Active optoelectronic system laser divergence angle measuring device and its installation and adjustment method

Abstract

The present invention provides a measuring device for the laser divergence angle of an active optoelectronic system and an adjustment method thereof, wherein the measuring device comprises a plane mirror, a spectroscopic component and a beam analysis component, wherein the plane mirror is arranged on one side of the active optoelectronic system; the spectroscopic component is arranged between the beam expansion system and the laser emission component in the active optoelectronic system; the beam analysis component is arranged on the reflective side of the spectroscopic component, and comprises a lens and a beam analyzer, and the laser emitted by the laser emission component is collimated by the beam expansion system, and then returned along the original path through the plane mirror, and after being reduced by the beam expansion system, it is reflected by the spectroscopic component and enters the beam analyzer, and the beam analyzer calculates the laser divergence angle according to the spot size. The measuring device for the laser divergence angle of an active optoelectronic system of the present invention is based on the optical characteristics of the optical system to be measured, does not require a large-caliber, long-focal-length collimator, is conducive to divergence angle measurement in an outdoor environment, can reduce equipment requirements and costs, and has strong versatility.

Description

Technical Field

[0001] The present invention relates to the field of laser communication technology, and in particular to a device for measuring the laser divergence angle of an active optoelectronic system and a method for assembling and adjusting the device for measuring the laser divergence angle of an active optoelectronic system. Background Art

[0002] In the existing far-field divergence angle measurement method, the far-field simulation and divergence angle measurement of the measured light beam are generally achieved by combining a collimator with a beam analyzer. Among them, the angular resolution of the beam analyzer depends on the effective focal length of the collimator, that is, when the pixel size of the beam analyzer is certain, it is usually necessary to use a collimator with the longest focal length possible to improve the divergence angle measurement accuracy. This measurement method is limited by existing optical processing technology and has a high cost in actual production. Summary of the invention

[0003] In order to solve the above technical problems, the present invention provides a device for measuring the laser divergence angle of an optical system and an adjustment method thereof. Based on the optical characteristics of the active optoelectronic system to be measured, there is no need for a large-aperture and long-focal-length collimator. Measurement can be achieved by adding only a plane mirror, a spectroscopic component and a beam analysis component. This is conducive to divergence angle measurement in an outdoor environment and can reduce equipment requirements and costs.

[0004] The technical solution adopted by the present invention is as follows:

[0005] A device for measuring the laser divergence angle of an active optoelectronic system, wherein the active optoelectronic system comprises a laser emitting component and a beam expansion system, and the device comprises: a plane mirror, wherein the plane mirror is arranged at one side of the active optoelectronic system, and the laser emitted by the laser emitting component is expanded by the beam expansion system to reach the plane mirror and is reflected back to the active optoelectronic system; a spectroscopic component, wherein the spectroscopic component is arranged between the beam expansion system and the laser emitting component; a beam analysis component, wherein the beam analysis component is arranged at the light transmission side of the spectroscopic component, wherein the beam analysis component comprises a lens and a beam analyzer, and wherein the beam analyzer is arranged at the focal plane of the lens; after the laser emitted by the laser emitting component is collimated by the beam expansion system, the collimated light passes through the plane mirror and returns along the original path, and the returned light is reflected by the spectroscopic component to the beam analysis component channel after being reduced by the beam expansion system, and converges on the beam analyzer through the lens, and the beam analyzer calculates the laser divergence angle of the active optoelectronic system according to the size of the laser spot on the beam analyzer.

[0006] In addition, the measuring device for the laser divergence angle of the active optoelectronic system proposed in the present invention may also have the following additional technical features:

[0007] According to one embodiment of the present invention, the beam expansion system includes a primary beam expansion telescope and a secondary beam expansion telescope.

[0008] According to an embodiment of the present invention, the light splitting component is a light splitting prism or a light splitting sheet.

[0009] According to one embodiment of the present invention, the beam profiler calculates the laser divergence angle of the active optoelectronic system using the following calculation formula:

[0010] θ=D / (F2×A)

[0011] Wherein, θ is the laser divergence angle of the active optoelectronic system, D is the diameter of the light spot, F2 is the focal length of the lens, and A is the beam expansion ratio of the beam expansion system.

