Method, device and apparatus for controlling temperature of detector module in CT scanning system

Abstract

The method, device and equipment for controlling the temperature of the detector module in the CT scanning system provided by the embodiments of the present disclosure include: obtaining a first control parameter of the control module of the CT scanning system under a first working condition and a first temperature change rate of the detector module under the first working condition; obtaining a second temperature change rate of the detector module of the CT scanning system under a second working condition in response to a trigger operation submitted by a target object; adjusting the first control parameter to obtain a second control parameter according to the first temperature change rate and the second temperature change rate; and adjusting the control parameter of the control module of the CT scanning system under the second working condition based on the second control parameter. According to the first temperature change rate of the detector module under the first working condition, the first control parameter of the control module and the second temperature change rate of the detector module under the second working condition, the second control parameter of the control module under the second working condition is adjusted, so as to realize rapid adjustment of the control parameter of the control module when the working condition changes.

Description

Technical Field

[0001] The present invention relates to the field of CT scanning technology and related technical fields, and in particular to a method, device and equipment for controlling the temperature of a detector module in a CT scanning system. Background Art

[0002] The CT detector system is very sensitive to temperature. From a system perspective, the detector system must work properly within an appropriate temperature range and ensure that the temperature of each detector is stable. If the temperature difference between different areas of the detector is large, the CT scan image will produce artifacts, affecting the image quality. However, due to the high power and large size of the detector itself, the heat dissipation capacity of each part of the detector is not the same. Especially when rotating at high speed, the temperature of the module at the edge of the detector drops much faster than that in the middle. In addition, different room temperature conditions will also affect the uniformity of temperature in various places. In short, temperature uniformity is affected by many factors.

[0003] In the prior art, generally, an appropriate room temperature range is adjusted and the rotation speed of the detector system is limited not to be too fast, thereby ensuring that the temperature difference of the detectors in different areas is kept within a small range, that is, the temperature of the detectors in different areas is uniform.

[0004] However, in the prior art, the detector has a small rotation speed range and has relatively high requirements on the ambient temperature of the detector. When the ambient temperature cannot be met and / or the detector rotation speed cannot meet the set rotation speed, the temperature of the detector will be uneven, affecting the quality of the CT scan image. Summary of the invention

[0005] The embodiments described herein provide a method, device and apparatus for controlling the temperature of a detector module in a CT scanning system, which solve the problems existing in the prior art.

[0006] In a first aspect, according to the present disclosure, a method for controlling the temperature of a detector module in a CT scanning system is provided, comprising:

[0007] Acquire a first control parameter of a control module of a CT scanning system under a first working condition and a first temperature change rate of a detector module under the first working condition, wherein the control module of the CT scanning system includes a heating control module and a heat dissipation control module, and the first temperature change rate is determined based on a first temperature of the detector module collected at any two adjacent sampling points under the first working condition;

[0008] In response to a trigger operation submitted by the target object, a second temperature change rate of the detector module of the CT scanning system under a second working condition is obtained, wherein the second temperature change rate is determined based on a second temperature of the detector module acquired at a first sampling point in the second working condition and a third temperature of the detector module acquired at a second sampling point, and the trigger operation is used to trigger the CT scanning system to change from the first working condition to the second working condition;

[0009] According to the first temperature change rate and the second temperature change rate, adjusting the first control parameter to obtain a second control parameter;

[0010] Based on the second control parameter, the control module of the CT scanning system is adjusted to control the parameter under the second working condition.

[0011] In some embodiments of the present disclosure, obtaining a second temperature change rate of a detector module of the CT scanning system under a second working condition includes:

[0012] calculating a difference between the third temperature and the second temperature;

[0013] A second temperature change rate of the detector module of the CT scanning system under a second working condition is determined according to an absolute value of a difference between the third temperature and the second temperature.

[0014] In some embodiments of the present disclosure, adjusting the first control parameter to obtain the second control parameter according to the first temperature change rate and the second temperature change rate includes:

[0015] calculating a ratio of the first temperature change rate to the second temperature change rate;

[0016] The first control parameter is multiplied by the ratio to obtain a second control parameter.

[0017] In some embodiments of the present disclosure, after adjusting the control parameter of the control module of the CT scanning system under the second working condition based on the second control parameter, the method further includes:

[0018] Acquiring a fourth temperature of a detector module of the CT scanning system in a second working condition;

[0019] According to the relationship between the fourth temperature and the preset temperature, a control signal is output to the control module of the CT scanning system.

[0020] In some embodiments of the present disclosure, obtaining a fourth temperature of a detector module of the CT scanning system under a second working condition includes:

[0021] Acquiring temperature information of each detector included in the detector module collected by a temperature sensor;

[0022] A fourth temperature of the detector module of the CT scanning system under the second working condition is determined according to the obtained average value of the temperature information of each detector included in the detector module.

