Method, system, device and medium for avalanche photodiode voltage regulation

Abstract

The application provides an avalanche photodiode voltage adjustment method, system, device and medium, the method comprising: setting the bias voltage of the APD to a first voltage satisfying a first gain; taking the first voltage as a current voltage, and repeatedly executing the following debugging operation: obtaining a first RSSI ADC value under the current voltage; setting the bias voltage of the APD to a candidate voltage, and obtaining a second RSSI ADC value under the candidate voltage; determining a current gain according to the first RSSI ADC value and the second RSSI ADC value; judging whether the difference between the current gain and a target gain is less than a preset difference value; if not, updating the current voltage based on the candidate voltage, the current gain and the target gain to obtain a new current voltage; if yes, stopping the debugging operation, and determining the candidate voltage corresponding to the stopping of the debugging operation as a target bias voltage. The method improves the adjustment efficiency and accuracy of the bias voltage.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of data governance, and in particular to an avalanche photodiode voltage adjustment method, system, device and medium. BACKGROUND

[0002] As an important component in optical fiber communication, an optical module is an optoelectronic device that realizes the functions of photoelectric conversion and electro-optical conversion in the process of optical signal transmission. An APD (Avalanche Photon Diode) is a photovoltaic device that uses the avalanche multiplication effect of carriers to amplify the photoelectric signal. In the field of optical module production, rapid and accurate adjustment of the APD bias voltage has always been a focus.

[0003] The method currently widely used in the industry for adjusting the APD bias voltage is to test the breakdown voltage Vbr of the APD at the OSA (Optical Subassembly) device stage, and to obtain the APD voltage using Vbr-X at the module stage. However, this testing method has low efficiency and accuracy in adjusting the APD bias voltage, which seriously affects the production efficiency. SUMMARY

[0004] Therefore, the purpose of the present application is to provide an avalanche photodiode voltage adjustment method, system, device and medium. The method starts with a first gain and continuously adjusts the bias voltage (including the current voltage and the candidate voltage) of the APD to quickly reach the optimal target gain, quickly iterate the bias voltage adjustment process, and improve the adjustment efficiency and accuracy of the bias voltage.

[0005] In a first aspect, the present application provides an avalanche photodiode voltage adjustment method, which comprises:

[0006] setting the bias voltage of an avalanche photodiode APD to a first voltage that satisfies a preset first gain;

[0007] setting the first voltage as a current voltage, and repeatedly performing the following adjustment operation until the adjustment operation stops when a preset iteration stop rule is met:

[0008] obtaining a first RSSI ADC value under the current voltage; setting the bias voltage of the APD to a candidate voltage different from the current voltage, and obtaining a second RSSI ADC value under the candidate voltage; determining a current gain according to the first RSSI ADC value and the second RSSI ADC value; and determining whether the difference between the current gain and a preset target gain is less than a preset difference value;

[0009] If no, updating the current voltage based on the candidate voltage, the current gain and the target gain to obtain a new current voltage;

[0010] If yes, determining that a preset iteration stopping rule is satisfied, stopping the debugging operation, and determining the candidate voltage corresponding to the stopping of the debugging operation as the target bias voltage.

[0011] In an embodiment, the updating of the current voltage based on the candidate voltage, the current gain and the target gain to obtain a new current voltage comprises:

[0012] updating the current voltage according to a preset iteration formula and the candidate voltage, the current gain and the target gain to obtain a new current voltage.

[0013] In an embodiment, the iteration formula comprises:

[0014]

[0015] wherein Vt represents the new current voltage, Vc represents the candidate voltage, Mc represents the current gain, Mt represents the target gain, and n is a preset constant.

[0016] In an embodiment, the determining of the current gain according to the first RSSI ADC value and the second RSSI ADC value comprises:

[0017] determining a ratio between the second RSSI ADC value and the first RSSI ADC value as the current gain.

[0018] In an embodiment, the obtaining of the first RSSI ADC value under the current voltage comprises:

[0019] converting the current voltage into a voltage analog signal;

[0020] measuring a received signal strength indication of the voltage analog signal to obtain a first RSSI ADC value.

[0021] In an embodiment, the method further comprises:

[0022] before setting the bias voltage of the APD as the first voltage, setting an optical signal of a receiving end of an optical module.