[0012] According to one embodiment of the present invention, the ratio of the focal length of the lens to the focal length of the laser emitting assembly is greater than or equal to 6.

[0013] According to one embodiment of the present invention, the device for measuring the laser divergence angle of an active optoelectronic system further includes: a corner cube prism, wherein the corner cube prism is used to assist in adjusting the light splitting component, the light beam analysis component and the plane mirror before measurement.

[0014] In addition, to achieve the above-mentioned purpose, the present invention also provides a method for assembling and adjusting a device for measuring the laser divergence angle of an active optoelectronic system.

[0015] A method for assembling and adjusting a device for measuring the laser divergence angle of an active optoelectronic system, wherein the active optoelectronic system includes a laser emitting component and a beam expanding system, and the method includes the following steps: S1, arranging a spectroscopic component between the beam expanding system and the laser emitting component, and arranging a beam analyzing component on the reflective side of the spectroscopic component, wherein the beam analyzing component includes a lens and a beam analyzer, and the beam analyzer is arranged at the focal plane of the lens; S2, placing a corner cube prism in front of the beam expanding system, adjusting the positions of the spectroscopic component and the lens, so that laser is emitted from the laser emitting component, the laser is collimated by the beam expanding system, and the collimated part of the beam is reflected back to the beam expanding system by the corner cube prism. , and then reflected by the spectroscopic component and formed a first light spot at the center of the detection surface of the beam analyzer; S3, fix the spectroscopic component, the beam analyzer and the lens, record the position of the first light spot, and withdraw the corner cone prism; S4, place a plane mirror in front of the beam expansion system, adjust the posture of the plane mirror, so that the laser is emitted from the laser emitting component, the laser is collimated by the beam expansion system, and the collimated light beam is reflected back to the beam expansion system by the plane mirror, and then imaged on the detection surface of the beam analyzer through the spectroscopic component to form a second light spot; S5, finely adjust the posture of the plane mirror until the position of the second light spot is near the recorded position of the first light spot.

[0016] In addition, the method for assembling and adjusting the measuring device for the laser divergence angle of the active optoelectronic system according to the present invention may also have the following additional technical features:

[0017] According to one embodiment of the present invention, step S2 specifically includes: placing the corner cube prism before the beam expansion system, so that the laser emitted from the laser emitting component passes through the beam splitting component and the beam expansion system in sequence to reach the corner cube prism; adjusting the posture of the beam splitting component so that the laser returned from the corner cube prism passes through the beam expansion system and enters the lens; adjusting the posture of the lens so that the laser passes through the lens and enters the beam analyzer to form a first light spot at the center of the detection surface of the beam analyzer.

[0018] Beneficial effects of the present invention:

[0019] The device for measuring the divergence angle of the laser of the active optoelectronic system of the present invention is based on the optical characteristics of the active optoelectronic system to be measured. A plane mirror is arranged on one side of the active optoelectronic system, and a spectrometer and a beam analyzer are arranged between the laser emission component and the beam expansion system to achieve measurement, which is conducive to the measurement of the divergence angle in an outdoor environment; there is no need for a large-aperture and long-focal-length collimator, which can reduce equipment requirements and costs, and is particularly suitable for full-aperture laser emission. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 It is a schematic structural diagram of a device for measuring the laser divergence angle of an active optoelectronic system according to an embodiment of the present invention;

[0021] Figure 2 A schematic diagram of the structure of a device for measuring the laser divergence angle of an active optoelectronic system according to an embodiment of the present invention when using a corner cube prism to assist in adjustment;

[0022] Figure 3 The present invention is a flowchart of a method for assembling and adjusting a device for measuring a laser divergence angle of an active optoelectronic system according to an embodiment of the present invention. DETAILED DESCRIPTION

