A method, device and storage medium for detecting deformation defects in a hanger.

Abstract

This application provides a method, apparatus, and storage medium for detecting bracket deformation defects. The method includes: acquiring bracket line speed data, first data information monitored by a first ranging sensor, and second data information monitored by a second ranging sensor from a double-row copper plating production line; wherein the first and second ranging sensors are respectively disposed on both sides of the copper plating production line; calculating the bracket spacing on the first side of the bracket to be tested based on the first data information and the bracket line speed data; calculating the bracket spacing on the second side of the bracket to be tested based on the second data information and the bracket line speed data; and determining whether the bracket to be tested has a deformation defect based on the bracket spacing on the first side and the bracket spacing on the second side, combined with a preset threshold, and generating a judgment result. The technical solution provided by this application can detect bracket deformation defects on a double-row copper plating production line in a timely manner, reduce material stacking defects, and improve the product yield of the double-row copper plating production line.

Description

Technical Field

[0001] This application relates to the field of defect detection technology, specifically to a method, device, and storage medium for detecting deformation defects in a hanger. Background Technology

[0002] Vertical continuous copper plating production line (DVCP) is used for electroplating processes on circuit boards. It has good electroplating distribution, hole filling and via filling capabilities, and stable electroplating quality.

[0003] Currently, product defects and equipment defects encountered with DVCP rely entirely on manual visual inspection. Furthermore, the loading, copper plating, and unloading points are located in different areas, making it impossible for a single person to fully monitor all product and equipment defects on the DVCP. The current inspection efforts and persistence are insufficient for continuous identification and detection, hindering timely problem detection and resolution.

[0004] DVCP typically uses a clamping mechanism on a hanger to hold the circuit board material and move the clamped circuit board material to different areas such as the loading position, copper plating pool, and unloading position to perform electroplating processing on the held circuit board material.

[0005] The inventors discovered that if a bracket deforms during the movement of the bracket, the circuit board material held on that bracket may overlap with the circuit board material held on the adjacent bracket, resulting in defects that affect product yield. Summary of the Invention

[0006] In view of this, this application provides a method, apparatus and storage medium for detecting bracket deformation defects, so as to detect bracket deformation defects on DVCP in a timely manner, reduce material stacking defects and improve the product yield of DVCP.

[0007] In a first aspect, this application provides a method for detecting deformation defects in a hanger, the method comprising:

[0008] Acquire the rack speed data of the double-row copper plating production line; acquire the first data information monitored by the first ranging sensor and the second data information monitored by the second ranging sensor; wherein, the first ranging sensor is set on the first side of the copper plating production line and the second ranging sensor is set on the second side of the copper plating production line;

[0009] Based on the first data information and the hanger line speed data, calculate the first side hanger spacing of the hanger to be tested; based on the second data information and the hanger line speed data, calculate the second side hanger spacing of the hanger to be tested.

[0010] Based on the spacing between the first and second side brackets, and combined with a preset threshold, it is determined whether the bracket to be tested has a deformation defect and a judgment result is generated.

[0011] In an optional implementation, calculating the first side bracket spacing of the bracket to be tested based on the first data information and the bracket line speed data includes:

[0012] Based on the first data information, a first high-level duration matching the first side spacing of the bracket to be tested is determined;

[0013] The spacing between the first side brackets of the bracket to be tested is calculated based on the duration of the first high-level signal and the bracket line speed data.

[0014] In an optional implementation, calculating the second side bracket spacing of the bracket to be tested based on the second data information and the bracket line speed data includes:

[0015] Based on the second data information, determine the second high-level duration that matches the second side spacing of the bracket to be tested;

[0016] The second side bracket spacing of the bracket to be tested is calculated based on the duration of the second high level and the bracket line speed data.

[0017] In an optional implementation, the spacing between the first side hangers of the hanger to be tested is calculated using the following formula:

[0018] L An =1 / 60*k*t An ;

[0019] Among them, L An The spacing between the A-side hangers of the hanger n to be tested is in mm; k is the hanger linear speed of the copper plating production line, in m / min; t An The duration of the high-level signal on side A of the mounting bracket n to be tested, in milliseconds.