[0023] In some embodiments of the present disclosure, before determining the fourth temperature of the detector module of the CT scanning system under the second working condition according to the obtained average value of the temperature information of each detector included in the detector module, the method further includes:

[0024] The maximum and minimum values ​​of the temperature information of the detectors in the detector module are eliminated.

[0025] In some embodiments of the present disclosure, outputting a control signal to a control module of the CT scanning system according to a relationship between the fourth temperature and a preset temperature includes:

[0026] When the fourth temperature is greater than or equal to the first preset temperature and less than or equal to the second preset temperature, outputting a control signal to a temperature increase control module and a temperature decrease control module of the CT scanning system;

[0027] When the fourth temperature is lower than the first preset temperature, outputting a control signal to a temperature rise control module of the CT scanning system;

[0028] When the fourth temperature is greater than the second preset temperature, a control signal is output to the temperature reduction control module of the CT scanning system.

[0029] In some embodiments of the present disclosure, before obtaining the fourth temperature of the detector module of the CT scanning system under the second working condition, the method further includes:

[0030] Acquire information on the number of detectors included in a detector module in a CT scanning system, wherein the detector module includes detectors arrayed along a first direction and a second direction;

[0031] According to the number information of the detectors included in the detector module in the first direction and the number information of the detectors included in the detector module in the second direction, the detector module is divided into a plurality of sub-detector modules;

[0032] The obtaining of a fourth temperature of the detector module of the CT scanning system under the second working condition includes:

[0033] A fourth temperature of each sub-detector module of the CT scanning system under the second working condition is obtained.

[0034] In a second aspect, according to the present disclosure, a detector module temperature control device in a CT scanning system is provided, comprising:

[0035] A first operating condition parameter acquisition module, used to acquire a first control parameter of a control module of a CT scanning system under a first operating condition and a first temperature change rate of a detector module under the first operating condition, wherein the control module of the CT scanning system includes a heating control module and a heat dissipation control module, and the first temperature change rate is determined based on a first temperature of the detector module collected at any two adjacent sampling points under the first operating condition;

[0036] a second operating condition parameter acquisition module, configured to acquire a second temperature change rate of the detector module of the CT scanning system under a second operating condition in response to a trigger operation submitted by a target object, wherein the second temperature change rate is determined based on a second temperature of the detector module acquired at a first sampling point and a third temperature of the detector module acquired at a second sampling point under the second operating condition, and the trigger operation is used to trigger the CT scanning system to change from the first operating condition to the second operating condition;

[0037] A second operating condition control parameter determination module, configured to adjust the first control parameter to obtain a second control parameter according to the first temperature change rate and the second temperature change rate;

[0038] An adjustment module is used to adjust the control parameters of the control module of the CT scanning system under the second working condition based on the second control parameter.

[0039] In a third aspect, according to the present disclosure, there is provided a computer device, including:

[0040] one or more processors;

[0041] a storage device for storing one or more programs,

[0042] When the one or more programs are executed by the one or more processors, the one or more processors implement any method as described in the first aspect.

[0043] The method, device and equipment for controlling the temperature of the detector module in the CT scanning system provided by the embodiment of the present disclosure first obtain the first control parameter of the control module of the CT scanning system under the first working condition and the first temperature change rate of the detector module under the first working condition; then, in response to the trigger operation submitted by the target object, obtain the second temperature change rate of the detector module of the CT scanning system under the second working condition; and adjust the first control parameter according to the first temperature change rate and the second temperature change rate to obtain the second control parameter; finally, based on the second control parameter, adjust the control parameter of the control module of the CT scanning system under the second working condition. By obtaining the first temperature change rate of the detector module under the first working condition and the first control parameter of the control module, and the second temperature change rate of the detector module under the second working condition, and adjusting the second control parameter of the control module under the second working condition, it is possible to quickly adjust the control parameter of the control module when the working condition of the CT scanning system changes, thereby improving the accuracy of the temperature control of the detector module.

[0044] The above description is only an overview of the technical solution of the embodiment of the present application. In order to more clearly understand the technical means of the embodiment of the present application, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the embodiment of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] In order to more clearly illustrate the technical solutions of the embodiments of the present disclosure, the drawings of the embodiments will be briefly described below. It should be noted that the drawings described below only relate to some embodiments of the present disclosure, but are not intended to limit the present disclosure, wherein:

[0046] Figure 1 It is a flow chart of a method for controlling the temperature of a detector module in a CT scanning system provided by an embodiment of the present disclosure;

[0047] Figure 2 It is a flow chart of another method for controlling the temperature of a detector module in a CT scanning system provided by an embodiment of the present disclosure;

[0048] Figure 3 It is a structural schematic diagram of a detector module temperature control device in a CT scanning system provided by an embodiment of the present disclosure;

[0049] Figure 4 It is a structural diagram of a computer device provided in an embodiment of the present disclosure.

