A continuous integrated circuit testing system and testing method thereof

Abstract

The present invention discloses a continuous integrated circuit test system and a test method thereof, which relates to the technical field of integrated circuit test systems, including a test equipment control module, a test software module, an automatic control system module and a decision feedback module, wherein the test equipment control module is used to control the automatic adaptation of the test equipment and IC to ensure consistency and repeatability of the test, the test software module is used to call the test software to test the IC and collect test data to generate a test report, the automatic control system module is used to schedule the execution of the test plan and monitor the test progress in real time, and the decision feedback module is used to track IC defects and optimize the design feedback of the test data. The present invention realizes the connection of the automatic equipment for IC testing by designing a test equipment control module, ensures the correct connection between the IC and the test equipment, provides a stable electrical connection, and solves the problem of connection errors in manual assembly connection.

Description

Technical Field

[0001] This invention relates to the field of integrated circuit testing system technology, specifically to a continuous integrated circuit testing system and its testing method. Background Technology

[0002] A continuous integrated circuit test system is a high-efficiency, automated system for testing integrated circuits (ICs). It is designed to ensure IC quality and stability, reduce failure rates, and improve production efficiency.

[0003] 1. Patent document US07676715B2 discloses an integrated circuit with a continuous test repeat function block, which enables multiple blocks to be tested at once by transmitting status information between the selected block and the test block during normal operation. However, the above patent cannot realize the function of connecting automated equipment for IC testing.

[0004] 2. Patent document KR1020150064385A discloses an integrated circuit testing device and system, which realizes the monitoring of the power consumption and operating status of a single integrated circuit through an integrated circuit monitoring unit and a wireless communication unit. However, the above patent cannot achieve intelligent control of IC testing.

[0005] 3. Patent document CN116359709A discloses an integrated circuit product testing system, which realizes the confirmation of the working status of abnormal integrated circuit products, determines whether it will affect normal use in the future, and improves the accuracy of the judgment results. However, the above patent cannot realize the continuous testing coordination function of IC testing.

[0006] 4. Patent document CN115808611A discloses an integrated circuit testing system that realizes automated detection and statistics of integrated circuits in different types of test objects, but the above patent cannot realize the tracking and feedback optimization function of IC test results.

[0007] In summary, the aforementioned patents fail to achieve automated equipment connection for IC testing, intelligent control of IC testing, continuous testing coordination for IC testing, and tracking and feedback optimization of IC test results. This results in problems such as low accuracy and reliability of IC testing, uncoordinated continuous testing, and inability to track anomalies and optimize IC design, leading to a decrease in IC product yield.

[0008] Therefore, this application proposes a continuous integrated circuit testing system and its testing method that can realize automated equipment connection for IC testing, intelligent control of IC testing, continuous testing coordination function for IC testing, and tracking, feedback and optimization function for IC test results. Summary of the Invention

[0009] The purpose of this invention is to provide a continuous integrated circuit testing system and its testing method to solve the technical problems mentioned in the background art, which are that the system cannot achieve automated equipment connection for IC testing, intelligent control of IC testing, continuous testing coordination function for IC testing, and tracking and feedback optimization function for IC test results, resulting in low accuracy, poor reliability, uncoordinated continuous testing, and inability to track anomalies and optimize IC design, thus reducing the yield of IC products.

[0010] To achieve the above objectives, the present invention provides the following technical solution: a continuous integrated circuit testing system, comprising a test equipment control module, a test software module, an automated control system module, and a decision feedback module;

[0011] The test equipment control module and the test software module are connected via signal lines, the automation control module and the test software module are connected via data lines, and the decision feedback module, the test software module, and the automation control system module are connected via plug-in data ports to transmit data.

[0012] The test equipment control module is used to control the test equipment to automatically adapt to the IC, ensuring consistent and repeatable testing. The test software module is used to call the test software to perform IC testing and collect test data to generate test reports. The automated control system module is used to schedule and execute the test plan and monitor the test progress in real time. The decision feedback module is used to track IC defects and provide feedback on optimized design based on the test data.