[0020] In an optional implementation, the spacing between the second side brackets of the bracket to be tested is calculated using the following formula:

[0021] L Bn =1 / 60*k*t Bn ;

[0022] Among them, L Bn The spacing between the brackets on side B of the bracket n to be tested is in mm; k is the linear speed of the brackets in the copper plating production line, in m / min; t Bn The duration of the high-level signal on side B of the mounting bracket n to be tested, in milliseconds.

[0023] In an optional implementation, the step of determining whether the bracket to be detected has a deformation defect and generating a determination result based on the spacing between the first and second side brackets and a preset threshold includes:

[0024] Determine whether the spacing between the first side brackets is within the first preset threshold range;

[0025] Determine whether the spacing between the second side brackets is within the first preset threshold range;

[0026] If it is determined that the spacing of the first side bracket is not within the first preset threshold range, a defect identification result for the spacing of the first side bracket of the bracket to be detected is generated.

[0027] If it is determined that the spacing of the second side bracket is not within the first preset threshold range, a defect identification result for the spacing of the second side bracket of the bracket to be detected is generated.

[0028] In an optional implementation, the step of determining whether the bracket to be detected has a deformation defect and generating a determination result based on the first side bracket spacing, the second side bracket spacing, and a preset threshold further includes:

[0029] If it is determined that both the spacing between the first side bracket and the spacing between the second side bracket are within the first preset threshold range, then the absolute value of the difference between the spacing between the first side bracket and the spacing between the second side bracket is calculated.

[0030] Determine whether the absolute value of the difference is within the range of a second preset threshold;

[0031] If the absolute value of the difference is determined to be within the range of the second preset threshold, then it is determined that the bracket to be tested does not have deformation defects.

[0032] If it is determined that the absolute value of the difference is not within the range of the second preset threshold, then it is determined that the bracket to be tested has a deformation defect.

[0033] Secondly, this application provides a device for detecting deformation defects in a hanger, the device comprising:

[0034] The acquisition module is used to acquire the rack line speed data of the double-row copper plating production line; the acquisition module is also used to acquire first data information monitored by a first ranging sensor and second data information monitored by a second ranging sensor; wherein, the first ranging sensor is disposed on the first side of the copper plating production line and the second ranging sensor is disposed on the second side of the copper plating production line;

[0035] The calculation module is used to calculate the first side bracket spacing of the bracket to be tested based on the first data information and the bracket line speed data; the calculation module is also used to calculate the second side bracket spacing of the bracket to be tested based on the second data information and the bracket line speed data.

[0036] The identification module is used to determine whether the bracket to be detected has a deformation defect based on the spacing between the first side bracket and the spacing between the second side bracket, combined with a preset threshold, and to generate a judgment result.

[0037] Thirdly, this application provides a computer device, including: a memory and a processor, wherein the memory and the processor are communicatively connected to each other, the memory stores computer instructions, and the processor executes the computer instructions to implement the bracket deformation defect detection method described in the first aspect.

[0038] Fourthly, this application provides a computer-readable storage medium storing computer instructions, which, when executed by a processor, implement the bracket deformation defect detection method described in the first aspect.

[0039] The method, apparatus, and storage medium for detecting deformation defects in hangers provided in this application have at least the following beneficial effects:

[0040] The technical solution provided in this application can determine the rack spacing by acquiring the rack speed data of a double-row copper plating production line and the monitoring data from distance sensors located on both sides of the rack. Furthermore, by combining the rack spacing on both sides with a preset threshold, it can determine whether the rack has deformed and generate a judgment result. This method effectively monitors the double-row copper plating production line, promptly detects rack deformation defects, facilitates timely problem handling, avoids material stacking defects, and improves the product yield of the double-row copper plating production line.