[0050] In the drawings, reference numerals with the same last two digits correspond to the same elements. It should be noted that the elements in the drawings are schematic and not drawn to scale. DETAILED DESCRIPTION

[0051] In order to make the purpose, technical solution and advantages of the embodiments of the present disclosure clearer, the technical solution of the embodiments of the present disclosure will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the present disclosure, rather than all of the embodiments. Based on the described embodiments of the present disclosure, all other embodiments obtained by those skilled in the art without creative work also fall within the scope of protection of the present disclosure.

[0052] Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by a person skilled in the art to which the subject matter of the present disclosure belongs. It will be further understood that terms such as those defined in commonly used dictionaries should be interpreted as having a meaning consistent with their meaning in the context of the specification and the relevant art, and will not be interpreted in an idealized or overly formal form unless otherwise explicitly defined herein. As used herein, a statement that two or more parts are "connected" or "coupled" together shall mean that the parts are joined together directly or through one or more intermediate components.

[0053] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase "embodiments" in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0054] The term "and / or" in this article is only a description of the association relationship of the associated objects, indicating that there can be three relationships. For example, A and / or B can mean: A exists, A and B exist at the same time, and B exists. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.

[0055] Furthermore, in all embodiments of the present disclosure, terms such as “first” and “second” are used only to distinguish one component (or a part of a component) from another component (or another part of a component).

[0056] In the description of the present application, unless otherwise specified, "plurality" means more than two (including two), and similarly, "multiple groups" means more than two groups (including two).

[0057] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the accompanying drawings.

[0058] Based on the problems existing in the prior art, the present disclosure provides a method for controlling the temperature of a detector module in a CT scanning system. Figure 1 FIG. 1 is a flow chart of a method for controlling the temperature of a detector module in a CT scanning system provided by an embodiment of the present disclosure. Figure 1 As shown, the detector module temperature control method in the CT scanning system includes:

[0059] S110 , obtaining a first control parameter of a control module of a CT scanning system under a first working condition and a first temperature change rate of a detector module under the first working condition.

[0060] The control module of the CT scanning system includes a heating control module and a heat dissipation control module, and the first temperature change rate is determined based on the first temperature of the detector module collected at any two adjacent sampling points in the first working condition.

[0061] The control module of the CT scanning system includes a heating control module and a heat dissipation control module. Each detector of the detector module of the CT scanning system is provided with a temperature sensor, and the temperature information of each detector in the detector module is collected through the temperature sensor.

[0062] In a specific implementation, the temperature sensor provided on each detector of the detector module measures the temperature of the detector at the corresponding sampling point, and the time interval between any two adjacent sampling points is the same, that is, the sampling period of the temperature sensor is T. After the temperature information of the detector collected by the temperature sensor is obtained, the temperature change rate of the detector module can be determined according to the temperature information of the detector obtained at any two adjacent sampling points, that is, the absolute value of the difference between the temperature information of the detector collected at any two adjacent sampling points is the temperature change rate of the detector module.

[0063] When the CT scanning system is in a stable operating state under the first working condition, the first control parameter of the control module of the CT scanning system under the first working condition and the first temperature change rate of the detector module under the first working condition are fixed.

[0064] S120 . In response to a trigger operation submitted by the target object, obtain a second temperature change rate of a detector module of the CT scanning system under a second working condition.

[0065] Among them, the second temperature change rate is determined based on the second temperature of the detector module collected at the first sampling point of the second working condition and the third temperature of the detector module collected at the second sampling point, and the triggering operation is used to trigger the CT scanning system to change from the first working condition to the second working condition.

[0066] When the target object triggers a change in the working condition of the CT scanning system, for example, when the first working condition is a static working condition, the second working condition may be a rotation exposure scanning working condition, a non-rotation exposure-only working condition, or a non-exposure rotation-only working condition. In an exemplary embodiment, after the target object submits a trigger operation, the CT scanning system changes from a static working condition to a rotation exposure scanning working condition, that is, the first working condition of the CT scanning system is a static working condition, and the second working condition is a rotation exposure scanning working condition, and the working condition of the CT scanning system changes. At this time, by obtaining the second temperature of the detector module collected by the temperature sensor at the first sampling point of the second working condition and the third temperature of the detector module collected at the second sampling point, the second temperature change rate of the detector module of the CT scanning system under the second working condition is determined according to the absolute value of the difference between the third temperature and the second temperature.

[0067] It should be noted that the time interval between the first sampling point and the second sampling point is T.

