Chip testing and sorting integrated machine

Abstract

This invention discloses a chip testing and sorting integrated machine. A sliding table is provided on both sides of the material sorting tray. When the material sorting tray is tilted, it is parallel to one of the sliding tables, allowing the material to slide along the table into collection boxes located on both sides of the equipment housing. A turntable is located at the bottom of the testing chamber, and a second motor is installed between the turntable and the equipment housing. From the inlet to the top of the outlet, the testing chamber has a medium-temperature stage and a high-temperature stage arranged sequentially. A camera is installed at the top of the testing chamber near the outlet, along the rotation direction of the turntable. A bracket is installed above the unloading slide plate, and an electric push rod is installed at the top of the bracket, opposite to the material sorting tray. A vertically downward-pointing cylinder is installed at the end of the electric push rod, and a push plate is fixedly connected to the end of the cylinder's movable rod. This invention can meet testing needs under different conditions and can also achieve rapid sorting of qualified and unqualified products.

Description

Technical Field

[0001] This invention relates to the field of chip testing technology, and in particular to a chip testing and sorting integrated machine. Background Technology

[0002] A chip, or large-scale integrated circuit, is used in various circuit structures to simplify circuit size. After the chips are manufactured, they must undergo rigorous testing processes before they can be officially released to the market.

[0003] To ensure that chips can operate normally in high-temperature environments, they need to undergo high-temperature testing to check their target design performance and whether they meet industry standards. After the test is completed, the chips are removed from the testing facility and sorted according to the test results. Summary of the Invention

[0004] The purpose of this invention is to provide a chip testing and sorting integrated machine that can meet testing needs under different conditions and can also quickly sort qualified and unqualified products, thereby improving the applicability and testing efficiency of the device.

[0005] To achieve the above objectives, the technical solution adopted by the present invention is: a chip testing and sorting integrated machine, comprising: an equipment box, a testing box dispensing tray, and a collection box. The dispensing tray is located on the circumferential side wall of the equipment box. A first motor is disposed between the dispensing tray and the equipment box, and the output shaft of the first motor is sleeved with the bottom of the dispensing tray, so that the dispensing tray can tilt to the left and right. A slide is provided on both sides of the dispensing tray. When the dispensing tray is tilted, the dispensing tray is parallel to one of the slides, so that the material can slide along the slide into the collection box located on both sides of the equipment box.

[0006] The outer circumferential wall of the testing box is provided with several support plates at intervals to fix it to the top of the equipment box. A turntable is set at the bottom of the testing box. A second motor is set between the turntable and the equipment box, so that the material can move inside the testing box along the rotation direction of the turntable. The testing box has a discharge port on the side close to the material distribution tray. The testing box has a feed port at the end opposite to the rotation direction of the turntable and close to the discharge port. The testing box has a medium temperature platform and a high temperature platform arranged sequentially from the feed port to the top of the discharge port. A camera is set at the top of the testing box at the end close to the discharge port along the rotation direction of the turntable.

[0007] A discharge slide is provided between the discharge port and the distribution tray. A bracket is provided above the discharge slide. An electric push rod is provided at the top of the bracket and on the side opposite to the distribution tray. A vertically downward cylinder is provided at the end of the electric push rod. A push plate is fixedly connected to the end of the movable rod of the cylinder.

[0008] The following are further improvements to the above technical solution:

[0009] 1. In the above scheme, a control computer is provided on one side of the top of the equipment box.

[0010] 2. In the above scheme, the control computer is electrically connected to the camera, the medium temperature stage, the high temperature stage, the electric push rod, and the first and second motors of the cylinder.

[0011] 3. In the above scheme, the turntable is a circular turntable.

[0012] 4. In the above scheme, the camera is a CCD camera.

[0013] 5. In the above scheme, a caster wheel is provided at each of the four corners of the bottom of the equipment box.

[0014] 6. In the above scheme, a support leg is provided at each of the four corners of the bottom of the equipment box.

[0015] 7. In the above solution, the top of the support leg is threadedly connected to the equipment box, and a rubber pad is fixedly connected to the bottom.

[0016] 8. In the above solution, the equipment box is provided with doors on all three sides.

[0017] Due to the application of the above technical solution, the present invention has the following advantages compared with the prior art:

[0018] 1. The chip testing and sorting integrated machine of the present invention has a second motor installed between the turntable at the bottom of the testing chamber and the equipment box, so that the material can move inside the testing chamber along the rotation direction of the turntable. The testing chamber has a discharge port on the side near the sorting tray, and a feed port is provided at the end of the testing chamber opposite to the rotation direction of the turntable near the discharge port. The testing chamber has a medium temperature stage and a high temperature stage arranged sequentially from the feed port to the top of the discharge port. By integrating the medium temperature stage and the high temperature stage into one testing chamber, the testing needs under different conditions can be met, and multiple chips can be tested simultaneously, which improves the applicability and testing efficiency of the device.