[0041] As can be seen, the above methods can be used to detect rack deformation defects on the double-row copper plating production line in a timely manner, reduce material stacking defects, and improve the product yield of the double-row copper plating production line. Attached Figure Description

[0042] To more clearly illustrate the technical solutions in the specific embodiments of this application or the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained from these drawings without creative effort. It should be noted that the drawings described below are illustrative and should not be construed as imposing any limitations on this application. In the drawings:

[0043] Figure 1 A partial structural schematic diagram of a double-row copper plating production line according to one embodiment of this application is shown;

[0044] Figure 2 A schematic diagram of a bracket deformation defect detection method according to one embodiment of this application is shown;

[0045] Figure 3 This paper shows a schematic diagram of the structure of a double-row copper plating production line in one embodiment of the present application, in which any two adjacent hangers are in the same row (side);

[0046] Figure 4 A schematic diagram illustrating the monitoring principle of a ranging sensor in one embodiment of this application is shown;

[0047] Figure 5 A schematic diagram of a bracket deformation defect detection device according to one embodiment of this application is shown;

[0048] Figure 6 A schematic diagram of a computer device according to one embodiment of this application is shown. Detailed Implementation

[0049] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, not all of them. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0050] In the description of this application, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0051] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal connection of two components; and they can refer to a wireless connection or a wired connection. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0052] Furthermore, the technical features involved in the different embodiments of this application described below can be combined with each other as long as they do not conflict with each other.

[0053] Although the processes described below include multiple operations that occur in a specific order, it should be clearly understood that these processes may also include more or fewer operations, which may be executed sequentially or in parallel.

[0054] Example 1

[0055] The bracket deformation defect detection method provided in this application is specifically applicable to a vertically continuous copper plating production line (DVCP) with two rows of plates. See also Figure 1 The vertical continuous copper plating production line shown is a double-row line. "Double-row" means that the copper plating plates are clamped on both sides of the racks (corresponding to two rows), and the process is advanced synchronously along the production line. The deformation of the racks in a double-row line mainly occurs when the racks deform (or shift) during the process of advancing the plates.

[0056] Please see Figure 2 The bracket deformation defect detection method provided in one embodiment of this application may include the following steps.

[0057] S201. Obtain the rack speed data of the double-row copper plating production line; obtain the first data information monitored by the first ranging sensor and the second data information monitored by the second ranging sensor; wherein, the first ranging sensor is set on the first side of the copper plating production line and the second ranging sensor is set on the second side of the copper plating production line.

[0058] In this embodiment, please continue to refer to Figure 1The rack line speed data refers to the speed at which the rack moves along the production line. The double-row copper plating production line includes column A (side) and column B (side). That is, each rack includes column A (side) and column B (side). In practical applications, a distance sensor is installed on each of sides A and B. For example, if the first distance sensor is installed on side A, the first data information acquired is the data monitored by the first distance sensor on side A. The principle behind the installation of the second distance sensor should be understood similarly, and will not be elaborated here.

[0059] See Figure 3 As shown, Figure 3 This is a schematic diagram of a double-row copper plating production line where any two adjacent racks are in the same row (side). During the copper plating process, there is a certain distance between adjacent racks. (See reference...) Figure 4 As shown, when the ranging sensor is monitoring distance, if a bracket passes through its monitoring area, the sensor will detect a low-level signal due to the bracket's obstruction. Conversely, if no bracket passes through the monitoring area (i.e., from the time the previous bracket has completely passed until the next bracket arrives), the sensor will detect a high-level signal because there is no obstruction. In other words, the first and second data information represent the duration of the corresponding high and low levels.

[0060] S202. Based on the first data information and the hanger line speed data, calculate the first side hanger spacing of the hanger to be tested; based on the second data information and the hanger line speed data, calculate the second side hanger spacing of the hanger to be tested.