[0068] S130. Adjust the first control parameter according to the first temperature change rate and the second temperature change rate to obtain a second control parameter.

[0069] In a specific implementation, the first control parameter is adjusted according to the first temperature change rate and the second temperature change rate to obtain the second control parameter, including: calculating the ratio of the first temperature change rate to the second temperature change rate; multiplying the first control parameter by the ratio to obtain the second control parameter.

[0070] Specifically, after obtaining the first temperature change rate of the detector module under the first working condition and the second temperature change rate of the detector module under the second working condition, the ratio of the first temperature change rate to the second temperature change rate is first calculated, and then the second control parameter of the control module of the CT scanning system under the second working condition is obtained by multiplying the first control parameter by the ratio of the first temperature change rate to the second temperature change rate.

[0071] In a specific embodiment, if the first temperature change rate of the detector module under the first operating condition is A1, the first control parameter of the control module under the first operating condition is KP1, and the second temperature change rate of the detector module under the second operating condition is A2, then the second control parameter of the control module under the second operating condition is KP2=KP1*(A2 / A1).

[0072] By acquiring the first temperature change rate of the detector module and the first control parameter of the control module under the first working condition, as well as the second temperature change rate of the detector module under the second working condition, the second control parameter of the control module under the second working condition is adjusted, so that when the working condition of the CT scanning system changes, the control parameters of the control module can be quickly adjusted to improve the control accuracy of the detector module temperature.

[0073] As a preferred embodiment, if the first temperature change rate of the detector module under the first operating condition is A1, the first control parameter of the control module under the first operating condition is KP1, the sampling period under the first operating condition is T1, and the second temperature change rate of the detector module under the second operating condition is A2, then the sampling period under the second operating condition is T2 = T1 / (A2 / A1).

[0074] S140 . Based on the second control parameter, adjust the control parameter of the control module of the CT scanning system under the second working condition.

[0075] In the above embodiment, the second temperature change rate of the detector module of the CT scanning system under the second operating condition is determined based on the second temperature of the detector module collected at the first sampling point under the second operating condition and the third temperature of the detector module collected at the second sampling point. Therefore, after the second control parameter is obtained based on the first temperature change rate, the second temperature change rate and the first control parameter, the accuracy of the fourth temperature of the detector module collected after the third sampling point can be achieved by adjusting the control parameter of the control module of the CT scanning system to the second control parameter.

[0076] The detector module temperature control method in the CT scanning system provided by the embodiment of the present disclosure first obtains the first control parameter of the control module of the CT scanning system under the first working condition and the first temperature change rate of the detector module under the first working condition; then, in response to the trigger operation submitted by the target object, obtains the second temperature change rate of the detector module of the CT scanning system under the second working condition; and adjusts the first control parameter according to the first temperature change rate and the second temperature change rate to obtain the second control parameter; finally, based on the second control parameter, adjusts the control parameter of the control module of the CT scanning system under the second working condition. By obtaining the first temperature change rate of the detector module under the first working condition and the first control parameter of the control module, and the second temperature change rate of the detector module under the second working condition, and adjusting the second control parameter of the control module under the second working condition, it is possible to quickly adjust the control parameter of the control module when the working condition of the CT scanning system changes, thereby improving the control accuracy of the temperature of the detector module.

[0077] Based on the above embodiments, Figure 2 FIG. 1 is a flow chart of another method for controlling the temperature of a detector module in a CT scanning system provided by an embodiment of the present disclosure. Figure 2 As shown, after executing step S140, the following steps are also included:

[0078] S150: Obtain a fourth temperature of a detector module of the CT scanning system in a second working condition.

[0079] The fourth temperature is the temperature corresponding to any other sampling point except the first sampling point and the second sampling point under the second operating condition.

[0080] After the control module of the CT scanning system is adjusted to the second control parameter, a fourth temperature of the control module of the CT scanning system under the second control parameter is obtained.

[0081] In a specific implementation, obtaining the fourth temperature of the detector module of the CT scanning system under the second working condition includes: obtaining temperature information of each detector included in the detector module collected by a temperature sensor; and determining the fourth temperature of the detector module of the CT scanning system under the second working condition based on the average value of the temperature information of each detector included in the detector module.

[0082] Specifically, each detector included in the detector module is provided with a temperature sensor, and the fourth temperature of the detector module under the second working condition is obtained by acquiring the temperature information of the detector collected by each temperature sensor and then calculating the average value of the temperature information of each detector.