[0019] 2. The chip testing and sorting integrated machine of the present invention has an electric push rod installed at the top of its support and on the side opposite to the collection box. The end of the electric push rod is equipped with a vertically downward cylinder. The end of the movable rod of the cylinder is fixedly connected to a push plate. The material is quickly transferred through the cooperation between the cylinder and the electric push rod. The structure is simple and reliable, and effectively avoids chip drop and damage caused by inconsistent gripping force. Furthermore, the material distribution tray is located on the circumferential side wall of the equipment box. The first motor is set between the material distribution tray and the equipment box. A slide is set on both sides of the material distribution tray. The material can slide along the slide into the collection box located on both sides of the equipment box, so that the material is transferred to the material distribution tray by the feeding slide plate. The material distribution tray guides the material into the corresponding collection box, thereby realizing the rapid sorting of qualified and unqualified products and greatly improving the product sorting efficiency. Attached Figure Description

[0020] Appendix Figure 1 This is a schematic diagram of the overall structure of the chip testing and sorting integrated machine of the present invention;

[0021] Appendix Figure 2 Appendix to this invention Figure 1 Enlarged view of point A;

[0022] Appendix Figure 3 This is a partial structural exploded view of the chip testing and sorting integrated machine of the present invention;

[0023] Appendix Figure 4 This is a partial structural schematic diagram of the chip testing and sorting integrated machine of the present invention;

[0024] Appendix Figure 5 This is the electrical control schematic diagram of the chip testing and sorting integrated machine of the present invention.

[0025] In the attached diagrams: 1. Equipment box; 2. Testing box; 3. Distributor tray; 4. First motor; 5. Support plate; 6. Turntable; 7. Second motor; 8. Discharge port; 9. Inlet port; 10. Medium temperature stage; 11. High temperature stage; 12. Camera; 13. Unloading slide plate; 14. Bracket; 15. Electric push rod; 16. Cylinder; 17. Push plate; 18. Slide table; 19. Collection box; 20. Control computer; 21. Casters; 22. Support legs; 23. Box door. Detailed Implementation

[0026] In the description of this patent, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used solely for the convenience of describing the invention and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the invention. The terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance. Furthermore, unless otherwise explicitly specified and limited, the terms "installed," "connected," and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this patent based on the specific circumstances.

[0027] The present invention will be further described below with reference to embodiments:

[0028] Example 1: A chip testing and sorting integrated machine includes: an equipment box 1, a testing box 2, a dispensing tray 3, and a collection box 19. The dispensing tray 3 is located on the circumferential side wall of the equipment box 1. A first motor 4 is disposed between the dispensing tray 3 and the equipment box 1, and the output shaft of the first motor 4 is sleeved with the bottom of the dispensing tray 3, so that the dispensing tray 3 can tilt to the left and right. A slide table 18 is provided on both sides of the dispensing tray 3. When the dispensing tray 3 is in an inclined state, the dispensing tray 3 is exactly parallel to one of the slide tables 18, so that the material can slide along the slide table 18 into the collection box 19 located on both sides of the equipment box 1.

[0029] The outer circumferential wall of the testing box 2 is provided with several support plates 5 at intervals, which are fixedly installed on the top of the equipment box 1. A turntable 6 is provided at the bottom of the testing box 2. A second motor 7 is provided between the turntable 6 and the equipment box 1, so that the material can move inside the testing box 2 along the rotation direction of the turntable 6. The testing box 2 has a discharge port 8 on the side close to the material distribution tray 3. The testing box 2 has a feed port 9 at the end near the discharge port 8 along the opposite rotation direction of the turntable 6. The testing box 2 has a medium temperature platform 10 and a high temperature platform 11 arranged sequentially from the feed port 9 to the top of the discharge port 8. A camera 12 is provided at the top of the testing box 2 at the end near the discharge port 8 along the rotation direction of the turntable 6.

[0030] A discharge slide plate 13 is provided between the discharge port 8 and the distribution tray 3. A bracket 14 is provided above the discharge slide plate 13. An electric push rod 15 is provided at the top of the bracket 14 and on the side opposite to the distribution tray 3. A vertically downward cylinder 16 is provided at the end of the electric push rod 15. A push plate 17 is fixedly connected to the end of the movable rod of the cylinder 16.

[0031] A control computer 20 is installed on one side of the top of the aforementioned equipment box 1.

[0032] The aforementioned control computer 20 is electrically connected to the camera 12, the medium-temperature stage 10, the high-temperature stage 11, the electric push rod 15, the cylinder 16, the first motor 4, and the second motor 7.

[0033] The aforementioned turntable 6 is a circular turntable.

