Floating transfer structure and chip testing device

Abstract

The present invention belongs to the field of chip testing technology, and discloses a floating transfer structure and a chip testing device. The chip testing device comprises a turntable, a testing machine and a floating transfer structure, wherein a test seat is arranged on the turntable, and a test PCB board is arranged on the test seat, and the turntable rotates to rotate a plurality of test seats to the position of the floating transfer structure in sequence. The floating transfer structure comprises a base, a floating seat, a probe and a drive control component, wherein the base is arranged on the testing machine, and the floating seat is arranged on the base to move up and down through an elastic member; the probe is inserted into the floating seat, and the drive control component selectively presses the floating seat, so that the probe floats and is connected or separated from the test PCB board. By arranging the test seat on the turntable, the chip to be tested is grabbed and placed in the test seat, and the turntable is rotated to perform continuous multiple tests, thereby avoiding damage to the chip to be tested due to repeated grabbing, and improving the detection efficiency; there is no need for the turntable to float as a whole, thereby improving the floating speed and structural stability.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing, and in particular to a floating transfer structure and a chip testing device. Background Art

[0002] KGD chips (Known good die, integrated circuits of multi-chip components) are qualified chips. When the operator completes production and the production yield is above 90%, the remaining 10% that pass the test are KGD. Especially for automotive-grade chips (chips used for automotive control), there are more stringent requirements in terms of temperature, humidity, aging resistance, etc.

[0003] The existing chip testing process is completed by automated equipment. The grabbing mechanism grabs the chip to be tested to the chip tester for testing. The chip tester is usually equipped with multiple test stations, and the chip to be tested is grabbed in turn to different test stations for testing. A test seat is provided on the test station, and the test seat includes an upper pressure cover and a lower base. The lower base is set on the workbench, and the upper pressure cover is set on the pressure head. Each time the chip is transferred to a test station, it is necessary to control the pressure head to drive the upper pressure cover to press down once, and drive the lower base to float as a whole through the turntable set at the test station to achieve the connection or disconnection of the test seat. However, due to the weight of the upper pressure cover itself, the floating speed is slow and the stability is poor; and repeated grabbing of the chip to be tested is prone to damage, and the detection efficiency is low.

[0004] That is, the existing test equipment sets the turntable to float as a whole and needs to repeatedly grab the chip to be tested, which has the disadvantages of slow floating speed, poor stability, easy chip damage and low detection efficiency. Summary of the invention

[0005] The purpose of the present invention is to provide a floating transfer structure and a chip testing device to solve the problems of slow floating speed, poor stability, easy chip damage and low detection efficiency in the overall floating of the turntable in the existing testing equipment.

[0006] To achieve this object, the present invention adopts the following technical solutions:

[0007] The present invention provides a floating transfer structure, which includes:

[0008] A base, used for being set on a testing machine;

[0009] A floating seat, the floating seat being arranged on the base so as to be movable up and down through an elastic member;

[0010] A probe, which is inserted into the floating seat and has one end passing through the base and connected to the testing machine;

[0011] The driving control component selectively presses the floating seat to drive the probe to float so that the other end of the probe is connected to or separated from the test PCB board.

[0012] As an optional technical solution for a floating transfer structure, a mounting groove is provided on the base, the floating seat and the elastic member are both arranged in the mounting groove, the elastic member is located between the base and the floating seat, and the floating seat is slidably matched with the groove wall of the mounting groove.

[0013] As an optional technical solution of the floating transfer structure, a first guide blind hole is provided at the bottom of the mounting groove, and the elastic member is partially disposed in the first guide blind hole;

[0014] And / or, a second guide blind hole is provided at the bottom of the floating seat, and the elastic member is partially arranged in the second guide blind hole.

[0015] As an optional technical solution of a floating transfer structure, the drive control component includes:

[0016] A support frame, arranged on the testing machine;

[0017] A driving member, disposed on the supporting frame;

[0018] The pressing block is connected to the driving member, and the driving member drives the pressing block to move and press the floating seat.

