PCB test fixture and PCB test system

Abstract

The embodiment of the present application provides a PCB test fixture and a PCB test system, wherein the PCB test fixture includes an optical component, an adjustment component, a test probe, and a first stage and a second stage that are opposite and spaced from bottom to top, the optical component includes: a camera and a reflection component, the camera and the reflection component are both arranged on a side of the second stage away from the first stage, the reflection component includes a first reflector, the second stage is provided with a first through hole, the camera is used to photograph the test area of ​​the test piece and the image of the test probe imaged to the first reflector through the first through hole. The PCB test fixture and the PCB test system provided by the embodiment of the present application can solve the problem that the test needle is difficult to align with the test point in a small space, and the test speed is fast and the proficiency requirement for manual operation is low.

Description

Technical Field

[0001] The embodiments of the present application relate to the technical field of PCB production and testing equipment, and in particular to a PCB test fixture and a PCB test system. Background Art

[0002] During the manufacturing and assembly of printed circuit boards (PCBs), an essential step is to test the PCBs based on their functionality and manufacturability. Testing can identify any short circuits, open circuits, component placement errors, or faulty components, determine whether the PCB functions meet the standards, and then optimize the PCB manufacturing and assembly processes to reduce the production rate of defective products.

[0003] Regarding the PCB inspection process, the test piece is generally placed in the accommodating cavity of the positioning fixture for fixing, and then the probe with the test needle of the fixture is aligned with the test point of the test piece. Then the equipment is started, the probe is pressed down, and the test needle on the probe is engaged with the test point on the test piece. After the engagement is completed, the PCB is tested.

[0004] However, due to the poor consistency of the incoming positions of the tested pieces and the small size of the test needle and the test point, it is difficult for the test probe to achieve precise matching with the test point through mechanical positioning, resulting in a high rate of misdetection. In the case that the internal space of the PCB test equipment cabinet on the production line is small and the equipment size cannot be increased, the relative position of the test needle and the test point cannot be intuitively debugged in the small test space, and can only be tested through methods such as blue film perforation detection, which requires continuous debugging, slow debugging speed, and high proficiency requirements for manual operation. Summary of the invention

[0005] The embodiments of the present application provide a PCB test fixture and a PCB test system, which can solve the problem that a test needle is difficult to align with a point to be tested in a narrow space, and have a fast test speed and low requirements on the proficiency of manual operation.

[0006] On the one hand, an embodiment of the present application provides a PCB test fixture, including: an optical component, an adjustment component, a test probe, and a first stage and a second stage that are opposite to each other and spaced from bottom to top, wherein an assembly cavity is provided on a surface of the first stage facing the second stage, and the assembly cavity is used to assemble a test piece to be tested, the adjustment component includes: an adjuster and a cantilever, the adjuster is provided on the second stage, one end of the cantilever is connected to the adjuster, and the other end of the cantilever is provided with a test probe facing a test area of ​​the test piece to be tested, and the adjuster can drive the cantilever to move, the optical component includes: a camera and a reflection component, the camera and the reflection component are both provided on a surface of the second stage away from the first stage, the reflection component includes a first reflector, the second stage is provided with a first through hole, and the camera is used to photograph the test area of ​​the test piece to be tested and the image of the test probe imaged onto the first reflector through the first through hole.

[0007] The PCB test fixture provided by the embodiment of the present application can feed back the alignment of the test probe located in the interlayer between the first stage and the second stage and the area to be tested of the test piece to the camera located in the same plane of the first reflector through the first reflector. After the camera obtains the image information of the test probe and the area to be tested of the test piece, the cantilever can be driven by the regulator to drive the test probe to align with the area to be tested of the test piece, and finally the test probe is buckled with the area to be tested of the test piece. On the one hand, the first reflector and the camera are both located on the side of the second stage away from the first stage, which can reduce the arrangement of devices in the Z-direction space (i.e., the vertical space with the second stage as a reference) inside the production line cabinet. On the other hand, the camera and the first reflector can realize the visualization of the test probe and the area to be tested of the test piece in the narrow space between the first stage and the second stage, and the regulator can solve the problem that the test probe and the area to be tested of the test piece cannot be accurately aligned due to the position deviation of the incoming material being greater than the assembly tolerance. The debugging time is short, which is conducive to the mass production of PCBs. On the other hand, the image information obtained by the camera can also be used to observe in real time whether the test probe and the test area of ​​the test piece have defects such as damage, scratches, detachment, deformation, etc., so as to facilitate the subsequent replacement of the test probe and optimization of the test piece.

[0008] In a possible embodiment, the reflection assembly also includes: a second reflector, which is arranged on a surface of the second stage facing away from the first stage, and the camera is used to photograph the test area of ​​the test piece to be tested and the image of the test probe imaged onto the second reflector through the first through hole via the first reflector.

[0009] Since the camera may need a certain imaging distance to acquire an image, the accuracy and distortion problems caused by short-distance shooting can be reduced. Since the plane space of the second stage is limited, the second reflector can be used to change the imaging direction of the test area of ​​the test piece and the test probe in the camera, and the imaging distance can be extended, which can solve the accuracy and distortion problems caused by short-distance shooting, and can solve the problem of device layout in the plane on the second stage. In addition, the image formed by the reflector is a mirror reflection, and the imaging is opposite to the actual direction. Through the two reflections of the first reflector and the second reflector, the image captured by the camera is the same as the actual direction of the test area of ​​the test piece and the test probe, which is convenient for subsequent observation and adjustment of the test probe.