[0061] In an optional implementation, calculating the first side bracket spacing of the bracket to be tested based on the first data information and the bracket line speed data includes:

[0062] Based on the first data information, a first high-level duration matching the first side spacing of the bracket to be tested is determined;

[0063] The spacing between the first side brackets of the bracket to be tested is calculated based on the duration of the first high-level signal and the bracket line speed data.

[0064] In this embodiment, the first data information corresponds to the duration of high and low voltage levels in column A of the double-column copper plating production line. The first high-level duration corresponding to side A of the bracket to be tested can be determined by matching the sequence information of the bracket to be tested with the high-level duration in the first data information. Furthermore, the bracket spacing on side A of the bracket to be tested can be obtained by calculating the product of the bracket's linear speed and the first high-level duration.

[0065] In an optional implementation, the spacing between the first side hangers of the hanger to be tested is calculated using the following formula:

[0066] L An =1 / 60*k*t An ;

[0067] Among them, L An The spacing between the A-side hangers of the hanger n to be tested is in mm; k is the hanger linear speed of the copper plating production line, in m / min; t An The duration of the high-level signal on side A of the mounting bracket n to be tested, in milliseconds.

[0068] In an optional implementation, calculating the second side bracket spacing of the bracket to be tested based on the second data information and the bracket line speed data includes:

[0069] Based on the second data information, determine the second high-level duration that matches the second side spacing of the bracket to be tested;

[0070] The second side bracket spacing of the bracket to be tested is calculated based on the duration of the second high level and the bracket line speed data.

[0071] In this embodiment, the second data information corresponds to the duration of high and low levels in column B of the double-column copper plating production line. The second high-level duration corresponding to side B of the rack to be tested can be determined by matching the sequence information of the rack to be tested with the high-level duration in the second data information. Furthermore, the rack spacing on side B of the rack to be tested can be obtained by calculating the product of the rack line speed and the second high-level duration.

[0072] In an optional implementation, the spacing between the second side brackets of the bracket to be tested is calculated using the following formula:

[0073] L Bn =1 / 60*k*t Bn ;

[0074] Among them, L Bn The spacing between the brackets on side B of the bracket n to be tested is in mm; k is the linear speed of the brackets in the copper plating production line, in m / min; t Bn The duration of the high-level signal on side B of the mounting bracket n to be tested, in milliseconds.

[0075] Furthermore, it's important to note that the hangers typically also have anti-collision targets, which are considered part of the hanger as a whole in this solution. However, in practical applications, the length of the anti-collision target needs to be reduced by twice to obtain the actual hanger spacing. The subsequent threshold setting can also be determined based on the length of the anti-collision target. That is, if the hanger spacing after removing twice the anti-collision target length is used as the basis for judgment, then the range of the first threshold mentioned below should be the original threshold minus twice the anti-collision target length. The specific logic will not be elaborated here.

[0076] S203. Based on the spacing between the first side brackets and the spacing between the second side brackets, and combined with a preset threshold, determine whether the bracket to be tested has a deformation defect and generate a judgment result.

[0077] In this embodiment, it is typically necessary to first determine the spacing between the first and second side brackets. If the spacing on one side exceeds the corresponding preset range, it indicates that the distance between that side of the bracket and the adjacent bracket is unreasonable. This could be due to bracket deformation or other reasons, requiring staff to investigate the cause on-site. If the spacing on both sides is within a reasonable range, the difference between the two side bracket spacings and a preset threshold can be used to determine if the bracket has any deformation defects.

[0078] In this embodiment, by acquiring the line speed data of the racks on the double-row copper plating production line and the monitoring data from the distance sensors located on both sides of the racks, the rack spacing can be determined from the monitoring data. Furthermore, by combining the rack spacing on both sides with a preset threshold, a judgment result is generated to determine whether the racks have deformed. This method effectively monitors the double-row copper plating production line, promptly detects rack deformation defects, facilitates timely problem handling, avoids material stacking defects, and improves the product yield of the double-row copper plating production line.