[0019] As an optional technical solution of a floating transfer structure, the floating seat includes:

[0020] A sliding portion, slidably disposed in the mounting groove;

[0021] The extension part is arranged on a side of the sliding part away from the mounting groove, the cross-sectional area of ​​the extension part is smaller than the cross-sectional area of ​​the sliding part, and the probe is arranged in the sliding part and the extension part.

[0022] As an optional technical solution of a floating transition structure, the sliding portion has a force-bearing end surface on the side facing the extension portion, and the end of the pressure block is provided with a avoidance opening. The extension portion is inserted into the avoidance opening, and the pressure block presses against the force-bearing end surface.

[0023] As an optional technical solution for a floating adapter structure, a through hole is provided at the bottom of the mounting groove, the inner wall of the through hole radially extends inward to form a limiting protrusion, the probe portion is inserted into the through hole, and the limiting protrusion is used to stop the probe.

[0024] As an optional technical solution for a floating transfer structure, the number of the probes is the same as the number of connection points of the test PCB board.

[0025] As an optional technical solution of a floating transfer structure, the elastic member includes a spring.

[0026] The present invention provides a chip testing device, which includes a turntable, a tester and the floating transfer structure. The turntable is provided with a plurality of test seats, the test PCB board is arranged on the test seat, and the turntable rotates to rotate the plurality of test seats to the position of the floating transfer structure in sequence.

[0027] Beneficial effects:

[0028] The present invention provides a floating transfer structure, which includes a base, a floating seat, a probe and a drive control component. The base is used to be arranged on a test machine, and the floating seat is arranged on the base so as to be movable up and down through an elastic member; the probe is inserted into the floating seat, and one end of the probe passes through the base and is connected to the test machine; the drive control component selectively presses the floating seat to drive the probe to float, so that the other end of the probe is connected to or separated from the test PCB board. By setting the floating transfer structure, one end of the probe is connected to the test machine, and the probe floats up and down so as to be able to extend or shorten, so that the other end of the probe is connected to or separated from the test PCB board of the test seat, without the need for the overall floating of the turntable, thereby improving the floating speed and structural stability.

[0029] The present invention provides a chip testing device, which includes a turntable, a tester and a floating transfer structure. The turntable is provided with a plurality of test seats, and the test seats are provided with a test PCB board. The turntable rotates to rotate the plurality of test seats to the position of the floating transfer structure in sequence. By arranging the test seats on the turntable, the chip to be tested is grabbed and placed in the test seats, and the turntable is rotated to perform multiple consecutive tests, thereby avoiding damage to the chip to be tested due to repeated grabbing, and improving the detection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] Figure 1 The chip testing device provided by the embodiment of the present invention is a partial structural diagram Figure 1 ;

[0031] Figure 2 The chip testing device provided by the embodiment of the present invention is a partial structural diagram Figure 2 ;

[0032] Figure 3 yes Figure 2 A partial enlarged view of the middle A;

[0033] Figure 4 is a partial cross-sectional view of a floating transfer structure provided by an embodiment of the present invention;

[0034] Figure 5 It is a schematic diagram of the testing process of the chip testing device provided by an embodiment of the present invention.

[0035] In the figure:

[0036] 100, floating transfer structure; 200, turntable; 210, test socket; 211, test PCB board; 300, test machine;

[0037] 10. Base; 20. Floating seat; 30. Elastic member; 40. Probe; 50. Drive control assembly; 51. Drive member; 52. Press block. DETAILED DESCRIPTION

[0038] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the present invention, rather than to limit the present invention. It should also be noted that, for ease of description, only parts related to the present invention, rather than all structures, are shown in the accompanying drawings.

[0039] In the description of the present invention, unless otherwise clearly specified and limited, the terms "connected", "connected", and "fixed" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0040] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may include that the first and second features are in direct contact, or may include that the first and second features are not in direct contact but are in contact through another feature between them. Moreover, a first feature being "above", "above" and "above" a second feature includes that the first feature is directly above and obliquely above the second feature, or simply indicates that the first feature is higher in level than the second feature. A first feature being "below", "below" and "below" a second feature includes that the first feature is directly below and obliquely below the second feature, or simply indicates that the first feature is lower in level than the second feature.