[0023] In an embodiment, the first RSSI ADC value and the second RSSI ADC value correspond to the same optical signal.

[0024] In a second aspect, an embodiment of the present application provides an avalanche photodiode voltage adjustment system, the system comprising:

[0025] a voltage setting module configured to set a bias voltage of an avalanche photodiode (APD) to a first voltage satisfying a preset first gain;

[0026] an operation repeating execution module configured to take the first voltage as a current voltage, and repeatedly execute the following debugging operation until the debugging operation stops when a preset iteration stopping rule is satisfied:

[0027] obtain a first RSSI ADC value under the current voltage; set the bias voltage of the APD to a candidate voltage different from the current voltage, and obtain a second RSSI ADC value under the candidate voltage; determine a current gain according to the first RSSI ADC value and the second RSSI ADC value; and determine whether a difference between the current gain and a preset target gain is less than a preset difference value;

[0028] a voltage updating module configured to, in a case where the difference between the current gain and the preset target gain is not less than the preset difference value, update the current voltage based on the candidate voltage, the current gain and the target gain to obtain a new current voltage;

[0029] a voltage determination module configured to, in a case where the difference between the current gain and the preset target gain is less than the preset difference value, determine that the preset iteration stopping rule is satisfied, stop the debugging operation, and determine the candidate voltage corresponding to the stopping of the debugging operation as a target bias voltage.

[0030] In a third aspect, an embodiment of the present application further provides an electronic device comprising a processor and a memory, the memory storing computer executable instructions capable of being executed by the processor, and the processor executes the computer executable instructions to implement the steps of the avalanche photodiode voltage adjustment method provided in the first aspect.

[0031] In a fourth aspect, an embodiment of the present application further provides a storage medium storing computer executable instructions, and the computer executable instructions, when invoked and executed by a processor, cause the processor to implement the steps of the avalanche photodiode voltage adjustment method provided in the first aspect.

[0032] The method for adjusting the voltage of an avalanche photodiode provided by the embodiment of the application first sets the bias voltage of the APD as a first voltage satisfying a preset first gain; then takes the first voltage as a current voltage, and repeatedly executes the following debugging operation: obtaining a first RSSI ADC value under the current voltage; setting the bias voltage of the APD as a candidate voltage different from the current voltage, and obtaining a second RSSI ADC value under the candidate voltage; determining a current gain according to the first RSSI ADC value and the second RSSI ADC value; judging whether the difference between the current gain and a preset target gain is less than a preset difference value; if not, updating the current voltage based on the candidate voltage, the current gain and the target gain to obtain a new current voltage; and if yes, determining that a preset iteration stop rule is satisfied, stopping the debugging operation, and determining the candidate voltage corresponding to the stop of the debugging operation as a target bias voltage.

[0033] The current voltage in the debugging operation of the above embodiment is updated based on the candidate voltage, the current gain and the target gain, so that the change of the new current voltage is more accurate than that of the current voltage in the previous round, and the use of the current voltage with higher accuracy can effectively reduce the debugging times; meanwhile, the updated current voltage and the candidate voltage different from the current voltage are set as the adjustment mode of the bias voltage, which is simple and fast, and can improve the adjustment efficiency. In the process of repeatedly executing the debugging operation, the bias voltage (including the current voltage and the candidate voltage) of the APD is continuously adjusted from the first gain as the starting point, so that the current gain quickly reaches the optimal target gain, and the debugging process of the bias voltage is quickly iterated. Therefore, the above scheme can improve the debugging efficiency and accuracy of the bias voltage.

[0034] Other features and advantages of the present application will be set forth in the following description, and in part will become apparent to those skilled in the art from the description, or can be learned by practice of the present application. The objects and other advantages of the present application will be realized and achieved by the structure particularly pointed out in the description, claims and drawings.

[0035] In order to make the above-mentioned objects, features and advantages of the present application more apparent, the following preferred embodiments are specifically described with reference to the accompanying drawings. BRIEF DESCRIPTION OF DRAWINGS

[0036] In order to more clearly illustrate the specific embodiments of the present application or the technical solutions in the prior art, the following will briefly introduce the drawings needed to be used in the specific embodiments or prior art description. Obviously, the drawings in the following description are some embodiments of the present application, and those skilled in the art can also obtain other drawings according to these drawings without any creative effort.