[0023] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0024] like Figure 1 As shown, the active optoelectronic system of the embodiment of the present invention comprises a laser emitting component 10 and a beam expansion system 20, and the measuring device of the laser divergence angle of the active optoelectronic system comprises: a plane mirror 30, a spectroscopic component 40 and a beam analysis component 50, wherein the plane mirror 30 is arranged on one side of the active optoelectronic system, and the laser emitted by the laser emitting component 10 is expanded by the beam expansion system 20 to reach the plane mirror 30 and reflected back to the active optoelectronic system; the spectroscopic component 40 is arranged between the beam expansion system 20 and the laser emitting component 10; and the beam analysis component 50 is arranged on the surface of the spectroscopic component 40. 0, the beam analysis component 50 includes a lens 51 and a beam analyzer 52, and the beam analyzer 52 is arranged at the focal plane of the lens 51; the laser emitted by the laser emitting component 10 is collimated by the beam expansion system 20, and the collimated light returns along the original path through the plane mirror 30, and the returned light is reduced by the beam expansion system 20 and reflected by the beam splitting component 40 to the beam analysis component channel, and converges on the beam analyzer 52 through the lens 51. The beam analyzer 52 calculates the laser divergence angle of the active optoelectronic system according to the size of the laser spot on the beam analyzer 52.

[0025] It is understandable that for an active optoelectronic system with a beam expansion system 20, the collimated laser emitted by the laser emitting assembly will further compress the divergence angle through the beam expansion system 20. Let the divergence angle of the collimated light beam emitted by the laser emitting assembly 10 be θ1, and after the divergence angle is compressed by the beam expansion system 20, it is emitted into free space and finally collimated with a divergence angle θ.

[0026] The principle of the measuring device of this embodiment for measuring the laser divergence angle of the active optoelectronic system is as follows: based on the self-collimation method of the plane mirror, the collimated laser emitted by the laser emitting assembly 10 first transmits part of the laser through the light splitting assembly 40, then compresses the divergence angle through the beam expansion system 20 and then emits, and is reflected back to the beam expansion system 20 by the plane mirror 30, and then is reflected by the light splitting assembly and converged by the lens 51 and imaged in the beam analyzer 52, wherein the laser emitted by the laser emitting assembly passes through the beam expansion system 20 twice. The first beam expansion system 20 and the laser emitting assembly 10 together form a laser emitting system, which can emit a laser beam with a small divergence angle, usually a few micro-radians; after the laser is reflected by the plane mirror 30, it passes through the beam expansion system 20 for the second time, and at this time, the beam expansion system 20 and the lens 51 together form an equivalent collimator, and the focal length F3 of the collimator can be calculated by the focal length F2 of the lens 51 and the beam expansion ratio A of the beam expansion system (i.e., F3=F2*A). It should be noted that the divergence angle obtained by the beam analyzer at this time is a compressed divergence angle θ.

[0027] The device for measuring the divergence angle of the laser of the active optoelectronic system of the present embodiment is based on the optical characteristics of the active optoelectronic system to be measured. It only needs to add a plane mirror, a spectroscopic component and a beam analysis component to realize the measurement, which is conducive to the measurement of the divergence angle in the outdoor environment. It does not require a large-aperture and long-focal-length collimator, which can reduce the equipment requirements and the cost at the same time. It has strong versatility and is particularly suitable for full-aperture laser emission.

[0028] In one embodiment of the present invention, the beam analyzer 52 can directly calculate the laser divergence angle of the active optoelectronic system according to the diameter of the light spot formed by the laser on the beam analyzer 52. The calculation formula for the laser divergence angle of the active optoelectronic system calculated by the beam analyzer 52 is:

[0029] θ=D / (F2×A)

[0030] Wherein, θ is the laser divergence angle of the active optoelectronic system, D is the diameter of the light spot, F2 is the focal length of the lens 51 , and A is the beam expansion ratio of the beam expansion system 20 .

[0031] In one embodiment of the present invention, the ratio of the focal length of the lens 51 to the focal length of the laser emitting assembly 10 is greater than or equal to 6, so that the diameter of the light spot formed on the beam analyzer 52 is large enough to ensure the accuracy of the measurement result.

[0032] like Figure 1 As shown, in one embodiment of the present invention, the beam expansion system 20 may include a primary beam expansion telescope 21 and a secondary beam expansion telescope 22 .

[0033] At this time, the beam analyzer 52 calculates the laser divergence angle of the active optoelectronic system using the following formula:

[0034] θ=D / (F2×A1*A2)

[0035] In the formula, A1 is the beam expansion ratio of the primary beam expanding telescope 21, and A2 is the beam expansion ratio of the secondary beam expanding telescope 22.