[0013] Preferably, the test equipment control module includes: a test seat control unit, a probe card control unit, and a test instrument control unit;

[0014] The test seat control unit uses an automated robotic arm to remove the IC from the storage rack and precisely place it on the test seat;

[0015] The probe card control unit controls the motor to ensure that the probes on the probe card contact the IC pins with appropriate pressure and position;

[0016] The test instrument control unit uses the GPIB communication protocol to communicate with the oscilloscope and signal generator test instruments, configure instrument parameters, and issue measurement commands.

[0017] Preferably, the test software module includes: a test plan management unit, a test case management unit, a test data acquisition unit, a data analysis and processing unit, and a report generation unit;

[0018] The test plan management unit creates test plans through GUI software, and test operators specify test phases and schedules through the test plan management unit.

[0019] The test case management unit categorizes test cases in the test case library according to function, performance, electrical characteristics, and failure modes, making them available for test operators to select and use.

[0020] The test data acquisition unit receives test data from the test equipment and instruments in real time through the data acquisition interface, and transmits the test data to the database for storage.

[0021] The data analysis and processing unit uses data analysis algorithms to perform statistical analysis, anomaly detection, and performance evaluation on the data collected by the test data acquisition unit.

[0022] The report generation unit is used by the test software to generate test reports from the database collected by the test data acquisition unit and the data analysis and processing unit, which are then analyzed and statistically analyzed by the data analysis and processing unit. These reports are available for test operators to view and export.

[0023] Preferably, the automated control system module includes: a test planning and scheduling unit, a test case execution control unit, and a test progress monitoring unit;

[0024] The test plan scheduling unit uses scheduling algorithms to automatically schedule test tasks based on the priority of the test plan and resource availability;

[0025] The test case execution control unit automates the execution of test cases, including parameter settings and control over test start and end.

[0026] The test progress monitoring unit monitors the test progress in real time using dashboards and an alarm system, and issues alerts to address any problems that may arise.

[0027] Preferably, the decision feedback module includes: a defect tracking and management unit and an automated decision support unit;

[0028] The defect tracking and management unit is used to record and track problems found during IC testing;

[0029] The automated decision support unit is used to make decisions on defect repair, design optimization, and secondary testing based on the results and defect information in the test report, and then feeds the decisions back to the test software module.

[0030] Preferably, the data analysis and processing unit uses the isolated forest algorithm as the data analysis algorithm. The core of the isolated forest algorithm is to identify outliers by constructing a random tree from the database data collected by the test data acquisition unit.

[0031] In an isolated forest, the distribution of data is simulated by recursively constructing binary trees. For each random tree, a feature is randomly selected from the dataset and denoted as f. A split value is randomly selected between the minimum and maximum values ​​of feature f and denoted as s. The data points are divided into left and right subtrees according to the split value s. This process is recursively carried out until the depth of the tree reaches the predetermined maximum depth or only one data point remains.

[0032] To calculate the anomaly score for a data point, its depth within the random tree needs to be determined. The shallower the depth, the more easily the data point is isolated, and therefore the lower the anomaly score. The formula for calculating the anomaly score is as follows:

[0033] s(x)=2-E(h(x)) / c

[0034] Where h(x) is the path length, defined as the depth from the root node to the data point x, E(h(x)) is the average path length, calculated as the average path length of all data points for a given random tree, s(x) is the anomaly score, and c is a constant value used for scaling.

[0035] Preferably, the data analysis and processing unit uses the isolated forest algorithm for anomaly detection. By setting a threshold t for the anomaly score, usually comparing the relative size of s(x) and t, anomaly values ​​are identified. If s(x) < t, the data point x is considered an anomaly value; otherwise, it is considered a normal value.

[0036] Preferably, the scheduling algorithm used in the test plan scheduling unit is the FCFS scheduling algorithm, and the pseudocode of the specific scheduling algorithm is as follows:

[0037]

[0038]

[0039] Test plans are submitted to a queue and then executed sequentially according to the FCFS scheduling algorithm, ensuring that test plans are executed in the order they are submitted.

[0040] Preferably, the testing method includes the following steps:

[0041] S1. First, the test plan development and preparation phase: Use the test plan management unit to create a test plan, including test objectives, planning phases and schedule. Then, select an appropriate test case library (functional, performance, electrical characteristics, failure modes) and use the test case management unit to select and configure test cases.