[0037] Figure 1 A flow chart of an avalanche photodiode voltage adjustment method provided for an embodiment of the present application is shown in FIG. 1.

[0038] Figure 2 A flow chart of another avalanche photodiode voltage adjustment method provided for an embodiment of the present application is shown in FIG. 2.

[0039] Figure 3 A structural schematic diagram of an avalanche photodiode voltage adjustment system provided for an embodiment of the present application is shown in FIG. 3.

[0040] Figure 4 A structural schematic diagram of an electronic device provided for an embodiment of the present application is shown in FIG. 4.

[0041] Icon:

[0042] 301-voltage setting module; 302-operation repeat execution module; 303-voltage update module; 304-voltage determination module;

[0043] 401-processor; 402-memory; 403-bus; 404-communication interface. DETAILED DESCRIPTION

[0044] In order to make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the technical scheme of the present application will be described clearly and completely below in conjunction with embodiments. Obviously, the described embodiments are some of the embodiments of the present application, but not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the present application.

[0045] As an important component in optical fiber communication, an optical module is an optoelectronic device for realizing the functions of photoelectric conversion and electro-optical conversion in the process of optical signal transmission. The optical module converts electrical signals into optical signals at the sending end, and converts optical signals into electrical signals at the receiving end.

[0046] An APD is a photovoltaic device that amplifies photoelectric signals using the avalanche multiplication effect of carriers, and is suitable for long-distance transmission and high-speed communication systems with high sensitivity requirements. When working, the reverse bias voltage is increased to adjust the photoelectric conversion efficiency, so as to realize a smaller bit error rate under a larger gain. In the field of optical module production, fast and accurate adjustment of the APD bias voltage has always been the focus of debugging algorithm optimization.

[0047] The method for debugging the APD bias voltage currently widely used in the industry is that, in the OSA device stage, the breakdown voltage Vbr of the APD can be tested, and the APD bias voltage is obtained by using Vbr-X in the module stage. The specific testing method is that, in the absence of light, the bias voltage Vapd is adjusted, and the dark current is tested, and when the dark current is about 10 uA, the APD bias voltage at this time is the breakdown voltage of the APD. However, in this method, the consistency of the device leads to differences in X of each device, and the differences in the module end packaging, which leads to poor accuracy of the calculated bias voltage, and often requires multiple adjustments to meet the requirement of the bit error rate, affecting the production efficiency.

[0048] Based on the relationship that the bit error rate decreases first and then increases rapidly with the increase of the APD bias voltage, the widely used debugging method at the module end is to gradually increase the bias voltage to find the minimum bit error rate inflection point. The precision and efficiency of this method are affected by the step of the bias voltage change. When the step is large, the debugging efficiency is high, but the precision deviation is large, and it is easy to not meet the requirement of the bit error rate; when the step is small, the debugging precision is high, and the increase in the number of debugging times affects the production efficiency.

[0049] Based on this, the present application provides an avalanche photodiode voltage adjustment method, system, device and medium, which starts from a first gain in the process of repeatedly performing the debugging operation, and continuously adjusts the bias voltage (including the current voltage and the candidate voltage) of the APD, so that the current gain quickly reaches the optimal target gain, and the debugging process of the bias voltage is quickly iterated, thereby improving the debugging efficiency and accuracy of the bias voltage.

[0050] In order to facilitate the understanding of the present embodiment, first, a kind of avalanche photodiode voltage adjustment method disclosed in the present application embodiment is introduced in detail, as shown in Figure 1 The method comprises:

[0051] Step S101, the bias voltage of the APD is set to a first voltage satisfying a preset first gain.

[0052] Generally, the gain of the APD is represented by a multiplication factor M; the first gain is, for example, the gain of M=1. In the present embodiment, the bias voltage of the APD can be set to the first voltage capable of making the gain M=1.

[0053] When the APD is working, the bias voltage needs to be adjusted multiple times to adjust the photoelectric conversion efficiency, until the gain approaches the preset target gain, to achieve the optimal gain. Based on this, the first voltage is taken as the current voltage, and the following steps S102 to S105 shown in the debugging operation is repeatedly performed until the debugging operation meets the preset iteration stopping rule:

[0054] Step S102, acquiring a first RSSI ADC value at the current voltage.

