bottom of the test seat (1).

3. The chip testing device according to claim 1, characterized in that: The pressure cover (2) comprises a fixed frame (21) and a cover plate (22) rotatably connected to the fixed frame (21); the fixed frame (21) is arranged on the test seat (1); and the pressure head mechanism (3) is rotatably arranged on the cover plate (22).

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