[0042] S2. Then, proceed to the test execution phase: Use the test seat control unit to correctly install the IC on the test seat, use the probe card control unit to ensure the correct position and contact pressure of the probe card, and use the test instrument control unit to configure and trigger the test instrument, generate test signals, and measure the IC response.

[0043] S3. Then, the data processing stage begins: The data processing and analysis unit performs statistics, isolated anomaly detection, and performance evaluation on the data collected by the test data acquisition unit in the database. The data is then transmitted to the report generation unit. The report generation unit generates a test report from the database collected by the test data acquisition unit and the data analysis and statistical results from the data processing unit. The report is stored in the test software's user interface for test operators to view and export.

[0044] S4. Finally, use the defect tracking and management unit to record and track problems found in the IC.

[0045] Preferably, the testing method further includes the following steps:

[0046] S11. After the test plan is formulated, the test plan scheduling unit uses the FCFS scheduling algorithm to schedule the first test plan first and execute the test plan continuously.

[0047] S21. The test progress monitoring unit monitors the test progress in real time using a dashboard and alarm system. When a response error or disconnection occurs during the test, the test progress monitoring unit issues an alarm to remind the tester to calibrate the test software and test IC.

[0048] S31. The test case execution control unit automatically executes the test cases and transmits the collected data to the test database for storage through the test data acquisition unit.

[0049] S41. Based on the abnormal situation information in the test report generation results, the automated decision support unit feeds back the defect information to the user interface and test software, performs secondary testing based on the abnormal information in the test results, and issues a decision plan to optimize the IC design.

[0050] Compared with the prior art, the beneficial effects of the present invention are:

[0051] 1. This invention, by incorporating a test equipment control module, achieves automated equipment connection for IC testing, ensuring correct connection between the IC and the test equipment, providing a stable electrical connection, and solving the problem of connection errors that occur during manual assembly.

[0052] 2. This invention, through the design of a test software module, realizes intelligent management and control of IC testing, ensuring the accuracy of IC testing, selecting appropriate test cases for testing, and generating analysis reports based on test data. This solves the problem that IC test results cannot be visualized, and improves the intelligence of IC testing.

[0053] 3. This invention, through the design of an automated control system module, realizes the continuous test coordination function for IC testing, solving the problem of test conflicts and delays caused by chaotic test plans, which leads to inaccurate test results;

[0054] 4. This invention, by incorporating a decision feedback module, enables the tracking and feedback optimization of IC test results, thereby improving the yield of IC products and optimizing IC design. Attached Figure Description

[0055] Figure 1 This is a schematic diagram of the continuous integrated circuit testing system of the present invention;

[0056] Figure 2 This is a schematic diagram of the control module of the test equipment of the present invention;

[0057] Figure 3 This is a schematic diagram of the test software module of the present invention;

[0058] Figure 4 This is a schematic diagram of the automated control system module of the present invention;

[0059] Figure 5 This is a schematic diagram of the decision feedback module of the present invention. Detailed Implementation

[0060] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0061] In the description of this invention, it should be noted that the terms "upper," "lower," "inner," "outer," "front end," "rear end," "both ends," "one end," and "the other end," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing this invention and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0062] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installed," "equipped with," "connected," etc., should be interpreted broadly. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be a connection within two components. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.

[0063] Example 1

[0064] Please see Figures 1-5 The present invention provides an embodiment of a continuous integrated circuit testing system and testing method, comprising a test equipment control module, a test software module, an automated control system module, and a decision feedback module;

[0065] The test equipment control module and the test software module are connected via signal lines, the automation control module and the test software module are connected via data lines, and the decision feedback module, the test software module, and the automation control system module are connected via plug-in data ports to transmit data.

[0066] The test equipment control module is used to control the test equipment to automatically adapt to the IC, ensuring consistent and repeatable testing. The test software module is used to call the test software to test the IC and collect test data to generate test reports. The automated control system module is used to schedule and execute the test plan and monitor the test progress in real time. The decision feedback module is used to track IC defects and provide feedback on optimized design based on the test data.