[0036] It is understandable that the specific composition of the beam expansion system is not limited here. In other specific embodiments, a single beam expansion telescope or a multi-stage beam expansion telescope can be set according to user needs, and this embodiment does not limit this.

[0037] In a feasible embodiment, the beam expansion ratio of the first-stage beam expander telescope 21 can be set to A1=8, and the beam expansion ratio of the second-stage beam expander telescope 22 can be set to A2=5. The beam expansion ratio of the beam expansion system 20 is the combined beam expansion ratio of the first-stage beam expander telescope 21 and the second-stage beam expander telescope 22 (A=A1*A2=40). The focal length of the laser emitting component 10 is F1=70mm, and the focal length of the lens 51 is F2=0.7m. At this time, the beam analyzer 52 can accurately measure the laser divergence angle of the active optoelectronic system including the beam expansion system 20 and the laser emitting component 10.

[0038] In one embodiment of the present invention, the beam splitting component 40 may be a beam splitting prism or a beam splitter.

[0039] In one embodiment of the present invention, the device for measuring the laser divergence angle of an active optoelectronic system further includes: a corner cube prism for assisting in adjusting the light splitting component 40, the light beam analyzing component 50 and the plane mirror 30 before measurement.

[0040] The specific steps of using a corner cube to assist in assembling the light splitting component 40, the beam analysis component 50 and the plane mirror 30 are as follows:

[0041] (1) The spectroscopic component 40 is disposed between the beam expansion system 20 and the laser emitting component 10 , and the beam analysis component 50 is disposed on the reflective side of the spectroscopic component 40 , and the beam analyzer 52 is disposed at the focal plane of the lens 51 .

[0042] (2) Place the corner cube prism 60 before the beam expansion system 20 (such as Figure 2 As shown), the positions of the beam splitter component 40 and the lens 51 are adjusted so that the laser is emitted from the laser emitting component 10, and the laser is collimated by the beam expansion system 20. The collimated part of the light beam is reflected back to the beam expansion system 20 through the corner cube prism 60, and then reflected by the beam splitter component 40 and forms a first light spot at the center of the detection surface of the beam analyzer 52, so that the rear light path optical axis of the beam expansion system 20 is consistent with the zero field of view optical axis.

[0043] Specifically, step (2) may include:

[0044] A. Place the corner cube prism 60 before the beam expansion system 20, so that the laser is emitted from the laser emitting component 10, transmitted through the spectroscopic component 40, and then collimated through the beam expansion system 20 to reach the corner cube prism 60 and self-collimate back to the detection light path, wherein the detection light path is the light path between the spectroscopic component 40 and the beam analyzer 52.

[0045] B. Adjust the position of the beam splitter 40 so that the laser light returned from the corner cube prism 60 enters the lens 51 through the beam expansion system 20 .

[0046] C. Finely adjust the position of the lens 51 so that the laser enters the beam analyzer 52 through the lens 51 and forms a first light spot at the center of the detection surface of the beam analyzer 52.

[0047] (3) Fix the beam splitter assembly 40, the beam analyzer 52 and the lens 51, record the position of the first light spot, and withdraw the corner cube prism 60.

[0048] (4) Place the plane mirror 30 before the beam expansion system 20 (such as Figure 1 As shown), the position of the plane mirror 30 is adjusted so that the laser is emitted from the laser emitting assembly 10, the laser is collimated by the beam expansion system 20, the collimated light beam is reflected back to the beam expansion system 20 by the plane mirror 30, and then imaged on the detection surface of the beam analyzer 52 by the light splitting assembly 40 to form a second light spot;

[0049] (5) Finely adjust the position of the plane mirror 30 until the position of the second light spot is close to the recorded position of the first light spot to ensure that the laser can return along the zero field of view optical axis of the beam expansion system 20 after being emitted.

[0050] According to the device for measuring the divergence angle of the laser of the active optoelectronic system of the embodiment of the present invention, based on the optical characteristics of the active optoelectronic system to be measured, a plane mirror is arranged on one side of the active optoelectronic system, and a spectrometer and a beam analyzer are arranged between the laser emission component and the beam expansion system to achieve measurement, which is conducive to the measurement of the divergence angle in the outdoor environment; there is no need for a large-aperture and long-focal-length collimator, which can reduce equipment requirements and costs, and is particularly suitable for full-aperture laser emission.