[0010] In a possible embodiment, there are two assembly cavities, and the adjustment components and the reflection components are both in two groups, each group of the adjustment components and each group of the reflection components corresponds to one test piece, there is one camera, and the second reflector in each group of reflection components images the corresponding test area of ​​the test piece to be tested and the test probe to the camera.

[0011] This allows for dual-station PCB testing with one camera, speeding up testing.

[0012] In a possible embodiment, the first reflector is arranged to be inclined relative to the plane of the second stage, the second reflector is arranged to be perpendicular to the plane of the second stage, the two groups of reflective components are located on the same straight line, the imaging path from the first reflector through the second reflector to the camera is arranged at an angle, the two groups of reflective components are arranged symmetrically and close to each other with respect to the central axis of the camera lens, and the two first reflectors in the two groups of reflective components are arranged face to face.

[0013] In this way, compared with the staggered arrangement of the two sets of reflective components, the imaging quality of the camera for the test area of ​​the test piece and the test probe can be enhanced. In addition, the image conditions of the test area of ​​the two test pieces and the test probe captured by the camera are consistent, which is convenient for subsequent observation and adjustment of the regulator.

[0014] In a possible implementation, the optical assembly further includes: a reflector bracket, the first reflector and the second reflector are assembled on the reflector bracket, and the reflector bracket is fixedly connected to the second stage.

[0015] On the one hand, the first reflector can be suspended on the first through hole, and on the other hand, the centralized installation of the first reflector and the second reflector can be facilitated, thereby reducing the assembly process.

[0016] In a possible implementation manner, the optical component further includes: a light source, and the light source is used to illuminate the test area of ​​the to-be-tested object.

[0017] In a possible embodiment, a groove or a second through hole is formed on a side of the second stage facing away from the first stage, the groove or the second through hole is connected to the first through hole, one end of the cantilever connected to the regulator is located in the groove or the second through hole, and the other end of the cantilever extends into the first through hole.

[0018] This helps to reduce the height of the interlayer between the first stage and the second stage, thereby reducing the height of the PCB test fixture in the Z direction.

[0019] In a possible embodiment, the PCB test fixture further includes: a suspension bridge located on a side of the second stage facing away from the first stage, the suspension bridge being arranged across the sink trough or the second through hole, the adjuster being suspended from the suspension bridge, and one end of the adjuster connected to the cantilever extending into the sink trough or the second through hole.

[0020] In this way, the connection between the cantilever and the adjuster can be facilitated.

[0021] In a possible implementation manner, an extension direction from one end of the cantilever connected to the adjuster to one end of the cantilever provided with the test probe is parallel to a central axis of the camera lens.

[0022] In this way, the direction in which the adjuster drives the cantilever to move is the same direction as the display direction of the image captured by the camera or the direction opposite to the display direction.

[0023] In a possible implementation manner, one end of the cantilever on which the test probe is provided is provided with a slot, and the test probe is assembled in the slot.

[0024] On the one hand, the installation stability of the test probe can be guaranteed, and on the other hand, the device arrangement in the Z-direction space of the PCB test fixture can be reduced.

[0025] In a possible embodiment, the PCB test fixture further includes: a base and a moving stage, the base and the moving stage are arranged on a side of the first stage away from the second stage, the moving stage is arranged on a side of the base facing the first stage, the moving stage is used to be fixedly connected to the first stage, a slide inclined from bottom to top is arranged on the base, the moving stage has a sliding roller, the sliding roller is slidably arranged on the slide, a first guide column extending toward the second stage is arranged on a side of the moving stage facing the second stage, a second guide column extending toward the moving stage is arranged on a side of the second stage facing the moving stage, the first guide column is sleeved on the second guide column or the second guide column is sleeved on the first guide column.

[0026] In this way, the test probe can be fastened to the test area of ​​the test object while the moving stage, the first stage and the second stage move together.

[0027] In a possible implementation, the regulator can drive the cantilever to move along the plane of the second stage.

[0028] In a possible implementation, the PCB test fixture further includes: a driving device, which is mounted on the moving stage along a horizontal direction of the moving stage, and is used to drive the moving stage to slide along the slideway.

[0029] In a possible implementation, the camera is a miniature camera.

[0030] On the other hand, the present application provides a PCB testing system, including: the PCB testing fixture, motion control system and terminal equipment as described above, the PCB testing fixture is electrically connected to the motion control system and the terminal equipment respectively, and the motion control system is electrically connected to the terminal equipment.

[0031] The PCB testing system provided by the embodiment of the present application can feed back the alignment of the test probe located in the interlayer of the first stage and the second stage and the area to be tested of the test piece to the camera located in the same plane of the first reflector through the first reflector in the PCB testing fixture. After the camera obtains the image information of the test probe and the area to be tested of the test piece, the cantilever can be driven by the regulator to drive the test probe to align with the area to be tested of the test piece, and finally the test probe is buckled with the area to be tested of the test piece. On the one hand, the first reflector and the camera are both located on the side of the second stage away from the first stage, which can reduce the arrangement of the components in the Z-direction space (i.e., the vertical space with the second stage as a reference) inside the production line cabinet. On the other hand, the camera and the first reflector can realize the visualization of the test probe and the area to be tested of the test piece in the narrow space in the interlayer of the first stage and the second stage, and the problem that the test probe and the area to be tested of the test piece cannot be accurately aligned due to the position deviation of the incoming material being greater than the assembly tolerance can be solved through the regulator, and the debugging time is short, which is conducive to the mass production of PCBs. On the other hand, the image information obtained by the camera can also be used to observe in real time whether the test probe and the test area of ​​the test piece have defects such as damage, scratches, detachment, deformation, etc., so as to facilitate the subsequent replacement of the test probe and optimization of the test piece. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] In order to more clearly illustrate the technical solutions in the present application or the prior art, a brief introduction will be given below to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative labor.