[0079] In an optional implementation, the step of determining whether the bracket to be detected has a deformation defect and generating a determination result based on the spacing between the first and second side brackets and a preset threshold includes:

[0080] Determine whether the spacing between the first side brackets is within the first preset threshold range;

[0081] Determine whether the spacing between the second side brackets is within the first preset threshold range;

[0082] If it is determined that the spacing of the first side bracket is not within the first preset threshold range, a defect identification result for the spacing of the first side bracket of the bracket to be detected is generated.

[0083] If it is determined that the spacing of the second side bracket is not within the first preset threshold range, a defect identification result for the spacing of the second side bracket of the bracket to be detected is generated.

[0084] In this embodiment, by setting a first preset threshold and comparing it with the spacing of the first and second side hangers, it is possible to identify whether there are corresponding hanger spacing defects on the double-row copper plating production line. This helps on-site inspectors to promptly identify and address problems, ensuring the normal operation of the double-row copper plating production line and improving its production efficiency. This further improves the product yield of the double-row copper plating production line.

[0085] In an optional implementation, the step of determining whether the bracket to be detected has a deformation defect and generating a determination result based on the first side bracket spacing, the second side bracket spacing, and a preset threshold further includes:

[0086] If it is determined that both the spacing between the first side bracket and the spacing between the second side bracket are within the first preset threshold range, then the absolute value of the difference between the spacing between the first side bracket and the spacing between the second side bracket is calculated.

[0087] Determine whether the absolute value of the difference is within the range of a second preset threshold;

[0088] If the absolute value of the difference is determined to be within the range of the second preset threshold, then it is determined that the bracket to be tested does not have deformation defects.

[0089] If it is determined that the absolute value of the difference is not within the range of the second preset threshold, then it is determined that the bracket to be tested has a deformation defect.

[0090] In this embodiment, the judgment is made by the absolute value of the difference. When the absolute value of the difference exceeds a second preset range, it indicates that the difference in the distance between the two side brackets is too large, meaning the bracket has undergone a significant offset (deformation). This method can identify whether the brackets on the double-row copper plating production line have deformation defects, thus helping on-site inspectors to promptly identify and address problems, ensuring the normal operation of the double-row copper plating production line, improving its production efficiency, and further increasing the product yield of the double-row copper plating production line.

[0091] Example 2

[0092] This embodiment provides a device for detecting bracket deformation defects, which is applied to the bracket deformation defect detection method provided in Embodiment 1 above for illustration. Please refer to... Figure 5 As shown, the bracket deformation defect detection device provided in one embodiment of this application may include the following multiple modules.

[0093] The acquisition module is used to acquire the rack line speed data of the double-row copper plating production line; the acquisition module is also used to acquire first data information monitored by a first ranging sensor and second data information monitored by a second ranging sensor; wherein, the first ranging sensor is disposed on the first side of the copper plating production line and the second ranging sensor is disposed on the second side of the copper plating production line;

[0094] The calculation module is used to calculate the first side bracket spacing of the bracket to be tested based on the first data information and the bracket line speed data; the calculation module is also used to calculate the second side bracket spacing of the bracket to be tested based on the second data information and the bracket line speed data.

[0095] The identification module is used to determine whether the bracket to be detected has a deformation defect based on the spacing between the first side bracket and the spacing between the second side bracket, combined with a preset threshold, and to generate a judgment result.

[0096] The bracket deformation defect detection device provided in this application embodiment can be applied to the bracket deformation defect detection method provided in Embodiment 1 above. For relevant details, please refer to the above method embodiment. The implementation principle and technical effect are similar, and will not be repeated here.

[0097] It should be noted that the bracket deformation defect detection device provided in this embodiment is only illustrated by the above-described division of functional modules / units when performing bracket deformation defect detection. In practical applications, the above functions can be assigned to different functional modules / units as needed, that is, the internal structure of the bracket deformation defect detection device can be divided into different functional modules / units to complete all or part of the functions described above. Furthermore, the implementation method of the bracket deformation defect detection method provided in the above-described embodiment 1 and the implementation method of the bracket deformation defect detection device provided in this embodiment 2 belong to the same concept. The specific implementation process of the bracket deformation defect detection device provided in this embodiment 2 is detailed in the above-described embodiment 1, and will not be repeated here.