[0051] Corresponding to the above-mentioned device for measuring the laser divergence angle of an active optoelectronic system, the present invention further provides a method for assembling and adjusting the device for measuring the laser divergence angle of an active optoelectronic system.

[0052] like Figure 1 As shown, the active optoelectronic system of the embodiment of the present invention includes a laser emission component and a beam expansion system. Figure 3 As shown, the method for assembling and adjusting the device for measuring the laser divergence angle of the active optoelectronic system according to the embodiment of the present invention comprises the following steps:

[0053] S1, dispose the spectroscopic component between the beam expansion system and the laser emitting component, and dispose the beam analysis component on the reflective side of the spectroscopic component, wherein the beam analysis component includes a lens and a beam analyzer, and the beam analyzer is disposed at the focal plane of the lens.

[0054] S2, place the corner cube prism before the beam expansion system, adjust the position of the beam splitter and the lens, so that the laser is emitted from the laser emitting component, the laser is collimated by the beam expansion system, and the collimated part of the light beam is reflected back to the beam expansion system through the corner cube prism, and then reflected by the beam splitter and forms the first light spot at the center of the detection surface of the beam analyzer, so that the optical axis of the rear light path of the beam expansion system is consistent with the optical axis of the zero field of view.

[0055] Specifically, step S2 may include:

[0056] S21, placing a corner cube prism before the beam expansion system, so that the laser is emitted from the laser emitting component and sequentially passes through the beam splitting component and the beam expansion system to reach the corner cube prism.

[0057] S22, adjusting the position of the beam splitter assembly so that the laser light returned from the corner cube prism enters the lens through the beam expansion system.

[0058] S23, adjusting the posture of the lens so that the laser enters the beam analyzer through the lens, and forms a first light spot at the center of the detection surface of the beam analyzer.

[0059] S3, fix the beam splitter, beam analyzer and lens, record the position of the first light spot, and withdraw the corner cube prism.

[0060] S4, place the plane mirror in front of the beam expansion system, adjust the position of the plane mirror, so that the laser is emitted from the laser emitting component, the laser is collimated by the beam expansion system, the collimated light beam is reflected back to the beam expansion system by the plane mirror, and then imaged on the detection surface of the beam analyzer by the spectrometer component to form a second light spot.

[0061] S5, finely adjust the position of the plane mirror until the position of the second light spot is close to the recorded position of the first light spot to ensure that the laser can return along the zero field of view optical axis of the beam expansion system after being emitted.

[0062] According to the assembly and adjustment method of the measuring device of the laser divergence angle of the active optoelectronic system of the embodiment of the present invention, a corner cube prism is used to assist in the assembly and adjustment of the spectroscopic component, the beam analysis component and the plane mirror, so as to achieve the purpose of calibrating the optical axis, so that the emitted laser can return along the zero field of view of the beam expansion system when returning from the plane mirror, thereby ensuring the accuracy of the measurement result of the measuring device; and the assembly and adjustment method is simple and easy to operate, which can effectively improve work efficiency.

[0063] In the description of the present invention, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. "Multiple" means two or more, unless otherwise clearly and specifically defined.

[0064] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0065] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being "above", "above" or "above" a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being "below", "below" or "below" a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0066] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, unless they are contradictory.

[0067] Any process or method description in a flowchart or otherwise described herein may be understood to represent a module, segment or portion of code that includes one or more executable instructions for implementing the steps of a specific logical function or process, and the scope of the preferred embodiments of the present invention includes alternative implementations in which functions may not be performed in the order shown or discussed, including performing functions in a substantially simultaneous manner or in the reverse order depending on the functions involved, which should be understood by those skilled in the art to which the embodiments of the present invention belong.

[0068] Although the embodiments of the present invention have been shown and described above, it is to be understood that the above embodiments are exemplary and are not to be construed as limitations of the present invention. A person skilled in the art may change, modify, replace and vary the above embodiments within the scope of the present invention.