[0033] Figure 1 A schematic diagram of the structure of a PCB test fixture provided in one embodiment of the present application;

[0034] Figure 2 A front view of a PCB test fixture provided in one embodiment of the present application;

[0035] Figure 3 A back view of a PCB test fixture provided in one embodiment of the present application;

[0036] Figure 4 A top view of a PCB test fixture provided in one embodiment of the present application;

[0037] Figure 5 A schematic diagram of the cooperation between a test probe and a test piece provided in an embodiment of the present application;

[0038] Figure 6 A schematic diagram of a partially disassembled structure of a PCB test fixture provided in one embodiment of the present application;

[0039] Figure 7 A schematic diagram of optical imaging of a PCB test fixture provided in one embodiment of the present application;

[0040] Figure 8 A schematic diagram of a PCB testing system provided in one embodiment of the present application.

[0041] Description of reference numerals:

[0042] 100-PCB test fixture;

[0043] 110- optical component; 111- camera;

[0044] 112-reflection component; 1121-first reflector; 1122-second reflector;

[0045] 113-reflector bracket; 114-light source;

[0046] 120-adjustment component; 121-regulator;

[0047] 122-cantilever; 1221-card slot;

[0048] 130-first stage; 131-assembly chamber;

[0049] 140 - second loading platform; 141 - first through hole; 142 - sink; 143 - second guide column;

[0050] 150-test probe; 160-drawbridge;

[0051] 170-base; 171-slideway;

[0052] 180-moving stage; 181-sliding roller; 182-first guide column;

[0053] 190-driving device; 200-test piece; 300-column;

[0054] 400-terminal device;

[0055] 500-Motion control system. DETAILED DESCRIPTION

[0056] The terms used in the implementation method part of this application are only used to explain the specific embodiments of this application, and are not intended to limit this application. The implementation method of the embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0057] In the embodiments of the present application, the terms "include", "comprises" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the statement "comprising a" does not exclude the presence of other identical elements in the process, method, article or device including the element.

[0058] PCB testing is an essential part of the PCB manufacturing process. It can determine whether the various functions of the PCB meet the standards and plays an important role in the quality of the produced PCB functions.

[0059] During the PCB inspection process, due to the poor consistency of the incoming position of the test piece, the position deviation of the test piece fixed in the positioning fixture cavity is likely to be greater than its originally preset assembly tolerance. In addition, because the test piece (such as the test needle) on the test probe and the test point on the test piece are small in size, the test probe may not be able to precisely match the test point, which will lead to a high error rate in PCB inspection. In addition, when the test probe is not aligned with the test point, the impact caused by the test probe and the test point needs to be buckled together will also cause damage to the test piece and the test probe.

[0060] However, in the case that the internal space of the PCB test station equipment cabinet on the production line is small and the equipment size cannot be increased, it is impossible to visually observe the relative position of the test probe and the test point of the test piece. For example, it is impossible to visually capture the relative position of the test probe and the test point of the test piece with the naked eye or an industrial camera. It can only be continuously adjusted through methods such as blue film perforation detection until the test probe is aligned with the test piece. The debugging speed is slow and requires high proficiency in manual operation.

[0061] In order to solve the above problems, an embodiment of the present application provides a PCB test fixture, which solves the problem that the test probe and the test point cannot be precisely matched in a narrow space by utilizing specially designed visual positioning. The PCB test time is short, which is conducive to the mass production of PCBs. In addition, it can also observe in real time whether the test probe and the test area of ​​the test piece are damaged, scratched, detached, deformed, and other defects.

[0062] The PCB test fixture and PCB test system provided in the embodiments of the present application are described in detail below with reference to the accompanying drawings and specific embodiments.

[0063] Figure 1 This is a structural diagram of a PCB test fixture 100 provided in one embodiment of the present application. Figure 2This is a front view of a PCB test fixture 100 provided in one embodiment of the present application, referring to Figure 1 and Figure 2 As shown, the PCB test fixture 100 provided in the embodiment of the present application includes: a first stage 130 and a second stage 140 which are opposite to each other and spaced apart from each other from bottom to top, the first stage 130 is used to carry the test piece 200, and the second stage 140 is used to assemble various devices required for testing the PCB.

[0064] Figure 3 This is a back view of a PCB test fixture 100 provided in one embodiment of the present application, referring to Figure 2 and Figure 3 As shown, an assembly cavity 131 is provided on one side of the first stage 130 facing the second stage 140, and the assembly cavity 131 is used to assemble the test piece 200. The assembly cavity 131 can provide initial rough positioning for the test piece 200. The test piece 200 can be manually loaded into the assembly cavity 131, or can be mechanically fed into the assembly cavity 131 in an automated production line.

[0065] Figure 4 A top view of a PCB test fixture 100 provided in an embodiment of the present application, see Figure 1 and Figure 4 As shown, the PCB test fixture 100 provided in the embodiment of the present application further includes: an adjustment component 120 , an optical component 110 and a test probe 150 .