[0083] As an implementable embodiment, after obtaining the temperature information of each detector included in the detector module collected by the temperature sensor, firstly, the maximum value and the minimum value of the temperature information of the detectors in the detector module are eliminated, and then based on the temperature information of other detectors after eliminating the maximum value and the minimum value, the fourth temperature of the detector module of the CT scanning system under the second working condition is obtained, so as to ensure the accuracy of the fourth temperature of the determined detector module under the second working condition, and avoid the temperature of the collected detector being invalid data due to the failure of some temperature sensors, which further affects the accuracy of the fourth temperature of the obtained detector module.

[0084] S160 , outputting a control signal to a control module of the CT scanning system according to a relationship between the fourth temperature and the preset temperature.

[0085] There is a corresponding relationship between the preset temperature and the working condition of the CT scanning system, and the preset temperature is different under different working conditions.

[0086] The control module of the CT scanning system includes a heating control module and a cooling control module. After obtaining the second control parameter of the control module of the CT scanning system under the second working condition in steps S110-S140, the fourth temperature of the detector module under the second working condition is obtained, and then the relationship between the fourth temperature and the preset temperature is compared, and a control signal is output to the heating module and / or the cooling control module to achieve precise adjustment of the temperature of the detector module of the CT scanning system.

[0087] As a specific implementation, according to the relationship between the fourth temperature and the preset temperature, a control signal is output to the control module of the CT scanning system, including: when the fourth temperature is greater than or equal to the first preset temperature and less than or equal to the second preset temperature, a control signal is output to the heating control module and the cooling control module of the CT scanning system; when the fourth temperature is less than the first preset temperature, a control signal is output to the heating control module of the CT scanning system; when the fourth temperature is greater than the second preset temperature, a control signal is output to the cooling control module of the CT scanning system.

[0088] Specifically, when the fourth temperature is lower than the first preset temperature, only a control signal is output to the temperature increasing control module of the CT scanning system, and based on the temperature increasing control module of the CT scanning system, the detector module is heated to ensure that the temperature of the control module of the CT scanning system is controlled within the preset temperature range; when the fourth temperature is higher than the second preset temperature, only a control signal is output to the temperature increasing control module of the CT scanning system, and based on the temperature decreasing control module of the CT scanning system, the detector module is cooled to ensure that the temperature of the control module of the CT scanning system is controlled within the preset temperature range; when the fourth temperature is higher than or equal to the first preset temperature and lower than or equal to the second preset temperature, control signals are respectively output to the temperature increasing control module and the temperature decreasing control module of the CT scanning system, and under the joint action of the temperature increasing control module and the temperature decreasing control module, the temperature of the control module of the CT scanning system is controlled within the preset temperature range.

[0089] In the disclosed embodiment, after obtaining the second control parameter of the control module of the CT scanning system under the second operating condition, the fourth temperature of the detector module under the second operating condition is obtained, and then the relationship between the fourth temperature and the preset temperature is compared, and a control signal is output to the heating module and / or the cooling control module to achieve precise adjustment of the temperature of the detector module of the CT scanning system.

[0090] On the basis of the above embodiment, as an optional implementation manner, before obtaining the fourth temperature of the detector module of the CT scanning system under the second working condition, it also includes: obtaining the number information of detectors included in the detector module of the CT scanning system, wherein the detector module includes detectors arranged in an array along a first direction and a second direction; dividing the detector module into multiple sub-detector modules according to the number information of detectors included in the detector module in the first direction and the number information of detectors included in the detector module in the second direction.

[0091] In this embodiment, one sub-detector module corresponds to one control module.

[0092] The detector module is divided into intervals based on the information on the number of detectors included in the first direction and the number of detectors included in the second direction, so as to obtain a plurality of sub-detector modules. Then, based on the above-mentioned steps S150 and S160, the fourth temperature of each sub-detector module under the second working condition is obtained, and the relationship between the fourth temperature of each sub-detector module under the second working condition and the preset temperature is judged in turn, and a control signal is output to the control module corresponding to each sub-detector module to realize zoned control of the temperature of the detector module and ensure the uniformity of the temperature of the detector module.

[0093] Based on the above embodiments, the present disclosure also provides a detector module temperature control device in a CT scanning system. Figure 3 is a schematic diagram of the structure of a detector module temperature control device in a CT scanning system provided by an embodiment of the present disclosure, such as Figure 3 As shown, the detector module temperature control device in the CT scanning system includes:

[0094] A first operating condition parameter acquisition module 310, configured to acquire a first control parameter of a control module of a CT scanning system under a first operating condition and a first temperature change rate of a detector module under the first operating condition, wherein the control module of the CT scanning system includes a heating control module and a heat dissipation control module, and the first temperature change rate is determined based on a first temperature of the detector module collected at any two adjacent sampling points under the first operating condition;

[0095] A second operating condition parameter acquisition module 320 is used to obtain a second temperature change rate of the detector module of the CT scanning system under a second operating condition in response to a trigger operation submitted by the target object, wherein the second temperature change rate is determined based on a second temperature of the detector module acquired at a first sampling point and a third temperature of the detector module acquired at a second sampling point under the second operating condition, and the trigger operation is used to trigger the CT scanning system to change from the first operating condition to the second operating condition;

[0096] A second operating condition control parameter determination module 330, configured to adjust the first control parameter to obtain a second control parameter according to the first temperature change rate and the second temperature change rate;

[0097] The adjustment module 340 is used to adjust the control parameters of the control module of the CT scanning system under the second working condition based on the second control parameter.