[0034] Each of the four corners at the bottom of the aforementioned equipment box 1 is equipped with a caster wheel 21.

[0035] Each of the four corners at the bottom of the aforementioned equipment box 1 is provided with a support leg 22.

[0036] The top of the aforementioned support leg 22 is threadedly connected to the equipment box 1, and a rubber pad is fixedly connected to the bottom.

[0037] The equipment box 1 mentioned above is equipped with doors 23 on all three sides.

[0038] Example 2: A chip testing and sorting integrated machine includes: an equipment box 1, a testing box 2, a dispensing tray 3, and a collection box 19. The dispensing tray 3 is located on the circumferential side wall of the equipment box 1. A first motor 4 is disposed between the dispensing tray 3 and the equipment box 1, and the output shaft of the first motor 4 is sleeved with the bottom of the dispensing tray 3, so that the dispensing tray 3 can tilt to the left and right. A slide table 18 is provided on both sides of the dispensing tray 3. When the dispensing tray 3 is in an inclined state, the dispensing tray 3 is exactly parallel to one of the slide tables 18, so that the material can slide along the slide table 18 into the collection box 19 located on both sides of the equipment box 1.

[0039] The outer circumferential wall of the testing box 2 is provided with several support plates 5 at intervals, which are fixedly installed on the top of the equipment box 1. A turntable 6 is provided at the bottom of the testing box 2. A second motor 7 is provided between the turntable 6 and the equipment box 1, so that the material can move inside the testing box 2 along the rotation direction of the turntable 6. The testing box 2 has a discharge port 8 on the side close to the material distribution tray 3. The testing box 2 has a feed port 9 at the end near the discharge port 8 along the opposite rotation direction of the turntable 6. The testing box 2 has a medium temperature platform 10 and a high temperature platform 11 arranged sequentially from the feed port 9 to the top of the discharge port 8. A camera 12 is provided at the top of the testing box 2 at the end near the discharge port 8 along the rotation direction of the turntable 6.

[0040] A discharge slide plate 13 is provided between the discharge port 8 and the distribution tray 3. A bracket 14 is provided above the discharge slide plate 13. An electric push rod 15 is provided at the top of the bracket 14 and on the side opposite to the distribution tray 3. A vertically downward cylinder 16 is provided at the end of the electric push rod 15. A push plate 17 is fixedly connected to the end of the movable rod of the cylinder 16.

[0041] A control computer 20 is installed on one side of the top of the aforementioned equipment box 1.

[0042] The aforementioned control computer 20 is electrically connected to the camera 12, the medium-temperature stage 10, the high-temperature stage 11, the electric push rod 15, the cylinder 16, the first motor 4, and the second motor 7.

[0043] The aforementioned turntable 6 is a circular turntable.

[0044] A bracket is provided on the annular inner wall of the aforementioned turntable 6, and the bracket is connected to the output shaft of the second motor 7.

[0045] The aforementioned camera 12 is a CCD camera, which improves the accuracy of judging and analyzing product test results while also shortening the judgment time.

[0046] Each of the four corners at the bottom of the aforementioned equipment box 1 is equipped with a caster wheel 21.

[0047] Each of the four corners at the bottom of the aforementioned equipment box 1 is provided with a support leg 22.

[0048] When using the above-mentioned chip testing and sorting integrated machine, the working principle is as follows: When in use, the chip to be tested is placed on the turntable. According to the testing requirements (e.g., medium temperature test, high temperature test, medium temperature and high temperature test), the medium temperature stage and the high temperature stage are started separately, or the medium temperature stage and the high temperature stage are started simultaneously. For example, when performing a medium temperature test, the medium temperature stage is started to perform a medium temperature test on the chip. Then, the first motor is started to drive the turntable to rotate, so that the chip that has undergone the medium temperature test rotates to the area below the camera, and the camera takes a picture of the chip after the medium temperature test. The captured image is sent to the control computer for analysis, which solves the inconvenience of manual inspection in the past, reduces the possible errors of manual inspection, and improves the sorting efficiency of chips.

[0049] If the requirements are met, the product is judged to be qualified. At this time, the electric push rod is activated to push the chip onto the unloading slide plate using the push plate, and the second motor is activated to rotate the tray to one side of the slide, so that the qualified chip slides through the slide into one of the collection boxes.

[0050] If the requirements are not met, the chip is judged to be defective. At this time, the electric push rod is activated to push the chip onto the slide plate, and the micro motor is activated to rotate the tray to the other side of the slide, so that the defective chip slides to another collection box through another slide.