[0066] Specifically, the adjustment assembly 120 includes: an adjuster 121 and a cantilever 122 ( Figure 4 The regulator 121 is blocked by the suspension bridge 160, and the cantilever 122 serves as a carrier for the test probe 150. The regulator 121 is disposed on the second stage 140. Generally, after the test probe 150 is aligned with the test area of ​​the test object 200, the first stage 130 and the second stage 140 are engaged. In order not to affect the engagement between the first stage 130 and the second stage 140, and for the convenience of installation, for example, Figure 1 and Figure 4 As shown in , the regulator 121 is disposed on the side of the second stage 140 away from the first stage 130. Of course, if conditions permit, the present application does not exclude the scenario where the regulator 121 is installed on the side of the second stage 140 and the second stage 140 faces the first stage 130.

[0067] One end of the cantilever 122 is connected to the regulator 121, and the other end of the cantilever 122 is provided with a test probe 150 facing the first stage 130. The test probe 150 is directly facing the test area of ​​the test piece 200 (such as Figure 5). It can be understood that, here, "the test probe 150 is facing the test area of ​​the test piece 200" refers to an ideal facing relationship. Due to assembly or processing deviation, a certain relative position deviation between the test probe 150 and the test area of ​​the test piece 200 is allowed. At this time, the position of the test probe 150 can be adjusted by driving the cantilever 122 through the regulator 121, so that the test probe 150 faces the test area of ​​the test piece 200. The regulator 121 can drive the cantilever 122 to move, for example, the regulator 121 can drive the cantilever 122 to move along the plane direction of the second stage 140, so that the relative position of the test probe 150 and the test area of ​​the test piece 200 can be adjusted. For another example, the adjuster 121 can drive the cantilever 122 to move vertically along the plane of the second stage 140. In this way, when the test probe 150 is directly opposite to the test area of ​​the test piece 200, the adjuster 121 can drive the cantilever 122 to move toward the first stage 130, so that the test probe 150 is pressed down to combine with the test area of ​​the test piece 200 to measure the electrical performance parameters of the PCB. At this time, there is no need for a snap-fit ​​action between the first stage 130 and the second stage 140.

[0068] The test probe 150 may be in the form of a test needle, a Universal Serial Bus (USB), a Board to Board (BTB), etc. Exemplarily, in some embodiments of the present application, the test probe 150 and the test area of ​​the test piece 200 are both in the form of a BTB, for example, a BTB male or female card connector is provided on the first stage 130, and all the test points of the test piece 200 are concentrated in the card connector.

[0069] Continue to refer Figure 1 and Figure 4 As shown, the optical component 110 includes: a camera 111 and a reflective component 112. The camera 111 may be a micro camera, such as a pinhole camera, a board-level camera, etc. Based on the application scenario of the present application, in some embodiments of the present application, the camera 111 may be a board-level camera, and the lens of the camera 111 may be an M12 lens, etc. A board-level camera is an embedded camera device that directly integrates an image processing unit onto a PCB board. The board-level camera uses chips such as a field programmable gate array or an embedded processor to pre-process, extract, analyze and process the collected image, and then output the result or store it in a memory.

[0070] Based on the consideration of space limitation, installation convenience and the imaging quality of the camera 111, in the embodiment of the present application, the camera 111 and the reflective component 112 are both arranged on the side of the second stage 140 facing away from the first stage 130, that is, the upper surface of the second stage 140 in the figure. Of course, it is easy to think that, without considering the space limitation, installation convenience and the imaging quality of the camera 111, the camera 111 and the reflective component 112 can be arranged at any position of the second stage 140, for example, on the side of the second stage 140 facing the first stage 130.

[0071] The reflective assembly 112 includes: a first reflector 1121, and the first reflector 1121 can be a surface polished metal device with regular reflective performance, a glass or metal product coated with a metal reflective film, etc. The second stage 140 is provided with a first through hole 141, and the camera 111 is used to photograph the image of the test area of ​​the test piece 200 and the image of the test probe 150 imaged to the first reflector 1121 through the first through hole 141. The present application does not limit the setting positions of the camera 111 and the first reflector 1121 on the upper surface of the second stage 140, as long as the first reflector 1121 can illuminate the test area of ​​the test piece 200 and the test probe 150 through the first through hole 141, and the camera 111 can obtain the image information of the test area of ​​the test piece 200 and the test probe 150 from the first reflector 1121.

[0072] It is understandable that the PCB test fixture 100 provided in the embodiment of the present application can feed back the alignment of the test probe 150 located in the sandwich of the first stage 130 and the second stage 140 and the test area of ​​the test piece 200 to the camera 111 located in the same plane of the first reflector 1121 through the first reflector 1121. After the camera 111 obtains the image information of the test probe 150 and the test area of ​​the test piece 200, the cantilever 122 can be driven by the regulator 121 to drive the test probe 150 to align with the test area of ​​the test piece 200, and finally the test probe 150 is buckled with the test area of ​​the test piece 200. On the one hand, the first reflector 1121 and the camera 111 are both located on the side of the second stage 140 away from the first stage 130, which can reduce the device arrangement in the Z-direction space (i.e., the vertical direction space with the second stage 140 as a reference) inside the production line cabinet. On the other hand, the camera 111 and the first reflector 1121 can realize the visualization of the test probe 150 and the test area of ​​the test piece 200 in the narrow space between the first stage 130 and the second stage 140, and the regulator 121 can solve the problem that the test probe 150 and the test area of ​​the test piece 200 cannot be accurately aligned due to the position deviation of the incoming material being greater than the assembly tolerance, and the debugging time is short, which is conducive to the mass production of PCBs. On the other hand, through the image information obtained by the camera 111, it is also possible to observe in real time whether the test probe 150 and the test area of ​​the test piece 200 have defects such as damage, scratches, falling off, deformation, etc., so as to facilitate the subsequent replacement of the test probe 150 and the optimization of the test piece 200.