[0041] In the description of this embodiment, the terms "upper", "lower", "right", etc., directions or positional relationships are based on the directions or positional relationships shown in the drawings, and are only for the convenience of description and simplification of operation, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are only used to distinguish in the description and have no special meaning.

[0042] like Figures 1 to 4As shown, the present invention provides a floating transfer structure 100 and a chip testing device, which includes a floating transfer structure 100, a turntable 200 and a testing machine 300. The turntable 200 is provided with a plurality of test sockets 210, and the test sockets 210 are provided with a test PCB board 211 (Printed Circuit Board). The turntable 200 rotates to rotate the plurality of test sockets 210 to the position of the floating transfer structure 100 in sequence.

[0043] The floating transfer structure 100 includes a base 10, a floating seat 20, a probe 40 and a drive control component 50. The base 10 is set on the test machine 300. The floating seat 20 is set on the base 10 so as to be movable up and down through an elastic member 30. The probe 40 is passed through the floating seat 20 and one end of the probe 40 passes through the base 10 to be connected with the test machine 300. The drive control component 50 selectively presses the floating seat 20 to drive the probe 40 to float so that the other end of the probe 40 is connected to or separated from the test PCB board 211.

[0044] In this embodiment, the turntable 200 drives the test seat 210 to rotate to the top of the floating adapter structure 100; when the drive control component 50 presses the floating seat 20 downward, the floating seat 20 drives the probe 40 to float downward, and the probe 40 is in a pressed state separated from the test PCB board 211; when the drive control component 50 is released, the floating seat 20 drives the probe 40 to float upward under the action of the elastic member 30, and the probe 40 is in a released state connected to the test PCB board 211.

[0045] It can be understood that, in other embodiments, the floating adapter structure 100 can be provided with one or more groups; a turntable 200 can also be provided to drive the test seat 210 to rotate to the bottom of the floating adapter structure 100; the driving control component 50 is used to press the floating seat 20 upward, so that the probe 40 floats upward and connects with the test PCB board 211; when the driving control component 50 is released, the floating seat 20 and the probe 40 float downward under the action of the elastic member 30 and separate from the test PCB board 211.

[0046] The probe 40 is a spring-type probe; the probe 40 has a spring structure inside, and the probe 40 includes a needle tube, a needle and a spring structure. The spring structure can elastically support the needle, so that the probe 40 is pressed to float downward and shorten. When the drive control component 50 is released, the needle floats upward under the action of the spring structure and extends; the specific structure of the probe 40 can be set with reference to the prior art; the number of probes 40 is the same as the number of connection points of the test PCB board 211.

[0047] By setting a test socket 210 on the turntable 200, the chip to be tested is captured and placed in the test socket 210, and the turntable 200 is rotated to perform multiple consecutive tests, thereby avoiding damage to the chip to be tested due to repeated capture, thereby improving the detection efficiency; by setting a floating adapter structure 100, one end of the probe 40 remains connected to the test machine 300, and the probe 40 floats up and down to extend or shorten, thereby achieving connection or separation between the probe 40 and the test PCB board 211 of the test socket 210, without the need for the turntable 200 to float as a whole, thereby improving the floating speed and structural stability.

[0048] Specifically, the drive control assembly 50 includes a support frame, a driving member 51 and a pressing block 52. The support frame is arranged on the test machine 300, the driving member 51 is arranged on the support frame, the pressing block 52 is connected to the driving member 51, and the driving member 51 drives the pressing block 52 to move and press the floating seat 20. By arranging the support frame to arrange the driving member 51 at a certain height, there is space for the pressing block 52 to press the floating seat 20 downward.

[0049] In this embodiment, the support frame includes a support base, a bracket and a connecting plate. The support base is a rectangular frame, and the support base is arranged on the top of the testing machine 300; the bracket is in a "X" shape, and the bracket is arranged on the support base; the connecting plate is L-shaped, one end of the connecting plate is overlapped and fixed on the top of the bracket, and the other end of the connecting plate extends in the vertical direction for fixing the driving member 51; under the drive of the driving member 51, the pressing block 52 can move up and down in the vertical direction.