[0055] The embodiment can include reading a sampling value of RSSI (Received Signal Strength Indication) ADC (Analog-to-Digital Converter) of the current voltage, performing DAC (Digital to Analog Converter) conversion on the read sampling value, and obtaining a first RSSI ADC value.

[0056] Step S103, setting the bias voltage of the APD to a candidate voltage different from the current voltage, and acquiring a second RSSI ADC value at the candidate voltage.

[0057] In the embodiment, the bias voltage of the APD can be set to a candidate voltage that does not satisfy the first gain, that is, the candidate voltage is a bias voltage of an arbitrary gain M≠1. Referring to step S102, the second RSSI ADC value at the candidate voltage is acquired.

[0058] Step S104, determining the current gain according to the first RSSI ADC value and the second RSSI ADC value. In implementation, the ratio between the second RSSI ADC value and the first RSSI ADC value can be determined as the current gain. The current gain is the actual gain at the candidate voltage.

[0059] Step S105, determining whether the difference between the current gain and the preset target gain is less than a preset difference value. The smaller the preset difference value, the higher the precision of adjusting the bias voltage, and the larger the preset difference value, the higher the debugging efficiency; thus, the preset difference value can be determined according to actual needs. The target gain can be determined according to a chip manual.

[0060] In the embodiment, it is determined whether the difference between the current gain and the target gain is less than the preset difference value; if not, step S106 is performed. If yes, step S107 is performed.

[0061] Step S106, updating the current voltage based on the candidate voltage, the current gain and the target gain, to obtain a new current voltage.

[0062] If the difference between the current gain and the target gain is not less than the preset difference value, it indicates that the current gain is far from the optimal target gain, and the bias voltage of the APD needs to be further adjusted. In this case, the current voltage is updated based on the candidate voltage, the current gain and the target gain to obtain a new current voltage. Since the updating manner of the bias voltage in this embodiment is to update the new current voltage based on the previous current voltage and based on the candidate voltage, the current gain and the target gain, the new current voltage is more accurate.

[0063] After obtaining the new current voltage, the debugging operation shown in steps S102 to S105 is performed again based on the new current voltage. The specific execution process can refer to the above embodiment, which will not be described here.

[0064] In step S107, it is determined that the preset iteration stopping rule is met, the debugging operation is stopped, and the candidate voltage corresponding to the stopping of the debugging operation is determined as the target bias voltage.

[0065] According to the above embodiment, the debugging operation is repeatedly performed by updating the current voltage and the candidate voltage for multiple times, until the difference between the current gain and the target gain is less than the preset difference value, and it is determined that the preset iteration stopping rule is met. When the debugging operation meets the preset iteration stopping rule, it indicates that the current gain controlled according to the updated candidate voltage can approach the optimal target gain, and the current gain with a smaller bit error rate can be realized, which can meet the actual debugging requirements. In this case, the debugging operation is stopped. In addition, the updated candidate voltage corresponding to the stopping of the debugging operation is determined as the target bias voltage.

[0066] The above-described avalanche photodiode voltage adjustment method provided by the embodiment of the present application sets the bias voltage of the APD as a first voltage satisfying a preset first gain; sets the first voltage as a current voltage, and repeatedly performs the following debugging operation: obtaining a first RSSI ADC value under the current voltage; setting the bias voltage of the APD as a candidate voltage different from the current voltage, and obtaining a second RSSI ADC value under the candidate voltage; determining a current gain according to the first RSSI ADC value and the second RSSI ADC value; determining whether the difference between the current gain and a preset target gain is less than a preset difference value; if not, updating the current voltage based on the candidate voltage, the current gain and the target gain to obtain a new current voltage; and if yes, determining that the preset iteration stopping rule is met, stopping the debugging operation, and determining the candidate voltage corresponding to the stopping of the debugging operation as the target bias voltage.