[0073] Among them, the camera 111 can be connected to the terminal device 400, the regulator 121 is connected to the motion control system 500, and the motion control system 500 is connected to the terminal device 400. After the terminal device 400 obtains the image information taken by the camera 111, the compensation value is calculated by the visual system of the terminal device 400 and fed back to the motion control system 500. The motion control system 500 instructs the regulator 121 to drive the cantilever 122 to drive the test probe 150 to align with the test area of ​​the test piece 200, and then buckle them, so as to realize the automation of precise alignment of the test probe 150 and the test area of ​​the test piece 200.

[0074] Of course, this application does not stop there. Figure 6 This is a schematic diagram of a partially disassembled structure of a PCB test fixture 100 provided in an embodiment of the present application, with reference to Figure 6 Combined with Figure 4As shown, in some embodiments of the present application, the reflection component 112 may further include: a second reflector 1122, which is disposed on a surface of the second stage 140 away from the first stage 130. It can be simply understood that the second reflector 1122 is in the same plane as the first reflector 1121 and the camera 111. At this time, the camera 111 is used to capture the image of the test area of ​​the test piece 200 and the image of the test probe 150 through the first through hole 141 and the first reflector 1121 to the second reflector 1122. It can be understood that the test area of ​​the test piece 200 and the alignment of the test probe 150 are reflected by the first reflector 1121 and then reflected by the second reflector 1122 to the camera 111, and the imaging path is from the test area of ​​the test piece 200 and the test probe 150 to the first reflector 1121 to the second reflector 1122 and then to the camera 111.

[0075] Since the camera 111 may need a certain imaging distance to acquire an image, the accuracy and distortion problems caused by short-distance shooting can be reduced. Since the plane space of the second stage 140 is limited, the second reflector 1122 can be used to change the imaging direction of the test area of ​​the test piece 200 and the test probe 150 on the camera 111, and the imaging distance can be extended, which can solve the accuracy and distortion problems caused by short-distance shooting, and can solve the problem of device layout in the plane on the second stage 140. In addition, the image formed by the reflector is a mirror reflection, and the image is opposite to the actual direction. Through the two reflections of the first reflector 1121 and the second reflector 1122, the image captured by the camera 111 is the same as the actual direction of the test area of ​​the test piece 200 and the test probe 150, so as to facilitate subsequent observation and adjustment of the test probe 150.

[0076] It should be mentioned that the present application does not impose any restrictions on the location of the second reflector 1122 on the upper surface of the second stage 140 . It is sufficient that the camera 111 can obtain the image of the test area of ​​the test piece 200 and the test probe 150 in the first reflector 1121 from the second reflector 1122 .

[0077] Continue to refer Figure 4 and Figure 6 As shown, in some embodiments of the present application, the assembly cavity 131 on the first stage 130 can be set to two, for example, Figure 6As shown in , two assembly cavities 131 are arranged side by side, and the assembly cavity 131 is loaded with the test piece 200, and the adjustment component 120 and the reflection component 112 are both two groups, each group of the adjustment component 120 and each group of the reflection component 112 corresponds to one test piece 200, and there is one camera 111. The second reflector 1122 in each group of the reflection component 112 reflects the corresponding test area of ​​the test piece 200 and the image of the test probe 150 in the first reflector 1121 to the camera 111. In this way, a camera 111 double-station PCB test can be achieved, which speeds up the test speed. Of course, without considering the cost and the plane space of the first stage 130 and the second stage 140, in other embodiments of the present application, multiple groups of adjustment components 120 and reflection components 112 can also be used and multiple assembly cavities 131 can be set accordingly. In addition, the camera 111 and the reflection component 112 can be set one-to-one, or, without considering the shooting quality of the camera 111, the camera 111 and the reflection component 112 can also be set one-to-many.

[0078] It should be mentioned that, in the case of a one-to-two arrangement of the camera 111 and the reflective assembly 112, the present application does not impose any restriction on the arrangement positions of the two sets of reflective assemblies 112 on the second stage 140. It is only necessary for the camera 111 to simultaneously obtain the image information of the two test pieces 200 and the test probe 150 from the two second reflectors 1122.

[0079] In order to enhance the shooting quality of the test scene of the one-camera 111 dual-standby test device 200, Figure 7 This is a schematic diagram of an optical imaging of a PCB test fixture 100 provided in an embodiment of the present application, refer to Figure 7 Combined with Figure 4 As shown, in some embodiments of the present application, the first reflector 1121 is tilted relative to the plane of the second stage 140, and its tilt angle can be any angle between 0° and 90°. The angle needs to be determined according to the relative position of the test area of ​​the test object 200 and the first through hole 141. For example, Figure 4 As shown in FIG. 1 , the test area of ​​the test piece 200 is located directly below the first through hole 141 , and the first reflector 1121 is disposed directly above the first through hole 141 at an angle of 45°.