[0098] The detector module temperature control device in the CT scanning system provided by the embodiment of the present disclosure first obtains the first control parameter of the control module of the CT scanning system under the first working condition and the first temperature change rate of the detector module under the first working condition; then, in response to the trigger operation submitted by the target object, obtains the second temperature change rate of the detector module of the CT scanning system under the second working condition; and adjusts the first control parameter according to the first temperature change rate and the second temperature change rate to obtain the second control parameter; finally, based on the second control parameter, adjusts the control parameter of the control module of the CT scanning system under the second working condition. By obtaining the first temperature change rate of the detector module and the first control parameter of the control module under the first working condition, and the second temperature change rate of the detector module under the second working condition, and adjusting the second control parameter of the control module under the second working condition, it is possible to quickly adjust the control parameter of the control module when the working condition of the CT scanning system changes, thereby improving the accuracy of the temperature control of the detector module.

[0099] In a specific implementation, obtaining a second temperature change rate of a detector module of a CT scanning system under a second working condition includes:

[0100] calculating a difference between the third temperature and the second temperature;

[0101] A second temperature change rate of the detector module of the CT scanning system under the second working condition is determined according to the absolute value of the difference between the third temperature and the second temperature.

[0102] In a specific implementation, adjusting the first control parameter to obtain the second control parameter according to the first temperature change rate and the second temperature change rate includes:

[0103] Calculating a ratio of the first temperature change rate to the second temperature change rate;

[0104] The first control parameter is multiplied by the ratio to obtain a second control parameter.

[0105] In a specific implementation, after adjusting the control parameter of the control module of the CT scanning system under the second working condition based on the second control parameter, the method further includes:

[0106] Acquire a fourth temperature of a detector module of the CT scanning system in a second working condition;

[0107] According to the relationship between the fourth temperature and the preset temperature, a control signal is output to a control module of the CT scanning system.

[0108] In a specific implementation, obtaining a fourth temperature of a detector module of a CT scanning system under a second working condition includes:

[0109] Acquire temperature information of each detector included in the detector module collected by the temperature sensor;

[0110] The fourth temperature of the detector module of the CT scanning system under the second working condition is determined according to the obtained average value of the temperature information of each detector included in the detector module.

[0111] In a specific implementation, before determining the fourth temperature of the detector module of the CT scanning system under the second working condition according to the obtained average value of the temperature information of each detector included in the detector module, the method further includes:

[0112] Eliminate the maximum and minimum values ​​of the temperature information of the detector in the detector module.

[0113] In a specific embodiment, outputting a control signal to a control module of a CT scanning system according to a relationship between the fourth temperature and the preset temperature includes:

[0114] When the fourth temperature is greater than or equal to the first preset temperature and less than or equal to the second preset temperature, output a control signal to a temperature increase control module and a temperature decrease control module of the CT scanning system;

[0115] When the fourth temperature is lower than the first preset temperature, outputting a control signal to a temperature increase control module of the CT scanning system;

[0116] When the fourth temperature is greater than the second preset temperature, a control signal is output to a temperature reduction control module of the CT scanning system.

[0117] In a specific implementation, before obtaining the fourth temperature of the detector module of the CT scanning system under the second working condition, the method further includes:

[0118] Acquire information on the number of detectors included in a detector module in a CT scanning system, wherein the detector module includes detectors arrayed along a first direction and a second direction;

[0119] According to the number information of the detectors included in the detector module in the first direction and the number information of the detectors included in the detector module in the second direction, the detector module is divided into a plurality of sub-detector modules;

[0120] Obtaining a fourth temperature of a detector module of a CT scanning system under a second working condition includes:

[0121] The fourth temperature of each sub-detector module of the CT scanning system under the second working condition is obtained.

[0122] The present application also provides a computer device. Figure 4 , Figure 4 This is a basic structural block diagram of the computer device in this embodiment.