[0067] In the above embodiment, the current voltage during the debugging operation is obtained based on updates to the candidate voltage, current gain, and target gain. Therefore, the new current voltage is more accurate than the change in the current voltage in the previous round, and using a more accurate current voltage can effectively reduce the number of debugging attempts. Simultaneously, updating the current voltage and setting a candidate voltage different from the current voltage is a simple and fast method for adjusting the bias voltage, improving adjustment efficiency. During the repeated debugging operation, starting from the first gain, the bias voltage of the APD (including the current voltage and candidate voltage) is continuously adjusted to quickly reach the optimal target gain, rapidly iterating and completing the bias voltage debugging process. Therefore, the above scheme can improve the debugging efficiency and accuracy of the bias voltage.

[0068] In one implementation, the optical signal at the receiving end of the optical module can be set before the bias voltage of the APD is set to a first voltage. Accordingly, this embodiment can provide a... Figure 2 The method for adjusting the voltage of the avalanche photodiode is shown below.

[0069] Step S201: Set the optical signal at the receiving end of the optical module.

[0070] Step S202: Set the bias voltage of the APD to a first voltage that satisfies the preset first gain.

[0071] Use the first voltage as the current voltage and repeat the following debugging operation until the debugging operation meets the preset iteration stop rule.

[0072] Step S203: Obtain the first RSSI ADC value under the current voltage.

[0073] In one specific embodiment, the current voltage can be converted into a voltage analog signal; specifically, the DAC conversion relationship between the bias voltage and the analog signal can be obtained through the chip datasheet and hardware circuit connection method, and based on the DAC conversion relationship, the current voltage can be converted into a voltage analog signal.

[0074] The received signal strength indication of the voltage analog signal is measured to obtain the first RSSI ADC value.

[0075] Step S204: Set the bias voltage of the APD to a candidate voltage different from the current voltage, and obtain the second RSSI ADC value under the candidate voltage. The method for obtaining the second RSSI ADC value can refer to the method for obtaining the first RSSI ADC value, and will not be described in detail here.

[0076] In this embodiment, the current voltage and the candidate voltage are set, corresponding to the same optical signal at the receiving end; correspondingly, the first RSSI ADC value and the second RSSI ADC value correspond to the same optical signal.

[0077] Step S205: The ratio between the second RSSI ADC value and the first RSSI ADC value is determined as the current gain. Specifically, the current gain Mc can be:

[0078] M c =RSSI ADC2 / RSSI ADC1 (1)

[0079] Where RSSI ADC2 represents the second RSSI ADC value, and RSSI ADCl represents the first RSSI ADC value.

[0080] Step S206: Determine whether the difference between the current gain and the preset target gain is less than the preset difference. If not, the bias voltage of the APD needs to be further adjusted, i.e., execute the following step S207; if yes, execute the following step S208.

[0081] Step S207: Update the current voltage according to the preset iterative formula, candidate voltage, current gain, and target gain to obtain a new current voltage.

[0082] The iterative formula in this embodiment can be referred to as formula (2) below:

[0083]

[0084] Where Vt represents the new current voltage, Vc represents the candidate voltage, Mc represents the current gain, Mt represents the target gain, and n is a preset constant. Specifically, n is a constant related to the material, device structure, and incident wavelength. For example, for silicon materials, n is about 1.5 to 4, and for chromium materials, n is generally 2.5 to 8.

[0085] Based on the new current voltage, repeat the debugging operations shown in steps S203-S206 above until the difference between the current gain and the preset target gain is less than the preset difference, then execute step S208.

[0086] Step S208: Determine that the preset iteration stop rule is met, stop the debugging operation, and determine the candidate voltage corresponding to the stop of the debugging operation as the target bias voltage.

[0087] By repeatedly performing the debugging operation until the difference between the current gain Mc and the target gain Mt is less than the preset difference, it can be considered that Mc≈Mt, and the preset iteration stopping rule is met. At this time, the debugging is successful, the debugging operation is stopped, and the updated candidate voltage corresponding to the time when the debugging operation stops is determined as the target bias voltage.

[0088] To facilitate understanding of the iterative formulas in the above embodiments, a method for obtaining the iterative formulas is provided below, referring to the following embodiments.