[0067] Furthermore, firstly, several test plans are created using the test software module, and various test case libraries are matched. Next, the test equipment control module precisely connects the IC to the test instrument, ensuring good contact between the IC and the test equipment and preventing test deviations. Then, the automated control system module schedules the test plans to achieve continuous testing and real-time monitoring of test progress, ensuring smooth testing and complete implementation of each test. Finally, test reports are generated by collecting test data, and the decision feedback module uses the test data to track and repair IC defects and provide feedback on IC design optimization.

[0068] Example 2

[0069] Please see Figure 1 and Figure 2 The present invention provides an embodiment of a continuous integrated circuit testing system and testing method, wherein the testing equipment control module includes: a test seat control unit, a probe card control unit, and a test instrument control unit;

[0070] The test seat control unit uses an automated robotic arm to remove the IC from the storage rack and precisely place it on the test seat;

[0071] The probe card control unit controls the motor to ensure that the probes on the probe card contact the IC pins with appropriate pressure and position;

[0072] The test instrument control unit uses the GPIB communication protocol to communicate with the oscilloscope and signal generator test instruments, configure instrument parameters, and issue measurement commands.

[0073] Furthermore, when a specific IC needs to be tested, the operator inputs the IC's identifier through the test software interface, and the system will automatically perform robotic arm operations to install the IC onto the test seat. Before the test begins, the system will automatically adjust the position and pressure of the probe card according to the IC's pin arrangement to ensure a good electrical connection. During the test, the test software automatically communicates with the required test instruments to configure their measurement parameters in order to generate the necessary test signals and acquire data.

[0074] Example 3

[0075] Please see Figure 1 and Figure 3 The present invention provides an embodiment of a continuous integrated circuit testing system and a testing method thereof, wherein the testing software module includes: a test plan management unit, a test case management unit, a test data acquisition unit, a data analysis and processing unit, and a report generation unit;

[0076] The test plan management unit creates test plans through GUI software, and test operators specify test phases and schedules through the test plan management unit.

[0077] The test case management unit categorizes test cases in the test case library according to function, performance, electrical characteristics, and failure modes, making them available for test operators to select and use.

[0078] The test data acquisition unit receives test data from the test equipment and instruments in real time through the data acquisition interface, and transmits the test data to the database for storage.

[0079] The data analysis and processing unit uses data analysis algorithms to perform statistical analysis, anomaly detection, and performance evaluation on the data collected by the test data acquisition unit.

[0080] The report generation unit is used by the test software to generate test reports from the database collected by the test data acquisition unit and the data analysis and processing unit, which are then analyzed and statistically analyzed by the data analysis and processing unit. These reports are available for the test operators to view and export.

[0081] Furthermore, the operator uses the testing software interface to create a test plan, select the IC to be tested and the corresponding test cases, and schedule the test date and time. The operator selects appropriate test cases in the testing software and can customize the test cases as needed. After the test starts, the test data is automatically collected and stored in the database to ensure the integrity and accuracy of the data. The test data is automatically transmitted to the data analysis unit, which performs various analyses, detects abnormal data points, and calculates performance indicators. Once the test is completed and the data analysis is finished, the testing software automatically uses the report generation module to generate a test report for the operator to view or export.

[0082] Example 4

[0083] Please see Figure 1 and Figure 4 The present invention provides an embodiment of a continuous integrated circuit testing system and testing method, wherein the automated control system module includes: a test planning and scheduling unit, a test case execution control unit, and a test progress monitoring unit;

[0084] The test plan scheduling unit uses scheduling algorithms to automatically schedule test tasks based on the priority of the test plan and resource availability;

[0085] The test case execution control unit automates the execution of test cases, including parameter settings and control over test start and end.

[0086] The test progress monitoring unit monitors the test progress in real time using a dashboard and alarm system, and issues alarms to deal with any problems that may arise.

[0087] Furthermore, the system automatically schedules test tasks based on the test plan and priorities, ensuring that high-priority tasks are executed first. The test software automatically executes tests according to the test case settings, captures data, and stores the results in the database. Operators can view the dashboard at any time to understand the test progress, and the system will automatically issue alerts to deal with potential problems.