[0123] The computer device includes a memory 510 and a processor 520 that are connected to each other through a system bus. It should be noted that the figure only shows a computer device with components 510-520, but it should be understood that it is not required to implement all the components shown, and more or fewer components can be implemented instead. Among them, those skilled in the art can understand that the computer device here is a device that can automatically perform numerical calculations and / or information processing according to pre-set or stored instructions, and its hardware includes but is not limited to microprocessors, application specific integrated circuits (Application Specific Integrated Circuit, ASIC), programmable gate arrays (Field-Programmable Gate Array, FPGA), digital processors (Digital Signal Processor, DSP), embedded devices, etc.

[0124] Computer devices can be computing devices such as desktop computers, notebooks, PDAs, and cloud servers. Computer devices can interact with users through keyboards, mice, remote controls, touch pads, or voice control devices.

[0125] The memory 510 includes at least one type of readable storage medium, and the readable storage medium includes a non-volatile memory or a volatile memory, such as a flash memory, a hard disk, a multimedia card, a card-type memory (e.g., SD or DX memory, etc.), a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), a programmable read-only memory (PROM), a magnetic memory, a magnetic disk, an optical disk, etc., and the RAM may include a static RAM or a dynamic RAM. In some embodiments, the memory 510 may be an internal storage unit of a computer device, such as a hard disk or a memory of the computer device. In other embodiments, the memory 510 may also be an external storage device of a computer device, such as a plug-in hard disk, a smart memory card (SMC), a secure digital (SD) card, or a flash card (Flash Card), etc., equipped on the computer device. Of course, the memory 510 may also include both an internal storage unit of the computer device and an external storage device thereof. In this embodiment, the memory 510 is generally used to store an operating system and various application software installed on the computer device, such as the program code of the above method, etc. In addition, the memory 510 may also be used to temporarily store various data that have been output or are to be output.

[0126] The processor 520 is generally used to perform the overall operation of the computer device. In this embodiment, the memory 510 is used to store program codes or instructions, the program code includes computer operation instructions, and the processor 520 is used to execute the program codes or instructions stored in the memory 510 or process data, such as running the program code of the above method.

[0127] In this article, the bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, etc. The bus system can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, only one thick line is used in the figure, but it does not mean that there is only one bus or one type of bus.

[0128] Another embodiment of the present application also provides a computer-readable medium, which may be a computer-readable signal medium or a computer-readable medium. A processor in a computer reads a computer-readable program code stored in the computer-readable medium, so that the processor can execute the functional actions specified in each step or a combination of steps in the above method; and generate a device for implementing the functional actions specified in each block or a combination of blocks in the block diagram.

[0129] Computer-readable media include but are not limited to electronic, magnetic, optical, electromagnetic, infrared memory or semiconductor systems, devices or apparatuses, or any appropriate combination of the foregoing, the memory is used to store program codes or instructions, the program codes include computer operating instructions, and the processor is used to execute the program codes or instructions of the above methods stored in the memory.

[0130] For the definitions of memory and processor, please refer to the description of the aforementioned computer device embodiment and will not be repeated here.

[0131] In the several embodiments provided in the present application, it should be understood that the disclosed systems, devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic, for example, the division of modules or units is only a logical function division, and there may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0132] Each functional unit or module in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0133] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions to enable a computer device (which can be a personal computer, server, or network device, etc.) or a processor (processor) to perform all or part of the steps of each embodiment method of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (Read-Only Memory, ROM), random access memory (Random Access Memory, RAM), disk or optical disk and other media that can store program code.

[0134] Unless the context clearly indicates otherwise, the singular form of the words used herein and in the appended claims includes the plural and vice versa. Thus, when referring to the singular, the plural form of the corresponding term is generally included. Similarly, the words "comprise" and "include" are to be interpreted as inclusive rather than exclusive. Likewise, the terms "include" and "or" should be interpreted as inclusive unless such interpretation is expressly prohibited herein. Where the term "example" is used herein, particularly when it is located after a group of terms, the "example" is merely exemplary and illustrative and should not be considered exclusive or comprehensive.

[0135] Further aspects and scopes of adaptability become apparent from the description provided herein. It should be understood that various aspects of the present application can be implemented individually or in combination with one or more other aspects. It should also be understood that the description and specific embodiments herein are intended for purposes of illustration only and are not intended to limit the scope of the present application.

[0136] Several embodiments of the present disclosure are described in detail above, but it is obvious that those skilled in the art can make various modifications and variations to the embodiments of the present disclosure without departing from the spirit and scope of the present disclosure. The protection scope of the present disclosure is defined by the attached claims.