[0089] The basic structure of an APD is a PN junction operating under a bias voltage. The PN junction absorbs incident light and generates photocurrent. When the bias voltage is increased beyond a certain value, the reverse current surges, resulting in a multiple increase in photocurrent. This carrier multiplication characteristic can be reflected by the avalanche gain coefficient M (also called the multiplication factor). The general formula for the multiplication factor is:

[0090]

[0091] Where V represents the bias voltage, V B This represents avalanche breakdown compression, where n is a constant.

[0092] Since the collisional ionization of charge carriers is irregular, the direction of motion after the collision becomes more random, thus generating additional noise (also known as excess noise). The mean square value of the noise current of the APD satisfies the following equation (4):

[0093]

[0094] To ensure a high signal-to-noise ratio after amplification, the gain factor cannot be increased indefinitely; that is, the bias voltage of the APD cannot be too high or too low. Too high a gain factor will increase noise and may cause device breakdown, while too low a gain factor will result in insufficient gain and a high bit error rate. The bias voltage corresponding to the minimum bit error rate is the optimal target bias voltage.

[0095] By transforming the general formula (3) for the gain factor above, we can obtain the following formula (5):

[0096]

[0097] According to the above embodiments, let the target gain be denoted as Mt, the current gain as Mc, the current bias voltage (i.e., candidate voltage) of the APD as Vc, and the bias voltage after APD adjustment as Vt. When the current gain Mc is close to the target gain Mt, the gain is appropriate, and the bias voltage at this time is the target bias voltage. Based on the above considerations, the iterative formula shown in formula (2) can be obtained.

[0098] In summary, the avalanche photodiode voltage adjustment method provided in this disclosure can be used for rapid and precise debugging in optical module production. Through the above embodiments, during the repeated debugging operation, starting with a first gain of M=1, a new bias voltage is calculated according to the iterative formula, and the bias voltage debugging process is completed rapidly through iteration. Specifically, when adjusting the bias voltage, the iterative formula is updated using a formula derived from the general formula of the multiplication factor, which improves the accuracy of bias voltage adjustment. Using a more accurate bias voltage effectively reduces the number of debugging attempts and significantly improves production efficiency.

[0099] Regarding the avalanche photodiode voltage adjustment method provided in the foregoing embodiments, this invention provides an avalanche photodiode voltage adjustment system, such as... Figure 3 As shown, the system includes:

[0100] The voltage setting module 301 is used to set the bias voltage of the avalanche photodiode (APD) to a first voltage that satisfies a preset first gain.

[0101] The operation repetition module 302 is used to take the first voltage as the current voltage and repeatedly execute the following debugging operation until the debugging operation meets the preset iteration stop rule:

[0102] Obtain a first RSSI ADC value at the current voltage; set the bias voltage of the APD to a candidate voltage different from the current voltage, and obtain a second RSSI ADC value at the candidate voltage; determine the current gain based on the first RSSI ADC value and the second RSSI ADC value; determine whether the difference between the current gain and the preset target gain is less than a preset difference.

[0103] The voltage update module 303 is used to update the current voltage based on the candidate voltage, the current gain, and the target gain, so as to obtain a new current voltage, provided that the difference between the current gain and the preset target gain is not less than the preset difference.

[0104] The voltage determination module 304 is used to determine that the preset iteration stop rule is met when the difference between the current gain and the preset target gain is less than the preset difference, stop the debugging operation, and determine the candidate voltage corresponding to the stop of the debugging operation as the target bias voltage.

[0105] In one embodiment, the voltage update module 303 is further configured to:

[0106] The current voltage is updated according to the preset iterative formula, the candidate voltage, the current gain, and the target gain to obtain a new current voltage.

[0107] In one implementation, the iterative formula includes:

[0108]

[0109] Where Vt represents the new current voltage, Vc represents the candidate voltage, Mc represents the current gain, Mt represents the target gain, and n is a preset constant.

[0110] In one embodiment, the operation repetition module 302 includes a gain determination unit, which is used to:

[0111] The ratio between the second RSSI ADC value and the first RSSI ADC value is determined as the current gain.

[0112] In one embodiment, the operation repetition module 302 includes a signal value acquisition unit, which is used for:

[0113] Convert the current voltage into an analog voltage signal;

[0114] The received signal strength indication of the voltage analog signal is measured to obtain the first RSSI ADC value.