[0098] Example 3

[0099] Please see Figure 6 As shown, one embodiment of this application also provides a computer device, which may be a desktop computer, a laptop computer, a handheld computer, or a cloud server, etc. This computer device may include, but is not limited to, a processor and a memory. The processor and memory may be connected via a bus or other means.

[0100] The processor can be a central processing unit (CPU). It can also be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs) or other programmable logic devices, graphics processing units (GPUs), embedded neural network processing units (NPUs) or other dedicated deep learning coprocessors, discrete gate or transistor logic devices, discrete hardware components, or combinations of the above types of chips.

[0101] Memory, as a non-transitory computer-readable storage medium, can be used to store non-transitory software programs, non-transitory computer-executable programs, and modules, such as the program instructions / modules corresponding to the methods in the above embodiments of this application. The processor executes various functional applications and data processing by running the non-transitory software programs, instructions, and modules stored in the memory, thereby implementing the methods in the above embodiments.

[0102] The memory may include a program storage area and a data storage area. The program storage area may store the operating system and applications required for at least one function; the data storage area may store data created by the processor, etc. Furthermore, the memory may include high-speed random access memory and non-transitory memory, such as at least one disk storage device, flash memory device, or other non-transitory solid-state storage device. In some embodiments, the memory may optionally include memory remotely located relative to the processor, which can be connected to the processor via a network. Examples of such networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof.

[0103] One embodiment of this application also provides a computer-readable storage medium for storing a computer program that, when executed by a processor, implements the method described in the above-described method embodiments.

[0104] The technical solution provided in this application acquires the line speed data of the racks in a double-row copper plating production line and the monitoring data from distance sensors located on both sides of the racks. This allows for the determination of the rack spacing from the monitoring data, and by combining the rack spacing on both sides with a preset threshold, it determines whether the racks have deformed and generates a judgment result. This method effectively monitors the double-row copper plating production line, promptly detects rack deformation defects, facilitates timely problem handling, avoids material stacking defects, and improves the product yield of the double-row copper plating production line.

[0105] Those skilled in the art will understand that all or part of the processes in the methods described above in this application can be implemented by a computer program instructing related hardware. The program can be stored in a computer-readable storage medium, and when executed, it can include the processes of the embodiments described above. The storage medium can be a magnetic disk, optical disk, read-only memory (ROM), random access memory (RAM), flash memory, hard disk drive (HDD), or solid-state drive (SSD), etc.; the storage medium can also include combinations of the above types of memory.

[0106] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0107] While embodiments of this application have been described in conjunction with the accompanying drawings, this should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various variations or modifications based on the above description without departing from the concept of this application. It is neither necessary nor possible to exhaustively list all embodiments here. However, obvious variations or modifications derived therefrom still fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A method for detecting deformation defects in a hanger, characterized in that, The method includes: Acquire the rack speed data of the double-row copper plating production line; acquire the first data information monitored by the first ranging sensor and the second data information monitored by the second ranging sensor; wherein, the first ranging sensor is set on the first side of the copper plating production line and the second ranging sensor is set on the second side of the copper plating production line; Based on the first data information and the hanger line speed data, calculate the first side hanger spacing of the hanger to be tested; based on the second data information and the hanger line speed data, calculate the second side hanger spacing of the hanger to be tested. Based on the spacing between the first and second side brackets, and combined with a preset threshold, it is determined whether the bracket to be tested has a deformation defect and a judgment result is generated.

2. The method for detecting deformation defects in a hanger according to claim 1, characterized in that, The step of calculating the first side bracket spacing of the bracket to be tested based on the first data information and the bracket line speed data includes: Based on the first data information, determine the first high-level duration that matches the first side spacing of the bracket to be tested; The spacing between the first side brackets of the bracket to be tested is calculated based on the duration of the first high-level signal and the bracket line speed data.