[0080] In some embodiments of the present application, the optical assembly 110 may further include a reflector bracket 113 (eg, Figure 4 As shown in the figure, the first reflector 1121 and the second reflector 1122 are assembled on the reflector bracket 113, and the reflector bracket 113 is connected to the second stage 140. On the one hand, the first reflector 1121 can be suspended on the first through hole 141, and on the other hand, the centralized installation of the first reflector 1121 and the second reflector 1122 can be facilitated to reduce the assembly process.

[0081] The second reflector 1122 is arranged perpendicular to the plane of the second stage 140. The two sets of reflective components 112 are located on the same straight line. The imaging path from the first reflector 1121 to the camera 111 through the second reflector 1122 is arranged at an angle. It can be understood that the imaging path has a certain angle (the imaging path can refer to Figure 7 The two sets of reflective components 112 are symmetrical and close to each other with respect to the central axis of the camera 111 lens. Here, "close to each other" means that the two sets of reflective components 112 are as close to each other as possible so that the camera 111 can simultaneously capture the image of the second reflective mirror 1122. In addition, the two first reflective mirrors 1121 in the two sets of reflective components 112 are arranged face to face.

[0082] In this way, compared with the staggered arrangement of the two sets of reflective components 112, the imaging quality of the camera 111 for the test area of ​​the test piece 200 and the test probe 150 can be enhanced. In addition, the image conditions of the test areas of the two test pieces 200 and the test probe 150 captured by the camera 111 are consistent, which is convenient for subsequent observation and adjustment of the adjuster 121.

[0083] Continue to refer Figure 4 and Figure 6 As shown, in some embodiments of the present application, the optical assembly 110 may further include a light source 114, and the light source 114 is used to illuminate the test area of ​​the test piece 200 so that the camera 111 can take pictures of it. Figure 4 and Figure 6 As shown in , the light source 114 can be a semi-annular light source 114, and of course, a point light source 114 or an annular light source 114 can also be used.

[0084] refer to Figure 1 and Figure 4 As shown, in order to further reduce the arrangement of devices in the Z-up direction of the PCB test fixture 100, in some embodiments of the present application, a sink 142 is provided on the side of the second stage 140 facing away from the first stage 130, the sink 142 is connected to the first through hole 141, the end of the cantilever 122 connected to the regulator 121 is located in the sink 142, and the other end of the cantilever 122 extends into the first through hole 141. In this way, compared with the working condition where the cantilever 122 is arranged on the side of the second stage 140 facing the first stage 130, it is conducive to reducing the height of the interlayer between the first stage 130 and the second stage 140, thereby reducing the height of the PCB test fixture 100 in the Z-up direction.

[0085] It is understandable that, based on the function of the sink 142 , the sink 142 may also be in the form of a through hole, that is, a second through hole is provided on a surface of the second loading platform 140 facing away from the first loading platform 130 .

[0086] Based on the above working condition that one end of the cantilever 122 is set in the sink 142, in order to facilitate the connection between the cantilever 122 and the regulator 121, refer to Figure 1 and Figure 4 As shown, in some embodiments of the present application, the PCB test fixture 100 may further include a suspension bridge 160 located on a side of the second stage 140 facing away from the first stage 130, the suspension bridge 160 is spanned over the sink 142, the regulator 121 is suspended from the suspension bridge 160, and one end of the regulator 121 connected to the cantilever 122 extends into the sink 142.

[0087] refer to Figure 4 As shown, in some embodiments of the present application, the extension direction from the end of the cantilever 122 connected to the adjuster 121 to the end of the cantilever 122 provided with the test probe 150 is parallel to the central axis of the lens of the camera 111. In this way, the direction in which the adjuster 121 drives the cantilever 122 to move in a certain direction is the same direction as the display direction of the image captured by the camera 111 or the direction opposite to the display direction. For example, when the PCB test fixture 100 only includes the first reflector 1121, the direction in which the adjuster 121 drives the cantilever 122 to move in a certain direction is the opposite direction to the display direction of the image captured by the camera 111. When the PCB test fixture 100 includes the first reflector 1121 and the second reflector 1122, the direction in which the adjuster 121 drives the cantilever 122 to move in a certain direction is the same direction as the display direction of the image captured by the camera 111.

[0088] The present application does not restrict the location of the adjuster 121 , and it is only necessary to ensure that the adjuster 121 does not block the imaging of the camera 111 .

[0089] refer to Figure 5 As shown, in some embodiments of the present application, a slot 1221 can be opened at one end of the cantilever 122 where the test probe 150 is provided, and the test probe 150 is assembled in the slot 1221. On the one hand, the installation stability of the test probe 150 can be ensured, and on the other hand, the device arrangement in the Z-direction space of the PCB test fixture 100 can be reduced.

[0090] refer to Figure 1 As shown, in some embodiments of the present application, the PCB test fixture 100 may further include: a base 170 and a moving stage 180, the base 170 and the moving stage 180 are arranged on the side of the first stage 130 away from the second stage 140, and the moving stage 180 is arranged on the side of the base 170 facing the first stage 130, and the moving stage 180 is used to be fixedly connected to the first stage 130. For example, Figure 2As shown in FIG. 1 , the first loading platform 130 is fixedly connected to the moving loading platform 180 by snapping the column 300 .