[0051] A second motor is installed between the turntable at the bottom of the testing chamber and the equipment box, allowing the material to move inside the testing chamber along the rotation direction of the turntable. The testing chamber has a discharge port on the side near the material distribution tray, and a feed port is installed at the end of the testing chamber opposite to the rotation direction of the turntable and near the discharge port. The testing chamber has a medium-temperature stage and a high-temperature stage arranged sequentially from the feed port to the top of the discharge port. By integrating the medium-temperature stage and the high-temperature stage into one testing chamber, the testing needs under different conditions can be met, and multiple chips can be tested simultaneously, improving the applicability and testing efficiency of the device.

[0052] Furthermore, a support is installed above the feeding slide plate, and an electric push rod is installed at the top of the support and on the side opposite to the collection box. A vertically downward cylinder is installed at the end of the electric push rod, and a push plate is fixedly connected to the end of the movable rod of the cylinder. The material is transferred through the cooperation between the cylinder and the electric push rod. It can adapt to chips of different sizes. Compared with the method of transferring chips by gripping them, the structure is simple and reliable, and it can also effectively avoid chip damage caused by inconsistent gripping force, thus improving the applicability and reliability of the device.

[0053] Furthermore, the material distribution tray is located on the side wall around the equipment box, and the first motor is set between the material distribution tray and the equipment box. A slide is set on both sides of the material distribution tray, and the material can slide along the slide into the collection box located on both sides of the equipment box, which can realize the rapid sorting of qualified and unqualified products, thereby greatly improving the product sorting efficiency.

[0054] The above embodiments are only for illustrating the technical concept and features of the present invention, and are intended to enable those skilled in the art to understand the content of the present invention and implement it accordingly. They should not be construed as limiting the scope of protection of the present invention. All equivalent changes or modifications made in accordance with the spirit and essence of the present invention should be covered within the scope of protection of the present invention.

Claims

1. A chip testing and sorting integrated machine, characterized in that: include: Equipment box (1), detection box (2), material distribution tray (3) and collection box (19). The material distribution tray (3) is located on the side wall around the equipment box (1). A first motor (4) is set between the material distribution tray (3) and the equipment box (1). The output shaft of the first motor (4) is sleeved with the bottom of the material distribution tray (3), so that the material distribution tray (3) can tilt to the left and right. A slide (18) is provided on both sides of the material distribution tray (3). When the material distribution tray (3) is tilted, the material distribution tray (3) is parallel to one of the slides (18), so that the material can slide along the slide (18) into the collection box (19) located on both sides of the equipment box (1). The outer circumferential wall of the detection box (2) is provided with several support plates (5) at intervals to fix it on the top of the equipment box (1). A turntable (6) is provided at the bottom of the detection box (2). A second motor (7) is provided between the turntable (6) and the equipment box (1) so that the material can move inside the detection box (2) along the rotation direction of the turntable (6). The detection box (2) has a discharge port (8) on the side close to the material distribution tray (3). The detection box (2) has a feed port (9) at the end close to the discharge port (8) along the opposite rotation direction of the turntable (6). The detection box (2) is provided with a medium temperature platform (10) and a high temperature platform (11) in sequence from the feed port (9) to the top of the discharge port (8). The detection box (2) has a camera (12) at the top of the end close to the discharge port (8) along the rotation direction of the turntable (6). A discharge slide plate (13) is provided between the discharge port (8) and the distribution tray (3). A bracket (14) is provided above the discharge slide plate (13). An electric push rod (15) is provided at the top of the bracket (14) and on the side opposite to the distribution tray (3). A vertically downward cylinder (16) is provided at the end of the electric push rod (15). A push plate (17) is fixedly connected to the end of the movable rod of the cylinder (16).

2. The chip testing and sorting integrated machine according to claim 1, characterized in that: A control computer (20) is provided on one side of the top of the equipment box (1).

3. The chip testing and sorting integrated machine according to claim 2, characterized in that: The control computer (20) is electrically connected to the camera (12), the medium temperature stage (10), the high temperature stage (11), the electric push rod (15), the cylinder (16), the first motor (4), and the second motor (7).

4. The chip testing and sorting integrated machine according to claim 1, characterized in that: The turntable (6) is a circular turntable.

5. The chip testing and sorting integrated machine according to claim 1, characterized in that: The camera (12) is a CCD camera.

6. The chip testing and sorting integrated machine according to claim 1, characterized in that: The equipment box (1) is equipped with a universal wheel (21) at each of the four corners at the bottom.

7. The chip testing and sorting integrated machine according to claim 1, characterized in that: The equipment box (1) is provided with a support leg (22) at each of the four corners at the bottom.

8. The chip testing and sorting integrated machine according to claim 7, characterized in that: The top of the support leg (22) is threaded to the equipment box (1), and a rubber pad is fixedly connected to the bottom.

9. The chip testing and sorting integrated machine according to claim 1, characterized in that: The equipment box (1) is provided with doors (23) on all three sides.

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