3. The method for detecting deformation defects in a hanger according to claim 2, characterized in that, The step of calculating the second side bracket spacing of the bracket to be tested based on the second data information and the bracket line speed data includes: Based on the second data information, determine the second high-level duration that matches the second side spacing of the bracket to be detected; The second side bracket spacing of the bracket to be tested is calculated based on the duration of the second high level and the bracket line speed data.

4. The method for detecting deformation defects in a hanger according to claim 1, characterized in that, The spacing between the first side hangers of the hanger to be tested is calculated using the following formula: L An =1 / 60*k*t An ; Among them, L An The spacing between the A-side hangers of the hanger n to be tested is in mm; k is the hanger linear speed of the copper plating production line, in m / min; t An The duration of the high-level signal on side A of the mounting bracket n to be tested, in milliseconds.

5. The method for detecting deformation defects in a hanger according to claim 4, characterized in that, The spacing between the second side brackets of the bracket to be tested is calculated using the following formula: L Bn =1 / 60*k*t Bn ; Among them, L Bn The spacing between the brackets on side B of the bracket n to be tested is in mm; k is the linear speed of the brackets in the copper plating production line, in m / min; t Bn The duration of the high-level signal on side B of the mounting bracket n to be tested, in milliseconds.

6. The method for detecting deformation defects in a hanger according to claim 1, characterized in that, The step of determining whether the bracket to be detected has a deformation defect based on the spacing between the first and second side brackets and a preset threshold, and generating a determination result, includes: Determine whether the spacing between the first side brackets is within the first preset threshold range; Determine whether the spacing between the second side brackets is within the first preset threshold range; If it is determined that the spacing of the first side bracket is not within the first preset threshold range, a defect identification result for the spacing of the first side bracket of the bracket to be detected is generated. If it is determined that the spacing of the second side bracket is not within the first preset threshold range, a defect identification result for the spacing of the second side bracket of the bracket to be detected is generated.

7. The method for detecting deformation defects in a hanger according to claim 6, characterized in that, The step of determining whether the bracket to be detected has a deformation defect based on the spacing between the first and second side brackets and a preset threshold, and generating a determination result, further includes: If it is determined that both the spacing between the first side bracket and the spacing between the second side bracket are within the first preset threshold range, then the absolute value of the difference between the spacing between the first side bracket and the spacing between the second side bracket is calculated. Determine whether the absolute value of the difference is within the range of a second preset threshold; If the absolute value of the difference is determined to be within the range of the second preset threshold, then it is determined that the bracket to be tested does not have deformation defects. If it is determined that the absolute value of the difference is not within the range of the second preset threshold, then it is determined that the bracket to be tested has a deformation defect.

8. A device for detecting deformation defects in a hanger, characterized in that, The device includes: The acquisition module is used to acquire the rack line speed data of the double-row copper plating production line; the acquisition module is also used to acquire first data information monitored by a first ranging sensor and second data information monitored by a second ranging sensor; wherein, the first ranging sensor is disposed on the first side of the copper plating production line and the second ranging sensor is disposed on the second side of the copper plating production line; The calculation module is used to calculate the first side bracket spacing of the bracket to be tested based on the first data information and the bracket line speed data; the calculation module is also used to calculate the second side bracket spacing of the bracket to be tested based on the second data information and the bracket line speed data. The identification module is used to determine whether the bracket to be detected has a deformation defect based on the spacing between the first side bracket and the spacing between the second side bracket, combined with a preset threshold, and to generate a judgment result.

9. A computer device, characterized in that, include: The system includes a memory and a processor, which are interconnected and the memory stores computer instructions. The processor executes the computer instructions to implement the bracket deformation defect detection method as described in any one of claims 1-7.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer instructions that, when executed by a processor, implement the bracket deformation defect detection method as described in any one of claims 1-7.

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