[0091] Among them, a slide 171 inclined from bottom to top is provided on the base 170, and the moving stage 180 has a sliding roller 181, and the sliding roller 181 is slidably set on the slide 171. In this way, the horizontal movement of the moving stage 180 can be converted into horizontal and upward movement, so that after the test probe 150 is aligned with the test area of ​​the test piece 200, the moving stage 180 drives the first stage 130 to achieve a snap-fit ​​action.

[0092] At the same time, a first guide column 182 extending toward the second stage 140 is provided on the side of the moving stage 180 facing the second stage 140, and a second guide column 143 extending toward the moving stage 180 is provided on the side of the second stage 140 facing the moving stage 180. The first guide column 182 is sleeved on the second guide column 143 or the second guide column 143 is sleeved on the first guide column 182. It can be understood that after the test probe 150 is aligned with the test area of ​​the test piece 200, if the moving stage 180 only drives the first stage 130 to move obliquely upward, the test probe 150 and the test area of ​​the test piece 200 will be offset. Through the first guide column 182 and the second guide column 143, the moving stage 180 can drive the first stage 130 to move and the second stage 140 to move at the same time. When the moving stage 180, the first stage 130 and the second stage 140 move together, the test probe 150 is buckled with the test area of ​​the test piece 200.

[0093] It is understandable that, based on the function of the moving stage 180, in some embodiments of the present application, it is not limited to the situation in which the first stage 130 is mounted on the moving stage 180 as shown in the figure, but the first stage 130 may be attached to the moving stage 180, or the first stage 130 and the moving stage 180 may be integrally arranged (the first stage 130 may be regarded as the moving stage 180).

[0094] When the first stage 130 and the second stage 140 can complete the snapping action, the adjuster 121 does not need to drive the cantilever 122 to move along the Z direction of the PCB test fixture 100 , and can only drive the cantilever 122 to move along the plane of the second stage 140 .

[0095] refer to Figure 1 and Figure 3As shown, in some embodiments of the present application, the PCB test fixture 100 may further include a driving device 190, such as a cylinder, etc. The driving device 190 is assembled on the moving stage 180 along the horizontal direction of the moving stage 180, which can save the Z-direction space of the PCB test fixture 100. The driving device 190 can drive the moving stage 180 to slide along the slide 171 to realize the automation of the PCB test fixture 100.

[0096] The PCB test fixture 100 provided in the embodiment of the present application can mainly solve the problem that the incoming position deviation of the test piece 200 is greater than the assembly tolerance, resulting in the inability to align the matching points of the test probe 150 and the test piece 200; the problem that the equipment testing space is small, the Z-axis operating space is less than or equal to 70mm, and the conventional industrial camera 111 cannot be used for shooting; the problem that the concentrated test of the test points of the test piece 200 and the alignment of the test probe 150 are difficult; and the problem that precise positioning of multiple workstations needs to be completed simultaneously with an accuracy of not less than ±0.1mm.

[0097] Figure 8 This is a schematic diagram of a PCB testing system provided in an embodiment of the present application, referring to Figure 8 As shown, an embodiment of the present application also provides a PCB testing system, including a PCB testing fixture 100, a motion control system 500 and a terminal device 400 as shown above, the PCB testing fixture 100 is electrically connected to the motion control system 500 and the terminal device 400, respectively, and the motion control system 500 is electrically connected to the terminal device 400.

[0098] Specifically, the camera 111 in the PCB test fixture 100 can be connected to the terminal device 400, and the regulator 121 can be connected to the motion control device. After the terminal device 400 obtains the image information of the camera 111, it calculates the compensation value through image analysis and then gives an instruction to the motion control system 500. The motion control system 500 controls the regulator 121 to operate the cantilever 122 to drive the test probe 150 to align with the test area of ​​the test piece 200, and then completes the engagement between the test probe 150 and the test area of ​​the test piece 200 through the driving device 190.

[0099] Among them, the technical features of the PCB test fixture 100, the technical effects corresponding to the technical features, and the technical problems solved by the technical effects are the same as those of the PCB test fixture 100 mentioned above, and will not be described one by one here.

[0100] The main steps of the PCB testing system to realize automatic alignment of the test probe 150 and the test area of ​​the test piece 200 are as follows:

[0101] (1) Calibrate the camera 111 using a calibration plate to obtain the external parameter matrix and distortion coefficient of the camera 111 relative to the coordinate system of the test piece 200 on the left and right sides.

[0102] (2) The test piece 200 is manually or mechanically loaded, and the PCB test fixture 100 is put into the equipment cabinet.

[0103] (3) The adjuster 121 moves to the initial position, driving the cantilever 122 to avoid the camera 111's shooting line of sight.

[0104] (4) The light source 114 illuminates the test pieces 200 , and the camera 111 simultaneously acquires position images of the two test pieces 200 .

[0105] (5) Image analysis and calculation of compensation value.

[0106] (6) The regulator 121 adjusts the position according to the compensation value, so that the test probe 150 moves to the position just above the test area of ​​the test object 200 .

[0107] (7) The driving device 190 drives the moving stage 180 to move upward to complete the fastening.

[0108] (8) Start testing.

[0109] The directional terms mentioned in the embodiments of the present application, such as "inside", "outside", etc., are only referenced to the directions of the drawings. Therefore, the directional terms used are for better and clearer description and understanding of the embodiments of the present application, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the embodiments of the present application. In addition, unless otherwise specified in the present application, "multiple" in the present application refers to two or more.

[0110] In the embodiments of the present application, "and / or" is only a description of the association relationship of the associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.