[0050] Preferably, the driving member 51 is a cylinder. By setting the cylinder as the driving member 51, the structure is simple and the cost is low, the force transmission is stable and easy to control, and the stable operation of the chip testing device is effectively guaranteed.

[0051] See also Figure 4 The base 10 is provided with a mounting groove, the floating seat 20 and the elastic member 30 are both arranged in the mounting groove, the elastic member 30 is located between the base 10 and the floating seat 20, and the floating seat 20 is slidably matched with the groove wall of the mounting groove. By providing the mounting groove on the base 10, the floating seat 20 is slidably matched with the groove wall of the mounting groove, so that the floating seat 20 can move up and down relative to the base 10, so that it is convenient to arrange the elastic member 30 in the mounting groove, the elastic member 30 is located between the base 10 and the floating seat 20 to provide a force opposite to the driving force of the driving member 51, and when the driving member 51 is released, the floating seat 20 rebounds and floats under the action of the elastic member 30.

[0052] In order to ensure the rebound effect, at least one row of elastic members 30 is provided on both sides of the installation slot, and each row is evenly spaced with multiple elastic members 30. In this embodiment, the elastic members 30 are arranged in two rows, and each row is evenly spaced with 6 elastic members 30; the elastic members 30 are springs.

[0053] In order to ensure the stability of the elastic member 30, a first guide blind hole is provided at the bottom of the mounting groove, and the elastic member 30 is partially disposed in the first guide blind hole; a second guide blind hole is provided at the bottom of the floating seat 20, and the elastic member 30 is partially disposed in the second guide blind hole. By providing the guide blind hole on the base 10 or the floating seat 20, and partially arranging the elastic member 30 inside the guide blind hole, the direction of compression or rebound of the elastic member 30 is limited, which is conducive to ensuring that the floating seat 20 moves up and down smoothly.

[0054] Furthermore, the floating seat 20 includes a sliding portion and an extension portion, the sliding portion is slidably disposed in the mounting groove, the extension portion is disposed on a side of the sliding portion away from the mounting groove, the cross-sectional area of ​​the extension portion is smaller than the cross-sectional area of ​​the sliding portion, and the probe 40 is inserted into the sliding portion and the extension portion. By inserting the probe 40 into the sliding portion and the extension portion, and setting the cross-sectional area of ​​the extension portion to be smaller than the cross-sectional area of ​​the sliding portion, the probe 40 is mostly disposed inside the floating seat 20, thereby effectively protecting the probe 40, and the weight of the floating seat 20 can be reduced, thereby avoiding serious loss of the elastic member 30 due to the excessive weight of the floating seat 20.

[0055] Specifically, the sliding portion has a force-bearing end face on the side facing the extension portion, and a relief opening is provided at the end of the pressing block 52. The extension portion is inserted into the relief opening, and the pressing block 52 presses against the force-bearing end face. By providing the relief opening on the pressing block 52 and inserting the extension portion into the relief opening, the pressing block 52 can press against the circumference of the floating seat 20, which is conducive to ensuring that the floating seat 20 is subjected to uniform force.

[0056] In this embodiment, the probe 40 is vertically inserted into the floating seat 20 and both ends extend out of the floating seat 20 ; the extension portion is disposed at the middle of the sliding portion.

[0057] A through hole is provided at the bottom of the mounting groove, and the inner wall of the through hole extends radially inward to form a limiting protrusion, and the probe 40 is partially inserted into the through hole, and the limiting protrusion is used to stop the probe 40. By providing a through hole on the mounting groove, the end of the probe 40 can extend from the through hole so as to be connected to the direct docking PCB (DDP) on the top of the test machine 300; by providing the limiting protrusion, the maximum downward pressing distance of the probe 40 is limited.

[0058] The following is the use process of the floating transfer structure 100:

[0059] See also Figure 5 Before the test, the driving member 51 drives the pressing block 52 to press the floating seat 20 downward, and the floating seat 20 moves downward and drives the probe 40 to float downward, and the probe 40 is shortened, so that the probe 40 remains in a pressed state.

[0060] The turntable 200 drives the test seat 210 to rotate to the position of the floating adapter structure 100 , so that the test PCB board 211 on the test seat 210 is located above the floating seat 20 .