[0115] In one embodiment, the system further includes an optical setting module, which is used for:

[0116] Before setting the bias voltage of the APD to the first voltage, set the optical signal at the receiving end of the optical module.

[0117] In one embodiment, the first RSSI ADC value and the second RSSI ADC value correspond to the same optical signal.

[0118] The avalanche photodiode voltage adjustment system provided in this invention provides a more accurate current voltage adjustment method during the debugging process. Since the current voltage is updated based on candidate voltage, current gain, and target gain, the new current voltage is more accurate than the previous voltage change, effectively reducing the number of adjustments. Furthermore, updating the current voltage and setting a candidate voltage different from the current voltage is a simple and fast method for adjusting the bias voltage, improving adjustment efficiency. During repeated debugging operations, starting from the first gain, the bias voltage of the APD (including the current voltage and candidate voltage) is continuously adjusted to quickly reach the optimal target gain, rapidly iterating the bias voltage debugging process. Therefore, this solution improves the debugging efficiency and accuracy of the bias voltage.

[0119] The avalanche photodiode voltage regulation system provided in this embodiment of the invention has the same implementation principle and technical effect as the aforementioned avalanche photodiode voltage regulation method embodiment. For the sake of brevity, any parts not mentioned in the device embodiment can be referred to the corresponding content in the aforementioned method embodiment.

[0120] This embodiment also provides an electronic device, the structural schematic diagram of which is shown below. Figure 4 As shown, the device includes a processor 401 and a memory 402; wherein, the memory 402 is used to store one or more computer instructions, which are executed by the processor to implement the above-mentioned method for regulating the voltage of the avalanche photodiode.

[0121] Figure 4 The electronic device shown also includes a bus 403 and a communication interface 404. The processor 401, the communication interface 404 and the memory 402 are connected via the bus 403.

[0122] The memory 402 may include high-speed random access memory (RAM), and may also include non-volatile memory, such as at least one disk storage device. The bus 403 may be an ISA bus, PCI bus, or EISA bus, etc. The bus can be divided into address bus, data bus, control bus, etc. For ease of representation, Figure 4 The symbol is represented by a single double-headed arrow, but this does not mean that there is only one bus or one type of bus.

[0123] Communication interface 404 is used to connect to at least one user terminal and other network units through a network interface, and to send encapsulated IPv4 packets or IPv4 packets to the user terminal through the network interface.

[0124] Processor 401 may be an integrated circuit chip with signal processing capabilities. In implementation, each step of the above method can be completed by the integrated logic circuitry in the hardware of processor 401 or by instructions in software form. The processor 401 can be a general-purpose processor, including a Central Processing Unit (CPU), a Network Processor (NP), etc.; it can also be a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field-Programmable Gate Array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components. It can implement or execute the methods, steps, and logic block diagrams disclosed in the embodiments of this disclosure. The general-purpose processor can be a microprocessor or any conventional processor. The steps of the methods disclosed in the embodiments of this disclosure can be directly manifested as execution by a hardware decoding processor, or execution by a combination of hardware and software modules in the decoding processor. The software module can reside in a readily available storage medium in the art, such as random access memory, flash memory, read-only memory, programmable read-only memory, electrically erasable programmable memory, or registers. This storage medium is located in memory 402. The processor 401 reads the information from memory 402 and, in conjunction with its hardware, completes the steps of the method described in the foregoing embodiments.

[0125] This invention also provides a storage medium storing a computer program, which, when executed by a processor, performs the steps of the methods described in the foregoing embodiments.

[0126] In the several embodiments provided in this application, it should be understood that the disclosed systems, devices, and methods can be implemented in other ways. The device embodiments described above are merely illustrative. For example, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. Furthermore, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Additionally, the coupling or direct coupling or communication connection shown or discussed may be through some communication interfaces; the indirect coupling or communication connection between devices or units may be electrical, mechanical, or other forms.

[0127] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0128] In addition, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.