[0111] In the description of the embodiments of the present application, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, or it can be an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the embodiments of the present application can be understood according to specific circumstances.

[0112] The terms "first", "second", "third", "fourth", etc. (if any) in the description and claims of the embodiments of the present application and the above-mentioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence.

[0113] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the embodiments of the present application, rather than to limit them. Although the embodiments of the present application have been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein by equivalents. These modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A PCB test fixture, characterized in that: include: An optical component, an adjustment component, a test probe, and a first stage and a second stage which are arranged opposite to each other and spaced apart from each other from bottom to top; An assembly cavity is provided on a surface of the first stage facing the second stage, and the assembly cavity is used for assembling the test piece; The adjustment assembly comprises: an adjuster and a cantilever, wherein the adjuster is arranged on the second stage, one end of the cantilever is connected to the adjuster, and the other end of the cantilever is arranged with a test probe facing a side of the first stage, the test probe is arranged facing the test area of ​​the test object, and the adjuster can drive the cantilever to move; The optical component includes: a camera and a reflection component, the camera and the reflection component are both arranged on a surface of the second stage facing away from the first stage, the reflection component includes a first reflector, the second stage is provided with a first through hole, the camera is used to photograph the test area of ​​the test piece to be tested and the image of the test probe imaged to the first reflector through the first through hole; the PCB test fixture is used to be incorporated into the equipment cabinet, and the first reflector is used to feed back the alignment of the test probe located in the interlayer between the first stage and the second stage and the test area of ​​the test piece to be tested to the camera located in the same plane as the first reflector.

2. The PCB test fixture according to claim 1, characterized in that: The reflective assembly further comprises: a second reflector; The second reflector is disposed on a surface of the second stage facing away from the first stage, and the camera is used to photograph a test area of ​​the test piece and an image of the test probe formed by passing through the first through hole and the first reflector to the second reflector.

3. The PCB test fixture according to claim 2, characterized in that: There are two assembly cavities, and there are two groups of adjustment components and reflection components, and each group of adjustment components and each group of reflection components corresponds to one piece to be tested; There is one camera, and the second reflector in each set of reflective components images the corresponding test area of ​​the test piece and the test probe to the camera.

4. The PCB test fixture according to claim 3, characterized in that: The first reflector is arranged to be inclined to the plane of the second stage, the second reflector is arranged to be perpendicular to the plane of the second stage, the two groups of reflective components are located on the same straight line, and the imaging path from the first reflector to the camera through the second reflector is arranged at an angle; The two groups of reflection components are symmetrically arranged with respect to the central axis of the lens of the camera and are close to each other, and the two first reflection mirrors in the two groups of reflection components are arranged face to face.

5. The PCB test fixture according to any one of claims 2 to 4, characterized in that: The optical assembly further comprises: a reflector bracket, the first reflector and the second reflector being mounted on the reflector bracket; The reflector bracket is fixedly connected to the second stage.

6. The PCB test fixture according to any one of claims 1 to 4, characterized in that: The optical assembly further comprises: a light source; The light source is used to illuminate the test area of ​​the test piece.

7. The PCB test fixture according to any one of claims 1 to 4, characterized in that: A groove or a second through hole is formed on a side of the second stage facing away from the first stage, and the groove or the second through hole is connected to the first through hole. One end of the cantilever connected to the regulator is located in the groove or the second through hole, and the other end of the cantilever extends into the first through hole.

8. The PCB test fixture according to claim 7, characterized in that: Also includes: a suspension bridge located on a side of the second loading platform facing away from the first loading platform; The suspension bridge is arranged across the sink trough or the second through hole, the regulator is suspended from the suspension bridge, and one end of the regulator connected to the cantilever extends into the sink trough or the second through hole.

9. The PCB test fixture according to any one of claims 1 to 4, characterized in that: The extending direction from one end of the cantilever connected to the adjuster to one end of the cantilever provided with the test probe is parallel to the central axis of the lens of the camera.

10. The PCB test fixture according to any one of claims 1 to 4, characterized in that: One end of the cantilever on which the test probe is disposed is provided with a slot, and the test probe is assembled in the slot.

11. The PCB test fixture according to any one of claims 1 to 4, characterized in that: Also includes: Base and motion stage; The base and the moving stage are arranged on a side of the first stage away from the second stage, the moving stage is arranged on a side of the base facing the first stage, and the moving stage is used to be fixedly connected to the first stage; The base is provided with a slideway inclined from bottom to top, and the moving stage has a slide roller, and the slide roller is slidably arranged on the slideway; A first guide column extending toward the second platform is provided on one side of the moving platform facing the second platform, and a second guide column extending toward the moving platform is provided on one side of the second platform facing the moving platform. The first guide column is sleeved on the second guide column or the second guide column is sleeved on the first guide column.

12. The PCB test fixture according to claim 11, characterized in that: The regulator can drive the cantilever to move along the plane of the second stage.

13. The PCB test fixture according to claim 11, characterized in that: Also includes: Drive device; The driving device is mounted on the moving stage along a horizontal direction of the moving stage, and the driving device is used to drive the moving stage to slide along the slideway.

14. The PCB test fixture according to any one of claims 1 to 4, characterized in that: The camera is a miniature camera.

15. A PCB testing system, characterized in that: include: The PCB test fixture, motion control system and terminal equipment as described in any one of claims 1 to 14; The PCB test fixture is electrically connected to the motion control system and the terminal device respectively, and the motion control system is electrically connected to the terminal device.

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