Claims

1. A method for controlling the temperature of a detector module in a CT scanning system, characterized in that: include: Acquire a first control parameter of a control module of a CT scanning system under a first working condition and a first temperature change rate of a detector module under the first working condition, wherein the control module of the CT scanning system includes a heating control module and a heat dissipation control module, and the first temperature change rate is determined based on a first temperature of the detector module collected at any two adjacent sampling points under the first working condition; In response to a trigger operation submitted by the target object, a second temperature change rate of the detector module of the CT scanning system under a second working condition is obtained, wherein the second temperature change rate is determined based on a second temperature of the detector module acquired at a first sampling point and a third temperature of the detector module acquired at a second sampling point under the second working condition, and the trigger operation is used to trigger the CT scanning system to change from the first working condition to the second working condition; According to the first temperature change rate and the second temperature change rate, adjusting the first control parameter to obtain a second control parameter; Based on the second control parameter, adjusting a control parameter of the control module of the CT scanning system under the second working condition; Acquire a fourth temperature of a detector module of the CT scanning system under a second working condition; According to the relationship between the fourth temperature and the preset temperature, a control signal is output to the control module of the CT scanning system.

2. The method according to claim 1, characterized in that: The obtaining of a second temperature change rate of the detector module of the CT scanning system under a second working condition includes: calculating a difference between the third temperature and the second temperature; A second temperature change rate of the detector module of the CT scanning system under a second working condition is determined according to an absolute value of a difference between the third temperature and the second temperature.

3. The method according to claim 1, characterized in that: The adjusting the first control parameter to obtain the second control parameter according to the first temperature change rate and the second temperature change rate includes: calculating a ratio of the first temperature change rate to the second temperature change rate; The first control parameter is multiplied by the ratio to obtain a second control parameter.

4. The method according to claim 1, characterized in that: The obtaining of a fourth temperature of the detector module of the CT scanning system under the second working condition includes: Acquiring temperature information of each detector included in the detector module collected by a temperature sensor; A fourth temperature of the detector module of the CT scanning system under the second working condition is determined according to the obtained average value of the temperature information of each detector included in the detector module.

5. The method according to claim 4, characterized in that Before determining the fourth temperature of the detector module of the CT scanning system under the second working condition according to the obtained average value of the temperature information of each detector included in the detector module, the method further includes: The maximum and minimum values ​​of the temperature information of the detectors in the detector module are eliminated.

6. The method according to claim 1, characterized in that Outputting a control signal to a control module of the CT scanning system according to a relationship between the fourth temperature and the preset temperature includes: When the fourth temperature is greater than or equal to the first preset temperature and less than or equal to the second preset temperature, outputting a control signal to a temperature increase control module and a temperature decrease control module of the CT scanning system; When the fourth temperature is lower than the first preset temperature, outputting a control signal to a temperature rise control module of the CT scanning system; When the fourth temperature is greater than the second preset temperature, a control signal is output to the temperature reduction control module of the CT scanning system.

7. The method according to claim 1, characterized in that Before obtaining the fourth temperature of the detector module of the CT scanning system under the second working condition, the method further includes: Acquire information on the number of detectors included in a detector module in a CT scanning system, wherein the detector module includes detectors arrayed along a first direction and a second direction; According to the number information of the detectors included in the detector module in the first direction and the number information of the detectors included in the detector module in the second direction, the detector module is divided into a plurality of sub-detector modules; The obtaining of a fourth temperature of the detector module of the CT scanning system under the second working condition includes: A fourth temperature of each sub-detector module of the CT scanning system under the second working condition is obtained.

8. A detector module temperature control device in a CT scanning system, characterized in that: include: A first operating condition parameter acquisition module, used to acquire a first control parameter of the control module of the CT scanning system under a first operating condition and a first temperature change rate of the detector module under the first operating condition, wherein the control module of the CT scanning system includes a heating control module and a heat dissipation control module, and the first temperature change rate is determined based on a first temperature of the detector module collected at any two adjacent sampling points under the first operating condition; a second operating condition parameter acquisition module, configured to acquire a second temperature change rate of the detector module of the CT scanning system under a second operating condition in response to a trigger operation submitted by a target object, wherein the second temperature change rate is determined based on a second temperature of the detector module acquired at a first sampling point and a third temperature of the detector module acquired at a second sampling point under the second operating condition, and the trigger operation is used to trigger the CT scanning system to change from the first operating condition to the second operating condition; A second operating condition control parameter determination module, configured to adjust the first control parameter to obtain a second control parameter according to the first temperature change rate and the second temperature change rate; an adjusting module, configured to adjust a control parameter of a control module of the CT scanning system under the second working condition based on the second control parameter; A temperature acquisition module, used to acquire a fourth temperature of the detector module of the CT scanning system under a second working condition; The control module is used to output a control signal to the control module of the CT scanning system according to the relationship between the fourth temperature and the preset temperature.

9. A computer device, characterized in that: include: one or more processors; a storage device for storing one or more programs, When the one or more programs are executed by the one or more processors, the one or more processors implement the method according to any one of claims 1 to 7.

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