[0129] If the aforementioned functions are implemented as software functional units and sold or used as independent products, they can be stored in a processor-executable, non-volatile, computer-readable storage medium. Based on this understanding, the technical solution of this invention, essentially, or the part that contributes to the prior art, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0130] Finally, it should be noted that the above-described embodiments are merely specific implementations of the present invention, used to illustrate the technical solutions of the present invention, and not to limit it. The scope of protection of the present invention is not limited thereto. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that any person skilled in the art can still modify or easily conceive of changes to the technical solutions described in the foregoing embodiments within the technical scope disclosed in the present invention, or make equivalent substitutions for some of the technical features; and these modifications, changes, or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention, and should all be covered within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A method for adjusting the voltage of an avalanche photodiode, characterized in that, The avalanche photodiode voltage is applied to an optical module in optical fiber communication, and the method includes: Set the bias voltage of the avalanche photodiode (APD) to a first voltage that satisfies the preset first gain. Using the first voltage as the current voltage, the following debugging operation is repeated until the debugging operation meets the preset iteration stopping rule: Obtain a first RSSI ADC value at the current voltage; set the bias voltage of the APD to a candidate voltage different from the current voltage, and obtain a second RSSI ADC value at the candidate voltage; determine the current gain based on the first RSSI ADC value and the second RSSI ADC value; determine whether the difference between the current gain and the preset target gain is less than a preset difference. If not, the current voltage is updated based on the candidate voltage, the current gain, and the target gain to obtain a new current voltage; If so, the preset iteration stop rule is satisfied, the debugging operation is stopped, and the candidate voltage corresponding to the stop of the debugging operation is determined as the target bias voltage.

2. The method according to claim 1, characterized in that, The step of updating the current voltage based on the candidate voltage, the current gain, and the target gain to obtain a new current voltage includes: The current voltage is updated according to the preset iterative formula, the candidate voltage, the current gain, and the target gain to obtain a new current voltage.

3. The method according to claim 2, characterized in that, The iterative formula includes: Where Vt represents the new current voltage, Vc represents the candidate voltage, Mc represents the current gain, Mt represents the target gain, and n is a preset constant.

4. The method according to claim 1, characterized in that, Determining the current gain based on the first RSSI ADC value and the second RSSI ADC value includes: The ratio between the second RSSI ADC value and the first RSSI ADC value is determined as the current gain.

5. The method according to claim 1, characterized in that, The step of obtaining the first RSSIADC value under the current voltage includes: Convert the current voltage into an analog voltage signal; The received signal strength indication of the voltage analog signal is measured to obtain the first RSSI ADC value.

6. The method according to claim 1, characterized in that, The method further includes: Before setting the bias voltage of the APD to the first voltage, set the optical signal at the receiving end of the optical module.

7. The method according to claim 6, characterized in that, The first RSSI ADC value and the second RSSI ADC value correspond to the same optical signal.

8. A voltage regulation system for an avalanche photodiode, characterized in that, The avalanche photodiode voltage is applied in an optical module in optical fiber communication, and the system includes: The voltage setting module is used to set the bias voltage of the avalanche photodiode (APD) to a first voltage that satisfies a preset first gain. The operation repetition module is used to repeatedly execute the following debugging operation, taking the first voltage as the current voltage, until the debugging operation meets the preset iteration stop rule: Obtain a first RSSI ADC value at the current voltage; set the bias voltage of the APD to a candidate voltage different from the current voltage, and obtain a second RSSI ADC value at the candidate voltage; determine the current gain based on the first RSSI ADC value and the second RSSI ADC value; determine whether the difference between the current gain and the preset target gain is less than a preset difference. The voltage update module is used to update the current voltage based on the candidate voltage, the current gain, and the target gain, to obtain a new current voltage, provided that the difference between the current gain and the preset target gain is not less than the preset difference. The voltage determination module is used to determine if the current gain and the preset target gain are less than the preset difference, and to stop the debugging operation if the preset iteration stop rule is met. The module then determines the candidate voltage corresponding to the stop of the debugging operation as the target bias voltage.

9. An electronic device, characterized in that, include: Processors and storage devices; The storage device stores computer-executable instructions that can be executed by a processor, which executes the computer-executable instructions to implement the steps of the avalanche photodiode voltage adjustment method according to any one of claims 1 to 7.

10. A storage medium, characterized in that, The storage medium stores computer-executable instructions, which, when invoked and executed by a processor, cause the processor to implement the steps of the avalanche photodiode voltage adjustment method according to any one of claims 1 to 7.

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