[0061] After the test PCB board 211 is in place, the driving member 51 drives the pressing block 52 to move upward, and the floating seat 20 moves upward under the action of the elastic member 30, so that the probe 40 is gradually released, the probe 40 floats upward, and the probe 40 stretches until it contacts and connects with the test PCB board 211, and the testing machine 300 starts testing.

[0062] After the test is completed, the driving member 51 drives the pressing block 52 to press the floating seat 20 downward again, so that the probe 40 remains in the pressed state, and the turntable 200 drives the test seat 210 to rotate to the next station, and the test seat 210 at the previous station enters the test station, and the test is repeated in a reciprocating cycle.

[0063] By rotating the multiple test sockets 210 on the turntable 200 to the position of the floating adapter structure 100 in sequence, the test sockets 210 can be located in front of the floating adapter structure 100, and the test PCB board 211 is located above the floating socket 20, which is convenient for repairing and replacing the test sockets 210.

[0064] Obviously, the above embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention. For those skilled in the art, various obvious changes, readjustments and substitutions can be made without departing from the protection scope of the present invention. It is not necessary and impossible to list all the embodiments here. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the claims of the present invention.

Claims

1. Floating transfer structure, characterized in that: include: A base (10) used for being arranged on a testing machine (300); A floating seat (20), the floating seat (20) being disposed on the base (10) so as to be movable up and down via an elastic member (30); A probe (40) is inserted into the floating seat (20) and one end of which passes through the base (10) and is connected to the testing machine (300); A driving control component (50) selectively presses the floating seat (20) to drive the probe (40) to float so that the other end of the probe (40) is connected to or separated from the test PCB (211); The base (10) is provided with a mounting groove, the floating seat (20) and the elastic member (30) are both arranged in the mounting groove, the elastic member (30) is located between the base (10) and the floating seat (20), and the floating seat (20) is slidably matched with the groove wall of the mounting groove; The floating seat (20) comprises: A sliding portion, slidably disposed in the mounting groove; The extension part is arranged on a side of the sliding part away from the mounting groove, the cross-sectional area of ​​the extension part is smaller than the cross-sectional area of ​​the sliding part, and the probe (40) is arranged through the sliding part and the extension part.

2. The floating transfer structure according to claim 1, characterized in that: A first guide blind hole is provided at the bottom of the mounting groove, and the elastic member (30) is partially arranged in the first guide blind hole; And / or, a second guide blind hole is provided at the bottom of the floating seat (20), and a portion of the elastic member (30) is disposed in the second guide blind hole.

3. The floating transfer structure according to claim 1, characterized in that: The drive control component (50) comprises: A support frame, arranged on the testing machine (300); A driving member (51) is arranged on the support frame; The pressing block (52) is connected to the driving member (51), and the driving member (51) drives the pressing block (52) to move and press against the floating seat (20).

4. The floating transfer structure according to claim 3, characterized in that: The sliding portion has a force-bearing end surface on a side facing the extension portion, and an escape opening is provided at the end of the pressing block (52). The extension portion is inserted into the escape opening, and the pressing block (52) presses against the force-bearing end surface.

5. The floating transfer structure according to claim 1, characterized in that: A through hole is provided at the bottom of the mounting groove, the inner wall of the through hole radially extends inward to form a limiting protrusion, the probe (40) is partially inserted into the through hole, and the limiting protrusion is used to stop the probe (40).

6. The floating transfer structure according to any one of claims 1 to 5, characterized in that: The number of the probes (40) provided is the same as the number of connection points of the test PCB board (211).

7. The floating transfer structure according to any one of claims 1 to 5, characterized in that: The elastic member (30) comprises a spring.

8. A chip testing device, characterized in that: The invention comprises a turntable (200), a testing machine (300), and a floating transfer structure according to any one of claims 1 to 7, wherein a plurality of test sockets (210) are arranged on the turntable (200), the test PCB board (211) is arranged on the test sockets (210), and the turntable (200) rotates to rotate the plurality of test sockets (210) in sequence to the position of the floating transfer structure.

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