Claims

1. A device for measuring the laser divergence angle of an active optoelectronic system, wherein the active optoelectronic system comprises a laser emitting component and a beam expansion system, characterized in that: The device comprises: A plane mirror, wherein the plane mirror is arranged at one side of the active optoelectronic system, and the laser emitted by the laser emitting assembly is expanded by the beam expansion system to reach the plane mirror and is reflected back to the active optoelectronic system; A light splitting component, the light splitting component is arranged between the beam expansion system and the laser emitting component; A beam analysis component, the beam analysis component is arranged on the reflective side of the beam splitting component, the beam analysis component comprises a lens and a beam analyzer, and the beam analyzer is arranged at the focal plane of the lens; After the laser emitted by the laser emitting component is collimated by the beam expanding system, the collimated light returns along the original path through the plane mirror, and the return light is reflected by the beam splitting component to the beam analysis component channel after being contracted by the beam expanding system, and converges on the beam analyzer through the lens. The beam analyzer calculates the laser divergence angle of the active optoelectronic system according to the size of the laser spot on the beam analyzer.

2. The device for measuring the laser divergence angle of an active optoelectronic system according to claim 1, characterized in that: The beam expansion system includes a primary beam expansion telescope and a secondary beam expansion telescope.

3. The device for measuring the laser divergence angle of an active optoelectronic system according to claim 1, characterized in that: The light splitting component is a light splitting prism or a light splitting plate.

4. The device for measuring the laser divergence angle of an active optoelectronic system according to claim 1, characterized in that: The beam analyzer calculates the laser divergence angle of the active optoelectronic system using the following formula: θ=D / (F2×A) Wherein, θ is the laser divergence angle of the active optoelectronic system, D is the diameter of the light spot, F2 is the focal length of the lens, and A is the beam expansion ratio of the beam expansion system.

5. The device for measuring the laser divergence angle of an active optoelectronic system according to claim 4, characterized in that: The ratio of the focal length of the lens to the focal length of the laser emitting assembly is greater than or equal to 6.

6. The device for measuring the laser divergence angle of an active optoelectronic system according to claim 1, characterized in that: Also includes: A corner cube prism is used to assist in adjusting the light splitting component, the light beam analysis component and the plane mirror before measurement.

7. A method for assembling and adjusting a device for measuring the laser divergence angle of an active optoelectronic system according to any one of claims 1 to 6, characterized in that: The method comprises the following steps: S1, disposing a beam splitter component between the beam expansion system and the laser emitting component, and disposing a beam analysis component on the reflective side of the beam splitter component, wherein the beam analysis component comprises a lens and a beam analyzer, and the beam analyzer is disposed at the focal plane of the lens; S2, placing a corner cube prism before the beam expansion system, adjusting the positions of the beam splitter component and the lens, so that the laser is emitted from the laser emitting component, the laser is collimated by the beam expansion system, and the collimated part of the light beam is reflected back to the beam expansion system by the corner cube prism, and then reflected by the beam splitter component to form a first light spot at the center of the detection surface of the beam analyzer; S3, fixing the light splitting component, the light beam analyzer and the lens, recording the position of the first light spot, and withdrawing the corner cube; S4, placing a plane mirror before the beam expansion system, adjusting the posture of the plane mirror, so that the laser is emitted from the laser emitting component, the laser is collimated by the beam expansion system, the collimated light beam is reflected back to the beam expansion system by the plane mirror, and then imaged on the detection surface of the beam analyzer by the light splitting component to form a second light spot; S5, finely adjusting the posture of the plane mirror until the position of the second light spot is near the recorded position of the first light spot.

8. The method for assembling and adjusting the device for measuring the laser divergence angle of the active optoelectronic system according to claim 7, characterized in that: Step S2 specifically includes: Placing the corner cube prism before the beam expansion system, so that the laser is emitted from the laser emitting component and sequentially passes through the light splitting component and the beam expansion system to reach the corner cube prism; Adjusting the position of the light splitting component so that the laser light returned from the corner cube prism enters the lens through the beam expansion system; The position and posture of the lens is adjusted so that the laser enters the beam analyzer through the lens, and forms a first light spot at the center of the detection surface of the beam analyzer.

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