[0088] Example 5

[0089] Please see Figure 1 and Figure 5 The present invention provides an embodiment of a continuous integrated circuit testing system and testing method, wherein the decision feedback module includes a defect tracking management unit and an automated decision support unit;

[0090] The defect tracking and management unit is used to record and track problems found during IC testing;

[0091] The automated decision support unit is used to make decisions on defect repair, design optimization, and secondary testing based on the results and defect information in the test report, and then feeds the decisions back to the test software module.

[0092] Furthermore, based on test reports, decisions can be made to take action, such as fixing defects, adjusting production parameters, or conducting further tests. This feedback is used to improve the design and manufacturing process of ICs.

[0093] The working principle is as follows: First, the test environment is initialized, and the test equipment control module ensures that the test equipment and IC are correctly connected and installed. Next, the test software module is used to formulate a continuous and appropriate test plan, clearly defining the test objectives, phases and schedule, and selecting an appropriate test case library for parameter configuration. Then, at the start of the test, the automated control system module is used to perform continuous testing and monitor the test process in real time, outputting a test report. Finally, the decision feedback module is used to track and fix defects in the test result report, while feeding back abnormal information to the test software, which makes optimization decisions to improve IC yield.

[0094] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the invention can be implemented in other specific forms without departing from its spirit or essential characteristics. Therefore, the embodiments should be considered in all respects as exemplary and non-limiting, and the scope of the invention is defined by the appended claims rather than the foregoing description. Thus, all variations falling within the meaning and scope of equivalents of the claims are intended to be included within the present invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

Claims

1. A continuous integrated circuit testing system, characterized in that: It includes test equipment control module, test software module, automatic control system module and decision feedback module; The test equipment control module is connected to the test software module via a signal line, the automation control system module is connected to the test software module via a data line, and the decision feedback module is connected to the test software module and the automation control system module via a plug-and-unplug data port to transmit data; The test equipment control module is used to control the automatic adaptation of the test equipment and IC to ensure consistency and repeatability of the test; the test software module is used to call the test software to test the IC and collect test data to generate a test report; the automatic control system module is used to schedule the execution of the test plan and monitor the test progress in real time; the decision feedback module is used to track IC defects and optimize the design feedback for the test data; The test equipment control module includes: a test seat control unit, a probe card control unit and a test instrument control unit; The test seat control unit takes the IC from the storage rack and places it precisely on the test seat by using an automated robotic arm; The probe card control unit ensures that the probes on the probe card contact the IC pins with appropriate pressure and position by controlling the motor; The test instrument control unit uses the GPIB communication protocol to communicate with the oscilloscope and signal generator test instruments, configure instrument parameters and issue measurement instructions; The test software module includes: a test plan management unit, a test case management unit, a test data acquisition unit, a data analysis and processing unit, and a report generation unit; The test plan management unit creates a test plan through the GUI software, and the test operator specifies the test phases and schedule through the test plan management unit; The test case management unit classifies the test cases in the test case library according to functions, performances, electrical characteristics and failure modes for the test operators to select and use; The test data acquisition unit receives the test data of the test equipment and instruments in real time through the data acquisition interface, and transmits the test data to the database for storage; The data analysis processing unit uses a data analysis algorithm to perform statistical analysis, anomaly detection and performance evaluation on the data collected by the test data collection unit; The report generation unit is used for the test software to generate a test report for the test operator to view and export the database collected by the test data collection unit and the data analysis and processing unit's statistical data analysis results; The automated control system module includes: a test plan scheduling unit, a test case execution control unit and a test progress monitoring unit; The test plan scheduling unit uses a scheduling algorithm to automatically schedule test tasks based on the priority of the test plan and resource availability; The test case execution control unit realizes the automated execution of test cases, including parameter setting, test start and end control; The test progress monitoring unit monitors the test progress in real time by using a dashboard and alarm system, and issues alarms to respond to problems that arise at any time; The decision feedback module includes: a defect tracking management unit and an automated decision support unit; The defect tracking management unit is used to record and track problems found during IC testing; The automated decision support unit is used to make decisions on defect repair, design optimization, and secondary testing based on the test report results and defect information, and feeds back the decisions to the test software module; The data analysis processing unit uses an isolation forest algorithm as the data analysis algorithm. The core of the isolation forest algorithm is to identify outliers by constructing a random tree for the database data collected by the test data collection unit; In the isolation forest, the distribution of data is simulated by recursively constructing a binary tree. For each random tree, a feature is randomly selected from the data set and recorded as f. A split value is randomly selected between the minimum and maximum values ​​of feature f and recorded as s. The data point is divided into a left subtree and a right subtree according to the split value s. This process is recursively performed until the depth of the tree reaches the predetermined maximum depth or only one data point is left. In order to calculate the anomaly score of a data point, it is necessary to determine it based on its depth in the random tree. The shallower the depth, the easier it is for the data point to be isolated, and therefore the lower the anomaly score. The anomaly score calculation formula is as follows: Where h(x) is the path length, defined as the depth from the root node to reach data point x, E(h(x)) is the average path length, which is the average of the path lengths of all data points for a given random tree, s(x) is the anomaly score, and c is a constant value used for scaling.

2. A continuous integrated circuit test system according to claim 1, characterized in that: The data analysis processing unit uses the isolated forest algorithm to perform anomaly detection, and identifies outliers by setting a threshold t of the anomaly score, usually the relative size of s(x) compared with t. If s(x) < t, the data point x is regarded as an outlier, otherwise it is regarded as a normal value.

3. A continuous integrated circuit testing system according to claim 1, characterized in that: The scheduling algorithm used in the test plan scheduling unit is the FCFS scheduling algorithm. The specific scheduling algorithm pseudo code is as follows: # Define the test plan queue and store the test plans in the order they are submitted test_plan_queue = [] # Submit the test plan to the queue def submit_test_plan(test_plan): test_plan_queue.append(test_plan) # Execute the test plan in the test plan queue def execute_test_plans(): while len(test_plan_queue) > 0: # Take the next test plan to be executed from the queue current_test_plan = test_plan_queue.pop(0) # Execute the current test plan execute_test_plan(current_test_plan) # Output the test plan information that has been executed print("Execute test plan:", current_test_plan) # Example: Submit a test plan submit_test_plan("Test Plan 1") submit_test_plan("Test Plan 2") submit_test_plan("Test Plan 3") # Execute the test plan execute_test_plans() The test plan is submitted to the queue and then executed continuously according to the FCFS scheduling algorithm, so that the test plans are executed first in the order they are submitted.

4. A testing method for a continuous integrated circuit testing system according to any one of claims 1 to 3, characterized in that: The test method comprises the following steps: S1. First, the test plan formulation and preparation phase: Use the test plan management unit to create a test plan, including test objectives, planning phases and schedules, then select the appropriate test case library (function, performance, electrical characteristics, failure mode), and use the test case management unit to select and configure test cases; S2, then, enter the test execution phase: use the test seat control unit to correctly mount the IC on the test seat, use the probe card control unit to ensure the correct position and contact pressure of the probe card, use the test instrument control unit to configure and trigger the test instrument, generate test signals and measure IC responses; S3, then, enter the data processing stage: the data processing and analysis unit performs statistics, isolated abnormality detection and performance evaluation on the data in the database collected by the test data collection unit, and transmits the data to the report generation unit. The report generation unit generates a test report based on the database collected by the test data collection unit and the data analysis and processing unit. The statistical data results are stored in the test software recording user interface for the test operator to view and export; S4. Finally, use the defect tracking and management unit to record and track the problems found in the IC.

5. The testing method of a continuous integrated circuit testing system according to claim 4, characterized in that: The test method further comprises the following steps: S11. After the test plan is formulated, the test plan scheduling unit uses the FCFS scheduling algorithm to prioritize the first test plan and continuously execute the test plan; S21, the test progress monitoring unit monitors the test progress in real time by using a dashboard and an alarm system. When a response error or disconnection occurs during the test, the test progress monitoring unit issues an alarm to remind the tester to calibrate the test software and the test IC; S31, using the test case execution control unit to automatically execute the test case, and transmitting the collected data to the test database for storage through the test data collection unit; S41. Based on the abnormal situation information in the test report generation result, the automated decision support unit feeds back the defect information to the user interface and the test software, performs secondary inspection according to the abnormal information in the test result, and issues a decision plan for optimizing the IC design.

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